USPTO Examiner HANEY NOAH JAMES - Art Unit 2877

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18847136OPTICAL SPECTROSCOPY FOR CHARACTERIZING ATMOSPHERIC EMISSIONSSeptember 2024March 2025Allow600YesNo
18766527NIGHT HYPER-SPECTRAL REMOTE SENSING IMAGING SYSTEM FOR MULTI-COMPONENT ATMOSPHERIC TRACE CONSTITUENTSJuly 2024January 2025Allow610YesNo
18382930MICRO-RAMAN DEVICEOctober 2023May 2025Allow1900NoNo
18487278SELF-CORRECTING ASSEMBLABLE OPTICAL FIBER SENSING SYSTEM FOR DISPLACEMENT FIELD AND CORRECTION METHOD THEREOFOctober 2023April 2024Allow610YesNo
18276300Method and Apparatus for Spectrophotometry of Turbid MediaAugust 2023June 2025Allow2210NoNo
18214974LINEAR ARRAY SCANNING BRILLOUIN SCATTERING ELASTIC IMAGING DEVICEJune 2023April 2025Allow2210NoNo
18004452OPTICAL SPECTROMETER BASED ON ALTERNATING DIFFRACTIVE OPTICAL ELEMENTSJanuary 2023April 2025Abandon2710NoNo
18147072MEASURING APPARATUSDecember 2022September 2024Allow2100NoNo
18086395Microcavity Plasma Array for Optical Emission SpectroscopyDecember 2022June 2025Abandon3010NoNo
18065687METHOD FOR PERFORMING RAMAN SPECTROSCOPY WITHIN A LOGGING WHILE DRILLING INSTRUMENTDecember 2022May 2025Allow2930YesNo
18064537ADHESION INTERFACE OBSERVATION METHODDecember 2022September 2024Allow2100NoNo
18061038THREE-DIMENSIONAL SCANNER, CONTROL METHOD, AND RECORDING MEDIUM FOR RECORDING PROGRAMSDecember 2022March 2025Allow2710YesNo
18071690Devices, Systems, and Methods for Analyzing Measurement ObjectsNovember 2022May 2025Allow3011YesNo
18070672INTRAORAL SCANNER HAVING TOMOGRAPHIC IMAGING FUNCTION AND METHOD FOR TOMOGRAPHIC IMAGING OF ORAL CAVITY USING THE SAMENovember 2022February 2025Allow2610NoNo
17989589AUTOMATIC FIBER END POINT DETECTION USING COHERENT OPTICAL TIME DOMAIN REFLECTOMETRYNovember 2022February 2025Abandon2710NoNo
17967228ELLIPSOMETER AND APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICE INCLUDING THE ELLIPSOMETEROctober 2022March 2025Allow2811YesNo
17937618SYSTEMS, METHODS, AND APPARATUSES FOR DISTINGUISHING AN INTERFERING GAS IN A GAS FLOWOctober 2022December 2024Allow2610NoNo
17907409METHODS AND SYSTEMS FOR ESTIMATING PROPERTIES OF ORGANIC MATTER IN GEOLOGICAL ROCK FORMATIONSSeptember 2022November 2024Allow2620YesNo
17932215SYSTEMS AND METHODS FOR SURFACE PROFILE ESTIMATION VIA OPTICAL COHERENCE TOMOGRAPHYSeptember 2022September 2024Allow2400NoNo
17797685OPTICAL IMAGING SYSTEM AND METHOD BASED ON RANDOM LIGHT FIELD SPATIAL STRUCTURE ENGINEERINGAugust 2022November 2024Allow2710YesNo
17797455DRY QUALITY EVALUATION DEVICE FOR ELECTRODE AND DRY QUALITY EVALUATION METHOD FOR ELECTRODEAugust 2022January 2025Allow2920NoNo
17858646SPECTROSCOPIC DETECTOR ASSEMBLYJuly 2022September 2023Allow1400YesNo
17788347IDENTIFICATION OF MICROBIAL CONTAMINATIONS OR INFECTIONS IN LIQUID SAMPLES BY RAMAN SPECTROSCOPYJune 2022October 2024Abandon2810NoNo
17844919APPARATUS FOR DETECTING UV BLOCKING MATERIAL AND MOBILE DEVICE INCLUDING THE APPARATUSJune 2022June 2024Allow2300NoNo
17756840METHOD AND DEVICE FOR PROCESSING TWO-DIMENSIONAL OPTICAL SPECTRAJune 2022February 2025Allow3210YesNo
178307022D Material Detector for Activity Monitoring of Single Living Micro-Organisms and Nano-OrganismsJune 2022October 2024Allow2910NoNo
17828747LARGE SPOT SIZE SPECTROMETERMay 2022August 2024Allow2610NoNo
17747100PESTICIDE DETECTION DEVICE WITH WASHING FUNCTIONMay 2022October 2024Abandon2910NoNo
17737663OPTICAL INSPECTION DEVICE AND INSPECTING METHOD USING THE SAMEMay 2022October 2024Allow2920YesNo
17658895COLOR MEASURING APPARATUSApril 2022February 2024Allow2330NoNo
17716985ANALYSIS OF MIXED VOLATILE COMPOUNDSApril 2022September 2024Allow2910YesNo
17711006HETERODYNE TWO-DIMENSIONAL GRATING MEASURING DEVICE AND MEASURING METHOD THEREOFMarch 2022November 2024Allow3120NoNo
17765138ABSORBANCE SPECTROSCOPIC DEVICEMarch 2022March 2024Allow2420NoNo
17657233CONCEALMENT COMPONENT FOR AN OPTICAL SENSOR DEVICEMarch 2022September 2024Allow2930YesNo
17702347UTILIZING HIGHLY SCATTERED LIGHT FOR INTELLIGENCE THROUGH AEROSOLSMarch 2022June 2024Allow2710YesNo
