Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 19081428 | IMAGING SYSTEM AND METHOD | March 2025 | July 2025 | Allow | 4 | 1 | 0 | No | No |
| 19073498 | Self-Referencing Interferometric Microscope | March 2025 | July 2025 | Allow | 4 | 0 | 1 | No | No |
| 18988955 | MULTI-LAYER DETACHABLE SINGLE-AXIS FIBER OPTIC SENSING DEVICE | December 2024 | August 2025 | Allow | 8 | 2 | 0 | Yes | No |
| 18984931 | OPTICAL FIBER-TYPED SPECTRAL CONFOCAL COHERENCE TOMOGRAPHY OPTICAL SYSTEM AND APPLICATION THEREOF | December 2024 | June 2025 | Allow | 6 | 1 | 0 | No | No |
| 18896369 | BIDIRECTIONAL LITTROW TWO-DEGREE-OF-FREEDOM GRATING INTERFERENCE MEASUREMENT DEVICE BASED ON DOUBLE GRATINGS | September 2024 | January 2025 | Allow | 4 | 1 | 0 | No | No |
| 18783208 | Optical Coherence Tomography System for Subsurface Inspection | July 2024 | March 2026 | Allow | 20 | 0 | 0 | No | No |
| 18744405 | PORTABLE OPTICAL GYROSCOPE AND COMPASS UNIT | June 2024 | February 2025 | Allow | 8 | 0 | 0 | No | No |
| 18663403 | DISTANCE MEASUREMENT DEVICE AND METHOD BASED ON SECONDARY MIXING OF INTER-MODE SELF-INTERFERENCE SIGNALS OF OPTICAL FREQUENCY COMBS | May 2024 | January 2025 | Allow | 8 | 0 | 0 | No | No |
| 18647044 | SEMICONDUCTOR PROCESS DEVICE AND METHOD OF MONITORING SEMICONDUCTOR PROCESS | April 2024 | January 2026 | Allow | 21 | 1 | 0 | Yes | No |
| 18701049 | Coating Thickness Measuring Apparatus and Method | April 2024 | February 2026 | Allow | 22 | 1 | 0 | No | No |
| 18620384 | MULTI-CONFIGURABLE WAVEFRONT TESTER | March 2024 | November 2025 | Allow | 19 | 1 | 1 | No | No |
| 18600690 | Interferometric Measurement System Using Time-Correlated Photons | March 2024 | November 2024 | Allow | 8 | 0 | 0 | No | No |
| 18595318 | HETERODYNE LASER INTERFEROMETER BASED ON INTEGRATED DUAL POLARIZATION BEAM-SPLITTING ASSEMBLY AND MEASUREMENT METHOD THEREOF | March 2024 | February 2025 | Allow | 12 | 1 | 0 | No | No |
| 18687468 | OPTICAL HETERODYNE INTERFERENCE MEASUREMENT DEVICE AND OPTICAL HETERODYNE INTERFERENCE MEASUREMENT METHOD | February 2024 | March 2026 | Allow | 25 | 0 | 0 | No | No |
| 18685766 | LIGHT INTENSITY DISTRIBUTION PATTERN MEASURING DEVICE AND METHOD | February 2024 | December 2025 | Allow | 21 | 1 | 0 | No | No |
| 18294489 | REFRACTORY LANCE ASSEMBLY AND REFRACTORY LANCE TUBE | February 2024 | November 2025 | Allow | 22 | 0 | 1 | No | No |
| 18580046 | SYSTEM AND METHOD FOR INSPECTING A FLUID | January 2024 | December 2025 | Allow | 23 | 1 | 0 | No | No |
| 18396691 | SYSTEM, METHOD, AND APPARATUS FOR DIGITAL HOLOGRAPHIC VIBRATION IMAGING WITH INTEGRATED SYSTEM PHASE CORRECTION | December 2023 | March 2024 | Allow | 3 | 0 | 0 | Yes | No |
| 18533186 | HOLOGRAPHIC MICROSCOPE | December 2023 | April 2025 | Allow | 16 | 2 | 0 | No | No |
| 18532379 | OPTICAL INSPECTION APPARATUS | December 2023 | August 2025 | Allow | 20 | 1 | 0 | No | No |
| 18522316 | Laser Interferometer | November 2023 | September 2025 | Allow | 22 | 0 | 0 | No | No |
| 18517362 | PIEZOELECTRIC INTERFEROMETER | November 2023 | January 2026 | Allow | 26 | 1 | 0 | No | No |
| 18517699 | INTERFEROMETER WITH ABSORBING LAYER | November 2023 | January 2026 | Allow | 26 | 1 | 0 | No | No |
