USPTO Examiner TSAI HSIEN C - Art Unit 2881

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18927668SUPPORTING INSULATION BASE OF NEGATIVE HIGH-VOLTAGE POTENTIAL NEUTRON TARGET OF COMPACT NEUTRON SOURCEOctober 2024December 2024Allow200NoNo
18816188OUTER SOURCE ASSEMBLY AND ASSOCIATED COMPONENTSAugust 2024February 2025Allow610NoNo
18653555SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMPLE BY CHARGED PARTICLES, SET OF SYSTEMS TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMPLE AND METHOD TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMPLE BY CHARGED PARTICLESMay 2024December 2024Allow700NoNo
18621600Monitoring Radical Particle Concentration Using Mass SpectrometryMarch 2024December 2024Allow900NoNo
18607766Improved Low-Power Mass Interrogation System and Assay For Determining Vitamin D LevelsMarch 2024November 2024Allow800NoNo
18433141METHOD AND DEVICE FOR PREPARING A MICROSCOPIC SAMPLE FROM A VOLUME SAMPLEFebruary 2024September 2024Allow700NoNo
18536031METHOD AND SYSTEMS USEFUL FOR PRODUCING ALUMINUM IONSDecember 2023February 2025Allow1420YesNo
18515728BENCH-TOP TIME OF FLIGHT MASS SPECTROMETERNovember 2023June 2024Allow700NoNo
18378247SYSTEMS AND METHODS FOR CONDUCTING REACTIONS AND SCREENING FOR REACTION PRODUCTSOctober 2023June 2024Allow800NoNo
18481111DUAL SOURCE INJECTOR WITH SWITCHABLE ANALYZING MAGNETOctober 2023June 2024Allow800NoNo
18283109Mass Spectrometry Methods And Systems For High Pressure Charge State Control And/Or FragmentationSeptember 2023September 2025Allow2400NoNo
18551211MASS SPECTROMETER AND METHOD FOR CONTROLLING SAMESeptember 2023September 2025Allow2400NoNo
18243178Electron Microscope and Specimen Orientation Alignment MethodSeptember 2023January 2026Allow2900NoNo
18460929OVERLAY MEASURING METHOD AND SYSTEM, AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING THE SAMESeptember 2023January 2026Allow2800NoNo
18451026EUV SOURCE WITH ROTATION CRUCIBLE AND LASER AND TIN (SN) AUTO-FILLING METHODAugust 2023September 2025Allow2500NoNo
18277188ASSEMBLY FOR SEPARATING RADIATION IN THE FAR FIELDAugust 2023January 2026Allow2910NoNo
18274244METABOLIC ENZYME-INDUCED MICRO-NANO PLASTIC PARTICLE BIODEGRADATION METHOD AND PRODUCT ANALYSIS METHOD THEREFORJuly 2023December 2023Allow500NoNo
18222510DETECTORJuly 2023January 2026Allow3010NoNo
18345618FLUORINE BASED MOLECULAR CO-GAS WHEN RUNNING DIMETHYLALUMINUM CHLORIDE AS A SOURCE MATERIAL TO GENERATE AN ALUMINUM ION BEAMJune 2023March 2024Allow900NoNo
18340396PHOTONIC CHIP BASED ATOMIC SENSORSJune 2023September 2023Allow200NoNo
18340152MULTIPLE CHARGED PARTICLE BEAM WRITING METHOD AND MULTIPLE CHARGED PARTICLE BEAM WRITING APPARATUSJune 2023September 2025Allow2700NoNo
18336337HYDRAULIC FEED SYSTEM FOR AN ION SOURCEJune 2023July 2024Allow1310NoNo
18327698FLOW RECIRCULATION FOR MOBILITY SEPARATION IMPROVEMENTJune 2023September 2025Allow2800NoNo
18326935VACUUM CHAMBER ARRANGEMENT FOR CHARGED PARTICLE BEAM GENERATORMay 2023December 2023Allow700NoNo
18320212SAMPLE HOLDER, LOADING DEVICE, AND METHOD FOR INSERTING A SAMPLE INTO A SAMPLE HOLDERMay 2023January 2026Allow3210YesNo
18036098Methods For Detection Of Isomeric Steroids Using Differential Mobility SpectrometryMay 2023January 2026Allow3310NoNo
18035916ANALYSIS DEVICEMay 2023August 2025Allow2700NoNo
18143684SYSTEM AND METHOD FOR ION SOURCE TEMPERATURE CONTROL USING SYMMETRIC OR ASYMMETRIC APPLICATION OF FORCEMay 2023September 2025Allow2800NoNo
18306381REFILLABLE ION CHAMBER WITH AUTOMATED PURGING SYSTEMApril 2023May 2024Allow1310YesNo
18301568SCANNING ELECTRON MICROSCOPE (SEM) MEASUREMENT METHOD AND APPARATUSApril 2023January 2026Allow3400NoNo
18300165Method for analyzing quality of thin surface layer of PCBApril 2023January 2026Allow3310NoNo
