Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18783965 | 3D SEMICONDUCTOR DEVICE AND STRUCTURE WITH METAL LAYERS | July 2024 | July 2025 | Allow | 11 | 1 | 0 | No | No |
| 18657751 | Semiconductor Structure and Method of Fabricating the Same | May 2024 | June 2025 | Allow | 13 | 2 | 1 | Yes | No |
| 18626777 | SEMICONDUCTOR DEVICE | April 2024 | April 2025 | Allow | 12 | 1 | 0 | No | No |
| 18597813 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES AND SEMICONDUCTOR DEVICES | March 2024 | July 2025 | Allow | 17 | 1 | 0 | Yes | No |
| 18581241 | Gate Structures Having Neutral Zones to Minimize Metal Gate Boundary Effects and Methods of Fabricating Thereof | February 2024 | February 2025 | Allow | 12 | 0 | 1 | No | No |
| 18433867 | SEMICONDUCTOR DEVICE HAVING CUT GATE DIELECTRIC | February 2024 | October 2025 | Allow | 20 | 2 | 0 | No | No |
| 18517277 | COMPACT ELECTRICAL CONNECTION THAT CAN BE USED TO FORM AN SRAM CELL AND METHOD OF MAKING THE SAME | November 2023 | May 2025 | Allow | 18 | 0 | 0 | No | No |
| 18516719 | LINE-END EXTENSION METHOD AND DEVICE | November 2023 | February 2026 | Allow | 27 | 2 | 0 | No | No |
| 18546255 | IMAGING DEVICE AND ELECTRONIC APPARATUS INCLUDING AT LEAST ONE LIGHT-BLOCKING SECTION | August 2023 | November 2025 | Allow | 28 | 1 | 0 | Yes | No |
| 18446190 | Semiconductor Device with Air-Spacer | August 2023 | July 2025 | Allow | 23 | 2 | 0 | No | No |
| 18358909 | SGT MOSFET DEVICE AND MANUFACTURING METHOD OF CONTACT HOLES OF SGT MOSFET DEVICE | July 2023 | January 2026 | Allow | 30 | 1 | 0 | Yes | No |
| 18357247 | PNP CONTROLLED ESD PROTECTION DEVICE WITH HIGH HOLDING VOLTAGE AND SNAPBACK | July 2023 | August 2025 | Allow | 24 | 1 | 0 | No | No |
| 18220499 | ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT INCLUDING A FIRST RESISTOR AND A SECOND RESISTOR | July 2023 | January 2025 | Allow | 18 | 1 | 0 | No | No |
| 18258049 | OPTICAL DETECTION DEVICE | June 2023 | September 2025 | Allow | 27 | 1 | 0 | Yes | No |
| 18320201 | ELECTRO-STATIC DISCHARGE PROTECTION DEVICES HAVING A LOW TRIGGER VOLTAGE | May 2023 | August 2025 | Allow | 27 | 3 | 0 | Yes | No |
| 18319489 | ELECTRO-STATIC DISCHARGE PROTECTION DEVICES HAVING A LOW TRIGGER VOLTAGE | May 2023 | March 2025 | Allow | 22 | 2 | 0 | Yes | No |
| 18319782 | DISPLAY DEVICE | May 2023 | March 2026 | Allow | 34 | 1 | 0 | Yes | No |
| 18307786 | MEMORY DEVICE, SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE MEMORY DEVICE | April 2023 | April 2025 | Allow | 24 | 0 | 0 | No | No |
| 18139025 | Weight Optimized Stiffener and Sealing Structure for Direct Liquid Cooled Modules | April 2023 | December 2025 | Allow | 32 | 2 | 0 | No | No |
| 18135637 | IMAGE SENSOR AND ELECTRONIC SYSTEM INCLUDING THE SAME | April 2023 | December 2025 | Allow | 32 | 1 | 1 | Yes | No |
| 18031158 | IMAGE SENSOR AND IMAGING DEVICE | April 2023 | February 2026 | Allow | 34 | 1 | 0 | No | No |
| 18130256 | IMAGING ELEMENT, LAMINATED IMAGING ELEMENT, AND SOLID-STATE IMAGING DEVICE | April 2023 | October 2025 | Allow | 30 | 2 | 0 | Yes | No |
