Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 19084627 | MASS SPECTROMETRY SYSTEM AND METHOD WITH STACKED-RING ION TRANSFER DEVICE | March 2025 | June 2025 | Allow | 3 | 0 | 0 | No | No |
| 19074174 | SYSTEM AND METHOD FOR ION PACKET FORMATION, DELIVERY, AND CALIBRATION IN MASS SPECTROMETRY | March 2025 | June 2025 | Allow | 4 | 1 | 0 | No | No |
| 19074212 | MASS SPECTROMETRY SYSTEM AND METHOD WITH CONTROLLED ION TRANSFER | March 2025 | June 2025 | Allow | 3 | 1 | 0 | No | No |
| 19023867 | AUTOMATIC MAGNETIC IMPURITY SAMPLE ISOLATION | January 2025 | August 2025 | Allow | 7 | 0 | 1 | No | No |
| 18975232 | APPARATUS FOR SANITIZING A FIBEROPTIC ENDOSCOPE | December 2024 | March 2025 | Allow | 3 | 0 | 0 | No | No |
| 18799273 | ION ANALYSIS APPARATUS AND METHOD | August 2024 | November 2024 | Allow | 3 | 0 | 0 | No | No |
| 18675535 | UNMANNED HUMAN ANALOGUE | May 2024 | September 2024 | Allow | 4 | 0 | 0 | No | No |
| 18668048 | CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE MEASUREMENTS | May 2024 | December 2024 | Allow | 7 | 0 | 0 | No | No |
| 18650681 | BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER | April 2024 | December 2024 | Allow | 7 | 0 | 0 | No | No |
| 18648278 | ULTRATHIN CONFORMAL COATINGS FOR ELECTROSTATIC DISSIPATION IN SEMICONDUCTOR PROCESS TOOLS | April 2024 | October 2025 | Allow | 18 | 1 | 1 | Yes | No |
| 18643509 | METHOD AND SYSTEM OF IDENTIFYING AND QUANTIFYING ANTIBODY FRAGMENTATION | April 2024 | November 2024 | Allow | 7 | 0 | 0 | No | No |
| 18624417 | Voltage Supply for a Mass Analyser | April 2024 | October 2024 | Allow | 7 | 0 | 0 | No | No |
| 18617563 | REUSABLE STRAW AND CASE WITH INTEGRATED CLEANING, DRYING AND SANITIZING MEMBER | March 2024 | December 2024 | Allow | 9 | 0 | 0 | No | No |
| 18610570 | HIGH RESOLUTION IMAGING APPARATUS AND METHOD | March 2024 | September 2024 | Allow | 6 | 0 | 0 | No | No |
| 18610673 | HIGH CONFIDENCE COMPOUND IDENTIFICATION BY LIQUID CHROMATOGRAPHY-MASS SPECTROMETRY | March 2024 | November 2024 | Allow | 8 | 0 | 0 | No | No |
| 18435492 | VERIFICATION METHODS AND AGRONOMIC ENHANCEMENTS FOR CARBON REMOVAL BASED ON ENHANCED ROCK WEATHERING | February 2024 | May 2025 | Allow | 16 | 2 | 0 | Yes | No |
| 18426207 | METHOD AND SYSTEM FOR NANOSCALE DATA RECORDING | January 2024 | May 2025 | Allow | 16 | 1 | 0 | No | No |
| 18400300 | NANOPARTICLE ANALYSIS FOR ULTRA-LOW LEVEL CONCENTRATIONS OF NANOPARTICLES IN FLUID SAMPLES | December 2023 | April 2024 | Allow | 3 | 0 | 0 | No | No |
| 18391303 | APPARATUS AND METHOD FOR AGRICULTURAL CONTAMINANT DETECTION | December 2023 | July 2024 | Allow | 7 | 1 | 0 | No | No |
| 18532965 | PROXIMITY SENSOR FOR ELECTRON BACKSCATTER DIFFRACTION SYSTEMS | December 2023 | February 2026 | Allow | 26 | 0 | 0 | No | No |
| 18525048 | APPARATUS FOR ANALYZING METAL CONTAMINATION OF A WAFER AND A METHOD THEREOF | November 2023 | February 2026 | Allow | 26 | 0 | 0 | No | No |
| 18525401 | DISTORTION OPTIMIZED MULTI-BEAM SCANNING SYSTEM | November 2023 | February 2026 | Allow | 26 | 0 | 0 | No | No |
| 18516645 | ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK | November 2023 | June 2024 | Allow | 7 | 0 | 0 | No | No |
