Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18896369 | BIDIRECTIONAL LITTROW TWO-DEGREE-OF-FREEDOM GRATING INTERFERENCE MEASUREMENT DEVICE BASED ON DOUBLE GRATINGS | September 2024 | January 2025 | Allow | 4 | 1 | 0 | No | No |
| 18744405 | PORTABLE OPTICAL GYROSCOPE AND COMPASS UNIT | June 2024 | February 2025 | Allow | 8 | 0 | 0 | No | No |
| 18663403 | DISTANCE MEASUREMENT DEVICE AND METHOD BASED ON SECONDARY MIXING OF INTER-MODE SELF-INTERFERENCE SIGNALS OF OPTICAL FREQUENCY COMBS | May 2024 | January 2025 | Allow | 8 | 0 | 0 | No | No |
| 18600690 | Interferometric Measurement System Using Time-Correlated Photons | March 2024 | November 2024 | Allow | 8 | 0 | 0 | No | No |
| 18595318 | HETERODYNE LASER INTERFEROMETER BASED ON INTEGRATED DUAL POLARIZATION BEAM-SPLITTING ASSEMBLY AND MEASUREMENT METHOD THEREOF | March 2024 | February 2025 | Allow | 12 | 1 | 0 | No | No |
| 18396691 | SYSTEM, METHOD, AND APPARATUS FOR DIGITAL HOLOGRAPHIC VIBRATION IMAGING WITH INTEGRATED SYSTEM PHASE CORRECTION | December 2023 | March 2024 | Allow | 3 | 0 | 0 | Yes | No |
| 18533186 | HOLOGRAPHIC MICROSCOPE | December 2023 | April 2025 | Allow | 16 | 2 | 0 | No | No |
| 18486815 | Method and Device for Superresolution Optical Measurement using Singular Optics | October 2023 | September 2024 | Allow | 11 | 0 | 0 | No | No |
| 18379610 | PORTABLE OPTICAL GYROSCOPE AND COMPASS UNIT | October 2023 | March 2024 | Allow | 5 | 1 | 0 | No | No |
| 18473224 | Optical Coherence Tomography System for Subsurface Inspection | September 2023 | June 2024 | Allow | 9 | 0 | 1 | No | No |
| 18469792 | MEASUREMENT SYSTEM FOR DETECTING DEEP-HOLE SURFACE TOPOGRAPHY BASED ON LOW-COHERENCE INTERFEROMETRY | September 2023 | June 2025 | Allow | 21 | 0 | 0 | No | No |
| 18278616 | ANALYSIS DEVICE | August 2023 | April 2025 | Allow | 20 | 0 | 0 | No | No |
| 18228010 | MEASUREMENT APPARATUS, METHOD FOR MEASURING BY INTERFEROMETRY, PROCESSING METHOD, OPTICAL ELEMENT AND LITHOGRAPHY SYSTEM | July 2023 | March 2025 | Allow | 20 | 0 | 0 | No | No |
| 18359661 | INSPECTION METHOD FOR DETECTING A DEFECTIVE BONDING INTERFACE IN A SAMPLE SUBSTRATE, AND MEASUREMENT SYSTEM IMPLEMENTING THE METHOD | July 2023 | January 2024 | Allow | 6 | 1 | 0 | No | No |
| 18225012 | Thermal Desorption Preconcentrator Adapted for Spectroscopic Gas Analysis | July 2023 | May 2025 | Allow | 22 | 0 | 0 | No | No |
| 18354635 | THREE-DIMENSIONAL MEASUREMENT DEVICE | July 2023 | March 2025 | Allow | 20 | 0 | 0 | No | No |
| 18329609 | VEHICLE HULL WITH INTERFEROMETRIC FIBER-OPTIC GYROSCOPE | June 2023 | July 2023 | Allow | 2 | 0 | 0 | No | No |
| 18265361 | LAB-ON-A-CHIP SYSTEM WITH FUNCTIONALIZED WAVEGUIDE | June 2023 | June 2025 | Allow | 25 | 1 | 0 | No | No |
| 18204181 | INTERFEROMETER FILTERS WITH PARTIAL COMPENSATION STRUCTURE | May 2023 | March 2025 | Allow | 21 | 0 | 0 | No | No |
| 18325729 | Laser Interferometer | May 2023 | August 2024 | Allow | 15 | 1 | 0 | No | No |
| 18321680 | SILICON NITRIDE WAVEGUIDE BASED INTEGRATED PHOTONICS FRONT-END CHIP FOR OPTICAL GYROSCOPE | May 2023 | February 2025 | Allow | 21 | 2 | 0 | Yes | No |
| 18318919 | METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES ETCHED IN A SUBSTRATE | May 2023 | January 2024 | Allow | 8 | 2 | 0 | Yes | No |
