Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18912204 | SEVERE WEATHER VORTEX DISRUPTION SYSTEM AND METHOD | October 2024 | January 2025 | Allow | 3 | 0 | 0 | No | No |
| 18751504 | HEAVY PEPTIDE APPROACH TO ACCURATELY MEASURE UNPROCESSED C-TERMINAL LYSINE | June 2024 | August 2025 | Abandon | 14 | 1 | 0 | No | No |
| 18680578 | STERILIZATION MODULE | May 2024 | September 2025 | Allow | 15 | 1 | 1 | No | No |
| 18643379 | FLUID TRANSFER SYSTEM IN A CHARGED PARTICLE SYSTEM | April 2024 | November 2024 | Allow | 6 | 0 | 0 | No | No |
| 18629633 | TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LOSS SPECTROSCOPY DETECTOR | April 2024 | November 2024 | Allow | 7 | 0 | 0 | No | No |
| 18617227 | SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACTIVE MATERIALS | March 2024 | December 2024 | Allow | 9 | 0 | 0 | No | No |
| 18599199 | DETACHABLE COLUMN UNIT OF SCANNING ELECTRON MICROSCOPE, AND METHOD FOR PROVIDING THE SAME | March 2024 | October 2024 | Allow | 7 | 0 | 0 | No | No |
| 18583973 | Charged Particle Beam Device | February 2024 | October 2024 | Allow | 7 | 0 | 0 | No | No |
| 18431847 | SYSTEM COMPRISING A MULTI-BEAM PARTICLE MICROSCOPE AND METHOD FOR OPERATING THE SAME | February 2024 | January 2025 | Allow | 11 | 1 | 0 | No | No |
| 18408347 | LIVE CHEMICAL IMAGING WITH MULTIPLE DETECTORS | January 2024 | February 2026 | Allow | 25 | 0 | 0 | No | No |
| 18574428 | Device For Interfacing A Sample Transfer Device To An Analytic Or Sample Preparation Device And A Container For Transporting A Sample Under Environmentally Controlled Conditions | December 2023 | December 2024 | Abandon | 12 | 0 | 1 | No | No |
| 18574339 | STERILIZATION DEVICE | December 2023 | February 2026 | Allow | 26 | 0 | 0 | No | No |
| 18395805 | Transmission electron microscopy with square beams | December 2023 | September 2024 | Allow | 8 | 1 | 0 | No | No |
| 18527974 | SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF | December 2023 | March 2025 | Abandon | 16 | 1 | 0 | No | No |
| 18522313 | Determining a position of an object in a beam apparatus | November 2023 | February 2026 | Allow | 27 | 0 | 0 | No | No |
| 18562345 | SAMPLE HOLDER AND IMPEDANCE MICROSCOPE | November 2023 | February 2026 | Allow | 27 | 0 | 0 | No | No |
| 18507857 | Charged Particle Beam Apparatus | November 2023 | February 2026 | Allow | 27 | 0 | 0 | No | No |
| 18290295 | MASS SPECTROMETER | November 2023 | March 2026 | Allow | 28 | 0 | 0 | No | No |
| 18379400 | CHARGED PARTICLE BEAM SYSTEM, METHOD OF OPERATING A CHARGED PARTICLE BEAM SYSTEM, METHOD OF RECORDING A PLURALITY OF IMAGES AND COMPUTER PROGRAMS FOR EXECUTING THE METHODS | October 2023 | March 2025 | Allow | 17 | 3 | 0 | Yes | No |
| 18483038 | LITHOGRAPHY SYSTEM WITH NON-INVASIVE MONITORING AND METHODS | October 2023 | February 2026 | Allow | 29 | 0 | 1 | No | No |
| 18284824 | SYSTEM AND METHOD FOR DETERMINING LOCAL FOCUS POINTS DURING INSPECTION IN A CHARGED PARTICLE SYSTEM | September 2023 | November 2025 | Allow | 25 | 0 | 0 | No | No |
| 18474982 | METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELECTRON MICROSCOPY | September 2023 | October 2024 | Allow | 13 | 0 | 0 | No | No |
| 18473991 | INERT NON-ADSORBING CRIMPABLE CAPILLARIES AND DEVICES FOR ADJUSTING GAS FLOW IN ISOTOPE RATIO ANALYSIS | September 2023 | July 2024 | Allow | 10 | 1 | 0 | Yes | No |
