USPTO Examiner YAZBACK MAHER - Art Unit 2877

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
19056155HYBRID FREE SPACE OSCILLATORS FOR ULTRAPRECISION SENSOR APPLICATIONSFebruary 2025September 2025Allow710NoNo
18581722WAFER NOTCH POSITIONING DETECTIONFebruary 2024March 2026Allow2510YesNo
18294666SPECTRAL DOMAIN OPTICAL IMAGING WITH WAVELENGTH COMB ILLUMINATIONFebruary 2024February 2026Allow2510NoNo
18425830COMPLEX PHASE DIFFERENCE SENSING DEVICE OF SAMPLE SURFACE SHAPEJanuary 2024February 2026Allow2510YesNo
18389925PLASMONIC BOROPHENE NANORIBBON METAL-INSULATOR-METAL STRUCTURE FOR QUANTUM IMAGINGDecember 2023July 2025Allow1900YesNo
18514942SYSTEMS AND METHODS FOR DISTRIBUTED FIBER OPTIC SENSING OVER LIVE FIBERSNovember 2023January 2026Abandon2620YesNo
18514952SYSTEMS AND METHODS FOR UTILIZING DISTRIBUTED FIBER OPTIC SENSING TO DETECT RISKS TO FIBERSNovember 2023January 2026Allow2630YesNo
18554145TRANSMISSION TYPE OPTICAL MEASUREMENT DEVICE HAVING IMPROVED MEASUREMENT ACCURACYOctober 2023May 2025Allow1910NoNo
18480700OPTICAL DEVICEOctober 2023January 2025Allow1610NoNo
18479929SURFACE DENSITY MEASUREMENT METHOD, SURFACE DENSITY MEASUREMENT SYSTEM, AND COMPUTER DEVICEOctober 2023September 2025Allow2410NoNo
18470081DETECTING VIBRATION OF A CABLE OF AN INFORMATION HANDLING SYSTEMSeptember 2023December 2025Allow2610YesNo
18277910MEASUREMENT DEVICE FOR MEASURING TEMPERATURE OR DISTORTION OF AN OPTICAL FIBER, METHOD OF ADJUSTING MEASUREMENT DEVICE, AND MEASUREMENT METHOD FOR MEASURING TEMPERATURE OF DISTORTION OF AN OPTICAL FIBERAugust 2023January 2026Allow2930YesNo
18220357GEMSTONE MULTI-TESTER INSTRUMENT WITH REMOVABLE PROBEJuly 2023January 2026Allow3020YesNo
18255192DISTANCE MEASURING DEVICE AND DISTANCE MEASURING METHODMay 2023January 2026Allow3210NoNo
18133261ANALYSIS DEVICE, ANALYSIS SYSTEM AND PORTABLE INFORMATION TERMINALApril 2023September 2025Allow2920YesNo
18120743GRAIN-COMPONENT SENSOR AND GRAIN-COMPONENT ANALYZING INSTRUMENTMarch 2023November 2025Abandon3220NoNo
18024120METHOD AND APPARATUS FOR CREATING A MICROSCOPIC SAMPLE IMAGE OF A MOLECULAR VIBRATIONAL RESPONSE OF A SAMPLEMarch 2023May 2025Allow2610NoNo
18105749INTERFEROMETER WITH AUXILIARY LENS FOR MEASUREMENT OF A TRANSPARENT TEST OBJECTFebruary 2023August 2025Allow3010NoNo
18017812SPECTROMETER-LESS SAMPLE ANALYSIS SYSTEM AND METHOD USING HIGH WAVENUMBER RAMAN SCATTERINGJanuary 2023August 2025Abandon3110NoNo
18014480DEMULTIPLEXING FILTER AND METHODJanuary 2023January 2025Allow2500NoNo
18014411System for Characterising Particles in the Form of an Aerosol in an Ambient Gas and Associated MethodJanuary 2023June 2025Allow3010YesNo
18149928LASER LIGHT PROFILE MEASURING DEVICE AND LASER LIGHT PROFILE MEASURING METHODJanuary 2023April 2025Allow2710YesNo
18013366Nanozeolites and their Analytical Use as Chemosensors in Biorelevant MediaDecember 2022July 2025Allow3110NoNo
18002847Systems and Methods for Real-Time Color Correction of Waveguide Based DisplaysDecember 2022March 2025Abandon2610NoNo
