Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 17255490 | DISPLAY PANEL, METHOD OF MANUFACTURING THEREOF, AND DISPLAY DEVICE | December 2020 | October 2024 | Abandon | 46 | 2 | 1 | No | No |
| 17111838 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | December 2020 | February 2024 | Allow | 39 | 2 | 0 | Yes | Yes |
| 16950549 | SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR MEMORY DEVICE | November 2020 | April 2024 | Allow | 41 | 4 | 0 | Yes | No |
| 17087968 | SEMICONDUCTOR DEVICE INCLUDING GRAPHENE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE | November 2020 | February 2024 | Allow | 39 | 4 | 0 | Yes | No |
| 17064834 | THREE-DIMENSIONAL NAND MEMORY DEVICE WITH REDUCED REVERSE DIPOLE EFFECT AND METHOD FOR FORMING THE SAME | October 2020 | November 2024 | Allow | 49 | 4 | 1 | Yes | Yes |
| 17062373 | MICROELECTRONIC DEVICES WITH SLIT STRUCTURES INCLUDING METAL PLUGS AND RELATED SYSTEMS | October 2020 | January 2024 | Allow | 39 | 4 | 1 | Yes | No |
| 17043781 | DISPLAY DEVICE AND FABRICATION METHOD THEREOF | September 2020 | October 2024 | Allow | 48 | 2 | 1 | Yes | Yes |
| 17021627 | MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME | September 2020 | June 2025 | Abandon | 57 | 6 | 1 | Yes | Yes |
| 17005267 | SEMICONDUCTOR MEMORY DEVICE | August 2020 | October 2024 | Abandon | 50 | 5 | 1 | No | No |
| 16963503 | ELECTRODE CONNECTION ELEMENT, LIGHT-EMITTING DEVICE COMPRISING SAME, AND METHOD FOR PRODUCING LIGHT-EMITTING DEVICE | July 2020 | August 2024 | Abandon | 49 | 4 | 1 | No | No |
| 16857888 | PIXEL AND DISPLAY DEVICE HAVING THE SAME | April 2020 | January 2025 | Allow | 56 | 4 | 1 | Yes | Yes |
| 16832803 | MULTI-LAYER INDUCTOR | March 2020 | May 2025 | Allow | 60 | 4 | 0 | Yes | Yes |
| 16606906 | IMAGING DEVICE AND ELECTRONIC DEVICE | October 2019 | April 2024 | Allow | 54 | 5 | 1 | Yes | No |
| 16423700 | INTEGRATED CIRCUIT PACKAGES WITH SOLDER THERMAL INTERFACE MATERIALS WITH EMBEDDED PARTICLES | May 2019 | December 2024 | Allow | 60 | 6 | 1 | Yes | No |
| 15810670 | Anneal Techniques for Chalcogenide Semiconductors | November 2017 | May 2018 | Allow | 6 | 0 | 0 | Yes | No |
| 15797791 | DIFFUSION BARRIER LAYER FORMATION | October 2017 | September 2018 | Allow | 11 | 0 | 1 | Yes | No |
| 15683989 | SN DOPED ZNS NANOWIRES FOR WHITE LIGHT SOURCE MATERIAL | August 2017 | July 2018 | Allow | 11 | 0 | 0 | No | No |
| 15595602 | DOUBLE ASPECT RATIO TRAPPING | May 2017 | July 2018 | Allow | 14 | 2 | 0 | Yes | No |
| 15519058 | DEPOSITION MASK, DEPOSITION DEVICE, DEPOSITION METHOD, AND DEPOSITION MASK MANUFACTURING METHOD | April 2017 | July 2018 | Allow | 15 | 0 | 1 | No | No |
| 15179378 | ADVANCED METALLIZATION FOR DAMAGE REPAIR | June 2016 | June 2017 | Allow | 13 | 2 | 0 | Yes | No |
| 15162164 | DOUBLE ASPECT RATIO TRAPPING | May 2016 | January 2017 | Allow | 7 | 0 | 0 | Yes | No |
| 15162221 | DOUBLE ASPECT RATIO TRAPPING | May 2016 | June 2017 | Allow | 12 | 1 | 0 | No | No |
| 15137307 | Anneal Techniques for Chalcogenide Semiconductors | April 2016 | June 2016 | Allow | 2 | 0 | 0 | Yes | No |
