Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18648232 | METHODS OF FORMING MICROELECTRONIC DEVICES, AND RELATED ELECTRONIC SYSTEMS | April 2024 | February 2026 | Allow | 22 | 2 | 0 | Yes | No |
| 18383146 | VERTICAL MEMORY STRUCTURE WITH AIR GAPS AND METHOD FOR PREPARING THE SAME | October 2023 | January 2025 | Allow | 15 | 2 | 1 | Yes | No |
| 18466475 | IMAGE SENSOR | September 2023 | January 2026 | Abandon | 28 | 4 | 0 | Yes | No |
| 18464828 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SEMICONDUCTOR DEVICE | September 2023 | December 2024 | Allow | 15 | 2 | 0 | Yes | No |
| 18241402 | Integrated Assemblies, and Methods of Forming Integrated Assemblies | September 2023 | November 2025 | Allow | 27 | 6 | 0 | Yes | No |
| 18234147 | MAGNETORESISTANCE EFFECT ELEMENT | August 2023 | September 2024 | Allow | 13 | 0 | 0 | Yes | No |
| 18363987 | METAL NITRIDE DIFFUSION BARRIER AND METHODS OF FORMATION | August 2023 | January 2026 | Allow | 30 | 2 | 0 | Yes | No |
| 18361677 | Metal/Dielectric/Metal Hybrid Hard Mask To Define Ultra-Large Height Top Electrode For Sub 60nm MRAM Devices | July 2023 | August 2024 | Allow | 13 | 1 | 0 | Yes | No |
| 18346879 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | July 2023 | January 2026 | Allow | 31 | 2 | 1 | Yes | No |
| 18343176 | SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING APPARATUS | June 2023 | August 2025 | Allow | 26 | 4 | 0 | Yes | No |
| 18339088 | MEMORY DEVICES INCLUDING CONDUCTIVE RAILS, AND RELATED METHODS AND ELECTRONIC SYSTEMS | June 2023 | May 2025 | Allow | 23 | 2 | 1 | Yes | No |
| 18333235 | METHODS OF FORMING MICROELECTRONIC DEVICES, AND RELATED ELECTRONIC SYSTEMS | June 2023 | September 2024 | Allow | 15 | 0 | 1 | Yes | No |
| 18310523 | SELF-LIMITING GROWTH | May 2023 | December 2025 | Abandon | 31 | 3 | 1 | Yes | No |
| 18126048 | METHOD OF TUNING FILM PROPERTIES OF METAL NITRIDE USING PLASMA | March 2023 | July 2025 | Allow | 27 | 3 | 1 | Yes | No |
| 18112395 | EPITAXIAL STRONTIUM TITANATE ON SILICON | February 2023 | February 2026 | Allow | 36 | 2 | 1 | Yes | No |
| 18096316 | LOCAL CONTACTS OF THREE-DIMENSIONAL MEMORY DEVICES AND METHODS FOR FORMING THE SAME | January 2023 | February 2026 | Abandon | 37 | 4 | 1 | Yes | No |
| 18091383 | ACTIVE DEVICE SUBSTRATE | December 2022 | January 2026 | Allow | 37 | 2 | 0 | Yes | No |
| 18085044 | SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES | December 2022 | March 2025 | Allow | 27 | 2 | 1 | Yes | No |
| 18083473 | Piezoelectric MEMS Resonators based on Porous Silicon Technologies | December 2022 | March 2024 | Allow | 15 | 2 | 0 | No | No |
| 18075605 | DISPLAY PANEL AND DISPLAY DEVICE | December 2022 | December 2025 | Allow | 36 | 1 | 1 | Yes | No |
| 18075666 | SEMICONDUCTOR DEVICE STRUCTURE WITH ENERGY REMOVABLE STRUCTURE AND METHOD FOR PREPARING THE SAME | December 2022 | February 2026 | Allow | 38 | 3 | 1 | Yes | No |
| 17974898 | METHOD FOR REPAIRING SUBSTRATE AND ELECTRONIC DEVICE | October 2022 | December 2025 | Abandon | 38 | 4 | 1 | No | No |
| 17967472 | Multi-Pin-Wafer-Level-Chip-Scale-Packaging Solution for High Power Semiconductor Devices | October 2022 | June 2024 | Allow | 20 | 0 | 1 | No | No |
