Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18959313 | LIGHT SOURCE SYSTEM AND METHOD OF OPERATION | November 2024 | February 2025 | Allow | 3 | 0 | 0 | No | No |
| 18750933 | SYSTEMS AND METHODS FOR DISINFECTION | June 2024 | August 2024 | Allow | 1 | 0 | 0 | No | No |
| 18660862 | Lithography Apparatus and Method | May 2024 | June 2025 | Allow | 14 | 1 | 0 | No | No |
| 18644458 | EUV LIGHT SOURCE WITH A BEAM POSITIONING DEVICE | April 2024 | August 2024 | Allow | 4 | 0 | 0 | No | No |
| 18635131 | PLASMA GENERATING DEVICE | April 2024 | May 2025 | Allow | 13 | 1 | 0 | No | No |
| 18618543 | DECREASED CROSSTALK ATOMIC OBJECT DETECTION | March 2024 | May 2025 | Allow | 14 | 1 | 0 | No | No |
| 18608243 | FLEXIBLE ION GENERATOR DEVICE | March 2024 | May 2025 | Allow | 14 | 1 | 0 | No | No |
| 18597563 | METHOD OF MANUFACTURING INTEGRATED CIRCUIT | March 2024 | April 2025 | Allow | 13 | 1 | 0 | No | No |
| 18512264 | TARGET DELIVERY SYSTEM | November 2023 | December 2024 | Allow | 13 | 0 | 0 | No | No |
| 18508195 | TARGET CONTROL IN EXTREME ULTRAVIOLET LITHOGRAPHY SYSTEMS USING ABERRATION OF REFLECTION IMAGE | November 2023 | February 2025 | Allow | 15 | 1 | 0 | No | No |
| 18505522 | ION GENERATOR AND ION IMPLANTER | November 2023 | November 2024 | Allow | 12 | 1 | 0 | No | No |
| 18495485 | SYSTEMS AND METHODS FOR DISINFECTION | October 2023 | May 2024 | Allow | 7 | 1 | 0 | No | No |
| 18382646 | MULTI-DIRECTIONAL SHORT-WAVE METHODS AND SYSTEMS | October 2023 | March 2024 | Allow | 4 | 0 | 0 | No | No |
| 18126505 | SYSTEM AND METHOD FOR SAFELY IRRADICATING PATHOGENS | October 2023 | September 2024 | Allow | 18 | 1 | 0 | No | No |
| 18477213 | APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLES | September 2023 | November 2024 | Allow | 13 | 1 | 0 | No | No |
| 18448026 | REPELLENT ELECTRODE FOR ELECTRON REPELLING | August 2023 | November 2024 | Allow | 15 | 1 | 0 | No | No |
| 18231170 | DEVICE AND METHOD TO REMOVE DEBRIS FROM AN EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY SYSTEM | August 2023 | September 2024 | Allow | 14 | 1 | 0 | No | No |
| 18366092 | EUV PHOTOLITHOGRAPHY SYSTEM FUEL SOURCE AND METHODS OF OPERATING THE SAME | August 2023 | October 2024 | Allow | 14 | 1 | 0 | No | No |
| 18212346 | SYSTEM FOR ESTIMATING THE OCCURRENCE OF DEFECTS, AND COMPUTER-READABLE MEDIUM | June 2023 | July 2024 | Allow | 13 | 1 | 0 | No | No |
| 18199483 | HIGH DENSITY ENERGY DIRECTING DEVICE | May 2023 | April 2024 | Allow | 11 | 0 | 0 | No | No |
| 18142500 | METHOD AND APPARATUS FOR MITIGATING CONTAMINATION | May 2023 | June 2024 | Allow | 14 | 1 | 0 | No | No |
| 18304019 | Radioabsorbent Assemblies | April 2023 | June 2024 | Allow | 14 | 1 | 0 | No | No |
| 18032565 | METHOD FOR PRE-DETECTING DEFECTIVE POROUS POLYMER SUBSTRATE FOR SEPARATOR | April 2023 | November 2023 | Allow | 7 | 0 | 0 | No | No |
| 18133441 | SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PARTICLES | April 2023 | April 2024 | Allow | 12 | 1 | 0 | No | No |
