Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 17256914 | PROBE CHIP, SCAN HEAD, SCANNING PROBE MICROSCOPY DEVICE AND USE OF A PROBE CHIP | December 2020 | May 2024 | Allow | 41 | 4 | 0 | No | No |
| 17130636 | Ion Entry/Exit Device | December 2020 | August 2022 | Allow | 19 | 1 | 0 | No | No |
| 17127309 | ION BEAM IMPLANTATION METHOD AND SEMICONDUCTOR DEVICE | December 2020 | October 2023 | Allow | 34 | 1 | 1 | No | No |
| 17117696 | System and method of preparing integrated circuits for backside probing using charged particle beams | December 2020 | November 2022 | Allow | 24 | 1 | 1 | No | No |
| 17113637 | Device With A Self-Disinfecting Surface | December 2020 | June 2023 | Abandon | 30 | 2 | 0 | No | No |
| 17112213 | Pre-Doffing Disinfection Systems And Methods | December 2020 | September 2022 | Allow | 22 | 1 | 0 | No | No |
| 17108313 | Sterilization Box Assembly | December 2020 | September 2023 | Abandon | 34 | 2 | 0 | No | No |
| 16950703 | System and Method for Loading an Ion Trap | November 2020 | October 2022 | Allow | 23 | 2 | 0 | No | No |
| 17055727 | MICROSPHERE CONTAINMENT SYSTEMS AND METHODS | November 2020 | December 2023 | Allow | 37 | 2 | 0 | No | No |
| 17053192 | Detector Having Improved Construction | November 2020 | January 2024 | Allow | 39 | 2 | 0 | No | No |
| 17051138 | BAFFLES TO ABSORB REFLECTED ENERGY IN REFLECTORS | October 2020 | July 2023 | Allow | 33 | 0 | 0 | No | No |
| 17047507 | FRAME FOR EYEWEAR PROVIDING IMPROVED PROTECTION AGAINST IONISING RADIATION AND RADIOPROTECTIVE EYEWEAR COMPRISING SUCH A FRAME | October 2020 | February 2024 | Abandon | 41 | 1 | 0 | No | No |
| 17069302 | Large Radius Probe | October 2020 | May 2022 | Allow | 19 | 1 | 0 | No | No |
| 17043950 | Stage Device, Charged Particle Beam Apparatus, and Vacuum Apparatus | September 2020 | May 2022 | Allow | 20 | 1 | 0 | No | No |
| 17043260 | BOWTIE FILTER, RADIATION SCANNING APPARATUS, AND RADIATION SCANNING METHOD | September 2020 | June 2023 | Abandon | 32 | 2 | 0 | No | No |
| 17032589 | WATERPROOF DISINFECTION LAMP | September 2020 | September 2022 | Abandon | 24 | 1 | 0 | No | No |
| 16963040 | SCANNING PROBE MICROSCOPE | September 2020 | January 2022 | Allow | 18 | 1 | 0 | Yes | No |
| 16981983 | METHOD AND SYSTEM FOR AT LEAST SUBSURFACE CHARACTERIZATION OF A SAMPLE | September 2020 | August 2022 | Abandon | 23 | 2 | 0 | No | No |
| 17010936 | Personal Protective Equipment Sanitizing Assembly | September 2020 | October 2022 | Allow | 25 | 0 | 0 | No | No |
| 17006049 | SYSTEMS, DEVICES, AND METHODS FOR CONTAMINANT RESISTANT INSULATIVE STRUCTURES | August 2020 | February 2022 | Allow | 17 | 1 | 0 | Yes | No |
| 16992058 | SUBSTRATE POSITIONING DEVICE AND ELECTRON BEAM INSPECTION TOOL | August 2020 | November 2022 | Allow | 28 | 1 | 0 | No | No |
| 16984813 | Pattern Height Information Correction System and Pattern Height Information Correction Method | August 2020 | May 2022 | Allow | 22 | 1 | 0 | Yes | No |
| 16967046 | SAMPLE SUPPORT BODY AND PRODUCTION METHOD FOR SAMPLE SUPPORT BODY | August 2020 | March 2022 | Allow | 19 | 0 | 0 | No | No |
| 16940428 | Thin laminar material for producing short wave infrared emission | July 2020 | June 2022 | Allow | 23 | 1 | 0 | Yes | No |
