Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18647481 | REFRACTIVE PERISCOPE FOR EXTENDED-PUPIL PARALLELISM AND VIRTUAL IMAGING DISTANCE MEASUREMENTS | April 2024 | November 2024 | Allow | 7 | 0 | 0 | No | No |
| 18578616 | OPTICAL-BASED VALIDATION OF PARALLELISM BETWEEN INTERNAL FACETS | January 2024 | June 2024 | Allow | 5 | 0 | 0 | No | No |
| 18385035 | OPTICAL PARALLELISM SYSTEM FOR EXTENDED REALITY METROLOGY | October 2023 | March 2024 | Allow | 5 | 1 | 0 | Yes | No |
| 18227652 | OVERLAY MEASUREMENT DEVICE AND METHOD, AND SYSTEM AND PROGRAM THEREFOR | July 2023 | January 2024 | Allow | 6 | 1 | 0 | No | No |
| 18320295 | CALIBRATION FOR AN INSTRUMENT (DEVICE, SENSOR) | May 2023 | March 2024 | Allow | 10 | 1 | 0 | Yes | No |
| 18307852 | APPARATUS AND METHOD FOR COAXIALLY ALIGNING TWO ROTATABLE SHAFTS | April 2023 | January 2024 | Allow | 9 | 0 | 0 | No | No |
| 18161387 | APPARATUSES AND METHODS FOR A ROTATING OPTICAL REFLECTOR | January 2023 | October 2023 | Allow | 9 | 1 | 0 | No | No |
| 18101869 | MULTIPLE REFLECTOMETRY FOR MEASURING ETCH PARAMETERS | January 2023 | November 2023 | Allow | 9 | 1 | 0 | Yes | No |
| 18148499 | HOLOGRAPHIC CHARACTERIZATION OF IRREGULAR PARTICLES | December 2022 | October 2023 | Allow | 10 | 1 | 0 | No | No |
| 18066138 | MONITORING DEVICE AND MONITORING SYSTEM | December 2022 | August 2023 | Allow | 8 | 1 | 0 | No | No |
| 18060981 | WAFER NOTCH POSITIONING DETECTION | December 2022 | November 2023 | Allow | 12 | 2 | 0 | Yes | No |
| 17970054 | DEPTH PROFILING OF SEMICONDUCTOR STRUCTURES USING PICOSECOND ULTRASONICS | October 2022 | August 2023 | Allow | 10 | 1 | 0 | No | No |
| 17915260 | ELECTRODE QUALITY EVALUATION METHOD AND ELECTRODE MANUFACTURING METHOD | September 2022 | December 2023 | Allow | 15 | 0 | 0 | No | No |
| 17941619 | DAMAGE IDENTIFICATION METHOD BASED ON CABLE FORCE TESTS OF CABLE SYSTEM AND TEST ERROR SELF-ADAPTIVE ANALYSIS | September 2022 | April 2023 | Allow | 8 | 0 | 0 | No | No |
| 17876087 | SPECTRAL-CHARACTERISTIC ACQUISITION APPARATUS AND METHOD OF OBTAINING SPECTRAL CHARACTERISTICS | July 2022 | September 2023 | Allow | 14 | 1 | 0 | No | No |
| 17868169 | DISTANCE MEASUREMENT SYSTEM, DISTANCE MEASUREMENT DEVICE, AND DISTANCE MEASUREMENT METHOD | July 2022 | November 2024 | Abandon | 28 | 1 | 0 | No | No |
| 17853455 | FILM THICKNESS MEASUREMENT METHOD, FILM THICKNESS MEASUREMENT DEVICE, AND FILM FORMATION SYSTEM | June 2022 | February 2024 | Allow | 20 | 1 | 0 | No | No |
| 17841514 | Measuring Device and Method of Determining a Depth of Field of an Optical Setup | June 2022 | March 2024 | Allow | 21 | 1 | 0 | No | No |
| 17834892 | FLUID IDENTIFICATION USING OPTICAL DATA MEASUREMENTS | June 2022 | October 2023 | Allow | 16 | 0 | 0 | No | No |
| 17824569 | OPTICAL FILTER, SPECTROMETER INCLUDING THE OPTICAL FILTER, AND ELECTRONIC APPARATUS INCLUDING THE OPTICAL FILTER | May 2022 | February 2023 | Allow | 32 | 1 | 0 | Yes | No |
| 17663478 | OPTICAL DEVICE | May 2022 | June 2023 | Allow | 13 | 2 | 0 | Yes | No |
| 17663490 | PROTECTIVE FILM THICKNESS MEASURING METHOD | May 2022 | October 2023 | Allow | 17 | 1 | 0 | Yes | No |
