USPTO Examiner CHANG HANWAY - Art Unit 2881

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18959313LIGHT SOURCE SYSTEM AND METHOD OF OPERATIONNovember 2024February 2025Allow300NoNo
18750933SYSTEMS AND METHODS FOR DISINFECTIONJune 2024August 2024Allow100NoNo
18660862Lithography Apparatus and MethodMay 2024June 2025Allow1410NoNo
18644458EUV LIGHT SOURCE WITH A BEAM POSITIONING DEVICEApril 2024August 2024Allow400NoNo
18635131PLASMA GENERATING DEVICEApril 2024May 2025Allow1310NoNo
18618543DECREASED CROSSTALK ATOMIC OBJECT DETECTIONMarch 2024May 2025Allow1410NoNo
18608243FLEXIBLE ION GENERATOR DEVICEMarch 2024May 2025Allow1410NoNo
18597563METHOD OF MANUFACTURING INTEGRATED CIRCUITMarch 2024April 2025Allow1310NoNo
18512264TARGET DELIVERY SYSTEMNovember 2023December 2024Allow1300NoNo
18508195TARGET CONTROL IN EXTREME ULTRAVIOLET LITHOGRAPHY SYSTEMS USING ABERRATION OF REFLECTION IMAGENovember 2023February 2025Allow1510NoNo
18505522ION GENERATOR AND ION IMPLANTERNovember 2023November 2024Allow1210NoNo
18495485SYSTEMS AND METHODS FOR DISINFECTIONOctober 2023May 2024Allow710NoNo
18382646MULTI-DIRECTIONAL SHORT-WAVE METHODS AND SYSTEMSOctober 2023March 2024Allow400NoNo
18126505SYSTEM AND METHOD FOR SAFELY IRRADICATING PATHOGENSOctober 2023September 2024Allow1810NoNo
18477213APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLESSeptember 2023November 2024Allow1310NoNo
18448026REPELLENT ELECTRODE FOR ELECTRON REPELLINGAugust 2023November 2024Allow1510NoNo
18231170DEVICE AND METHOD TO REMOVE DEBRIS FROM AN EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY SYSTEMAugust 2023September 2024Allow1410NoNo
18366092EUV PHOTOLITHOGRAPHY SYSTEM FUEL SOURCE AND METHODS OF OPERATING THE SAMEAugust 2023October 2024Allow1410NoNo
18212346SYSTEM FOR ESTIMATING THE OCCURRENCE OF DEFECTS, AND COMPUTER-READABLE MEDIUMJune 2023July 2024Allow1310NoNo
18199483HIGH DENSITY ENERGY DIRECTING DEVICEMay 2023April 2024Allow1100NoNo
18142500METHOD AND APPARATUS FOR MITIGATING CONTAMINATIONMay 2023June 2024Allow1410NoNo
18304019Radioabsorbent AssembliesApril 2023June 2024Allow1410NoNo
18032565METHOD FOR PRE-DETECTING DEFECTIVE POROUS POLYMER SUBSTRATE FOR SEPARATORApril 2023November 2023Allow700NoNo
18133441SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PARTICLESApril 2023April 2024Allow1210NoNo
18298927LITHOGRAPHY THERMAL CONTROLApril 2023June 2024Allow1410NoNo
18120905EUV LITHOGRAPHY APPARATUSMarch 2023June 2024Allow1510NoNo
18117632SURFACE-ASSISTED LASER DESORPTION/IONIZATION METHOD, MASS SPECTROMETRY METHOD AND MASS SPECTROMETRY DEVICEMarch 2023February 2024Allow1110NoNo
18118039APPARATUS AND METHOD FOR GENERATING EXTREME ULTRAVIOLET RADIATIONMarch 2023June 2024Allow1510NoNo
18114805LASER INTERFERENCE FRINGE CONTROL FOR HIGHER EUV LIGHT SOURCE AND EUV THROUGHPUTFebruary 2023December 2023Allow920NoNo
18164959CONTROL OF DYNAMIC GAS LOCK FLOW INLETS OF AN INTERMEDIATE FOCUS CAPFebruary 2023May 2024Allow1510YesNo
18106434MULTI-ATOMIC OBJECT CRYSTAL TRANSPORT THROUGH ATOMIC OBJECT CONFINEMENT APPARATUS JUNCTIONFebruary 2023October 2024Allow2120NoNo
18151930METHOD FOR USING RADIATION SOURCE APPARATUSJanuary 2023May 2024Allow1610NoNo
18090379ELECTROMAGNETIC WAVE-TRAPPING DEVICEDecember 2022May 2023Allow500NoNo
18064858METHOD AND SYSTEM FOR GENERATING DROPLETS FOR EUV PHOTOLITHOGRAPHY PROCESSESDecember 2022August 2024Allow2010NoNo
18007528EXTREME ULTRAVIOLET LIGHT SOURCE DEVICEDecember 2022May 2023Allow600NoNo
