Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18654822 | ION COLLECTOR FOR USE IN PLASMA SYSTEMS | May 2024 | October 2025 | Allow | 17 | 0 | 0 | No | No |
| 18614351 | STERILIZING DEVICE | March 2024 | January 2026 | Allow | 22 | 2 | 0 | No | No |
| 18397728 | SYSTEMS, DEVICES, AND METHODS FOR CONTAMINANT RESISTANT INSULATIVE STRUCTURES | December 2023 | December 2024 | Allow | 12 | 0 | 0 | No | No |
| 18533306 | 3D Ion Traps With Connection Through Substrate | December 2023 | February 2026 | Allow | 26 | 0 | 0 | No | No |
| 18521168 | INFORMATION PROCESSING SYSTEM AND PHASE ANALYSIS SYSTEM | November 2023 | March 2026 | Allow | 28 | 0 | 0 | No | No |
| 18498984 | OBJECTIVE LENS SYSTEM FOR FAST SCANNING LARGE FOV | October 2023 | January 2025 | Allow | 14 | 1 | 0 | No | No |
| 18372427 | METHODS AND SYSTEMS FOR CONTROLLING AN ION MOBILITY SEPARATOR BASED ON A HADAMARD ALGORITHM | September 2023 | October 2025 | Allow | 25 | 0 | 0 | No | No |
| 18365746 | CLAMPING MECHANISM | August 2023 | January 2026 | Allow | 30 | 1 | 0 | No | No |
| 18224643 | DEVICE AND METHOD FOR TUNING A CHARGED PARTICLE BEAM POSITION | July 2023 | September 2025 | Allow | 26 | 0 | 0 | No | No |
| 18224005 | APPARATUS AND METHOD FOR GENERATING EXTREME ULTRAVIOLET RADIATION | July 2023 | September 2024 | Allow | 14 | 1 | 0 | No | No |
| 18220899 | AIR CLEANING DEVICE | July 2023 | December 2023 | Allow | 5 | 1 | 0 | No | No |
| 18213220 | 3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAGES OBTAINED DURING DELAYERING OF THE SAMPLE | June 2023 | December 2024 | Allow | 18 | 2 | 0 | No | No |
| 18207611 | LUMINESCENCE-BASED METHOD FOR PLANNING PRECISELY DELIVERED ION BEAM THERAPY | June 2023 | August 2025 | Allow | 27 | 0 | 0 | No | No |
| 18137153 | Charged Particle Beam System and Control Method Therefor | April 2023 | February 2026 | Allow | 34 | 1 | 0 | No | No |
| 18303106 | Method and Scanning Transmission Charged-Particle Microscope | April 2023 | January 2026 | Allow | 33 | 1 | 0 | No | No |
| 18114349 | Ion Milling Device and Ion Milling Method | February 2023 | October 2025 | Allow | 32 | 1 | 0 | No | No |
| 18168362 | ION COLLECTOR FOR USE IN PLASMA SYSTEMS | February 2023 | January 2024 | Allow | 11 | 1 | 0 | Yes | No |
| 18103474 | MEASURING METHOD FOR MEASURING HEAT DISTRIBUTION OF SPECIFIC SPACE USING STHM PROBE, METHOD AND DEVICE FOR DETECTING BEAM SPOT OF LIGHT SOURCE | January 2023 | March 2024 | Allow | 14 | 1 | 0 | No | No |
| 18090646 | NEUTRON CAPTURE THERAPY APPARATUS AND OPERATION METHOD OF MONITORING SYSTEM THEREOF | December 2022 | January 2026 | Abandon | 36 | 1 | 0 | No | No |
| 18069666 | STERILIZING DEVICE | December 2022 | November 2023 | Allow | 11 | 1 | 0 | No | No |
| 18082648 | NEUTRON CAPTURE THERAPY APPARATUS | December 2022 | December 2025 | Allow | 36 | 1 | 0 | No | No |
| 18008071 | SAMPLE BLOCK AND SAMPLE BLOCK HOLDER | December 2022 | January 2026 | Abandon | 37 | 0 | 1 | No | No |
| 17928172 | A PROBE CASSETTE AND METHOD FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE PROBE DEVICES FOR A PROBE BASED SYSTEM | November 2022 | October 2025 | Allow | 35 | 3 | 0 | No | No |
| 18053916 | Ion Entry/Exit Device | November 2022 | March 2024 | Allow | 17 | 1 | 0 | No | No |
| 17974648 | ANIMAL IRRADIATION SYSTEM | October 2022 | August 2024 | Allow | 22 | 1 | 0 | No | No |
