Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18675098 | SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME | May 2024 | August 2025 | Allow | 14 | 1 | 0 | No | No |
| 18656362 | DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME | May 2024 | February 2025 | Allow | 10 | 0 | 0 | No | No |
| 18624602 | SEMICONDUCTOR DEVICE | April 2024 | September 2025 | Allow | 17 | 1 | 0 | No | No |
| 18437058 | METHODS, SYSTEMS, AND APPARATUS FOR CONDUCTING A RADICAL TREATMENT OPERATION PRIOR TO CONDUCTING AN ANNEALING OPERATION | February 2024 | December 2025 | Allow | 22 | 1 | 1 | Yes | No |
| 18396840 | DISPLAY SUBSTRATE AND DISPLAY DEVICE | December 2023 | January 2025 | Allow | 13 | 1 | 0 | No | No |
| 18545270 | SOLID-STATE IMAGE CAPTURING ELEMENT, SOLID-STATE IMAGE CAPTURING DEVICE, AND SOLID-STATE IMAGE CAPTURING ELEMENT READING METHOD | December 2023 | August 2025 | Allow | 19 | 2 | 0 | No | No |
| 18514106 | SEMICONDUCTOR DEVICE WITH ANNULAR SEMICONDUCTOR FIN AND METHOD FOR PREPARING THE SAME | November 2023 | March 2026 | Allow | 28 | 0 | 0 | No | No |
| 18504050 | METHOD FOR DETECTING TEMPERATURE OF THERMAL CHAMBER | November 2023 | June 2024 | Allow | 7 | 0 | 0 | No | No |
| 18484596 | DISPLAY SUBSTRATE AND DISPLAY DEVICE | October 2023 | August 2025 | Allow | 22 | 1 | 0 | No | No |
| 18372241 | SEMICONDUCTOR DEVICE WITH ANNULAR SEMICONDUCTOR FIN AND METHOD FOR PREPARING THE SAME | September 2023 | December 2025 | Allow | 27 | 0 | 0 | No | No |
| 18471372 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | September 2023 | May 2024 | Allow | 8 | 1 | 0 | No | No |
| 18551780 | OPTOELECTRONIC SEMICONDUCTOR CHIP, MANUFACTURING METHOD AND SEMICONDUCTOR COMPONENT | September 2023 | February 2026 | Allow | 28 | 0 | 0 | No | No |
| 18283012 | DISPLAY PANELS | September 2023 | December 2025 | Allow | 27 | 0 | 0 | No | No |
| 18450963 | METHODS OF PARALLEL TRANSFER OF MICRO-DEVICES USING TREATMENT | August 2023 | August 2024 | Allow | 12 | 1 | 0 | No | No |
| 18232603 | SEMICONDUCTOR STRUCTURE WITH ENHANCED PLACEHOLDER POSITION MARGIN | August 2023 | November 2025 | Allow | 27 | 0 | 0 | No | No |
| 18446505 | PREPARATION METHOD FOR AMORPHOUS SILICON INTEGRATED WITH TUNNELING OXIDE LAYER | August 2023 | October 2025 | Allow | 26 | 0 | 0 | No | No |
| 18361207 | CHIP PACKAGE STRUCTURE WITH RING DAM | July 2023 | April 2025 | Allow | 20 | 0 | 1 | Yes | No |
| 18274369 | SEMICONDUCTOR PACKAGE INCLUDING BONDING WIRE COATED WITH OXIDE INSULATION, ELECTRONIC SYSTEM INCLUDING SAME, AND BATTERY MODULE INCLUDING SAME | July 2023 | September 2025 | Allow | 26 | 0 | 0 | No | No |
| 18225846 | SEMICONDUCTOR COMPONENT AND SEMICONDUCTOR DEVICE | July 2023 | November 2025 | Allow | 28 | 0 | 0 | No | No |
| 18358708 | Semiconductor Device With Air Gaps Between Metal Gates And Method Of Forming The Same | July 2023 | May 2024 | Allow | 10 | 0 | 1 | Yes | No |
| 18358379 | HIGHLY EFFICIENT OLED DEVICES WITH VERY SHORT DECAY TIMES | July 2023 | February 2025 | Allow | 19 | 2 | 0 | Yes | No |
| 18261605 | SUPPORT SUBSTRATE MADE OF SILICON SUITABLE FOR RADIOFREQUENCY APPLICATIONS AND ASSOCIATED MANUFACTURING METHOD | July 2023 | October 2025 | Allow | 27 | 0 | 0 | No | No |
