USPTO Examiner CHOI JAMES J - Art Unit 2881

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
17254724BEAM TRANSPORT LINE FOR RADIOTHERAPY SYSTEMS AND RADIOTHERAPY SYSTEM THEREOFDecember 2020November 2024Abandon4610NoNo
16972248METHOD FOR GENERATING COLD ATOMIC BEAM, APPARATUS FOR GENERATING COLD ATOMIC BEAM, AND ATOMIC INTERFEROMETERDecember 2020October 2022Abandon2210NoNo
17028363MASS SPECTROMETER WITH CHARGE UP DETERMINER USING ION INTENSITY SIGNALSeptember 2020February 2024Allow4020YesNo
17024578Geometry Based Three Dimensional Reconstruction of a Semiconductor Specimen by Solving an Optimization Problem, Using at Least Two SEM Images Acquired at Different Illumination AnglesSeptember 2020November 2023Allow3820YesNo
16992086AFM with Suppressed Parasitic SignalsAugust 2020June 2021Allow1000YesNo
16989618METHOD AND APPARATUS FOR PERFORMING IRRADIATION TIME OPTIMIZATION FOR INTENSITY MODULATED PROTON THERAPY DURING TREATMENT PLANNING WHILE MAINTAINING ACCEPTABLE IRRADIATION PLAN QUALITYAugust 2020June 2021Allow1000YesNo
16919460MASS ANALYSER WITH 3D ELECTROSTATIC FIELDJuly 2020December 2023Allow4121YesNo
16915965ZIRCON ID-TIMS PB ISOTOPE DETERMINATION METHOD USING MULTIPLE ION COUNTERS WITH DYNAMIC MULTI-COLLECTION PROTOCOLJune 2020May 2021Allow1100NoNo
16904798MULTIPLE ELECTRON-BEAM IMAGE ACQUISITION APPARATUS AND MULTIPLE ELECTRON-BEAM IMAGE ACQUISITION METHOD USING BEAM ARRANGEMENT WITH OMITTED CORNERS IN A SCAN DIRECTIONJune 2020December 2023Allow4220YesNo
16771547MASS SPECTROMETER INCLUDING A FIXATION BANDJune 2020June 2021Allow1201YesNo
16880631PULSED ION BEAM TO PULSED NEUTRAL PARTICLE BEAM SLOW WAVE CONVERTER DEVICE AND METHOD FOR USE THEREOFMay 2020January 2024Allow4421YesNo
16875900LONGITUDINAL TOOL FOR CLEANING ION OPTIC MULTIPOLE DEVICESMay 2020December 2023Allow4321NoNo
16842724DISINFECTION APPARATUS HAVING SUBMERSIBLE UV LIGHT DEVICESApril 2020March 2021Allow1200YesNo
16828330Method of Controlling Transmission Electron Microscope and Transmission Electron MicroscopeMarch 2020December 2021Allow2010YesNo
16821150MICROFABRICATED ION TRAP CHIP WITH IN SITU RADIO-FREQUENCY SENSINGMarch 2020April 2021Allow1310YesNo
16815048MASS SEPARATOR USING RETRACTABLE MAGNETIC YOKE ON A BEAM BENDING PATHMarch 2020March 2022Allow2420YesNo
16801555CHARGED PARTICLE MULTI-BEAM DEVICEFebruary 2020January 2022Allow2311YesNo
16781569DEVICE FOR GENERATING NEGATIVE IONS BY IMPINGING POSITIVE IONS ON A TARGETFebruary 2020February 2021Allow1200YesNo
16598144UNIAXIAL COUNTER-PROPAGATING MONOLASER ATOM TRAPOctober 2019December 2021Allow2611YesNo
16586971PERSONAL RADIATION PROTECTION GARMENT USING RADIATION PROTECTIVE LAYERSSeptember 2019December 2021Allow2630YesNo
16434924ION ACCELERATION COMPLEX FOR THE TREATMENT OF ATRIAL FIBRILLATIONSJune 2019December 2020Allow1800YesNo
16421192MULTI-BEAM SCANNING ELECTRON MICROSCOPEMay 2019February 2022Allow3321YesNo
16462956RESIN LAMINATE RIDGE FILTER FOR PARTICLE THERAPY SYSTEM AND MANUFACTURING METHOD THEREOFMay 2019April 2021Allow2311YesNo
16345520Charged Particle Beam Apparatus and Sample Observation Method Using Superimposed Comparison Image DisplayApril 2019June 2021Allow2621YesNo