| 17921248 | METHOD, SYSTEM AND COMPUTER PROGRAM FOR PERFORMING ACOUSTIC SCANNING PROBE MICROSCOPY | October 2022 | March 2025 | Allow | 29 | 0 | 0 | No | No |
| 17972292 | Detection and Correction of System Responses in Real-Time | October 2022 | October 2023 | Allow | 12 | 1 | 0 | No | No |
| 18046035 | EFFICIENT TREATMENT OF CRANIO SPINAL CANCERS | October 2022 | June 2024 | Allow | 20 | 2 | 0 | No | No |
| 17964411 | DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIVE COMPOSITIONAL CHARGED PARTICLE IMAGING | October 2022 | July 2024 | Allow | 21 | 3 | 0 | No | No |
| 17916622 | METHOD OF DETERMINING DIMENSIONS OF FEATURES OF A SUBSURFACE TOPOGRAPHY, SCANNING PROBE MICROSCOPY SYSTEM AND COMPUTER PROGRAM | October 2022 | June 2024 | Allow | 21 | 0 | 0 | No | No |
| 17948743 | Large Radius Probe | September 2022 | December 2023 | Allow | 15 | 1 | 0 | No | No |
| 17911572 | VIBRATION COMPONENT MEASUREMENT DEVICE, KELVIN PROBE FORCE MICROSCOPE, AND VIBRATION COMPONENT MEASUREMENT METHOD | September 2022 | October 2023 | Allow | 13 | 0 | 0 | No | No |
| 17909463 | SYSTEM AND METHOD FOR PARTICLE THERAPY | September 2022 | December 2024 | Abandon | 27 | 1 | 0 | No | No |
| 17902215 | Method and device for enhancing vacuum tolerance of optical levitation particles by preheating desorption | September 2022 | November 2022 | Allow | 2 | 0 | 0 | No | No |
| 17899718 | NEUTRON CAPTURE THERAPY SYSTEM | August 2022 | August 2025 | Allow | 35 | 1 | 0 | No | No |
| 17821221 | IONIZATION DEVICE, MASS SPECTROMETRY SYSTEM, AND IONIZATION METHOD | August 2022 | July 2025 | Allow | 35 | 1 | 0 | No | No |
| 17797304 | Semiconductor Analysis System | August 2022 | June 2025 | Allow | 34 | 1 | 0 | No | No |
| 17796323 | A DIAMOND SCANNING ELEMENT, ESPECIALLY FOR IMAGING APPLICATION, AND A METHOD FOR ITS FABRICATION | July 2022 | January 2025 | Allow | 29 | 0 | 0 | No | No |
| 17872251 | UV LED CURING APPARATUS | July 2022 | June 2025 | Abandon | 34 | 1 | 0 | No | No |
| 17794290 | LIQUID DISINFECTING MODULE | July 2022 | May 2025 | Abandon | 34 | 1 | 0 | No | No |
| 17813518 | MULTI-BEAM DIGITAL SCAN AND IMAGE ACQUISITION | July 2022 | June 2025 | Allow | 35 | 1 | 1 | No | No |
| 17792810 | APPARATUS AND METHOD FOR PROJECTING AN ARRAY OF MULTIPLE CHARGED PARTICLE BEAMLETS ON A SAMPLE | July 2022 | August 2024 | Allow | 25 | 2 | 0 | No | No |
| 17811985 | CHARGED PARTICLE BEAM WRITING APPARATUS, CHARGED PARTICLE BEAM WRITING METHOD AND RECORDING MEDIUM | July 2022 | September 2024 | Allow | 27 | 0 | 0 | No | No |
| 17854174 | APPARATUS FOR SYNTHESIZING NANO-PARTICLES USING ELECTRON BEAM | June 2022 | October 2024 | Allow | 28 | 0 | 0 | No | No |
| 17854240 | NANO WATER ION GROUP GENERATOR | June 2022 | February 2023 | Allow | 7 | 1 | 0 | No | No |
| 17845272 | ENERGY SELECTION SYSTEM FOR COMPACT PROTON THERAPY | June 2022 | February 2024 | Allow | 19 | 1 | 0 | No | No |
| 17839662 | SENSOR DEVICE FOR DETECTING DISINFECTING STATE | June 2022 | June 2025 | Abandon | 36 | 0 | 1 | No | No |
| 17757328 | METHOD AND DEVICE FOR SIMULTANEOUS INDEPENDENT MOTION MEASUREMENT OF MULTIPLE PROBES IN ATOMIC FORCE MICROSCOPE | June 2022 | October 2023 | Allow | 16 | 1 | 0 | No | No |
| 17757343 | INTEGRATED DUAL-PROBE RAPID IN-SITU SWITCHING MEASUREMENT METHOD AND DEVICE OF ATOMIC FORCE MICROSCOPE | June 2022 | August 2023 | Allow | 14 | 1 | 0 | No | No |
