USPTO Examiner TRAN JUDY DAO - Art Unit 2877

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18956055SCHLIEREN SYSTEM FOR IN-SITU/ONLINE MONITORING OF SPATTER IN LARGE-AREA MELT POOLNovember 2024January 2026Allow1410YesNo
18656937COOPERATIVE POLARIZATION SKYLIGHT BACKGROUND RADIATION MEASUREMENT DEVICE AND METHODMay 2024September 2024Allow400NoNo
18646265ULTRA LOW-NA REFRACTIVE INDEX PROFILING SYSTEM AND METHOD FOR FILTERING OUT SEVERELY DISTURBING DIFFRACTION EFFECTSApril 2024November 2025Allow1800YesNo
18606571PROCESSING APPARATUS FOR ELECTRONIC COMPONENTMarch 2024August 2025Allow1720YesNo
18686418METHOD FOR MEASURING A THICKNESS OF A FILM OR PLATE, SYSTEM FOR MANUFACTURING A FILM OR PLATE OF THIS TYPE, AND METHOD FOR OPERATING A SYSTEM OF THIS TYPEFebruary 2024June 2025Allow1510YesNo
18582887SIMPLE ZERO-Q-TRANSFORMING (ZQT) MULTI-PASS CELLS FOR OPTICAL APPLICATIONSFebruary 2024December 2025Allow2110YesNo
18398269PROBE FOR THREE-DIMENSIONAL SCANNER AND THREE-DIMENSIONAL SCANNERDecember 2023February 2026Allow2621NoNo
18562531CRYOGENIC THERMALLY STIMULATED EMISSION SPECTROMETERNovember 2023December 2025Abandon2520NoNo
18509406MEASURING CELL FOR PERFORMING OPTICAL MEASUREMENTSNovember 2023October 2025Allow2310NoNo
18506628Optical Fiber Measurement SystemNovember 2023January 2026Allow2610YesNo
18552216METHOD FOR CARRYING OUT A SYSTEM TEST OF A LASER PROCESSING SYSTEM, CONTROL UNIT AND LASER PROCESSING SYSTEMSeptember 2023January 2026Allow2820NoNo
18472479FLUORESCENCE POLARIZATION IMMUNOASSAY METHOD AND FLUORESCENCE POLARIZATION IMMUNOASSAY DEVICESeptember 2023July 2025Allow2200NoNo
18471167FLUID COMPOSITION SENSOR DEVICE AND METHOD OF USING THE SAMESeptember 2023April 2024Allow730NoNo
18546161Circuit, Device and Method for Optical Characteristic InspectionAugust 2023July 2025Abandon2410NoNo
18362145METHOD FOR DETERMINING DISTRIBUTED BIREFRINGENCE VARIATIONS IN A POLARIZATION- MAINTAINING OPTICAL FIBERJuly 2023September 2025Allow2610NoNo
18261798METHOD FOR DETERMINING AT LEAST ONE SPEED COMPONENT OF A FLUID STREAMJuly 2023December 2025Allow2910YesNo
18272398METHOD FOR CALIBRATING A LASER SCANNER, AND TECHNICAL APPARATUSJuly 2023September 2025Allow2610YesNo
18200707COMPACT WIDE FIELD IMAGER FOR LASER DETECTIONMay 2023June 2025Abandon2510NoNo
18130716METHOD FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF MULTI-LAYER FILMApril 2023March 2025Allow2310NoNo
18193903FOCUS ASSISTANCE FOR ROTATING LUMINAIRE BASED ON MEASUREMENTS BY INDEPENDENTLY ROTATING DISTANCE SENSORMarch 2023November 2025Allow3210YesNo
18011019MICROSCOPIC RAMAN SPECTROSCOPY DEVICE AND METHOD FOR ADJUSTING MICROSCOPIC RAMAN SPECTROSCOPY DEVICEMarch 2023November 2025Allow3510NoNo
18169937LASER INTERFEROMETERFebruary 2023November 2025Allow3301YesNo
18101477Rolled Material End Edge DetectorJanuary 2023January 2026Allow3630YesNo
18012374DEVICE FOR WATER EXAMINATIONDecember 2022December 2025Abandon3630NoNo
18002230ACQUISITION DEVICE FOR A PARTIALLY AUTOMATED ACQUISITION OF MULTIPLE OBJECT DATA SETS OF AT LEAST ONE OBJECTDecember 2022March 2025Abandon2710NoNo
18081102WAFER TYPE SENSOR, WAFER ALIGNMENT METHOD USING THE SAME, AND CALIBRATION DEVICE FOR CALIBRATING WAFER TYPE SENSORDecember 2022May 2025Allow2911YesNo
18065381COLOR MEASURING SYSTEM, BACKING PLATE, AND COLOR MEASURING APPARATUSDecember 2022December 2025Allow3740NoNo
17906143DEVICE AND METHOD FOR CHARACTERISING THE ROUGHNESS PROFILE OF A TISSUE SAMPLENovember 2022December 2024Allow2710YesNo
17972073MULTI-SPECTRAL SCATTERING-MATRIX TOMOGRAPHYOctober 2022March 2025Allow2810NoNo
17995434OPTICAL MEASURING DEVICE AND METHOD FOR ASCERTAINING THE THREE-DIMENSIONAL SHAPE OF AN OBJECTOctober 2022October 2025Abandon3720NoNo
17958897Remote Detection ApparatusOctober 2022February 2025Abandon2910NoNo
17935118METHOD AND SYSTEM FOR EXPANDING THE DYNAMIC RANGE OF MACH-ZEHNDER SENSOR BASED ON THE CALCULATION OF OPTICAL LENGTHSeptember 2022November 2024Abandon2610NoNo
