USPTO Art Unit 2877 Prosecution Statistics

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
19043183HIGH INTENSITY ILLUMINATION SYSTEMS AND METHODS OF USE THEREOFJanuary 2025June 2025Allow410NoNo
19035744COMPACT FIBER OPTIC GYROSCOPE WITH FEEDBACK-ENHANCED FREQUENCY INTERFEROMETRY FOR PRECISION MEASUREMENTJanuary 2025April 2025Allow200NoNo
19025771NON-CONTACT OPTICAL AXIS AND PUPIL CENTER DETECTION APPARATUSJanuary 2025May 2025Allow410YesNo
19020962Cell Sorting Using A High Throughput Fluorescence Flow CytometerJanuary 2025March 2025Allow200NoNo
18880001PARTICLES CHARACTERIZATION IN FLOW CYTOMETRYDecember 2024April 2025Allow300NoNo
19004565METHOD AND DEVICE FOR CHARACTERIZING A RESONATOR ELEMENTDecember 2024June 2025Allow610NoNo
19004437FIRE SMOKE DETECTION METHOD AND FIRE SMOKE DETECTOR BASED ON PARTICLE SHAPE CHARACTERISTICSDecember 2024April 2025Allow300NoNo
18879735APPARATUS AND METHOD FOR EXTENDED DEPTH OF FIELDDecember 2024June 2025Allow600NoNo
18879152METHOD, OPTICAL FILTER SYSTEM, OPTICAL MEASUREMENT DEVICE AND USEDecember 2024March 2025Allow300NoNo
18984964DEVICE FOR MEASURING THE REFRACTIVE INDEX OF A FLUIDDecember 2024July 2025Allow600NoNo
18974563IMAGING DEVICE AND METHOD FOR TURBID OIL ABRASIVE PARTICLES BASED ON POLARIZED IMAGE ENHANCEMENTDecember 2024February 2025Allow200NoNo
18966467OPTICAL MEASUREMENTSDecember 2024March 2025Allow301NoNo
18961487COLLABORATIVE WELD SEAM TRACKING METHOD BASED ON LASER LINE SCANNING SENSING AND PLATFORM THEREOFNovember 2024February 2025Allow300NoNo
18870275METHODS FOR COMPENSATING MEASUREMENTS OF DEVICES UNDER TEST (DUTS) CAPTURED THROUGH PRESCRIPTION LENSES, AND ASSOCIATED IMAGING SYSTEMS, DEVICES, AND METHODSNovember 2024February 2025Allow300NoNo
18958180DEVICE FOR MEASURING DIAMETER ERROR OF ROLLER FOR THREADED PAIR TRANSMISSIONNovember 2024February 2025Allow200NoNo
18939263FLOW CYTOMETERNovember 2024April 2025Allow510YesNo
18930957METHOD AND MINIATURIZED APPARATUS FOR RAMAN SPECTROSCOPY USING ROTATABLE DIFFRACTION GRATING AND SLITOctober 2024December 2024Allow200NoNo
18930946METHOD AND APPARATUS FOR RAMAN SIGNAL ANALYSISOctober 2024February 2025Allow400NoNo
18927698WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOOD FLOWOctober 2024February 2025Allow400YesNo
18922440VISUAL TURBIDITY DETECTION DEVICE AND DETECTION METHOD THEREOFOctober 2024March 2025Allow510NoNo
18896369BIDIRECTIONAL LITTROW TWO-DEGREE-OF-FREEDOM GRATING INTERFERENCE MEASUREMENT DEVICE BASED ON DOUBLE GRATINGSSeptember 2024January 2025Allow410NoNo
18891376GRATING DISPLACEMENT MEASUREMENT DEVICE AND METHOD USING DOUBLE-LAYER FLOATING READING HEAD, MEDIUM, AND APPARATUSSeptember 2024November 2024Allow210NoNo
18887436METHOD AND APPARATUS FOR ANALYZING A GEMSTONESeptember 2024January 2025Allow410NoNo
18885002BIREFRINGENCE MITIGATION IN AN OPTICAL NETWORKSeptember 2024November 2024Allow200NoNo
18847136OPTICAL SPECTROSCOPY FOR CHARACTERIZING ATMOSPHERIC EMISSIONSSeptember 2024March 2025Allow600YesNo
18828306SYSTEM AND METHOD FOR ACTIVE HYPERSPECTRAL IMAGING WITH SUPERCONTINUUM LIGHTSeptember 2024March 2025Allow610NoNo
18827528ACCURATE METHANE DETECTION USING TUNED LIDAR MODULATIONSeptember 2024November 2024Allow200NoNo
18823596FLOW CYTOMETERSeptember 2024October 2024Allow200NoNo
18815092LIGHT REFLECTION SUPPORT AND THROUGH HOLE INSPECTION SYSTEMAugust 2024February 2025Allow610NoNo
18813695VORTEX DICHROISM DARK-FIELD CONFOCAL MICROSCOPY MEASUREMENT APPARATUS BASED ON SPIRAL TRANSFORMATIONAugust 2024November 2024Allow200NoNo
18810526DEVICE FOR COLLABORATIVE DETECTION OF CARBON AND NITROGEN EMISSIONS AND METHOD THEREOFAugust 2024December 2024Allow400NoNo
18802879MEASUREMENTS USING CAMERA IMAGING TISSUE COMPRISING SKIN OR THE HANDAugust 2024July 2025Allow1100YesNo
18837827METHOD FOR MATCHING A COATING OF ANY GLOSS LEVELAugust 2024April 2025Allow810NoNo
