USPTO Examiner AYUB HINA F - Art Unit 2877

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
19068065MONOCULAR HIGH-RESOLUTION MULTISPECTRAL IMAGING SYSTEM AND CONTROL METHODMarch 2025July 2025Allow400NoNo
18993787CALIBRATION METHOD OF MEASUREMENT TEMPERATURE OF CONCENTRATION MEASUREMENT APPARATUS, AND CONCENTRATION MEASUREMENT APPARATUSJanuary 2025July 2025Allow610YesNo
18856590GAS DETECTING DEVICEOctober 2024November 2025Allow1300YesNo
18853189A METHOD AND SYSTEM FOR MEASUREMENT OF OPTICAL LOSS IN WAFER LEVEL TESTING VIA WAVELENGTH-ROUTE DIVISIONOctober 2024March 2026Allow1800YesNo
18887176MULTISPECTRAL FILTERSeptember 2024February 2026Allow1700YesNo
18760099HYBRID METROLOGY METHOD AND SYSTEMJuly 2024March 2025Allow900NoNo
18661855COLORIMETRY DEVICEMay 2024February 2026Allow2110NoNo
18641975COLOR MEASUREMENT APPARATUSApril 2024April 2025Allow1210NoNo
18701998DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHODApril 2024March 2026Allow2310YesNo
18634686IDENTIFYING SUBSTANCES STORED IN CONTAINERS UTILIZING A PORTABLE RAMAN PROBEApril 2024March 2026Allow2310YesNo
18627740LASER INDUCED BREAKDOWN SPECTROSCOPE ANALYZING AEROSOLApril 2024February 2026Allow2310YesNo
18445912Sample alignment system in reflectometers, ellipsometers, spectrophotometers and the likeMarch 2024October 2025Allow1910YesNo
18611338METHODS FOR NUCLEIC ACID SEQUENCINGMarch 2024February 2026Allow2310NoNo
18607867System and Method for Quantum Absorption SpectroscopyMarch 2024January 2026Allow2210NoNo
18603194INTEGRATED DEVICE WITH EXTERNAL LIGHT SOURCE FOR PROBING, DETECTING AND ANALYZING MOLECULESMarch 2024July 2025Abandon1601NoNo
18598725COLOR MEASUREMENT APPARATUS AND CONTROL METHODMarch 2024October 2025Allow1900NoNo
18598615COLOR MEASUREMENT APPARATUSMarch 2024January 2026Allow2310NoNo
18588491DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNEDFebruary 2024August 2025Allow1800YesNo
18585009OPTICAL MEASUREMENT APPARATUS, OPTICAL MEASUREMENT ADAPTER AND METHOD OF OPTICAL MEASUREMENTFebruary 2024October 2025Allow2000NoNo
18443040SPECTROMETER SYSTEMS AND METHODS OF REMOTE DATA ACQUISITION FOR DETECTING CHEMICAL COMPOSITIONSFebruary 2024February 2026Allow2411NoNo
18431601DEVICE AND METHOD FOR MEASURING AZIMUTH ANGLE AND ELEVATION ANGLE OF MID-INFRARED LASER LIGHTFebruary 2024July 2025Allow1700NoNo
18292507CASCADED, SELF-CALIBRATED, SINGLE-PIXEL INFRARED HADAMARD TRANSFORM SPECTROMETERJanuary 2024July 2025Allow1800NoNo
18411598SPECTRUM MEASUREMENT APPARATUS AND SPECTRUM MEASUREMENT METHODJanuary 2024December 2025Allow2310NoNo
18577515A POSITION MEASUREMENT SYSTEM, A POSITIONING SYSTEM, A LITHOGRAPHIC APPARATUS, AND A DEVICE MANUFACTURING METHODJanuary 2024March 2026Abandon2610NoNo
18396404DEVICES, SYSTEMS, AND METHODS FOR AGROCHEMICAL DETECTION AND AGROCHEMICAL COMPOSITIONSDecember 2023June 2025Allow1711YesNo
18572800CONCENTRATION MEASUREMENT DEVICEDecember 2023January 2026Allow2410NoNo
18544818ON-LINE MULTI-COMPONENT GAS ANALYSIS SYSTEM BASED ON SPECTRAL ABSORPTION TECHNOLOGY AND ANALYSIS METHOD THEREOFDecember 2023August 2025Allow2000NoNo
18541744MAGNETIC STABILIZATION METHOD AND SYSTEM IN INFRARED, VISIBLE AND ULTRAVIOLET SPECTROSCOPYDecember 2023January 2026Allow2510YesNo
18495088SYSTEM AND METHOD FOR A JEWELRY VIEWING STANDOctober 2023October 2025Allow2410NoNo
18479273MEASUREMENT SYSTEM AND MEASUREMENT METHODOctober 2023March 2026Allow2920YesNo
18283804OPTICAL DEVICESeptember 2023October 2025Allow2510NoNo
18370809OPTICAL CAVITY FOR ABSORPTION SPECTROSCOPY AND METHODS OF ASSEMBLYSeptember 2023September 2025Allow2410YesNo