17914284NEW TYPE OF DEVICE(S) FOR AUTOMATICALLY MONITORING A COATING AND/OR STRUCTURE APPLIED TO A SUBSTRATE WITH DETERMINATION OF REFLECTIVE PROPERTIES AND/OR GEOMETRIC DIMENSIONS, AND A CORRESPONDING METHODSeptember 2022November 2024Allow2610NoNo
17913553DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHODSeptember 2022May 2025Allow3220NoNo
17942680METHOD FOR MEASURING THE DIAMETER OF FILAMENT DIFFRACTION FRINGES BY CALCULATING THE FREQUENCY DOMAINSeptember 2022October 2024Allow2520NoNo
17879891Orbital Goniometer Autocollimation DeviceAugust 2022August 2025Abandon3720YesNo
17878318POLARIZING FIZEAU INTERFEROMETERAugust 2022December 2024Allow2820YesNo
17870740Method and Apparatus for Characterizing Objects Using a Light-Emitting ArrayJuly 2022December 2024Allow2910YesNo
17869698INTRAORAL SCANNER WITH ILLUMINATION SEQUENCING AND CONTROLLED POLARIZATIONJuly 2022January 2025Allow3010YesNo
17865126LIDAR ADAPTIVE SINGLE-PASS HISTOGRAMMING FOR LOW POWER LIDAR SYSTEMJuly 2022May 2024Allow2200NoNo
17863680EVALUATION SYSTEM FOR AN OPTICAL DEVICEJuly 2022June 2024Allow2320NoNo
17786545POLARIZATION IMAGING SYSTEM AND POLARIZATION IMAGING METHODJune 2022February 2025Allow3220YesNo
17786069LIDAR WITH MULTI-RANGE CHANNELSJune 2022December 2025Abandon4240NoNo
17785744DETECTOR WAVELENGTH CALIBRATIONJune 2022March 2025Allow3330NoNo
17785201METHOD FOR DETECTING GRANULAR MATTERS AND OPTICAL SORTER USED THEREFORJune 2022March 2025Abandon3320NoNo
17805072FLUID COMPOSITION SENSOR DEVICE AND METHOD OF USING THE SAMEJune 2022October 2022Allow530YesNo
17664773METHOD FOR DETERMINING AN IMAGING QUALITY OF AN OPTICAL SYSTEM WHEN ILLUMINATED BY ILLUMINATION LIGHT WITHIN AN ENTRANCE PUPIL TO BE MEASUREDMay 2022August 2025Allow3930YesNo
17743845RECORDING APPARATUSMay 2022October 2025Abandon4130NoNo
17722049FLUID TESTING SYSTEMApril 2022December 2025Allow4441YesYes
17722132OPTICAL MACHINE OF SMOKE DETECTORApril 2022October 2024Allow3031NoNo
17656468GAS DETECTION DEVICEMarch 2022May 2024Allow2620YesNo
17694783DEVICE AND A METHOD FOR LIGHT-BASED ANALYSIS OF A SUBSTANCE IN A LIQUID SAMPLEMarch 2022September 2024Allow3010NoNo
17636764METHOD FOR POSITIONING SUBSTRATEFebruary 2022October 2025Allow4440YesNo
17632801METHOD AND SYSTEM FOR QUANTIFYING A SPECTRAL SIMILARITY BETWEEN A SAMPLE COLOR AND A TARGET COLORFebruary 2022July 2024Allow3010NoNo
17665480INTEGRATED COMPACT CELL SORTERFebruary 2022December 2024Allow3420YesNo
17610103IMPROVED 3D SENSINGNovember 2021April 2025Allow4120YesNo
17478551LIGHT-EMITTING DEVICE, OPTICAL DEVICE, AND INFORMATION PROCESSING DEVICESeptember 2021July 2024Allow3410NoNo
17475518LENSLESS IMAGER FOR LASER DETECTIONSeptember 2021July 2025Allow4640YesNo
17471007SYSTEMS AND METHODS FOR ABSOLUTE SAMPLE POSITIONINGSeptember 2021May 2025Allow4421NoNo
17433816MATERIAL HANDLING SYSTEM AND MONITORING SYSTEM AND MONITORING METHOD FOR PARTICLES IN TRAVELING AREA OF OVERHEAD HOIST TRANSFERSAugust 2021March 2025Allow4310NoNo
17391253METHODS AND SYSTEMS FOR AUTOMATICALLY IDENTIFYING IR SECURITY MARKS BASED ON KNOWN HALFTONE FREQUENCY AND COLOR INFORMATIONAugust 2021February 2024Allow3011NoNo
17389411ABATEMENT OF ASBESTOS USING FLUORINATED METAL COMPOUNDSJuly 2021January 2024Allow3000NoNo
17367937SYSTEMS AND METHODS FOR MANUFACTURING COLORED PRODUCTJuly 2021July 2025Allow4931NoNo
17349452SYSTEM AND METHOD FOR DETECTING OPTICAL POWER OF DRY OPHTHALMIC LENSESJune 2021March 2024Allow3311NoNo
17316621DISTRIBUTED ACOUSTIC SENSING USING DYNAMIC RANGE SUPPRESSIONMay 2021April 2024Allow3510NoNo
17243158IN-SITU FILM GROWTH RATE MONITORING APPARATUS, SYSTEMS, AND METHODS FOR SUBSTRATE PROCESSINGApril 2021May 2024Allow3611YesNo
17287370CHOLESTEROL MEASUREMENT DEVICEApril 2021May 2024Allow3610NoNo
17285103METHOD AND MICROSCOPE FOR DETERMINING THE THICKNESS OF A COVER SLIP OR SLIDEApril 2021February 2024Allow3410NoNo
17269904TOOL-CHECKING DEVICE IN A WORKPIECE PROCESSING MACHINEFebruary 2021March 2024Allow3610YesNo
17261259DIFFRACTIVE BIOSENSORJanuary 2021September 2024Abandon4420NoNo
17104154PRISM-COUPLING SYSTEMS AND METHODS HAVING MULTIPLE LIGHT SOURCES WITH DIFFERENT WAVELENGTHSNovember 2020December 2024Abandon4921NoNo