| 18283499 | Charged Particle Beam System | September 2023 | February 2026 | Allow | 29 | 0 | 0 | No | No |
| 18459616 | ELECTROSPRAY ION SOURCE FOR SPECTROMETRY USING INDUCTIVELY HEATED GAS | September 2023 | July 2024 | Allow | 11 | 1 | 0 | No | No |
| 18456997 | METHOD AND APPARATUS FOR USABLE BEAM CURRENT AND BRIGHTNESS IN SCHOTTKY THERMAL FIELD EMISSION (TFE) | August 2023 | July 2024 | Allow | 11 | 1 | 0 | Yes | No |
| 18456246 | TECHNIQUES FOR IMAGING LOW DUTY CYCLE SIGNALS USING A SCANNING ELECTRON MICROSCOPE | August 2023 | September 2025 | Allow | 25 | 0 | 0 | No | No |
| 18362757 | THERMAL-AIDED INSPECTION BY ADVANCED CHARGE CONTROLLER MODULE IN A CHARGED PARTICLE SYSTEM | July 2023 | June 2024 | Allow | 11 | 1 | 0 | No | No |
| 18227417 | COLLECTION PROBE AND METHODS FOR THE USE THEREOF | July 2023 | April 2024 | Allow | 9 | 0 | 0 | No | No |
| 18360731 | METHOD AND SYSTEM FOR THE REMOVAL AND/OR AVOIDANCE OF CONTAMINATION IN CHARGED PARTICLE BEAM SYSTEMS | July 2023 | September 2024 | Allow | 13 | 2 | 0 | No | No |
| 18262972 | DYNAMIC HEATING OF A DIFFERENTIAL MOBILITY SPECTROMETER CELL | July 2023 | December 2025 | Allow | 29 | 0 | 1 | No | No |
| 18013761 | PROCESS APPARATUS INCLUDING DIFFERENTIAL PUMPING DEVICE AND FOCUSED ION BEAM COLUMN | July 2023 | December 2025 | Allow | 36 | 1 | 0 | No | No |
| 18357869 | DETECTOR AND METHOD FOR OBTAINING KIKUCHI IMAGES | July 2023 | January 2026 | Allow | 30 | 1 | 0 | No | No |
| 18357056 | FIB AND SEM RESOLUTION ENHANCEMENT USING ASYMMETRIC PROBE DECONVOLUTION | July 2023 | December 2025 | Allow | 29 | 1 | 0 | Yes | No |
| 18220931 | SCANNING ELECTRON MICROSCOPY-BASED SAMPLE ANALYSIS | July 2023 | March 2026 | Allow | 32 | 0 | 1 | No | No |
| 18345675 | MICROSCOPE ABERRATION CORRECTION | June 2023 | September 2025 | Allow | 27 | 0 | 0 | No | No |
| 18269269 | ELECTRON OPTICAL COLUMN AND METHOD FOR DIRECTING A BEAM OF PRIMARY ELECTRONS ONTO A SAMPLE | June 2023 | November 2025 | Allow | 28 | 0 | 0 | No | No |
| 18337397 | XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION | June 2023 | July 2024 | Allow | 13 | 1 | 0 | No | No |
| 18333699 | EXAMINING, ANALYZING AND/OR PROCESSING AN OBJECT USING AN OBJECT RECEIVING CONTAINER | June 2023 | April 2025 | Allow | 22 | 3 | 0 | No | No |
| 18207353 | SHOE CARE APPARATUS | June 2023 | November 2025 | Allow | 30 | 1 | 0 | Yes | No |
| 18328668 | AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS | June 2023 | October 2025 | Allow | 28 | 0 | 0 | No | No |
| 18039446 | Immunostaining Method, Sample Exchange Chamber, And Charged Particle Beam Apparatus | May 2023 | October 2025 | Allow | 29 | 1 | 0 | No | No |
| 18202767 | COMPACT 2D SCANNER MAGNET WITH TRAPEZOIDAL COILS | May 2023 | July 2025 | Allow | 26 | 0 | 0 | No | No |
| 18323669 | ORIENTATION TOOL FOR ELECTRON BACKSCATTER DIFFRACTION | May 2023 | March 2026 | Allow | 34 | 1 | 1 | No | No |
| 18201536 | ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY | May 2023 | April 2024 | Allow | 11 | 0 | 0 | No | No |
| 18321476 | MODULAR ION GENERATOR DEVICE | May 2023 | June 2024 | Allow | 13 | 2 | 0 | No | No |
| 18321442 | METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE | May 2023 | January 2024 | Allow | 8 | 0 | 0 | No | No |