| 16940996 | Method And Apparatus Of Atomic Force Microscope Based Infrared Spectroscopy With Controlled Probing Depth | July 2020 | October 2021 | Allow | 14 | 1 | 0 | No | No |
| 16937883 | MASS SPECTROMETER AND METHOD FOR TIME-OF-FLIGHT MASS SPECTROMETRY | July 2020 | June 2023 | Abandon | 35 | 2 | 0 | No | Yes |
| 16937033 | ION FLOW GUIDE DEVICES AND METHODS | July 2020 | October 2021 | Allow | 15 | 0 | 0 | No | No |
| 16932161 | CANTILEVER WITH A COLLOCATED PIEZOELECTRIC ACTUATOR-SENSOR PAIR | July 2020 | August 2023 | Allow | 37 | 2 | 0 | No | No |
| 16924011 | SYSTEMS AND METHODS FOR SANITIZING PORTABLE DEVICES | July 2020 | December 2022 | Abandon | 29 | 2 | 0 | No | No |
| 16922552 | Charged Particle Beam Device | July 2020 | April 2022 | Allow | 21 | 1 | 0 | No | No |
| 16908507 | INSPECTION TOOL AND METHOD OF DETERMINING A DISTORTION OF AN INSPECTION TOOL | June 2020 | October 2021 | Allow | 15 | 0 | 0 | No | No |
| 16956858 | ION FOCUSING DEVICE | June 2020 | November 2022 | Allow | 28 | 1 | 0 | No | No |
| 16901900 | METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE, WHEREIN AN ELECTRON ENERGY-LOSS SPECTROSCOPY (EELS) SPECTRUM IS ACQUIRED | June 2020 | April 2022 | Allow | 22 | 1 | 0 | No | No |
| 16897693 | UV LIGHT AND STERILIZATION SYSTEM | June 2020 | June 2022 | Allow | 25 | 1 | 0 | No | No |
| 16771121 | Charged Particle Beam Device | June 2020 | April 2022 | Allow | 23 | 1 | 0 | No | No |
| 15733175 | MICRO-OPTOMECHANICAL SYSTEM AND METHOD FOR THE PRODUCTION THEREOF | June 2020 | December 2024 | Allow | 54 | 6 | 1 | Yes | No |
| 16885374 | LED ULTRAVIOLET GERMICIDAL LAMP | May 2020 | August 2022 | Allow | 26 | 1 | 0 | No | No |
| 16879151 | ADJUSTMENT METHOD AND ELECTRON BEAM DEVICE | May 2020 | October 2021 | Allow | 17 | 1 | 0 | No | No |
| 16765406 | METHOD OF STRESS REDUCTION AND METHOD OF IMPROVING DEGREE OF CONCENTRATION | May 2020 | December 2023 | Abandon | 43 | 4 | 0 | Yes | No |
| 16874712 | SYSTEM AND METHOD FOR PERFORMING THREE-DIMENSIONAL COMPOSITIONAL ANALYSES | May 2020 | September 2021 | Allow | 16 | 0 | 0 | No | No |
| 16856085 | METHODS FOR TESTING OR ADJUSTING A CHARGED-PARTICLE DETECTOR, AND RELATED DETECTION SYSTEMS | April 2020 | December 2021 | Allow | 20 | 2 | 0 | No | No |
| 16857117 | Methods in Mass Spectrometry Using Collision Gas as ION Source | April 2020 | September 2021 | Allow | 17 | 0 | 0 | No | No |
| 16838490 | Regulated Charged Particle Beam Emitter Systems and Methods | April 2020 | September 2023 | Allow | 42 | 3 | 0 | No | No |
| 16649975 | DETECTION OF BURIED FEATURES BY BACKSCATTERED PARTICLES | March 2020 | May 2022 | Allow | 25 | 3 | 0 | No | No |
| 16647497 | SAMPLE SUPPORT BODY | March 2020 | February 2022 | Allow | 23 | 0 | 0 | No | No |
| 16814293 | Charged Particle Beam Apparatus | March 2020 | February 2022 | Allow | 23 | 1 | 0 | No | No |
| 16645269 | Rational Nano-Coulomb Ionization | March 2020 | June 2022 | Allow | 27 | 0 | 1 | No | No |
| 16805807 | NEGATIVE ION GENERATOR, WEARABLE AIR PURIFIER HAVING THE AFOREMENTIONED NEGATIVE ION GENERATOR, AND METHOD OF MANUFACTURING THE AFOREMENTIONED NEGATIVE ION GENERATOR | March 2020 | December 2023 | Abandon | 45 | 3 | 0 | No | No |