| 17661557 | INTEGRATED RAPID NON-DESTRUCTIVE DETECTION SYSTEM FOR MULTI-INDEX OF MEAT QUALITY | May 2022 | November 2022 | Allow | 6 | 1 | 0 | No | No |
| 17727491 | Sensor Device for Biosensing and Other Applications | April 2022 | November 2023 | Abandon | 19 | 1 | 0 | No | No |
| 17723017 | Spectrometer | April 2022 | September 2023 | Allow | 17 | 1 | 0 | No | No |
| 17719489 | METHOD AND APPARATUS FOR DETERMINING A CONTOUR OF A FRAME GROOVE | April 2022 | March 2024 | Allow | 23 | 0 | 0 | No | No |
| 17710244 | ANALYTE QUANTITATION USING RAMAN SPECTROSCOPY | March 2022 | January 2024 | Allow | 22 | 1 | 0 | No | No |
| 17762859 | METHOD FOR MEASURING FILM THICKNESS DISTRIBUTION OF WAFER WITH THIN FILMS | March 2022 | January 2024 | Allow | 21 | 0 | 0 | No | No |
| 17696980 | NON-DESTRUCTIVE GAP METROLOGY | March 2022 | October 2023 | Allow | 19 | 2 | 0 | Yes | No |
| 17753395 | SPECTRAL CONFOCAL MEASUREMENT DEVICE AND MEASUREMENT METHOD THEREOF | March 2022 | June 2024 | Allow | 28 | 1 | 0 | Yes | No |
| 17675736 | AEROSOL-BASED LIQUID PARTICLE DETECTION MEASUREMENT | February 2022 | October 2023 | Allow | 20 | 1 | 0 | Yes | No |
| 17584669 | METHODS AND APPARATUS FOR PROCESSING A SUBSTRATE | January 2022 | May 2024 | Allow | 27 | 2 | 0 | Yes | Yes |
| 17648216 | METHOD FOR MEASURING FILM THICKNESS OF SEMICONDUCTOR DEVICE | January 2022 | November 2023 | Allow | 22 | 0 | 0 | No | No |
| 17556430 | CONTACTLESS METHOD FOR POLYMER COATING THICKNESS MEASUREMENT | December 2021 | September 2023 | Allow | 21 | 1 | 0 | Yes | No |
| 17555873 | NOVEL CHROMATIC CONFOCAL SENSOR WITH IMAGING CAPABILITY FOR 6-AXIS SPATIAL ALLOCATION CALIBRATION | December 2021 | May 2023 | Allow | 17 | 1 | 0 | Yes | No |
| 17556388 | IMAGING DEVICE, CONTROL METHOD THEREFOR, MEASURING DEVICE, AND STORAGE MEDIUM | December 2021 | November 2024 | Abandon | 35 | 2 | 0 | No | No |
| 17619730 | MULTI-CHANNEL GAS SENSOR | December 2021 | September 2022 | Allow | 9 | 1 | 0 | No | No |
| 17595953 | MEASUREMENT DEVICE AND MEASUREMENT METHOD | November 2021 | June 2024 | Abandon | 30 | 1 | 0 | No | No |
| 17456493 | ULTRA-SPECTRALLY SELECTIVE TERAHERTZ BAND STOP REFLECTOR | November 2021 | December 2024 | Allow | 37 | 1 | 0 | No | No |
| 17522303 | APPARATUS AND METHOD FOR COAXIALLY ALIGNING TWO ROTATABLE SHAFTS | November 2021 | March 2023 | Allow | 16 | 0 | 0 | No | No |
| 17522569 | SYSTEMS AND METHODS FOR IDENTIFYING A COATING ON AN IMPLANT | November 2021 | March 2023 | Allow | 17 | 1 | 0 | No | No |
| 17502632 | COMPOSITIONS AND METHODS FOR EVALUATION OF LIQUID CONTACT ANGLE PROPERTIES | October 2021 | July 2023 | Allow | 21 | 1 | 0 | No | No |
| 17483622 | PARTICLE DETECTION SENSOR AND PARTICLE DETECTOR | September 2021 | May 2023 | Allow | 20 | 1 | 0 | No | No |
| 17482187 | METHOD FOR DETECTING THE CONCENTRATION OF ORGANIC PARTICLES IN THE AIR AND APPARATUS THEREFOR | September 2021 | November 2023 | Abandon | 26 | 1 | 0 | No | No |
| 17479377 | APPARATUS FOR INSPECTING MEAT, SYSTEM FOR INSPECTING MEAT INCLUDING THE SAME, REFRIGERATOR INCLUDING THE SAME, AND METHOD OF INSPECTING MEAT | September 2021 | August 2023 | Allow | 25 | 1 | 0 | Yes | No |
| 17447951 | CALIBRATION FOR AN INSTRUMENT (DEVICE, SENSOR) | September 2021 | January 2023 | Allow | 16 | 1 | 0 | Yes | No |
