Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18706149 | HIGH TEMPERATURE MOLD GAP MEASUREMENT USING OPTICAL FIBER INTERFEROMETRY | April 2024 | October 2025 | Allow | 17 | 0 | 0 | No | No |
| 18631496 | COMPUTER DISPLAY WITH INTEGRATED COLORIMETER | April 2024 | October 2025 | Allow | 18 | 1 | 0 | Yes | No |
| 18505342 | ACTIVE QUADRATURE DEMODULATION FOR SUBSAMPLED/CIRCULAR RANGING OPTICAL COHERENCE TOMOGRAPHY | November 2023 | July 2025 | Allow | 20 | 2 | 0 | Yes | No |
| 18375025 | REAL-TIME, REFERENCE-FREE BACKGROUND ORIENTED SCHLIEREN IMAGING SYSTEM | September 2023 | November 2025 | Allow | 25 | 1 | 0 | No | No |
| 18244023 | Self-Mixing Interferometry Sensors Used to Sense Vibration of a Structural or Housing Component Defining an Exterior Surface of a Device | September 2023 | March 2025 | Abandon | 18 | 2 | 0 | Yes | No |
| 18237911 | Apparatus of Inner Light Layer Illumination by Multi-beam Interference for Imaging in Turbid Media | August 2023 | May 2024 | Allow | 9 | 1 | 0 | No | No |
| 18356768 | OPTICAL GYROSCOPE WITH BROADBAND COMB INTERROGATION | July 2023 | October 2025 | Allow | 27 | 0 | 0 | No | No |
| 18356012 | SENSOR | July 2023 | March 2026 | Abandon | 32 | 0 | 0 | No | No |
| 18219784 | FIBER-OPTIC GYROSCOPE WITH A DUAL-INJECTION POLARIZATION- MAINTAINING 3X3 DIRECTIONAL COUPLER FOR ENHANCED MEASUREMENT SENSITIVITY THROUGH HETERODYNE | July 2023 | March 2025 | Allow | 20 | 0 | 0 | No | No |
| 18349715 | STABILITY ENHANCED RESONATOR FIBER OPTIC GYRO (RFOG) | July 2023 | December 2025 | Allow | 29 | 0 | 0 | No | No |
| 18344651 | Extended Reach Ring Interferometer with Multifiber Optical Cable for Event Detection, Location, and Characterization | June 2023 | March 2024 | Allow | 8 | 1 | 0 | Yes | No |
| 18344575 | EXTENDED REACH RING INTERFEROMETER HAVING REFERENCE COIL FOR MITIGATING SIGNAL FADING | June 2023 | February 2024 | Allow | 8 | 1 | 0 | Yes | No |
| 18214376 | DUAL COMB SPECTROSCOPY UNDER NO-WALKING CONDITION | June 2023 | November 2025 | Allow | 29 | 3 | 1 | Yes | No |
| 18337273 | SYSTEMS, APPARATUSES, AND METHODS FOR INSPECTING INNER SURFACES OF HOLES USING PIXEL-INTENSITY ANALYSIS | June 2023 | March 2026 | Allow | 33 | 2 | 0 | Yes | No |
| 18207812 | WELD QUALITY INSPECTION WITH DOMAIN KNOWLEDGE INFUSED ADAPTIVE-NETWORK-BASED FUZZY INFERENCE SYSTEM | June 2023 | June 2025 | Allow | 25 | 0 | 0 | No | No |
| 18331794 | MOISTURE SENSOR SYSTEMS & METHODS OF INSTALLATION | June 2023 | June 2025 | Allow | 24 | 0 | 0 | No | No |
| 18206828 | IMMERSED LENS DOWNHOLE REFRACTOMETER | June 2023 | November 2024 | Allow | 17 | 1 | 1 | Yes | No |
| 18313777 | Multi-Channel Light Detection and Ranging (LIDAR) Unit Having a Telecentric Lens Assembly and Single Circuit Board for Emitters and Detectors | May 2023 | November 2024 | Allow | 19 | 2 | 0 | Yes | No |
| 18125713 | USE OF FREQUENCY OFFSETS IN GENERATION OF LIDAR DATA | March 2023 | June 2025 | Allow | 27 | 3 | 0 | No | Yes |