| 18193557 | COMPACT ELECTRICAL CONNECTION THAT CAN BE USED TO FORM AN SRAM CELL AND METHOD OF MAKING THE SAME | March 2023 | December 2025 | Allow | 33 | 2 | 0 | No | No |
| 18190221 | Device And Method For Tuning Threshold Voltage By Implementing Different Work Function Metals In Different Segments Of A Gate | March 2023 | October 2025 | Allow | 31 | 2 | 0 | Yes | No |
| 18119959 | Etching and Encapsulation Scheme for Magnetic Tunnel Junction Fabrication | March 2023 | March 2025 | Allow | 25 | 3 | 0 | No | No |
| 18176671 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE | March 2023 | March 2026 | Abandon | 36 | 2 | 0 | No | No |
| 18174601 | IMAGING APPARATUS | February 2023 | August 2025 | Allow | 30 | 1 | 0 | No | No |
| 18113277 | DISPLAY DEVICE | February 2023 | June 2025 | Allow | 27 | 0 | 0 | No | No |
| 18172730 | Image Sensor with a Bond Pad | February 2023 | January 2026 | Allow | 35 | 2 | 1 | No | No |
| 18109127 | MEMS PRESSURE SENSOR | February 2023 | March 2025 | Allow | 25 | 2 | 1 | No | No |
| 18158217 | HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING AN ISOLATION REGION | January 2023 | January 2025 | Allow | 24 | 2 | 0 | No | No |
| 18155583 | MANUFACTURING METHOD FOR DISPLAY DEVICE, PANEL INCLUDING LIGHT EMITTING PANELS FOR MANUFACTURING DISPLAY DEVICE, AND DISPLAY DEVICE | January 2023 | February 2026 | Allow | 37 | 1 | 1 | No | No |
| 18005094 | SOLID-STATE IMAGING APPARATUS, METHOD FOR MANUFACTURING SOLID-STATE IMAGING APPARATUS, AND ELECTRONIC APPARATUS | January 2023 | November 2025 | Allow | 34 | 1 | 0 | No | No |
| 18152224 | SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF | January 2023 | December 2025 | Allow | 35 | 1 | 1 | No | No |
| 18094789 | SEMICONDUCTOR DEVICES | January 2023 | August 2025 | Allow | 31 | 1 | 0 | Yes | No |
| 18149760 | SUBSTRATE CONTACT IN WAFER BACKSIDE | January 2023 | December 2025 | Allow | 35 | 1 | 0 | Yes | No |
| 18003960 | SOLID-STATE IMAGING DEVICE AND MANUFACTURING METHOD THEREFOR | December 2022 | December 2025 | Allow | 35 | 1 | 0 | No | No |
| 18003549 | SOLID-STATE IMAGING DEVICE AND ELECTRONIC APPARATUS | December 2022 | October 2025 | Abandon | 34 | 1 | 0 | No | No |
| 18064660 | SEMICONDUCTOR PACKAGE | December 2022 | October 2025 | Allow | 34 | 1 | 1 | Yes | No |
| 18075034 | TRANSISTORS WITH BACKSIDE SOURCE/DRAIN CONTACT AND SPACER | December 2022 | September 2025 | Allow | 34 | 1 | 0 | Yes | No |
| 18060056 | LATE MIDDLE-OF-LINE GATE CUT WITH POWER BAR FORMATION | November 2022 | November 2025 | Allow | 35 | 1 | 0 | Yes | No |
| 17926046 | III-NITRIDE LED WITH UV EMISSION BY AUGER CARRIER INJECTION | November 2022 | March 2026 | Allow | 40 | 1 | 1 | No | No |
| 17989026 | DETECTION DEVICE AND DISPLAY DEVICE | November 2022 | July 2025 | Allow | 32 | 1 | 0 | Yes | No |
| 17985959 | LIGHT EMITTING DISPLAY APPARATUS | November 2022 | December 2025 | Allow | 37 | 1 | 0 | No | No |
| 18054835 | READ-ONLY MEMORY WITH VERTICAL TRANSISTORS | November 2022 | April 2025 | Allow | 29 | 1 | 1 | Yes | No |
| 17977805 | DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME | October 2022 | September 2025 | Allow | 35 | 0 | 1 | No | No |