| 16641540 | ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD | February 2020 | March 2022 | Abandon | 25 | 1 | 1 | No | No |
| 16777099 | Space Focus Time of Flight Mass Spectrometer | January 2020 | June 2022 | Abandon | 28 | 2 | 0 | No | No |
| 16776039 | CHARGED PARTICLE BEAM SYSTEM AND METHOD OF MEASURING SAMPLE USING SCANNING ELETRON MICROSCOPE | January 2020 | September 2021 | Allow | 20 | 2 | 0 | Yes | No |
| 16751717 | MODULAR ION GENERATOR DEVICE | January 2020 | November 2021 | Allow | 22 | 1 | 0 | No | No |
| 16734548 | ELECTRON MICROSCOPE SAMPLE HOLDER FLUID HANDLING WITH INDEPENDENT PRESSURE AND FLOW CONTROL | January 2020 | September 2021 | Allow | 20 | 1 | 0 | No | No |
| 16706937 | INORGANIC MASS SPECTROMETER | December 2019 | March 2022 | Abandon | 28 | 2 | 0 | No | No |
| 16704858 | ION COLLECTOR FOR USE IN PLASMA SYSTEMS | December 2019 | October 2022 | Allow | 34 | 1 | 1 | No | No |
| 16617963 | IMPROVED CHARGED PARTICLE DETECTOR | November 2019 | September 2024 | Allow | 57 | 7 | 0 | No | No |
| 16691847 | Detection and Correction of System Responses in Real-Time | November 2019 | July 2022 | Allow | 32 | 3 | 0 | No | No |
| 16691517 | Mass Spectrometer Compensating Ion Beams Fluctuations | November 2019 | September 2022 | Allow | 34 | 3 | 0 | No | No |
| 16678796 | LASER ARCHITECTURE FOR COMPONENT EFFICIENT ATOMIC INTERFEROMETER GRAVIMETER | November 2019 | June 2024 | Allow | 55 | 1 | 1 | No | No |
| 16676717 | MULTIBEAMLET CHARGED PARTICLE DEVICE AND METHOD | November 2019 | December 2021 | Allow | 26 | 1 | 0 | No | No |
| 16607526 | Method for Measuring Distribution of Pores in Electrode for Secondary Battery | October 2019 | September 2024 | Allow | 58 | 2 | 0 | Yes | No |
| 16660152 | Electron Beam Device | October 2019 | April 2022 | Allow | 30 | 0 | 0 | No | No |
| 16500419 | SYSTEM AND METHOD FOR MODELLING OF DOSE CALCULATION IN RADIOTHERAPY TREATMENT PLANNING | October 2019 | April 2022 | Allow | 30 | 2 | 0 | No | No |
| 16551042 | FOAM IN ION IMPLANTATION SYSTEM | August 2019 | October 2021 | Allow | 26 | 3 | 0 | No | No |
| 16423687 | METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A MEASURING TIP OF A SCANNING PROBE MICROSCOPE | May 2019 | April 2022 | Allow | 34 | 2 | 1 | No | No |
| 16392925 | Portable Vehicle Inspection Portal with Accompanying Workstation | April 2019 | September 2022 | Allow | 40 | 5 | 0 | No | No |
| 16360844 | CHARGED PARTICLE BEAM TREATMENT APPARATUS | March 2019 | March 2023 | Abandon | 48 | 5 | 0 | No | No |
| 16359831 | BEAM SPLITTER FOR A CHARGED PARTICLE DEVICE | March 2019 | April 2024 | Abandon | 60 | 4 | 0 | No | Yes |
| 16355704 | Positioning Samples for Microscopy, Inspection, or Analysis | March 2019 | March 2022 | Allow | 36 | 3 | 0 | No | No |
| 16318827 | IMAGING MASS SPECTROMETRIC DATA PROCESSING DEVICE | January 2019 | May 2022 | Abandon | 39 | 5 | 0 | No | No |
| 16242093 | LASER SOURCE DEVICE AND EXTREME ULTRAVIOLET LITHOGRAPHY DEVICE | January 2019 | December 2019 | Allow | 11 | 0 | 0 | No | No |
| 16240951 | EXTREME ULTRAVIOLET RADIATION SOURCE AND DROPLET CATCHER THEREOF | January 2019 | September 2019 | Allow | 9 | 0 | 0 | No | No |
| 16240071 | REDUCTION OF CONDENSED GASES ON CHAMBER WALLS VIA PURGE GAS DILUTION AND EVACUATION FOR SEMICONDUCTOR PROCESSING EQUIPMENT | January 2019 | June 2024 | Abandon | 60 | 7 | 0 | No | Yes |