17990962DEVICE AND METHOD FOR MEASURING CORRELATION BETWEEN FATIGUE PERFORMANCE AND MICROSTRUCTURE OF ONE-DIMENSIONAL (1D) NANOMATERIAL IN SITU IN TRANSMISSION ELECTRON MICROSCOPE (TEM)November 2022May 2025Allow3000NoNo
18051772DEVICE FOR DESORPTION SCANNING OF ANALYTE MATERIAL ON A SAMPLE SUPPORTNovember 2022May 2025Allow3000NoNo
17978622FLEXIBLE ION GENERATOR DEVICENovember 2022January 2024Allow1400NoNo
17975493ION GUIDE WITH VARYING MULTIPOLESOctober 2022June 2024Allow1920YesNo
17918648LASER DESORPTION/IONIZATION MASS SPECTROMETER AND LASER POWER ADJUSTMENT METHODOctober 2022April 2025Allow3000NoNo
17963054EXTREME ULTRAVIOLET CONTROL SYSTEMOctober 2022March 2024Allow1710NoNo
17955168SYSTEM AND METHOD FOR SAFELY IRRADICATING PATHOGENSSeptember 2022February 2023Allow500NoNo
17914488CHARGED PARTICLE BEAM DEVICE, AND METHOD FOR CONTROLLING CHARGED PARTICLE BEAM DEVICESeptember 2022April 2025Allow3100NoNo
17933708TRANSMISSION APPARATUS, MEASUREMENT SYSTEM, AND CAMERA SYSTEMSeptember 2022March 2025Allow3000NoNo
17948407Optical Emission Spectroscopy for Advanced Process CharacterizationSeptember 2022January 2025Allow2801NoNo
17912226PLASMA GENERATING DEVICESeptember 2022December 2023Allow1500NoNo
17905909EXTREME-ULTRAVIOLET LIGHT SOURCE DEVICE USING ELECTRON BEAMSSeptember 2022March 2025Allow3000NoNo
17823049EXTREME ULTRAVIOLET LIGHT GENERATION METHOD, EXTREME ULTRAVIOLET LIGHT GENERATION APPARATUS, AND ELECTRONIC DEVICE MANUFACTURING METHODAugust 2022February 2025Allow2900NoNo
17820117METHODS OF CROSS-SECTION IMAGING OF AN INSPECTION VOLUME IN A WAFERAugust 2022February 2025Allow3000NoNo
17882452RADIOTHERAPY DOSE PARAMETER COMPUTATION TECHNIQUESAugust 2022February 2025Allow3100NoNo
17817248AUTOMATED APPLICATION OF DRIFT CORRECTION TO SAMPLE STUDIED UNDER ELECTRON MICROSCOPEAugust 2022October 2022Allow200NoNo
17875288EUV LIGHT SOURCE AND APPARATUS FOR EUV LITHOGRAPHYJuly 2022February 2024Allow1910NoNo
17814530Integrated Sample Processing System with Multiple Detection CapabilityJuly 2022January 2024Allow1810NoNo
17870654MACHINE LEARNING ON WAFER DEFECT REVIEWJuly 2022October 2023Allow1500NoNo
17869117Electron Microscope and Method of Correcting AberrationJuly 2022January 2025Allow3000NoNo
17792786IMAGING UNIT, MASS SPECTROMETER, AND MASS SPECTROMETRY METHODJuly 2022December 2024Allow2900NoNo
17865043LUMINAIRE EMITTING TWO DIFFERENT BANDS OF DISINFECTION LIGHTJuly 2022March 2025Allow3200NoNo
17792715LASER AMPLIFICATION DEVICE AND EXTREME ULTRAVIOLET LIGHT GENERATION APPARATUSJuly 2022December 2024Allow2900NoNo
17864939INSERT FOR A SOURCE CHAMBER OF AN EUV RADIATION SOURCEJuly 2022January 2025Allow3000NoNo
17859133IMAGING SYSTEMS AND METHODS OF OPERATING THE SAMEJuly 2022November 2024Allow2900NoNo
17858436Electron Microscope and Image Generation MethodJuly 2022February 2025Allow3210NoNo
17791013CHARGED PARTICLE BEAM DEVICE AND INSPECTION DEVICEJuly 2022October 2024Allow2800NoNo
17810783METHOD FOR OPERATING A PARTICLE BEAM MICROSCOPE, PARTICLE BEAM MICROSCOPE AND COMPUTER PROGRAM PRODUCTJuly 2022November 2024Allow2800NoNo
17855888METHOD, APPARATUS, AND PROGRAM FOR DETERMINING CONDITION RELATED TO CAPTURED IMAGE OF CHARGED PARTICLE BEAM APPARATUSJuly 2022October 2024Allow2800NoNo
17854940GAS RETAINING ION GUIDE WITH AXIAL ACCELERATIONJune 2022October 2024Allow2800NoNo
17788610Ion Milling DeviceJune 2022October 2024Allow2700NoNo
17786825CONTAINER, CLOSURE LID, AND VESSEL FOR TRANSPLANT OBJECTS, AND METHODS AND SYSTEMS FOR PROVIDING THREE-DIMENSIONAL STRUCTURE DATA AND FOR STERILIZING A TRANSPLANT OBJECTJune 2022September 2024Allow2700NoNo