18299749COVERAGE CALCULATING METHOD, CHARGED PARTICLE BEAM WRITING METHOD, COVERAGE CALCULATING DEVICE, CHARGED PARTICLE BEAM WRITING APPARATUS, AND COMPUTER-READABLE STORAGE MEDIUMApril 2023August 2025Allow2800NoNo
18131840FLOW FOR HIGH RESOLUTION STEREOSCOPIC MEASUREMENTSApril 2023June 2025Allow2700NoNo
18296103STAGE DEVICE, CHARGED PARTICLE BEAM DEVICE, AND VACUUM DEVICEApril 2023November 2025Allow3100NoNo
18024128ION SPECTROMETERMarch 2023December 2025Abandon3410NoNo
18021356FOCUSED ION BEAM SYSTEMFebruary 2023May 2025Allow2700NoNo
18007458A GAS ION GUNJanuary 2023May 2025Allow2800NoNo
18101265SYSTEMS AND METHODS FOR CONDUCTING REACTIONS AND SCREENING FOR REACTION PRODUCTSJanuary 2023June 2023Allow400NoNo
18155177ION GUN AND VACUUM PROCESSING APPARATUSJanuary 2023August 2023Allow710NoNo
18148761MULTI-ELECTRON BEAM WRITING APPARATUS AND MULTI-ELECTRON BEAM WRITING METHODDecember 2022June 2025Allow3000NoNo
18082543MEMS PLATFORM FOR THIN FILM NANOMECHANICS CHARACTERIZATIONDecember 2022July 2025Allow3100NoNo
17925471METHOD FOR ION/ION REACTION FOR ION MOBILITY MASS SPECTROSCOPYNovember 2022June 2025Allow3100NoNo
17923662SCINTILLATOR AND CHARGED PARTICLE RADIATION APPARATUSNovember 2022December 2025Allow3710NoNo
17923203DIFFERENTIAL PUMPING APPARATUS AND FOCUSED CHARGED PARTICLE BEAM SYSTEMNovember 2022January 2026Allow3810NoNo
17922823Charged Particle Beam Device and Sample Observation MethodNovember 2022June 2025Allow3100NoNo
18050532ION SOURCES FOR IMPROVED ROBUSTNESSOctober 2022June 2025Allow3200NoNo
18045666METHODS AND APPARATUSES FOR MAPPING STATE PREPARATION ERROR TO SUBSPACE LEAKAGE ERROROctober 2022March 2025Allow2900NoNo
18045387METHODS AND APPARATUSES FOR REDUCING PHASE NOISEOctober 2022January 2025Allow2700NoNo
17962825CONTROL METHOD OF WRITING APPARATUS AND WRITING APPARATUSOctober 2022December 2025Abandon3810NoNo
17916930DE-CLUSTERING ION GUIDEOctober 2022July 2025Allow3310NoNo
17934421METHODS AND APPARATUSES FOR ELECTROMAGNETICALLY-INDUCED TRANSPARENCY COOLING IN AN ISOTOPE WITH A NUCLEAR SPIN OF 3/2 OR GREATERSeptember 2022December 2024Allow2700NoNo
17933740METHODS AND APPARATUSES FOR PERFORMING ECHO SEQUENCESeptember 2022September 2024Allow2400NoNo
17906548ION GUIDE ASSEMBLY HAVING MULTIPLE ION GUIDESSeptember 2022March 2025Allow3000NoNo
17941095METHOD FOR RAPID ON-SITE DETECTION OF FENTANYL ANALOGS USING A MINIATURE MASS SPECTROMETERSeptember 2022February 2025Allow3000NoNo
17939676COLD TRAP ENHANCED INPUT INTO LOW-COST ANALYZERSeptember 2022March 2023Allow710NoNo
17899772LIGHT SOURCE APPARATUSAugust 2022January 2026Allow4010YesNo
17897080LENS DESIGNSAugust 2022September 2024Allow2500NoNo
17889176ULTRAVIOLET LIGHT FIXTUREAugust 2022December 2025Abandon4010NoNo
17759787METHODS AND SYSTEMS FOR DETECTING AND QUANTIFYING A TARGET ANALYTE IN A SAMPLE BY NEGATIVE ION MODE MASS SPECTROMETRYJuly 2022September 2024Allow2600NoNo
17876219ELECTRODE FABRICATION AND DIE SHAPING FOR METAL-ON-GLASS ION TRAPSJuly 2022July 2025Allow3510NoNo
17870122Disinfection Device And Disinfection SystemJuly 2022November 2024Allow2810YesNo
17759087METHOD AND SYSTEM FOR THE IDENTIFICATION OF COMPOUNDS IN COMPLEX BIOLOGICAL OR ENVIRONMENTAL SAMPLESJuly 2022February 2025Allow3100NoNo
17867414METHODS AND APPARATUSES FOR CROSS-TALK MITIGATIONJuly 2022September 2024Allow2600NoNo
17865559DEVICE FOR CONTROLLING TRAPPED IONS HAVING AN ELECTRODE CIRCUITRY CONFIGURED FOR DEVICE TESTINGJuly 2022February 2025Allow3111NoNo
17866273METHODS AND APPARATUSES FOR BARIUM STATES PREPARATIONS FOR QUANTUM OPERATIONSJuly 2022March 2025Allow3200NoNo
17758646Determining Curtain Plate Integrity in Differential Mobility SpectrometryJuly 2022September 2024Allow2600NoNo
