USPTO Examiner LAPAGE MICHAEL P - Art Unit 2877

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18650634METHOD OF MEASURING THICKNESS OF THIN FILMS USING DIFFRACTION OF POLARIZED LIGHT THROUGH A THIN FILMApril 2024February 2025Allow920YesNo
18644184SHAPE INSPECTION DEVICE, PROCESSING DEVICE, HEIGHT IMAGE PROCESSING DEVICEApril 2024September 2025Allow1700YesNo
18602774Automated Non-Contact Thickness Inspection and Projection SystemMarch 2024October 2024Allow700YesNo
18600760ANGULAR AVERAGING CALIBRATION ON BARE WAFER METROLOGY TOOLS FOR ESFQR MATCHING IMPROVEMENTMarch 2024October 2025Allow1901NoNo
18596665INTERACTION OF SPECTROSCOPY AND ARTIFICIAL INTELLIGENCE FOR SEROLOGICAL ANALYSIS AND ITS APPLICATIONSMarch 2024November 2025Allow2010YesNo
18587496MICROFLUIDIC CHIP DEVICE FOR OPTICAL FORCE MEASUREMENTS AND CELL IMAGING USING MICROFLUIDIC CHIP CONFIGURATION AND DYNAMICSFebruary 2024March 2026Allow2430YesNo
18528384INTERFEROMETRY ASSEMBLY HAVING OPTICAL PATHS THROUGH DIFFERENT MATERIALSDecember 2023May 2025Allow1821YesNo
18516603Flow Cytometer With Adjustable Positional Offset Sort Deflection Plates And Methods Of Using The SameNovember 2023April 2025Allow1730YesNo
18494919Particle Size Statistical Method of Granular Minerals of ShaleOctober 2023February 2026Allow2820YesNo
18491684REMOVABLE CIRCULAR NOZZLE FOR FLOW CYTOMETERSOctober 2023August 2025Allow2200NoNo
18373639JOGBOX WITH 3D SCANNERSeptember 2023April 2025Allow1930NoNo
18373905SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIESSeptember 2023May 2024Allow800YesNo
18367705SYSTEMS AND METHODS FOR EVALUATING IMMUNE RESPONSE TO INFECTION VIA MONITORING CELL GRANULARITY PARAMETER OF CELLSSeptember 2023May 2024Allow800YesNo
18548794LIQUID HANDLING MEANS FOR PERFORMING ASSAYS USING PLATE-LIKE LIQUID CONTACTING ELEMENT WITH FORCE CONTROLSeptember 2023March 2024Allow700YesNo
18233289FLOW CELLS HAVING CHAMBERS WITH PRIMERS ATTACHED THERETO AND METHOD OF USING THE SAME WITHOUT THE USE OF IMMOBILIZING AGENTSAugust 2023August 2024Allow1201YesNo
18228227PARTIAL COHERENCE MITIGATION IN VIDEO MEASUREMENT SYSTEMS VIA ILLUMINATION APODIZATIONJuly 2023March 2026Allow3110YesNo
18342184Superresolution Metrology Methods based on Singular Distributions and Deep LearningJune 2023January 2025Allow1820NoNo
18214726DEVICES AND METHODS FOR SEMEN ANALYSISJune 2023September 2024Allow1510YesNo
18336502POLARIZATION SPECTRAL FILTER, POLARIZATION SPECTRAL FILTER ARRAY, AND POLARIZATION SPECTRAL SENSORJune 2023June 2024Allow1210NoNo
18336855AUTOMATED MICRODISSECTION INSTRUMENT AND METHOD FOR PROCESSING A BIOLOGICAL SAMPLEJune 2023March 2025Allow2140YesNo
18332027METHOD AND SYSTEM FOR CREATING A STICHED DESIGN FILEJune 2023January 2026Allow3110NoNo
18143843EXTENDED REALITY VIRTUAL DISTANCE MEASUREMENT SYSTEMMay 2023November 2023Allow610YesNo
18142008CELL ANALYSIS IN BODY FLUIDS, PARTICULARLY BLOOD USING A SAMPLE CARD WITH MULTIPLE SPACER SETS HAVING AT LEAST TWO DISTINCT SUBSTANTIALLY UNIFORM HEIGHTSMay 2023December 2024Allow1920YesNo
18034219CONDENSER UNIT FOR PROVIDING DIRECTED LIGHTING OF AN OBJECT TO BE MEASURED POSITIONED IN A MEASURED OBJECT POSITION, IMAGING DEVICE AND METHOD FOR RECORDING A SILHOUETTE CONTOUR OF AT LEAST ONE OBJECT TO BE MEASURED IN A MEASURING FIELD USING AN IMAGING DEVICE AND USE OF AN ATTENUATION ELEMENTApril 2023September 2024Abandon1620YesNo
18139864Multi-Parameter Inspection Apparatus for Monitoring of Manufacturing Parts Using a Polarization Image DetectorApril 2023February 2024Allow1000YesNo