| 18260713 | SYSTEMS AND TECHNIQUES FOR OPTICAL MEASUREMENT OF THIN FILMS | July 2023 | February 2026 | Allow | 31 | 0 | 1 | No | No |
| 18218882 | SEMICONDUCTOR ELEMENT AND DEVICE | July 2023 | February 2026 | Allow | 31 | 0 | 1 | No | No |
| 18344755 | METHOD FOR MONITORING GATE OXIDE THICKNESS | June 2023 | September 2025 | Allow | 27 | 0 | 0 | Yes | No |
| 18212827 | METHOD OF FORMING SILICON WITHIN A GAP ON A SURFACE OF A SUBSTRATE | June 2023 | November 2025 | Allow | 29 | 0 | 0 | No | No |
| 18212136 | MEASUREMENT OF LATERAL DOPANT CONCENTRATION AND DISTRIBUTION IN HIGH ASPECT RATIO TRENCH STRUCTURES | June 2023 | November 2025 | Allow | 29 | 0 | 1 | No | No |
| 18337115 | SEMICONDUCTOR MEMORY DEVICE | June 2023 | January 2026 | Allow | 31 | 0 | 1 | Yes | No |
| 18206593 | CHIP PACKAGE WITH HIGHER BEARING CAPACITY IN WIRE BONDING | June 2023 | August 2025 | Allow | 27 | 0 | 0 | No | No |
| 18204474 | ORGANIC ELECTROLUMINESCENT ELEMENT AND ELECTRONIC DEVICE | June 2023 | August 2025 | Allow | 26 | 0 | 0 | No | No |
| 18323907 | SEMICONDUCTOR DEVICES WITH BACKSIDE AIR GAP DIELECTRIC | May 2023 | September 2024 | Allow | 16 | 1 | 0 | No | No |
| 18201868 | SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME | May 2023 | March 2024 | Allow | 10 | 0 | 1 | No | No |
| 18303975 | MANUFACTURING METHOD OF A SEMICONDUCTOR MEMORY DEVICE | April 2023 | February 2024 | Allow | 10 | 0 | 1 | No | No |
| 18300708 | VOLTAGE-ISOLATED INTEGRATED CIRCUIT PACKAGES | April 2023 | November 2025 | Allow | 31 | 0 | 1 | No | No |
| 18028454 | POWER SEMICONDUCTOR DEVICE AND OPERATING METHOD | March 2023 | October 2025 | Allow | 30 | 0 | 0 | No | No |
| 18125294 | Method for Reducing Loss of Dielectric Layer in IO Silicon Oxide Removal Process | March 2023 | July 2025 | Allow | 28 | 0 | 0 | No | No |
| 18246281 | METHOD FOR MANUFACTURING PACKAGING ENCLOSURE AND METHOD FOR MANUFACTURING PACKAGING CHIP | March 2023 | July 2025 | Allow | 28 | 0 | 0 | No | No |
| 18123484 | SEMICONDUCTOR STRUCTURE AND FORMING METHOD THEREOF | March 2023 | July 2023 | Allow | 4 | 0 | 0 | No | No |
| 18183789 | METHOD FOR MANUFACTURING TRENCH MOSFET | March 2023 | June 2025 | Allow | 27 | 0 | 0 | No | No |
| 18116000 | GaN Devices With Ion Implanted Ohmic Contacts and Method of Fabricating Devices Incorporating the Same | March 2023 | October 2023 | Allow | 7 | 1 | 0 | No | No |
| 18111923 | SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, INVERTER CIRCUIT, DRIVE DEVICE, VEHICLE, AND ELEVATOR | February 2023 | June 2023 | Allow | 4 | 0 | 0 | No | No |
| 18160533 | SILICON CARBIDE SEMICONDUCTOR DEVICE AND SILICON CARBIDE SEMICONDUCTOR SUBSTRATE | January 2023 | October 2025 | Allow | 33 | 0 | 0 | No | No |
| 18158318 | SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE | January 2023 | February 2026 | Abandon | 37 | 0 | 1 | No | No |
| 18099380 | THIN FILM TRANSISTOR INCLUDING CRYSTALLIZED SEMICONDUCTOR, DISPLAY DEVICE INCLUDING THE SAME, MANUFACTURING METHOD OF THE SAME, AND METHOD FOR CRYSTALLIZING SEMICONDUCTOR | January 2023 | September 2024 | Allow | 20 | 2 | 1 | No | No |
| 18016755 | LOW-LEAKAGE SCHOTTKY DIODES AND METHOD OF MAKING A POWER SEMICONDUCTOR DEVICE | January 2023 | February 2026 | Allow | 37 | 0 | 1 | No | No |