| 18199728 | Electron Microscope and Calibration Method | May 2023 | July 2025 | Allow | 26 | 0 | 0 | No | No |
| 18319807 | ADAPTIVE FOOTWEAR SANITIZATION DEVICE | May 2023 | January 2026 | Abandon | 32 | 1 | 0 | No | No |
| 18319554 | CHARGED PARTICLE BEAM DEVICE | May 2023 | September 2025 | Allow | 28 | 0 | 0 | No | No |
| 18037458 | Systems and Method for Image and/or Video Processing of Mass Spectrometry Data | May 2023 | September 2025 | Allow | 28 | 0 | 0 | No | No |
| 18316842 | SYSTEM FOR DISINFECTING LARGER SCALE SPACES AND EQUIPMENT | May 2023 | March 2025 | Abandon | 22 | 2 | 0 | No | No |
| 18196396 | ENTROPY BASED IMAGE PROCESSING FOR FOCUSED ION BEAM DELAYER – EDGE SLICES DETECTION | May 2023 | January 2025 | Allow | 20 | 0 | 0 | No | No |
| 18308265 | SYSTEMS AND METHODS OF OPERATION OF LINEAR ION TRAPS IN DUAL BALANCED AC/UNBALANCED RF MODE FOR 2D MASS SPECTROMETRY | April 2023 | March 2024 | Allow | 10 | 1 | 0 | No | No |
| 18139184 | MODULATION OF ROLLING K VECTORS OF ANGLED GRATINGS | April 2023 | May 2024 | Allow | 13 | 1 | 0 | Yes | No |
| 18031359 | CHARGED PARTICLE BEAM APPARATUS | April 2023 | November 2025 | Allow | 31 | 0 | 1 | No | No |
| 18298327 | INTERACTIVE ANALYSIS OF MASS SPECTROMETRY DATA INCLUDING PEAK SELECTION AND DYNAMIC LABELING | April 2023 | April 2025 | Allow | 24 | 0 | 0 | No | No |
| 18132162 | LASER-SUSTAINED PLASMA SOURCE BASED ON COLLIDING LIQUID JETS | April 2023 | October 2023 | Allow | 7 | 0 | 0 | No | No |
| 18193545 | CRENELLATED SAMPLE HOLDER AND SPUTTER TARGET FOR SAMPLE PREPARATION IN CRYO ELECTRON MICROSCOPY APPLICATIONS | March 2023 | July 2025 | Allow | 28 | 1 | 0 | No | No |
| 18126322 | METHOD FOR CALIBRATING A SCANNING CHARGED PARTICLE MICROSCOPE | March 2023 | November 2023 | Allow | 8 | 1 | 1 | No | No |
| 18187966 | METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION | March 2023 | August 2024 | Allow | 16 | 3 | 0 | No | No |
| 18123216 | CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD | March 2023 | June 2025 | Allow | 27 | 0 | 0 | Yes | No |
| 18027051 | METAL PATTERN INSPECTION METHOD AND FOCUSED ION BEAM APPARATUS | March 2023 | September 2025 | Allow | 30 | 1 | 0 | No | No |
| 18122388 | ELECTRON GUN AND ELECTRON MICROSCOPE | March 2023 | October 2024 | Allow | 19 | 2 | 0 | No | No |
| 18184761 | MICROSCOPIC SPECIMEN AND ANALYSIS METHOD THEREOF USING MICROSCOPE | March 2023 | June 2025 | Allow | 27 | 0 | 0 | No | No |
| 18185324 | MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH FAST AUTOFOCUS AROUND AN ADJUSTABLE WORKING DISTANCE | March 2023 | August 2025 | Allow | 29 | 1 | 0 | No | No |
| 18120278 | DELAY TIME MEASUREMENT METHOD AND SYSTEM | March 2023 | August 2025 | Allow | 29 | 0 | 1 | No | No |
| 18019626 | Machine Difference Corrrection Method for Mass Spectrometry Apparatus | March 2023 | July 2025 | Allow | 29 | 0 | 1 | No | No |
| 18118461 | High resolution multi-reflection time-of-flight mass analyser | March 2023 | July 2025 | Allow | 28 | 1 | 0 | No | No |
| 18023545 | METHODS AND SYSTEMS INCLUDING PULSED DUAL-BEAM CHARGE NEUTRALIZATION | February 2023 | October 2023 | Allow | 8 | 1 | 0 | No | No |