| 18509739 | Microresonator-Frequency-Comb-Based Platform For Clinical High-Resolution Optical Coherence Tomography | November 2023 | August 2025 | Allow | 21 | 2 | 0 | No | No |
| 18487863 | System And Method For Assisted Or Automated Crop Transfer | October 2023 | January 2026 | Allow | 27 | 1 | 0 | No | No |
| 18486815 | Method and Device for Superresolution Optical Measurement using Singular Optics | October 2023 | September 2024 | Allow | 11 | 0 | 0 | No | No |
| 18379610 | PORTABLE OPTICAL GYROSCOPE AND COMPASS UNIT | October 2023 | March 2024 | Allow | 5 | 1 | 0 | No | No |
| 18378543 | Self-Aligning Interferometric End Point Housing | October 2023 | August 2025 | Allow | 23 | 0 | 0 | No | No |
| 18473224 | Optical Coherence Tomography System for Subsurface Inspection | September 2023 | June 2024 | Allow | 9 | 0 | 1 | No | No |
| 18470163 | METHOD AND ASSEMBLY TO REDUCE EXTERNAL LASER LIGHT SCATTERING SOURCE IN RING LASER GYROSCOPE | September 2023 | December 2025 | Allow | 27 | 1 | 0 | Yes | No |
| 18469792 | MEASUREMENT SYSTEM FOR DETECTING DEEP-HOLE SURFACE TOPOGRAPHY BASED ON LOW-COHERENCE INTERFEROMETRY | September 2023 | June 2025 | Allow | 21 | 0 | 0 | No | No |
| 18467490 | INTERFEROMETRIC RESONATOR OPTICAL GYROSCOPE WITH OPTICAL FREQUENCY COMB | September 2023 | September 2025 | Allow | 24 | 1 | 1 | Yes | No |
| 18463698 | INTERFEROMETRIC WAVEMETER FOR BROADBAND SENSORS IN PHOTONIC SYSTEMS | September 2023 | March 2026 | Allow | 30 | 1 | 1 | No | No |
| 18548842 | GENERATOR FOR GENERATING AN ANTI-KERR-EFFECT MODULATED LIGHT SIGNAL, INTERFEROMETRY MEASURING DEVICE COMPRISING SUCH A GENERATOR, AND METHOD FOR MODULATING A LIGHT SIGNAL | September 2023 | February 2026 | Allow | 29 | 1 | 0 | No | No |
| 18548849 | METHOD FOR REDUCING THE KERR EFFECT IN AN INTERFEROMETRY MEASURING DEVICE, AND INTERFEROMETRY MEASURING DEVICE CONFIGURED TO IMPLEMENT THIS METHOD | September 2023 | January 2026 | Allow | 28 | 1 | 0 | No | No |
| 18278616 | ANALYSIS DEVICE | August 2023 | April 2025 | Allow | 20 | 0 | 0 | No | No |
| 18453610 | APPARATUS AND METHOD FOR ENHANCED BEAT NOTE DETECTION | August 2023 | September 2025 | Allow | 25 | 0 | 0 | No | No |
| 18233763 | MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS | August 2023 | October 2025 | Allow | 27 | 1 | 0 | Yes | No |
| 18276948 | OPTICAL SENSING DEVICE FOR MEASURING DEFORMATION OF A SAMPLE | August 2023 | August 2025 | Allow | 24 | 1 | 0 | No | No |
| 18232673 | PUPIL IMAGE MEASURING DEVICE AND METHOD | August 2023 | January 2026 | Allow | 29 | 1 | 0 | Yes | No |
| 18230613 | THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETRIC MEASUREMENTS | August 2023 | November 2025 | Allow | 28 | 1 | 0 | No | No |
| 18228010 | MEASUREMENT APPARATUS, METHOD FOR MEASURING BY INTERFEROMETRY, PROCESSING METHOD, OPTICAL ELEMENT AND LITHOGRAPHY SYSTEM | July 2023 | March 2025 | Allow | 20 | 0 | 0 | No | No |
| 18361170 | METHOD OF CALIBRATING OPTICAL COHERENCE TOMOGRAPHY APPARATUS TO MEASURE DEPTH | July 2023 | March 2026 | Allow | 32 | 1 | 0 | No | No |
| 18359661 | INSPECTION METHOD FOR DETECTING A DEFECTIVE BONDING INTERFACE IN A SAMPLE SUBSTRATE, AND MEASUREMENT SYSTEM IMPLEMENTING THE METHOD | July 2023 | January 2024 | Allow | 6 | 1 | 0 | No | No |
