USPTO Art Unit 2881 Prosecution Statistics

Art Unit Information

Art Unit: 2881
Group: 2880
Tech Center: 2800
Total Cases: 23,189
Last Active: June 2025

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
19250525Ultraviolet Lamp Apparatuses Which Move Their Lamp/s While Emitting LightJune 2025January 2026Allow710NoNo
19222939Helmet mount with accessoriesMay 2025July 2025Allow200YesNo
19212751BORON NEUTRON CAPTURE THERAPY SYSTEMMay 2025July 2025Allow100NoNo
19212810BORON NEUTRON CAPTURE THERAPY DEVICE COMPATIBLE WITH ROTATING TARGET AND FIXED TARGET AND TARGET REPLACEMENT METHODMay 2025July 2025Allow200NoNo
19089613ELECTRODE ASSEMBLY FOR MASS SPECTROMETRY SYSTEMMarch 2025May 2025Allow210NoNo
19084627MASS SPECTROMETRY SYSTEM AND METHOD WITH STACKED-RING ION TRANSFER DEVICEMarch 2025June 2025Allow300NoNo
19076415PRODUCTION OF HIGHLY PURIFIED 212PBMarch 2025May 2025Allow200NoNo
19074174SYSTEM AND METHOD FOR ION PACKET FORMATION, DELIVERY, AND CALIBRATION IN MASS SPECTROMETRYMarch 2025June 2025Allow410NoNo
19074212MASS SPECTROMETRY SYSTEM AND METHOD WITH CONTROLLED ION TRANSFERMarch 2025June 2025Allow310NoNo
19072894SYSTEMS AND METHODS FOR DISINFECTIONMarch 2025February 2026Abandon1110NoNo
19039069HIGH TEMPERATURE ION SOURCEJanuary 2025July 2025Allow610NoNo
19028608WAFER MEASUREMENT SYSTEM USING TIME-OF-FLIGHT MEDIUM-ENERGY ION SCATTERING SIGNALJanuary 2025May 2025Allow400NoNo
19023867AUTOMATIC MAGNETIC IMPURITY SAMPLE ISOLATIONJanuary 2025August 2025Allow701NoNo
19015374DEVICE AND METHOD FOR MULTI-ENERGY FIELD INDUCED ATOMIC-SCALE COMPUTER NUMERICAL CONTROL (CNC) MACHINING IN ENVIRONMENTAL ATMOSPHEREJanuary 2025October 2025Allow920NoNo
19008683ELECTRON DETECTION DEVICE AND SCANNING ELECTRON MICROSCOPEJanuary 2025February 2025Allow100NoNo
18878214HYBRID NEAR-FIELD SCANNING MICROWAVE MICROSCOPEDecember 2024August 2025Allow700NoNo
18975232APPARATUS FOR SANITIZING A FIBEROPTIC ENDOSCOPEDecember 2024March 2025Allow300NoNo
18969965Ultraviolet Lamp Apparatuses Which Move Their Lamp/s While Emitting LightDecember 2024May 2025Allow510NoNo
18968553SINGLE-MOLECULE FORCE SPECTROSCOPY-INFRARED SPECTROSCOPY (SMFS-IR) COUPLING METHOD AND SYSTEM, AND DEVICEDecember 2024April 2025Allow500NoNo
18959313LIGHT SOURCE SYSTEM AND METHOD OF OPERATIONNovember 2024February 2025Allow300NoNo
18942340PRODUCTION OF HIGHLY PURIFIED 212PBNovember 2024April 2025Allow510NoNo
18927668SUPPORTING INSULATION BASE OF NEGATIVE HIGH-VOLTAGE POTENTIAL NEUTRON TARGET OF COMPACT NEUTRON SOURCEOctober 2024December 2024Allow200NoNo
18912204SEVERE WEATHER VORTEX DISRUPTION SYSTEM AND METHODOctober 2024January 2025Allow300NoNo
18897472SYSTEM AND METHOD FOR ADMINISTERING RADIOACTIVE AGENTS TO A SUBJECTSeptember 2024April 2025Allow710NoNo
18884880SAPPHIRE LAMP FOR LASER SUSTAINED PLASMA BROADBAND LIGHT SOURCESeptember 2024September 2025Allow1210NoNo
18829304TEST DEVICE AND TEST METHOD FOR ISOTOPE MEASUREMENT OF NOBLE GASES IN LUNAR SOILSeptember 2024December 2024Allow300NoNo
18816188OUTER SOURCE ASSEMBLY AND ASSOCIATED COMPONENTSAugust 2024February 2025Allow610NoNo
18808351APPARATUS AND METHOD FOR PULSED MODE CHARGE DETECTION MASS SPECTROMETRYAugust 2024April 2025Allow800NoNo
18802057DETECTOR AND STERILIZATION SYSTEMAugust 2024December 2024Allow410NoNo
18799273ION ANALYSIS APPARATUS AND METHODAugust 2024November 2024Allow300NoNo
18789193ATOMIC VAPOR SOURCE FOR QUANTUM METROLOGYJuly 2024November 2024Allow410NoNo
18776470AUTOMATED DETECTION OF BOUNDARIES IN MASS SPECTROMETRY DATAJuly 2024July 2025Allow1110NoNo
