USPTO Art Unit 2893 Prosecution Statistics

Art Unit Information

Art Unit: 2893
Group: 2890
Tech Center: 2800
Total Cases: 17,917
Last Active: September 2025

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
19320623METHOD TO PRODUCE A 3D MULTILAYER SEMICONDUCTOR DEVICE AND STRUCTURESeptember 2025March 2026Allow600NoNo
19260224COMPLEMENTARY SEMICONDUCTOR DEVICES USING HALIDE PEROVSKITE THIN FILMSJuly 2025November 2025Allow510NoNo
19218716SILICON CARBIDE DETECTOR AND FABRICATION METHOD THEREOFMay 2025December 2025Allow611NoNo
19119588MANUFACTURING METHOD FOR A POWER SEMICONDUCTOR DEVICE AND POWER SEMICONDUCTOR DEVICEApril 2025September 2025Allow610NoNo
19109527POWER MODULE COMPRISING A SEMICONDUCTOR MODULE COMPONENT AND AN ALIGNMENT PART, AND METHOD FOR FORMING THE POWER MODULEMarch 2025June 2025Allow300NoNo
19036506MICROSTRUCTURE ENHANCED ABSORPTION PHOTOSENSITIVE DEVICESJanuary 2025October 2025Allow910YesNo
19030244DISPLAY DEVICEJanuary 2025March 2025Allow200YesNo
18956395FE-FET STRUCTURE WITH BURIED ELECTRODENovember 2024July 2025Allow811NoNo
18867459Semiconductor device AND manufacturing METHOD THEREOFNovember 2024April 2025Allow500NoNo
18949173ACENTRIC NON-ROUND ELECTRICAL INTERCONNECTIONSNovember 2024August 2025Allow911YesNo
18939075FACE BONDED SEMICONDUCTOR DEVICE WITH THROUGH OXIDE VIA AND METAL PLUGNovember 2024November 2025Allow1221YesNo
18931666SEMICONDUCTOR DEVICE INCLUDING INTERCONNECT STRUCTURE WITH METAL JUMP STRUCTURE CONNECTING ADJACENT METAL LINESOctober 2024June 2025Allow811YesNo
18929113VERTICAL MEMORY DEVICESOctober 2024October 2025Allow1200NoNo
18922192SEMICONDUCTOR DIE ASSEMBLIES WITH DECOMPOSABLE MATERIALS AND ASSOCIATED METHODS AND SYSTEMSOctober 2024October 2025Allow1200NoNo
18908950STRUCTURES WITH DEEP TRENCH ISOLATION REGIONS FOR A HIGH-VOLTAGE FIELD-EFFECT TRANSISTOROctober 2024February 2025Allow510NoNo
18905089OPTICAL SENSING APPARATUSOctober 2024February 2025Allow410YesNo
18829143HOMOGENEOUS OPTOELECTRONIC RESERVOIR COMPUTING SYSTEM BASED ON NITROGEN-DOPED GE-SB-TE MATERIALSeptember 2024August 2025Abandon1110NoNo
18822880MICROSTRUCTURE ENHANCED ABSORPTION PHOTOSENSITIVE DEVICESSeptember 2024January 2025Allow410YesNo
18810963LEAD FRAME DEVICE WITH SHARED TERMINALAugust 2024July 2025Allow1111NoNo
18809802BIASING AND READOUT METHODS FOR HIGH-SPEED RESISTIVE GATE SENSORAugust 2024February 2026Allow1811NoNo
18808758SEMICONDUCTOR DEVICE INCLUDING BACKSIDE CONTACT STRUCTURE WITH SILICIDE LAYER FORMED IN FEOL PROCESSAugust 2024June 2025Allow1021YesNo
18808892SEMICONDUCTOR MODULEAugust 2024October 2024Allow200NoNo
18806772PHOTODETECTORS WITH MULTIPLE LIGHT-ABSORBING SEMICONDUCTOR LAYERSAugust 2024February 2025Allow610NoNo
18806478HERMETIC MICROELECTRONIC MODULE USING A SHEATHAugust 2024August 2025Allow1221NoNo
18793939METHOD TO PRODUCE A 3D MULTILAYER SEMICONDUCTOR DEVICE AND STRUCTUREAugust 2024July 2025Allow1110NoNo
18834521ARRANGEMENT FOR A SEMICONDUCTOR ARRANGEMENT COMPRISING AT LEAST ONE PASSIVE COMPONENT AND A SUBSTRATEJuly 2024July 2025Allow1211YesNo
18788822WIRE BONDING METHOD AND APPARATUS FOR ELECTROMAGNETIC INTERFERENCE SHIELDINGJuly 2024October 2025Allow1400NoNo
18787689ELECTRONIC COMPONENT PACKAGE AND MANUFACURING METHOD THEREOFJuly 2024September 2024Allow100NoNo
187839653D SEMICONDUCTOR DEVICE AND STRUCTURE WITH METAL LAYERSJuly 2024July 2025Allow1110NoNo
18777478HIGH-SENSITIVITY AVALANCHE PHOTODETECTORSJuly 2024January 2025Allow610NoNo
