USPTO Examiner COOK JONATHON - Art Unit 2877

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18673052DEVICE AND METHOD FOR MEASURING WAFERSMay 2024December 2024Allow710YesNo
18588108HYBRID OPTICAL SYSTEMFebruary 2024March 2025Allow1310NoNo
18402383Method and System for Determining the Location of Artefacts and/or Inclusions in a Gemstone, Mineral, or Sample ThereofJanuary 2024April 2025Allow1510NoNo
18452350AXIAL LENGTH MEASUREMENT MONITORAugust 2023April 2025Abandon2020NoNo
18350109METHODS AND APPARATUS FOR OFDR INTERROGATOR MONITORING AND OPTIMIZATIONJuly 2023March 2025Allow2110YesNo
18132799Contamination Load Sensing DeviceApril 2023May 2025Abandon2520NoNo
18188967METHOD AND SYSTEM FOR DETECTING DYNAMIC STRAINMarch 2023September 2024Allow1810NoNo
18120698Apparatus For Optical Coherence TomographyMarch 2023January 2024Allow1110NoNo
18182951MEASUREMENT APPARATUS AND ANALYSIS METHODMarch 2023May 2025Allow2720YesNo
18181908POLYMER BASED PHOTOVOLTAIC MODULES WITH EMBEDDED OPTICAL SENSORSMarch 2023March 2025Allow2410NoNo
18115395FOREIGN METALLIC PARTICLE DETECTOR SYSTEMS AND METHODS OF DETECTING FOREIGN METALLIC PARTICLESFebruary 2023June 2025Allow2820YesNo
18022307APPARATUS AND METHOD FOR LIGHT SHEET IMAGING WITH OPTICAL COHERENCE GATINGFebruary 2023June 2025Allow2800NoNo
18171438AUTOMATED CONTROL OF CELL CULTURE USING RAMAN SPECTROSCOPYFebruary 2023March 2025Allow2530NoNo
18021376OPTICAL ANALYSIS SYSTEM AND CONTROL METHOD OF OPTICAL ANALYSIS SYSTEMFebruary 2023March 2025Allow2510NoNo
18018843SAMPLE OBSERVATION APPARATUSJanuary 2023March 2025Allow2610YesNo
18082552FAST MEASUREMENT METHOD FOR MICRO-NANO DEEP GROOVE STRUCTURE BASED ON WHITE LIGHT INTERFERENCEDecember 2022June 2023Allow600NoNo
18001772SYSTEM INCLUDING AUTO-ALIGNMENTDecember 2022October 2023Allow1120NoNo
18072838SYSTEM AND METHOD FOR MEASURING INTRAOCULAR PRESSURE AND OCULAR TISSUE BIOMECHANICAL PROPERTIESDecember 2022March 2024Allow1510NoNo
18056015OPTICAL SYSTEMNovember 2022March 2025Allow2820YesNo
17925415Angle Measurement Device and MethodNovember 2022October 2024Allow2300NoNo
17998828FILTER LIFE CONDITION ASSESSMENT THROUGH OPTICAL ABSORBANCENovember 2022January 2025Abandon2610NoNo
17998760SYSTEM AND METHOD FOR DETERMINING A CONCENTRATION OF A GAS IN A CONTAINERNovember 2022March 2025Allow2810NoNo
17924237DEFECT INSPECTION APPARATUSNovember 2022January 2025Allow2610NoNo
17923777ALIGNMENT OF A MEASUREMENT OPTICAL SYSTEM AND A SAMPLE UNDER TESTNovember 2022July 2023Allow811NoNo
17997805OPTICAL MEASUREMENT DEVICE AND WATER QUALITY ANALYSIS SYSTEMNovember 2022January 2025Allow2610NoNo
17922578DEVICE FOR DETECTING AND ANALYTE IN SAMPLEOctober 2022February 2025Abandon2810NoNo
17922171Defect Inspection Apparatus and Defect Inspection MethodOctober 2022June 2025Allow3221NoNo
17973590DEVICE AND METHOD FOR MEASURING TOOLSOctober 2022December 2024Allow2610NoNo
17920528METHODS AND APPARATUS FOR MEASURING A FEATURE OF GLASS-BASED SUBSTRATEOctober 2022January 2025Allow2720NoNo
17918426CONTAMINANT IDENTIFICATION METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND METHODS THEREOFOctober 2022April 2025Allow3020YesNo
17936263AXIAL LENGTH MEASUREMENT MONITORSeptember 2022May 2023Allow810YesNo
17935696FLOW CYTOMETERSeptember 2022February 2025Allow3710YesNo
17914616Measurement Device and Measurement Method for Measuring Roundness of Coating Roll for Manufacturing BatterySeptember 2022December 2024Allow2710NoNo
17946927DEFLECTOMETRY DEVICE FOR DIFFERENTIAL METROLOGY OF MATERIAL REMOVALSeptember 2022June 2025Abandon3320NoNo
17903444SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND STORAGE MEDIUMSeptember 2022June 2025Allow3430YesNo