18797466METHODS AND SYSTEMS FOR OPEN PATH GAS DETECTIONAugust 2024February 2025Allow620YesNo
18796276STATIC CONE PENETRATION TEST DEVICE AND TEST METHOD INCORPORATING HYPERSPECTRAL IMAGING TECHNOLOGYAugust 2024March 2025Allow711NoNo
18788971METHOD, DEVICE, AND SYSTEM FOR DETECTING SOIL ORGANIC MATTERJuly 2024September 2024Allow100NoNo
18832667REUSABLE SERS MOLECULE DETECTION APPARATUS AND USE METHOD THEREOFJuly 2024March 2025Allow810NoNo
18776431METHOD OF DETERMINING AT LEAST ONE PROPERTY ASSOCIATED TO A DRY PARTICULATE SUBSTANCEJuly 2024March 2025Allow821NoNo
18767516TRANSMISSION CORRECTED PLASMA EMISSION USING IN-SITU OPTICAL REFLECTOMETRYJuly 2024June 2025Allow1110YesNo
18766527NIGHT HYPER-SPECTRAL REMOTE SENSING IMAGING SYSTEM FOR MULTI-COMPONENT ATMOSPHERIC TRACE CONSTITUENTSJuly 2024January 2025Allow610YesNo
18762412RAMAN SPECTROSCOPY SYSTEMJuly 2024September 2024Allow200NoNo
18760441SYSTEMS AND METHODS FOR OPTICAL TRACKING OF HIGH PRECISIONJuly 2024April 2025Allow910NoNo
18760099HYBRID METROLOGY METHOD AND SYSTEMJuly 2024March 2025Allow900NoNo
18744803MICRO-PROBE LASER FREQUENCY MODULATION INTERFEROMETRIC RANGING METHOD AND SYSTEMJune 2024November 2024Allow510NoNo
18744405PORTABLE OPTICAL GYROSCOPE AND COMPASS UNITJune 2024February 2025Allow800NoNo
18738116METHOD FOR MEASURING RAMAN NANO-LIGHT SPECTRA FROM SOLID SUPPORTJune 2024August 2024Allow210NoNo
18738120METHOD FOR MAKING AN SERS ELECTRODEJune 2024September 2024Allow310NoNo
18738109SERS ELECTRODE HAVING TRANSITION METAL OXIDE NANOPARTICLE LAYERJune 2024October 2024Allow410NoNo
18738790SYSTEMS AND METHODS FOR SCREENING ASYMPTOMATIC VIRUS EMITTERSJune 2024July 2025Allow1310NoNo
18738936METHOD OF USING CROWD-SOURCED ECHO LOCATION PINGS TO DETECT FIBER LOCATIONS USING DISTRIBUTED ACOUSTIC SENSINGJune 2024August 2024Allow200NoNo
18737763Multispecies Measurement Platform Using Absorption Spectroscopy for Measurement of Co-Emitted Trace GasesJune 2024June 2025Allow1210NoNo
18734968Methods for Spectrally Resolving Fluorophores of a Sample and Systems for SameJune 2024March 2025Allow910NoNo
18733788CABLE-BASED MEASURING SYSTEMJune 2024June 2025Abandon1310NoNo
18732934OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY DEVICE AND OPTICAL INSPECTION METHOD USING THE SAMEJune 2024April 2025Allow1010NoNo
18731813DOSE MEASUREMENT SYSTEM AND METHODJune 2024December 2024Allow600NoNo
18715339DEVICES AND METHODS FOR DETERMINING CHIRAL OPTICAL PROPERTIES FROM THIRD HARMONIC MIE SCATTERING OF SEMICONDUCTOR NANOHELICESMay 2024September 2024Allow400NoNo
18678928DETECTION METHOD OF CREASE DEGREE OF SCREEN AND VISUAL DETECTION APPARATUSMay 2024January 2025Allow800YesNo
18714941METHOD FOR MEASURING SURFACE PARAMETER OF COPPER FOIL, METHOD FOR SORTING COPPER FOIL, AND METHOD FOR PRODUCING SURFACE-TREATED COPPER FOILMay 2024October 2024Allow400NoNo
18677738FLUORESCENCE IMAGING OF GEMSTONE ON TRANSPARENT STAGEMay 2024May 2025Allow1110NoNo
18673905SMALL IN-DIE TARGET DESIGN FOR OVERLAY MEASUREMENTMay 2024May 2025Allow1100NoNo
18673052DEVICE AND METHOD FOR MEASURING WAFERSMay 2024December 2024Allow710YesNo
18668764FOREIGN OBJECT DEBRIS DISCRIMINATION WITH MODULATED LASER LIGHTMay 2024February 2025Allow800NoNo
18663403DISTANCE MEASUREMENT DEVICE AND METHOD BASED ON SECONDARY MIXING OF INTER-MODE SELF-INTERFERENCE SIGNALS OF OPTICAL FREQUENCY COMBSMay 2024January 2025Allow800NoNo
18656937COOPERATIVE POLARIZATION SKYLIGHT BACKGROUND RADIATION MEASUREMENT DEVICE AND METHODMay 2024September 2024Allow400NoNo
18654654SYSTEM INCLUDING A FIBER LASER MODULEMay 2024April 2025Allow1110NoNo
18651942INTERFEROMETRIC DETECTION AND QUANTIFICATION SYSTEM AND METHODS OF USE IN FOOD PROCESSING AND FOOD SUPPLY CHAINMay 2024May 2025Allow1310NoNo
18650790METROLOGY SYSTEM AND METHOD FOR DETERMINING A CHARACTERISTIC OF ONE OR MORE STRUCTURES ON A SUBSTRATEApril 2024March 2025Allow1010NoNo