18111130METHOD FOR OPERATING AN OPTICAL TOMOGRAPHIC IMAGING APPARATUSFebruary 2023April 2025Allow2610YesNo
18040404SPECTROSCOPIC EVALUATION OF UNSAPONIFIABLE MATTER IN TALLOWFebruary 2023April 2025Allow2610NoNo
18158346SYSTEM FOR ANALYZING AND IMAGING PARTICLES OR CELLS IN FLUIDS USING A MICROFLUIDIC CHIP HELD IN A CAVITY ITH THREADED SCREW HOLES FOR ADJUSTMENTJanuary 2023July 2025Allow2940YesNo
18083945SYNCHRONIZING AN OPTICAL COHERENCE TOMOGRAPHY SYSTEMDecember 2022May 2025Allow2900NoNo
18082342MEASURING FILM-THICKNESS OF A WORKPIECE IN A SEMICONDUCTOR PROCESSING APPARATUS USING A COMPOSITE SPECTRUMDecember 2022August 2025Allow3220YesNo
18077330Methods and Systems for Coherent Imaging and Feedback Control for Modification of Materials Using Dynamic Optical Path Switch in the Reference ArmsDecember 2022April 2025Allow2911NoNo
18076666VEHICLES, SYSTEMS, AND METHODS FOR THE AUTONOMOUS INSPECTION OF OBJECTSDecember 2022August 2025Allow3200YesNo
17928106METHOD FOR DETERMINING A FOCAL LENGTH OF A PARTICLE IN A MEDIUMNovember 2022April 2024Allow1600NoNo
17986026LARGE-DEPTH-RANGE THREE-DIMENSIONAL (3D) MEASUREMENT METHOD, SYSTEM, AND DEVICE BASED ON PHASE FUSIONNovember 2022May 2023Allow610YesNo
17985501Inspection Systems and Methods Employing Different Wavelength Directional Light For Enhanced ImagingNovember 2022January 2026Allow3921YesNo
17921402SHAPE MEASURING AND VIBRATION DETECTIONOctober 2022November 2025Allow3610YesNo
17915112LEARNING DEVICE, DIAGNOSTIC SYSTEM, AND MODEL GENERATION METHOD TO DIAGNOSE ABNORMALITY BASED ON TEMPERATURE MEASUREMENT IN A PRODUCTION FACILITYSeptember 2022June 2025Allow3310YesNo
17930797Methods of Multi-Core Fiber AlignmentSeptember 2022August 2025Allow3511NoNo
17939080INNER SURFACE SHAPE MEASUREMENT DEVICE, AND ALIGNMENT METHOD AND MAGNIFICATION CALIBRATION METHOD FOR INNER SURFACE SHAPE MEASUREMENT DEVICESeptember 2022April 2023Allow710YesNo
17939226INNER SURFACE SHAPE MEASUREMENT DEVICE, AND ALIGNMENT METHOD FOR INNER SURFACE SHAPE MEASUREMENT DEVICESeptember 2022April 2023Allow710YesNo
17896650MULTI-SCALE AUTOENCODER GENERATION METHOD, ELECTRONIC DEVICE AND READABLE STORAGE MEDIUMAugust 2022July 2025Allow3500YesNo
17893723FAST AR DEVICE PAIRING USING DEPTH PREDICTIONSAugust 2022May 2025Allow3220NoNo
17891302METHOD AND APPARATUS FOR DETECTING DEFECT BASED ON PHASED PASS/FAIL DETERMINATIONAugust 2022January 2026Allow4111NoNo
17877367METHOD AND DEVICE FOR DETERMINING AN ANGULAR ORIENTATION OF A LOGJuly 2022October 2025Allow3911NoNo
17758663INSPECTION DEVICE AND INSPECTION METHOD FOR DETECTING FORMATION OF A SOLDER BRIDGE OVER ADJACENT ELECTRODESJuly 2022March 2025Allow3220YesNo
17850151ABNORMALITY INSPECTION SYSTEM AND METHOD FOR DETECTING ABNORMALITY OF CURVED COMPONENT USING TWO DIFFERENT LEARNING MODELSJune 2022August 2025Allow3810YesNo
17848649SHAPE PROFILE MEASUREMENT DEVICE, AND SHRINK-PACKAGING MACHINEJune 2022October 2023Allow1610YesNo
17843293Computer and Visual Inspection Method for Identifying Defective ProductsJune 2022September 2025Allow3930NoNo
17839822PRISM COUPLING SYSTEMS AND METHODS EMPLOYING LIGHT-BLOCKING MEMBERSJune 2022April 2025Allow3411YesNo
17836505Method for Assessing Tool Profile Using Break-Beam Tool Setting ApparatusJune 2022July 2024Allow2520YesNo
17832931NEURAL NETWORK-BASED IMAGE DETECTION METHOD WITH HISTOGRAM ADJUSTMENT, COMPUTING DEVICE, AND STORAGE MEDIUMJune 2022November 2025Allow4211NoNo
