USPTO Examiner LYONS MICHAEL A - Art Unit 2877

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18896369BIDIRECTIONAL LITTROW TWO-DEGREE-OF-FREEDOM GRATING INTERFERENCE MEASUREMENT DEVICE BASED ON DOUBLE GRATINGSSeptember 2024January 2025Allow410NoNo
18744405PORTABLE OPTICAL GYROSCOPE AND COMPASS UNITJune 2024February 2025Allow800NoNo
18663403DISTANCE MEASUREMENT DEVICE AND METHOD BASED ON SECONDARY MIXING OF INTER-MODE SELF-INTERFERENCE SIGNALS OF OPTICAL FREQUENCY COMBSMay 2024January 2025Allow800NoNo
18600690Interferometric Measurement System Using Time-Correlated PhotonsMarch 2024November 2024Allow800NoNo
18595318HETERODYNE LASER INTERFEROMETER BASED ON INTEGRATED DUAL POLARIZATION BEAM-SPLITTING ASSEMBLY AND MEASUREMENT METHOD THEREOFMarch 2024February 2025Allow1210NoNo
18396691SYSTEM, METHOD, AND APPARATUS FOR DIGITAL HOLOGRAPHIC VIBRATION IMAGING WITH INTEGRATED SYSTEM PHASE CORRECTIONDecember 2023March 2024Allow300YesNo
18533186HOLOGRAPHIC MICROSCOPEDecember 2023April 2025Allow1620NoNo
18486815Method and Device for Superresolution Optical Measurement using Singular OpticsOctober 2023September 2024Allow1100NoNo
18379610PORTABLE OPTICAL GYROSCOPE AND COMPASS UNITOctober 2023March 2024Allow510NoNo
18473224Optical Coherence Tomography System for Subsurface InspectionSeptember 2023June 2024Allow901NoNo
18469792MEASUREMENT SYSTEM FOR DETECTING DEEP-HOLE SURFACE TOPOGRAPHY BASED ON LOW-COHERENCE INTERFEROMETRYSeptember 2023June 2025Allow2100NoNo
18278616ANALYSIS DEVICEAugust 2023April 2025Allow2000NoNo
18228010MEASUREMENT APPARATUS, METHOD FOR MEASURING BY INTERFEROMETRY, PROCESSING METHOD, OPTICAL ELEMENT AND LITHOGRAPHY SYSTEMJuly 2023March 2025Allow2000NoNo
18359661INSPECTION METHOD FOR DETECTING A DEFECTIVE BONDING INTERFACE IN A SAMPLE SUBSTRATE, AND MEASUREMENT SYSTEM IMPLEMENTING THE METHODJuly 2023January 2024Allow610NoNo
18225012Thermal Desorption Preconcentrator Adapted for Spectroscopic Gas AnalysisJuly 2023May 2025Allow2200NoNo
18354635THREE-DIMENSIONAL MEASUREMENT DEVICEJuly 2023March 2025Allow2000NoNo
18329609VEHICLE HULL WITH INTERFEROMETRIC FIBER-OPTIC GYROSCOPEJune 2023July 2023Allow200NoNo
18265361LAB-ON-A-CHIP SYSTEM WITH FUNCTIONALIZED WAVEGUIDEJune 2023June 2025Allow2510NoNo
18204181INTERFEROMETER FILTERS WITH PARTIAL COMPENSATION STRUCTUREMay 2023March 2025Allow2100NoNo
18325729Laser InterferometerMay 2023August 2024Allow1510NoNo
18321680SILICON NITRIDE WAVEGUIDE BASED INTEGRATED PHOTONICS FRONT-END CHIP FOR OPTICAL GYROSCOPEMay 2023February 2025Allow2120YesNo
18318919METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES ETCHED IN A SUBSTRATEMay 2023January 2024Allow820YesNo
18319103METHOD AND A SYSTEM FOR COMBINED CHARACTERISATION OF STRUCTURES ETCHED IN A SUBSTRATEMay 2023January 2024Allow820YesNo
18317395SEMICONDUCTOR MEASUREMENT APPARATUSMay 2023June 2025Allow2511NoNo
18317835Frequency-Domain Optical Coherence Tomography with Extended Field-of-View and Reduction of Aliasing ArtifactsMay 2023August 2024Allow1510NoNo
18138237FIBER OPTIC GYROSCOPEApril 2023December 2024Allow2000NoNo
18302151METHOD AND SYSTEM FOR MEASURING A SURFACE OF AN OBJECT COMPRISING DIFFERENT STRUCTURES USING LOW COHERENCE INTERFEROMETRYApril 2023November 2023Allow710NoNo
18301871WAVELENGTH REFERENCE DEVICEApril 2023April 2024Allow1210NoNo
18296733PRODUCTION METHOD AND MEASUREMENT METHODApril 2023April 2025Allow2501NoNo
18027679OPTICAL ALIGNMENT COMPENSATION SYSTEM FOR A GAS DETECTION SYSTEMMarch 2023April 2025Allow2510NoNo
18183432MICRO-MOLDED ANAMORPHIC REFLECTOR LENS FOR IMAGE GUIDED THERAPEUTIC/DIAGNOSTIC CATHETERSMarch 2023December 2023Allow1010NoNo
18179062Method and Device for Superresolution Optical Measurement using Singular OpticsMarch 2023July 2023Allow400NoNo
18023482COMPACT DUAL PASS INTERFEROMETER FOR A PLANE MIRROR INTERFEROMETERFebruary 2023December 2024Allow2200NoNo
18173182LASER INTERFEROMETERFebruary 2023June 2025Allow2800NoNo