| 18120148 | System and Method of Measuring Contaminants in a Substantially Translucent Material, Such as Water | March 2023 | January 2026 | Abandon | 34 | 1 | 0 | No | No |
| 18109824 | DIFFERENTIAL REFRACTOMETER FOR GRADIENT CHROMATOGRAPHY | February 2023 | June 2025 | Allow | 28 | 1 | 0 | No | No |
| 18019687 | OPTICAL COHERENCE TOMOGRAPHY DEVICE | February 2023 | June 2025 | Abandon | 29 | 1 | 0 | No | No |
| 18103359 | MACHINE LEARNING-BASED TRANSFORMATION OF LOW-RESOLUTION WAFER INSPECTION IMAGES TO HIGH RESOLUTION IMAGES | January 2023 | October 2025 | Allow | 33 | 1 | 0 | No | No |
| 18005957 | MEASUREMENT EQUIPMENT FOR SPECTROSCOPIC ANALYSIS OF INDIVIDUAL MOVING OBJECTS | January 2023 | September 2025 | Allow | 32 | 2 | 0 | No | No |
| 18064651 | METHOD OF ANALYZING A SPECTRAL PEAK | December 2022 | May 2025 | Allow | 29 | 1 | 0 | No | No |
| 17960345 | METHOD FOR ANALYSING A SPRAY GENERATED BY A DEVICE FOR DISPENSING FLUID PHARMACEUTICAL PRODUCT | October 2022 | April 2025 | Allow | 31 | 1 | 0 | No | No |
| 17953978 | Laser Interferometer | September 2022 | September 2025 | Allow | 36 | 0 | 0 | Yes | No |
| 17934859 | SYSTEMS AND METHODS FOR CONCURRENT MEASUREMENTS OF INTERFEROMETRIC AND ELLIPSOMETRIC SIGNALS OF MULTI-LAYER THIN FILMS | September 2022 | November 2025 | Allow | 38 | 1 | 0 | No | No |
| 17907215 | METHOD FOR DETERMINING THE REFRACTIVE-INDEX PROFILE OF A CYLINDRICAL OPTICAL OBJECT | September 2022 | June 2023 | Allow | 9 | 1 | 0 | Yes | No |
| 17948026 | FABRY-PEROT CAVITY PHASE MODULATOR INCLUDING A TUNABLE CORE, AN OPTICAL MODULATING DEVICE INCLUDING THE SAME, AND A LIDAR APPARATUS INCLUDING THE OPTICAL MODULATING DEVICE | September 2022 | August 2023 | Allow | 10 | 1 | 0 | No | No |
| 17932551 | METHOD AND SYSTEM FOR MOIRÉ PROFILIMETRY USING SIMULTANEOUS DUAL FRINGE PROJECTION | September 2022 | June 2025 | Allow | 33 | 1 | 0 | No | No |
| 17900334 | ELECTRONIC DEVICE INCLUDING PROCESSOR EXECUTING DEFECT DETECTION MODULE, OPERATING METHOD OF ELECTRONIC DEVICE, AND METHOD FOR FABRICATING SEMICONDUCTOR INTEGRATED CIRCUIT | August 2022 | May 2025 | Allow | 32 | 0 | 0 | No | No |
| 17894988 | METHOD OF CLUSTERING USING ENCODER-DECODER MODEL BASED ON ATTENTION MECHANISM AND STORAGE MEDIUM FOR IMAGE RECOGNITION | August 2022 | June 2025 | Abandon | 34 | 1 | 0 | No | No |
| 17893082 | OVERLAY MEASUREMENT BETWEEN LAYERS OF A SEMICONDUCTOR SPECIMEN BASED ON CENTER OF SYMMETRY (COS) LOCALIZATION | August 2022 | November 2025 | Allow | 39 | 2 | 0 | Yes | No |
| 17890648 | SEMICONDUCTOR INSPECTION METHOD INCLUDING HEATING A TOP SURFACE OF A SEMICONDUCTOR PACKAGE | August 2022 | July 2025 | Allow | 35 | 1 | 1 | No | No |
| 17798469 | METHOD FOR MEASURING THE GEOMETRY OF A GLAZING BY PROJECTION OF A RANDOM LIGHT PATTERN | August 2022 | April 2025 | Allow | 32 | 1 | 0 | No | No |
| 17878896 | PHOTOMASK INSPECTION METHOD USING IMAGE INENSITY RATIO | August 2022 | December 2025 | Allow | 40 | 3 | 0 | No | No |