| 17471026 | TEMPLATE, WORKPIECE, AND ALIGNMENT METHOD | September 2021 | July 2023 | Allow | 22 | 1 | 0 | No | No |
| 17465428 | PORTABLE TEST PAPER COUNTING DEVICE AND METHOD BASED ON SINGLE PHOTON DETECTOR | September 2021 | December 2022 | Allow | 16 | 0 | 0 | No | No |
| 17404984 | PLASMA DETECTING DEVICE | August 2021 | October 2023 | Allow | 26 | 1 | 0 | No | No |
| 17396980 | COLLOIDAL FINGERPRINTS FOR SOFT MATERIALS USING TOTAL HOLOGRAPHIC CHARACTERIZATION | August 2021 | December 2023 | Allow | 29 | 3 | 0 | Yes | No |
| 17443873 | Method And System For Analyzing A Sample Desorbed At Different Temperatures Using Cavity Ring-Down Spectroscopy, And A Method For Generating A Predictive Model | July 2021 | June 2023 | Allow | 22 | 2 | 0 | No | No |
| 17385407 | SHAPE-BASED VEHICLE CLASSIFICATION USING LASER SCAN AND NEURAL NETWORK | July 2021 | March 2024 | Allow | 31 | 1 | 0 | Yes | No |
| 17382134 | TECHNIQUES FOR CHARACTERIZING FILMS ON OPTICALLY CLEAR SUBSTRATES USING ELLIPSOMETRY | July 2021 | March 2023 | Allow | 20 | 1 | 0 | No | No |
| 17424491 | INTEGRATED WAFER BOW MEASUREMENTS | July 2021 | September 2023 | Allow | 26 | 1 | 0 | No | No |
| 17379507 | MEASUREMENT APPARATUS OF WAVEFRONT AND POLARIZATION PROFILE OF VECTORIAL OPTICAL FIELDS | July 2021 | January 2023 | Allow | 18 | 1 | 0 | No | No |
| 17370304 | LIGHT SOURCE DEVICE AND OPTICAL PULSE TESTER | July 2021 | January 2024 | Allow | 31 | 1 | 0 | No | No |
| 17368860 | STRUCTURED LIGHT MEASURING DEVICE | July 2021 | December 2022 | Allow | 17 | 0 | 0 | No | No |
| 17418757 | METHOD FOR DETERMINING PROPERTIES OF A SAMPLE BY ELLIPSOMETRY | June 2021 | December 2023 | Allow | 30 | 1 | 0 | Yes | No |
| 17355692 | FOUNTAIN SOLUTION THICKNESS MEASUREMENT SYSTEM AND METHOD USING ELLIPSOMETRY | June 2021 | August 2023 | Allow | 26 | 0 | 0 | No | No |
| 17353994 | Systems and Methods for Thomson Scattering Background Interference Suppression | June 2021 | October 2023 | Allow | 28 | 1 | 0 | No | No |
| 17304118 | POSITION MEASURING APPARATUS AND MEASURING METHOD | June 2021 | March 2023 | Allow | 21 | 1 | 0 | No | No |
| 17299219 | DEVICE FOR DETERMINING THE THICKNESS OF AN OBJECT | June 2021 | August 2023 | Allow | 26 | 1 | 0 | Yes | No |
| 17334132 | REDUCING POLARIZATION DEPENDENT LOSS (PDL) IN A GRATING-BASED OPTICAL SPECTRUM ANALYZER (OSA) | May 2021 | August 2023 | Allow | 26 | 1 | 0 | Yes | No |
| 17297419 | GAS SENSOR COMPRISING A PULSED LIGHT SOURCE | May 2021 | March 2024 | Allow | 34 | 0 | 0 | Yes | No |
| 17325529 | METHOD AND SYSTEM FOR INTERROGATING OPTICAL FIBERS | May 2021 | September 2022 | Allow | 16 | 1 | 0 | Yes | No |
| 17323396 | OVERLAY MARK AND METHOD OF MAKING | May 2021 | September 2023 | Allow | 28 | 3 | 0 | Yes | No |
| 17308949 | EFFECTIVE CELL APPROXIMATION MODEL FOR LOGIC STRUCTURES | May 2021 | February 2024 | Allow | 33 | 2 | 0 | Yes | No |
| 17289658 | MULTI-CAVITY SUPERIMPOSED NON-RESONANT PHOTOACOUSTIC CELL AND GAS DETECTION SYSTEM | April 2021 | June 2024 | Abandon | 37 | 1 | 0 | No | No |
| 17242569 | MULTIPLE REFLECTOMETRY FOR MEASURING ETCH PARAMETERS | April 2021 | October 2022 | Allow | 17 | 1 | 0 | Yes | No |