17786238FABRICATING THIN FILM LIQUID CELLSJune 2022September 2024Allow2700NoNo
17786420CHECKING QUALITY OF A TREATMENT PLANJune 2022November 2024Allow2910NoNo
17806293CHARGE CARRIER GENERATION SOURCEJune 2022September 2024Allow2700NoNo
17836109ION GENERATOR AND ION IMPLANTERJune 2022August 2023Allow1410NoNo
17835107MOLTEN LIQUID TRANSPORT FOR TUNABLE VAPORIZATION IN ION SOURCESJune 2022September 2024Allow2700NoNo
17805663ION BEAM CHAMBER FLUID DELIVERY APPARATUS AND METHOD AND ION BEAM ETCHER USING SAMEJune 2022August 2024Allow2600NoNo
17830244Creating Multiple Electron Beams with a Photocathode FilmJune 2022December 2024Allow3110NoNo
17828312ION GUN AND VACUUM PROCESSING APPARATUSMay 2022September 2022Allow400NoNo
17751545TARGET CONTROL IN EXTREME ULTRAVIOLET LITHOGRAPHY SYSTEMS USING ABERRATION OF REFLECTION IMAGEMay 2022August 2023Allow1510NoNo
17725276Charged Particle Beam DeviceApril 2022July 2023Allow1510NoNo
17770495CHARGED PARTICLE DETECTION FOR SPECTROSCOPIC TECHNIQUESApril 2022July 2024Allow2700NoNo
17719121SAMPLE SUPPORT, SAMPLE IONIZATION METHOD, AND MASS SPECTROMETRY METHODApril 2022April 2023Allow1210NoNo
17714491VAPORIZER, ION SOURCE AND METHOD FOR GENERATING ALUMINUM-CONTAINING VAPORApril 2022July 2024Allow2800NoNo
17707109All-Optical Laser-Driven Light Source with Electrodeless IgnitionMarch 2022July 2024Allow2700NoNo
17764865RADIATION CONDUITMarch 2022November 2024Allow3110NoNo
17656731APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLESMarch 2022June 2023Allow1510NoNo
17656414METHOD AND APPARATUS FOR TREATING POST-HARVEST PLANTMarch 2022July 2024Allow2800NoNo
17703209ELECTROMAGNETIC INTERFERENCE REDUCING SYSTEMS AND METHODS FOR ULTRAVIOLET LAMP ASSEMBLIESMarch 2022August 2024Allow2910NoNo
17702010METHOD OF FORMING PHOTO-ALIGNMENT FILM AND METHOD OF FORMING LIQUID CRYSTAL LAYERMarch 2022June 2024Allow2700NoNo
17762081SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PARTICLESMarch 2022January 2023Allow1000NoNo
17697813IDENTIFICATION AND QUANTITATION OF INSULIN-LIKE GROWTH FACTOR-I VARIANTS BY MASS SPECTROMETRYMarch 2022October 2024Allow3110NoNo
17693103REPELLENT ELECTRODE FOR ELECTRON REPELLINGMarch 2022July 2023Allow1610YesNo
17691647Lithography Apparatus and MethodMarch 2022February 2024Allow2310NoNo
17688613GERMANIUM TETRAFLOURIDE AND HYDROGEN MIXTURES FOR AN ION IMPLANTATION SYSTEMMarch 2022July 2023Allow1610NoNo
17687459FOIL TRAP AND LIGHT SOURCE APPARATUS INCLUDING THE SAMEMarch 2022October 2023Allow1900NoNo
17652784SURGICALLY POSITIONED NEUTRON FLUX ACTIVATED HIGH ENERGY THERAPEUTIC CHARGED PARTICLE GENERATION SYSTEMFebruary 2022June 2023Allow1610NoNo
17671691SYSTEMS AND METHODS FOR DISINFECTIONFebruary 2022July 2023Allow1720NoNo
17665817Germicidal Lighting Apparatus With Visible GlareFebruary 2022May 2024Allow2800NoNo
17583982SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS AND THEIR USE FOR PROCESS MONITORING AND CONTROLJanuary 2022January 2024Allow2430NoNo
17583799SYSTEM FOR MONITORING A PLASMAJanuary 2022May 2024Allow2810NoNo
17576156Multipole Unit and Charged Particle Beam DeviceJanuary 2022July 2023Allow1800NoNo
17576016Method of Measuring Aberration and Electron MicroscopeJanuary 2022July 2023Allow1800NoNo
17569737HIGH-BRIGHTNESS LASER PRODUCED PLASMA SOURCE AND METHOD OF GENERATION AND COLLECTION RADIATIONJanuary 2022May 2024Allow2800NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner CHANG, HANWAY.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
9
Examiner Affirmed
3
(33.3%)
Examiner Reversed
6
(66.7%)
Reversal Percentile
86.9%
Higher than average

