USPTO Art Unit 1737 Prosecution Statistics

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18820061REFLECTIVE MASK BLANK, REFLECTIVE MASK, AND MANUFACTURING METHOD THEREFORAugust 2024October 2024Allow100NoNo
18751925NANOCELLULOSE X-RAY FILM AND METHOD OF MAKINGJune 2024September 2024Allow300YesNo
18749170EUV PHOTO MASKS AND MANUFACTURING METHOD THEREOFJune 2024March 2025Allow800NoNo
18749541FILM, MANUFACTURING METHOD OF FILM, AND LAMINATEJune 2024June 2025Abandon1200NoNo
18664420ANISOTROPIC THERMALLY CONDUCTIVE POLYMERS WITH DYNAMIC MOLECULAR WEIGHT, AND METHODS OF MAKING THE SAMEMay 2024June 2025Allow1300NoNo
18654329METHOD FOR FORMING STRUCTURE OF PELLICLE-MASK STRUCTURE WITH VENT STRUCTUREMay 2024June 2025Allow1320NoNo
18654160ORGANOTIN PATTERNING MATERIALS WITH LIGANDS HAVING SILICON/GERMANIUM; PRECURSOR COMPOSITIONS; AND SYNTHESIS METHODSMay 2024January 2025Allow800NoNo
18706104LIQUID CRYSTAL COMPOUND, LIQUID CRYSTAL COMPOSITION THEREOF, AND LIQUID CRYSTAL DISPLAY DEVICEApril 2024June 2025Allow1410NoNo
18649060PELLICLE FOR FLAT PANEL DISPLAY PHOTOMASKApril 2024February 2025Allow900NoNo
18642711PATTERN FORMING METHOD AND METHOD FOR MANUFACTURING ELECTRONIC DEVICEApril 2024April 2025Allow1210NoNo
18639365BIO-DERIVED X-RAY-SENSITIVE FILM AND A METHOD OF PREPARATION THEREOFApril 2024June 2024Allow200NoNo
18701832ANTHRAQUINONE COMPOUND, LIQUID CRYSTAL COMPOSITION CONTAINING SAID COMPOUND, AND LIGHT-CONTROLLING ELEMENTApril 2024March 2025Allow1110NoNo
18631063LIQUID CRYSTAL COMPOSITION AND LIQUID CRYSTAL ELEMENTApril 2024January 2025Allow910NoNo
18698038ANTHRAQUINONE COMPOUND, LIQUID CRYSTAL COMPOSITION CONTAINING SAID COMPOUND, AND DIMMING ELEMENTApril 2024March 2025Allow1210NoNo
18621502REFLECTIVE MASK BLANK AND REFLECTIVE MASKMarch 2024June 2024Allow300NoNo
18609833PHOTORESIST COMPOSITION AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICEMarch 2024March 2025Allow1110NoNo
18601853METHOD FOR SIZING A GRAY SCALE LITHOGRAPHY MASKMarch 2024June 2024Allow300NoNo
18601592METHODS AND SYSTEMS FOR RETICLE ENHANCEMENT TECHNOLOGY OF A DESIGN PATTERN TO BE MANUFACTURED ON A SUBSTRATEMarch 2024November 2024Allow800NoNo
18591383METHOD OF MANUFACTURING INTEGRATED CIRCUITFebruary 2024November 2024Allow900NoNo
18686535Liquid Crystalline Polymer Composition and Molded Article Produced TherefromFebruary 2024June 2025Allow1610NoNo
18444020REFLECTIVE MASK BLANK, REFLECTIVE MASK, METHOD OF MANUFACTURING REFLECTIVE MASK BLANK, AND METHOD OF MANUFACTURING REFLECTIVE MASKFebruary 2024May 2024Allow300NoNo
18439057REFLECTIVE MASK BLANK FOR EUV LITHOGRAPHY AND SUBSTRATE WITH CONDUCTIVE FILMFebruary 2024October 2024Allow800NoNo
18438142FABRICATING A DEVICE USING A MULTILAYER STACKFebruary 2024December 2024Allow1010YesNo
18437967Nonlinear Optical Chromophores Having Tetrahydrocarbazole Donor Groups, Lyotropic Compositions Containing the Same, and Methods of Poling Such CompositionsFebruary 2024September 2024Allow710NoNo
18436895TONER AND METHOD OF FORMATION USING FLY ASH-RICH CARBONFebruary 2024December 2024Allow1010NoNo
18433486COMPUTER-READABLE STORAGE MEDIUM RECORDING DATA STRUCTURE FOR STORING DATA CONTROLLING OPERATION OF OVERLAY MEASUREMENT DEVICE AND OVERLAY MEASUREMENT DEVICE THEREFORFebruary 2024August 2024Allow600NoNo