| 14950301 | SEMICONDUCTOR DEVICE, MODULE, AND ELECTRONIC DEVICE | November 2015 | November 2016 | Allow | 11 | 0 | 1 | No | No |
| 14949815 | ADVANCED METALLIZATION FOR DAMAGE REPAIR | November 2015 | May 2017 | Allow | 28 | 2 | 1 | Yes | No |
| 14612344 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE | February 2015 | July 2016 | Allow | 18 | 2 | 1 | Yes | No |
| 14501137 | DIFFUSION BARRIER LAYER FORMATION | September 2014 | April 2016 | Allow | 19 | 0 | 1 | Yes | No |
| 14500244 | DOUBLE ASPECT RATIO TRAPPING | September 2014 | March 2016 | Allow | 17 | 0 | 1 | Yes | No |
| 14500304 | III-V FinFET CMOS WITH III-V AND GERMANIUM-CONTAINING CHANNEL CLOSELY SPACED | September 2014 | January 2016 | Allow | 16 | 0 | 1 | Yes | No |
| 14498965 | MICROELECTROMECHANICAL SYSTEM (MEMS) BOND RELEASE STRUCTURE AND METHOD OF WAFER TRANSFER FOR THREE-DIMENSIONAL INTEGRATED CIRCUIT (3D IC) INTEGRATION | September 2014 | January 2018 | Allow | 39 | 6 | 1 | No | No |
| 14378643 | METHOD FOR PRODUCING A RADIATION-EMITTING SEMICONDUCTOR COMPONENT | August 2014 | March 2017 | Allow | 31 | 4 | 0 | No | Yes |
| 14123638 | METHOD AND APPARATUS FOR MOLDING ENCAPSULANT OF LIGHT EMITTING DEVICE | March 2014 | August 2017 | Allow | 44 | 4 | 1 | Yes | Yes |
| 14203745 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | March 2014 | March 2016 | Allow | 24 | 4 | 1 | Yes | No |
| 14141559 | SYSTEM AND METHOD FOR FORMING AN ALUMINUM FUSE FOR COMPATIBILITY WITH COPPER BEOL INTERCONNECT SCHEME | December 2013 | August 2014 | Allow | 8 | 0 | 0 | Yes | No |
| 14027837 | METHODS FOR FABRICATING INTEGRATED CIRCUITS | September 2013 | May 2015 | Allow | 20 | 2 | 1 | Yes | No |
| 13861074 | REVERSE-CONDUCTING SEMICONDUCTOR DEVICE | April 2013 | January 2015 | Allow | 22 | 2 | 0 | Yes | Yes |
| 13856246 | HIGH-K METAL GATE DEVICE STRUCTURE FOR HUMAN BLOOD GAS SENSING | April 2013 | January 2016 | Allow | 34 | 3 | 1 | Yes | No |
| 13738735 | METHOD OF FABRICATING CIGS BY SELENIZATION AT HIGH TEMPERATURE | January 2013 | December 2013 | Allow | 11 | 2 | 0 | Yes | No |
| 13737846 | Back-Contact for Thin Film Solar Cells Optimized for Light Trapping for Ultrathin Absorbers | January 2013 | November 2014 | Allow | 22 | 1 | 0 | Yes | No |
| 13611081 | NANOWIRE EFUSES | September 2012 | April 2014 | Allow | 19 | 3 | 0 | Yes | No |
| 13569394 | METHODOLOGY FOR EVALUATION OF ELECTRICAL CHARACTERISTICS OF CARBON NANOTUBES | August 2012 | April 2013 | Abandon | 8 | 2 | 0 | Yes | No |
| 13488532 | CIRCUIT TECHNIQUE TO ELECTRICALLY CHARACTERIZE BLOCK MASK SHIFTS | June 2012 | October 2014 | Allow | 28 | 2 | 2 | Yes | No |
| 13488870 | SYSTEM AND METHOD FOR FORMING ALUMINUM FUSE FOR COMPATIBILITY WITH COPPER BEOL INTERCONNECT SCHEME | June 2012 | August 2014 | Allow | 26 | 2 | 1 | Yes | No |
| 13513923 | SEMICONDUCTOR DEVICE USING CLOSE PROXIMITY WIRELESS COMMUNICATION | June 2012 | November 2014 | Allow | 29 | 2 | 1 | Yes | No |
| 13500034 | UNIT FOR SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE | June 2012 | July 2014 | Allow | 28 | 2 | 1 | Yes | No |
| 13394097 | Optoelectronic Module Comprising at Least One First Semiconductor Body Having a Radiation Outlet Side and an Insulation Layer and Method for the Production Thereof | May 2012 | June 2014 | Allow | 27 | 2 | 1 | Yes | No |