| 18319103 | METHOD AND A SYSTEM FOR COMBINED CHARACTERISATION OF STRUCTURES ETCHED IN A SUBSTRATE | May 2023 | January 2024 | Allow | 8 | 2 | 0 | Yes | No |
| 18317395 | SEMICONDUCTOR MEASUREMENT APPARATUS | May 2023 | June 2025 | Allow | 25 | 1 | 1 | No | No |
| 18317835 | Frequency-Domain Optical Coherence Tomography with Extended Field-of-View and Reduction of Aliasing Artifacts | May 2023 | August 2024 | Allow | 15 | 1 | 0 | No | No |
| 18138237 | FIBER OPTIC GYROSCOPE | April 2023 | December 2024 | Allow | 20 | 0 | 0 | No | No |
| 18302151 | METHOD AND SYSTEM FOR MEASURING A SURFACE OF AN OBJECT COMPRISING DIFFERENT STRUCTURES USING LOW COHERENCE INTERFEROMETRY | April 2023 | November 2023 | Allow | 7 | 1 | 0 | No | No |
| 18301871 | WAVELENGTH REFERENCE DEVICE | April 2023 | April 2024 | Allow | 12 | 1 | 0 | No | No |
| 18296733 | PRODUCTION METHOD AND MEASUREMENT METHOD | April 2023 | April 2025 | Allow | 25 | 0 | 1 | No | No |
| 18027679 | OPTICAL ALIGNMENT COMPENSATION SYSTEM FOR A GAS DETECTION SYSTEM | March 2023 | April 2025 | Allow | 25 | 1 | 0 | No | No |
| 18183432 | MICRO-MOLDED ANAMORPHIC REFLECTOR LENS FOR IMAGE GUIDED THERAPEUTIC/DIAGNOSTIC CATHETERS | March 2023 | December 2023 | Allow | 10 | 1 | 0 | No | No |
| 18179062 | Method and Device for Superresolution Optical Measurement using Singular Optics | March 2023 | July 2023 | Allow | 4 | 0 | 0 | No | No |
| 18023482 | COMPACT DUAL PASS INTERFEROMETER FOR A PLANE MIRROR INTERFEROMETER | February 2023 | December 2024 | Allow | 22 | 0 | 0 | No | No |
| 18173182 | LASER INTERFEROMETER | February 2023 | June 2025 | Allow | 28 | 0 | 0 | No | No |
| 18172043 | OPTICAL GYROSCOPE WITH WEAK MEASUREMENT AMPLIFICATION READOUT | February 2023 | February 2024 | Allow | 12 | 1 | 0 | No | No |
| 18166792 | RESONATOR OPTICAL GYROSCOPE WITH DIMINISHED BIAS ERROR | February 2023 | January 2025 | Allow | 24 | 1 | 0 | Yes | No |
| 18166665 | TRANSVERSE MAGNETIC MODE TRAVELLING WAVE RESONATOR WITH AT LEAST ONE BRAGG GRATING AND GYROSCOPE APPLICATIONS THEREOF | February 2023 | January 2025 | Allow | 24 | 1 | 0 | Yes | No |
| 18082561 | SPATIAL PROPERTY OR COLOR IMPLEMENTATION PROPERTY MEASUREMENT DEVICE OF HOLOGRAPHIC IMAGES | December 2022 | April 2025 | Allow | 28 | 1 | 1 | No | No |
| 18060795 | AGGREGATING DATA OVER TIME TO IMPROVE IMAGE QUALITY | December 2022 | June 2023 | Allow | 6 | 0 | 0 | No | No |
| 17964799 | MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS | October 2022 | May 2023 | Allow | 7 | 1 | 0 | No | No |
| 17963556 | FOUR-QUADRANT INTERFEROMETRY SYSTEM BASED ON AN INTEGRATED ARRAY WAVE PLATE | October 2022 | September 2024 | Allow | 23 | 1 | 0 | No | No |
| 17959779 | METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICAL ELEMENT | October 2022 | January 2025 | Allow | 27 | 1 | 0 | No | No |
| 17898618 | Laser Interferometer | August 2022 | March 2025 | Allow | 30 | 1 | 0 | No | No |
| 17894164 | OPTICAL MEASUREMENT SYSTEM | August 2022 | November 2024 | Allow | 27 | 1 | 0 | No | No |
| 17894202 | OPTICAL INTERFERENCE RANGE SENSOR | August 2022 | May 2025 | Allow | 33 | 1 | 0 | No | No |
| 17894108 | SILICON NITRIDE WAVEGUIDE BASED INTEGRATED PHOTONICS FRONT-END CHIP FOR OPTICAL GYROSCOPE | August 2022 | March 2023 | Allow | 6 | 1 | 0 | No | No |
