Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18673052 | DEVICE AND METHOD FOR MEASURING WAFERS | May 2024 | December 2024 | Allow | 7 | 1 | 0 | Yes | No |
| 18588108 | HYBRID OPTICAL SYSTEM | February 2024 | March 2025 | Allow | 13 | 1 | 0 | No | No |
| 18402383 | Method and System for Determining the Location of Artefacts and/or Inclusions in a Gemstone, Mineral, or Sample Thereof | January 2024 | April 2025 | Allow | 15 | 1 | 0 | No | No |
| 18452350 | AXIAL LENGTH MEASUREMENT MONITOR | August 2023 | April 2025 | Abandon | 20 | 2 | 0 | No | No |
| 18350109 | METHODS AND APPARATUS FOR OFDR INTERROGATOR MONITORING AND OPTIMIZATION | July 2023 | March 2025 | Allow | 21 | 1 | 0 | Yes | No |
| 18132799 | Contamination Load Sensing Device | April 2023 | May 2025 | Abandon | 25 | 2 | 0 | No | No |
| 18188967 | METHOD AND SYSTEM FOR DETECTING DYNAMIC STRAIN | March 2023 | September 2024 | Allow | 18 | 1 | 0 | No | No |
| 18120698 | Apparatus For Optical Coherence Tomography | March 2023 | January 2024 | Allow | 11 | 1 | 0 | No | No |
| 18182951 | MEASUREMENT APPARATUS AND ANALYSIS METHOD | March 2023 | May 2025 | Allow | 27 | 2 | 0 | Yes | No |
| 18181908 | POLYMER BASED PHOTOVOLTAIC MODULES WITH EMBEDDED OPTICAL SENSORS | March 2023 | March 2025 | Allow | 24 | 1 | 0 | No | No |
| 18115395 | FOREIGN METALLIC PARTICLE DETECTOR SYSTEMS AND METHODS OF DETECTING FOREIGN METALLIC PARTICLES | February 2023 | June 2025 | Allow | 28 | 2 | 0 | Yes | No |
| 18022307 | APPARATUS AND METHOD FOR LIGHT SHEET IMAGING WITH OPTICAL COHERENCE GATING | February 2023 | June 2025 | Allow | 28 | 0 | 0 | No | No |
| 18171438 | AUTOMATED CONTROL OF CELL CULTURE USING RAMAN SPECTROSCOPY | February 2023 | March 2025 | Allow | 25 | 3 | 0 | No | No |
| 18021376 | OPTICAL ANALYSIS SYSTEM AND CONTROL METHOD OF OPTICAL ANALYSIS SYSTEM | February 2023 | March 2025 | Allow | 25 | 1 | 0 | No | No |
| 18018843 | SAMPLE OBSERVATION APPARATUS | January 2023 | March 2025 | Allow | 26 | 1 | 0 | Yes | No |
| 18082552 | FAST MEASUREMENT METHOD FOR MICRO-NANO DEEP GROOVE STRUCTURE BASED ON WHITE LIGHT INTERFERENCE | December 2022 | June 2023 | Allow | 6 | 0 | 0 | No | No |
| 18001772 | SYSTEM INCLUDING AUTO-ALIGNMENT | December 2022 | October 2023 | Allow | 11 | 2 | 0 | No | No |
| 18072838 | SYSTEM AND METHOD FOR MEASURING INTRAOCULAR PRESSURE AND OCULAR TISSUE BIOMECHANICAL PROPERTIES | December 2022 | March 2024 | Allow | 15 | 1 | 0 | No | No |
| 18056015 | OPTICAL SYSTEM | November 2022 | March 2025 | Allow | 28 | 2 | 0 | Yes | No |
| 17925415 | Angle Measurement Device and Method | November 2022 | October 2024 | Allow | 23 | 0 | 0 | No | No |
| 17998828 | FILTER LIFE CONDITION ASSESSMENT THROUGH OPTICAL ABSORBANCE | November 2022 | January 2025 | Abandon | 26 | 1 | 0 | No | No |
| 17998760 | SYSTEM AND METHOD FOR DETERMINING A CONCENTRATION OF A GAS IN A CONTAINER | November 2022 | March 2025 | Allow | 28 | 1 | 0 | No | No |
| 17924237 | DEFECT INSPECTION APPARATUS | November 2022 | January 2025 | Allow | 26 | 1 | 0 | No | No |
| 17923777 | ALIGNMENT OF A MEASUREMENT OPTICAL SYSTEM AND A SAMPLE UNDER TEST | November 2022 | July 2023 | Allow | 8 | 1 | 1 | No | No |