| 17232817 | LIQUID DROPLET MEASUREMENT METHOD AND LIQUID DROPLET MEASUREMENT DEVICE, AND METHOD AND APPARATUS FOR MANUFACTURING DEVICE | April 2021 | September 2023 | Allow | 29 | 0 | 0 | No | No |
| 17285410 | GAS MEASUREMENT DEVICE AND GAS MEASUREMENT METHOD | April 2021 | December 2022 | Abandon | 20 | 1 | 0 | No | No |
| 17227079 | SYSTEMS AND METHODS FOR ORIENTATOR BASED WAFER DEFECT SENSING | April 2021 | January 2023 | Allow | 21 | 1 | 0 | No | No |
| 17225275 | MULTI-SCALE SPECTRAL IMAGING APPARATUSES AND METHODS, AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES BY USING THE IMAGING METHODS | April 2021 | May 2023 | Allow | 26 | 0 | 0 | No | No |
| 17224046 | SYSTEMS AND METHODS OF AMBIENT GAS SENSING IN A VEHICLE | April 2021 | February 2023 | Allow | 22 | 1 | 0 | No | No |
| 17217990 | OPTO-ACOUSTIC MEASUREMENT OF A TRANSPARENT FILM STACK | March 2021 | January 2023 | Allow | 21 | 0 | 0 | No | No |
| 17217307 | METHOD AND APPARATUS FOR CORRECTING ERROR OF OPTICAL SENSOR, APPARATUS FOR ESTIMATING BIO-INFORMATION | March 2021 | October 2022 | Allow | 19 | 1 | 0 | Yes | No |
| 17281129 | OXIDE FILM THICKNESS MEASUREMENT DEVICE AND METHOD | March 2021 | August 2023 | Allow | 29 | 0 | 0 | No | No |
| 17214888 | Modulation Of Scanning Velocity During Overlay Metrology | March 2021 | March 2023 | Allow | 24 | 3 | 0 | No | No |
| 17280604 | Scattered Light Smoke Detector Having a Two-Color LED, a Photosensor, and a Wavelength-Selective Polarizer Connected Upstream of the Photosensor or Connected Downstream of the Two-Color LED, and Suitable Use of Such a Polarizer | March 2021 | July 2022 | Allow | 16 | 1 | 0 | No | No |
| 17300091 | Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system | March 2021 | March 2023 | Allow | 25 | 1 | 0 | No | No |
| 17269162 | FLUID MEDIUM MONITORING APPARATUS | February 2021 | January 2023 | Allow | 23 | 2 | 0 | No | No |
| 17268567 | HOMOGENEOUS ASSAY WITH PARTICLE AGGREGATION OR DE-AGGREGATION | February 2021 | March 2023 | Allow | 25 | 1 | 0 | No | No |
| 17169101 | SYSTEM AND METHOD FOR DETECTING CONTAMINATION OF THIN-FILMS | February 2021 | February 2023 | Allow | 24 | 2 | 0 | No | No |
| 17162860 | PHOTONIC INTEGRATED CIRCUIT-BASED COHERENTLY PHASED ARRAY LASER TRANSMITTER | January 2021 | November 2023 | Allow | 33 | 1 | 0 | No | No |
| 17151963 | WARP MEASUREMENT DEVICE, VAPOR DEPOSITION APPARATUS, AND WARP MEASUREMENT METHOD | January 2021 | March 2023 | Allow | 26 | 0 | 0 | No | No |
| 17258674 | OPTICAL INSPECTION DEVICE AND METHOD | January 2021 | September 2022 | Allow | 20 | 1 | 0 | No | No |
| 17256966 | NORMAL INCIDENCE ELLIPSOMETER AND METHOD FOR MEASURING OPTICAL PROPERTIES OF SAMPLE BY USING SAME | December 2020 | July 2022 | Allow | 18 | 1 | 0 | No | No |
| 17256921 | DEVICE FOR MEASURING BUMP HEIGHT, APPARATUS FOR PROCESSING SUBSTRATE, METHOD OF MEASURING BUMP HEIGHT, AND STORAGE MEDIUM | December 2020 | November 2022 | Allow | 23 | 1 | 0 | No | No |
| 17135911 | ALIGNMENT SYSTEM AND ALIGNMENT MARK | December 2020 | March 2023 | Allow | 27 | 1 | 0 | No | No |
| 17247352 | DEVICE AND METHOD FOR DETECTING PARTICLES AND METHOD FOR MANUFACTURING SAME | December 2020 | January 2023 | Allow | 25 | 1 | 0 | No | No |