| 17970965 | TRENCH GATE METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURE | October 2022 | October 2025 | Allow | 36 | 1 | 0 | No | No |
| 17969146 | MAGNETIC FIELD-FREE SPIN-ORBIT TORQUE SWITCHING DEVICE USING SAPPHIRE MISCUT SUBSTRATE | October 2022 | January 2026 | Allow | 39 | 2 | 0 | No | No |
| 17913807 | DISPLAY SUBSTRATE, METHOD FOR MANUFACTURING SAME AND DISPLAY DEVICE | September 2022 | January 2026 | Allow | 40 | 2 | 0 | No | No |
| 17900073 | 3D SEMICONDUCTOR DEVICE AND STRUCTURE | August 2022 | February 2023 | Allow | 5 | 1 | 0 | No | No |
| 17818437 | CHIP PACKAGE STRUCTURE WITH HEAT CONDUCTIVE LAYER | August 2022 | September 2025 | Allow | 37 | 5 | 1 | Yes | No |
| 17884293 | METHOD OF SEMICONDUCTOR LAYOUT WITH DIFFERENT ROW HEIGHTS | August 2022 | October 2025 | Allow | 38 | 2 | 1 | No | No |
| 17816619 | SEMICONDUCTOR PACKAGE AND METHOD OF TESTING THE SAME | August 2022 | February 2026 | Allow | 43 | 1 | 1 | Yes | No |
| 17876331 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | July 2022 | October 2025 | Allow | 38 | 1 | 1 | Yes | No |
| 17874279 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES HAVING DIFFERENT GATE DIELECTRIC THICKNESS WITHIN ONE TRANSISTOR | July 2022 | June 2025 | Allow | 35 | 4 | 0 | Yes | No |
| 17843957 | 3D SEMICONDUCTOR DEVICE AND STRUCTURE | June 2022 | August 2022 | Allow | 2 | 0 | 0 | No | No |
| 17840027 | PHOTOSENSITIVE SENSOR AND CORRESPONDING MANUFACTURING METHOD | June 2022 | October 2025 | Allow | 40 | 1 | 1 | No | No |
| 17838434 | PACKAGE STRUCTURE WITH FAN-OUT FEATURE | June 2022 | September 2025 | Allow | 39 | 5 | 1 | No | No |
| 17806131 | STRUCTURE INCLUDING DISCRETE DIELECTRIC MEMBER FOR PROTECTING FIRST AIR GAP DURING FORMING OF SECOND AIR GAP | June 2022 | January 2026 | Allow | 44 | 3 | 1 | Yes | No |
| 17685060 | METAL MATRIX COMPOSITE LAYERS FOR HEAT DISSIPATION FROM INTEGRATED CIRCUIT DEVICES | March 2022 | January 2026 | Allow | 46 | 1 | 1 | No | No |
| 17586412 | ETCHING TO REDUCE LINE WIGGLING | January 2022 | February 2025 | Allow | 36 | 4 | 1 | Yes | No |
| 17586730 | 3D SEMICONDUCTOR DEVICE AND STRUCTURE | January 2022 | June 2022 | Allow | 4 | 0 | 0 | No | No |
| 17543041 | MEMS CAVITY WITH NON-CONTAMINATING SEAL | December 2021 | December 2022 | Allow | 13 | 0 | 0 | Yes | No |
| 17524489 | IMAGE SENSING DEVICE | November 2021 | July 2025 | Allow | 44 | 1 | 1 | No | No |
| 17522974 | GATE-CUT AND SEPARATION TECHNIQUES FOR ENABLING INDEPENDENT GATE CONTROL OF STACKED TRANSISTORS | November 2021 | May 2025 | Allow | 42 | 1 | 1 | Yes | No |
| 17523418 | THREE DIMENSIONAL MEMORY DEVICE AND METHOD OF MAKING THEREOF BY FORMING CHANNEL AND MEMORY FILM AFTER WORD LINE REPLACEMENT | November 2021 | July 2025 | Allow | 44 | 1 | 1 | No | No |
| 17472667 | 3D SEMICONDUCTOR DEVICE AND STRUCTURE | September 2021 | January 2022 | Allow | 4 | 0 | 0 | No | No |
| 17471661 | MANUFACTURING PROCESS OF ELEMENT CHIP USING LASER GROOVING AND PLASMA-ETCHING | September 2021 | September 2022 | Allow | 13 | 0 | 0 | No | No |