| 17997805 | OPTICAL MEASUREMENT DEVICE AND WATER QUALITY ANALYSIS SYSTEM | November 2022 | January 2025 | Allow | 26 | 1 | 0 | No | No |
| 17922578 | DEVICE FOR DETECTING AND ANALYTE IN SAMPLE | October 2022 | February 2025 | Abandon | 28 | 1 | 0 | No | No |
| 17922171 | Defect Inspection Apparatus and Defect Inspection Method | October 2022 | June 2025 | Allow | 32 | 2 | 1 | No | No |
| 17973590 | DEVICE AND METHOD FOR MEASURING TOOLS | October 2022 | December 2024 | Allow | 26 | 1 | 0 | No | No |
| 17920528 | METHODS AND APPARATUS FOR MEASURING A FEATURE OF GLASS-BASED SUBSTRATE | October 2022 | January 2025 | Allow | 27 | 2 | 0 | No | No |
| 17918426 | CONTAMINANT IDENTIFICATION METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND METHODS THEREOF | October 2022 | April 2025 | Allow | 30 | 2 | 0 | Yes | No |
| 17936263 | AXIAL LENGTH MEASUREMENT MONITOR | September 2022 | May 2023 | Allow | 8 | 1 | 0 | Yes | No |
| 17935696 | FLOW CYTOMETER | September 2022 | February 2025 | Allow | 37 | 1 | 0 | Yes | No |
| 17914616 | Measurement Device and Measurement Method for Measuring Roundness of Coating Roll for Manufacturing Battery | September 2022 | December 2024 | Allow | 27 | 1 | 0 | No | No |
| 17946927 | DEFLECTOMETRY DEVICE FOR DIFFERENTIAL METROLOGY OF MATERIAL REMOVAL | September 2022 | June 2025 | Abandon | 33 | 2 | 0 | No | No |
| 17903444 | SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND STORAGE MEDIUM | September 2022 | June 2025 | Allow | 34 | 3 | 0 | Yes | No |
| 17897905 | METHODS AND SYSTEMS FOR CHARACTERIZING LASER MACHINING PROPERTIES BY MEASURING KEYHOLE DYNAMICS USING INTERFEROMETRY | August 2022 | November 2024 | Allow | 27 | 2 | 0 | No | No |
| 17883724 | DIAGNOSIS METHOD USING LASER INDUCED BREAKDOWN SPECTROSCOPY AND DIAGNOSIS DEVICE PERFORMING THE SAME | August 2022 | September 2023 | Allow | 13 | 1 | 0 | No | No |
| 17878415 | 3D PROFILOMETRY WITH A LINNIK INTERFEROMETER | August 2022 | April 2025 | Allow | 32 | 1 | 1 | No | No |
| 17759851 | LIGHT-SHEET PHOTONIC-FORCE OPTICAL COHERENCE ELASTOGRAPHY | July 2022 | October 2023 | Allow | 14 | 2 | 0 | No | No |
| 17759738 | METHODS AND SYSTEMS FOR NON-DESTRUCTIVE ESTIMATION OF SCATTERING PARTICLE SIZE | July 2022 | March 2025 | Allow | 32 | 1 | 1 | No | No |
| 17875858 | BIOSENSOR DEVICE | July 2022 | September 2024 | Allow | 26 | 1 | 0 | No | No |
| 17871795 | Noise Reduction in Time-Gated Spectroscopy | July 2022 | October 2023 | Abandon | 14 | 1 | 0 | No | No |
| 17869846 | INTERFEROMETRIC LENS ALIGNER AND METHOD | July 2022 | March 2025 | Allow | 32 | 3 | 1 | No | No |
| 17758796 | INFRARED ABSORPTION-BASED COMPOSITION SENSOR FOR FLUID MIXTURES | July 2022 | December 2024 | Allow | 29 | 2 | 0 | Yes | No |
| 17790221 | METHOD AND SYSTEM FOR RETRIEVING AN OPTICAL PARAMETER OF AN OPHTHALMIC LENS | June 2022 | June 2025 | Allow | 36 | 3 | 0 | No | No |
| 17757253 | METHOD FOR DETERMINING FILM THICKNESS, METHOD FOR PRODUCING A FILM AND DEVICE FOR PRODUCING A FILM | June 2022 | January 2025 | Allow | 31 | 2 | 0 | No | No |
| 17782025 | DEVICES AND METHODS FOR LINE-SCANNING MICROSCOPY | June 2022 | January 2023 | Allow | 7 | 1 | 0 | No | No |