| 18225012 | Thermal Desorption Preconcentrator Adapted for Spectroscopic Gas Analysis | July 2023 | May 2025 | Allow | 22 | 0 | 0 | No | No |
| 18262359 | SYSTEM AND METHOD FOR CALCULATING A DROPLET DELAY TIME, AND SORTING DEVICE | July 2023 | September 2025 | Allow | 26 | 1 | 0 | No | No |
| 18354635 | THREE-DIMENSIONAL MEASUREMENT DEVICE | July 2023 | March 2025 | Allow | 20 | 0 | 0 | No | No |
| 18341281 | CLOSED LOOP OPERATION OF BROADBAND RESONATOR OPTICAL GYROSCOPE USING SAWTOOTH PHASE MODULATIONS | June 2023 | July 2025 | Allow | 25 | 1 | 0 | Yes | No |
| 18269547 | AN INTERFEROMETER SYSTEM, POSITIONING SYSTEM, A LITHOGRAPHIC APPARATUS, A JITTER DETERMINATION METHOD, AND A DEVICE MANUFACTURING METHOD | June 2023 | August 2025 | Allow | 26 | 1 | 0 | No | No |
| 18331165 | METHODS AND APARATUS FOR A TWENTY-FIVE-COLOR FLUORESCENCE-BASED ASSAY AND FLOW CYTOMETRY PANEL | June 2023 | March 2026 | Allow | 33 | 2 | 1 | No | No |
| 18329609 | VEHICLE HULL WITH INTERFEROMETRIC FIBER-OPTIC GYROSCOPE | June 2023 | July 2023 | Allow | 2 | 0 | 0 | No | No |
| 18265361 | LAB-ON-A-CHIP SYSTEM WITH FUNCTIONALIZED WAVEGUIDE | June 2023 | June 2025 | Allow | 25 | 1 | 0 | No | No |
| 18204181 | INTERFEROMETER FILTERS WITH PARTIAL COMPENSATION STRUCTURE | May 2023 | March 2025 | Allow | 21 | 0 | 0 | No | No |
| 18325729 | Laser Interferometer | May 2023 | August 2024 | Allow | 15 | 1 | 0 | No | No |
| 18321680 | SILICON NITRIDE WAVEGUIDE BASED INTEGRATED PHOTONICS FRONT-END CHIP FOR OPTICAL GYROSCOPE | May 2023 | February 2025 | Allow | 21 | 2 | 0 | Yes | No |
| 18037819 | SINGLE FRAME-TILTED WAVE INTERFEROMETER | May 2023 | September 2025 | Allow | 28 | 1 | 0 | No | No |
| 18199488 | DETECTION DEVICE, SYSTEM AND METHOD FOR DETERMINATION OF INCIDENCE ANGLE OF AN OPTICAL BEAM | May 2023 | July 2025 | Allow | 26 | 1 | 0 | No | No |
| 18319103 | METHOD AND A SYSTEM FOR COMBINED CHARACTERISATION OF STRUCTURES ETCHED IN A SUBSTRATE | May 2023 | January 2024 | Allow | 8 | 2 | 0 | Yes | No |
| 18318919 | METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES ETCHED IN A SUBSTRATE | May 2023 | January 2024 | Allow | 8 | 2 | 0 | Yes | No |
| 18198230 | PASSIVE TOPOLOGICALLY BIASED SAGNAC INTERFEROMETER AS A ROTATIONAL SENSOR CAPABLE OF SENSING MAGNITUDE AND DIRECTION OF ROTATION | May 2023 | March 2026 | Allow | 34 | 1 | 0 | No | No |
| 18317395 | SEMICONDUCTOR MEASUREMENT APPARATUS | May 2023 | June 2025 | Allow | 25 | 1 | 1 | No | No |
| 18317835 | Frequency-Domain Optical Coherence Tomography with Extended Field-of-View and Reduction of Aliasing Artifacts | May 2023 | August 2024 | Allow | 15 | 1 | 0 | No | No |
| 18315872 | SPECTRAL SENSOR SYSTEM WITH SPATIALLY MODIFIED CENTER WAVELENGTHS | May 2023 | August 2025 | Allow | 27 | 1 | 0 | No | No |
| 18138237 | FIBER OPTIC GYROSCOPE | April 2023 | December 2024 | Allow | 20 | 0 | 0 | No | No |
| 18302151 | METHOD AND SYSTEM FOR MEASURING A SURFACE OF AN OBJECT COMPRISING DIFFERENT STRUCTURES USING LOW COHERENCE INTERFEROMETRY | April 2023 | November 2023 | Allow | 7 | 1 | 0 | No | No |
| 18301871 | WAVELENGTH REFERENCE DEVICE | April 2023 | April 2024 | Allow | 12 | 1 | 0 | No | No |