| 13393577 | WIRING CONNECTION METHOD AND FUNCTIONAL DEVICE | May 2012 | April 2014 | Allow | 25 | 2 | 1 | Yes | No |
| 13446462 | Patterning Embedded Control Lines for Vertically Stacked Semiconductor Elements | April 2012 | July 2014 | Allow | 27 | 4 | 0 | Yes | No |
| 13408187 | STRUCTURE AND METHOD OF FORMING ENHANCED ARRAY DEVICE ISOLATION FOR IMPLANTED PLATE EDRAM | February 2012 | February 2015 | Allow | 35 | 2 | 1 | Yes | No |
| 13399659 | PACKAGED MICROELECTRONIC DEVICES RECESSED IN SUPPORT MEMBER CAVITIES, AND ASSOCIATED METHODS | February 2012 | December 2012 | Allow | 10 | 1 | 0 | No | No |
| 13385264 | High-voltage transistor device with integrated resistor | February 2012 | June 2014 | Allow | 28 | 2 | 0 | Yes | No |
| 13369460 | THREE DIMENSIONAL INTEGRATED DEEP TRENCH DECOUPLING CAPACITORS | February 2012 | January 2013 | Allow | 11 | 2 | 0 | Yes | No |
| 13355748 | LOCALIZED ALLOYING FOR IMPROVED BOND RELIABILITY | January 2012 | February 2016 | Allow | 48 | 4 | 1 | Yes | Yes |
| 13344628 | STRUCTURE, SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING A SEMICONDUCTOR STRUCTURE AND PACKAGING THEREOF | January 2012 | November 2014 | Allow | 35 | 4 | 1 | Yes | No |
| 13344765 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME | January 2012 | May 2014 | Allow | 28 | 2 | 1 | Yes | No |
| 13285062 | MANUFACTURING METHOD OF PHOTOELECTRIC CONVERSION DEVICE | October 2011 | April 2014 | Allow | 29 | 2 | 1 | Yes | No |
| 13284080 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | October 2011 | September 2013 | Allow | 23 | 1 | 1 | No | No |
| 13283291 | BACK-CONTACT FOR THIN FILM SOLAR CELLS OPTIMIZED FOR LIGHT TRAPPING FOR ULTRATHIN ABSORBERS | October 2011 | June 2014 | Allow | 32 | 4 | 1 | Yes | No |
| 13264209 | METHOD OF MANUFACTURING OLED-ON-SILICON | October 2011 | February 2014 | Allow | 28 | 2 | 1 | Yes | No |
| 13283225 | METHOD OF FABRICATING CIGS BY SELENIZATION AT HIGH TEMPERATURE | October 2011 | October 2013 | Allow | 23 | 2 | 1 | Yes | No |
| 13200688 | METHOD OF DIVIDING A SEMICONDUCTOR WAFER HAVING SEMICONDUCTOR AND METAL LAYERS INTO SEPARATE DEVICES | September 2011 | February 2013 | Allow | 17 | 1 | 1 | Yes | No |
| 13211870 | METHOD FOR FORMING CU FILM AND STORAGE MEDIUM | August 2011 | November 2013 | Allow | 27 | 2 | 1 | Yes | No |
| 13101766 | LIQUID CRYSTAL DISPLAY DEVICE AND METHOD FOR MANUFACTURING THE SAME | May 2011 | June 2012 | Allow | 13 | 1 | 0 | No | No |
| 13079280 | SOLID-STATE IMAGING DEVICE AND CAMERA | April 2011 | July 2012 | Allow | 15 | 2 | 0 | Yes | No |
| 12949210 | SOLID-STATE IMAGING DEVICE AND CAMERA | November 2010 | April 2012 | Allow | 17 | 2 | 1 | Yes | No |
| 12941799 | LED-Based Light Source Utilizing Asymmetric Conductors | November 2010 | February 2013 | Allow | 27 | 5 | 1 | Yes | Yes |
| 12906766 | METHOD FOR PROVIDING OXIDE LAYERS | October 2010 | May 2014 | Allow | 42 | 4 | 0 | Yes | No |
| 12904104 | GYROSCOPE | October 2010 | May 2012 | Allow | 20 | 0 | 0 | No | No |