| 17826821 | DEVICE AND METHOD FOR INSPECTING AIR VOID AT LEAD FILM OF BATTERY | May 2022 | October 2023 | Allow | 16 | 0 | 0 | No | No |
| 17826096 | METHOD FOR INVESTIGATING AN ELECTROLYTE SOLUTION FOR PROCESSING A COMPONENT MATERIAL OF AN AIRCRAFT ENGINE | May 2022 | April 2025 | Allow | 34 | 2 | 0 | No | No |
| 17825718 | DETECTION AIDED TWO-STAGE PHASE UNWRAPPING ON PATTERN WAFER GEOMETRY MEASUREMENT | May 2022 | December 2022 | Allow | 6 | 0 | 0 | No | No |
| 17780286 | RAMAN SPECTROMETER | May 2022 | January 2025 | Abandon | 32 | 1 | 0 | No | No |
| 17749338 | SURFACE PROFILE INSPECTION METHODS AND SYSTEMS | May 2022 | February 2024 | Allow | 21 | 1 | 0 | No | No |
| 17715573 | OPHTHALMIC INTRAOPERATIVE IMAGING SYSTEM USING OPTICAL COHERENCE TOMOGRAPHY LIGHT PIPE | April 2022 | February 2024 | Abandon | 22 | 1 | 0 | No | No |
| 17754423 | A SENSOR DEVICE AND METHOD FOR DETECTION OF A COMPONENT IN A FLUID | March 2022 | September 2024 | Abandon | 30 | 1 | 0 | No | No |
| 17764379 | METHOD FOR MEASURING WAFER PROFILE | March 2022 | September 2024 | Allow | 30 | 1 | 0 | No | No |
| 17433776 | METHOD FOR CONTROLLING A SEMICONDUCTOR-LASER-DIODE-BASED SS- INTERFEROMETER SYSTEM | March 2022 | March 2025 | Allow | 43 | 2 | 0 | Yes | No |
| 17762712 | OPTICAL SYSTEM AND INTERFERENCE OBJECTIVE MODULE THEROF | March 2022 | January 2025 | Allow | 34 | 2 | 0 | Yes | No |
| 17653163 | SPECTRAL MEASUREMENT METHOD, SPECTRAL MEASUREMENT SYSTEM, AND BROADBAND PULSED LIGHT SOURCE UNIT | March 2022 | March 2025 | Allow | 36 | 1 | 0 | No | No |
| 17677156 | COMPACT OCT SPECTROMETER SUITABLE FOR MOBILE ENVIRONMENT | February 2022 | September 2023 | Allow | 18 | 1 | 0 | No | No |
| 17669823 | TOMOGRAPHIC IMAGING SYSTEM FOR TRANSPARENT MATERIAL COMPOSITE THIN FILM | February 2022 | October 2023 | Allow | 20 | 1 | 0 | No | No |
| 17629757 | INSPECTION DEVICE | January 2022 | October 2024 | Allow | 33 | 1 | 1 | No | No |
| 17574968 | Digital Holographic Tomography Turbulence Measurements | January 2022 | January 2024 | Allow | 24 | 2 | 0 | No | No |
| 17647585 | AXIAL LENGTH MEASUREMENT MONITOR | January 2022 | August 2022 | Allow | 7 | 1 | 0 | Yes | No |
| 17569865 | OCT DEVICE | January 2022 | August 2023 | Abandon | 20 | 1 | 0 | No | No |
| 17645089 | MEASURING APPARATUS | December 2021 | September 2023 | Allow | 21 | 1 | 0 | Yes | No |
| 17549767 | SYSTEM ARCHITECTURE FOR INTEGRATED PHOTONICS OPTICAL GYROSCOPES | December 2021 | September 2022 | Allow | 9 | 1 | 0 | No | No |
| 17546084 | OPTICAL COHERENCE TOMOGRAPHY APPARATUS, CONTROL METHOD FOR OPTICAL COHERENCE TOMOGRAPHY APPARATUS, AND COMPUTER-READABLE STORAGE MEDIUM | December 2021 | September 2023 | Allow | 21 | 1 | 0 | No | No |
| 17522245 | OPTICAL COHERENCE TOMOGRAPHY WITH DISPERSED STRUCTURED ILLUMINATION | November 2021 | March 2023 | Allow | 16 | 1 | 0 | No | No |
| 17518954 | DISPLACEMENT SENSOR AND PROFILE MEASUREMENT APPARATUS | November 2021 | March 2023 | Allow | 16 | 1 | 0 | No | No |
| 17517452 | SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METROLOGY | November 2021 | June 2023 | Allow | 20 | 1 | 0 | Yes | No |