| 17958515 | SEMICONDUCTOR DEVICE | October 2022 | August 2024 | Allow | 23 | 2 | 0 | Yes | No |
| 17934220 | SEMICONDUCTOR STRUCTURE WITH SEMICONDUCTOR-ON-INSULATOR REGION AND METHOD | September 2022 | June 2024 | Allow | 21 | 2 | 1 | Yes | No |
| 17947514 | MASKLESS PATTERNING AND CONTROL OF GRAPHENE LAYERS | September 2022 | June 2025 | Allow | 33 | 3 | 1 | Yes | Yes |
| 17861700 | THREE-DIMENSIONAL SEMICONDUCTOR DEVICE INCLUDING A THROUGH-VIA STRUCTURE HAVING A VIA LINER HAVING PROTRUDING PORTIONS | July 2022 | July 2024 | Allow | 25 | 1 | 1 | Yes | No |
| 17857341 | METHODS FOR LOW RESISTIVITY AND STRESS TUNGSTEN GAP FILL | July 2022 | June 2024 | Allow | 23 | 1 | 0 | Yes | No |
| 17787601 | Display Substrate and Preparation Method thereof, and Display Apparatus | June 2022 | November 2025 | Allow | 41 | 2 | 1 | Yes | No |
| 17844898 | MEMORY DEVICE USING SEMICONDUCTOR ELEMENT | June 2022 | December 2025 | Allow | 41 | 2 | 1 | No | Yes |
| 17830546 | SEMICONDUCTOR DEVICE | June 2022 | March 2024 | Allow | 21 | 1 | 0 | No | No |
| 17750423 | SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF | May 2022 | March 2025 | Allow | 34 | 4 | 0 | Yes | No |
| 17747131 | SEMICONDUCTOR PACKAGE | May 2022 | July 2025 | Allow | 38 | 2 | 1 | Yes | No |
| 17743451 | SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME | May 2022 | March 2026 | Allow | 46 | 4 | 1 | Yes | No |
| 17755642 | SOLID-STATE IMAGING DEVICE AND METHOD OF PRODUCING THE SAME | May 2022 | February 2026 | Abandon | 45 | 3 | 1 | No | No |
| 17724898 | Method For Reducing Lithography Defects and Pattern Transfer | April 2022 | December 2024 | Allow | 31 | 2 | 1 | Yes | No |
| 17721369 | METHOD FOR MANUFACTURING A MAGNETIC RANDOM-ACCESS MEMORY DEVICE USING POST PILLAR FORMATION ANNEALING | April 2022 | April 2024 | Allow | 24 | 1 | 0 | Yes | No |
| 17721241 | MICROELECTRONIC DEVICES DESIGNED WITH COMPOUND SEMICONDUCTOR DEVICES AND INTEGRATED ON AN INTER DIE FABRIC | April 2022 | February 2026 | Abandon | 46 | 5 | 0 | Yes | Yes |
| 17659014 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | April 2022 | March 2025 | Abandon | 35 | 2 | 0 | No | No |
| 17718242 | SELF FIELD-SUPPRESSION CVD TUNGSTEN (W) FILL ON PVD W LINER | April 2022 | May 2025 | Allow | 37 | 2 | 1 | Yes | No |
| 17717375 | Performing Annealing Process To Improve Fin Quality Of A Finfet Semiconductor | April 2022 | July 2024 | Allow | 27 | 2 | 0 | Yes | No |
| 17701253 | SEMICONDUCTOR DEVICE | March 2022 | November 2024 | Allow | 32 | 2 | 1 | Yes | No |
| 17654077 | TUNGSTEN MOLYBDENUM STRUCTURES | March 2022 | August 2024 | Allow | 30 | 2 | 1 | Yes | No |
| 17688259 | METHOD OF FORMING SEMICONDUCTOR DEVICE HAVING CARBON NANOTUBE | March 2022 | August 2024 | Allow | 30 | 2 | 1 | Yes | No |
| 17676209 | SEMICONDUCTOR MEMORY DEVICE | February 2022 | February 2025 | Allow | 36 | 2 | 1 | Yes | No |
| 17589810 | DISPLAY SUBSTRATE, DISPLAY PANEL, DISPLAY APPARATUS, AND METHOD OF FABRICATING DISPLAY SUBSTRATE | January 2022 | April 2025 | Allow | 38 | 2 | 1 | No | No |
| 17575158 | CONTACT STRUCTURES FOR THREE-DIMENSIONAL MEMORY | January 2022 | May 2025 | Abandon | 40 | 4 | 1 | Yes | No |
| 17565807 | INTERCONNECT STRUCTURE AND ELECTRONIC DEVICE INCLUDING THE SAME | December 2021 | December 2025 | Abandon | 47 | 4 | 1 | Yes | No |