| 12872020 | MAGNETORESISTIVE RANDOM ACCESS MEMORY WITH IMPROVED LAYOUT DESIGN AND PROCESS THEREOF | August 2010 | December 2010 | Allow | 4 | 0 | 0 | No | No |
| 12846020 | METHOD OF FORMING SEMICONDUCTOR STRUCTURES WITH CONTACT HOLES | July 2010 | July 2016 | Allow | 60 | 5 | 1 | Yes | Yes |
| 12820880 | METHODOLOGY FOR EVALUATION OF ELECTRICAL CHARACTERISTICS OF CARBON NANOTUBES | June 2010 | May 2014 | Allow | 47 | 6 | 1 | Yes | No |
| 12819646 | REVERSE-CONDUCTING SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SUCH A REVERSE-CONDUCTING SEMICONDUCTOR DEVICE | June 2010 | January 2013 | Allow | 30 | 2 | 1 | Yes | Yes |
| 12773248 | SOLID-STATE IMAGING DEVICE AND CAMERA | May 2010 | January 2012 | Allow | 20 | 2 | 0 | No | No |
| 12659600 | METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE | March 2010 | November 2012 | Allow | 32 | 2 | 1 | Yes | No |
| 12694715 | METHOD OF FABRICATING SELF-ALIGNED CONTACT PAD USING CHEMICAL MECHANICAL POLISHING PROCESS | January 2010 | April 2010 | Allow | 3 | 0 | 0 | No | No |
| 12636539 | AUTO FEEDBACK APPARATUS FOR LASER MARKING | December 2009 | January 2012 | Allow | 25 | 1 | 1 | No | No |
| 12605971 | METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | October 2009 | September 2010 | Allow | 10 | 0 | 0 | Yes | No |
| 12511517 | METHOD FOR PREFERENTIAL GROWTH OF SEMICONDUCTING VERTICALLY ALIGNED SINGLE WALLED CARBON NANOTUBES | July 2009 | January 2012 | Allow | 29 | 1 | 0 | No | No |
| 12511119 | DIGITAL RADIOGRAPHIC FLAT-PANEL IMAGING ARRAY WITH DUAL HEIGHT SEMICONDUCTOR AND METHOD OF MAKING SAME | July 2009 | February 2011 | Allow | 19 | 0 | 1 | No | No |
| 12509780 | THREE DIMENSIONAL INTEGRATED DEEP TRENCH DECOUPLING CAPACITORS | July 2009 | November 2011 | Allow | 27 | 2 | 1 | Yes | No |
| 12524138 | THIN-FILM TRANSISTOR FABRICATION PROCESS AND DISPLAY DEVICE | July 2009 | March 2013 | Allow | 43 | 3 | 1 | Yes | No |
| 12457290 | SEMICONDUCTOR DEVICE | June 2009 | December 2011 | Allow | 30 | 1 | 1 | No | No |
| 12302740 | SEMICONDUCTOR DEVICE | June 2009 | August 2013 | Allow | 57 | 3 | 1 | Yes | No |
| 12476799 | NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND METHOD FOR MANUFACTURING SAME | June 2009 | August 2010 | Allow | 14 | 0 | 1 | No | No |
| 12425850 | HEAT CONDUCTIVE PLATE STRUCTURE | April 2009 | June 2011 | Allow | 26 | 0 | 1 | Yes | No |
| 12379348 | COPOLYMERS, POLYMER RESIN COMPOSITION FOR BUFFER LAYER METHOD OF FORMING A PATTERN USING THE SAME AND METHOD OF MANUFACTURING A CAPACITOR USING THE SAME | February 2009 | March 2010 | Allow | 13 | 0 | 0 | No | No |
| 12320279 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | January 2009 | August 2010 | Allow | 19 | 2 | 0 | No | No |
| 12320278 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | January 2009 | May 2011 | Allow | 27 | 2 | 1 | No | No |
| 12320240 | MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | January 2009 | February 2011 | Allow | 25 | 0 | 0 | No | No |
| 12277329 | CAPACITIVE SENSOR AND MANUFACTURING METHOD THEREFOR | November 2008 | February 2012 | Allow | 38 | 2 | 0 | No | Yes |
| 12275489 | SOLID-STATE IMAGING DEVICE AND CAMERA | November 2008 | March 2013 | Allow | 51 | 6 | 1 | Yes | Yes |