18776046METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSISJuly 2024July 2025Allow1210NoNo
18773322SYSTEM AND METHOD FOR OMNIDIRECTIONAL REAL TIME DETECTION OF PHOTOLITHOGRAPHY CHARACTERISTICSJuly 2024October 2025Allow1510NoNo
18772999Effective Temperature Calculation Method for Multi-Charged Particle Beam Writing Region, Multi-Charged Particle Beam Writing Apparatus, Multi-Charged Particle Beam Writing Method, and Recording Medium Recording ProgramJuly 2024October 2024Allow300NoNo
18770357PARTICLE IMAGE VELOCIMETRY OF EXTREME ULTRAVIOLET LITHOGRAPHY SYSTEMSJuly 2024April 2025Allow910NoNo
18768681HIGH DENSITY ENERGY DIRECTING DEVICEJuly 2024October 2025Abandon1610NoNo
18768828TWO DIMENSIONAL MSMSJuly 2024February 2025Allow700NoNo
18762559EXTREME ULTRAVIOLET LITHOGRAPHY SYSTEMJuly 2024April 2025Allow910NoNo
18751504HEAVY PEPTIDE APPROACH TO ACCURATELY MEASURE UNPROCESSED C-TERMINAL LYSINEJune 2024August 2025Abandon1410NoNo
18750933SYSTEMS AND METHODS FOR DISINFECTIONJune 2024August 2024Allow100NoNo
18722829Inert Ultraviolet Curing ApparatusJune 2024November 2024Allow500NoNo
18747343ION SOURCEJune 2024April 2025Allow1010NoNo
18739605STERILIZATION UNIT AND STERILIZATION APPARATUS INCLUDING THE SAMEJune 2024April 2025Allow1010NoNo
18739836METHOD FOR REAL TIME ENCODING OF SCANNING SWATH DATA AND PROBABILISTIC FRAMEWORK FOR PRECURSOR INFERENCEJune 2024June 2025Allow1210NoNo
17442126Laser virus filter screenJune 2024February 2025Abandon4110NoNo
18680372PRODUCTION OF HIGHLY PURIFIED 212PBMay 2024August 2024Allow300YesNo
18680605PRODUCTION OF HIGHLY PURIFIED 212PBMay 2024September 2024Allow400NoNo
18680578STERILIZATION MODULEMay 2024September 2025Allow1511NoNo
18675535UNMANNED HUMAN ANALOGUEMay 2024September 2024Allow400NoNo
18674489Methods and Systems for Detecting Prostaglandins by LC-MS/MSMay 2024March 2025Allow920NoNo
18674512METHOD FOR OPERATING A MULTI-BEAM PARTICLE BEAM MICROSCOPEMay 2024August 2025Allow1510YesNo
18668048CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE MEASUREMENTSMay 2024December 2024Allow700NoNo
18694765SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA PIEZO-PROBESMay 2024July 2024Allow400NoNo
18660862Lithography Apparatus and MethodMay 2024June 2025Allow1410NoNo
18657924SYSTEMS, DEVICES, AND METHODS FOR BEAM MISALIGNMENT DETECTIONMay 2024July 2025Allow1410NoNo
18654715RADIOPAQUE PARTICLE PROCESSING ADDITIVEMay 2024July 2024Allow300NoNo
18654822ION COLLECTOR FOR USE IN PLASMA SYSTEMSMay 2024October 2025Allow1700NoNo
18653555SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMPLE BY CHARGED PARTICLES, SET OF SYSTEMS TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMPLE AND METHOD TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMPLE BY CHARGED PARTICLESMay 2024December 2024Allow700NoNo
18651012ADJUSTABLE SUPPORT FOR ARC CHAMBER OF ION SOURCEApril 2024May 2025Allow1210NoNo
18650681BENCH-TOP TIME OF FLIGHT MASS SPECTROMETERApril 2024December 2024Allow700NoNo
18648278ULTRATHIN CONFORMAL COATINGS FOR ELECTROSTATIC DISSIPATION IN SEMICONDUCTOR PROCESS TOOLSApril 2024October 2025Allow1811YesNo
18644458EUV LIGHT SOURCE WITH A BEAM POSITIONING DEVICEApril 2024August 2024Allow400NoNo
18643379FLUID TRANSFER SYSTEM IN A CHARGED PARTICLE SYSTEMApril 2024November 2024Allow600NoNo
18643509METHOD AND SYSTEM OF IDENTIFYING AND QUANTIFYING ANTIBODY FRAGMENTATIONApril 2024November 2024Allow700NoNo
18638688SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURINGApril 2024March 2025Allow1100NoNo