| 18505760 | ACTIVE PIEZO STABILIZATION OF AN ION TRAP | November 2023 | January 2026 | Allow | 26 | 0 | 0 | No | No |
| 18559750 | SAMPLE SUPPORTS FOR CRYO-ELECTRON MICROSCOPY | November 2023 | January 2026 | Allow | 27 | 0 | 0 | No | No |
| 18504720 | ULTRA-MICRO ELECTRODE FOR ELECTROCHEMICAL ANALYSIS AND METHOD OF MANUFACTURING THE SAME | November 2023 | January 2026 | Allow | 27 | 0 | 0 | No | No |
| 18559408 | High-Voltage Insulating Structure, Charged Particle Gun, and Charged Particle Beam Device | November 2023 | February 2026 | Allow | 27 | 0 | 0 | No | No |
| 18502683 | MULTI-BEAM CHARGED PARTICLE SYSTEM AND METHOD OF CONTROLLING THE WORKING DISTANCE IN A MULTI-BEAM CHARGED PARTICLE SYSTEM | November 2023 | December 2025 | Allow | 25 | 0 | 0 | No | No |
| 18499548 | Shape-based proximity effect correction method for throughput, patterning fidelity, and contrast enhancement of particle beam lithography and imaging structure | November 2023 | December 2025 | Allow | 26 | 0 | 0 | No | No |
| 18498970 | SUBSTRATE STRESS MANAGEMENT USING VARIABLE ENERGY AND VARIABLE DOSE IMPLANTATION | October 2023 | December 2025 | Allow | 26 | 0 | 0 | No | No |
| 18493889 | EUV LIGHT SOURCE WITH A SEPARATION DEVICE | October 2023 | December 2023 | Allow | 2 | 0 | 0 | No | No |
| 18493961 | MULTI CHARGED PARTICLE BEAM WRITING APPARATUS | October 2023 | November 2025 | Allow | 25 | 0 | 0 | No | No |
| 18554840 | AUTOMATED METHOD PARAMETER CONFIGURATION FOR DIFFERENTIAL MOBILITY SPECTROMETRY SEPARATIONS | October 2023 | December 2025 | Allow | 26 | 0 | 0 | No | No |
| 18378421 | ENERGY FILTER ELEMENT FOR ION IMPLANTATION SYSTEMS FOR THE USE IN THE PRODUCTION OF WAFERS | October 2023 | May 2024 | Allow | 7 | 0 | 0 | No | No |
| 18377481 | DATA INDEPENDENT ACQUISITION WITH PARALLEL ISOLATION MULTIPLEXING | October 2023 | November 2025 | Allow | 25 | 0 | 0 | No | No |
| 18285988 | BIO-IDENTIFICATION USING LOW RESOLUTION TANDEM MASS SPECTROMETRY | October 2023 | December 2025 | Allow | 26 | 0 | 0 | No | No |
| 18474142 | SAMPLE PROBE SYSTEMS AND ASSOCIATED METHODS | September 2023 | October 2025 | Allow | 25 | 0 | 0 | No | No |
| 18283605 | MASS SPECTROMETER AND MASS SPECTROMETRY METHOD | September 2023 | February 2026 | Allow | 29 | 1 | 0 | No | No |
| 18370158 | ADJUSTABLE EXIT ANGLE SOURCE FOR IONS AND NEUTRAL PARTICLES | September 2023 | October 2025 | Allow | 25 | 0 | 0 | No | No |
| 18469517 | SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANALYSIS USING SECONDARY ION MASS SPECTROMETRY | September 2023 | August 2024 | Allow | 10 | 1 | 0 | No | No |
| 18466753 | DETERMINING AN EXPECTED RESPONSE OF A MASS SPECTROMETER | September 2023 | October 2025 | Allow | 25 | 0 | 0 | No | No |
| 18465292 | C PEPTIDE DETECTION BY MASS SPECTROMETRY | September 2023 | September 2024 | Allow | 12 | 1 | 0 | No | No |
| 18461176 | MAGNETO-OPTICAL TRAP METHOD AND APPARATUS USING POSITIVE AND NEGATIVE G-FACTORS | September 2023 | March 2024 | Allow | 7 | 0 | 0 | No | No |
| 18278544 | Bent PCB Ion Guide for Reduction of Contamination and Noise | August 2023 | October 2025 | Allow | 25 | 0 | 0 | No | No |