18433479COMPUTER-READABLE STORAGE MEDIUM RECORDING DATA STRUCTURE FOR STORING DATA CONTROLLING OPERATION OF OVERLAY MEASUREMENT DEVICE AND OVERLAY MEASUREMENT DEVICE THEREFORFebruary 2024August 2024Allow600NoNo
18433482COMPUTER-READABLE STORAGE MEDIUM RECORDING DATA STRUCTURE FOR STORING DATA CONTROLLING OPERATION OF OVERLAY MEASUREMENT DEVICE AND OVERLAY MEASUREMENT DEVICE THEREFORFebruary 2024August 2024Allow600NoNo
18420846REFLECTIVE MASK BLANK, REFLECTIVE MASK, METHOD OF MANUFACTURING REFLECTIVE MASK BLANK, AND METHOD OF MANUFACTURING REFLECTIVE MASKJanuary 2024October 2024Allow920NoNo
18417352REFLECTIVE MASK BLANK AND REFLECTIVE MASKJanuary 2024September 2024Allow800NoNo
18411091METHOD OF MANUFACTURING PHASE SHIFT PHOTO MASKSJanuary 2024May 2025Allow1620NoNo
18404934METHOD AND APPARATUS FOR DIRECT WRITING PHOTOETCHING BY PARALLEL INTERPENETRATING SUPER-RESOLUTION HIGH-SPEED LASERJanuary 2024July 2024Allow600NoNo
18402511EUV PHOTO MASKS AND MANUFACTURING METHOD THEREOFJanuary 2024September 2024Allow800NoNo
18575719PHOTOLITHOGRAPHY METHODDecember 2023October 2024Allow910NoNo
18575532MASK TOPOLOGY OPTIMIZATION METHOD AND SYSTEM FOR SURFACE PLASMON NEAR-FIELD PHOTOLITHOGRAPHYDecember 2023July 2024Allow700NoNo
18575736METHOD FOR INVERSE OPTICAL PROXIMITY CORRECTION OF SUPER-RESOLUTION LITHOGRAPHY BASED ON LEVEL SET ALGORITHMDecember 2023June 2024Allow500NoNo
18396056PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING CURED RELIEF PATTERN, AND SEMICONDUCTOR APPARATUSDecember 2023September 2024Abandon910NoNo
18395234EXTREME ULTRAVIOLET MASK WITH TANTALUM BASE ALLOY ABSORBERDecember 2023July 2024Allow700NoNo
18394787REFLECTIVE MASK BLANK, REFLECTIVE MASK, METHOD OF MANUFACTURING REFLECTIVE MASK BLANK, AND METHOD OF MANUFACTURING REFLECTIVE MASKDecember 2023September 2024Allow900NoNo
18545948EXTREME ULTRAVIOLET MASK AND METHOD FOR FORMING THE SAMEDecember 2023November 2024Allow1110NoNo
18544970REFLECTIVE MASK BLANK, REFLECTIVE MASK, AND METHOD FOR MANUFACTURING REFLECTIVE MASKDecember 2023March 2024Allow200NoNo
18528914ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING TARGET SUBSTRATEDecember 2023January 2025Allow1400NoNo
18528544REFLECTIVE MASK BLANK, REFLECTIVE MASK AND METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICEDecember 2023December 2024Allow1200NoNo
18526463REFLECTIVE MASK BLANK AND REFLECTIVE MASKDecember 2023July 2024Allow700NoNo
18522942PHOTOMASK INCLUDING FIDUCIAL MARK AND METHOD OF MAKING A PHOTOMASKNovember 2023February 2025Allow1510NoNo
18517796REFLECTIVE MASK BLANK, REFLECTIVE MASK, METHOD OF MANUFACTURING REFLECTIVE MASK BLANK, AND METHOD OF MANUFACTURING REFLECTIVE MASKNovember 2023January 2024Allow200NoNo
18517828CLEANING METHOD FOR PHOTO MASKS AND APPARATUS THEREFORNovember 2023November 2024Allow1200NoNo
18516630PELLICLE FOR AN EUV LITHOGRAPHY MASK AND A METHOD OF MANUFACTURING THEREOFNovember 2023November 2024Allow1200NoNo
18515161LIQUID CRYSTAL COMPOSITION, ELEMENT AND LIQUID CRYSTAL LENS OR A BIREFRINGENT LENS FOR STEREOSCOPIC IMAGE DISPLAYNovember 2023January 2025Allow1410NoNo
18503908METHOD FOR BUILDING AN ETCHING-FREE HYBRID NONLINEAR WAVEGUIDE COMPOSED OF POLYMER AND ION-IMPLANTED NONLINEAR CRYSTALNovember 2023June 2024Allow700NoNo