17897905METHODS AND SYSTEMS FOR CHARACTERIZING LASER MACHINING PROPERTIES BY MEASURING KEYHOLE DYNAMICS USING INTERFEROMETRYAugust 2022November 2024Allow2720NoNo
17883724DIAGNOSIS METHOD USING LASER INDUCED BREAKDOWN SPECTROSCOPY AND DIAGNOSIS DEVICE PERFORMING THE SAMEAugust 2022September 2023Allow1310NoNo
178784153D PROFILOMETRY WITH A LINNIK INTERFEROMETERAugust 2022April 2025Allow3211NoNo
17759851LIGHT-SHEET PHOTONIC-FORCE OPTICAL COHERENCE ELASTOGRAPHYJuly 2022October 2023Allow1420NoNo
17759738METHODS AND SYSTEMS FOR NON-DESTRUCTIVE ESTIMATION OF SCATTERING PARTICLE SIZEJuly 2022March 2025Allow3211NoNo
17875858BIOSENSOR DEVICEJuly 2022September 2024Allow2610NoNo
17871795Noise Reduction in Time-Gated SpectroscopyJuly 2022October 2023Abandon1410NoNo
17869846INTERFEROMETRIC LENS ALIGNER AND METHODJuly 2022March 2025Allow3231NoNo
17758796INFRARED ABSORPTION-BASED COMPOSITION SENSOR FOR FLUID MIXTURESJuly 2022December 2024Allow2920YesNo
17790221METHOD AND SYSTEM FOR RETRIEVING AN OPTICAL PARAMETER OF AN OPHTHALMIC LENSJune 2022June 2025Allow3630NoNo
17757253METHOD FOR DETERMINING FILM THICKNESS, METHOD FOR PRODUCING A FILM AND DEVICE FOR PRODUCING A FILMJune 2022January 2025Allow3120NoNo
17782025DEVICES AND METHODS FOR LINE-SCANNING MICROSCOPYJune 2022January 2023Allow710NoNo
17826821DEVICE AND METHOD FOR INSPECTING AIR VOID AT LEAD FILM OF BATTERYMay 2022October 2023Allow1600NoNo
17826096METHOD FOR INVESTIGATING AN ELECTROLYTE SOLUTION FOR PROCESSING A COMPONENT MATERIAL OF AN AIRCRAFT ENGINEMay 2022April 2025Allow3420NoNo
17825718DETECTION AIDED TWO-STAGE PHASE UNWRAPPING ON PATTERN WAFER GEOMETRY MEASUREMENTMay 2022December 2022Allow600NoNo
17780286RAMAN SPECTROMETERMay 2022January 2025Abandon3210NoNo
17749338SURFACE PROFILE INSPECTION METHODS AND SYSTEMSMay 2022February 2024Allow2110NoNo
17715573OPHTHALMIC INTRAOPERATIVE IMAGING SYSTEM USING OPTICAL COHERENCE TOMOGRAPHY LIGHT PIPEApril 2022February 2024Abandon2210NoNo
17754423A SENSOR DEVICE AND METHOD FOR DETECTION OF A COMPONENT IN A FLUIDMarch 2022September 2024Abandon3010NoNo
17764379METHOD FOR MEASURING WAFER PROFILEMarch 2022September 2024Allow3010NoNo
17433776METHOD FOR CONTROLLING A SEMICONDUCTOR-LASER-DIODE-BASED SS- INTERFEROMETER SYSTEMMarch 2022March 2025Allow4320YesNo
17762712OPTICAL SYSTEM AND INTERFERENCE OBJECTIVE MODULE THEROFMarch 2022January 2025Allow3420YesNo
17653163SPECTRAL MEASUREMENT METHOD, SPECTRAL MEASUREMENT SYSTEM, AND BROADBAND PULSED LIGHT SOURCE UNITMarch 2022March 2025Allow3610NoNo
17677156COMPACT OCT SPECTROMETER SUITABLE FOR MOBILE ENVIRONMENTFebruary 2022September 2023Allow1810NoNo
17669823TOMOGRAPHIC IMAGING SYSTEM FOR TRANSPARENT MATERIAL COMPOSITE THIN FILMFebruary 2022October 2023Allow2010NoNo
17629757INSPECTION DEVICEJanuary 2022October 2024Allow3311NoNo
17574968Digital Holographic Tomography Turbulence MeasurementsJanuary 2022January 2024Allow2420NoNo
17647585AXIAL LENGTH MEASUREMENT MONITORJanuary 2022August 2022Allow710YesNo
17569865OCT DEVICEJanuary 2022August 2023Abandon2010NoNo
17645089MEASURING APPARATUSDecember 2021September 2023Allow2110YesNo
17549767SYSTEM ARCHITECTURE FOR INTEGRATED PHOTONICS OPTICAL GYROSCOPESDecember 2021September 2022Allow910NoNo
17546084OPTICAL COHERENCE TOMOGRAPHY APPARATUS, CONTROL METHOD FOR OPTICAL COHERENCE TOMOGRAPHY APPARATUS, AND COMPUTER-READABLE STORAGE MEDIUMDecember 2021September 2023Allow2110NoNo
17522245OPTICAL COHERENCE TOMOGRAPHY WITH DISPERSED STRUCTURED ILLUMINATIONNovember 2021March 2023Allow1610NoNo
17518954DISPLACEMENT SENSOR AND PROFILE MEASUREMENT APPARATUSNovember 2021March 2023Allow1610NoNo
17517452SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METROLOGYNovember 2021June 2023Allow2010YesNo