18774282SEMICONDUCTOR DEVICE HAVING A BACKSIDE METALLIZATION LAYER AND A PROTECTION LAYERJuly 2024January 2026Allow1820NoNo
18772320THIN FILM RESISTOR WITH VIABAR STRUCTUREJuly 2024November 2025Allow1631YesNo
18768451QUANTUM DOT LIGHT EMITTING STRUCTURE, METHOD FOR MANUFACTURING THE SAME, ARRAY SUBSTRATE, AND DISPLAY DEVICEJuly 2024August 2025Allow1310NoNo
18768308DISPLAY DEVICE HAVING A SEMICONDUCTOR LAYER STRUCTURE INCLUDING A THIRD PORTION EXTENDING IN A THIRD DIRECTION DIRECTLY CONNECTING TO A FIRST PORTION AND A SECOND PORTION THAT EXTEND IN DIFFERENT DIRECTIONSJuly 2024December 2025Allow1820YesNo
18766974ECCENTRIC VIA STRUCTURES FOR STRESS REDUCTIONJuly 2024January 2025Allow700NoNo
18765489INDUCTORS WITH AIRGAP ELECTRICAL ISOLATIONJuly 2024October 2024Allow410NoNo
18766279PASSIVATION STRUCTURE WITH INCREASED THICKNESS FOR METAL PADSJuly 2024November 2025Allow1620NoNo
18761691METHOD FOR MAKING MEMORY DEVICE INCLUDING A SUPERLATTICE GETTERING LAYERJuly 2024February 2025Allow820NoNo
18760656TRANSISTOR GATE STRUCTURES AND METHODS OF FORMING THE SAMEJuly 2024September 2025Allow1400NoNo
18754507Work Function Control In Gate StructuresJune 2024December 2025Allow1820YesNo
18754367SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREFOR, AND ELECTRONIC EQUIPMENTJune 2024February 2025Allow801NoNo
18754418SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREFOR, AND ELECTRONIC DEVICEJune 2024January 2025Allow601NoNo
18753697METHOD FOR ION IMPLANTATION THAT ADJUSTS A TARGET'S TILT ANGLE BASED ON A DISTRIBUTION OF EJECTED IONS FROM A TARGETJune 2024December 2025Allow1810NoNo
18749274HIGH DENSITY SUBSTRATE ROUTING IN PACKAGEJune 2024February 2025Allow800NoNo
18746818INPUT/OUTPUT SEMICONDUCTOR DEVICESJune 2024August 2025Allow1410NoNo
18745743ARRAY OF HEAT-SINKED POWER SEMICONDUCTORSJune 2024January 2026Allow1920NoNo
18745613Semiconductor Package and MethodJune 2024February 2025Allow800NoNo
18745704GATE-ALL-AROUND STRUCTURE WITH SELF SUBSTRATE ISOLATION AND METHODS OF FORMING THE SAMEJune 2024July 2025Allow1310NoNo
18745970DISPLAY DEVICEJune 2024February 2025Allow800NoNo
18743906CAPACITOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAMEJune 2024December 2025Allow1810YesNo
18744087SEMICONDUCTOR DEVICEJune 2024January 2025Allow800YesNo
18741166ETCH PROFILE CONTROL OF ISOLATION TRENCHJune 2024June 2025Allow1210NoNo
18741029HIGH PERFORMANCE IMAGE SENSORJune 2024May 2025Allow1110NoNo
18740503PACKAGE STRUCTUREJune 2024May 2025Allow1110NoNo
187384383D NAND - HIGH ASPECT RATIO STRINGS AND CHANNELSJune 2024July 2025Allow1410NoNo
18734053DISPLAY DEVICEJune 2024March 2025Allow910NoNo
18732767THREE-DIMENSIONAL SEMICONDUCTOR DEVICE HAVING VERTICAL MISALIGNMENTJune 2024July 2025Allow1310NoNo
18733499GATE-ALL-AROUND STRUCTURE AND METHODS OF FORMING THE SAMEJune 2024September 2025Allow1610YesNo
18732484Power Semiconductor Packaging and Manufacturing Method ThereofJune 2024August 2024Allow300NoNo
18732430HIGH VOLTAGE LIGHT-EMITTING DEVICEJune 2024March 2025Allow900NoNo
18731392HIGH ELECTRON MOBILITY TRANSISTOR AND METHOD FOR FABRICATING THE SAMEJune 2024March 2025Allow910NoNo
18731454TRENCH GATE HIGH VOLTAGE TRANSISTOR FOR EMBEDDED MEMORYJune 2024July 2025Allow1310NoNo
18676730THIN FILM TRANSISTOR INCLUDING A DIELECTRIC DIFFUSION BARRIER AND METHODS FOR FORMING THE SAMEMay 2024October 2025Allow1700NoNo
18675367STRUCTURES FOR A FIELD-EFFECT TRANSISTOR THAT INCLUDE A SPACER STRUCTUREMay 2024March 2025Allow921YesNo
18676431DISPLAY PANEL AND DISPLAY DEVICEMay 2024April 2025Allow1010NoNo