| 17406183 | Phosphorus Fugitive Emission Control | August 2021 | September 2022 | Allow | 13 | 0 | 0 | No | No |
| 17367386 | 3D SEMICONDUCTOR DEVICE AND STRUCTURE | July 2021 | September 2021 | Allow | 2 | 0 | 0 | No | No |
| 17345488 | THIN FILM OBSCURANT FOR MICROELECTRONICS | June 2021 | December 2024 | Allow | 42 | 4 | 0 | Yes | No |
| 17340075 | SEMICONDUCTOR DEVICE COMPRISING A DEEP TRENCH ISOLATION STRUCTURE AND A TRAP RICH ISOLATION STRUCTURE IN A SUBSTRATE AND A METHOD OF MAKING THE SAME | June 2021 | October 2022 | Allow | 17 | 1 | 0 | No | No |
| 17214110 | INTEGRATED CIRCUIT DEVICE AND METHOD FOR ESD PROTECTION | March 2021 | June 2025 | Allow | 50 | 1 | 1 | No | No |
| 17197170 | SEMICONDUCTOR STORAGE DEVICE | March 2021 | March 2025 | Abandon | 48 | 2 | 2 | No | No |
| 17195211 | Conductive Feature Formation and Structure Using Bottom-Up Filling Deposition | March 2021 | July 2025 | Allow | 53 | 3 | 1 | No | No |
| 17187993 | LOW NOISE AMPLIFIER TRANSISTORS WITH DECREASED NOISE FIGURE AND LEAKAGE IN SILICON-ON-INSULATOR TECHNOLOGY | March 2021 | September 2022 | Allow | 19 | 0 | 0 | No | No |
| 17187396 | TILTED TRANSFER GATE FOR ADVANCED CMOS IMAGE SENSOR | February 2021 | December 2022 | Allow | 22 | 0 | 1 | No | No |
| 17169432 | 3D SEMICONDUCTOR DEVICE AND STRUCTURE | February 2021 | June 2021 | Allow | 4 | 1 | 0 | No | No |
| 17162315 | DISPLAY DEVICE | January 2021 | January 2025 | Allow | 48 | 2 | 1 | No | No |
| 17159102 | SEMICONDUCTOR DEVICE | January 2021 | January 2025 | Allow | 48 | 3 | 1 | No | No |
| 17159036 | THREE-DIMENSIONAL MEMORY DEVICE AND MANUFACTURING METHOD THEREOF | January 2021 | January 2025 | Allow | 48 | 1 | 1 | No | No |
| 17143407 | SNAPBACK ELECTROSTATIC DISCHARGE (ESD) CIRCUIT, SYSTEM AND METHOD OF FORMING THE SAME | January 2021 | March 2025 | Allow | 50 | 3 | 1 | Yes | No |
| 17132971 | ELECTROLUMINESCENT DEVICE, AND DISPLAY DEVICE COMPRISING THE SAME | December 2020 | August 2022 | Allow | 20 | 0 | 0 | No | No |
| 17095259 | NEGATIVE TRANSCONDUCTANCE DEVICE AND MULTI-VALUED INVERTER LOGIC DEVICE USING THE SAME | November 2020 | December 2022 | Allow | 25 | 0 | 1 | No | No |
| 17053888 | IMAGING DEVICE | November 2020 | March 2025 | Allow | 52 | 4 | 0 | No | No |
| 17069823 | Integrated Silicon Photonics Platforms for Scalable Quantum Systems | October 2020 | October 2025 | Allow | 60 | 3 | 2 | Yes | No |
| 17065424 | 3D SEMICONDUCTOR DEVICE AND STRUCTURE | October 2020 | January 2021 | Allow | 3 | 0 | 0 | No | No |
| 17064285 | READ-ONLY MEMORY WITH VERTICAL TRANSISTORS | October 2020 | September 2022 | Allow | 23 | 1 | 1 | Yes | No |
| 17034194 | METHOD OF PREPARING AN ISOLATION REGION IN A HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE | September 2020 | March 2022 | Allow | 18 | 0 | 0 | No | No |
| 17034159 | METHOD OF PREPARING AN ISOLATION REGION IN A HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE | September 2020 | October 2022 | Allow | 25 | 1 | 0 | No | No |
| 17012896 | MEMS PRESSURE SENSOR | September 2020 | December 2022 | Allow | 27 | 1 | 0 | No | No |