| 18298927 | LITHOGRAPHY THERMAL CONTROL | April 2023 | June 2024 | Allow | 14 | 1 | 0 | No | No |
| 18120905 | EUV LITHOGRAPHY APPARATUS | March 2023 | June 2024 | Allow | 15 | 1 | 0 | No | No |
| 18117632 | SURFACE-ASSISTED LASER DESORPTION/IONIZATION METHOD, MASS SPECTROMETRY METHOD AND MASS SPECTROMETRY DEVICE | March 2023 | February 2024 | Allow | 11 | 1 | 0 | No | No |
| 18118039 | APPARATUS AND METHOD FOR GENERATING EXTREME ULTRAVIOLET RADIATION | March 2023 | June 2024 | Allow | 15 | 1 | 0 | No | No |
| 18114805 | LASER INTERFERENCE FRINGE CONTROL FOR HIGHER EUV LIGHT SOURCE AND EUV THROUGHPUT | February 2023 | December 2023 | Allow | 9 | 2 | 0 | No | No |
| 18164959 | CONTROL OF DYNAMIC GAS LOCK FLOW INLETS OF AN INTERMEDIATE FOCUS CAP | February 2023 | May 2024 | Allow | 15 | 1 | 0 | Yes | No |
| 18106434 | MULTI-ATOMIC OBJECT CRYSTAL TRANSPORT THROUGH ATOMIC OBJECT CONFINEMENT APPARATUS JUNCTION | February 2023 | October 2024 | Allow | 21 | 2 | 0 | No | No |
| 18151930 | METHOD FOR USING RADIATION SOURCE APPARATUS | January 2023 | May 2024 | Allow | 16 | 1 | 0 | No | No |
| 18090379 | ELECTROMAGNETIC WAVE-TRAPPING DEVICE | December 2022 | May 2023 | Allow | 5 | 0 | 0 | No | No |
| 18064858 | METHOD AND SYSTEM FOR GENERATING DROPLETS FOR EUV PHOTOLITHOGRAPHY PROCESSES | December 2022 | August 2024 | Allow | 20 | 1 | 0 | No | No |
| 18007528 | EXTREME ULTRAVIOLET LIGHT SOURCE DEVICE | December 2022 | May 2023 | Allow | 6 | 0 | 0 | No | No |
| 17990962 | DEVICE AND METHOD FOR MEASURING CORRELATION BETWEEN FATIGUE PERFORMANCE AND MICROSTRUCTURE OF ONE-DIMENSIONAL (1D) NANOMATERIAL IN SITU IN TRANSMISSION ELECTRON MICROSCOPE (TEM) | November 2022 | May 2025 | Allow | 30 | 0 | 0 | No | No |
| 18051772 | DEVICE FOR DESORPTION SCANNING OF ANALYTE MATERIAL ON A SAMPLE SUPPORT | November 2022 | May 2025 | Allow | 30 | 0 | 0 | No | No |
| 17978622 | FLEXIBLE ION GENERATOR DEVICE | November 2022 | January 2024 | Allow | 14 | 0 | 0 | No | No |
| 17975493 | ION GUIDE WITH VARYING MULTIPOLES | October 2022 | June 2024 | Allow | 19 | 2 | 0 | Yes | No |
| 17918648 | LASER DESORPTION/IONIZATION MASS SPECTROMETER AND LASER POWER ADJUSTMENT METHOD | October 2022 | April 2025 | Allow | 30 | 0 | 0 | No | No |
| 17963054 | EXTREME ULTRAVIOLET CONTROL SYSTEM | October 2022 | March 2024 | Allow | 17 | 1 | 0 | No | No |
| 17955168 | SYSTEM AND METHOD FOR SAFELY IRRADICATING PATHOGENS | September 2022 | February 2023 | Allow | 5 | 0 | 0 | No | No |
| 17914488 | CHARGED PARTICLE BEAM DEVICE, AND METHOD FOR CONTROLLING CHARGED PARTICLE BEAM DEVICE | September 2022 | April 2025 | Allow | 31 | 0 | 0 | No | No |
| 17933708 | TRANSMISSION APPARATUS, MEASUREMENT SYSTEM, AND CAMERA SYSTEM | September 2022 | March 2025 | Allow | 30 | 0 | 0 | No | No |
| 17948407 | Optical Emission Spectroscopy for Advanced Process Characterization | September 2022 | January 2025 | Allow | 28 | 0 | 1 | No | No |
| 17912226 | PLASMA GENERATING DEVICE | September 2022 | December 2023 | Allow | 15 | 0 | 0 | No | No |
| 17905909 | EXTREME-ULTRAVIOLET LIGHT SOURCE DEVICE USING ELECTRON BEAMS | September 2022 | March 2025 | Allow | 30 | 0 | 0 | No | No |
