USPTO Examiner STAFIRA MICHAEL PATRICK - Art Unit 2877

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18887436METHOD AND APPARATUS FOR ANALYZING A GEMSTONESeptember 2024January 2025Allow410NoNo
18833785OPTICAL COMPUTING METHODS AND SYSTEMS FOR INSPECTING A GLASS CONTAINER IN TRANSMITTED LIGHTJuly 2024February 2026Allow1900NoNo
18752306Electronic Devices With Relative Humidity SensorsJune 2024November 2025Allow1600NoNo
18564801THREE-DIMENSIONAL MEASUREMENT DEVICEJune 2024December 2025Allow2500NoNo
18731813DOSE MEASUREMENT SYSTEM AND METHODJune 2024December 2024Allow600NoNo
18677738FLUORESCENCE IMAGING OF GEMSTONE ON TRANSPARENT STAGEMay 2024May 2025Allow1110NoNo
18713444IMAGING DEVICE, INSPECTION DEVICE, AND IMAGING METHODMay 2024February 2026Allow2110NoNo
18603625SYSTEM AND METHOD TO SELECT AND ISOLATE PARTICLES AND CELLS AND USES THEREOFMarch 2024November 2024Allow810NoNo
18686369METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING FOR IMAGE INSPECTION APPARATUSFebruary 2024October 2025Allow2000NoNo
18444299APPARATUS AND METHOD FOR INSPECTING WAFER CARRIERSFebruary 2024February 2025Allow1210NoNo
18426428DRIVE CONDITION MONITORINGJanuary 2024March 2026Allow2610NoNo
18423261OPTICAL SENSOR FOR THE MEASUREMENT OF PHYSICAL PARAMETERS IN HARSH ENVIRONMENTS AND METHODS OF MAKING AND USING THE SAMEJanuary 2024May 2025Allow1510NoNo
18422438MEASUREMENT SYSTEM FOR MICRO-MIXING AND MEASUREMENT METHOD THEREOFJanuary 2024November 2024Allow900NoNo
18291204SYSTEMS AND METHODS OF IMAGING POLARIMETRY THROUGH METASURFACE POLARIZATION GRATINGSJanuary 2024March 2026Allow2510NoNo
18418767OPTICAL SENSING SYSTEMJanuary 2024September 2024Allow800NoNo
18405615SYSTEMS FOR AUTHENTICATION AND RELATED DEVICES AND METHODSJanuary 2024February 2025Abandon1310NoNo
18405654SYSTEMS FOR AUTHENTICATION AND RELATED DEVICES AND METHODSJanuary 2024March 2025Allow1410NoNo
18398260INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUMDecember 2023August 2025Allow2020NoNo
18393013METHOD FOR TESTING AN OCT DEVICE AND TEST OBJECTDecember 2023March 2026Allow2710NoNo
18537880POLARIMETRIC IMAGE SENSORDecember 2023December 2025Allow2410NoNo
18535479STRETCHABLE STRAIN SENSOR, COMBINATION SENSOR, AND DISPLAY PANEL AND DEVICEDecember 2023February 2025Allow1401YesNo
18535933POINT CLOUD SEGMENTATION USING A COHERENT LIDAR FOR AUTONOMOUS VEHICLE APPLICATIONSDecember 2023December 2024Allow1210YesNo
18532234SYSTEMS FOR AUTHENTICATION AND RELATED DEVICES AND METHODSDecember 2023November 2024Abandon1220NoNo
18532288SYSTEM AND METHOD FOR AUTHENTICATING AN INTEGRATED CIRCUIT USING A DIAMOND-BASED READ-ONLY MEMORYDecember 2023October 2024Abandon1010NoNo
18530698DISPERSION MEASUREMENT APPARATUS AND DISPERSION MEASUREMENT METHODDecember 2023March 2025Allow1510NoNo
18531098ADAPTERS FOR INSPECTION OF OPTICAL FIBER TERMINATING ENDSDecember 2023January 2026Allow2610YesNo
18530068RADIUS OF CURVATURE (ROC) DETERMINATIONS BASED ON ROC-DEPENDENT OPTICAL CONJUGATE POSITIONSDecember 2023September 2025Allow2100NoNo
18525239MEASURING SYSTEM PROVIDING SHAPE FROM SHADINGNovember 2023January 2026Allow2510NoNo
18562229DEVICES AND METHODS FOR DETERMINING POLARIZATION CHARACTERISTICS FROM PARTIAL POLARIMETRYNovember 2023July 2025Allow2000NoNo
18513086GEMSTONE INSCRIPTION VIEWING SYSTEM AND APPLICATIONS THEREOFNovember 2023April 2024Allow510NoNo
18560467DETECTOR DEVICE, FOR MEASURING THE CALIBRE OF CERAMIC TILES OR SLABSNovember 2023January 2026Allow2620NoNo
18505878GENERATION OF ONE OR MORE EDGES OF LUMINOSITY TO FORM THREE-DIMENSIONAL MODELS OF OBJECTSNovember 2023August 2024Allow900NoNo