| 18170526 | MEMS SAMPLE HOLDER, PACKAGED PRODUCT THEREOF, AND APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTRON MICROSCOPE USING THE SAME | February 2023 | October 2023 | Allow | 8 | 1 | 0 | No | No |
| 18110284 | METHOD OF FORMING A MULTIPOLE DEVICE, METHOD OF INFLUENCING AN ELECTRON BEAM, AND MULTIPOLE DEVICE | February 2023 | September 2025 | Allow | 31 | 1 | 1 | Yes | No |
| 18107042 | Aberration Corrector and Electron Microscope | February 2023 | November 2025 | Allow | 33 | 1 | 0 | No | No |
| 18019347 | Charged Particle Beam Device | February 2023 | December 2025 | Allow | 35 | 1 | 0 | No | No |
| 18018900 | Electron Source, Method of Manufacturing the Same, And Electron Beam Apparatus Using the Same | January 2023 | May 2025 | Allow | 28 | 0 | 0 | No | No |
| 18019088 | SYSTEMS AND METHODS FOR PULSED VOLTAGE CONTRAST DETECTION AND CAPTURE OF CHARGING DYNAMICS | January 2023 | October 2025 | Allow | 32 | 1 | 0 | No | No |
| 18102766 | METHODS AND APPARATUSES FOR ADJUSTING BEAM CONDITION OF CHARGED PARTICLES | January 2023 | November 2023 | Allow | 10 | 1 | 0 | No | No |
| 18159852 | MULTIPLE PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATION, METHOD FOR OPERATING A MULTIPLE PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATION AND ASSOCIATED COMPUTER PROGRAM PRODUCT | January 2023 | March 2026 | Allow | 38 | 2 | 0 | No | No |
| 18006804 | TERAHERTZ DEVICE | January 2023 | December 2025 | Allow | 35 | 2 | 0 | No | No |
| 18159261 | METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELECTRON MICROSCOPY | January 2023 | August 2023 | Allow | 7 | 1 | 0 | No | No |
| 18016104 | CHARGED PARTICLE BEAM DEVICE | January 2023 | May 2025 | Allow | 28 | 0 | 0 | No | No |
| 18153031 | DESORBER FOR A SPECTROMETER | January 2023 | April 2024 | Allow | 15 | 1 | 0 | No | No |
| 18014803 | CHARGED PARTICLE BEAM DEVICE, AND SAMPLE OBSERVATION METHOD EMPLOYING SAME | January 2023 | June 2025 | Allow | 29 | 0 | 0 | No | No |
| 18149189 | MASS SPECTROMETRY IMAGING WITH SUBSTANCE IDENTIFICATION USING ION MOBILITY | January 2023 | June 2023 | Allow | 5 | 0 | 0 | No | No |
| 18148647 | SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTEM PROBES | December 2022 | December 2023 | Abandon | 12 | 1 | 0 | No | No |
| 18003778 | AIR PURIFICATION SYSTEM FOR AN ION MOBILITY SPECTROMETER, CORRESPONDING METHOD OF OPERATION AND ION MOBILITY SPECTROMETER | December 2022 | August 2025 | Allow | 32 | 1 | 0 | No | No |
| 18002937 | WORK FUNCTION MEASUREMENTS FOR SURFACE ANALYSIS | December 2022 | September 2025 | Allow | 32 | 0 | 0 | No | No |
| 18012478 | Charged Particle Beam Device and Scan Waveform Generation Method | December 2022 | July 2025 | Allow | 31 | 1 | 0 | No | No |
| 18009898 | CHARGED PARTICLE BEAM DEVICE, AND METHOD FOR ADJUSTING IMAGE CAPTURING CONDITIONS IN SAID CHARGED PARTICLE BEAM DEVICE | December 2022 | June 2025 | Allow | 30 | 0 | 1 | No | No |
| 18064156 | REPLACEMENT AND REFILL METHOD FOR DROPLET GENERATOR | December 2022 | January 2024 | Allow | 13 | 0 | 1 | No | No |
| 18077635 | INSPECTION DEVICE AND INSPECTION METHOD | December 2022 | May 2025 | Allow | 30 | 0 | 0 | No | No |
| 18074630 | Mobility Based Filtering of Ions | December 2022 | October 2024 | Allow | 22 | 3 | 0 | No | No |