| 17823049 | EXTREME ULTRAVIOLET LIGHT GENERATION METHOD, EXTREME ULTRAVIOLET LIGHT GENERATION APPARATUS, AND ELECTRONIC DEVICE MANUFACTURING METHOD | August 2022 | February 2025 | Allow | 29 | 0 | 0 | No | No |
| 17820117 | METHODS OF CROSS-SECTION IMAGING OF AN INSPECTION VOLUME IN A WAFER | August 2022 | February 2025 | Allow | 30 | 0 | 0 | No | No |
| 17882452 | RADIOTHERAPY DOSE PARAMETER COMPUTATION TECHNIQUES | August 2022 | February 2025 | Allow | 31 | 0 | 0 | No | No |
| 17817248 | AUTOMATED APPLICATION OF DRIFT CORRECTION TO SAMPLE STUDIED UNDER ELECTRON MICROSCOPE | August 2022 | October 2022 | Allow | 2 | 0 | 0 | No | No |
| 17875288 | EUV LIGHT SOURCE AND APPARATUS FOR EUV LITHOGRAPHY | July 2022 | February 2024 | Allow | 19 | 1 | 0 | No | No |
| 17814530 | Integrated Sample Processing System with Multiple Detection Capability | July 2022 | January 2024 | Allow | 18 | 1 | 0 | No | No |
| 17870654 | MACHINE LEARNING ON WAFER DEFECT REVIEW | July 2022 | October 2023 | Allow | 15 | 0 | 0 | No | No |
| 17869117 | Electron Microscope and Method of Correcting Aberration | July 2022 | January 2025 | Allow | 30 | 0 | 0 | No | No |
| 17792786 | IMAGING UNIT, MASS SPECTROMETER, AND MASS SPECTROMETRY METHOD | July 2022 | December 2024 | Allow | 29 | 0 | 0 | No | No |
| 17865043 | LUMINAIRE EMITTING TWO DIFFERENT BANDS OF DISINFECTION LIGHT | July 2022 | March 2025 | Allow | 32 | 0 | 0 | No | No |
| 17792715 | LASER AMPLIFICATION DEVICE AND EXTREME ULTRAVIOLET LIGHT GENERATION APPARATUS | July 2022 | December 2024 | Allow | 29 | 0 | 0 | No | No |
| 17864939 | INSERT FOR A SOURCE CHAMBER OF AN EUV RADIATION SOURCE | July 2022 | January 2025 | Allow | 30 | 0 | 0 | No | No |
| 17859133 | IMAGING SYSTEMS AND METHODS OF OPERATING THE SAME | July 2022 | November 2024 | Allow | 29 | 0 | 0 | No | No |
| 17858436 | Electron Microscope and Image Generation Method | July 2022 | February 2025 | Allow | 32 | 1 | 0 | No | No |
| 17791013 | CHARGED PARTICLE BEAM DEVICE AND INSPECTION DEVICE | July 2022 | October 2024 | Allow | 28 | 0 | 0 | No | No |
| 17810783 | METHOD FOR OPERATING A PARTICLE BEAM MICROSCOPE, PARTICLE BEAM MICROSCOPE AND COMPUTER PROGRAM PRODUCT | July 2022 | November 2024 | Allow | 28 | 0 | 0 | No | No |
| 17855888 | METHOD, APPARATUS, AND PROGRAM FOR DETERMINING CONDITION RELATED TO CAPTURED IMAGE OF CHARGED PARTICLE BEAM APPARATUS | July 2022 | October 2024 | Allow | 28 | 0 | 0 | No | No |
| 17854940 | GAS RETAINING ION GUIDE WITH AXIAL ACCELERATION | June 2022 | October 2024 | Allow | 28 | 0 | 0 | No | No |
| 17788610 | Ion Milling Device | June 2022 | October 2024 | Allow | 27 | 0 | 0 | No | No |
| 17786825 | CONTAINER, CLOSURE LID, AND VESSEL FOR TRANSPLANT OBJECTS, AND METHODS AND SYSTEMS FOR PROVIDING THREE-DIMENSIONAL STRUCTURE DATA AND FOR STERILIZING A TRANSPLANT OBJECT | June 2022 | September 2024 | Allow | 27 | 0 | 0 | No | No |
| 17786238 | FABRICATING THIN FILM LIQUID CELLS | June 2022 | September 2024 | Allow | 27 | 0 | 0 | No | No |