| 16226351 | Dielectric Coated Ion Transfer Device for Mass Spectrometry | December 2018 | September 2019 | Allow | 9 | 0 | 0 | No | No |
| 16190061 | Electron-Beam Inspection Systems with optimized throughput | November 2018 | March 2020 | Abandon | 17 | 1 | 0 | No | No |
| 16163263 | Multi-Beam Electron Characterization Tool with Telecentric Illumination | October 2018 | February 2022 | Allow | 40 | 5 | 0 | No | No |
| 16094281 | Charged Particle Microscope and Method of Imaging Sample | October 2018 | May 2022 | Abandon | 43 | 1 | 0 | No | No |
| 16160210 | CHARGED PARTICLE BEAM WRITING APPARATUS AND CHARGED PARTICLE BEAM WRITING METHOD | October 2018 | September 2019 | Allow | 11 | 0 | 0 | No | No |
| 16129408 | CHARGED PARTICLE BEAM WRITING APPARATUS AND METHOD FOR DIAGNOSING FAILURE OF BLANKING CIRCUIT | September 2018 | June 2019 | Allow | 9 | 0 | 0 | No | No |
| 16077782 | Ion Milling Device and Ion Milling Method | August 2018 | November 2022 | Allow | 51 | 3 | 1 | No | No |
| 16057402 | TOMOGRAPHY-ASSISTED TEM PREP WITH REQUESTED INTERVENTION AUTOMATION WORKFLOW | August 2018 | June 2019 | Allow | 10 | 0 | 0 | No | No |
| 16051911 | MULTI CHARGED PARTICLE BEAM WRITING APPARATUS AND MULTI CHARGED PARTICLE BEAM WRITING METHOD | August 2018 | June 2019 | Allow | 11 | 0 | 0 | No | No |
| 16047316 | Characterizing a Height Profile of a Sample by Side View Imaging | July 2018 | October 2019 | Allow | 14 | 1 | 0 | No | No |
| 16043958 | SCANNING ELECTRON MICROSCOPE AND IMAGE PROCESSING APPARATUS | July 2018 | August 2019 | Allow | 13 | 0 | 0 | No | No |
| 16021669 | ACTIVE MULTI-SPECTRAL SYSTEM FOR GENERATING CAMOUFLAGE OR OTHER RADIATING PATTERNS FROM OBJECTS IN AN INFRARED SCENE | June 2018 | October 2019 | Allow | 15 | 1 | 0 | No | No |
| 16018008 | OBJECTIVE LENS SYSTEM FOR FAST SCANNING LARGE FOV | June 2018 | July 2023 | Allow | 60 | 4 | 0 | No | Yes |
| 16010500 | CALIBRATING TIP-ENHANCED RAMAN MICROSCOPES | June 2018 | November 2019 | Allow | 17 | 1 | 0 | No | No |
| 16003327 | MODULAR ION GENERATOR DEVICE | June 2018 | October 2019 | Allow | 16 | 2 | 0 | No | No |
| 15986684 | Ultraviolet Absorbent Enclosure | May 2018 | November 2019 | Allow | 18 | 2 | 0 | No | No |
| 15980779 | Magnetic Lensing For Beta Emission Imaging | May 2018 | September 2019 | Allow | 16 | 1 | 0 | No | No |
| 15980777 | Magnetic Lensing For Beta Emission Imaging | May 2018 | October 2018 | Allow | 5 | 1 | 0 | No | No |
| 15980298 | Ion Entry/Exit Device | May 2018 | June 2019 | Allow | 13 | 2 | 0 | No | No |
| 15936140 | CHARGED PARTICLE BEAM APPARATUS | March 2018 | December 2019 | Allow | 20 | 0 | 0 | No | No |
| 15936074 | CHARGED PARTICLE BEAM APPARATUS | March 2018 | September 2019 | Allow | 18 | 1 | 0 | No | No |
| 15936155 | SAMPLE HOLDER, MEMBER MOUNTING DEVICE, AND CHARGED PARTICLE BEAM APPARATUS | March 2018 | September 2019 | Allow | 17 | 1 | 0 | No | No |
| 15903321 | MEMS DEVICE FOR GENERATING AN ION BEAM | February 2018 | April 2019 | Allow | 14 | 0 | 0 | No | No |
| 15902639 | Stage Apparatus and Charged Particle Beam Apparatus | February 2018 | April 2019 | Allow | 13 | 0 | 0 | No | No |
