Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 19265644 | BATTERY APPEARANCE DETECTION DEVICE AND BATTERY MANUFACTURING EQUIPMENT | July 2025 | February 2026 | Allow | 8 | 2 | 0 | No | No |
| 19197417 | SYSTEM AND METHODS FOR DETECTING MATTRESS DEFECTS | May 2025 | January 2026 | Allow | 8 | 2 | 0 | Yes | No |
| 19187556 | EDGE SHAPE MEASUREMENT APPARATUS AND METHOD OF MEASURING EDGE SHAPE | April 2025 | March 2026 | Allow | 11 | 2 | 0 | Yes | No |
| 18998074 | NOVEL TECHNIQUES FOR EXAMINATION OF LIGHT OPTICAL ELEMENTS | January 2025 | August 2025 | Allow | 7 | 1 | 1 | No | No |
| 19019616 | LASER-RANGING TELESCOPE WITH SWITCHABLE MAGNIFICATION | January 2025 | July 2025 | Allow | 6 | 1 | 0 | No | No |
| 19004565 | METHOD AND DEVICE FOR CHARACTERIZING A RESONATOR ELEMENT | December 2024 | June 2025 | Allow | 6 | 1 | 0 | No | No |
| 18922440 | VISUAL TURBIDITY DETECTION DEVICE AND DETECTION METHOD THEREOF | October 2024 | March 2025 | Allow | 5 | 1 | 0 | No | No |
| 18919048 | SINGLE WAFER ORIENTATION TOOL-INDUCED SHIFT CLEANING | October 2024 | November 2025 | Allow | 13 | 1 | 0 | No | No |
| 18892499 | TWIST AND TILT VERIFICATION USING DIFFRACTION PATTERNS | September 2024 | November 2025 | Allow | 13 | 2 | 0 | Yes | No |
| 18822901 | SPECTRAL ANGULAR METROLOGY | September 2024 | October 2025 | Allow | 14 | 1 | 0 | No | No |
| 18815092 | LIGHT REFLECTION SUPPORT AND THROUGH HOLE INSPECTION SYSTEM | August 2024 | February 2025 | Allow | 6 | 1 | 0 | No | No |
| 18797466 | METHODS AND SYSTEMS FOR OPEN PATH GAS DETECTION | August 2024 | February 2025 | Allow | 6 | 2 | 0 | Yes | No |
| 18776431 | METHOD OF DETERMINING AT LEAST ONE PROPERTY ASSOCIATED TO A DRY PARTICULATE SUBSTANCE | July 2024 | March 2025 | Allow | 8 | 2 | 1 | No | No |
| 18758306 | PARTICLE DISCRIMINATION BASED ON MULTI-ANGLE POLARIZED ELASTIC LIGHT SCATTERING | June 2024 | January 2026 | Allow | 19 | 2 | 1 | No | No |
| 18738936 | METHOD OF USING CROWD-SOURCED ECHO LOCATION PINGS TO DETECT FIBER LOCATIONS USING DISTRIBUTED ACOUSTIC SENSING | June 2024 | August 2024 | Allow | 2 | 0 | 0 | No | No |
| 18598606 | Systems and Methods for Measuring Mat Density of Aquatic Biomass | March 2024 | December 2024 | Allow | 9 | 0 | 1 | No | No |
| 18581858 | SAMPLE INSPECTION WITH MULTIPLE MEASUREMENT MODES | February 2024 | October 2025 | Allow | 20 | 0 | 0 | No | No |
| 18428986 | CONDENSATION PARTICLE COUNTERS | January 2024 | November 2025 | Allow | 21 | 1 | 0 | Yes | No |
| 18415016 | VISION INSPECTION SYSTEMS AND METHODS USING LIGHT SOURCES OF DIFFERENT WAVELENGTHS | January 2024 | December 2025 | Allow | 23 | 1 | 0 | No | No |
| 18570848 | OUTDOOR PHOTOLUMINESCENCE IMAGING OF PHOTOVOLTAIC ARRAYS VIA OPTICAL STRING MODULATION | December 2023 | January 2026 | Allow | 25 | 1 | 0 | No | No |
| 18511021 | SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION | November 2023 | March 2026 | Allow | 28 | 2 | 0 | Yes | No |
| 18557478 | OPTICAL SWITCHING AND INFORMATION CODING ON FEMTOSECOND OR SUB-FEMTOSECOND TIME SCALE | October 2023 | September 2024 | Allow | 11 | 2 | 0 | Yes | No |
| 18556388 | MACHINE FOR CONTROLLING THE SHAPE OF A REEL OF WEB PRODUCT | October 2023 | October 2025 | Allow | 24 | 1 | 0 | No | No |