| 17786420 | CHECKING QUALITY OF A TREATMENT PLAN | June 2022 | November 2024 | Allow | 29 | 1 | 0 | No | No |
| 17806293 | CHARGE CARRIER GENERATION SOURCE | June 2022 | September 2024 | Allow | 27 | 0 | 0 | No | No |
| 17836109 | ION GENERATOR AND ION IMPLANTER | June 2022 | August 2023 | Allow | 14 | 1 | 0 | No | No |
| 17835107 | MOLTEN LIQUID TRANSPORT FOR TUNABLE VAPORIZATION IN ION SOURCES | June 2022 | September 2024 | Allow | 27 | 0 | 0 | No | No |
| 17805663 | ION BEAM CHAMBER FLUID DELIVERY APPARATUS AND METHOD AND ION BEAM ETCHER USING SAME | June 2022 | August 2024 | Allow | 26 | 0 | 0 | No | No |
| 17830244 | Creating Multiple Electron Beams with a Photocathode Film | June 2022 | December 2024 | Allow | 31 | 1 | 0 | No | No |
| 17828312 | ION GUN AND VACUUM PROCESSING APPARATUS | May 2022 | September 2022 | Allow | 4 | 0 | 0 | No | No |
| 17751545 | TARGET CONTROL IN EXTREME ULTRAVIOLET LITHOGRAPHY SYSTEMS USING ABERRATION OF REFLECTION IMAGE | May 2022 | August 2023 | Allow | 15 | 1 | 0 | No | No |
| 17725276 | Charged Particle Beam Device | April 2022 | July 2023 | Allow | 15 | 1 | 0 | No | No |
| 17770495 | CHARGED PARTICLE DETECTION FOR SPECTROSCOPIC TECHNIQUES | April 2022 | July 2024 | Allow | 27 | 0 | 0 | No | No |
| 17719121 | SAMPLE SUPPORT, SAMPLE IONIZATION METHOD, AND MASS SPECTROMETRY METHOD | April 2022 | April 2023 | Allow | 12 | 1 | 0 | No | No |
| 17714491 | VAPORIZER, ION SOURCE AND METHOD FOR GENERATING ALUMINUM-CONTAINING VAPOR | April 2022 | July 2024 | Allow | 28 | 0 | 0 | No | No |
| 17707109 | All-Optical Laser-Driven Light Source with Electrodeless Ignition | March 2022 | July 2024 | Allow | 27 | 0 | 0 | No | No |
| 17764865 | RADIATION CONDUIT | March 2022 | November 2024 | Allow | 31 | 1 | 0 | No | No |
| 17656731 | APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLES | March 2022 | June 2023 | Allow | 15 | 1 | 0 | No | No |
| 17656414 | METHOD AND APPARATUS FOR TREATING POST-HARVEST PLANT | March 2022 | July 2024 | Allow | 28 | 0 | 0 | No | No |
| 17703209 | ELECTROMAGNETIC INTERFERENCE REDUCING SYSTEMS AND METHODS FOR ULTRAVIOLET LAMP ASSEMBLIES | March 2022 | August 2024 | Allow | 29 | 1 | 0 | No | No |
| 17702010 | METHOD OF FORMING PHOTO-ALIGNMENT FILM AND METHOD OF FORMING LIQUID CRYSTAL LAYER | March 2022 | June 2024 | Allow | 27 | 0 | 0 | No | No |
| 17762081 | SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PARTICLES | March 2022 | January 2023 | Allow | 10 | 0 | 0 | No | No |
| 17697813 | IDENTIFICATION AND QUANTITATION OF INSULIN-LIKE GROWTH FACTOR-I VARIANTS BY MASS SPECTROMETRY | March 2022 | October 2024 | Allow | 31 | 1 | 0 | No | No |
| 17693103 | REPELLENT ELECTRODE FOR ELECTRON REPELLING | March 2022 | July 2023 | Allow | 16 | 1 | 0 | Yes | No |
| 17691647 | Lithography Apparatus and Method | March 2022 | February 2024 | Allow | 23 | 1 | 0 | No | No |
| 17688613 | GERMANIUM TETRAFLOURIDE AND HYDROGEN MIXTURES FOR AN ION IMPLANTATION SYSTEM | March 2022 | July 2023 | Allow | 16 | 1 | 0 | No | No |