| 18021717 | MASS SPECTROMETRY CONTROL DEVICE, MASS SPECTROMETRY DEVICE, MASS SPECTROMETRY METHOD AND A NON-TRANSITORY COMPUTER READABLE MEDIUM STORING PROGRAM | August 2023 | October 2025 | Allow | 32 | 0 | 0 | No | No |
| 18230722 | OPERATING A GAS FEED DEVICE FOR A PARTICLE BEAM APPARATUS | August 2023 | February 2024 | Allow | 7 | 0 | 0 | No | No |
| 18364400 | TIME OF FLIGHT MASS ANALYSER AND METHOD OF TIME OF FLIGHT MASS SPECTROMETRY | August 2023 | September 2025 | Allow | 25 | 0 | 0 | No | No |
| 18274597 | WIDE RANGE ELECTRON IMPACT ION SOURCE FOR A MASS SPECTROMETER | July 2023 | May 2024 | Allow | 10 | 0 | 0 | No | No |
| 18357872 | ULTRA-COMPACT ION MASS SPECTROMETER FOR SPACE AND LABORATORY PLASMA MEASUREMENTS | July 2023 | September 2025 | Allow | 26 | 0 | 0 | No | No |
| 18357686 | DEEP STRUCTURE SIGNAL DETECTION AND ENHANCEMENT BY SEPARATION TO UPPER (TOPOGRAPHY) AND LOWER (BOTTOM) AREAS FOR ROBUST BLIND DENOISING SELF SUPERVISION (BDSS) | July 2023 | September 2025 | Allow | 26 | 0 | 0 | No | No |
| 18222280 | ROTATABLE TEM GRID HOLDER FOR IMPROVED FIB THINNING PROCESS | July 2023 | August 2025 | Allow | 25 | 0 | 0 | No | No |
| 18272295 | HAZARDOUS WASTE CANISTER SYSTEMS AND METHODS | July 2023 | October 2025 | Allow | 27 | 0 | 0 | No | No |
| 18347918 | METHOD FOR CROSS-SECTION SAMPLE PREPARATION | July 2023 | January 2024 | Allow | 7 | 0 | 0 | No | No |
| 18218932 | PROCESSING ION PEAK AREAS IN MASS SPECTROMETRY | July 2023 | November 2025 | Allow | 29 | 0 | 0 | No | No |
| 18259015 | MASS AND/OR ION MOBILITY SPECTROMETRY | June 2023 | February 2026 | Allow | 32 | 0 | 0 | No | No |
| 18267502 | Charged Particle Beam Device | June 2023 | October 2025 | Allow | 28 | 0 | 0 | No | No |
| 18333174 | METHOD FOR OPTIMIZING A PARAMETER SETTING OF AT LEAST ONE MASS SPECTROMETRY DEVICE | June 2023 | October 2025 | Allow | 28 | 0 | 0 | No | No |
| 18208598 | Charged Particle Beam Device and Image Acquisition Method | June 2023 | August 2025 | Allow | 26 | 0 | 0 | No | No |
| 18207644 | AUTOFOCUS METHOD FOR SINGLE BEAM AND MULTI-BEAM SYSTEMS | June 2023 | January 2026 | Allow | 32 | 1 | 0 | No | No |
| 18037383 | SAMPLE SUPPORT BODY, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD | May 2023 | July 2025 | Allow | 26 | 0 | 0 | No | No |
| 18196548 | SEMICONDUCTOR WAFER | May 2023 | November 2023 | Allow | 7 | 0 | 0 | No | No |
| 18313241 | PARALLEL PROCESSING AND HORIZONTAL SCALING FOR PEAK DETECTION | May 2023 | November 2025 | Allow | 30 | 0 | 0 | No | No |
| 18312991 | RADIATION SOURCE APPARATUS AND METHOD FOR USING THE SAME | May 2023 | November 2023 | Allow | 7 | 0 | 0 | No | No |
| 18035589 | Charged Particle Beam Apparatus and Report Creation Method | May 2023 | November 2025 | Allow | 30 | 0 | 0 | No | No |
| 18035331 | ELECTROSTATIC ION TRAP | May 2023 | August 2024 | Allow | 15 | 0 | 0 | No | No |
| 18312579 | EXTREME ULTRAVIOLET (EUV) RADIATION SOURCE APPARATUS, EUV LITHOGRAPHY SYSTEM, AND METHOD FOR GENERATING EXTREME ULTRAVIOLET RADIATION | May 2023 | August 2025 | Allow | 27 | 0 | 0 | No | No |
| 18141327 | DEBRIS MITIGATION DEVICE AND LIGHT SOURCE APPARATUS INCLUDING THE SAME | April 2023 | July 2025 | Allow | 26 | 0 | 0 | No | No |