| 18381458 | Simultaneous Multi-Surface Non-Contact Optical Profiler | October 2023 | August 2024 | Allow | 10 | 0 | 0 | No | No |
| 18485890 | APPARATUS OF VISION CHROMATIC CONFOCAL SENSOR BASED ON A GEOMETRICAL PHASE LENS | October 2023 | January 2026 | Allow | 27 | 1 | 0 | No | No |
| 18475544 | SUBSTRATE IMAGING APPARATUS | September 2023 | August 2025 | Allow | 23 | 1 | 0 | No | No |
| 18473219 | QUALITY DETECTION METHOD FOR POROUS METAL MATERIAL | September 2023 | May 2024 | Allow | 8 | 1 | 0 | No | No |
| 18372026 | HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS | September 2023 | December 2025 | Allow | 26 | 2 | 1 | Yes | No |
| 18369846 | SYSTEMS AND METHODS FOR OPTIMIZING AN INSTRUMENT SYSTEM WORKFLOW | September 2023 | November 2025 | Abandon | 26 | 0 | 1 | No | No |
| 18370136 | SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION | September 2023 | August 2025 | Allow | 23 | 1 | 0 | No | No |
| 18464598 | CALIBRATION OF AN OPTICAL DETECTOR USING A MICRO-FLOW CHAMBER | September 2023 | February 2026 | Allow | 30 | 2 | 0 | No | No |
| 18241171 | DEVICE FOR MEASURING INNER SIZE OF SHOE | August 2023 | August 2025 | Allow | 23 | 1 | 0 | No | No |
| 18278977 | ACCURATE TURBIDITY MEASUREMENT SYSTEM AND METHOD, USING SPECKLE PATTERN | August 2023 | August 2025 | Allow | 24 | 1 | 0 | Yes | No |
| 18231094 | METHODS AND SYSTEMS FOR OPEN PATH GAS DETECTION | August 2023 | July 2024 | Allow | 11 | 1 | 1 | No | No |
| 18366039 | FIRE DETECTION DEVICE | August 2023 | April 2025 | Allow | 20 | 1 | 1 | No | No |
| 18225187 | METHOD FOR IN-SITU NON-CONTACT DETECTION OF SYMMETRY ERROR OF KEYWAY LOCATED ON SHAFT-TYPE WORKPIECE | July 2023 | June 2025 | Allow | 23 | 1 | 0 | Yes | No |
| 18356096 | INSPECTION SYSTEM | July 2023 | September 2025 | Allow | 26 | 2 | 0 | No | No |
| 18272188 | BRILLOUIN GAIN SPECTRUM DISTRIBUTION MEASUREMENT METHOD AND EQUIPMENT | July 2023 | April 2025 | Allow | 21 | 1 | 0 | No | No |
| 18344484 | DEFECT INSPECTION DEVICE AND METHOD FOR INSPECTING DEFECT | June 2023 | November 2025 | Allow | 29 | 2 | 0 | Yes | No |
| 18216162 | SEMICONDUCTOR INSPECTION TOOL SYSTEM AND METHOD FOR WAFER EDGE INSPECTION | June 2023 | January 2025 | Allow | 19 | 1 | 0 | No | No |
| 18341339 | SYSTEM FOR OPTICAL INSPECTION OF A SUBSTRATE USING SAME OR DIFFERENT WAVELENGTHS | June 2023 | October 2024 | Allow | 16 | 3 | 0 | Yes | No |
| 18340394 | FOCUS CONTROL METHOD FOR SPECTROSCOPIC MEASURING APPARATUS, INSPECTION METHOD FOR SEMICONDUCTOR DEVICE, AND SPECTROSCOPIC MEASURING APPARATUS FOR PERFORMING THE SAME | June 2023 | September 2025 | Allow | 27 | 1 | 1 | No | No |
| 18258457 | MANAGEMENT SYSTEM, MANAGEMENT DEVICE, MANAGEMENT METHOD, AND PROGRAM | June 2023 | June 2025 | Allow | 24 | 1 | 0 | No | No |
| 18329585 | METHOD FOR MEASURING MULTIPLE PARAMETERS OF MIXED GASES BASED ON BROADBAND INFRARED LIGHT SOURCE | June 2023 | August 2023 | Allow | 2 | 0 | 0 | No | No |
| 18319266 | CALCULATION METHOD, IMAGE-CAPTURING METHOD, AND IMAGE-CAPTURING APPARATUS | May 2023 | February 2026 | Allow | 33 | 2 | 0 | Yes | No |
| 18197749 | METHOD FOR ALIGNING TO A PATTERN ON A WAFER | May 2023 | November 2025 | Allow | 30 | 3 | 1 | Yes | No |