18636732METHOD FOR TUNING WITH UNRESOLVED PEAKS ON QUADRUPOLE MASS SPECTROMETERSApril 2024February 2025Allow1000NoNo
18635131PLASMA GENERATING DEVICEApril 2024May 2025Allow1310NoNo
18631848NON-RADIOACTIVE PLASMA ION SOURCE DEVICEApril 2024December 2024Allow900NoNo
18630314MASS SPECTROMETRY VIA FREQUENCY TAGGINGApril 2024February 2025Allow1010NoNo
18629633TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LOSS SPECTROSCOPY DETECTORApril 2024November 2024Allow700NoNo
18628009PLASMA EXCITATION WITH ION ENERGY CONTROLApril 2024March 2025Allow1110NoNo
18627642ION MOBILITY ANALYSERApril 2024December 2024Allow910NoNo
18624417Voltage Supply for a Mass AnalyserApril 2024October 2024Allow700NoNo
18697908ACOUSTIC TRACKING SYSTEM AND METHOD FOR NUCLEAR SOURCESApril 2024July 2024Allow300NoNo
18621600Monitoring Radical Particle Concentration Using Mass SpectrometryMarch 2024December 2024Allow900NoNo
18618543DECREASED CROSSTALK ATOMIC OBJECT DETECTIONMarch 2024May 2025Allow1410NoNo
18616453DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL LOOPMarch 2024May 2025Allow1310NoNo
18617503METHOD AND APPARATUS FOR OPERATING A VACUUM INTERFACE OF A MASS SPECTROMETERMarch 2024June 2025Allow1530YesNo
18617227SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACTIVE MATERIALSMarch 2024December 2024Allow900NoNo
18617563REUSABLE STRAW AND CASE WITH INTEGRATED CLEANING, DRYING AND SANITIZING MEMBERMarch 2024December 2024Allow900NoNo
18615576STERILIZING APPARATUSMarch 2024May 2025Allow1310NoNo
18614351STERILIZING DEVICEMarch 2024January 2026Allow2220NoNo
18610570HIGH RESOLUTION IMAGING APPARATUS AND METHODMarch 2024September 2024Allow600NoNo
18610673HIGH CONFIDENCE COMPOUND IDENTIFICATION BY LIQUID CHROMATOGRAPHY-MASS SPECTROMETRYMarch 2024November 2024Allow800NoNo
18608243FLEXIBLE ION GENERATOR DEVICEMarch 2024May 2025Allow1410NoNo
18608606STERILIZATION APPARATUSMarch 2024August 2025Allow1720NoNo
18607766Improved Low-Power Mass Interrogation System and Assay For Determining Vitamin D LevelsMarch 2024November 2024Allow800NoNo
18606947Methods and Apparatus for Trapping and Accumulation of IonsMarch 2024May 2025Allow1410NoNo
18599199DETACHABLE COLUMN UNIT OF SCANNING ELECTRON MICROSCOPE, AND METHOD FOR PROVIDING THE SAMEMarch 2024October 2024Allow700NoNo
18598491ION SHUTTING SYSTEM WITH COMPENSATION ELECTRODES FOR ION TRAPMarch 2024April 2025Allow1310NoNo
18597563METHOD OF MANUFACTURING INTEGRATED CIRCUITMarch 2024April 2025Allow1310NoNo
18595895RADIATION SHIELDING DEVICES, SYSTEMS, AND METHODSMarch 2024January 2025Allow1110NoNo
18589559CALIBRATION TECHNIQUES FOR MASS SPECTROMETRY SYSTEMFebruary 2024March 2026Allow2500NoNo
18686753METHOD OF AUTO TUNING ONE OR MORE SENSORSFebruary 2024March 2025Allow1300NoNo
18583973Charged Particle Beam DeviceFebruary 2024October 2024Allow700NoNo
18583992EQUIPMENT DISINFECTIONFebruary 2024July 2025Allow1711NoNo
18442757SYSTEM, APPARATUS, AND METHOD FOR A THERMAL TARGETFebruary 2024May 2024Allow300NoNo
18439175Security Mechanisms for Radiopharmaceutical Elution System and Elution ProcessFebruary 2024September 2024Allow800YesNo
18436697IDENTIFICATION OF SAMPLE SUBSPECIES BASED ON PARTICLE CHARGE BEHAVIOR UNDER STRUCTURAL CHANGE-INDUCING SAMPLE CONDITIONSFebruary 2024October 2024Allow910NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for art-unit 2881.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
223
Examiner Affirmed
125
(56.1%)
Examiner Reversed
98
(43.9%)
Reversal Percentile
88.7%
Higher than average