| 18007716 | CONTRAST-ENHANCING STAINING SYSTEM AND METHOD AND IMAGING METHODS AND SYSTEMS RELATED THERETO | December 2022 | August 2025 | Allow | 33 | 0 | 0 | No | No |
| 17928691 | SAMPLE IMAGE OBSERVATION DEVICE AND METHOD FOR SAME | November 2022 | July 2025 | Allow | 31 | 1 | 0 | No | No |
| 18070659 | PROBE TIP X-Y LOCATION IDENTIFICATION USING A CHARGED PARTICLE BEAM | November 2022 | August 2024 | Allow | 20 | 0 | 0 | No | No |
| 17926955 | METHODS FOR ANALYZING INTERMOLECULAR INTERACTIONS IN MICROCRYSTALS | November 2022 | September 2025 | Allow | 34 | 1 | 0 | No | No |
| 17991168 | CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION OF A CHARGED PARTICLE BEAM, AND METHOD THEREOF | November 2022 | May 2025 | Allow | 30 | 0 | 0 | No | No |
| 17984041 | ELECTRICAL IMPEDANCE MEASUREMENT USING AN ELECTRON BEAM | November 2022 | July 2025 | Allow | 32 | 0 | 0 | No | No |
| 17981141 | TILT-COLUMN MULTI-BEAM ELECTRON MICROSCOPY SYSTEM AND METHOD | November 2022 | April 2024 | Allow | 17 | 0 | 0 | No | No |
| 17978518 | Phase Analyzer, Sample Analyzer, and Analysis Method | November 2022 | September 2025 | Allow | 35 | 2 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner MCCORMACK, JASON L.
With a 52.0% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 32.7% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner MCCORMACK, JASON L works in Art Unit 2881 and has examined 1,060 patent applications in our dataset. With an allowance rate of 85.8%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 19 months.
Examiner MCCORMACK, JASON L's allowance rate of 85.8% places them in the 63% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by MCCORMACK, JASON L receive 1.75 office actions before reaching final disposition. This places the examiner in the 38% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by MCCORMACK, JASON L is 19 months. This places the examiner in the 95% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +7.4% benefit to allowance rate for applications examined by MCCORMACK, JASON L. This interview benefit is in the 36% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 28.7% of applications are subsequently allowed. This success rate is in the 53% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 41.4% of cases where such amendments are filed. This entry rate is in the 63% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 52.2% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 46% percentile among all examiners. Note: Pre-appeal conferences show below-average success with this examiner. Consider whether your arguments are strong enough to warrant a PAC request.
This examiner withdraws rejections or reopens prosecution in 61.5% of appeals filed. This is in the 39% percentile among all examiners. Of these withdrawals, 32.5% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.
When applicants file petitions regarding this examiner's actions, 53.8% are granted (fully or in part). This grant rate is in the 55% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.
Examiner's Amendments: This examiner makes examiner's amendments in 0.5% of allowed cases (in the 60% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).
Quayle Actions: This examiner issues Ex Parte Quayle actions in 3.7% of allowed cases (in the 77% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.