17861076CURVED ION MOBILITY ARCHITECTUREJuly 2022April 2025Allow3310NoNo
17852674Ion Funnels Having Improved Pressure Distribution and Flow CharacteristicsJune 2022September 2025Abandon3910NoNo
17844219TIME-OF-FLIGHT MASS ANALYSERSJune 2022December 2025Allow4111YesNo
17806805GAS ANALYSIS DEVICE AND METHOD FOR DETECTING SAMPLE GASJune 2022January 2024Allow1910NoNo
17836670DUAL-SPACE, SINGLE-SPECIES ARCHITECTURE FOR TRAPPED-ION QUANTUM INFORMATION PROCESSINGJune 2022September 2025Allow4010NoNo
17756937MONITOR FOR A RADIOTHERAPY DEVICEJune 2022January 2025Allow3220NoNo
17832577PLANT DISINFECTION APPARATUSJune 2022August 2025Abandon3801NoNo
17832001Specimen Machining Device and Information Provision MethodJune 2022September 2023Allow1600NoNo
17830606Pattern Height Metrology Using an E-Beam SystemJune 2022December 2024Allow3000NoNo
17831147LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PARTICLE MICROSCOPYJune 2022September 2024Allow2800NoNo
17831255TARGET SUBSTANCE REPLENISHMENT DEVICE, EXTREME ULTRAVIOLET LIGHT GENERATION APPARATUS, AND ELECTRONIC DEVICE MANUFACTURING METHODJune 2022September 2024Allow2800NoNo
17828095Laser Plasma-Based Generation of Ultrawideband Microwave SignalsMay 2022September 2024Allow2700NoNo
17664812Pattern Data Processing For Programmable Direct-Write ApparatusMay 2022March 2024Allow2110NoNo
17749360Dielectric Coated Plasmonic PhotoemitterMay 2022October 2024Allow2900NoNo
17778599Charged Particle Beam DeviceMay 2022June 2024Allow2500NoNo
17778036MULTI-SOURCE CHARGED PARTICLE ILLUMINATION APPARATUSMay 2022June 2024Allow2500NoNo
17748761Absorbing Laser Beam Dump for High Average-Peak Power Laser SystemsMay 2022September 2024Allow2800NoNo
17746308Rapid Evaporative Ionisation Mass Spectrometry ("REIMS") and Desorption Electrospray Ionisation Mass Spectrometry ("DESI-MS") Analysis of Swabs and Biopsy SamplesMay 2022January 2026Allow4421NoNo
17745209SYSTEMS AND METHODS FOR CONDUCTING REACTIONS AND SCREENING FOR REACTION PRODUCTSMay 2022October 2022Allow500NoNo
17744408FLOW RECIRCULATION FOR MOBILITY SEPARATION IMPROVEMENTMay 2022September 2023Allow1600NoNo
17743965ANGLE CONTROL FOR NEUTRAL REACTIVE SPECIES GENERATED IN A PLASMAMay 2022June 2023Allow1300NoNo
17663085HYBRID MASS SPECTROMETRY APPARATUSMay 2022April 2025Allow3620NoNo
17740733INTEGRAL SWEEP IN ION BEAM SYSTEMMay 2022June 2023Allow1400NoNo
17730916METHODS OF DETERMINING ABERRATIONS OF A CHARGED PARTICLE BEAM, AND CHARGED PARTICLE BEAM SYSTEMApril 2022February 2025Allow3400NoNo
17727751Disinfection PurifierApril 2022September 2024Allow2901NoNo
17770854METHOD FOR PROVIDING A NEUTRON RADIATION SHIELD, AND ACCORDING SHIELDING SYSTEMApril 2022November 2024Allow3100NoNo
17709446Device, System, and Method for Ion Fragmentation by Use of An Ion Mobility Device and Messenger TaggingMarch 2022October 2024Allow3120NoNo
17705503DUAL SOURCE INJECTOR WITH SWITCHABLE ANALYZING MAGNETMarch 2022July 2023Allow1500NoNo
17705177ION GUIDE GEOMETRY IMPROVEMENTSMarch 2022September 2024Allow2910NoNo
17753922Electron Induced Dissociation Devices and MethodsMarch 2022February 2025Allow3511NoNo
17654759MECHANICALLY-STABLE ELECTRON SOURCEMarch 2022April 2023Allow1300NoNo
17687620COVER RING TO MITIGATE CARBON CONTAMINATION IN PLASMA DOPING CHAMBERMarch 2022August 2024Allow2910YesNo
17687453LUMINESCENT NANOSTRUCURE, AND COLOR CONVERSION PANEL AND ELECTRONIC DEVICE INCLUDING THE SAMEMarch 2022September 2024Allow3000NoNo
17683895ION IMPLANTER AND ELECTROSTATIC QUADRUPOLE LENS DEVICEMarch 2022March 2023Allow1200NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner TSAI, HSIEN C.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
3
Examiner Affirmed
3
(100.0%)
Examiner Reversed
0
(0.0%)
Reversal Percentile
13.9%
Lower than average