16379511LASER DEVICE AND EXTREME ULTRAVIOLET LIGHT GENERATION DEVICE USING DELAY DETERMINATION AT A SHUTTERApril 2019February 2021Allow2211YesNo
16287608SHAKEN-LATTICE MATTER-WAVE GYROFebruary 2019April 2022Allow3820YesNo
16286574MASS SPECTROMETRY SYSTEM AND WORKING METHOD AND APPLICATION THEREOF, AND SAMPLING DEVICE USED THEREINFebruary 2019February 2021Allow2320YesNo
16260519RADIATION DETECTION APPARATUS FOR CHANGING SENSITIVITY OF RADIATION SENSING DURING CONTROL FOR RADIATION IMAGING, METHOD OF CONTROLLING THE SAME, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUMJanuary 2019December 2019Allow1020YesNo
16261313LASER DEVICE, AND EXTREME ULTRAVIOLET LIGHT GENERATION SYSTEMJanuary 2019August 2020Allow1920YesNo
16257433Transmission Electron Microscope Sample HolderJanuary 2019May 2021Abandon2811NoNo
16256196GEL NAIL CURING DEVICEJanuary 2019January 2021Abandon2310NoNo
16254965Scanning Electron Microscope and Measurement Method for Obtaining Images of a Specimen Using an Ion Beam and an Electron BeamJanuary 2019October 2020Allow2020YesNo
16254795Systems and Methods for Pesticide Detection Using Mass SpectroscopyJanuary 2019November 2020Allow2231YesNo
16246648OPTICAL PULSE GENERATION FOR AN EXTREME ULTRAVIOLET LIGHT SOURCEJanuary 2019September 2020Allow2020YesNo
16242149METHOD AND DEVICE FOR DETERMINING THE STOPPING POWER FOR PROTON THERAPYJanuary 2019April 2020Allow1620YesNo
16242431SHED-RESISTANT THERMAL ATOM SOURCEJanuary 2019March 2021Allow2721YesNo
16230714Apparatus and System for Active Heat Transfer Management in ESI Ion SourcesDecember 2018November 2020Allow2321YesNo
16312009Methods and Systems for Analyzing Proteins Via Electron Capture DissociationDecember 2018February 2022Allow3821YesNo
16217089PARTICLE BEAM TREATMENT SYSTEM AND METHOD FOR RENEWING FACILITIES OF PARTICLE BEAM TREATMENT SYSTEMDecember 2018March 2022Allow3941YesNo
16306834MASS SPECTROMETRY IMAGING WITH AUTOMATC PARAMETER VARYING IN ION SOURCE TO CONTROL CHARGED DROPLET SPRAYINGDecember 2018February 2021Allow2621YesNo
16306238DEVICES, SYSTEMS, AND METHODS FOR DISSOCIATION OF IONS USING LIGHT EMITTING DIODESNovember 2018May 2021Allow3021YesNo
16202061SAMPLE CHIP FOR ELECTRON MICROSCOPE AND ITS RELATED APPLICATIONNovember 2018March 2021Allow2721YesNo
16198606PLANE SOURCE BLACKBODYNovember 2018November 2020Allow2431YesNo
16197448TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH ADJUSTABLE BEAM ENERGY SPREADNovember 2018December 2020Allow2521YesNo
16197249APPARATUS AND METHOD FOR CONTROLLING ION BEAM USING ELECTOSTATIC FILTERNovember 2018November 2020Allow2421YesNo
16301143ENCLOSURE FOR AMBIENT IONISATION ION SOURCENovember 2018January 2021Allow2620YesNo
15577114DELIVERY DEVICE, SUBSTRATE ION-IMPLANTING SYSTEM AND METHOD THEREOFOctober 2018March 2021Abandon3921NoNo
16095442MASS SPECTROMETER, ION OPTICAL DEVICE, AND METHOD FOR ION MANIPULATION IN MASS SPECTROMETER USING TRAP WITH CONCENTRIC RING ELECTRODESOctober 2018May 2020Allow1811YesNo
16166132FLOW THROUGH TYPE ULTRAVIOLET LED DISINFECTING APPARATUSOctober 2018October 2020Abandon2420NoNo
16165193CHARGED PARTICLE BEAM DEVICE, FIELD CURVATURE CORRECTOR, AND METHODS OF OPERATING A CHARGED PARTICLE BEAM DEVICEOctober 2018June 2020Allow2021YesNo