17605946APPARATUS, SYSTEMS AND METHODS FOR DETECTING LIGHTOctober 2021April 2024Allow3010NoNo
17603487ABSOLUTE LINEAR-IN-K SPECTROMETEROctober 2021May 2024Allow3110NoNo
17449715FTIR Spectrometer with cut-off filter for hydrogen sulfide detectionOctober 2021April 2023Allow1910NoNo
17593470METHOD FOR DETECTING ABNORMAL GROWTH OF GRAPHENE, MEASUREMENT APPARATUS, AND FILM FORMATION SYSTEMSeptember 2021March 2024Allow3010NoNo
17472047APPARATUS AND METHOD FOR DETECTING WAVEFRONT ABERRATION OF OBJECTIVE LENSSeptember 2021January 2023Allow1710NoNo
17437633PRODUCT-INSPECTION APPARATUS, PRODUCT-INSPECTION METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUMSeptember 2021January 2025Abandon4020NoNo
17282641METHOD FOR COMPENSATING THE ARTIFACTS GENERATED BY MOVING MEASUREMENT OBJECTS IN MEASUREMENT SIGNALS OF SWEPT-SOURCE OCT SYSTEMSSeptember 2021January 2025Allow4611NoNo
17464380STIMULATED RAMAN SPECTROSCOPY BASED MULTIPLEXED VIRTUAL IMMUNOHISTOLOGY USING ALKYNIC, NITRILE, OR AZIDE PROBESSeptember 2021February 2024Abandon2920NoNo
17433601PARTICLE SEPARATING AND MEASURING DEVICE AND PARTICLE SEPARATING AND MEASURING APPARATUSAugust 2021January 2025Abandon4120NoNo
17408976RAMAN SPECTROSCOPY-BASED OPTICAL MATCHED FILTER SYSTEM AND METHOD FOR USING THE SAMEAugust 2021March 2023Allow1910NoNo
17432759FLOW PATH DEVICE, AND TESTING DEVICE AND TESTING METHOD USING SAMEAugust 2021April 2025Allow4420NoNo
17432241Shape Sensing System And Method For Anthropomorphic Test DevicesAugust 2021March 2024Allow3110NoNo
17431327OPTICAL MEASUREMENT DEVICE AND MULTIPLE MIRRORAugust 2021November 2024Allow3921NoNo
17402571Cavity Enhanced Absorption Spectroscopy using a piecewise tunable laser and hierarchical wavelength determinationAugust 2021December 2024Allow4030YesNo
17401750Single Cell Grey Scatterometry Overlay Targets and Their Measurement Using Varying Illumination Parameter(s)August 2021September 2023Abandon2520NoNo
17400486DEVICE AND METHOD FOR CHARACTERIZING THE SURFACE SHAPE OF A TEST OBJECTAugust 2021September 2023Allow2510NoNo
17395299DETECTOR OR PHOTOMULTIPLIER TUBE (PMT) GAIN CONTROL OVER TIMEAugust 2021March 2025Allow4321YesNo
17426325OPTICAL MODULE, SIGNAL PROCESSING SYSTEM, AND SIGNAL PROCESSING METHODJuly 2021October 2023Allow2610NoNo
17380551CALIBRATION METHODJuly 2021October 2022Allow1400NoNo
17379616SYSTEMS AND METHODS FOR SPECTRAL PROCESSING IMPROVEMENTS IN SPATIAL HETERODYNE SPECTROSCOPYJuly 2021June 2022Allow1100NoNo
17421558AUTOMATED INSTRUMENT-TRACKING AND ADAPTIVE IMAGE SAMPLINGJuly 2021March 2024Allow3210NoNo
17420152HYBRID OPTICAL SYSTEMJuly 2021November 2023Allow2910NoNo
17365592HYPERSPECTRAL IMAGING (HSI) APPARATUS AND INSPECTION APPARATUS INCLUDING THE SAMEJuly 2021November 2023Allow2820YesNo
17419375WAVEGUIDE INTEGRATION WITH OPTICAL COUPLING STRUCTURES ON LIGHT DETECTION DEVICEJune 2021June 2024Allow3510NoNo
17356781APPARATUS, SYSTEMS AND METHODS FOR COMPRESSIVE SENSINGJune 2021April 2023Abandon2110NoNo
17354241DETECTING AND GUIDING OPTICAL CONNECTION(S) FOR ONE OR MORE IMAGING MODALITIES, SUCH AS IN OPTICAL COHERENCE TOMOGRAPHYJune 2021November 2023Allow2911YesNo
17351906APPARATUS, METHOD AND STORAGE MEDIUM FOR LUMEN CURVE SIMPLIFICATION FOR EDITING IN ONE OR MORE IMAGES, SUCH AS IN OPTICAL COHERENCE TOMOGRAPHY IMAGESJune 2021June 2023Allow2420NoNo
17416173APPARATUS, METHODS, AND COMPUTER PROGRAMS FOR OBTAINING AN IMAGE OF A SAMPLEJune 2021October 2023Allow2810NoNo
17413133OPTICAL COHERENCE TOMOGRAPHY DEVICEJune 2021July 2024Abandon3720NoNo
17303286Cost-Effective Line-Scan Optical Coherence Tomography ApparatusMay 2021December 2022Allow1910NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner COOK, JONATHON.