| 17836174 | DISINFECTION SYSTEM FOR A MOTORIZED VEHICLE | June 2022 | September 2025 | Abandon | 40 | 2 | 0 | No | No |
| 17757133 | ELECTRON BEAM SYSTEM | June 2022 | March 2025 | Allow | 33 | 1 | 0 | No | No |
| 17805752 | INSPECTION APPARATUS | June 2022 | January 2025 | Allow | 31 | 0 | 0 | No | No |
| 17829922 | METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A MEASURING TIP OF A SCANNING PROBE MICROSCOPE | June 2022 | January 2024 | Allow | 20 | 2 | 0 | Yes | No |
| 17781267 | Electron Source, Electron Beam Device, and Method for Manufacturing Electron Source | May 2022 | August 2025 | Allow | 38 | 2 | 0 | No | No |
| 17780422 | NANOPOSITIONING SYSTEMS AND ASSOCIATED METHODS | May 2022 | December 2024 | Allow | 31 | 0 | 1 | No | No |
| 17750569 | AUTOMATED ION-BEAM ALIGNMENT FOR DUAL-BEAM INSTRUMENT | May 2022 | July 2024 | Allow | 26 | 0 | 0 | No | No |
| 17750384 | System, Method and Kit for Immobilization of a Human's Body Part | May 2022 | December 2024 | Allow | 31 | 1 | 0 | No | No |
| 17750245 | MASS SPECTROMETRY EXTRACTION AND SELECTION PIPELINE FOR MACHINE LEARNING | May 2022 | February 2025 | Allow | 33 | 2 | 0 | No | No |
| 17748878 | BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT PROCESSING OF MULTIPLE SAMPLES | May 2022 | October 2024 | Allow | 29 | 0 | 0 | No | No |
| 17740699 | SYSTEMS, DEVICES, AND METHODS FOR CONTAMINANT RESISTANT INSULATIVE STRUCTURES | May 2022 | September 2023 | Allow | 17 | 1 | 0 | No | No |
| 17755581 | DEVICE, APPARATUS AND METHOD FOR MINIBEAM RADIATION THERAPY | May 2022 | May 2025 | Abandon | 36 | 4 | 0 | No | No |
| 17732727 | RADIATION THERAPY SYSTEM, AND OPERATION PROCEDURE OF POSITIONING DEVICE THEREOF | April 2022 | January 2025 | Allow | 33 | 1 | 1 | No | No |
| 17660425 | STATIC DEVICE FOR USE IN RADIOTHERAPY TREATMENT AND DESIGN METHOD FOR SUCH A DEVICE | April 2022 | July 2023 | Allow | 14 | 2 | 0 | Yes | No |
| 17770801 | PROBE CASSETTE FOR HOLDING A PROBE IN STORAGE FOR USE IN A SCANNING PROBE MICROSCOPE | April 2022 | March 2023 | Allow | 11 | 0 | 0 | No | No |
| 17724184 | APPARATUS FOR STERILIZING A LIQUID | April 2022 | March 2025 | Allow | 35 | 2 | 0 | Yes | No |
| 17768929 | MASS SPECTROMETER | April 2022 | February 2025 | Allow | 34 | 2 | 0 | No | No |
| 17710186 | APPARATUS FOR ARTIFICIAL WEATHERING COMPRISING TWO KINDS OF LIGHT EMISSION SOURCES | March 2022 | January 2025 | Allow | 34 | 1 | 0 | No | No |
| 17657528 | SEMICONDUCTOR PROCESSING TOOL AND METHODS OF OPERATION | March 2022 | March 2025 | Allow | 35 | 2 | 0 | Yes | No |
| 17706214 | PARTICLE BEAM TREATMENT APPARATUS AND ACCELERATOR | March 2022 | September 2024 | Allow | 30 | 1 | 0 | No | No |
| 17703791 | Probe for Scanning Probe Microscope and Binary State Scanning Probe Microscope Including the Same | March 2022 | August 2023 | Allow | 17 | 1 | 0 | No | No |
| 17697314 | SEMICONDUCTOR-LASER-INTEGRATED ATOMIC FORCE MICROSCOPY OPTICAL PROBE | March 2022 | October 2023 | Abandon | 18 | 1 | 0 | No | No |
| 17642554 | METHODS AND SYSTEMS FOR USING AND CONTROLLING HIGHER DOSE RATE IONIZING RADIATION IN SHORT TIME INTERVALS | March 2022 | May 2025 | Allow | 38 | 2 | 0 | No | No |
| 17684876 | METHOD FOR ION IMPLANTATION UNIFORMITY CONTROL | March 2022 | March 2025 | Allow | 37 | 1 | 0 | No | No |
| 17638491 | PROCESS CHAMBER TO TREAT AIRBORNE CHEMICAL AND BIOLOGICAL CONTAMINATION | February 2022 | February 2025 | Abandon | 36 | 0 | 1 | No | No |