18172043OPTICAL GYROSCOPE WITH WEAK MEASUREMENT AMPLIFICATION READOUTFebruary 2023February 2024Allow1210NoNo
18166792RESONATOR OPTICAL GYROSCOPE WITH DIMINISHED BIAS ERRORFebruary 2023January 2025Allow2410YesNo
18166665TRANSVERSE MAGNETIC MODE TRAVELLING WAVE RESONATOR WITH AT LEAST ONE BRAGG GRATING AND GYROSCOPE APPLICATIONS THEREOFFebruary 2023January 2025Allow2410YesNo
18082561SPATIAL PROPERTY OR COLOR IMPLEMENTATION PROPERTY MEASUREMENT DEVICE OF HOLOGRAPHIC IMAGESDecember 2022April 2025Allow2811NoNo
18060795AGGREGATING DATA OVER TIME TO IMPROVE IMAGE QUALITYDecember 2022June 2023Allow600NoNo
17964799MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMSOctober 2022May 2023Allow710NoNo
17963556FOUR-QUADRANT INTERFEROMETRY SYSTEM BASED ON AN INTEGRATED ARRAY WAVE PLATEOctober 2022September 2024Allow2310NoNo
17959779METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICAL ELEMENTOctober 2022January 2025Allow2710NoNo
17898618Laser InterferometerAugust 2022March 2025Allow3010NoNo
17894164OPTICAL MEASUREMENT SYSTEMAugust 2022November 2024Allow2710NoNo
17894202OPTICAL INTERFERENCE RANGE SENSORAugust 2022May 2025Allow3310NoNo
17894108SILICON NITRIDE WAVEGUIDE BASED INTEGRATED PHOTONICS FRONT-END CHIP FOR OPTICAL GYROSCOPEAugust 2022March 2023Allow610NoNo
17800612Measuring Apparatus, On-Chip Instrumentation Device and Measuring MethodAugust 2022September 2024Allow2500NoNo
17819102In-Situ Residual Intensity Noise Measurement Method And SystemAugust 2022September 2024Allow2600NoNo
17883454SPHERICAL MULTI-AXIS OPTICAL FIBER SENSING DEVICE, ASSEMBLING METHOD AND MOVABLE DEVICEAugust 2022September 2024Allow2500NoNo
17873406METROLOGY METHOD, TARGET AND SUBSTRATEJuly 2022July 2025Allow3520NoNo
17856063IMAGING SYSTEM AND A METHOD FOR IMAGING A SAMPLEJuly 2022June 2025Allow3610NoNo
17847478FLOW CYTOMETER PERFORMANCE EVALUATION METHOD AND STANDARD PARTICLE SUSPENSIONJune 2022November 2024Allow2810YesNo
17807256Quadrature Phase Analysis Light Scattering for Electrophoresis and Zeta Potential MeasurementsJune 2022March 2024Allow2110NoNo
17784929GEOMETRIC TOOLS AND METHODS TO MEASURE CLOSURE PHASE FOR ROBUST FEATURE RECOGNITION IN INTERFEROMETRIC IMAGESJune 2022August 2024Allow2610YesNo
17757037OPTICAL DEVICE FOR HETERODYNE INTERFEROMETRYJune 2022August 2024Allow2610YesNo
17757048FREQUENCY SHIFTER FOR HETERODYNE INTERFEROMETRY MEASUREMENTS AND DEVICE FOR HETERODYNE INTERFEROMETRY MEASUREMENTS HAVING SUCH A FREQUENCY SHIFTERJune 2022September 2024Allow2710YesNo
17834763COMPOSITE MEASUREMENT SYSTEM FOR MEASURING NANOMETER DISPLACEMENTJune 2022August 2024Allow2610NoNo
17803374Overcoming uncertaintyJune 2022October 2023Abandon1610NoNo
17781749METHOD AND SYSTEM FOR DETERMINING THE POSITION OF AN ELEMENT OF AN OPTICAL SYSTEM IN AN ASSEMBLY FOR PROCESSING OR MEASURING AN OBJECT, AS WELL AS THE POSITION OF SAID OBJECT RELATIVE TO SAID ASSEMBLY, BY PARALLEL INTERFEROMETRIC MEASUREMENTSJune 2022January 2025Allow3210NoNo
17781594METHOD AND SYSTEM FOR DETERMINING THE LOCAL POSITION OF AT LEAST ONE OPTICAL ELEMENT IN A MACHINE FOR LASER PROCESSING OF A MATERIAL, USING LOW-COHERENCE OPTICAL INTERFEROMETRY TECHNIQUESJune 2022September 2024Allow2801NoNo
17780668ATOMIC GYROSCOPE AND ATOMIC INTERFEROMETERMay 2022August 2023Allow1410NoNo
17825839USING LIGHT COUPLING PROPERTIES FOR MACHINE-LEARNING-BASED FILM DETECTIONMay 2022June 2025Abandon3710NoNo
17749079Quantum Interferometer with Improved Entangled Photon IdentificationMay 2022November 2023Allow1810NoNo
17737209DEVICE FOR MEASURING A SUBSTRATE AND METHOD FOR CORRECTING CYCLIC ERROR COMPONENTS OF AN INTERFEROMETERMay 2022August 2024Allow2711NoNo
17773115IN-LINE ANGULAR OPTICAL MULTI-POINT SCATTEROMETRY FOR NANOMANUFACTURING SYSTEMSApril 2022May 2025Allow3630YesNo
17733846SYSTEM AND METHOD FOR CORRECTING OPTICAL PATH LENGTH MEASUREMENT ERRORSApril 2022November 2023Allow1800NoNo