| 18252297 | METHOD OF CALIBRATING A FOCAL POINT OF A LASER APPARATUS MOUNTED ON A WINDOW MOUNTED IN SITU | May 2023 | October 2025 | Abandon | 30 | 1 | 0 | No | No |
| 18312264 | TAB IMAGE ACQUISITION DEVICE, SYSTEM, AND METHOD | May 2023 | June 2024 | Allow | 14 | 2 | 1 | No | No |
| 18251527 | IMAGING DEVICE | May 2023 | June 2025 | Allow | 26 | 1 | 0 | No | No |
| 18140190 | TIME DOMAIN MULTIPLEXED DEFECT SCANNER | April 2023 | October 2023 | Allow | 6 | 1 | 0 | No | No |
| 18134362 | DYNAMIC PROFILOMETRIC IMAGING USING MULTISCALE PATTERNS | April 2023 | March 2025 | Allow | 24 | 1 | 0 | No | No |
| 18132827 | SPORE STATE DISCRIMINATION | April 2023 | November 2023 | Allow | 7 | 0 | 0 | No | No |
| 18121026 | COAXIAL FOUR-REFLECTION OPTICAL SYSTEM FOR VISIBLE LIGHT LONG-WAVE INFRARED COMMON-APERTURE IMAGING | March 2023 | April 2025 | Allow | 25 | 0 | 0 | No | No |
| 18245130 | SYSTEMS AND METHODS FOR PERFORMING LASER-INDUCED BREAKDOWN SPECTROSCOPY | March 2023 | May 2025 | Allow | 27 | 1 | 0 | No | No |
| 18172063 | METHOD FOR INSPECTING PROBE MOLECULE | February 2023 | January 2025 | Allow | 23 | 0 | 0 | No | No |
| 18171570 | Method ad Apparatus for Digital Thread Inspection | February 2023 | April 2025 | Allow | 26 | 2 | 1 | No | No |
| 18111187 | FLOW CYTOMETRY SYSTEMS AND METHODS FOR PRESENTING TWO-DIMENSIONAL DOT PLOT | February 2023 | June 2025 | Allow | 28 | 2 | 0 | Yes | No |
| 18110926 | METHOD AND SYSTEM FOR PFAS DETECTION IN WATER SOURCES | February 2023 | June 2025 | Abandon | 28 | 1 | 0 | No | No |
| 18170279 | FIRE DETECTION APPARATUS | February 2023 | October 2024 | Allow | 20 | 2 | 0 | No | No |
| 18104231 | COUPLING MIRROR OF AN OPTICAL INSPECTION SYSTEM | January 2023 | September 2025 | Allow | 32 | 1 | 1 | Yes | No |
| 18161245 | CONCENTRATION MEASURING METHOD OF OPTICALLY ACTIVE SUBSTANCE AND CONCENTRATION MEASURING DEVICE OF OPTICALLY ACTIVE SUBSTANCE | January 2023 | September 2024 | Allow | 20 | 0 | 0 | No | No |
| 18093032 | MONITORING COPPER CORROSION IN AN INTEGRATED CIRCUIT DEVICE | January 2023 | September 2024 | Allow | 20 | 1 | 0 | No | No |
| 18092382 | TIME DOMAIN MULTIPLEXED DEFECT SCANNER | January 2023 | May 2023 | Allow | 4 | 1 | 1 | Yes | No |
| 18092385 | TIME DOMAIN MULTIPLEXED DEFECT SCANNER | January 2023 | April 2024 | Abandon | 16 | 3 | 0 | No | No |
| 18002786 | Projector for Diffuse Illumination and Structured Light | December 2022 | October 2023 | Allow | 10 | 1 | 0 | Yes | No |
| 18080006 | SEMICONDUCTOR INSPECTION TOOL SYSTEM AND METHOD FOR WAFER EDGE INSPECTION | December 2022 | July 2023 | Allow | 7 | 1 | 0 | No | No |
| 18008257 | OPTICAL SIGNAL DETECTION SYSTEM, OPTICAL SIGNAL DETECTION DEVICE, AND OPTICAL SIGNAL DETECTION METHOD | December 2022 | December 2024 | Allow | 24 | 0 | 0 | No | No |
| 17981674 | LOW-COHERENCE INTERFEROMETER WITH SURFACE POWER COMPENSATION | November 2022 | February 2025 | Allow | 27 | 1 | 0 | No | No |
| 17980379 | HIGH ALTITUDE LASER OPTICAL SENSOR | November 2022 | September 2024 | Allow | 22 | 0 | 0 | No | No |
| 17979335 | FLOW ANGLE SENSOR WITH IMAGE SENSOR | November 2022 | June 2025 | Allow | 31 | 2 | 1 | No | No |