| 17637654 | NOZZLE APPARATUS | February 2022 | June 2025 | Allow | 40 | 1 | 1 | No | No |
| 17637302 | METHOD FOR DETECTING VITAMIN D IN BLOOD BY USING LDI-MS, AND DEVICE FOR SAME | February 2022 | October 2024 | Allow | 31 | 1 | 0 | No | No |
| 17636344 | NUMERICALLY COMPENSATING SEM-INDUCED CHARGING USING DIFFUSION-BASED MODEL | February 2022 | November 2024 | Allow | 33 | 1 | 0 | No | No |
| 17635836 | ION BEAM DEVICE | February 2022 | September 2024 | Allow | 31 | 1 | 0 | No | No |
| 17635325 | ION MOBILITY SEPARATION DEVICE | February 2022 | October 2024 | Allow | 32 | 1 | 0 | No | No |
| 17634501 | Charged Particle Beam System and Overlay Misalignment Measurement Method | February 2022 | September 2024 | Allow | 32 | 1 | 0 | Yes | No |
| 17668189 | Dynamic Pinhole Aperture for Charged Particle Therapy Systems | February 2022 | September 2024 | Abandon | 32 | 2 | 0 | No | No |
| 17668275 | INSPECTION TOOL AND METHOD OF DETERMINING A DISTORTION OF AN INSPECTION TOOL | February 2022 | March 2023 | Allow | 13 | 1 | 0 | No | No |
| 17630698 | CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING SCANNING PROBE MICROSCOPE | January 2022 | June 2023 | Allow | 16 | 1 | 0 | No | No |
| 17630455 | MULTIPLE LANDING ENERGY SCANNING ELECTRON MICROSCOPY SYSTEMS AND METHODS | January 2022 | March 2025 | Allow | 37 | 2 | 0 | No | No |
| 17582504 | MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH AN IMPROVED FOCUS SETTING TAKING INTO ACCOUNT AN IMAGE PLANE TILT | January 2022 | December 2024 | Allow | 35 | 3 | 1 | Yes | No |
| 17572447 | PARTICLE THERAPY CLOSED-LOOP FEEDBACK SPOT-WISE BEAM CURRENT CONTROL SYSTEMS AND METHODS | January 2022 | September 2024 | Allow | 32 | 1 | 0 | No | No |
| 17570481 | ELECTRON MICROSCOPE SAMPLE HOLDER FLUID HANDLING WITH INDEPENDENT PRESSURE AND FLOW CONTROL | January 2022 | September 2023 | Allow | 20 | 2 | 0 | No | No |
| 17623789 | COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OPAQUE LIQUID ENVIRONMENTS, AND METHODS OF PERFORMING TOPOGRAPHY IMAGING | December 2021 | October 2023 | Allow | 21 | 1 | 1 | Yes | No |
| 17623584 | TOMOGRAPHIC ATOM PROBE WITH TERAHERTZ PULSE GENERATOR | December 2021 | February 2026 | Allow | 50 | 3 | 0 | Yes | No |
| 17561731 | APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORCE MICROSCOPE | December 2021 | January 2026 | Abandon | 48 | 7 | 0 | No | No |
| 17296828 | Defect Inspection Device and Defect Inspection Method | December 2021 | February 2024 | Abandon | 33 | 1 | 0 | No | No |
| 17620375 | Arrangement Having a Measuring Apparatus for a Scanning Probe Microscope, Scanning Probe Microscope, and Method for Operating | December 2021 | June 2025 | Abandon | 42 | 4 | 0 | No | No |
| 17615414 | APPARATUS AND METHOD FOR DETECTING ONE OR MORE SCANNING CHARGED PARTICLE BEAMS | November 2021 | April 2025 | Allow | 41 | 2 | 0 | No | No |
| 17537422 | DISLOCATION TYPE AND DENSITY DISCRIMINATION IN SEMICONDUCTOR MATERIALS USING CATHODOLUMINESCENCE MEASUREMENTS | November 2021 | December 2022 | Allow | 13 | 0 | 0 | No | No |
| 17535453 | STAGE ANTI-FRETTING MECHANISM FOR ROLLER BEARING LIFETIME IMPROVEMENT | November 2021 | September 2024 | Allow | 33 | 2 | 0 | No | No |
| 17612507 | HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SCANNING PROBE MICROSCOPY SYSTEM | November 2021 | January 2023 | Allow | 14 | 0 | 0 | No | No |