16165909METHODS AND DEVICES FOR HIGH-THROUGHPUT DATA INDEPENDENT ANALYSIS FOR MASS SPECTROMETRY USING PARALLEL ARRAYS OF CELLSOctober 2018August 2020Allow2221YesNo
16095008TRANSFER TUBE CALIBRATIONOctober 2018March 2022Abandon4141YesNo
16166042PHOTONEUTRON SOURCE USING AND NEUTRON INSPECTION SYSTEMOctober 2018November 2020Abandon2520NoNo
16095011RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MICROSCOPY/LITHOGRAPHY TIPSOctober 2018January 2021Allow2721YesNo
16164497Infrared Ray Generation MeshOctober 2018July 2020Allow2120YesNo
15929053ION SENSOR, ION SENSOR MANUFACTURING METHOD, AND FIELD ASYMMETRIC ION MOBILITY SPECTROMETRY SYSTEMOctober 2018December 2020Allow2531YesNo
16158931METHOD FOR DETERMINING A CONCENTRATION OF A TARGET ANALYTE IN A SAMPLE OF BODILY FLUIDOctober 2018February 2021Allow2821YesNo
16155297METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED-PARTICLE MICROSCOPEOctober 2018June 2020Allow2020YesNo
16147110METHOD AND APPARATUS FOR PERFORMING IRRADIATION TIME OPTIMIZATION FOR INTENSITY MODULATED PROTON THERAPY DURING TREATMENT PLANNING WHILE MAINTAINING ACCEPTABLE IRRADIATION PLAN QUALITYSeptember 2018May 2020Allow1920YesNo
16143949BEAM SHAPING ASSEMBLY FOR NEUTRON CAPTURE THERAPYSeptember 2018January 2020Allow1620YesNo
16118891Charged Particle Beam Device Having Inspection Scan Direction Based on Scan with Smaller DoseAugust 2018January 2021Allow2931YesNo
16078847HYBRID METHOD TO SYNTHESIZE VOLTAGE WAVEFORMS WITH NON-HARMONIC PROFILESAugust 2018August 2020Abandon2421NoNo
16106131PARTICLE BEAM THERAPY SYSTEM HAVING X-RAY DETECTORS ATTACHED TO A PARTICLE BEAM IRRADIATION SYSTEMAugust 2018February 2020Allow1820YesNo
16104210CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND METHOD FOR REDUCING ELECTRIFICATION OF SUBSTRATEAugust 2018August 2020Allow2421YesNo
16100589ION INJECTING DEVICE USING VACANT BAFFLE AND FARADAY CUPS, AND ION INJECTING METHOD THEREOF, FOR DETECTING CONTENT OF SUSPENDING PARTICLESAugust 2018June 2020Allow2221YesNo
16058266AUTOMATIC CALIBRATION DEVICE AND ION MIGRATION SPECTROMETERAugust 2018August 2020Allow2421YesNo
16073993SYSTEMS AND METHODS FOR ISOLATING A TARGET ION IN AN ION TRAP USING A DUAL FREQUENCY WAVEFORMJuly 2018February 2022Allow4241YesNo
16047987SYSTEMS AND METHODS FOR COMPENSATING DISPERSION OF A BEAM SEPARATOR IN A SINGLE-BEAM OR MULTI-BEAM APPARATUSJuly 2018January 2022Allow4121NoYes
16073255SYSTEMS AND METHODS FOR COLLISION INDUCED DISSOCIATION OF IONS IN AN ION TRAPJuly 2018December 2020Allow2921YesNo
16073159LIQUID MEMBRANE FORMING DEVICE AND LIQUID MEMBRANE CARTRIDGE USED THEREINJuly 2018April 2020Allow2020YesNo
16072230BIOSECURITY SYSTEM USING MONITORING AND SANITIZATION FOR AN AGRICULTURAL DWELLINGJuly 2018March 2022Allow4341YesNo
16042380MULTI CHARGED PARTICLE BEAM WRITING APPARATUS AND MULTI CHARGED PARTICLE BEAM WRITING METHODJuly 2018August 2020Allow2521YesNo
16070790CHARGED PARTICLE DETECTOR INCLUDING A LIGHT-EMITTING SECTION HAVING LAMINATION STRUCTURE, CHARGED PARTICLE BEAM DEVICE, AND MASS SPECTROMETER.July 2018March 2021Allow3240YesNo
16018530MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND APPLICATIONSJune 2018December 2019Abandon1701NoNo
16005278MEASURING A HEIGHT PROFILE OF A HOLE FORMED IN NON-CONDUCTIVE REGIONJune 2018May 2020Allow2320YesNo