| 16947530 | GROUNDING TECHNIQUES FOR BACKSIDE-BIASED SEMICONDUCTOR DICE AND RELATED DEVICES, SYSTEMS AND METHODS | August 2020 | June 2022 | Allow | 23 | 2 | 0 | No | No |
| 16985818 | PROCESS FOR MANUFACTURING A MEMS MICROMIRROR DEVICE, AND ASSOCIATED DEVICE | August 2020 | December 2021 | Allow | 16 | 0 | 0 | No | No |
| 16985174 | METHOD FOR FORMING SEMICONDUCTOR DEVICE | August 2020 | April 2022 | Allow | 21 | 1 | 1 | Yes | No |
| 16933082 | SEAL RING STRUCTURES AND METHODS OF FORMING SAME | July 2020 | January 2022 | Allow | 18 | 1 | 0 | Yes | No |
| 16927861 | CMP Stop Layer and Sacrifice Layer for High Yield Small Size MRAM Devices | July 2020 | August 2022 | Allow | 26 | 1 | 0 | No | No |
| 16912369 | ETCH PROFILE CONTROL OF INTERCONNECT STRUCTURES | June 2020 | July 2022 | Allow | 24 | 1 | 0 | Yes | No |
| 16897234 | SEMICONDUCTOR DEVICE INCLUDING A FIN-FET AND METHOD OF MANUFACTURING THE SAME | June 2020 | September 2021 | Allow | 15 | 0 | 0 | No | No |
| 16897229 | SEMICONDUCTOR DEVICE INCLUDING A FIN-FET AND METHOD OF MANUFACTURING THE SAME | June 2020 | February 2022 | Allow | 20 | 1 | 1 | No | No |
| 16886782 | SEMICONDUCTOR PACKAGE STRUCTURE WITH LANDING PADS AND MANUFACTURING METHOD THEREOF | May 2020 | June 2022 | Allow | 25 | 1 | 1 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner RAHIM, NILUFA.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 72.7% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner RAHIM, NILUFA works in Art Unit 2893 and has examined 395 patent applications in our dataset. With an allowance rate of 82.0%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 24 months.
Examiner RAHIM, NILUFA's allowance rate of 82.0% places them in the 54% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by RAHIM, NILUFA receive 1.94 office actions before reaching final disposition. This places the examiner in the 48% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by RAHIM, NILUFA is 24 months. This places the examiner in the 84% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a -5.2% benefit to allowance rate for applications examined by RAHIM, NILUFA. This interview benefit is in the 5% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 32.9% of applications are subsequently allowed. This success rate is in the 70% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 29.1% of cases where such amendments are filed. This entry rate is in the 41% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.
When applicants request a pre-appeal conference (PAC) with this examiner, 150.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 90% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 95% percentile among all examiners. Of these withdrawals, 70.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 41.4% are granted (fully or in part). This grant rate is in the 33% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 28% percentile). This examiner makes examiner's amendments less often than average. You may need to make most claim amendments yourself.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 3.7% of allowed cases (in the 76% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.