17804618LAYOUT-BASED WAFER DEFECT IDENTIFICATION AND CLASSIFICATION USING SEPARATELY GENERATED PREDICTED IMAGES AND PREDICTED LAYOUT DESIGNSMay 2022March 2026Allow4531YesNo
17828049DEVICE AND METHOD FOR OPTICALLY CAPTURING AN OBJECTMay 2022December 2025Allow4231YesNo
17749530SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD TO SUPPRESS ALTERATION OF PROCESSING LIQUIDMay 2022July 2023Allow1310YesNo
17749174SHAPE INSPECTION DEVICE, PROCESSING DEVICE, HEIGHT IMAGE PROCESSING DEVICE USING CHARACTERISTIC POINTS IN COMBINATION WITH CORRECETION REFERENCE REGIONS TO CORRECT HEIGHT MEASUREMENTSMay 2022March 2024Allow2200NoNo
17744451PHASE SHIFT-BASED THREE-DIMENSIONAL MEASUREMENT SYSTEM WITH MULTIPLE CALIBRATION SURFACES AND CALIBRATION METHOD THEREOFMay 2022September 2024Allow2810NoNo
17744538VISUAL AND/OR DIMENSIONAL TIP INSPECTION SYSTEMS AND METHODSMay 2022July 2025Allow3811YesNo
17662720METHODS AND SYSTEMS FOR COHERENT IMAGING AND FEEDBACK CONTROL FOR MODIFICATION OF MATERIALS VIA IMAGING A FEEDSTOCK SUPPLY STREAM INTERFEROMETRICALLYMay 2022June 2023Allow1300NoNo
17736503DEVICE FOR RECOGNIZING WAFER IDENTIFICATION NUMBER WITH AUTOMATICALLY TURNING ON AND OFF RECOGNIZING FUNCTIONMay 2022June 2024Allow2600YesNo
17729814FLOW CELLS WITH A HYDROPHOBIC BARRIERApril 2022July 2023Allow1410NoNo
17771439POSITION MEASUREMENT METHOD USING A CALIBRATION PLATE TO CORRECT A DETECTION VALUE FROM THE POSITION DETECTORApril 2022May 2023Allow1300NoNo
17726161DISPLACEMENT METER CONFIGURED TO MEASURE A DISPLACEMENT OF A MEASUREMENT TARGET OBJECT AND ARTICLE MANUFACTURING METHODApril 2022May 2025Allow3711NoNo
17770073METHOD AND SYSTEM FOR DETERMINING DYNAMIC PROPERTIES IN X AND Y PRINT DIRECTIONS OF AN FFF PRINTER USING CENTER LINE AND LINE WIDTH VARIATION ANALYSISApril 2022April 2025Allow3611YesNo
17754610FRACTURE SURFACE INSPECTION DEVICE AND FRACTURE SURFACE INSPECTION METHOD FOR LOSS EVALUATIONApril 2022September 2023Allow1710YesNo
17765712IMAGE MEASUREMENT METHOD AND IMAGE MEASUREMENT SYSTEM USING REMOVED MEAUREMENT IMAGES FOR PROCESSING EFFICIENCYMarch 2022June 2024Allow2600YesNo
17707151FIB-SEM 3D Tomography for measuring shape deviations of HAR structuresMarch 2022January 2025Allow3421YesNo
17700918STRIP WIDTH MEASUREMENT WITH CONTINUOUS HARDWARE IMPERFECTION CORRECTIONS OF SENSED EDGE POSITIONSMarch 2022January 2024Allow2201YesNo
17641903METHOD AND DEVICE FOR DETECTING MECHANICAL EQUIPMENT PARTSMarch 2022February 2025Abandon3510NoNo
17677788THIN FILM MULTIVARIATE OPTICAL ELEMENT AND DETECTOR COMBINATIONS, THIN FILM OPTICAL DETECTORS, AND DOWNHOLE OPTICAL COMPUTING SYSTEMSFebruary 2022December 2024Abandon3411NoNo
17672288FLUID MANAGEMENT SYSTEM FOR AN ANALYZER AND/OR SORTER TYPE FLOW TYPE PARTICLE ANALYZER USING A DETACHABLE CONNECTORFebruary 2022October 2025Allow4431NoNo
17665320SELF-INTERFEROMETRY BASED SENSOR SYSTEMS CAPABLE OF GENERATING DEPTH MAPS OR VELOCITY MAPSFebruary 2022March 2025Allow3731YesNo
17591891OVERLAY MEASUREMENT STRUCTURES HAVING OVERLAPPING PATTERNSFebruary 2022January 2026Allow4841NoNo
17588973METHOD AND DEVICE FOR MEASURING A TOOTHING OF GEARS OR THE LIKEJanuary 2022November 2023Allow2110NoNo
17631542A CALIBRATION METHOD FOR FRINGE PROJECTION SYSTEMS BASED ON PLANE MIRRORSJanuary 2022September 2023Allow1910YesNo
17585306MICROFLUIDIC CHIP DEVICE FOR OPTICAL FORCE MEASUREMENTS AND CELL IMAGING USING MICROFLUIDIC CHIP CONFIGURATION AND DYNAMICSJanuary 2022September 2023Allow2020YesNo