| 18298704 | MODULATION FOR THERMAL STABILITY IN RESONATOR FIBER OPTIC GYROSCOPE (RFOG) | April 2023 | September 2025 | Allow | 29 | 1 | 0 | No | No |
| 18296733 | PRODUCTION METHOD AND MEASUREMENT METHOD | April 2023 | April 2025 | Allow | 25 | 0 | 1 | No | No |
| 18027679 | OPTICAL ALIGNMENT COMPENSATION SYSTEM FOR A GAS DETECTION SYSTEM | March 2023 | April 2025 | Allow | 25 | 1 | 0 | No | No |
| 18123801 | MULTI-CONFIGURABLE WAVEFRONT TESTER | March 2023 | July 2024 | Abandon | 16 | 3 | 0 | Yes | No |
| 18183432 | MICRO-MOLDED ANAMORPHIC REFLECTOR LENS FOR IMAGE GUIDED THERAPEUTIC/DIAGNOSTIC CATHETERS | March 2023 | December 2023 | Allow | 10 | 1 | 0 | No | No |
| 18179062 | Method and Device for Superresolution Optical Measurement using Singular Optics | March 2023 | July 2023 | Allow | 4 | 0 | 0 | No | No |
| 18023482 | COMPACT DUAL PASS INTERFEROMETER FOR A PLANE MIRROR INTERFEROMETER | February 2023 | December 2024 | Allow | 22 | 0 | 0 | No | No |
| 18173182 | LASER INTERFEROMETER | February 2023 | June 2025 | Allow | 28 | 0 | 0 | No | No |
| 18172043 | OPTICAL GYROSCOPE WITH WEAK MEASUREMENT AMPLIFICATION READOUT | February 2023 | February 2024 | Allow | 12 | 1 | 0 | No | No |
| 18166792 | RESONATOR OPTICAL GYROSCOPE WITH DIMINISHED BIAS ERROR | February 2023 | January 2025 | Allow | 24 | 1 | 0 | Yes | No |
| 18166665 | TRANSVERSE MAGNETIC MODE TRAVELLING WAVE RESONATOR WITH AT LEAST ONE BRAGG GRATING AND GYROSCOPE APPLICATIONS THEREOF | February 2023 | January 2025 | Allow | 24 | 1 | 0 | Yes | No |
| 18160381 | LASER INTERFEROMETER | January 2023 | December 2025 | Allow | 34 | 2 | 1 | No | No |
| 18017178 | AN ILLUMINATION SOURCE AND ASSOCIATED METROLOGY APPARATUS | January 2023 | December 2025 | Allow | 35 | 1 | 0 | No | No |
| 18017025 | SOUND MEASUREMENT METHOD | January 2023 | January 2026 | Abandon | 36 | 2 | 0 | No | No |
| 18082561 | SPATIAL PROPERTY OR COLOR IMPLEMENTATION PROPERTY MEASUREMENT DEVICE OF HOLOGRAPHIC IMAGES | December 2022 | April 2025 | Allow | 28 | 1 | 1 | No | No |
| 18081607 | SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METROLOGY | December 2022 | July 2025 | Allow | 31 | 2 | 1 | No | No |
| 18060795 | AGGREGATING DATA OVER TIME TO IMPROVE IMAGE QUALITY | December 2022 | June 2023 | Allow | 6 | 0 | 0 | No | No |
| 17964799 | MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS | October 2022 | May 2023 | Allow | 7 | 1 | 0 | No | No |
| 17963556 | FOUR-QUADRANT INTERFEROMETRY SYSTEM BASED ON AN INTEGRATED ARRAY WAVE PLATE | October 2022 | September 2024 | Allow | 23 | 1 | 0 | No | No |
| 17959779 | METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICAL ELEMENT | October 2022 | January 2025 | Allow | 27 | 1 | 0 | No | No |
| 17910354 | APPARATUS FOR BORESCOPE INSPECTION OF TECHNICAL DEVICES | September 2022 | September 2025 | Allow | 37 | 2 | 0 | Yes | Yes |
| 17941168 | Single Cell In-Die Metrology Targets and Measurement Methods | September 2022 | July 2025 | Allow | 34 | 2 | 0 | No | No |
| 17898618 | Laser Interferometer | August 2022 | March 2025 | Allow | 30 | 1 | 0 | No | No |
| 17894164 | OPTICAL MEASUREMENT SYSTEM | August 2022 | November 2024 | Allow | 27 | 1 | 0 | No | No |