| 15902251 | Scanning Electron Microscope | February 2018 | March 2019 | Allow | 13 | 0 | 0 | No | No |
| 15902392 | DEVICE AND METHOD FOR FORMING A PLURALITY OF CHARGED PARTICLE BEAMLETS | February 2018 | August 2019 | Allow | 17 | 1 | 0 | Yes | No |
| 15902157 | MULTI CHARGED PARTICLE BEAM INSPECTION APPARATUS, AND MULTI CHARGED PARTICLE BEAM INSPECTION METHOD | February 2018 | June 2019 | Allow | 15 | 1 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner OSENBAUGH-STEWART, ELIZA W.
With a 20.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 29.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner OSENBAUGH-STEWART, ELIZA W works in Art Unit 2881 and has examined 559 patent applications in our dataset. With an allowance rate of 75.3%, this examiner has a below-average tendency to allow applications. Applications typically reach final disposition in approximately 24 months.
Examiner OSENBAUGH-STEWART, ELIZA W's allowance rate of 75.3% places them in the 42% percentile among all USPTO examiners. This examiner has a below-average tendency to allow applications.
On average, applications examined by OSENBAUGH-STEWART, ELIZA W receive 1.67 office actions before reaching final disposition. This places the examiner in the 31% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by OSENBAUGH-STEWART, ELIZA W is 24 months. This places the examiner in the 82% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +9.3% benefit to allowance rate for applications examined by OSENBAUGH-STEWART, ELIZA W. This interview benefit is in the 41% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 26.3% of applications are subsequently allowed. This success rate is in the 46% percentile among all examiners. Strategic Insight: RCEs show below-average effectiveness with this examiner. Carefully evaluate whether an RCE or continuation is the better strategy.
This examiner enters after-final amendments leading to allowance in 49.7% of cases where such amendments are filed. This entry rate is in the 75% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 57.1% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 50% percentile among all examiners. Note: Pre-appeal conferences show below-average success with this examiner. Consider whether your arguments are strong enough to warrant a PAC request.
This examiner withdraws rejections or reopens prosecution in 53.1% of appeals filed. This is in the 25% percentile among all examiners. Of these withdrawals, 47.1% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner rarely withdraws rejections during the appeal process compared to other examiners. If you file an appeal, be prepared to fully prosecute it to a PTAB decision. Per MPEP § 1207, the examiner will prepare an Examiner's Answer maintaining the rejections.
When applicants file petitions regarding this examiner's actions, 66.7% are granted (fully or in part). This grant rate is in the 72% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.
Examiner's Amendments: This examiner makes examiner's amendments in 0.9% of allowed cases (in the 65% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).
Quayle Actions: This examiner issues Ex Parte Quayle actions in 3.3% of allowed cases (in the 77% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.