| 18154492 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING APPARATUS, RECORDING MEDIUM AND METHOD OF PROCESSING SUBSTRATE | January 2023 | April 2025 | Allow | 27 | 1 | 2 | No | No |
| 18085677 | IMPLANTED ISOLATION FOR DEVICE INTEGRATION ON A COMMON SUBSTRATE | December 2022 | February 2024 | Allow | 14 | 2 | 1 | Yes | No |
| 18086220 | ROOM TEMPERATURE GLASS-TO-GLASS, GLASS-TO-PLASTIC AND GLASS-TO-GLASS CERAMIC/SEMICONDUCTOR BONDING | December 2022 | October 2025 | Abandon | 34 | 0 | 2 | No | No |
| 18007985 | SIC SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SIC SEMICONDUCTOR DEVICE | December 2022 | June 2025 | Allow | 31 | 0 | 1 | No | No |
| 18060191 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | November 2022 | June 2025 | Allow | 30 | 0 | 1 | No | No |
| 18058915 | SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES | November 2022 | July 2025 | Allow | 32 | 0 | 1 | No | No |
| 17925987 | SEMICONDUCTOR DEVICE | November 2022 | April 2025 | Allow | 29 | 0 | 0 | No | No |
| 18055032 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME | November 2022 | May 2025 | Allow | 30 | 0 | 1 | No | No |
| 17985538 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | November 2022 | July 2023 | Allow | 8 | 0 | 1 | No | No |
| 17984797 | SEMICONDUCTOR DEVICE | November 2022 | February 2023 | Allow | 4 | 0 | 0 | No | No |
| 17977420 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | October 2022 | May 2025 | Allow | 31 | 0 | 1 | No | No |
| 18048167 | TRANSISTOR WITH BUFFER STRUCTURE HAVING CARBON DOPED PROFILE | October 2022 | September 2025 | Allow | 35 | 0 | 0 | No | No |
| 18047581 | SEMICONDUCTOR DEVICE | October 2022 | January 2026 | Allow | 39 | 1 | 1 | Yes | No |
| 17967114 | RESISTIVE RANDOM-ACCESS MEMORY STRUCTURES WITH STACKED TRANSISTORS | October 2022 | March 2025 | Allow | 29 | 0 | 0 | No | No |
| 18046420 | DISPLAY APPARATUS | October 2022 | March 2025 | Allow | 29 | 0 | 0 | No | No |
| 17933748 | LIGHT-EMITTING DEVICE AND ELECTRONIC APPARATUS INCLUDING THE SAME | September 2022 | March 2025 | Allow | 30 | 0 | 0 | No | No |
| 17945467 | SEMICONDUCTOR DEVICE WITH GATE STRUCTURE AND CURRENT SPREAD REGION | September 2022 | August 2025 | Allow | 35 | 0 | 1 | Yes | No |
| 17903342 | BURIED METAL SIGNAL RAIL FOR MEMORY ARRAYS | September 2022 | May 2025 | Allow | 33 | 0 | 1 | No | No |
| 17902074 | SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, INVERTER CIRCUIT, DRIVER DEVICE, VEHICLE, AND ELEVATOR | September 2022 | June 2023 | Allow | 9 | 1 | 0 | No | No |
| 17929398 | SEMICONDUCTOR DEVICE | September 2022 | May 2025 | Allow | 32 | 0 | 1 | No | No |
| 17908344 | ORGANIC EL DISPLAY DEVICE AND PHOTOSENSITIVE RESIN COMPOSITION | August 2022 | October 2025 | Abandon | 38 | 0 | 1 | No | No |
| 17820304 | METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE | August 2022 | February 2024 | Allow | 18 | 2 | 0 | Yes | No |
| 17819391 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, THERMALLY CONDUCTIVE SHEET, AND METHOD OF MANUFACTURING THERMALLY CONDUCTIVE SHEET | August 2022 | October 2025 | Allow | 38 | 4 | 0 | Yes | No |
| 17883475 | FEED-FORWARD DEVICE FABRICATION | August 2022 | February 2026 | Allow | 42 | 0 | 1 | No | No |