18084249Auto-focus for SpectrometersDecember 2022January 2026Allow3720YesNo
18010720OPTICAL FIBER CHARACTERISTIC MEASUREMENT DEVICE, OPTICAL FIBER CHARACTERISTIC MEASUREMENT PROGRAM, AND OPTICAL FIBER CHARACTERISTIC MEASUREMENT METHOD FOR MEASURING CHARACTERISTICS OF OPTICAL FIBER BASED ON BRILLOUIN GAIN SPECTRUMDecember 2022March 2025Allow2710NoNo
18077963DIAMOND AND COLORLESS GEMSTONE MULTI-TESTERDecember 2022December 2025Allow3620YesNo
18008490OBSERVATION DEVICE AND OBSERVATION METHOD USING A LOW-SPEED CAMERA AS AN IMAGING UNIT WHEN OBSERVING A MOVING OBSERVATION OBJECTDecember 2022August 2025Allow3310YesNo
18008470DEVICE AND METHOD FOR DETERMINING THE THREE-DIMENSIONAL GEOMETRY OF AN INDIVIDUAL OBJECTDecember 2022December 2025Allow3620NoNo
18050848STRUCTURE INSPECTION METHOD AND STRUCTURE INSPECTION SYSTEMOctober 2022September 2024Abandon2200NoNo
17906566Fibre Optic Cable Sensing ApparatusSeptember 2022December 2024Allow2710NoNo
17911071SYSTEM FOR MEASURING MICROBENDS AND ARBITRARY MICRODEFORMATIONS ALONG A THREE-DIMENSIONAL SPACESeptember 2022February 2025Abandon2910NoNo
17910899ANOMALY DETECTION SYSTEM, ANOMALY DETECTION APPARATUS, AND ANOMALY DETECTION METHODSeptember 2022January 2026Abandon4030NoNo
17802067SIGNAL PROCESSING DEVICE AND SENSING MODULE WITH MULTISTAGE-BRANCHING-WIRED-LINE CIRCUITRYAugust 2022May 2025Abandon3320NoNo
17796749SYSTEM FOR POLARIMETRIC CHARACTERIZATION OF A TARGETAugust 2022May 2025Allow3320NoNo
17861710METHODS FOR DETERMINING PHOTODETECTOR GAIN-VOLTAGE USING OPTICAL SIGNALSJuly 2022October 2025Allow3921NoNo
17828912Method to Detect Diesel in Fluid Samples Using Partially Dissolvable CuvettesMay 2022September 2024Allow2810NoNo
17826618DEVICES, SYSTEMS, AND METHODS FOR CONTROLLING INSECTS IN A SMOKE DETECTOR DEVICEMay 2022January 2026Allow4341YesNo
17826608Wavelength Reference Having Repeating Spectral Features and Unique Spectral FeaturesMay 2022October 2025Allow4110NoNo
17825052OPTICAL DETECTION DEVICEMay 2022November 2024Abandon3010NoNo
17751197EPI SELF-HEATING SENSOR TUBE AS IN-SITU GROWTH RATE SENSORMay 2022December 2024Allow3111YesNo
17649905OBJECT RECOGNITION SYSTEM AND OBJECT RECOGNITION METHODFebruary 2022January 2026Allow4810YesNo
17578707MEDICAL INFUSION LINE ELECTRONIC ILLUMINATORJanuary 2022October 2025Allow4510NoNo
17550738Calibration Apparatus for Offset Vehicle SensorDecember 2021February 2025Abandon3811NoNo
17454159MEASUREMENT MARK APPLIED TO SEMICONDUCTOR STRUCTURE, MEASUREMENT LAYOUT FOR OVERLAY ERROR, SEMICONDUCTOR STRUCTURE, AND MEASUREMENT METHOD THEREOFNovember 2021July 2025Abandon4520NoNo
17511089NON-FIBER FLAT-PANEL BREAST DIFFUSION OPTICAL TOMOGRAPHY SYSTEMOctober 2021March 2025Allow4111NoNo
17500304MEASUREMENT MARK, SEMICONDUCTOR STRUCTURE, MEASUREMENT METHOD AND DEVICE, AND STORAGE MEDIUMOctober 2021June 2025Abandon4420NoNo
17460580ALIGNMENT MARK AND METHODAugust 2021December 2024Allow4020YesNo
16626048QUANTITATIVE LIQUID BIOPSY DIAGNOSTIC SYSTEM AND METHODSDecember 2019April 2023Abandon3920NoNo