| 17552755 | METHOD FOR PREPARING A SUBSTRATE | December 2021 | September 2025 | Allow | 45 | 4 | 0 | Yes | No |
| 17544994 | Methods of Performing Selective Low Resistivity Ru Atomic Layer Deposition and Interconnect Formed Using the Same | December 2021 | August 2024 | Allow | 32 | 2 | 1 | Yes | No |
| 17612546 | METHOD FOR FORMING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE | November 2021 | September 2024 | Allow | 34 | 2 | 1 | Yes | No |
| 17528068 | METHOD FOR FABRICATING MEMORY DEVICE | November 2021 | March 2024 | Allow | 28 | 2 | 0 | Yes | No |
| 17524984 | SEMICONDUCTOR MEMORY | November 2021 | April 2024 | Allow | 29 | 1 | 1 | Yes | No |
| 17517781 | MICRO LIGHT-EMITTING DIODE DISPLAY DEVICE | November 2021 | February 2026 | Abandon | 51 | 4 | 1 | Yes | No |
| 17515727 | LIGHT EMITTING DIODE PANEL AND METHOD FOR MANUFACTURING THE LIGHT EMITTING DIODE PANEL | November 2021 | April 2024 | Allow | 29 | 2 | 0 | Yes | No |
| 17516588 | THREE-DIMENSIONAL MEMORY DEVICE WITH DIELECTRIC ISOLATED VIA STRUCTURES AND METHODS OF MAKING THE SAME | November 2021 | June 2024 | Allow | 32 | 0 | 1 | Yes | No |
| 17498694 | METHOD AND APPARATUS FOR ANALOG FLOATING GATE MEMORY CELL | October 2021 | December 2025 | Abandon | 50 | 4 | 1 | Yes | No |
| 17497173 | VERTICAL STACKED NANOSHEET CMOS TRANSISTORS WITH DIFFERENT WORK FUNCTION METALS | October 2021 | June 2025 | Allow | 44 | 4 | 1 | Yes | Yes |
| 17441054 | DISPLAY DEVICE | September 2021 | May 2024 | Allow | 32 | 0 | 1 | Yes | No |
| 17459400 | SEMICONDUCTOR MANUFACTURING SYSTEM, METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE | August 2021 | October 2024 | Allow | 37 | 1 | 1 | Yes | No |
| 17412393 | SEMICONDUCTOR DEVICES AND METHODS FOR FABRICATING THE SAME | August 2021 | October 2024 | Allow | 38 | 4 | 1 | Yes | No |
| 17391659 | SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME | August 2021 | April 2024 | Allow | 33 | 3 | 1 | Yes | No |
| 17389693 | SEMICONDUCTOR STRUCTURE AND FORMING METHOD THEREOF | July 2021 | May 2024 | Abandon | 34 | 2 | 1 | Yes | No |
| 17362066 | LIGHT EMITTING DEVICE INCLUDING COVERING MEMBER AND EXTERNAL CONNECTION ELECTRODES | June 2021 | October 2024 | Allow | 39 | 4 | 0 | Yes | Yes |
| 17330256 | SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME | May 2021 | February 2025 | Allow | 44 | 4 | 1 | Yes | No |
| 17321258 | LOCAL CONTACTS OF THREE-DIMENSIONAL MEMORY DEVICES AND METHODS FOR FORMING THE SAME | May 2021 | February 2024 | Allow | 33 | 4 | 0 | Yes | No |
| 17302794 | METAL NITRIDE DIFFUSION BARRIER AND METHODS OF FORMATION | May 2021 | July 2025 | Allow | 50 | 6 | 1 | Yes | No |
| 17308210 | GATE CONTACT STRUCTURE | May 2021 | September 2025 | Allow | 52 | 7 | 1 | Yes | No |
| 17237874 | SEMICONDUCTOR DEVICE AND METHOD FOR MAKING THE SAME | April 2021 | January 2024 | Allow | 33 | 2 | 1 | Yes | No |
| 17222815 | SCALABLE EMBEDDED SILICON BRIDGE VIA PILLARS IN LITHOGRAPHICALLY DEFINED VIAS, AND METHODS OF MAKING SAME | April 2021 | September 2024 | Allow | 41 | 4 | 1 | Yes | No |
| 17182447 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR THE SAME | February 2021 | June 2024 | Allow | 40 | 4 | 1 | Yes | No |