18650634METHOD OF MEASURING THICKNESS OF THIN FILMS USING DIFFRACTION OF POLARIZED LIGHT THROUGH A THIN FILMApril 2024February 2025Allow920YesNo
18650437MODULAR OPTICAL PARTICLE COUNTER SENSOR AND APPARATUSApril 2024June 2025Allow1310NoNo
18649147SYSTEMS AND METHODS FOR PH SENSING IN FLUIDSApril 2024May 2025Abandon1310NoNo
18647481REFRACTIVE PERISCOPE FOR EXTENDED-PUPIL PARALLELISM AND VIRTUAL IMAGING DISTANCE MEASUREMENTSApril 2024November 2024Allow700NoNo
18646390TIME-OF-FLIGHT SENSORS CO-REGISTERED WITH CAMERA SYSTEMSApril 2024November 2024Allow700YesNo
18645967Seamless Integrating Cavity of Monolithic Fumed SilicaApril 2024January 2025Allow801YesNo
18641975COLOR MEASUREMENT APPARATUSApril 2024April 2025Allow1210NoNo
18641107PHOTOACOUSTIC DETECTING DEVICEApril 2024September 2024Allow510NoNo
18641020Methods and Systems for Characterizing Spillover Spreading in Flow Cytometer DataApril 2024June 2025Allow1420NoNo
18641280SYSTEMS AND METHODS FOR CREATING DUPLICATE KEYSApril 2024December 2024Allow800YesNo
18634000DEFECT INSPECTION METHODApril 2024February 2025Allow1100YesNo
18631650DEFECT DETECTION USING SYNTHETIC DATA AND MACHINE LEARNINGApril 2024March 2025Allow1100NoNo
18700225METHOD AND APPARATUS FOR CALIBRATING A SPECTRAL IMAGING DEVICEApril 2024September 2024Allow600NoNo
18626209MITIGATING BIAS INSTABILITIES IN OPTICAL GYROSCOPESApril 2024July 2024Allow310NoNo
18624890Crystallographic Defect InspectionApril 2024December 2024Allow910YesNo
18615126METHOD OF INSPECTING FLATNESS OF SUBSTRATEMarch 2024December 2024Allow900YesNo
18616014ENDPOINT DETECTION SYSTEM FOR ENHANCED SPECTRAL DATA COLLECTIONMarch 2024March 2025Allow1210YesNo
18611712ASSESSING AND REMEDIATING WELL CLOGGING FROM MOBILE PARTICLES, SYSTEMS, APPARATUSES, AND METHODSMarch 2024March 2025Allow1210YesNo
18611427SPECTROMETRY SYSTEMS WITH DECREASED LIGHT PATHMarch 2024January 2025Allow1010NoNo
18608956PACKAGE STRUCTURE AND MEASUREMENT METHOD FOR THE PACKAGE STRUCTUREMarch 2024July 2025Allow1521NoNo
18610122COMPACT INTRAORAL SCANNERMarch 2024December 2024Allow800YesNo
18605163LIGHT EMITTING APPARATUS, LIGHT EMITTING METHOD, LIGHT DETECTION APPARATUS AND SPECTRUM DETECTION METHODMarch 2024December 2024Allow901YesNo
18603625SYSTEM AND METHOD TO SELECT AND ISOLATE PARTICLES AND CELLS AND USES THEREOFMarch 2024November 2024Allow810NoNo
18602774Automated Non-Contact Thickness Inspection and Projection SystemMarch 2024October 2024Allow700YesNo
18600690Interferometric Measurement System Using Time-Correlated PhotonsMarch 2024November 2024Allow800NoNo
18600698OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATIONMarch 2024January 2025Allow1110NoNo
18600000Flow Cytometers Including Light Collection Enhancers, And Methods of Using The SameMarch 2024March 2025Allow1210NoNo
18599915SYSTEMS AND METHODS FOR DETERMINING AN ARTICULATED TRAILER ANGLEMarch 2024May 2025Allow1411NoNo
18598606Systems and Methods for Measuring Mat Density of Aquatic BiomassMarch 2024December 2024Allow901NoNo
18595426OPTICAL INTEGRATED DEVICE AND OPTICAL TIME DOMAIN REFLECTOMETERMarch 2024April 2025Allow1310NoNo
18595575Method And A System For Determining Analyte Content In A Fluid In A Treatment ApparatusMarch 2024April 2025Abandon1310NoNo
18595312HETERODYNE INTERFEROMETER BASED ON MULTI-TARGET OPPOSITE DISPLACEMENT MEASUREMENT AND MEASUREMENT METHOD THEREOFMarch 2024January 2025Allow1011NoNo
18595318HETERODYNE LASER INTERFEROMETER BASED ON INTEGRATED DUAL POLARIZATION BEAM-SPLITTING ASSEMBLY AND MEASUREMENT METHOD THEREOFMarch 2024February 2025Allow1210NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for art-unit 2877.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
57
Examiner Affirmed
41
(71.9%)
Examiner Reversed
16
(28.1%)
Reversal Percentile
27.3%
Lower than average