| 12273719 | CMOS RF IC | November 2008 | March 2012 | Allow | 40 | 5 | 0 | Yes | No |
| 12174357 | ELECTRONIC DEVICE INCLUDING A SEMICONDUCTOR FIN | July 2008 | May 2010 | Allow | 22 | 1 | 1 | No | No |
| 12160044 | METHOD FOR FABRICATING ROBUST LIGHT-EMITTING DIODES | July 2008 | December 2011 | Allow | 41 | 1 | 0 | No | No |
| 12150609 | METHOD OF FORMING ISOLATION STRUCTURE FOR SEMICONDUCTOR INTEGRATED CIRCUIT SUBSTRATE | April 2008 | February 2011 | Allow | 33 | 2 | 0 | No | No |
| 11970579 | METHOD AND STRUCTURE TO PROTECT FETS FROM PLASMA DAMAGE DURING FEOL PROCESSING | January 2008 | August 2010 | Allow | 32 | 2 | 1 | No | No |
| 11965698 | METHOD FOR FABRICATING CAPACITOR | December 2007 | April 2011 | Allow | 40 | 2 | 1 | No | No |
| 11928913 | DIELECTRIC MATERIAL WITH A REDUCED DIELECTRIC CONSTANT AND METHODS OF MANUFACTURING THE SAME | October 2007 | January 2011 | Allow | 39 | 2 | 0 | No | No |
| 11851082 | MANUFACTURE METHOD FOR SEMICONDUCTOR DEVICE HAVING FIELD OXIDE FILM | September 2007 | December 2009 | Allow | 27 | 1 | 1 | No | No |
| 11778516 | SEMICONDUCTOR MODULE | July 2007 | August 2009 | Allow | 25 | 2 | 1 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner TRAN, TONY.
With a 60.0% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 51.7% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner TRAN, TONY works in Art Unit 2893 and has examined 125 patent applications in our dataset. With an allowance rate of 96.0%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 29 months.
Examiner TRAN, TONY's allowance rate of 96.0% places them in the 85% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by TRAN, TONY receive 2.58 office actions before reaching final disposition. This places the examiner in the 72% percentile for office actions issued. This examiner issues a slightly above-average number of office actions.
The median time to disposition (half-life) for applications examined by TRAN, TONY is 29 months. This places the examiner in the 64% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a +2.9% benefit to allowance rate for applications examined by TRAN, TONY. This interview benefit is in the 25% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 27.6% of applications are subsequently allowed. This success rate is in the 51% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 20.8% of cases where such amendments are filed. This entry rate is in the 28% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.
When applicants request a pre-appeal conference (PAC) with this examiner, 95.2% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 70% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 84.4% of appeals filed. This is in the 78% percentile among all examiners. Of these withdrawals, 59.3% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 50.0% are granted (fully or in part). This grant rate is in the 45% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 10.4% of allowed cases (in the 94% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 1.7% of allowed cases (in the 68% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.