| 17818044 | THERMALLY CONDUCTIVE SHEET AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | August 2022 | August 2024 | Allow | 25 | 4 | 0 | Yes | No |
| 17815954 | MEMORY AND FORMING METHOD THEREOF | July 2022 | April 2025 | Allow | 33 | 0 | 1 | No | No |
| 17875998 | SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND MANUFACTURING APPARATUS OF SEMICONDUCTOR DEVICE | July 2022 | April 2023 | Allow | 9 | 0 | 1 | No | No |
| 17873903 | SEMICONDUCTOR DEVICES WITH BACKSIDE AIR GAP DIELECTRIC | July 2022 | January 2023 | Allow | 5 | 0 | 0 | No | No |
| 17861679 | Semiconductor Device With Air Gaps Between Metal Gates And Method Of Forming The Same | July 2022 | April 2023 | Allow | 10 | 1 | 0 | No | No |
| 17859575 | ENHANCEMENT MODE TRANSISTOR DEVICE | July 2022 | March 2023 | Allow | 8 | 1 | 0 | No | No |
| 17859577 | Measurement Method, Measurement System, and Non-Transitory Computer Readable Medium | July 2022 | June 2025 | Allow | 35 | 0 | 1 | No | No |
| 17758061 | DISPLAY PANEL AND DISPLAY DEVICE | June 2022 | May 2025 | Allow | 35 | 0 | 1 | No | No |
| 17835231 | POWER SEMICONDUCTOR DEVICE CAPABLE OF CONTROLLING SLOPE OF CURRENT AND VOLTAGE DURING DYNAMIC SWITCHING | June 2022 | September 2025 | Allow | 39 | 0 | 1 | No | No |
| 17835241 | SEMICONDUCTOR WAFER OF MONOCRYSTALLINE SILICON AND METHOD OF PRODUCING THE SEMICONDUCTOR WAFER | June 2022 | December 2022 | Allow | 6 | 0 | 0 | No | No |
| 17834804 | METHODS FOR DETERMINING SUITABILITY OF SILICON SUBSTRATES FOR EPITAXY | June 2022 | September 2024 | Allow | 27 | 1 | 1 | No | No |
| 17739753 | SEMICONDUCTOR DEVICE | May 2022 | December 2023 | Allow | 20 | 1 | 0 | No | No |
| 17736478 | Display System and Method for Making and Using Same | May 2022 | March 2025 | Allow | 34 | 0 | 0 | No | No |
| 17734266 | Methods Of Cooling Semiconductor Devices | May 2022 | August 2023 | Allow | 16 | 0 | 1 | No | No |
| 17729191 | SEMICONDUCTOR CHIP MANUFACTURING METHOD | April 2022 | October 2024 | Allow | 29 | 2 | 1 | Yes | No |
| 17728842 | LDMOS TRANSISTORS INCLUDING VERTICAL GATES WITH MULTIPLE DIELECTRIC SECTIONS, AND ASSOCIATED METHODS | April 2022 | February 2023 | Allow | 10 | 0 | 1 | Yes | No |
| 17726980 | METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE AND SILICON CARBIDE SEMICONDUCTOR DEVICE | April 2022 | September 2024 | Allow | 29 | 0 | 1 | Yes | No |
| 17715750 | MANUFACTURING METHOD OF A SEMICONDUCTOR MEMORY DEVICE | April 2022 | February 2023 | Allow | 11 | 0 | 1 | No | No |
| 17710092 | FABRICATION OF ELECTRONIC DEVICES USING SACRIFICIAL SEED LAYERS | March 2022 | June 2023 | Allow | 15 | 1 | 0 | No | No |
| 17705407 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | March 2022 | December 2022 | Allow | 9 | 0 | 0 | No | No |
| 17699181 | MANUFACTURING METHOD FOR THERMAL CONDUCTIVE LAYER, MANUFACTURING METHOD FOR LAMINATE, AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE | March 2022 | August 2023 | Allow | 17 | 0 | 0 | No | No |
| 17653168 | SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, INVERTER CIRCUIT, DRIVE DEVICE, VEHICLE, AND ELEVATOR | March 2022 | September 2024 | Allow | 30 | 0 | 1 | No | No |
| 17681536 | METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE | February 2022 | September 2023 | Allow | 19 | 0 | 0 | No | No |