| 17611424 | DIFFRACTOMETER FOR CHARGED-PARTICLE CRYSTALLOGRAPHY | November 2021 | April 2025 | Allow | 41 | 3 | 0 | Yes | No |
| 17594658 | Transmission Electron Microscope and Inspection Method Using Transmission Electron Microscope | October 2021 | July 2024 | Allow | 33 | 1 | 0 | No | No |
| 17293308 | Method And Control Unit For Demodulation | October 2021 | January 2024 | Allow | 32 | 1 | 0 | No | No |
| 17503334 | COMPACT LOW ANGLE ION BEAM EXTRACTION ASSEMBLY AND PROCESSING APPARATUS | October 2021 | September 2024 | Allow | 35 | 1 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner OSENBAUGH-STEWART, ELIZA W.
With a 20.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 28.1% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner OSENBAUGH-STEWART, ELIZA W works in Art Unit 2881 and has examined 650 patent applications in our dataset. With an allowance rate of 75.1%, this examiner has a below-average tendency to allow applications. Applications typically reach final disposition in approximately 25 months.
Examiner OSENBAUGH-STEWART, ELIZA W's allowance rate of 75.1% places them in the 40% percentile among all USPTO examiners. This examiner has a below-average tendency to allow applications.
On average, applications examined by OSENBAUGH-STEWART, ELIZA W receive 1.64 office actions before reaching final disposition. This places the examiner in the 33% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by OSENBAUGH-STEWART, ELIZA W is 25 months. This places the examiner in the 80% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +11.7% benefit to allowance rate for applications examined by OSENBAUGH-STEWART, ELIZA W. This interview benefit is in the 47% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 26.3% of applications are subsequently allowed. This success rate is in the 43% percentile among all examiners. Strategic Insight: RCEs show below-average effectiveness with this examiner. Carefully evaluate whether an RCE or continuation is the better strategy.
This examiner enters after-final amendments leading to allowance in 48.7% of cases where such amendments are filed. This entry rate is in the 73% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 66.7% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 56% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 54.5% of appeals filed. This is in the 26% percentile among all examiners. Of these withdrawals, 50.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.
When applicants file petitions regarding this examiner's actions, 73.9% are granted (fully or in part). This grant rate is in the 80% percentile among all examiners. Strategic Note: Petitions are frequently granted regarding this examiner's actions compared to other examiners. Per MPEP § 1002.02(c), various examiner actions are petitionable to the Technology Center Director, including prematureness of final rejection, refusal to enter amendments, and requirement for information. If you believe an examiner action is improper, consider filing a petition.
Examiner's Amendments: This examiner makes examiner's amendments in 0.8% of allowed cases (in the 64% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).
Quayle Actions: This examiner issues Ex Parte Quayle actions in 4.5% of allowed cases (in the 79% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.