18280195SEMICONDUCTOR LASER DEVICESeptember 2023November 2025Allow2620YesNo
18331604REFLECTION REFUTING LASER SCANNERAugust 2023December 2025Abandon3011NoNo
18452738BROAD-SPECTRUM IMAGING SPECTROMETER BASED ON TRANSMISSION AND REFLECTION INTEGRATED STRUCTUREAugust 2023June 2025Allow2100YesNo
18233063PARTICLE DETECTION SENSOR AND PARTICLE DETECTORAugust 2023January 2025Allow1830NoNo
18231940SPECTROMETER MODULEAugust 2023July 2024Allow1110NoNo
18275715APPARATUS FOR THE MEASUREMENT OF LIGHT TRANSMITTANCE THROUGH A LIQUID SAMPLE USING MULTIPLE LED LIGHT SOURCESAugust 2023July 2025Allow2410NoNo
18274629METHOD AND APPARATUS FOR CHARACTERISING AN OBJECTJuly 2023April 2025Allow2100NoNo
18262361METHOD FOR CALIBRATING A GAS SENSOR AND METHOD FOR MEASURING A GAS USING THE CALIBRATIONJuly 2023January 2025Allow1800NoNo
18223065PORTABLE MULTIFUNCTION SPECTROSCOPY ANALYZERJuly 2023August 2025Allow2510NoNo
18272126METHOD AND DEVICE FOR MEASURING SEMICONDUCTOR MULTILAYER STRUCTURE BASED ON SECOND HARMONICJuly 2023August 2024Allow1310YesNo
18271910SPECTROPHOTOMETRIC INSTRUMENTJuly 2023July 2025Allow2410NoNo
18340446OPTICAL DEVICEJune 2023April 2024Allow1010YesNo
18258579DETERMINING TIME RESPONSE VALUE OF AN ANALYTE IN A LIQUIDJune 2023April 2025Allow2100NoNo
18268785OPTICAL MODULE AND MULTIFOCAL OPTICAL DEVICEJune 2023July 2025Allow2510NoNo
18258528OPTICAL SPECTROMETERJune 2023September 2025Allow2720YesNo
18211393SYSTEM AND METHOD FOR TRACING A GEMSTONE'S JOURNEY FROM THE MINE TO THE CONSUMER BY DETECTING INCLUSIONS IN THE GEMSTONEJune 2023August 2025Abandon2610NoNo
18210558Optics For Measurement Of Thick Films And High Aspect Ratio StructuresJune 2023July 2025Allow2510YesNo
18207936CELL AND OPTICAL CAVITY FOR ABSORPTION SPECTROSCOPY AND METHODS OF ASSEMBLYJune 2023April 2025Allow2210NoNo
18326298LASER DEVICEMay 2023November 2024Allow1820NoNo
18323463MULTISPECTRAL FILTERMay 2023May 2024Allow1220YesNo
18320172QUADRILATERAL COMMON-PATH TIME-MODULATED INTERFEROMETRIC SPECTRAL IMAGING DEVICE AND METHODMay 2023February 2024Allow910NoNo
18197868CHAMBER MOISTURE CONTROL USING NARROW OPTICAL FILTERS MEASURING EMISSION LINESMay 2023June 2025Allow2511YesNo
18036799DEVICE FOR DIAGNOSING ENVIRONMENTAL STRESS IN PLANTS AND METHOD FOR DIAGNOSING ENVIRONMENTAL STRESSMay 2023June 2025Allow2520YesNo
18316559SOLID-STATE SPECTROMETERMay 2023May 2024Allow1220NoNo
18034816DEVICE AND METHOD FOR DETECTING THE PRESENCE OF GAS HYDRATE CRYSTALSMay 2023November 2024Allow1900NoNo
18033530POLARIZATION SELECTION METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND METHODS THEREOFApril 2023February 2025Allow2210YesNo
18302459INSTRUMENTS AND METHODS FOR CHARACTERIZING THE APPEARANCE OF SAMPLESApril 2023June 2024Allow1410YesNo
18249311OPTICAL DETECTOR AND METHOD FOR DETERMINING AT LEAST ONE PROPERTY OF AT LEAST ONE SUBSTANCEApril 2023September 2025Abandon2910NoNo
18298898HIGH-SENSITIVITY GAS-MAPPING 3D IMAGER AND METHOD OF OPERATIONApril 2023March 2025Allow2410NoNo
18295891MEASURING APPARATUS, MEASURING METHOD, AND STORAGE MEDIUMApril 2023June 2025Allow2710NoNo
18190567MEASUREMENT METHOD AND MEASUREMENT APPARATUS FOR MEASURING THICKNESS OF SEMICONDUCTOR WAFERMarch 2023July 2025Allow2820NoNo
18186191GAS CONCENTRATION MEASUREMENT SYSTEMMarch 2023December 2024Allow2000NoNo
18245605DEVICE AND METHOD FOR MEASURING INTERFACES OF AN OPTICAL ELEMENTMarch 2023April 2025Allow2510NoNo
18120781SPECTRAL CAMERA AND ELECTRONIC DEVICE INCLUDING THE SAMEMarch 2023May 2025Allow2610YesNo
18118269METHODS FOR HIGH-RESOLUTION, STABLE MEASUREMENT OF PITCH AND ORIENTATION IN OPTICAL GRATINGSMarch 2023April 2025Allow2601NoNo