15759192FABRICATION OF MASS SPECTROMETRY SURFACEMarch 2018July 2021Allow4041YesNo
15892487HIGH BRIGHTNESS ION BEAM EXTRACTION USING BIAS ELECTRODES AND MAGNETS PROXIMATE THE EXTRACTION APERTUREFebruary 2018February 2019Allow1211NoNo
15873217STERILIZATION DEVICE USING STRAIGHTENER AND UV LED ARRAY FACING THE STRAIGHTENERJanuary 2018April 2021Allow3950YesNo
15871171LED structure and luminaire for continuous disinfectionJanuary 2018February 2022Allow4940YesNo
15741246CHARGED PARTICLE BEAM SYSTEM, OPTO-ELECTRO SIMULTANEOUS DETECTION SYSTEM AND METHODDecember 2017November 2020Allow3421YesNo
15740291MAGNETIC LENS AND EXCITING CURRENT CONTROL METHODDecember 2017November 2020Allow3430YesNo
15842544System And Method To Monitor Glitch EnergyDecember 2017June 2020Allow3021YesNo
15840782DEVICE FOR CURING PIPELINE INNER RESIN LININGSDecember 2017December 2019Allow2520YesNo
15840171MASS SPECTROMETRY DEVICEDecember 2017March 2020Abandon2820NoNo
15833706METHOD FOR MEASURING DEPTH PROFILE OF PARTICLE BEAM USING ACOUSTIC SIGNALS GENERATED BY THE PARTICLE BEAMDecember 2017March 2020Allow2710YesNo
15825690BEAM SHAPING ASSEMBLY FOR NEUTRON CAPTURE THERAPYNovember 2017August 2018Allow910NoNo
15825787METHODS AND APPARATUS FOR DETERMINING INFORMATION REGARDING CHEMICAL COMPOSITION USING X-RAY RADIATIONNovember 2017March 2021Abandon3931YesNo
15823123Ion Interface Device Having Multiple Confinement Cells and Methods of Use ThereofNovember 2017November 2018Abandon1110NoNo
15819466DEVICE AND METHOD FOR THE PREPARATION OF SAMPLES FOR IONIZATION BY LASER DESORPTION IN A MASS SPECTROMETERNovember 2017January 2020Allow2620YesNo
15819793TECHNIQUES FOR MASS ANALYZING A COMPLEX SAMPLE BASED ON NOMINAL MASS AND MASS DEFECT INFORMATIONNovember 2017June 2020Allow3120YesNo
15817448Imaging a Gap Between Sample and Probe of a Scanning Probe Microscope in a Substantially Horizontal Side ViewNovember 2017April 2020Allow2921YesNo
15814884Guided Scanning Electron Microscopy Metrology Based on Wafer TopographyNovember 2017November 2020Allow3640YesNo
15814950BLANKING DEFLECTOR, AND MULTI CHARGED PARTICLE BEAM WRITING APPARATUS USING THREE DEFLECTOR ELECTRODES AND A TRANSMISSION LINENovember 2017May 2020Allow3021YesNo
15813998OPTICAL APPARATUS AND VIBRATION REMOVING METHODNovember 2017January 2020Allow2620YesNo
15813326Direct Capture and Analysis of Aerosols and Vapors By Paper Spray Mass SpectrometryNovember 2017January 2020Allow2621YesNo
15813272INFORMATION ACQUIRING METHOD IN ATOMIC FORCE MICROSCOPENovember 2017November 2019Abandon2421YesNo
15813777Ion Filter Using Aperture Plate With Plurality of ZonesNovember 2017April 2021Abandon4151YesNo
15808905DISINFECTION APPARATUS HAVING SUBMERSIBLE UV LIGHT DEVICESNovember 2017January 2020Allow2731YesNo
15808904FLOWING FLUID DISINFECTORS AND SUBMERSIBLE UV LIGHT DEVICESNovember 2017February 2020Abandon2860NoNo
15568529SAMPLE FRAGMENTATION DEVICE USING HEATING AND PRESSURE REGULATION BETWEEN SAMPLE INJECTOR AND SEPARATION COLUMNOctober 2017June 2021Allow4351YesNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner CHOI, JAMES J.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
8
Examiner Affirmed
4
(50.0%)
Examiner Reversed
4
(50.0%)
Reversal Percentile
76.0%
Higher than average