| 17800612 | Measuring Apparatus, On-Chip Instrumentation Device and Measuring Method | August 2022 | September 2024 | Allow | 25 | 0 | 0 | No | No |
| 17819102 | In-Situ Residual Intensity Noise Measurement Method And System | August 2022 | September 2024 | Allow | 26 | 0 | 0 | No | No |
| 17883454 | SPHERICAL MULTI-AXIS OPTICAL FIBER SENSING DEVICE, ASSEMBLING METHOD AND MOVABLE DEVICE | August 2022 | September 2024 | Allow | 25 | 0 | 0 | No | No |
| 17873406 | METROLOGY METHOD, TARGET AND SUBSTRATE | July 2022 | July 2025 | Allow | 35 | 2 | 0 | No | No |
| 17856063 | IMAGING SYSTEM AND A METHOD FOR IMAGING A SAMPLE | July 2022 | June 2025 | Allow | 36 | 1 | 0 | No | No |
| 17847478 | FLOW CYTOMETER PERFORMANCE EVALUATION METHOD AND STANDARD PARTICLE SUSPENSION | June 2022 | November 2024 | Allow | 28 | 1 | 0 | Yes | No |
| 17807256 | Quadrature Phase Analysis Light Scattering for Electrophoresis and Zeta Potential Measurements | June 2022 | March 2024 | Allow | 21 | 1 | 0 | No | No |
| 17784929 | GEOMETRIC TOOLS AND METHODS TO MEASURE CLOSURE PHASE FOR ROBUST FEATURE RECOGNITION IN INTERFEROMETRIC IMAGES | June 2022 | August 2024 | Allow | 26 | 1 | 0 | Yes | No |
| 17757037 | OPTICAL DEVICE FOR HETERODYNE INTERFEROMETRY | June 2022 | August 2024 | Allow | 26 | 1 | 0 | Yes | No |
| 17757048 | FREQUENCY SHIFTER FOR HETERODYNE INTERFEROMETRY MEASUREMENTS AND DEVICE FOR HETERODYNE INTERFEROMETRY MEASUREMENTS HAVING SUCH A FREQUENCY SHIFTER | June 2022 | September 2024 | Allow | 27 | 1 | 0 | Yes | No |
| 17834763 | COMPOSITE MEASUREMENT SYSTEM FOR MEASURING NANOMETER DISPLACEMENT | June 2022 | August 2024 | Allow | 26 | 1 | 0 | No | No |
| 17803374 | Overcoming uncertainty | June 2022 | October 2023 | Abandon | 16 | 1 | 0 | No | No |
| 17781749 | METHOD AND SYSTEM FOR DETERMINING THE POSITION OF AN ELEMENT OF AN OPTICAL SYSTEM IN AN ASSEMBLY FOR PROCESSING OR MEASURING AN OBJECT, AS WELL AS THE POSITION OF SAID OBJECT RELATIVE TO SAID ASSEMBLY, BY PARALLEL INTERFEROMETRIC MEASUREMENTS | June 2022 | January 2025 | Allow | 32 | 1 | 0 | No | No |
| 17781594 | METHOD AND SYSTEM FOR DETERMINING THE LOCAL POSITION OF AT LEAST ONE OPTICAL ELEMENT IN A MACHINE FOR LASER PROCESSING OF A MATERIAL, USING LOW-COHERENCE OPTICAL INTERFEROMETRY TECHNIQUES | June 2022 | September 2024 | Allow | 28 | 0 | 1 | No | No |
| 17780668 | ATOMIC GYROSCOPE AND ATOMIC INTERFEROMETER | May 2022 | August 2023 | Allow | 14 | 1 | 0 | No | No |
| 17825839 | USING LIGHT COUPLING PROPERTIES FOR MACHINE-LEARNING-BASED FILM DETECTION | May 2022 | June 2025 | Abandon | 37 | 1 | 0 | No | No |
| 17749079 | Quantum Interferometer with Improved Entangled Photon Identification | May 2022 | November 2023 | Allow | 18 | 1 | 0 | No | No |
| 17737209 | DEVICE FOR MEASURING A SUBSTRATE AND METHOD FOR CORRECTING CYCLIC ERROR COMPONENTS OF AN INTERFEROMETER | May 2022 | August 2024 | Allow | 27 | 1 | 1 | No | No |
| 17773115 | IN-LINE ANGULAR OPTICAL MULTI-POINT SCATTEROMETRY FOR NANOMANUFACTURING SYSTEMS | April 2022 | May 2025 | Allow | 36 | 3 | 0 | Yes | No |
| 17733846 | SYSTEM AND METHOD FOR CORRECTING OPTICAL PATH LENGTH MEASUREMENT ERRORS | April 2022 | November 2023 | Allow | 18 | 0 | 0 | No | No |
| 17661254 | INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPY | April 2022 | August 2023 | Allow | 15 | 2 | 0 | No | No |