17580541CONTROL OF A MANUFACTURING PROCESS USING CONTOUR CURVATURE ANALYSIS OF SPECIMENSJanuary 2022January 2025Allow3611YesNo
17580107IDENTIFYING DATA IN A NUMBER OF IMAGES TO TRANSFORM WITH IDENTIFICATION OF A BLANK AND COLORED PORTIONSJanuary 2022August 2025Allow4331YesNo
17567674NON-CONTACT MEASUREMENT FOR INTERFACE GAPSJanuary 2022November 2023Allow2211YesNo
17646080INTERFEROMETRY ASSEMBLY HAVING OPTICAL PATHS THROUGH DIFFERENT MATERIALSDecember 2021July 2023Allow1920YesNo
17561869IMAGE ANOMALY DETECTION METHOD BASED ON ZERO-SHOT LEARNINGDecember 2021June 2024Allow3000YesNo
17549665SYSTEMS AND METHODS FOR SAMPLE USE MAXIMIZATIONDecember 2021February 2025Abandon3811NoNo
17540080Infra-Red Spectroscopy SystemDecember 2021February 2023Allow1410YesNo
17615314PHASE RETRIEVAL DETECTION DEVICE AND METHOD BASED ON DIFFRACTION INFORMATION OF FRESNEL ZONE PLATENovember 2021July 2025Allow4330YesNo
17525624METHOD FOR COMPENSATION DURING THE PROCESS OF WAVEFRONT RECONSTRUCTION IN GRATING-BASED LATERAL SHEARING INTERFEROMETRYNovember 2021September 2022Allow1000YesNo
17525643GRADING COSMETIC APPEARANCE OF AN ELECTRONIC DEVICENovember 2021July 2025Allow4530YesNo
17523416DIMENSION MEASUREMENT JIG AND DIMENSION MEASUREMENT DEVICE INCLUDING SAMENovember 2021August 2025Abandon4521YesNo
17595137DETERMINATION OF A CHANGE OF OBJECT'S SHAPENovember 2021November 2024Abandon3621NoNo
17516605AUTOMATED MICRODISSECTION INSTRUMENT AND METHOD FOR PROCESSING A BIOLOGICAL SAMPLENovember 2021March 2023Allow1610YesNo
17515511FLOW CELLS USING SEQUENCING-READY NUCLEIC ACID FRAGEMENTS ATTACHED TO CARRIER BEADS IMMOBILIZED AT CAPTURE SITES OF A PLURALITY OF CHAMBERSOctober 2021June 2023Allow1901NoNo
17600726CONDUCTIVE NANOWIRE MEASUREMENTOctober 2021November 2023Abandon2610YesNo
17490521Compact, Self-Aligned Projection Focusing Schlieren Method and SystemSeptember 2021December 2022Allow1500YesNo
17487922CELL ANALYSIS IN BODY FLUIDS, PARTICULARLY BLOOD USING PLATES COUPLED WITH SPACERS HAVE A PREDETERMINED INTER SPACER SPACING AND UNIFORM HEIGHTSSeptember 2021January 2023Allow1620YesNo
17487092Automated Adjustment Of The Position Of The Light Source Of A Detection Assembly For Increased Light ReceptionSeptember 2021November 2024Allow3721YesNo
17481740Automated Non-Contact Thickness Inspection and Projection System Using Color-Coded Based PatternsSeptember 2021December 2023Allow2711YesNo
17436685Shearography Testing Method and System Using Shaped Excitation Light Having At Least One Curved LineSeptember 2021April 2024Allow3211YesNo
17462556METHOD AND APPARATUS FOR THE DETERMINATION OF DEFECTS DURING A SURFACE MODIFICATION METHODAugust 2021March 2024Allow3110YesNo
17458024PHASE COMPENSATION METHOD FOR DIGITAL HOLOGRAPHY SYSTEMSAugust 2021July 2025Allow4601YesNo
17310489A METHOD AND A SYSTEM FOR REAL-TIME HIGH-SPEED THREE DIMENSIONAL SURFACE IMAGINGAugust 2021January 2024Allow2920YesNo
17393278Handling Obstructions and Transmission Element Contamination for Self-Mixing Particulate Matter SensorsAugust 2021February 2023Allow1910NoNo
17387107Multi-Parameter Inspection Apparatus for Monitoring of Additive Manufacturing PartsJuly 2021January 2023Allow1810YesNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner LAPAGE, MICHAEL P.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
1
Examiner Affirmed
1
(100.0%)
Examiner Reversed
0
(0.0%)
Reversal Percentile
13.8%
Lower than average