18388094UV INSPECTION FOR IDENTIFYING INADEQUATE COATING ON A BEVERAGE CAN BOTTOMNovember 2023January 2026Abandon2610NoNo
18503223OPTICAL PARTICLE CHARACTERIZATION APPARATUSNovember 2023July 2025Allow2100NoNo
18557688PINHOLE DETECTION DEVICEOctober 2023September 2025Allow2310NoNo
18490617QUALITY CONTROL OF SUBSTRATE COATINGSOctober 2023November 2024Abandon1310NoNo
18381108METHOD FOR ELIMINATING MISJUDGMENT OF REFLECTIVE LIGHT AND OPTICAL SENSING SYSTEMOctober 2023May 2024Allow700NoNo
18484854LAMP SYSTEM CAPABLE OF DETECTING STEREOSCOPIC SHAPE OF ROAD SURFACEOctober 2023October 2025Allow2410NoNo
18377381Linear Polarization Component Detection System and MethodOctober 2023November 2025Allow2510NoNo
18477986INDUSTRIAL VEHICLE DISTANCE AND RANGE MEASUREMENT DEVICE CALIBRATIONSeptember 2023August 2024Allow1010NoNo
18374124MEASURING DEVICE FOR DETERMINING A DISTRIBUTION OF A HEAT TRANSFER MEDIUM AND METHOD FOR DETERMINING A DISTRIBUTION OF A HEAT TRANSFER MEDIUMSeptember 2023June 2025Allow2100NoNo
18284774SURFACE INSPECTION DEVICE AND SHAPE MEASUREMENT SOFTWARESeptember 2023May 2025Allow1900NoNo
18472997FIBER OPTIC PROFILER FOR EARLY DAMAGE WARNINGSeptember 2023October 2025Allow2510NoNo
18282607BIOLOGICAL SAMPLE ANALYZER AND FLOW CYTOMETERSeptember 2023November 2025Allow2610NoNo
18282431APPARATUS FOR MEASURING THE POLARIZATION OF AN ELECTROMAGNETIC RADIATION AND CORRESPONDING METHOD OF USESeptember 2023April 2025Allow1900NoNo
18368261LASER RADAR MOUNTING STRUCTURESeptember 2023November 2025Allow2620YesNo
18242916SUPER RESOLUTION AND FAST SURFACE B-FIELD IMAGING USING AN NV-DIAMONDSeptember 2023March 2025Allow1810NoNo
18280497DISPERSION STABILITY EVALUATION METHOD, AND DISPERSION STABILITY COMPARISON METHODSeptember 2023August 2025Allow2410NoNo
18462192DUAL-LENS SMOKE DETECTION SYSTEMSeptember 2023February 2026Allow2920YesNo
18462206MULTI-BEAM SMOKE DETECTORSeptember 2023October 2025Allow2610YesNo
18242458SUPPORT RING CENTERING FOR CLOSURE INSPECTIONSeptember 2023June 2025Allow2110NoNo
18460002WIRELESS SENSOR WITH EMBEDDED SOLAR PANEL AND INTERIOR LIGHT DETECTORSeptember 2023September 2025Allow2510YesNo
18278079OPTICAL PARTICLE ANALYSER WITH ILLUMINATION AT AN OBLIQUE ANGLE ONTO A NON-TRANSPARENT MICROFLUIDIC CHIPAugust 2023March 2026Allow3120NoNo
18453416METHOD FOR ASSESSING THE RESULT OF A SURFACE TREATMENT PERFORMED ON A WORKPIECE BY PARTICLE BLASTINGAugust 2023September 2025Allow2510NoNo
18229893FLATNESS MEASURING SYSTEM, METHOD AND APPARATUSAugust 2023December 2024Allow1600NoNo
18275473A THREE-DIMENSIONAL MEASURING DEVICEAugust 2023October 2025Abandon2610NoNo
183634818BIT CONVERSIONAugust 2023May 2025Allow2200NoNo
18361895OPTICAL MEASUREMENT DEVICEJuly 2023September 2025Allow2510NoNo
18274538EMISSION OPTICAL SYSTEM, EMISSION DEVICE, AND OPTICAL MEASUREMENT DEVICEJuly 2023September 2025Allow2510NoNo
18224044MOIRÉ-BASED DISTANCE MEASUREMENT METHODJuly 2023October 2023Allow310YesNo
18220150SYSTEMS AND METHODS FOR SYNTHESIZING A DIAMOND USING MACHINE LEARNINGJuly 2023April 2024Allow910YesNo
18218643TEMPERATURE MEASURING DEVICE AND TEMPERATURE MEASURING METHODJuly 2023February 2026Allow3210NoNo
18270648METHOD AND DEVICE FOR DETECTING DEFECTS OF A STRAND-LIKE PRODUCTJune 2023August 2025Allow2510NoNo
18214156TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL GLASS FIBER PREFORMS AND FIBERS THEMSELVESJune 2023May 2025Allow2310NoNo
18258994METHOD FOR SHAPE SENSING AN OPTICAL FIBERJune 2023October 2025Allow2810NoNo
18268701POLARIMETRYJune 2023July 2025Allow2410NoNo