17661254INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPYApril 2022August 2023Allow1520NoNo
17731124DISPLACEMENT MEASUREMENTS IN SEMICONDUCTOR WAFER PROCESSINGApril 2022March 2025Allow3510NoNo
17720344METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICAL ELEMENTApril 2022December 2023Allow2010NoNo
17716266BROADBAND INTERFEROMETRY AND METHOD FOR MEASUREMENT RANGE EXTENSION BY USING SAMEApril 2022September 2024Allow2910NoNo
17715866OPTICAL SPECTRUM SENSOR WAFER OR ROBOT FOR CHAMBER CONDITION MONITORINGApril 2022August 2024Allow2811NoNo
17714161Single-chip optical transceiverApril 2022June 2025Allow3800NoNo
17712264LIDAR SENSOR WITH ORTHOGONAL ARRAYSApril 2022August 2024Allow2941NoNo
17766365ENHANCING CONTRAST SENSITIVITY AND RESOLUTION IN A GRATING INTERFEROMETER BY MACHINE LEARNINGApril 2022August 2024Allow2810NoNo
17710967HETERODYNE ONE-DIMENSIONAL GRATING MEASURING DEVICE AND MEASURING METHOD THEREOFMarch 2022October 2023Allow1910NoNo
17708409MEASURING APPARATUS FOR INTERFEROMETRICALLY DETERMINING A SURFACE SHAPEMarch 2022August 2023Allow1701NoNo
17701847INTERFEROMETER WITH AT LEAST ONE DISPERSIVE ELEMENTMarch 2022February 2024Allow2320NoNo
17701012INTERFEROMETRIC MEASUREMENT METHOD AND INTERFEROMETRIC MEASUREMENT ARRANGEMENTMarch 2022September 2023Allow1810YesNo
17697189OPTICAL DISTANCE MEASUREMENT DEVICE AND MACHINING DEVICEMarch 2022May 2025Allow3800NoNo
17603797INTERFEROMETER WITH A LOOPED OR STRAIGHT OPTICAL FIBERMarch 2022September 2023Allow2310NoNo
17760983LIGHT INTERFERENCE GENERATOR AND INTERFERENCE IMAGING DEVICEMarch 2022August 2023Allow1710NoNo
17753479METHOD AND APPARATUS FOR MEASURING THREE-DIMENSIONAL REFRACTIVE INDEX TENSORMarch 2022September 2023Allow1810NoNo
17652674DISTRIBUTED FIBER OPTIC SENSING SYSTEMS AND METHODSFebruary 2022September 2023Allow1910NoNo
17681148SINGLE-BEAM THREE-DEGREE-OF-FREEDOM HOMODYNE LASER INTERFEROMETER BASED ON ARRAY DETECTORFebruary 2022May 2023Allow1410NoNo
17679423Homodyne Encoder System with Adaptive Path Length MatchingFebruary 2022May 2023Allow1500NoNo
17678978OPTICAL SYSTEMS WITH CONTROLLED MIRROR ARRANGEMENTSFebruary 2022September 2023Allow1910YesNo
17676468METHOD FOR CALIBRATING A MEASURING APPARATUSFebruary 2022May 2023Allow1401NoNo
17598000OPTICAL COHERENCE TOMOGRAPHY SYSTEMFebruary 2022July 2024Allow2910NoNo
17589265Method and Device for Superresolution Optical Measurement using Singular OpticsJanuary 2022November 2022Allow910NoNo
17648355METHOD, SYSTEM, AND APPARATUS FOR OPTICAL MEASUREMENTJanuary 2022May 2023Allow1600NoNo
17626760APPARATUS AND METHOD FOR PROCESSING CONSOLIDATED STACKS OF FIBER REINFORCED PLIESJanuary 2022January 2025Allow3621NoNo
17626299WHITE LIGHT INTERFEROMETRIC FIBER-OPTIC GYROSCOPE BASED ON RHOMBIC OPTICAL PATH DIFFERENCE BIAS STRUCTUREJanuary 2022April 2023Allow1510NoNo
17572353Polarization-Separated, Phase-Shifted InterferometerJanuary 2022August 2023Allow2010YesNo
17644933INTERFEROMETER AND OPTICAL INSTRUMENT WITH INTEGRATED OPTICAL COMPONENTSDecember 2021December 2023Allow2320NoNo
17554711METHODS AND APPARATUS FOR DECOMPOSITION TO ACCOUNT FOR IMPERFECT BEAMSPLITTERSDecember 2021July 2023Allow1910NoNo
17596169DEVICE AND METHOD FOR MEASURING INTERFACES OF AN OPTICAL ELEMENTDecember 2021July 2023Allow1910NoNo
17542152SYSTEMS AND METHODS FOR NON-DESTRUCTIVE EVALUATION OF OPTICAL MATERIAL PROPERTIES AND SURFACESDecember 2021September 2022Allow1000NoNo
17540500SYSTEM AND METHOD OF PHASE-LOCKED FIBER INTERFEROMETRYDecember 2021March 2023Allow1600NoNo
17538926INTERFEROMETER FILTERS WITH PARTIAL COMPENSATION STRUCTURENovember 2021February 2023Allow1500NoNo
17615538COLORIMETER COLOUR STANDARDSNovember 2021April 2024Allow2910YesNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner LYONS, MICHAEL A.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
2
Examiner Affirmed
2
(100.0%)
Examiner Reversed
0
(0.0%)
Reversal Percentile
13.2%
Lower than average