| 17813759 | GALVANOMETER POSITIONING TOOL AND LASER PRINTER | July 2022 | October 2024 | Allow | 26 | 0 | 0 | No | No |
| 17793163 | PHOTO-ACOUSTIC CONVERSION BASED SOUND EMITTER DEVICE | July 2022 | January 2026 | Allow | 42 | 1 | 1 | No | No |
| 17859358 | METHOD OF MANUFACTURING A DISPLAY DEVICE | July 2022 | September 2024 | Allow | 27 | 0 | 0 | No | No |
| 17809749 | METHOD FOR DETERMINING QUALITY OF INSPECTION DATA USING MACHINE LEARNING MODEL, INFORMATION PROCESSING APPARATUS, AND NON-TRANSITORY COMPUTER READABLE STORAGE MEDIUM STORING COMPUTER PROGRAM | June 2022 | December 2024 | Allow | 29 | 0 | 0 | No | No |
| 17842083 | METHOD AND APPARATUS FOR DETECTING DEFECT, DEVICE, AND STORAGE MEDIUM | June 2022 | March 2025 | Abandon | 33 | 1 | 0 | No | No |
| 17824730 | INFORMATION PROCESSING APPARATUS FOR TEACHING TRANSFER POSITION OF SUBSTRATE, TRANSFER POSITION TEACHING METHOD, AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE INFORMATION PROCESSING APPARATUS | May 2022 | March 2025 | Allow | 34 | 1 | 0 | No | No |
| 17749195 | MATERIAL COMPLETENESS DETECTION METHOD AND APPARATUS, AND STORAGE MEDIUM | May 2022 | February 2025 | Allow | 33 | 1 | 0 | No | No |
| 17663881 | DROPLET SENSOR WITH A PROTECTIVE FILM | May 2022 | September 2023 | Allow | 16 | 1 | 0 | No | No |
| 17774741 | METHODS AND APPARATUSES FOR MEASURING MAGNETIC FLUX DENSITY AND OTHER PARAMETERS BY MEANS OF A PLURALITY OF NV CENTERS, AND APPLICATIONS THEREOF | May 2022 | May 2025 | Allow | 37 | 1 | 0 | Yes | No |
| 17736878 | Optical Measurement of Workpiece Surface using Sharpness Maps | May 2022 | October 2025 | Allow | 42 | 4 | 0 | No | No |
| 17725693 | Real-Time, Reference-Free Background Oriented Schlieren Imaging System | April 2022 | June 2023 | Allow | 14 | 0 | 0 | No | No |
| 17716237 | DEFECT INSPECTION WITH IMAGES OF DIFFERENT SYNTHESIS RATIOS | April 2022 | September 2024 | Allow | 30 | 0 | 0 | No | No |
| 17707936 | NONINVASIVE VACCINE TESTER | March 2022 | February 2024 | Abandon | 23 | 1 | 0 | No | No |
| 17760831 | SPECTRUM MEASUREMENT DEVICE | March 2022 | July 2025 | Abandon | 40 | 2 | 0 | No | No |
| 17695536 | REFRACTOMETER HAVING A POLYMERIC OPTICALLY TRANSMISSIVE STRUCTURE AND A WINDOW, AND METHOD OF MAKING | March 2022 | September 2024 | Abandon | 30 | 2 | 1 | No | No |
| 17641490 | A CHIP-LEVEL RESONANT ACOUSTO-OPTIC COUPLED SOLID STATE WAVE GYROSCOPE | March 2022 | January 2024 | Allow | 22 | 1 | 0 | No | No |
| 17641481 | A CHIP-LEVEL DISC-TYPE ACOUSTO-OPTIC STANDING WAVE GYROSCOPE | March 2022 | June 2024 | Allow | 27 | 0 | 0 | No | No |
| 17689934 | DEVICE-LIKE METROLOGY TARGETS | March 2022 | March 2023 | Allow | 12 | 0 | 1 | No | No |
| 17639396 | WORKPIECE SURFACE DEFECT DETECTION DEVICE AND DETECTION METHOD, WORKPIECE SURFACE INSPECTION SYSTEM, AND PROGRAM | March 2022 | November 2024 | Allow | 32 | 1 | 0 | No | No |
| 17638215 | METHOD AND COMPUTER PROGRAM PRODUCT FOR AUTOMATED DEFECT DETECTION DURING BORESCOPING OF AN ENGINE | February 2022 | March 2025 | Allow | 36 | 1 | 0 | No | No |