Strategic Value of Filing an Appeal

Total Appeal Filings
1
Allowed After Appeal Filing
0
(0.0%)
Not Allowed After Appeal Filing
1
(100.0%)
Filing Benefit Percentile
5.8%
Lower than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 0.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the bottom 25% across the USPTO, indicating that filing appeals is less effective here than in most other areas.

Strategic Recommendations

Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.

Examiner COOK, JONATHON - Prosecution Strategy Guide

Executive Summary

Examiner COOK, JONATHON works in Art Unit 2877 and has examined 264 patent applications in our dataset. With an allowance rate of 91.7%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 28 months.

Allowance Patterns

Examiner COOK, JONATHON's allowance rate of 91.7% places them in the 76% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by COOK, JONATHON receive 1.31 office actions before reaching final disposition. This places the examiner in the 25% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by COOK, JONATHON is 28 months. This places the examiner in the 53% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +8.4% benefit to allowance rate for applications examined by COOK, JONATHON. This interview benefit is in the 41% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 44.0% of applications are subsequently allowed. This success rate is in the 95% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 60.9% of cases where such amendments are filed. This entry rate is in the 83% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 94% percentile among all examiners. Of these withdrawals, 100.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.

Petition Practice

When applicants file petitions regarding this examiner's actions, 22.2% are granted (fully or in part). This grant rate is in the 13% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 8.7% of allowed cases (in the 95% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 2.5% of allowed cases (in the 68% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.
  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.
  • Appeal filing as negotiation tool: This examiner frequently reconsiders rejections during the appeal process. Filing a Notice of Appeal may prompt favorable reconsideration during the mandatory appeal conference.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.