| 17894202 | OPTICAL INTERFERENCE RANGE SENSOR | August 2022 | May 2025 | Allow | 33 | 1 | 0 | No | No |
| 17894108 | SILICON NITRIDE WAVEGUIDE BASED INTEGRATED PHOTONICS FRONT-END CHIP FOR OPTICAL GYROSCOPE | August 2022 | March 2023 | Allow | 6 | 1 | 0 | No | No |
| 17821340 | INSPECTING APPARATUS, PEELING APPARATUS, AND LEARNED MODEL GENERATING METHOD | August 2022 | March 2026 | Allow | 43 | 2 | 1 | No | No |
| 17800612 | Measuring Apparatus, On-Chip Instrumentation Device and Measuring Method | August 2022 | September 2024 | Allow | 25 | 0 | 0 | No | No |
| 17819102 | In-Situ Residual Intensity Noise Measurement Method And System | August 2022 | September 2024 | Allow | 26 | 0 | 0 | No | No |
| 17883454 | SPHERICAL MULTI-AXIS OPTICAL FIBER SENSING DEVICE, ASSEMBLING METHOD AND MOVABLE DEVICE | August 2022 | September 2024 | Allow | 25 | 0 | 0 | No | No |
| 17873406 | METROLOGY METHOD, TARGET AND SUBSTRATE | July 2022 | July 2025 | Allow | 35 | 2 | 0 | No | No |
| 17795320 | MULTIMODE INTERFEROMETRIC DEVICE AND METHOD | July 2022 | September 2025 | Abandon | 37 | 2 | 0 | No | No |
| 17792435 | ANALYSIS DEVICE AND ANALYSIS METHOD | July 2022 | May 2025 | Allow | 34 | 1 | 0 | No | No |
| 17758702 | Egg Characteristic Determining Device | July 2022 | September 2025 | Abandon | 38 | 2 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner LYONS, MICHAEL A.
With a 0.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 31.6% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner LYONS, MICHAEL A works in Art Unit 2877 and has examined 1,416 patent applications in our dataset. With an allowance rate of 88.6%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 25 months.
Examiner LYONS, MICHAEL A's allowance rate of 88.6% places them in the 69% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by LYONS, MICHAEL A receive 1.09 office actions before reaching final disposition. This places the examiner in the 11% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by LYONS, MICHAEL A is 25 months. This places the examiner in the 80% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +8.3% benefit to allowance rate for applications examined by LYONS, MICHAEL A. This interview benefit is in the 39% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 38.0% of applications are subsequently allowed. This success rate is in the 87% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 65.7% of cases where such amendments are filed. This entry rate is in the 89% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.
When applicants request a pre-appeal conference (PAC) with this examiner, 114.3% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 81% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 87.5% of appeals filed. This is in the 81% percentile among all examiners. Of these withdrawals, 78.6% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 55.5% are granted (fully or in part). This grant rate is in the 57% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.
Examiner's Amendments: This examiner makes examiner's amendments in 8.7% of allowed cases (in the 92% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 5.9% of allowed cases (in the 83% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.