| 17652490 | PROCESSING APPARATUS AND METHOD FOR CALCULATING REFRACTIVE INDEX DISTRIBUTION BASED ON LIGHT BEAM DATA, OPTICAL APPARATUS INCLUDING THE PROCESSING APPARATUS, MANUFACTURING APPARATUS FOR CREATING OPTICAL ELEMENT | February 2022 | April 2025 | Allow | 37 | 3 | 0 | Yes | No |
| 17675575 | Compact Hyperspectral Mid-Infrared Spectrometer | February 2022 | December 2022 | Allow | 10 | 1 | 0 | No | No |
| 17586283 | SYSTEM FOR PRECISION DISPLACEMENT MEASUREMENT BASED ON SELF-TRACEABLE GRATING INTERFERENCE | January 2022 | September 2023 | Allow | 19 | 1 | 0 | No | No |
| 17573838 | METHOD FOR DETECTING DEFECTS IN DIVIDED AND FURTHER DIVIDED IMAGES BASED ON TRAINED MODELS, ELECTRONIC DEVICE, AND STORAGE MEDIUM | January 2022 | September 2024 | Allow | 32 | 1 | 0 | No | No |
| 17647340 | EUV MASK INSPECTION DEVICE, EUV MASK INSPECTION METHOD, NON-TRANSITORY COMPUTER-READABLE MEDIUM STORING EUV MASK INSPECTION PROGRAM, AND EUV MASK INSPECTION SYSTEM INCLUDING A GRAY IMAGE BASED ON DESIGN DATA OF A PATTERN | January 2022 | May 2025 | Allow | 40 | 2 | 0 | Yes | No |
| 17567677 | REFRACTIVE-INDEX SENSOR AND METHOD | January 2022 | March 2023 | Abandon | 15 | 1 | 0 | No | No |
| 17562019 | HETEROGENEOUS INTEGRATION DETECTING METHOD AND HETEROGENEOUS INTEGRATION DETECTING APPARATUS | December 2021 | February 2024 | Allow | 26 | 2 | 0 | Yes | No |
| 17560663 | METHOD FOR DETECTING PRODUCT DEFECT IN DETECTION IMAGE, COMPUTING DEVICE, AND STORAGE MEDIUM | December 2021 | March 2025 | Allow | 39 | 2 | 0 | No | No |
| 17618383 | METHOD AND DEVICE FOR CHARACTERIZING A MEDIUM USING REFRACTIVE INDEX | December 2021 | January 2025 | Abandon | 37 | 4 | 0 | Yes | No |
| 17548347 | SYSTEM FOR WAFER DECHUCKING AND HEALTH MONITORING | December 2021 | February 2025 | Abandon | 38 | 5 | 0 | Yes | No |
| 17528404 | SYSTEM FOR RECONSTRUCTING AND OUTPUTTING A STRUCTURE OF AN ESTIMATION SAMPLE USING REFRACTIVE INDEX DISTRIBUTION OF UPDATED ESTIMATION SAMPLE | November 2021 | October 2023 | Allow | 23 | 1 | 0 | Yes | No |
| 17526314 | ERROR REDUCTION IN RECONSTRUCTED IMAGES IN DEFECT DETECTION METHOD, ELECTRONIC DEVICE AND STORAGE MEDIUM | November 2021 | March 2024 | Allow | 28 | 0 | 0 | No | No |
| 17605051 | Deflectometry Measurement System | October 2021 | January 2024 | Allow | 27 | 1 | 0 | No | No |
| 17496345 | WAFER-TILT DETERMINATION FOR SLICE-AND-IMAGE PROCESS | October 2021 | March 2024 | Allow | 29 | 1 | 0 | Yes | No |
| 17479449 | LIDAR DEVICE WITH HEATER WIRE FOR HEATING OPTICAL WINDOW OF HOUSING | September 2021 | December 2025 | Allow | 51 | 4 | 0 | Yes | No |
| 17448175 | MULTI-USE BEAM SAMPLER IN LASER BEAM DELIVERY PATH OF OPHTHALMIC LASER SYSTEM | September 2021 | December 2023 | Allow | 27 | 0 | 0 | No | No |
| 17440810 | OBJECT DETECTION SYSTEM, TRANSPORT VEHICLE, AND OBJECT DETECTION DEVICE | September 2021 | January 2025 | Allow | 40 | 2 | 0 | Yes | Yes |
| 17476608 | METHODS AND SYSTEMS EMPLOYING IMAGE SENSING AND 3D SENSING TO IDENTIFY SHELVED PRODUCTS | September 2021 | May 2025 | Allow | 44 | 1 | 1 | No | No |