| 18140771 | CYCLOIDAL MASS SPECTROMETER AND METHOD FOR ADJUSTING RESOLUTION THEREOF | April 2023 | August 2025 | Allow | 27 | 0 | 0 | No | No |
| 18034322 | Pattern Measurement Device | April 2023 | July 2025 | Allow | 27 | 0 | 0 | No | No |
| 18033324 | CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE MEASUREMENTS | April 2023 | August 2023 | Allow | 4 | 0 | 0 | No | No |
| 18250109 | PRECISION OPTICAL SPECTROSCOPY IN A MASS SPECTROMETER | April 2023 | February 2026 | Allow | 34 | 0 | 1 | No | No |
| 18129533 | LIGHT SOURCE APPARATUS | March 2023 | June 2025 | Allow | 27 | 0 | 0 | No | No |
| 18128330 | Measurement System and Measurement Method | March 2023 | August 2025 | Allow | 29 | 0 | 0 | No | No |
| 18128583 | VERIFICATION METHODS AND AGRONOMIC ENHANCEMENTS FOR CARBON REMOVAL BASED ON ENHANCED ROCK WEATHERING | March 2023 | October 2023 | Allow | 7 | 0 | 0 | No | No |
| 18028862 | SAMPLE HOLDER FOR DETECTION OF HYDROGEN PERMEATION AND HYDROGEN PERMEATION AND DIFFUSION PATH OBSERVATION DEVICE | March 2023 | October 2025 | Allow | 31 | 1 | 0 | No | No |
| 18029004 | Charged Particle Beam Apparatus | March 2023 | June 2025 | Allow | 27 | 0 | 0 | No | No |
| 18028931 | MASS SPECTROMETRY METHOD AND MASS SPECTROMETER | March 2023 | January 2026 | Allow | 34 | 1 | 0 | No | No |
| 18190168 | INSTRUMENT, INCLUDING AN ELECTROSTATIC LINEAR ION TRAP, FOR ANALYZING IONS | March 2023 | December 2024 | Allow | 21 | 0 | 0 | No | No |
| 18027024 | ANALYSIS DATA PROCESSING DEVICE, ANALYSIS DEVICE, ANALYSIS DATA PROCESSING METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIUM STORING EXAMINATION PROGRAM | March 2023 | June 2025 | Allow | 27 | 0 | 0 | No | No |
| 18121550 | SYSTEM AND METHOD FOR THE ACOUSTIC LOADING OF AN ANALYTICAL INSTRUMENT USING A CONTINUOUS FLOW SAMPLING PROBE | March 2023 | July 2024 | Allow | 16 | 2 | 0 | No | No |
| 18120677 | ION CYCLOTRON RESONANCE SEPARATOR APPARATUS AND METHOD OF USE THEREOF | March 2023 | August 2025 | Allow | 29 | 0 | 0 | No | No |
| 18116076 | APPARATUS AND METHOD FOR AGRICULTURAL CONTAMINANT DETECTION | March 2023 | May 2023 | Allow | 3 | 0 | 0 | No | No |
| 18023692 | SAMPLE PREPARATION METHOD AND APPARATUS | February 2023 | September 2025 | Allow | 31 | 0 | 0 | No | No |
| 18019485 | SINGLE ION DETECTION METHOD AND DEVICE | February 2023 | August 2023 | Allow | 7 | 0 | 0 | No | No |
| 18105083 | Apparatus for Ion Manipulation Having Curved Turn Regions | February 2023 | February 2026 | Allow | 36 | 1 | 0 | No | No |
| 18104508 | JOINT NANOSCALE THREE-DIMENSIONAL IMAGING AND CHEMICAL ANALYSIS | February 2023 | February 2026 | Allow | 37 | 1 | 0 | No | No |
| 18018926 | TIME-OF-FLIGHT MASS SPECTROMETER ASSEMBLY WITH A SECONDARY FLANGE | January 2023 | May 2023 | Allow | 3 | 0 | 0 | No | No |
| 18103238 | NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATURE MEASUREMENTS | January 2023 | December 2025 | Allow | 34 | 1 | 0 | No | No |
| 18101911 | ANTIMICROBIAL LIGHT-EMITTING PERCUTANEOUS SITE DRESSING | January 2023 | May 2024 | Allow | 15 | 1 | 0 | No | No |
| 18017904 | METHOD OF DETECTING RADICALS USING MASS SPECTROMETRY | January 2023 | May 2023 | Allow | 4 | 0 | 0 | No | No |