18501693PHOTORESIST SYSTEM AND METHODNovember 2023March 2025Allow1620NoNo
18498437ELECTRON BEAM LITHOGRAPHY WITH DYNAMIC FIN OVERLAY CORRECTIONOctober 2023July 2024Allow900NoNo
18495987LIQUID CRYSTAL COMPOSITION AND DISPLAY PANELOctober 2023June 2025Abandon2020NoNo
18557696LIQUID CRYSTAL MEDIUMOctober 2023March 2025Abandon1610NoNo
18557106PELLICLE FILM, PELLICLE, EXPOSURE ORIGINAL PLATE, EXPOSURE DEVICE, AND METHOD FOR MANUFACTURING PELLICLE FILMOctober 2023April 2025Allow1840YesNo
18493738ORGANIC SOLID CRYSTALS HAVING HELICAL STRUCTURES FORMED USING CHOLESTERIC LIQUID CRYSTALSOctober 2023December 2024Allow1410NoNo
18493734ORGANIC SOLID CRYSTALS HAVING HELICAL STRUCTURES FORMED USING NEGATIVE TEMPLATESOctober 2023December 2024Allow1410NoNo
18492067LIGHTING DEVICE AND OPTICAL ELEMENTOctober 2023June 2025Allow2010NoNo
18382356REFLECTIVE MASK BLANK, REFLECTIVE MASK, METHOD OF MANUFACTURING REFLECTIVE MASK BLANK, AND METHOD OF MANUFACTURING REFLECTIVE MASKOctober 2023January 2024Allow300NoNo
18382269REFLECTIVE MASK BLANK, REFLECTIVE MASK, METHOD OF MANUFACTURING REFLECTIVE MASK BLANK, AND METHOD OF MANUFACTURING REFLECTIVE MASKOctober 2023October 2024Allow1210NoNo
18286845COMPOUND, LIQUID CRYSTAL COMPOSITION, AS WELL AS LIQUID CRYSTAL DISPLAY ELEMENT, SENSOR, LIQUID CRYSTAL LENS, OPTICAL COMMUNICATION EQUIPMENT, AND ANTENNA EACH USING THE SAMEOctober 2023April 2025Allow1810NoNo
18286600LIQUID-CRYSTAL POLYMER COMPOSITION, MOLDED LIQUID-CRYSTAL POLYMER, AND ELECTRICAL/ELECTRONIC APPLIANCEOctober 2023May 2025Allow1920YesNo
18484432METHOD FOR REMOVING PARTICLES FROM PELLICLE AND PHOTOMASKOctober 2023November 2024Allow1310NoNo
18483484REFLECTIVE MASK BLANK, REFLECTIVE MASK, METHOD OF MANUFACTURING REFLECTIVE MASK, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICEOctober 2023May 2024Allow700NoNo
18483453REFLECTIVE MASK BLANK, REFLECTIVE MASK AND MANUFACTURING METHOD THEREOF, AND SEMICONDUCTOR DEVICE MANUFACTURING METHODOctober 2023May 2024Allow700NoNo
18481362METHOD FOR PREPARING PIXEL DEFINE LAYEROctober 2023March 2025Allow1720YesNo
18476440LIGHT CONTROL SHEET, LIGHT CONTROL DEVICE, PHOTOSENSITIVE COMPOSITION, AND METHOD FOR PRODUCING LIGHT CONTROL SHEETSeptember 2023May 2025Allow2021NoNo
18284204AROMATIC ISOTHIOCYANATESSeptember 2023September 2024Allow1210NoNo
18371650Liquid crystal polymer, composition, liquid crystal polymer film, laminated material and method of forming liquid crystal polymer filmSeptember 2023March 2025Allow1821NoNo
18283329ANTHRAQUINONE COMPOUND, LIQUID CRYSTAL COMPOSITION CONTAINING SAID COMPOUND, AND DIMMING ELEMENTSeptember 2023September 2024Allow1110NoNo
18370204PELLICLE FRAME, PELLICLE, AND METHOD FOR PEELING PELLICLESeptember 2023July 2024Allow1010NoNo
18370197PELLICLE FRAME, PELLICLE, AND METHOD FOR PEELING PELLICLESeptember 2023May 2024Allow800NoNo
18369486PELLICLE FRAME, PELLICLE, AND METHOD FOR PEELING PELLICLESeptember 2023July 2024Allow1010NoNo
18369481PELLICLE FRAME, PELLICLE, AND METHOD FOR PEELING PELLICLESeptember 2023April 2024Allow700NoNo
18466668COMPOUND, POLYMER, PATTERN FORMING MATERIAL, PATTERN FORMING METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICESeptember 2023November 2024Allow1400NoNo