18210911Reconfigurable Integrated Circuits for Adjusting Cell Sorting ClassificationJune 2023February 2024Allow800NoNo
18207622COMPACT INTRAORAL 3D SCANNERJune 2023May 2024Allow1110YesNo
18256235OPTICAL SENSING ARRANGEMENT, AMBIENT LIGHT SENSOR AND METHOD FOR PROVIDING AN OUTPUT COUNTJune 2023February 2025Allow2000NoNo
18328355CHANGEABLE TIP FOR OPTICAL FIBER INSPECTION DEVICE WITH DETECTABLE TIP ORIENTATIONJune 2023March 2025Allow2200NoNo
18205154OPTICAL SYSTEMS AND METHODS OF PROBING BIOLOGICAL FLUIDSJune 2023August 2024Allow1500NoNo
18324883CALIBRATION TARGET FOR ULTRASONIC REMOVAL OF ECTOPARASITES FROM FISHMay 2023September 2024Abandon1610NoNo
18201852Systems and Methods for Reliable Authentication of Jewelry and/or GemstonesMay 2023April 2024Allow1110NoNo
18253647APPARATUS AND METHOD TO MEASURE DIRECTION AND POLARIZATION OF ELECTROMAGNETIC WAVESMay 2023July 2025Allow2610NoNo
18316413APPARATUS, METHOD AND RECORDING MEDIUM STORING COMMAND FOR INSPECTIONMay 2023April 2024Allow1110NoNo
18036297INSPECTION APPARATUS AND INSPECTION METHODMay 2023June 2025Allow2510NoNo
18313741Window Occlusion Imager Near Focal PlaneMay 2023March 2024Allow1010NoNo
18034875MATRIX-BASED CHARACTERIZATION AND MEASUREMENTS FOR SEMICONDUCTOR THIN-FILM MATERIALMay 2023May 2025Allow2510NoNo
18141322FLUORESCENCE IMAGING OF GEMSTONE ON TRANSPARENT STAGEApril 2023March 2024Allow1010NoNo
18138451ATTENUATED TOTAL INTERNAL REFLECTION OPTICAL SENSOR FOR OBTAINING DOWNHOLE FLUID PROPERTIESApril 2023October 2024Allow1810NoNo
18303965SYSTEMS AND METHODS OF LOCATING COOLING FEATURES IN A GAS TURBINE COMPONENT UNDER THERMAL BARRIER COATINGSApril 2023April 2025Allow2410YesNo
18032834EXTRINSIC FABRY-PEROT ABSOLUTE PRESSURE SENSORApril 2023October 2025Allow3010NoNo
18302618COMMUNICATION BETWEEN AN OPTICAL MEASURING DEVICE AND TWO MEASURING CELLS ACCOMMODATED THEREINApril 2023December 2025Allow3211NoNo
18298782CLOSE LOOP CONTROL OF AN ILLUMINATION SOURCE BASED ON SAMPLE HEATINGApril 2023March 2024Allow1110NoNo
18186900CONTROL APPARATUS, TURBIDIMETER, DETERMINATION METHOD, AND LEARNING METHODMarch 2023August 2025Allow2910YesNo
18115464AIR BUBBLE SENSING SYSTEMS AND RELATED SIGNAL PROCESSINGFebruary 2023March 2025Allow2510NoNo
17768510RECTANGULAR CELL FOR PHOTOMETRIC ANALYSISFebruary 2023September 2025Abandon4120NoNo
18172383OPTICAL INTERFEROMETRIC RANGE SENSORFebruary 2023July 2025Allow2910NoNo
18169817ROBOTFebruary 2023July 2025Allow2910NoNo
18041279Automated Optical Measurement System To Determine Semiconductor PropertiesFebruary 2023November 2025Abandon3320NoNo
18107648INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAMEFebruary 2023March 2025Allow2510NoNo
18161599LASER GAS ANALYZERJanuary 2023May 2025Allow2820YesNo
18160734SYSTEMS FOR AUTHENTICATION AND RELATED DEVICES AND METHODSJanuary 2023August 2023Allow711YesNo
18160097DOSE MEASUREMENT SYSTEM AND METHODJanuary 2023January 2024Allow1210NoNo
18159004OPTICAL SAFETY DEVICEJanuary 2023July 2025Allow2910NoNo
18158054METHOD FOR PREPARING A SAMPLE FOR LASER INDUCED BREAKDOWN SPECTROSCOPYJanuary 2023August 2023Allow610NoNo
18154405Reduced Dimensionality Structured Illumination Microscopy With Patterned Arrays of NanowellsJanuary 2023December 2023Allow1110YesNo
18092807THREE-DIMENSIONAL IMAGING SYSTEM AND METHODJanuary 2023July 2025Allow3010NoNo
18091456POWDER-FREE INTRAORAL SCANNING AND IMAGING SYSTEMDecember 2022July 2025Allow3110NoNo
18148616SENSOR AND BAND PASS FILTERDecember 2022October 2025Allow3421YesNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner STAFIRA, MICHAEL PATRICK.