Appeals Overview

No appeal data available for this record. This may indicate that no appeals have been filed or decided for applications in this dataset.

Examiner YAZBACK, MAHER - Prosecution Strategy Guide

Executive Summary

Examiner YAZBACK, MAHER works in Art Unit 2877 and has examined 6 patent applications in our dataset. With an allowance rate of 33.3%, this examiner allows applications at a lower rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 41 months.

Allowance Patterns

Examiner YAZBACK, MAHER's allowance rate of 33.3% places them in the 5% percentile among all USPTO examiners. This examiner is less likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by YAZBACK, MAHER receive 1.67 office actions before reaching final disposition. This places the examiner in the 34% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by YAZBACK, MAHER is 41 months. This places the examiner in the 21% percentile for prosecution speed. Applications take longer to reach final disposition with this examiner compared to most others.

Interview Effectiveness

Conducting an examiner interview provides a +80.0% benefit to allowance rate for applications examined by YAZBACK, MAHER. This interview benefit is in the 99% percentile among all examiners. Recommendation: Interviews are highly effective with this examiner and should be strongly considered as a prosecution strategy. Per MPEP § 713.10, interviews are available at any time before the Notice of Allowance is mailed or jurisdiction transfers to the PTAB.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 50.0% of applications are subsequently allowed. This success rate is in the 97% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 0.0% of cases where such amendments are filed. This entry rate is in the 2% percentile among all examiners. Strategic Recommendation: This examiner rarely enters after-final amendments compared to other examiners. You should generally plan to file an RCE or appeal rather than relying on after-final amendment entry. Per MPEP § 714.12, primary examiners have discretion in entering after-final amendments, and this examiner exercises that discretion conservatively.

Petition Practice

When applicants file petitions regarding this examiner's actions, 100.0% are granted (fully or in part). This grant rate is in the 92% percentile among all examiners. Strategic Note: Petitions are frequently granted regarding this examiner's actions compared to other examiners. Per MPEP § 1002.02(c), various examiner actions are petitionable to the Technology Center Director, including prematureness of final rejection, refusal to enter amendments, and requirement for information. If you believe an examiner action is improper, consider filing a petition.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 27% percentile). This examiner makes examiner's amendments less often than average. You may need to make most claim amendments yourself.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.0% of allowed cases (in the 33% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Prepare for rigorous examination: With a below-average allowance rate, ensure your application has strong written description and enablement support. Consider filing a continuation if you need to add new matter.
  • Prioritize examiner interviews: Interviews are highly effective with this examiner. Request an interview after the first office action to clarify issues and potentially expedite allowance.
  • Plan for RCE after final rejection: This examiner rarely enters after-final amendments. Budget for an RCE in your prosecution strategy if you receive a final rejection.
  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.
  • Plan for extended prosecution: Applications take longer than average with this examiner. Factor this into your continuation strategy and client communications.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.