| 17172276 | SEMICONDUCTOR DEVICE | February 2021 | September 2024 | Abandon | 43 | 4 | 1 | Yes | No |
| 17166962 | FIELD ASSISTED INTERFACIAL DIFFUSION DOPING THROUGH HETEROSTRUCTURE DESIGN | February 2021 | July 2024 | Allow | 41 | 5 | 1 | Yes | No |
| 17248358 | TUNGSTEN DEPOSITION ON A COBALT SURFACE | January 2021 | April 2024 | Allow | 39 | 5 | 1 | Yes | No |
| 17141722 | MICROELECTRONIC DEVICES INCLUDING VOIDS NEIGHBORING CONDUCTIVE CONTACTS, AND RELATED MEMORY DEVICES, ELECTRONIC SYSTEMS, AND METHODS | January 2021 | March 2024 | Allow | 38 | 3 | 1 | Yes | No |
| 17255490 | DISPLAY PANEL, METHOD OF MANUFACTURING THEREOF, AND DISPLAY DEVICE | December 2020 | October 2024 | Abandon | 46 | 2 | 1 | No | No |
| 17111838 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | December 2020 | February 2024 | Allow | 39 | 2 | 0 | Yes | Yes |
| 16950549 | SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR MEMORY DEVICE | November 2020 | April 2024 | Allow | 41 | 4 | 0 | Yes | No |
| 17087968 | SEMICONDUCTOR DEVICE INCLUDING GRAPHENE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE | November 2020 | February 2024 | Allow | 39 | 4 | 0 | Yes | No |
| 17064834 | THREE-DIMENSIONAL NAND MEMORY DEVICE WITH REDUCED REVERSE DIPOLE EFFECT AND METHOD FOR FORMING THE SAME | October 2020 | November 2024 | Allow | 49 | 4 | 1 | Yes | Yes |
| 17062373 | MICROELECTRONIC DEVICES WITH SLIT STRUCTURES INCLUDING METAL PLUGS AND RELATED SYSTEMS | October 2020 | January 2024 | Allow | 39 | 4 | 1 | Yes | No |
| 17043781 | DISPLAY DEVICE AND FABRICATION METHOD THEREOF | September 2020 | October 2024 | Allow | 48 | 2 | 1 | Yes | Yes |
| 17021627 | MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME | September 2020 | June 2025 | Abandon | 57 | 6 | 1 | Yes | Yes |
| 17005267 | SEMICONDUCTOR MEMORY DEVICE | August 2020 | October 2024 | Abandon | 50 | 5 | 1 | No | No |
| 16963503 | ELECTRODE CONNECTION ELEMENT, LIGHT-EMITTING DEVICE COMPRISING SAME, AND METHOD FOR PRODUCING LIGHT-EMITTING DEVICE | July 2020 | August 2024 | Abandon | 49 | 4 | 1 | No | No |
| 16857888 | PIXEL AND DISPLAY DEVICE HAVING THE SAME | April 2020 | January 2025 | Allow | 56 | 4 | 1 | Yes | Yes |
| 16832803 | MULTI-LAYER INDUCTOR | March 2020 | May 2025 | Allow | 60 | 4 | 0 | Yes | Yes |
| 16625029 | OPTICAL TRANSCEIVER HAVING HEAT DISSIPATION | December 2019 | October 2025 | Abandon | 60 | 7 | 1 | No | Yes |
| 16606906 | IMAGING DEVICE AND ELECTRONIC DEVICE | October 2019 | April 2024 | Allow | 54 | 5 | 1 | Yes | No |
| 16423700 | INTEGRATED CIRCUIT PACKAGES WITH SOLDER THERMAL INTERFACE MATERIALS WITH EMBEDDED PARTICLES | May 2019 | December 2024 | Allow | 60 | 6 | 1 | Yes | No |
| 15810670 | Anneal Techniques for Chalcogenide Semiconductors | November 2017 | May 2018 | Allow | 6 | 0 | 0 | Yes | No |
| 15797791 | DIFFUSION BARRIER LAYER FORMATION | October 2017 | September 2018 | Allow | 11 | 0 | 1 | Yes | No |
| 15683989 | SN DOPED ZNS NANOWIRES FOR WHITE LIGHT SOURCE MATERIAL | August 2017 | July 2018 | Allow | 11 | 0 | 0 | No | No |
| 15595602 | DOUBLE ASPECT RATIO TRAPPING | May 2017 | July 2018 | Allow | 14 | 2 | 0 | Yes | No |
| 15519058 | DEPOSITION MASK, DEPOSITION DEVICE, DEPOSITION METHOD, AND DEPOSITION MASK MANUFACTURING METHOD | April 2017 | July 2018 | Allow | 15 | 0 | 1 | No | No |