Strategic Value of Filing an Appeal

Total Appeal Filings
13
Allowed After Appeal Filing
3
(23.1%)
Not Allowed After Appeal Filing
10
(76.9%)
Filing Benefit Percentile
31.2%
Lower than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 23.1% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.

Strategic Recommendations

⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.

Examiner STAFIRA, MICHAEL PATRICK - Prosecution Strategy Guide

Executive Summary

Examiner STAFIRA, MICHAEL PATRICK works in Art Unit 2877 and has examined 828 patent applications in our dataset. With an allowance rate of 94.4%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 24 months.

Allowance Patterns

Examiner STAFIRA, MICHAEL PATRICK's allowance rate of 94.4% places them in the 83% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by STAFIRA, MICHAEL PATRICK receive 1.01 office actions before reaching final disposition. This places the examiner in the 10% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by STAFIRA, MICHAEL PATRICK is 24 months. This places the examiner in the 83% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +2.7% benefit to allowance rate for applications examined by STAFIRA, MICHAEL PATRICK. This interview benefit is in the 23% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 41.7% of applications are subsequently allowed. This success rate is in the 93% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 79.2% of cases where such amendments are filed. This entry rate is in the 96% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 95% percentile among all examiners. Of these withdrawals, 77.8% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.

Petition Practice

When applicants file petitions regarding this examiner's actions, 41.8% are granted (fully or in part). This grant rate is in the 33% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 8.1% of allowed cases (in the 91% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 3.1% of allowed cases (in the 74% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.
  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.
  • Appeal filing as negotiation tool: This examiner frequently reconsiders rejections during the appeal process. Filing a Notice of Appeal may prompt favorable reconsideration during the mandatory appeal conference.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.