| 17105047 | CELL ANALYSIS METHOD, CELL ANALYSIS DEVICE, AND CELL ANALYSIS SYSTEM | November 2020 | February 2024 | Allow | 39 | 2 | 0 | No | No |
| 17057743 | Method for Determining a Three-Dimensional Particle Distribution in a Medium | November 2020 | October 2023 | Allow | 35 | 1 | 0 | No | No |
| 16953584 | SPECTRAL APPARATUS AND METHOD OF DRIVING SPECTRAL APPARATUS | November 2020 | May 2023 | Allow | 30 | 1 | 0 | Yes | No |
| 17095477 | POLARIZATION SPECTRAL FILTER, POLARIZATION SPECTRAL FILTER ARRAY, AND POLARIZATION SPECTRAL SENSOR | November 2020 | March 2023 | Allow | 28 | 1 | 0 | Yes | No |
| 17079167 | HOLOGRAPHIC CHARACTERIZATION OF IRREGULAR PARTICLES | October 2020 | September 2022 | Allow | 23 | 1 | 0 | No | No |
| 17069177 | IMAGING SYSTEM FOR BURIED METROLOGY TARGETS | October 2020 | June 2022 | Allow | 20 | 0 | 0 | No | No |
| 17068693 | DEPTH PROFILING OF SEMICONDUCTOR STRUCTURES USING PICOSECOND ULTRASONICS | October 2020 | July 2022 | Allow | 21 | 1 | 0 | Yes | No |
| 17060526 | HOLOGRAPHIC MICROSCOPE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE USING THE SAME | October 2020 | March 2024 | Allow | 41 | 0 | 0 | No | No |
| 17044559 | SYSTEMS AND METHODS FOR BULK MOTION COMPENSATION IN PHASE-BASED FUNCTIONAL OPTICAL COHERENCE TOMOGRAPGY | October 2020 | November 2023 | Allow | 37 | 1 | 0 | Yes | No |
| 17019789 | MONITORING DEVICE AND MONITORING SYSTEM | September 2020 | September 2022 | Allow | 24 | 1 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner NIXON, OMAR H.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 100.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner NIXON, OMAR H works in Art Unit 2877 and has examined 137 patent applications in our dataset. With an allowance rate of 93.4%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 25 months.
Examiner NIXON, OMAR H's allowance rate of 93.4% places them in the 81% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by NIXON, OMAR H receive 1.18 office actions before reaching final disposition. This places the examiner in the 19% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by NIXON, OMAR H is 25 months. This places the examiner in the 68% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a +10.0% benefit to allowance rate for applications examined by NIXON, OMAR H. This interview benefit is in the 46% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 30.8% of applications are subsequently allowed. This success rate is in the 53% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 45.5% of cases where such amendments are filed. This entry rate is in the 64% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 200.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 96% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 94% percentile among all examiners. Of these withdrawals, 50.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 41.7% are granted (fully or in part). This grant rate is in the 43% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 25% percentile). This examiner makes examiner's amendments less often than average. You may need to make most claim amendments yourself.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 1.6% of allowed cases (in the 62% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.