What This Means

With a 43.9% reversal rate, the PTAB reverses the examiner's rejections in a meaningful percentage of cases. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.

Strategic Value of Filing an Appeal

Total Appeal Filings
739
Allowed After Appeal Filing
266
(36.0%)
Not Allowed After Appeal Filing
473
(64.0%)
Filing Benefit Percentile
70.2%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 36.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.

Strategic Recommendations

✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.

✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Art Unit 2881 - Prosecution Statistics Summary

Executive Summary

Art Unit 2881 is part of Group 2880 in Technology Center 2800. This art unit has examined 23,189 patent applications in our dataset, with an overall allowance rate of 85.6%. Applications typically reach final disposition in approximately 22 months.

Comparative Analysis

Art Unit 2881's allowance rate of 85.6% places it in the 80% percentile among all USPTO art units. This art unit has a significantly higher allowance rate than most art units at the USPTO.

Prosecution Patterns

Applications in Art Unit 2881 receive an average of 1.23 office actions before reaching final disposition (in the 9% percentile). The median prosecution time is 22 months (in the 91% percentile).

Strategic Considerations

When prosecuting applications in this art unit, consider the following:

  • The art unit's allowance rate suggests a more favorable examination environment compared to the USPTO average.
  • With fewer office actions than average, plan for relatively streamlined prosecution.
  • The median prosecution time is shorter than average and should be factored into your continuation and client communication strategies.
  • Review individual examiner statistics within this art unit to identify examiners with particularly favorable or challenging prosecution patterns.

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.