What This Means

With a 66.7% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.

Strategic Value of Filing an Appeal

Total Appeal Filings
41
Allowed After Appeal Filing
21
(51.2%)
Not Allowed After Appeal Filing
20
(48.8%)
Filing Benefit Percentile
83.0%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 51.2% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Strategic Recommendations

Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner CHANG, HANWAY - Prosecution Strategy Guide

Executive Summary

Examiner CHANG, HANWAY works in Art Unit 2881 and has examined 1,001 patent applications in our dataset. With an allowance rate of 91.8%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 18 months.

Allowance Patterns

Examiner CHANG, HANWAY's allowance rate of 91.8% places them in the 76% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by CHANG, HANWAY receive 0.99 office actions before reaching final disposition. This places the examiner in the 12% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by CHANG, HANWAY is 18 months. This places the examiner in the 95% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a -0.1% benefit to allowance rate for applications examined by CHANG, HANWAY. This interview benefit is in the 10% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 33.3% of applications are subsequently allowed. This success rate is in the 66% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 51.8% of cases where such amendments are filed. This entry rate is in the 73% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 120.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 81% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 79.1% of appeals filed. This is in the 67% percentile among all examiners. Of these withdrawals, 47.1% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.

Petition Practice

When applicants file petitions regarding this examiner's actions, 26.3% are granted (fully or in part). This grant rate is in the 17% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 1.6% of allowed cases (in the 74% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).

Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.4% of allowed cases (in the 48% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Request pre-appeal conferences: PACs are highly effective with this examiner. Before filing a full appeal brief, request a PAC to potentially resolve issues without full PTAB review.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.