| 17687459 | FOIL TRAP AND LIGHT SOURCE APPARATUS INCLUDING THE SAME | March 2022 | October 2023 | Allow | 19 | 0 | 0 | No | No |
| 17652784 | SURGICALLY POSITIONED NEUTRON FLUX ACTIVATED HIGH ENERGY THERAPEUTIC CHARGED PARTICLE GENERATION SYSTEM | February 2022 | June 2023 | Allow | 16 | 1 | 0 | No | No |
| 17671691 | SYSTEMS AND METHODS FOR DISINFECTION | February 2022 | July 2023 | Allow | 17 | 2 | 0 | No | No |
| 17665817 | Germicidal Lighting Apparatus With Visible Glare | February 2022 | May 2024 | Allow | 28 | 0 | 0 | No | No |
| 17583982 | SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS AND THEIR USE FOR PROCESS MONITORING AND CONTROL | January 2022 | January 2024 | Allow | 24 | 3 | 0 | No | No |
| 17583799 | SYSTEM FOR MONITORING A PLASMA | January 2022 | May 2024 | Allow | 28 | 1 | 0 | No | No |
| 17576156 | Multipole Unit and Charged Particle Beam Device | January 2022 | July 2023 | Allow | 18 | 0 | 0 | No | No |
| 17576016 | Method of Measuring Aberration and Electron Microscope | January 2022 | July 2023 | Allow | 18 | 0 | 0 | No | No |
| 17569737 | HIGH-BRIGHTNESS LASER PRODUCED PLASMA SOURCE AND METHOD OF GENERATION AND COLLECTION RADIATION | January 2022 | May 2024 | Allow | 28 | 0 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner CHANG, HANWAY.
With a 66.7% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 51.2% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner CHANG, HANWAY works in Art Unit 2881 and has examined 1,001 patent applications in our dataset. With an allowance rate of 91.8%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 18 months.
Examiner CHANG, HANWAY's allowance rate of 91.8% places them in the 76% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by CHANG, HANWAY receive 0.99 office actions before reaching final disposition. This places the examiner in the 12% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by CHANG, HANWAY is 18 months. This places the examiner in the 95% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a -0.1% benefit to allowance rate for applications examined by CHANG, HANWAY. This interview benefit is in the 10% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 33.3% of applications are subsequently allowed. This success rate is in the 66% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 51.8% of cases where such amendments are filed. This entry rate is in the 73% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 120.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 81% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 79.1% of appeals filed. This is in the 67% percentile among all examiners. Of these withdrawals, 47.1% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.
When applicants file petitions regarding this examiner's actions, 26.3% are granted (fully or in part). This grant rate is in the 17% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 1.6% of allowed cases (in the 74% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.4% of allowed cases (in the 48% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.