| 15179378 | ADVANCED METALLIZATION FOR DAMAGE REPAIR | June 2016 | June 2017 | Allow | 13 | 2 | 0 | Yes | No |
| 15162221 | DOUBLE ASPECT RATIO TRAPPING | May 2016 | June 2017 | Allow | 12 | 1 | 0 | No | No |
| 15162164 | DOUBLE ASPECT RATIO TRAPPING | May 2016 | January 2017 | Allow | 7 | 0 | 0 | Yes | No |
| 15137307 | Anneal Techniques for Chalcogenide Semiconductors | April 2016 | June 2016 | Allow | 2 | 0 | 0 | Yes | No |
| 14950301 | SEMICONDUCTOR DEVICE, MODULE, AND ELECTRONIC DEVICE | November 2015 | November 2016 | Allow | 11 | 0 | 1 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner TRAN, TONY.
With a 66.7% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 48.5% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner TRAN, TONY works in Art Unit 2893 and has examined 160 patent applications in our dataset. With an allowance rate of 93.1%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 33 months.
Examiner TRAN, TONY's allowance rate of 93.1% places them in the 80% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by TRAN, TONY receive 2.76 office actions before reaching final disposition. This places the examiner in the 81% percentile for office actions issued. This examiner issues more office actions than most examiners, which may indicate thorough examination or difficulty in reaching agreement with applicants.
The median time to disposition (half-life) for applications examined by TRAN, TONY is 33 months. This places the examiner in the 48% percentile for prosecution speed. Prosecution timelines are slightly slower than average with this examiner.
Conducting an examiner interview provides a -0.3% benefit to allowance rate for applications examined by TRAN, TONY. This interview benefit is in the 12% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 27.3% of applications are subsequently allowed. This success rate is in the 47% percentile among all examiners. Strategic Insight: RCEs show below-average effectiveness with this examiner. Carefully evaluate whether an RCE or continuation is the better strategy.
This examiner enters after-final amendments leading to allowance in 17.6% of cases where such amendments are filed. This entry rate is in the 20% percentile among all examiners. Strategic Recommendation: This examiner rarely enters after-final amendments compared to other examiners. You should generally plan to file an RCE or appeal rather than relying on after-final amendment entry. Per MPEP § 714.12, primary examiners have discretion in entering after-final amendments, and this examiner exercises that discretion conservatively.
When applicants request a pre-appeal conference (PAC) with this examiner, 100.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 74% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 83.3% of appeals filed. This is in the 77% percentile among all examiners. Of these withdrawals, 60.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 50.0% are granted (fully or in part). This grant rate is in the 48% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 10.0% of allowed cases (in the 93% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 1.3% of allowed cases (in the 64% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.