| 17678967 | GaN/DIAMOND WAFERS | February 2022 | October 2023 | Allow | 20 | 1 | 1 | No | No |
| 17678975 | GaN/DIAMOND WAFERS | February 2022 | October 2023 | Allow | 20 | 1 | 1 | No | No |
| 17671562 | NITRIDE-BASED SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | February 2022 | August 2024 | Allow | 30 | 1 | 0 | No | No |
| 17671558 | NITRIDE-BASED SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | February 2022 | March 2025 | Allow | 37 | 1 | 1 | No | No |
| 17671555 | NITRIDE-BASED SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | February 2022 | March 2025 | Allow | 37 | 1 | 1 | Yes | No |
| 17669831 | SEMICONDUCTOR DEVICE HAVING A CURRENT SPREADING REGION | February 2022 | September 2024 | Allow | 31 | 0 | 1 | No | No |
| 17667993 | SENSOR PACKAGE AND METHOD OF MANUFACTURING THE SAME | February 2022 | February 2025 | Allow | 36 | 0 | 1 | No | No |
| 17590122 | METHOD OF MANUFACTURING MAGNETIC TUNNEL JUNCTION AND MAGNETIC TUNNEL JUNCTION | February 2022 | January 2023 | Allow | 12 | 0 | 1 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner CHEN, JACK S J.
With a 0.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 33.3% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner CHEN, JACK S J works in Art Unit 2893 and has examined 1,030 patent applications in our dataset. With an allowance rate of 85.1%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 24 months.
Examiner CHEN, JACK S J's allowance rate of 85.1% places them in the 61% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by CHEN, JACK S J receive 1.16 office actions before reaching final disposition. This places the examiner in the 13% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by CHEN, JACK S J is 24 months. This places the examiner in the 84% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a -1.1% benefit to allowance rate for applications examined by CHEN, JACK S J. This interview benefit is in the 10% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 29.7% of applications are subsequently allowed. This success rate is in the 57% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 15.7% of cases where such amendments are filed. This entry rate is in the 17% percentile among all examiners. Strategic Recommendation: This examiner rarely enters after-final amendments compared to other examiners. You should generally plan to file an RCE or appeal rather than relying on after-final amendment entry. Per MPEP § 714.12, primary examiners have discretion in entering after-final amendments, and this examiner exercises that discretion conservatively.
When applicants request a pre-appeal conference (PAC) with this examiner, 105.3% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 78% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 80.8% of appeals filed. This is in the 74% percentile among all examiners. Of these withdrawals, 52.4% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.
When applicants file petitions regarding this examiner's actions, 41.7% are granted (fully or in part). This grant rate is in the 33% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 8.7% of allowed cases (in the 92% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 1.1% of allowed cases (in the 62% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.