What This Means

With a 0.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.

Strategic Value of Filing an Appeal

Total Appeal Filings
18
Allowed After Appeal Filing
6
(33.3%)
Not Allowed After Appeal Filing
12
(66.7%)
Filing Benefit Percentile
50.8%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 33.3% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.

Strategic Recommendations

Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner LYONS, MICHAEL A - Prosecution Strategy Guide

Executive Summary

Examiner LYONS, MICHAEL A works in Art Unit 2877 and has examined 1,435 patent applications in our dataset. With an allowance rate of 89.0%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 25 months.

Allowance Patterns

Examiner LYONS, MICHAEL A's allowance rate of 89.0% places them in the 68% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by LYONS, MICHAEL A receive 1.07 office actions before reaching final disposition. This places the examiner in the 15% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by LYONS, MICHAEL A is 25 months. This places the examiner in the 68% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +8.2% benefit to allowance rate for applications examined by LYONS, MICHAEL A. This interview benefit is in the 40% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 37.5% of applications are subsequently allowed. This success rate is in the 82% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 65.2% of cases where such amendments are filed. This entry rate is in the 87% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 114.3% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 79% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 87.5% of appeals filed. This is in the 78% percentile among all examiners. Of these withdrawals, 78.6% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.

Petition Practice

When applicants file petitions regarding this examiner's actions, 50.0% are granted (fully or in part). This grant rate is in the 61% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 7.7% of allowed cases (in the 94% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 5.6% of allowed cases (in the 81% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.
  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.
  • Request pre-appeal conferences: PACs are highly effective with this examiner. Before filing a full appeal brief, request a PAC to potentially resolve issues without full PTAB review.
  • Appeal filing as negotiation tool: This examiner frequently reconsiders rejections during the appeal process. Filing a Notice of Appeal may prompt favorable reconsideration during the mandatory appeal conference.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.