18179117Multi-Application Optical Sensing Apparatus and Method ThereofMarch 2023January 2024Allow1110YesNo
18043865FLUORIMETER CELL AND ITS CALIBRATIONMarch 2023January 2026Allow3420NoNo
18111229PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE PUPIL ELLIPSOMETRY MEASUREMENT METHODFebruary 2023November 2024Allow2100NoNo
18110042Measurement Device for Measuring Light, Measurement System and Measurement Method for Detecting Light ParametersFebruary 2023July 2025Allow2920YesNo
18108824SPECTROMETER MODULEFebruary 2023October 2025Abandon3250NoNo
18040760Detector for SpectroscopyFebruary 2023February 2025Allow2510YesNo
18040382SPECTROSCOPIC EVALUATION OF TALLOWFebruary 2023March 2025Allow2520NoNo
18104230POLARIZATION OPTICAL SYSTEMJanuary 2023June 2025Allow2820NoNo
18101644Measurement ApparatusJanuary 2023September 2024Allow2000NoNo
18006438Spectrometer Device and Method for Measuring Optical RadiationJanuary 2023May 2025Abandon2810NoNo
18005740Device for polarimetrically characterising the anisotropy of a medium, and corresponding imaging systemJanuary 2023January 2025Allow2410NoNo
18016084SPECTROMETER HAVING A SUPPORT PLATE AND HAVING A HOUSINGJanuary 2023October 2024Allow2100NoNo
18005265SPECTROSCOPIC DEVICE, SPECTROMETRY DEVICE, AND SPECTROSCOPIC METHODJanuary 2023January 2026Abandon3620NoNo
18003998SYSTEM FOR MEASURING THICKNESS AND PHYSICAL PROPERTIES OF THIN FILM USING SPATIAL LIGHT MODULATORDecember 2022October 2024Allow2210YesNo
18003801SYSTEMS AND METHODS FOR OPTICAL METROLOGYDecember 2022March 2025Allow2720YesNo
18003112ADAS CALIBRATION SYSTEM FOR CALIBRATING AT LEAST ONE HEADLAMP OF A VEHICLEDecember 2022August 2024Allow2000NoNo
18083868LiDAR DATA CONVERSION APPARATUS AND METHOD FOR TRAINING VARIOUS TYPES OF AUTONOMOUS VEHICLES BY USING PRE-ACQUIRED DATADecember 2022March 2026Allow3910NoNo
18082040SEMICONDUCTOR MEASUREMENT APPARATUSDecember 2022December 2024Allow2401NoNo
18078677SYSTEMS AND METHODS FOR CHARACTERIZING SPECTRAL REFLECTANCE OF REAL WORLD OBJECTSDecember 2022January 2024Allow1320NoNo
18009509OPTICAL FIBER BENDING LOSS MEASURING METHODDecember 2022February 2025Allow2610NoNo
18075379INFRARED RAMAN MICROSCOPE AND DATA PROCESSING METHODDecember 2022February 2025Allow2610NoNo
179928923D SCANNING SYSTEM AND METHODNovember 2022January 2026Allow3810NoNo
17926314METHOD AND APPARATUS FOR MEASURING DISTANCENovember 2022February 2025Allow2720NoNo
18055984METHOD AND SYSTEM FOR SPECTRAL IMAGING OF DENSITY, ANISOTROPY, AND ORIENTATIONNovember 2022August 2024Allow2100NoNo
17979395PULSED SPECTROPOLARIMETERNovember 2022February 2025Allow2730YesNo
17967215MULTI-SPECTRAL AND POLARIZATION IMAGING APPARATUS WITH ATMOSPHERIC SOUNDING FILTERS AND ASSOCIATED SYSTEM AND METHODOctober 2022January 2025Allow2700NoNo
17996348FLUORESCENCE MEASURING DEVICEOctober 2022December 2024Allow2610NoNo
17918691INTERFEROMETRIC GAS SENSOROctober 2022October 2024Allow2400NoNo
17964926DRUG SCANNING AND IDENTIFICATION SYSTEM AND USE METHOD THEREOFOctober 2022April 2024Allow1810NoNo
17917002SpectrometerOctober 2022November 2024Allow2610NoNo
17956824LIDAR AND AUTOMATED DRIVING DEVICESeptember 2022March 2026Allow4110NoNo
17946796MODULAR HOUSING FOR A SPECTROMETERSeptember 2022July 2024Allow2200NoNo
17906387MULTIPASS CELLSeptember 2022July 2024Allow2210NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner AYUB, HINA F.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
1
Examiner Affirmed
1
(100.0%)
Examiner Reversed
0
(0.0%)
Reversal Percentile
13.8%
Lower than average