What This Means

With a 50.0% reversal rate, the PTAB reverses the examiner's rejections in a meaningful percentage of cases. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.

Strategic Value of Filing an Appeal

Total Appeal Filings
31
Allowed After Appeal Filing
10
(32.3%)
Not Allowed After Appeal Filing
21
(67.7%)
Filing Benefit Percentile
50.6%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 32.3% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.

Strategic Recommendations

Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner CHOI, JAMES J - Prosecution Strategy Guide

Executive Summary

Examiner CHOI, JAMES J works in Art Unit 2881 and has examined 362 patent applications in our dataset. With an allowance rate of 69.9%, this examiner has a below-average tendency to allow applications. Applications typically reach final disposition in approximately 28 months.

Allowance Patterns

Examiner CHOI, JAMES J's allowance rate of 69.9% places them in the 33% percentile among all USPTO examiners. This examiner has a below-average tendency to allow applications.

Office Action Patterns

On average, applications examined by CHOI, JAMES J receive 2.57 office actions before reaching final disposition. This places the examiner in the 71% percentile for office actions issued. This examiner issues a slightly above-average number of office actions.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by CHOI, JAMES J is 28 months. This places the examiner in the 68% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +45.7% benefit to allowance rate for applications examined by CHOI, JAMES J. This interview benefit is in the 90% percentile among all examiners. Recommendation: Interviews are highly effective with this examiner and should be strongly considered as a prosecution strategy. Per MPEP § 713.10, interviews are available at any time before the Notice of Allowance is mailed or jurisdiction transfers to the PTAB.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 29.7% of applications are subsequently allowed. This success rate is in the 60% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 11.6% of cases where such amendments are filed. This entry rate is in the 13% percentile among all examiners. Strategic Recommendation: This examiner rarely enters after-final amendments compared to other examiners. You should generally plan to file an RCE or appeal rather than relying on after-final amendment entry. Per MPEP § 714.12, primary examiners have discretion in entering after-final amendments, and this examiner exercises that discretion conservatively.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 66.7% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 57% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 69.2% of appeals filed. This is in the 55% percentile among all examiners. Of these withdrawals, 38.9% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.

Petition Practice

When applicants file petitions regarding this examiner's actions, 62.9% are granted (fully or in part). This grant rate is in the 66% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 0.6% of allowed cases (in the 60% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).

Quayle Actions: This examiner issues Ex Parte Quayle actions in 1.6% of allowed cases (in the 68% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Prioritize examiner interviews: Interviews are highly effective with this examiner. Request an interview after the first office action to clarify issues and potentially expedite allowance.
  • Plan for RCE after final rejection: This examiner rarely enters after-final amendments. Budget for an RCE in your prosecution strategy if you receive a final rejection.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.