| 17469119 | THICKNESS EVALUATION METHOD OF CELL SHEET | September 2021 | October 2023 | Allow | 25 | 1 | 0 | No | No |
| 17464854 | Prism for Measuring Liquid Concentration | September 2021 | January 2023 | Allow | 17 | 1 | 0 | No | No |
| 17410798 | LASER INTERFEROMETER HAVING A VIBRATOR TO MODULATE LIGHT FOR DISPLACEMENT AND VIBRATION VELOCITY MEASUREMENT | August 2021 | September 2023 | Allow | 24 | 2 | 0 | No | No |
| 17401556 | ELECTRONIC DEVICE AND METHOD FOR DETECTING TOOL STATE BASED ON AUDIO | August 2021 | October 2024 | Allow | 38 | 2 | 0 | No | No |
| 17398470 | INTERFEROMETRIC FIBER-OPTIC GYROSCOPE WITH REDUCED COMMON MODE PHASE NOISES AND POLARIZATION CROSSTALK FOR ENHANCED MEASUREMENT SENSITIVITY AND ACCURACY | August 2021 | September 2023 | Abandon | 26 | 2 | 0 | No | No |
| 17398261 | OPTICAL DETECTION DEVICE HAVING ADHESIVE MEMBER | August 2021 | September 2022 | Allow | 13 | 0 | 0 | Yes | No |
| 17429443 | METHOD FOR AUTONOMOUSLY APPLYING A DANGLING BOND PATTERN TO A SUBSTRATE | August 2021 | September 2025 | Allow | 49 | 3 | 1 | Yes | No |
| 17428963 | WIRE NON-ATTACHMENT INSPECTION SYSTEM, WIRE NON-ATTACHMENT DETECTION DEVICE, AND WIRE NON-ATTACHMENT DETECTION METHOD | August 2021 | April 2024 | Abandon | 32 | 1 | 0 | No | No |
| 17383426 | DIFFERENTIAL REFRACTOMETER FOR GRADIENT CHROMATOGRAPHY | July 2021 | October 2022 | Allow | 15 | 0 | 0 | Yes | No |
| 17380017 | ROBOT BLADE TILT DETERMINATION BY EVALUATING GRAYSCALE IN IMAGES | July 2021 | April 2024 | Allow | 33 | 1 | 0 | No | No |
| 17378946 | SENSOR DEVICE WITH HEATED SPOT DETECTION FOR MEASURING MOTION OF VEHICLE AND METHOD OF OPERATING THE SENSOR DEVICE | July 2021 | June 2024 | Allow | 35 | 2 | 0 | Yes | No |
| 16610692 | DEVICE AND METHOD FOR MEASURING THICKNESS AND REFRACTIVE INDEX OF MULTILAYER THIN FILM BY USING ANGLE-RESOLVED SPECTRAL REFLECTOMETRY | July 2021 | October 2023 | Allow | 47 | 2 | 0 | No | No |
| 17367785 | RESOLUTION MEASUREMENT APPARATUS AND RESOLUTION MEASUREMENT METHOD USING THE SAME | July 2021 | April 2024 | Allow | 33 | 2 | 0 | No | No |
| 17364967 | CLASSIFICATION OF LASER SPECKLE PROFILES FOR VALIDATION OF PART PLACEMENT IN AN ASSEMBLY TASK | July 2021 | March 2023 | Allow | 21 | 1 | 0 | No | No |
| 17357396 | Printing Solder Point Quality Identification And Maintenance Suggestion System And Method Thereof | June 2021 | May 2024 | Allow | 35 | 2 | 0 | No | No |
| 17350210 | SYSTEM AND METHOD FOR IMAGE ANALYSIS FOR PHYSICAL DEFECT DETECTION OF A STORAGE MEDIUM | June 2021 | September 2025 | Abandon | 51 | 4 | 0 | Yes | No |
| 17350205 | DISTRIBUTED IMAGE ANALYSIS METHOD AND STORAGE MEDIUM FOR PERFORMING IMAGE ANALYSIS BASED ON IMAGE ANALYSIS RESULTS FROM SERVERS | June 2021 | January 2025 | Allow | 43 | 3 | 0 | Yes | No |
| 17413822 | ATOM INTERFEROMETER | June 2021 | March 2023 | Allow | 21 | 2 | 0 | No | No |
| 17298942 | METHOD AND SYSTEM FOR DETECTING EVENTS IN A CONDUIT | June 2021 | May 2025 | Abandon | 47 | 7 | 0 | Yes | No |