| 17605946 | APPARATUS, SYSTEMS AND METHODS FOR DETECTING LIGHT | October 2021 | April 2024 | Allow | 30 | 1 | 0 | No | No |
| 17603487 | ABSOLUTE LINEAR-IN-K SPECTROMETER | October 2021 | May 2024 | Allow | 31 | 1 | 0 | No | No |
| 17449715 | FTIR Spectrometer with cut-off filter for hydrogen sulfide detection | October 2021 | April 2023 | Allow | 19 | 1 | 0 | No | No |
| 17593470 | METHOD FOR DETECTING ABNORMAL GROWTH OF GRAPHENE, MEASUREMENT APPARATUS, AND FILM FORMATION SYSTEM | September 2021 | March 2024 | Allow | 30 | 1 | 0 | No | No |
| 17472047 | APPARATUS AND METHOD FOR DETECTING WAVEFRONT ABERRATION OF OBJECTIVE LENS | September 2021 | January 2023 | Allow | 17 | 1 | 0 | No | No |
| 17437633 | PRODUCT-INSPECTION APPARATUS, PRODUCT-INSPECTION METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM | September 2021 | January 2025 | Abandon | 40 | 2 | 0 | No | No |
| 17282641 | METHOD FOR COMPENSATING THE ARTIFACTS GENERATED BY MOVING MEASUREMENT OBJECTS IN MEASUREMENT SIGNALS OF SWEPT-SOURCE OCT SYSTEMS | September 2021 | January 2025 | Allow | 46 | 1 | 1 | No | No |
| 17464380 | STIMULATED RAMAN SPECTROSCOPY BASED MULTIPLEXED VIRTUAL IMMUNOHISTOLOGY USING ALKYNIC, NITRILE, OR AZIDE PROBES | September 2021 | February 2024 | Abandon | 29 | 2 | 0 | No | No |
| 17433601 | PARTICLE SEPARATING AND MEASURING DEVICE AND PARTICLE SEPARATING AND MEASURING APPARATUS | August 2021 | January 2025 | Abandon | 41 | 2 | 0 | No | No |
| 17408976 | RAMAN SPECTROSCOPY-BASED OPTICAL MATCHED FILTER SYSTEM AND METHOD FOR USING THE SAME | August 2021 | March 2023 | Allow | 19 | 1 | 0 | No | No |
| 17432759 | FLOW PATH DEVICE, AND TESTING DEVICE AND TESTING METHOD USING SAME | August 2021 | April 2025 | Allow | 44 | 2 | 0 | No | No |
| 17432241 | Shape Sensing System And Method For Anthropomorphic Test Devices | August 2021 | March 2024 | Allow | 31 | 1 | 0 | No | No |
| 17431327 | OPTICAL MEASUREMENT DEVICE AND MULTIPLE MIRROR | August 2021 | November 2024 | Allow | 39 | 2 | 1 | No | No |
| 17402571 | Cavity Enhanced Absorption Spectroscopy using a piecewise tunable laser and hierarchical wavelength determination | August 2021 | December 2024 | Allow | 40 | 3 | 0 | Yes | No |
| 17401750 | Single Cell Grey Scatterometry Overlay Targets and Their Measurement Using Varying Illumination Parameter(s) | August 2021 | September 2023 | Abandon | 25 | 2 | 0 | No | No |
| 17400486 | DEVICE AND METHOD FOR CHARACTERIZING THE SURFACE SHAPE OF A TEST OBJECT | August 2021 | September 2023 | Allow | 25 | 1 | 0 | No | No |
| 17395299 | DETECTOR OR PHOTOMULTIPLIER TUBE (PMT) GAIN CONTROL OVER TIME | August 2021 | March 2025 | Allow | 43 | 2 | 1 | Yes | No |
| 17426325 | OPTICAL MODULE, SIGNAL PROCESSING SYSTEM, AND SIGNAL PROCESSING METHOD | July 2021 | October 2023 | Allow | 26 | 1 | 0 | No | No |
| 17380551 | CALIBRATION METHOD | July 2021 | October 2022 | Allow | 14 | 0 | 0 | No | No |
| 17379616 | SYSTEMS AND METHODS FOR SPECTRAL PROCESSING IMPROVEMENTS IN SPATIAL HETERODYNE SPECTROSCOPY | July 2021 | June 2022 | Allow | 11 | 0 | 0 | No | No |
| 17421558 | AUTOMATED INSTRUMENT-TRACKING AND ADAPTIVE IMAGE SAMPLING | July 2021 | March 2024 | Allow | 32 | 1 | 0 | No | No |