| 17731124 | DISPLACEMENT MEASUREMENTS IN SEMICONDUCTOR WAFER PROCESSING | April 2022 | March 2025 | Allow | 35 | 1 | 0 | No | No |
| 17720344 | METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICAL ELEMENT | April 2022 | December 2023 | Allow | 20 | 1 | 0 | No | No |
| 17716266 | BROADBAND INTERFEROMETRY AND METHOD FOR MEASUREMENT RANGE EXTENSION BY USING SAME | April 2022 | September 2024 | Allow | 29 | 1 | 0 | No | No |
| 17715866 | OPTICAL SPECTRUM SENSOR WAFER OR ROBOT FOR CHAMBER CONDITION MONITORING | April 2022 | August 2024 | Allow | 28 | 1 | 1 | No | No |
| 17714161 | Single-chip optical transceiver | April 2022 | June 2025 | Allow | 38 | 0 | 0 | No | No |
| 17712264 | LIDAR SENSOR WITH ORTHOGONAL ARRAYS | April 2022 | August 2024 | Allow | 29 | 4 | 1 | No | No |
| 17766365 | ENHANCING CONTRAST SENSITIVITY AND RESOLUTION IN A GRATING INTERFEROMETER BY MACHINE LEARNING | April 2022 | August 2024 | Allow | 28 | 1 | 0 | No | No |
| 17710967 | HETERODYNE ONE-DIMENSIONAL GRATING MEASURING DEVICE AND MEASURING METHOD THEREOF | March 2022 | October 2023 | Allow | 19 | 1 | 0 | No | No |
| 17708409 | MEASURING APPARATUS FOR INTERFEROMETRICALLY DETERMINING A SURFACE SHAPE | March 2022 | August 2023 | Allow | 17 | 0 | 1 | No | No |
| 17701847 | INTERFEROMETER WITH AT LEAST ONE DISPERSIVE ELEMENT | March 2022 | February 2024 | Allow | 23 | 2 | 0 | No | No |
| 17701012 | INTERFEROMETRIC MEASUREMENT METHOD AND INTERFEROMETRIC MEASUREMENT ARRANGEMENT | March 2022 | September 2023 | Allow | 18 | 1 | 0 | Yes | No |
| 17697189 | OPTICAL DISTANCE MEASUREMENT DEVICE AND MACHINING DEVICE | March 2022 | May 2025 | Allow | 38 | 0 | 0 | No | No |
| 17603797 | INTERFEROMETER WITH A LOOPED OR STRAIGHT OPTICAL FIBER | March 2022 | September 2023 | Allow | 23 | 1 | 0 | No | No |
| 17760983 | LIGHT INTERFERENCE GENERATOR AND INTERFERENCE IMAGING DEVICE | March 2022 | August 2023 | Allow | 17 | 1 | 0 | No | No |
| 17753479 | METHOD AND APPARATUS FOR MEASURING THREE-DIMENSIONAL REFRACTIVE INDEX TENSOR | March 2022 | September 2023 | Allow | 18 | 1 | 0 | No | No |
| 17652674 | DISTRIBUTED FIBER OPTIC SENSING SYSTEMS AND METHODS | February 2022 | September 2023 | Allow | 19 | 1 | 0 | No | No |
| 17681148 | SINGLE-BEAM THREE-DEGREE-OF-FREEDOM HOMODYNE LASER INTERFEROMETER BASED ON ARRAY DETECTOR | February 2022 | May 2023 | Allow | 14 | 1 | 0 | No | No |
| 17679423 | Homodyne Encoder System with Adaptive Path Length Matching | February 2022 | May 2023 | Allow | 15 | 0 | 0 | No | No |
| 17678978 | OPTICAL SYSTEMS WITH CONTROLLED MIRROR ARRANGEMENTS | February 2022 | September 2023 | Allow | 19 | 1 | 0 | Yes | No |
| 17676468 | METHOD FOR CALIBRATING A MEASURING APPARATUS | February 2022 | May 2023 | Allow | 14 | 0 | 1 | No | No |
| 17598000 | OPTICAL COHERENCE TOMOGRAPHY SYSTEM | February 2022 | July 2024 | Allow | 29 | 1 | 0 | No | No |
| 17589265 | Method and Device for Superresolution Optical Measurement using Singular Optics | January 2022 | November 2022 | Allow | 9 | 1 | 0 | No | No |
| 17648355 | METHOD, SYSTEM, AND APPARATUS FOR OPTICAL MEASUREMENT | January 2022 | May 2023 | Allow | 16 | 0 | 0 | No | No |
| 17626760 | APPARATUS AND METHOD FOR PROCESSING CONSOLIDATED STACKS OF FIBER REINFORCED PLIES | January 2022 | January 2025 | Allow | 36 | 2 | 1 | No | No |