| 17296498 | METHOD, INTERFEROMETER AND SIGNAL DEVICE, EACH FOR DETERMINING AN INPUT PHASE AND/OR AN INPUT AMPLITUDE OF AN INPUT LIGHT FIELD | May 2021 | September 2024 | Abandon | 40 | 1 | 0 | No | No |
| 17296421 | STRUCTURE ESTIMATION SYSTEM AND STRUCTURE ESTIMATION PROGRAM FOR ESTIMATING HEIGHT OF STRUCTURE BASED ON DATA FROM CHARGED PARTICLE BEAM DEVICE | May 2021 | October 2025 | Allow | 53 | 5 | 0 | Yes | No |
| 17309306 | COMPUTER VISION-BASED ANOMALY DETECTION METHOD, DEVICE AND ELECTRONIC APPARATUS | May 2021 | March 2024 | Allow | 34 | 1 | 0 | Yes | No |
| 17321731 | DETECTOR THAT DETECTS RELATIVE POSITIONS OF MARKS WHILE BLOCKING NON-INTERFERENCE LIGHT | May 2021 | June 2024 | Allow | 37 | 2 | 1 | Yes | No |
| 17315063 | System for Emulating an Environment for Testing a Frequency Modulated Continuous Wave (FMCW) Detection and Ranging (LiDAR) System | May 2021 | March 2023 | Allow | 22 | 0 | 0 | No | No |
| 17314228 | POLARIZATION DEPENDENT LOSS MEASUREMENT | May 2021 | March 2023 | Allow | 22 | 1 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner LEE, HWA S.
With a 25.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 33.3% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner LEE, HWA S works in Art Unit 2877 and has examined 459 patent applications in our dataset. With an allowance rate of 87.1%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 31 months.
Examiner LEE, HWA S's allowance rate of 87.1% places them in the 66% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by LEE, HWA S receive 1.71 office actions before reaching final disposition. This places the examiner in the 36% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by LEE, HWA S is 31 months. This places the examiner in the 56% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a -14.2% benefit to allowance rate for applications examined by LEE, HWA S. This interview benefit is in the 2% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 28.2% of applications are subsequently allowed. This success rate is in the 51% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 36.7% of cases where such amendments are filed. This entry rate is in the 55% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 88.9% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 67% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 76.5% of appeals filed. This is in the 68% percentile among all examiners. Of these withdrawals, 46.2% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.
When applicants file petitions regarding this examiner's actions, 61.5% are granted (fully or in part). This grant rate is in the 66% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.
Examiner's Amendments: This examiner makes examiner's amendments in 11.1% of allowed cases (in the 94% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 3.5% of allowed cases (in the 76% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.