What This Means

With a 28.1% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.

Strategic Value of Filing an Appeal

Total Appeal Filings
428
Allowed After Appeal Filing
168
(39.3%)
Not Allowed After Appeal Filing
260
(60.7%)
Filing Benefit Percentile
82.8%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 39.3% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Strategic Recommendations

Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Art Unit 2877 - Prosecution Statistics Summary

Executive Summary

Art Unit 2877 is part of Group 2870 in Technology Center 2800. This art unit has examined 22,151 patent applications in our dataset, with an overall allowance rate of 86.8%. Applications typically reach final disposition in approximately 26 months.

Comparative Analysis

Art Unit 2877's allowance rate of 86.8% places it in the 83% percentile among all USPTO art units. This art unit has a significantly higher allowance rate than most art units at the USPTO.

Prosecution Patterns

Applications in Art Unit 2877 receive an average of 1.25 office actions before reaching final disposition (in the 10% percentile). The median prosecution time is 26 months (in the 70% percentile).

Strategic Considerations

When prosecuting applications in this art unit, consider the following:

  • The art unit's allowance rate suggests a more favorable examination environment compared to the USPTO average.
  • With fewer office actions than average, plan for relatively streamlined prosecution.
  • The median prosecution time is shorter than average and should be factored into your continuation and client communication strategies.
  • Review individual examiner statistics within this art unit to identify examiners with particularly favorable or challenging prosecution patterns.

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.