What This Means

With a 0.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.

Strategic Value of Filing an Appeal

Total Appeal Filings
18
Allowed After Appeal Filing
9
(50.0%)
Not Allowed After Appeal Filing
9
(50.0%)
Filing Benefit Percentile
81.3%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 50.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Strategic Recommendations

⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.

✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner AYUB, HINA F - Prosecution Strategy Guide

Executive Summary

Examiner AYUB, HINA F works in Art Unit 2877 and has examined 482 patent applications in our dataset. With an allowance rate of 84.2%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 25 months.

Allowance Patterns

Examiner AYUB, HINA F's allowance rate of 84.2% places them in the 59% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by AYUB, HINA F receive 1.73 office actions before reaching final disposition. This places the examiner in the 37% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by AYUB, HINA F is 25 months. This places the examiner in the 80% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +20.0% benefit to allowance rate for applications examined by AYUB, HINA F. This interview benefit is in the 64% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 29.9% of applications are subsequently allowed. This success rate is in the 58% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 53.1% of cases where such amendments are filed. This entry rate is in the 79% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 240.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 100% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 93.3% of appeals filed. This is in the 85% percentile among all examiners. Of these withdrawals, 78.6% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.

Petition Practice

When applicants file petitions regarding this examiner's actions, 41.8% are granted (fully or in part). This grant rate is in the 33% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 0.6% of allowed cases (in the 62% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).

Quayle Actions: This examiner issues Ex Parte Quayle actions in 1.0% of allowed cases (in the 61% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.
  • Request pre-appeal conferences: PACs are highly effective with this examiner. Before filing a full appeal brief, request a PAC to potentially resolve issues without full PTAB review.
  • Appeal filing as negotiation tool: This examiner frequently reconsiders rejections during the appeal process. Filing a Notice of Appeal may prompt favorable reconsideration during the mandatory appeal conference.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.