17655899OPTICAL MEASUREMENT SYSTEM, OPTICAL MEASUREMENT METHOD, AND NON-TRANSITORY STORAGE MEDIUM HAVING MEASUREMENT PROGRAM STORED THEREONMarch 2022November 2023Allow2020YesNo
17762578SYSTEM AND METHOD FOR CONTROLLING THE COLOUR OF A MOVING ARTICLEMarch 2022August 2023Allow1600YesNo
17694682COLORIMETER AND REFLECTIVITY MEASURING METHOD BASED ON MULTICHANNEL SPECTRUMMarch 2022July 2024Allow2811NoNo
17694151METHOD AND DEVICE FOR DETERMINING THE SHAPE OF AN OPTICAL WAVEGUIDE, AND DEVICE FOR PRODUCING TRAINING DATA FOR A NEURAL NETWORKMarch 2022August 2024Allow2910NoNo
17686802METHOD FOR ANALYZING TEST SUBSTANCE, ANALYZER, TRAINING METHOD, ANALYZER SYSTEM, AND ANALYSIS PROGRAMMarch 2022April 2024Allow2530YesNo
17653299OPTICAL MEASUREMENT DEVICE INCLUDING INTERNAL SPECTRAL REFERENCEMarch 2022October 2023Allow2010YesNo
17683965Apparatus and Method for Calibrating Raman ShiftMarch 2022July 2023Allow1710YesNo
17675179Multi-environment Rayleigh InterferometerFebruary 2022July 2023Allow1710YesNo
17651578COLOR MEASURING SYSTEM AND PROGRAMFebruary 2022February 2024Allow2420NoNo
17671983INTEGRATED EVANESCENT WAVE SPECTRAL SENSING DEVICEFebruary 2022December 2023Allow2211NoNo
17630142LIGHT IRRADIATION APPARATUSFebruary 2022January 2024Allow2400NoNo
17633178SYSTEM AND PROCESS FOR DIAMOND AUTHENTICATIONFebruary 2022August 2024Abandon3010NoNo
17571545OPTICAL PATH TEST SYSTEM AND METHOD FOR RETURN LIGHT RESISTANCE OF LASER CHIPJanuary 2022February 2023Allow1300YesNo
17623611VARIABLE SYNTHETIC WAVELENGTH ABSOLUTE DISTANCE MEASURING DEVICE LOCKED TO DYNAMIC SIDEBAND AND METHOD THEREOFDecember 2021April 2024Allow2810YesNo
17623469OPTICAL DEVICE COMPRISING WAVELENGTH-SELECTIVE OPTICAL FILTER INCLUDING DOWNCONVERTERDecember 2021September 2023Allow2110YesNo
17597098STATE DETECTION OF MATERIAL SURFACES OF WEARABLE OBJECTS USING COLOR SENSINGDecember 2021June 2024Abandon3010NoNo
17617750PHOTOTHERMAL GAS DETECTOR INCLUDING AN INTEGRATED ON-CHIP OPTICAL WAVEGUIDEDecember 2021July 2024Abandon3110NoNo
17616794APPARATUS AND METHOD FOR DETERMINING A PROPERTY OF PRODUCTSDecember 2021March 2024Allow2830YesNo
17522268APPARATUS AND METHOD FOR SPECTROSCOPIC ANALYSIS ON INFRARED RAYSNovember 2021January 2024Abandon2620NoNo
17609153SPECTRAL RECONSTRUCTION OF DETECTOR SENSITIVITYNovember 2021May 2024Allow3120YesNo
17496385ON-VEHICLE WATER IN FUEL SENSING SYSTEM AND RELATED SIGNAL PROCESSINGOctober 2021September 2024Allow3630YesNo
17602147PORTABLE ATMOSPHERIC MONITOROctober 2021May 2024Abandon3210NoNo
17490348IN-SITU MONITORING OF CHEMICAL FINGERPRINTS IN OILFIELD APPLICATIONSSeptember 2021November 2024Allow3810NoNo
17600501SENSOR ARRAY SPECTROMETERSeptember 2021June 2023Allow2120NoNo
17599173OPTICAL ANALYSIS CHIPSeptember 2021July 2024Allow3310NoNo
17465594Finger Devices with Self-Mixing Interferometric Proximity SensorsSeptember 2021January 2024Allow2910YesNo
17462489LEAD-FREE PINSCREEN IMPRINT DEVICE, SYSTEM, AND METHOD FOR RETRIEVING AT LEAST ONE IMPRINT OF A TOPMOST SURFACE OF A FISH LOCATED IN A WELLBOREAugust 2021November 2023Allow2720YesNo
17405592MULTI-MODAL IMAGING SYSTEMS AND METHODSAugust 2021October 2024Allow3820NoNo
17425307AUTOMATIC SYSTEM FOR BLADE INSPECTIONJuly 2021March 2024Allow3210YesNo
17418223APPARATUS AND METHOD FOR QUANTITATIVE DETECTION OF GASESJune 2021July 2023Allow2520YesNo
17309806Imaging of Biological TissueJune 2021April 2024Abandon3410NoNo
17339092WHITE DWARF: CROSS-POLARIZED WHITE LIGHT SLIDE-FREE IMAGINGJune 2021February 2024Allow3220YesNo
17297810Device and Method for Measuring Semiconductor-Based Light SourcesMay 2021April 2025Allow4620NoNo
17294042PROBE SUITABLE FOR MEASURING THE COMPOSITION OF AN OXIDISING GASMay 2021March 2024Abandon3410NoNo
17198913OPTICAL METROLOGY MODELS FOR IN-LINE FILM THICKNESS MEASUREMENTSMarch 2021April 2024Allow3710YesNo
17190629INSPECTION APPARATUS AND INSPECTION METHODMarch 2021December 2023Allow3420YesNo
17254485PHOTODETECTION DEVICE AND LASER DEVICEDecember 2020November 2023Allow3510NoNo
17072305IMAGE DISPLAY DEVICE AND IMAGE DISPLAY METHODOctober 2020August 2023Allow3400NoNo
16991462DISTANCE MEASUREMENT APPARATUS HAVING AN INTERPOLATION PROCESSORAugust 2020January 2024Allow4110YesNo