| 18099656 | RESIDUAL GAS ANALYSER, AND EUV LITHOGRAPHY SYSTEM HAVING A RESIDUAL GAS ANALYSER | January 2023 | January 2026 | Allow | 36 | 1 | 0 | No | No |
| 18016162 | Charge Reduced Mass Spectrometry for Sequencing of Oligonucleotide Therapeutics | January 2023 | May 2025 | Allow | 28 | 0 | 0 | No | No |
| 18095860 | Ion accumulation control for analytical instrument | January 2023 | May 2025 | Allow | 28 | 0 | 0 | No | No |
| 18152684 | METHOD AND APPARATUS FOR IMPROVED ELECTROSPRAY EMITTER LIFETIME | January 2023 | April 2023 | Allow | 3 | 0 | 0 | No | No |
| 18150314 | CURVED ION GUIDES AND RELATED SYSTEMS AND METHODS | January 2023 | May 2025 | Allow | 29 | 0 | 0 | No | No |
| 18091994 | ROTATING TARGET FOR EXTREME ULTRAVIOLET SOURCE WITH LIQUID METAL | December 2022 | April 2024 | Allow | 16 | 0 | 0 | No | No |
| 18147976 | EUV COLLECTOR | December 2022 | June 2025 | Allow | 60 | 0 | 0 | No | No |
| 18146768 | INSTRUMENT FOR SEPARATING IONS INCLUDING AN ELECTROSTATIC LINEAR ION TRAP TO SIMULTANEOUSLY TRAP MULTIPLE IONS | December 2022 | December 2024 | Allow | 24 | 0 | 0 | No | No |
| 18076500 | CHARGED PARTICLE DETECTOR | December 2022 | June 2025 | Allow | 30 | 0 | 0 | No | No |
| 18074824 | METHOD OF GENERATING A CRYSTALLINE ORIENTATION MAP OF A SURFACE PORTION OF A SAMPLE AND COMPUTER PROGRAM PRODUCT | December 2022 | April 2025 | Allow | 29 | 0 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner NGUYEN, KIET TUAN.
With a 100.0% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 70.6% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner NGUYEN, KIET TUAN works in Art Unit 2881 and has examined 2,155 patent applications in our dataset. With an allowance rate of 94.6%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 18 months.
Examiner NGUYEN, KIET TUAN's allowance rate of 94.6% places them in the 83% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by NGUYEN, KIET TUAN receive 0.54 office actions before reaching final disposition. This places the examiner in the 3% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by NGUYEN, KIET TUAN is 18 months. This places the examiner in the 96% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a -6.8% benefit to allowance rate for applications examined by NGUYEN, KIET TUAN. This interview benefit is in the 4% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 38.8% of applications are subsequently allowed. This success rate is in the 89% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 62.7% of cases where such amendments are filed. This entry rate is in the 88% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.
When applicants request a pre-appeal conference (PAC) with this examiner, 88.9% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 67% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 93.8% of appeals filed. This is in the 85% percentile among all examiners. Of these withdrawals, 80.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 44.6% are granted (fully or in part). This grant rate is in the 38% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 8.9% of allowed cases (in the 92% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 4.7% of allowed cases (in the 79% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.