| 17626299 | WHITE LIGHT INTERFEROMETRIC FIBER-OPTIC GYROSCOPE BASED ON RHOMBIC OPTICAL PATH DIFFERENCE BIAS STRUCTURE | January 2022 | April 2023 | Allow | 15 | 1 | 0 | No | No |
| 17572353 | Polarization-Separated, Phase-Shifted Interferometer | January 2022 | August 2023 | Allow | 20 | 1 | 0 | Yes | No |
| 17644933 | INTERFEROMETER AND OPTICAL INSTRUMENT WITH INTEGRATED OPTICAL COMPONENTS | December 2021 | December 2023 | Allow | 23 | 2 | 0 | No | No |
| 17554711 | METHODS AND APPARATUS FOR DECOMPOSITION TO ACCOUNT FOR IMPERFECT BEAMSPLITTERS | December 2021 | July 2023 | Allow | 19 | 1 | 0 | No | No |
| 17596169 | DEVICE AND METHOD FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT | December 2021 | July 2023 | Allow | 19 | 1 | 0 | No | No |
| 17542152 | SYSTEMS AND METHODS FOR NON-DESTRUCTIVE EVALUATION OF OPTICAL MATERIAL PROPERTIES AND SURFACES | December 2021 | September 2022 | Allow | 10 | 0 | 0 | No | No |
| 17540500 | SYSTEM AND METHOD OF PHASE-LOCKED FIBER INTERFEROMETRY | December 2021 | March 2023 | Allow | 16 | 0 | 0 | No | No |
| 17538926 | INTERFEROMETER FILTERS WITH PARTIAL COMPENSATION STRUCTURE | November 2021 | February 2023 | Allow | 15 | 0 | 0 | No | No |
| 17615538 | COLORIMETER COLOUR STANDARDS | November 2021 | April 2024 | Allow | 29 | 1 | 0 | Yes | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner LYONS, MICHAEL A.
With a 0.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 33.3% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner LYONS, MICHAEL A works in Art Unit 2877 and has examined 1,435 patent applications in our dataset. With an allowance rate of 89.0%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 25 months.
Examiner LYONS, MICHAEL A's allowance rate of 89.0% places them in the 68% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by LYONS, MICHAEL A receive 1.07 office actions before reaching final disposition. This places the examiner in the 15% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by LYONS, MICHAEL A is 25 months. This places the examiner in the 68% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a +8.2% benefit to allowance rate for applications examined by LYONS, MICHAEL A. This interview benefit is in the 40% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 37.5% of applications are subsequently allowed. This success rate is in the 82% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 65.2% of cases where such amendments are filed. This entry rate is in the 87% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.
When applicants request a pre-appeal conference (PAC) with this examiner, 114.3% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 79% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 87.5% of appeals filed. This is in the 78% percentile among all examiners. Of these withdrawals, 78.6% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 50.0% are granted (fully or in part). This grant rate is in the 61% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.
Examiner's Amendments: This examiner makes examiner's amendments in 7.7% of allowed cases (in the 94% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 5.6% of allowed cases (in the 81% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.