| 17420152 | HYBRID OPTICAL SYSTEM | July 2021 | November 2023 | Allow | 29 | 1 | 0 | No | No |
| 17365592 | HYPERSPECTRAL IMAGING (HSI) APPARATUS AND INSPECTION APPARATUS INCLUDING THE SAME | July 2021 | November 2023 | Allow | 28 | 2 | 0 | Yes | No |
| 17419375 | WAVEGUIDE INTEGRATION WITH OPTICAL COUPLING STRUCTURES ON LIGHT DETECTION DEVICE | June 2021 | June 2024 | Allow | 35 | 1 | 0 | No | No |
| 17356781 | APPARATUS, SYSTEMS AND METHODS FOR COMPRESSIVE SENSING | June 2021 | April 2023 | Abandon | 21 | 1 | 0 | No | No |
| 17354241 | DETECTING AND GUIDING OPTICAL CONNECTION(S) FOR ONE OR MORE IMAGING MODALITIES, SUCH AS IN OPTICAL COHERENCE TOMOGRAPHY | June 2021 | November 2023 | Allow | 29 | 1 | 1 | Yes | No |
| 17351906 | APPARATUS, METHOD AND STORAGE MEDIUM FOR LUMEN CURVE SIMPLIFICATION FOR EDITING IN ONE OR MORE IMAGES, SUCH AS IN OPTICAL COHERENCE TOMOGRAPHY IMAGES | June 2021 | June 2023 | Allow | 24 | 2 | 0 | No | No |
| 17416173 | APPARATUS, METHODS, AND COMPUTER PROGRAMS FOR OBTAINING AN IMAGE OF A SAMPLE | June 2021 | October 2023 | Allow | 28 | 1 | 0 | No | No |
| 17413133 | OPTICAL COHERENCE TOMOGRAPHY DEVICE | June 2021 | July 2024 | Abandon | 37 | 2 | 0 | No | No |
| 17303286 | Cost-Effective Line-Scan Optical Coherence Tomography Apparatus | May 2021 | December 2022 | Allow | 19 | 1 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner COOK, JONATHON.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 0.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the bottom 25% across the USPTO, indicating that filing appeals is less effective here than in most other areas.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner COOK, JONATHON works in Art Unit 2877 and has examined 264 patent applications in our dataset. With an allowance rate of 91.7%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 28 months.
Examiner COOK, JONATHON's allowance rate of 91.7% places them in the 76% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by COOK, JONATHON receive 1.31 office actions before reaching final disposition. This places the examiner in the 25% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by COOK, JONATHON is 28 months. This places the examiner in the 53% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a +8.4% benefit to allowance rate for applications examined by COOK, JONATHON. This interview benefit is in the 41% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 44.0% of applications are subsequently allowed. This success rate is in the 95% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 60.9% of cases where such amendments are filed. This entry rate is in the 83% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.
This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 94% percentile among all examiners. Of these withdrawals, 100.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 22.2% are granted (fully or in part). This grant rate is in the 13% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 8.7% of allowed cases (in the 95% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 2.5% of allowed cases (in the 68% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.