18675750MANUFACTURING METHOD OF AN ELECTRONIC DEVICEMay 2024July 2025Allow1420NoNo
18675098SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAMEMay 2024August 2025Allow1410NoNo
18674989SEMICONDUCTOR DEVICES AND METHODS OF FABRICATION THEREOFMay 2024October 2025Allow1610NoNo
18673308CAPACITOR COMPRISING ANTI-FERROELECTRIC LAYERS AND HIGH-K DIELECTRIC LAYERSMay 2024February 2026Allow2111NoNo
18673521SEMICONDUCTOR DEVICES WITH SINGLE-PHOTON AVALANCHE DIODES AND ISOLATION STRUCTURESMay 2024February 2025Allow810NoNo
18672936STACKING CMOS STRUCTUREMay 2024June 2025Allow1310NoNo
18671652SEMICONDUCTOR MODULEMay 2024February 2025Allow900NoNo
18671619LIGHT EMITTING DIODEMay 2024March 2025Allow1010NoNo
18669566METHOD FOR FORMING A SEMICONDUCTOR DIE AND A PHOTOELECTRIC DEVICE INTEGRATED IN A SAME PACKAGEMay 2024February 2025Allow900NoNo
18669679SEMICONDUCTOR MEMORY DEVICEMay 2024February 2026Allow2120NoNo
18669153LIGHT-EMITTING MODULE AND DISPLAY APPARATUSMay 2024April 2025Allow1010NoNo
18667666SELECTIVE AREA METAL PROCESS FOR IMPROVED METALLURGICAL BONDING OF ALUMINUM TO COPPER FOR INTEGRATED PASSIVE DEVICES IN A SEMICONDUCTOR DEVICEMay 2024November 2024Allow601NoNo
18667417INTEGRATED CIRCUIT DEVICE AND METHOD OF MANUFACTURING THE SAMEMay 2024December 2024Allow700NoNo
18667720FINGERPRINT SENSOR AND MANUFACTURING METHOD THEREOFMay 2024June 2025Allow1320NoNo
18667311SEMICONDUCTOR DEVICEMay 2024November 2025Allow1800NoNo
18665649DISPLAY APPARATUSMay 2024June 2025Allow1310NoNo
18664389AMORPHOUS BOTTOM ELECTRODE STRUCTURE FOR MIM CAPACITORSMay 2024September 2025Allow1610YesNo
18664483INTEGRATED CIRCUIT PACKAGE AND METHOD OF FORMING SAMEMay 2024December 2024Allow800NoNo
18665023DISPLAY DEVICE AND METHOD OF FABRICATING THE SAMEMay 2024October 2025Allow1710NoNo
18663479ACTIVE MATRIX SUBSTRATEMay 2024November 2025Allow1800NoNo
18662615METHOD OF FORMING SOURCE/DRAIN EPITAXIAL STACKSMay 2024September 2025Allow1620NoNo
18662959DISPLAY DEVICEMay 2024February 2026Allow2130NoNo
18659476DISPLAY DEVICEMay 2024March 2025Allow1000YesNo
18660198SEMICONDUCTOR DEVICEMay 2024February 2025Allow900YesNo
18657993SEMICONDUCTOR DEVICEMay 2024January 2025Allow810NoNo
18658378LIGHT-EMITTING DIODE UNIT FOR DISPLAY COMPRISING PLURALITY OF PIXELS AND DISPLAY DEVICE HAVING SAMEMay 2024March 2025Allow1110NoNo
18657751Semiconductor Structure and Method of Fabricating the SameMay 2024June 2025Allow1321YesNo
18656622ESD Structure for a Display Substrate EdgeMay 2024March 2025Allow1000NoNo
18655567SELF-ASSEMBLED GUIDED HOLE AND VIA PATTERNING OVER GRATINGMay 2024September 2025Allow1610YesNo
18656362DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAMEMay 2024February 2025Allow1000NoNo
18655318METHOD FOR REMOVING RESIST LAYER, METHOD OF FORMING A PATTERN AND METHOD OF MANUFACTURING A PACKAGEMay 2024April 2025Allow1110NoNo
18654802LIGHT-EMITTING ELEMENT, MANUFACTURING METHOD THEREFOR, AND DISPLAY DEVICE HAVING LIGHT-EMITTING ELEMENTMay 2024June 2025Allow1310YesNo
18653473SEMICONDUCTOR STRUCTURE INCLUDING SECTIONED WELL REGIONMay 2024October 2025Allow1810YesNo
18652529METHODS FOR REGISTRATION OF CIRCUIT DIES AND ELECTRICAL INTERCONNECTSMay 2024November 2024Allow700NoNo
18652167NON-VOLATILE STORAGE DEVICEMay 2024February 2025Allow900NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for art-unit 2893.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
170
Examiner Affirmed
106
(62.4%)
Examiner Reversed
64
(37.6%)
Reversal Percentile
72.7%
Higher than average