Appeals Overview

No appeal data available for this record. This may indicate that no appeals have been filed or decided for applications in this dataset.

Examiner HANEY, NOAH JAMES - Prosecution Strategy Guide

Executive Summary

Examiner HANEY, NOAH JAMES works in Art Unit 2877 and has examined 72 patent applications in our dataset. With an allowance rate of 83.3%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 28 months.

Allowance Patterns

Examiner HANEY, NOAH JAMES's allowance rate of 83.3% places them in the 51% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by HANEY, NOAH JAMES receive 1.25 office actions before reaching final disposition. This places the examiner in the 23% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by HANEY, NOAH JAMES is 28 months. This places the examiner in the 53% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +30.8% benefit to allowance rate for applications examined by HANEY, NOAH JAMES. This interview benefit is in the 82% percentile among all examiners. Recommendation: Interviews are highly effective with this examiner and should be strongly considered as a prosecution strategy. Per MPEP § 713.10, interviews are available at any time before the Notice of Allowance is mailed or jurisdiction transfers to the PTAB.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 41.7% of applications are subsequently allowed. This success rate is in the 92% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 100.0% of cases where such amendments are filed. This entry rate is in the 99% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Petition Practice

When applicants file petitions regarding this examiner's actions, 0.0% are granted (fully or in part). This grant rate is in the 3% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 25% percentile). This examiner makes examiner's amendments less often than average. You may need to make most claim amendments yourself.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 3.3% of allowed cases (in the 73% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Prioritize examiner interviews: Interviews are highly effective with this examiner. Request an interview after the first office action to clarify issues and potentially expedite allowance.
  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.
  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.