What This Means

With a 0.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.

Strategic Value of Filing an Appeal

Total Appeal Filings
4
Allowed After Appeal Filing
2
(50.0%)
Not Allowed After Appeal Filing
2
(50.0%)
Filing Benefit Percentile
81.3%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 50.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Strategic Recommendations

Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner LAPAGE, MICHAEL P - Prosecution Strategy Guide

Executive Summary

Examiner LAPAGE, MICHAEL P works in Art Unit 2877 and has examined 216 patent applications in our dataset. With an allowance rate of 90.3%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 32 months.

Allowance Patterns

Examiner LAPAGE, MICHAEL P's allowance rate of 90.3% places them in the 74% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by LAPAGE, MICHAEL P receive 1.62 office actions before reaching final disposition. This places the examiner in the 32% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by LAPAGE, MICHAEL P is 32 months. This places the examiner in the 52% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +3.4% benefit to allowance rate for applications examined by LAPAGE, MICHAEL P. This interview benefit is in the 25% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 37.7% of applications are subsequently allowed. This success rate is in the 86% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 32.8% of cases where such amendments are filed. This entry rate is in the 48% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 133.3% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 86% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 75.0% of appeals filed. This is in the 65% percentile among all examiners. Of these withdrawals, 66.7% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.

Petition Practice

When applicants file petitions regarding this examiner's actions, 29.0% are granted (fully or in part). This grant rate is in the 16% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 11.1% of allowed cases (in the 94% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 4.1% of allowed cases (in the 78% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.
  • Request pre-appeal conferences: PACs are highly effective with this examiner. Before filing a full appeal brief, request a PAC to potentially resolve issues without full PTAB review.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.