What This Means

With a 0.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.

Strategic Value of Filing an Appeal

Total Appeal Filings
9
Allowed After Appeal Filing
4
(44.4%)
Not Allowed After Appeal Filing
5
(55.6%)
Filing Benefit Percentile
73.1%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 44.4% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.

Strategic Recommendations

Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner TSAI, HSIEN C - Prosecution Strategy Guide

Executive Summary

Examiner TSAI, HSIEN C works in Art Unit 2881 and has examined 383 patent applications in our dataset. With an allowance rate of 88.0%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 23 months.

Allowance Patterns

Examiner TSAI, HSIEN C's allowance rate of 88.0% places them in the 68% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by TSAI, HSIEN C receive 1.21 office actions before reaching final disposition. This places the examiner in the 15% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by TSAI, HSIEN C is 23 months. This places the examiner in the 86% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +7.8% benefit to allowance rate for applications examined by TSAI, HSIEN C. This interview benefit is in the 37% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 34.1% of applications are subsequently allowed. This success rate is in the 75% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 63.5% of cases where such amendments are filed. This entry rate is in the 88% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 100.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 74% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 66.7% of appeals filed. This is in the 50% percentile among all examiners. Of these withdrawals, 66.7% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.

Petition Practice

When applicants file petitions regarding this examiner's actions, 48.5% are granted (fully or in part). This grant rate is in the 44% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 27% percentile). This examiner makes examiner's amendments less often than average. You may need to make most claim amendments yourself.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 4.2% of allowed cases (in the 78% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.
  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.