| 17973244 | ASSEMBLY AND METHOD FOR SPATIOTEMPORAL CONTROL OF CHEMICAL, BIOLOGICAL, AND BIOCHEMICAL REACTIONS | October 2022 | December 2023 | Allow | 14 | 2 | 0 | No | No |
| 18049414 | COLORIMETRIC APPARATUS | October 2022 | October 2024 | Allow | 24 | 1 | 0 | No | No |
| 17966621 | Methods and Systems of Enhancing Electromagnetic Radiation Signals from Extracellular Vesicles | October 2022 | August 2025 | Allow | 34 | 1 | 1 | No | No |
| 17995271 | SYSTEMS AND METHODS FOR MULTIVIEW SUPER-RESOLUTION MICROSCOPY | September 2022 | November 2025 | Abandon | 38 | 2 | 1 | Yes | No |
| 17956335 | CHAMBERLESS WIDE AREA DUCT SMOKE DETECTOR | September 2022 | January 2025 | Allow | 27 | 2 | 0 | No | No |
| 17912158 | MULTICHANNEL COLOR SENSOR | September 2022 | August 2025 | Allow | 35 | 3 | 0 | No | No |
| 17939768 | DEVICE AND METHOD FOR DETECTING SUBSURFACE DEFECT OF OPTICAL COMPONENT | September 2022 | July 2023 | Allow | 10 | 2 | 0 | No | No |
| 17905417 | SYSTEM AND METHODS FOR ANALYSIS OF A FLUID | September 2022 | November 2024 | Allow | 26 | 1 | 0 | No | No |
| 17908466 | Light Detecting Device and Light Detecting Method | August 2022 | March 2025 | Allow | 30 | 2 | 0 | Yes | No |
| 17895197 | SYSTEM, DEVICE AND METHOD FOR EFFECTIVE DEPLOYMENT OF A DUST ACCUMULATION SENSOR | August 2022 | August 2023 | Allow | 12 | 1 | 0 | No | No |
| 17888277 | METHOD AND APPARATUS FOR DETECTION OF PARTICLE SIZE IN A FLUID | August 2022 | May 2024 | Abandon | 21 | 1 | 0 | Yes | No |
| 17799431 | PRECISION OPTICAL CHAMBER DEVICE, SYSTEM, AND METHOD OF MANUFACTURING SAME | August 2022 | February 2025 | Abandon | 30 | 1 | 0 | No | No |
| 17798377 | OPTICAL COHERENCE TOMOGRAPHY DEVICE | August 2022 | May 2024 | Allow | 22 | 0 | 0 | No | No |
| 17883451 | HIGH-TEMPERATURE CONDENSATION PARTICLE COUNTER | August 2022 | November 2024 | Allow | 27 | 1 | 0 | No | No |
| 17880328 | OPTICAL SENSOR FOR SURFACE INSPECTION AND METROLOGY | August 2022 | May 2023 | Allow | 10 | 1 | 0 | No | No |
| 17880361 | OPTICAL SENSOR FOR SURFACE INSPECTION AND METROLOGY | August 2022 | December 2022 | Allow | 4 | 2 | 0 | No | No |
| 17816916 | OPTICAL SENSOR AND METHOD OF DETECTING AN LED IN SUCH A SENSOR | August 2022 | December 2025 | Allow | 40 | 4 | 0 | No | Yes |
| 17878148 | METHOD AND A DEVICE FOR DETERMINING A DISTANCE TO A TARGET | August 2022 | October 2024 | Allow | 27 | 1 | 0 | No | No |
| 17870745 | SYSTEMS, APPARATUSES AND METHODS FOR CALIBRATING LiDAR SENSORS OF A ROBOT USING INTERSECTING LiDAR SENSORS | July 2022 | March 2025 | Allow | 32 | 1 | 1 | No | No |
| 17867052 | VISUAL INSPECTION DEVICE | July 2022 | January 2024 | Allow | 18 | 1 | 0 | No | No |
| 17812490 | Method And Apparatus For The Application Of Force To A Sample Using Optical Interrogation Technique | July 2022 | December 2023 | Allow | 17 | 1 | 0 | No | No |
| 17811223 | METHOD TO DETERMINE GAS ABSORPTION IN RAPIDLY TUNED DIODE LIDAR | July 2022 | June 2023 | Allow | 11 | 2 | 0 | Yes | No |
| 17758293 | OBSERVATION APPARATUS, OBSERVATION METHOD, AND DISTANCE MEASUREMENT SYSTEM | June 2022 | April 2025 | Abandon | 34 | 2 | 0 | No | No |
| 17853637 | LIDAR WITH PHOTONIC INTEGRATED CIRCUIT | June 2022 | October 2025 | Abandon | 40 | 2 | 0 | No | No |