What This Means

With a 37.6% reversal rate, the PTAB reverses the examiner's rejections in a meaningful percentage of cases. This reversal rate is above the USPTO average, indicating that appeals have better success here than typical.

Strategic Value of Filing an Appeal

Total Appeal Filings
665
Allowed After Appeal Filing
216
(32.5%)
Not Allowed After Appeal Filing
449
(67.5%)
Filing Benefit Percentile
51.6%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 32.5% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.

Strategic Recommendations

✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.

✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Art Unit 2893 - Prosecution Statistics Summary

Executive Summary

Art Unit 2893 is part of Group 2890 in Technology Center 2800. This art unit has examined 17,917 patent applications in our dataset, with an overall allowance rate of 84.0%. Applications typically reach final disposition in approximately 25 months.

Comparative Analysis

Art Unit 2893's allowance rate of 84.0% places it in the 78% percentile among all USPTO art units. This art unit has a significantly higher allowance rate than most art units at the USPTO.

Prosecution Patterns

Applications in Art Unit 2893 receive an average of 1.72 office actions before reaching final disposition (in the 36% percentile). The median prosecution time is 25 months (in the 80% percentile).

Strategic Considerations

When prosecuting applications in this art unit, consider the following:

  • The art unit's allowance rate suggests a more favorable examination environment compared to the USPTO average.
  • With fewer office actions than average, plan for relatively streamlined prosecution.
  • The median prosecution time is shorter than average and should be factored into your continuation and client communication strategies.
  • Review individual examiner statistics within this art unit to identify examiners with particularly favorable or challenging prosecution patterns.

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.