Appeals Overview

No appeal data available for this record. This may indicate that no appeals have been filed or decided for applications in this dataset.

Examiner TRAN, JUDY DAO - Prosecution Strategy Guide

Executive Summary

Examiner TRAN, JUDY DAO works in Art Unit 2877 and has examined 16 patent applications in our dataset. With an allowance rate of 87.5%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 36 months.

Allowance Patterns

Examiner TRAN, JUDY DAO's allowance rate of 87.5% places them in the 67% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by TRAN, JUDY DAO receive 1.50 office actions before reaching final disposition. This places the examiner in the 26% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by TRAN, JUDY DAO is 36 months. This places the examiner in the 36% percentile for prosecution speed. Prosecution timelines are slightly slower than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +16.7% benefit to allowance rate for applications examined by TRAN, JUDY DAO. This interview benefit is in the 57% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 25.0% of applications are subsequently allowed. This success rate is in the 38% percentile among all examiners. Strategic Insight: RCEs show below-average effectiveness with this examiner. Carefully evaluate whether an RCE or continuation is the better strategy.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 60.0% of cases where such amendments are filed. This entry rate is in the 85% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 27% percentile). This examiner makes examiner's amendments less often than average. You may need to make most claim amendments yourself.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.0% of allowed cases (in the 33% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.