| 17836199 | OPTICAL ASSEMBLY FOR ALIGNMENT INSPECTION, OPTICAL APPARATUS INCLUDING THE SAME, DIE BONDING SYSTEM AND DIE BONDING METHOD USING THE SAME | June 2022 | April 2025 | Allow | 34 | 1 | 1 | Yes | No |
| 17804811 | 3D TARGET FOR OPTICAL SYSTEM CHARACTERIZATION | May 2022 | September 2024 | Allow | 28 | 0 | 1 | No | No |
| 17777980 | FLOW PATH DEVICE, METHOD FOR MANUFACTURING FLOW PATH DEVICE, FLOW PATH MEASURING DEVICE, AND INSPECTION APPARATUS | May 2022 | April 2024 | Allow | 23 | 0 | 0 | No | No |
| 17777805 | INTEGRATED CHIRPED-GRATING SPECTROMETER-ON-A-CHIP | May 2022 | June 2025 | Allow | 37 | 4 | 0 | No | No |
| 17738178 | SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS | May 2022 | February 2024 | Allow | 22 | 1 | 1 | No | No |
| 17774761 | METHOD OF CALIBRATING COORDINATE POSITION IDENTIFICATION ACCURACY OF LASER SURFACE INSPECTION APPARATUS AND METHOD OF EVALUATING SEMICONDUCTOR WAFER | May 2022 | September 2024 | Allow | 28 | 1 | 0 | Yes | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner TON, TRI T.
With a 30.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 35.7% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner TON, TRI T works in Art Unit 2877 and has examined 1,495 patent applications in our dataset. With an allowance rate of 88.4%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 22 months.
Examiner TON, TRI T's allowance rate of 88.4% places them in the 69% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by TON, TRI T receive 1.32 office actions before reaching final disposition. This places the examiner in the 19% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by TON, TRI T is 22 months. This places the examiner in the 89% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +10.1% benefit to allowance rate for applications examined by TON, TRI T. This interview benefit is in the 43% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 38.8% of applications are subsequently allowed. This success rate is in the 89% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 48.8% of cases where such amendments are filed. This entry rate is in the 73% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 121.7% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 83% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 76.7% of appeals filed. This is in the 68% percentile among all examiners. Of these withdrawals, 57.6% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.
When applicants file petitions regarding this examiner's actions, 67.9% are granted (fully or in part). This grant rate is in the 75% percentile among all examiners. Strategic Note: Petitions are frequently granted regarding this examiner's actions compared to other examiners. Per MPEP § 1002.02(c), various examiner actions are petitionable to the Technology Center Director, including prematureness of final rejection, refusal to enter amendments, and requirement for information. If you believe an examiner action is improper, consider filing a petition.
Examiner's Amendments: This examiner makes examiner's amendments in 4.5% of allowed cases (in the 84% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 17.9% of allowed cases (in the 93% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.