18464695COATING COMPOSITIONS FOR USE WITH AN OVERCOATED PHOTORESISTSeptember 2023October 2024Allow1310NoNo
18281306DYE COMPOUND-CONTAINING LIQUID CRYSTAL COMPOSITION AND DEVICE INCLUDING THE SAMESeptember 2023November 2024Allow1510NoNo
18463009COMPOSITION, OPTICALLY ANISOTROPIC FILM, CIRCULARLY POLARIZING PLATE, DISPLAY DEVICE, COMPOUND, AND METHOD FOR PRODUCING COMPOUNDSeptember 2023March 2025Allow1810NoNo
18242643METHOD OF FORMING PATTERNSSeptember 2023March 2025Abandon1921YesNo
18241442PELLICLESeptember 2023June 2024Allow1010NoNo
18459703PELLICLESeptember 2023July 2024Allow1110NoNo
18239906Liquid Crystal Element and Emulsion CompositionAugust 2023June 2025Allow2111NoNo
18238331HETEROCYCLIC COMPOUNDS FOR LIQUID CRYSTALSAugust 2023October 2024Allow1410NoNo
18456426PELLICLE FRAME AND PELLICLEAugust 2023August 2024Allow1110NoNo
18456434PELLICLE FRAME AND PELLICLEAugust 2023August 2024Allow1110NoNo
18456436PELLICLE FRAME AND PELLICLEAugust 2023August 2024Allow1110NoNo
18236515ADHESIVE FOR PELLICLE, PELLICLE FOR PHOTO MASK AND METHOD FOR MANUFACTURING THE SAMEAugust 2023November 2024Allow1510YesNo
18450452METHOD FOR PREPARING PIXEL DEFINE LAYERAugust 2023March 2025Allow1920YesNo
18234415Mesogen CompoundsAugust 2023October 2024Allow1411NoNo
18449075METHOD FOR PREPARING PIXEL DEFINE LAYERAugust 2023March 2025Allow1920YesNo
18447441PHOTORESIST WITH POLAR-ACID-LABILE-GROUPAugust 2023March 2024Allow700NoNo
18447920METALLIC PHOTORESIST PATTERNING AND DEFECT IMPROVEMENTAugust 2023May 2025Allow2210YesNo
18446702EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY METHOD WITH DEVELOPER COMPOSITIONAugust 2023August 2024Allow1210NoNo
18447104APPARATUS, SYSTEM AND METHODAugust 2023May 2025Allow2121NoNo
18231444RESIN, PHOTORESIST COMPOSITION, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICEAugust 2023June 2024Allow1110NoNo
18276357ANTHRAQUINONE COMPOUND, LIQUID CRYSTAL COMPOSITION CONTAINING SAID COMPOUND, AND DIMMING ELEMENTAugust 2023August 2024Allow1210NoNo
18231000ULTRA-THIN, ULTRA-LOW DENSITY FILMS FOR EUV LITHOGRAPHYAugust 2023May 2024Allow900NoNo
18366097Multi-Function Overlay Marks for Reducing Noise and Extracting Focus and Critical Dimension InformationAugust 2023April 2024Allow800NoNo
18365302EUV Metallic Resist Performance Enhancement Via AdditivesAugust 2023March 2025Allow1930YesNo
18365760OPTICAL ASSEMBLY WITH COATING AND METHODS OF USEAugust 2023March 2025Allow1920YesNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for art-unit 1737.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
48
Examiner Affirmed
26
(54.2%)
Examiner Reversed
22
(45.8%)
Reversal Percentile
90.6%
Higher than average

What This Means

With a 45.8% reversal rate, the PTAB reverses the examiner's rejections in a meaningful percentage of cases. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.

Strategic Value of Filing an Appeal

Total Appeal Filings
193
Allowed After Appeal Filing
53
(27.5%)
Not Allowed After Appeal Filing
140
(72.5%)
Filing Benefit Percentile
23.0%
Lower than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 27.5% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the bottom 25% across the USPTO, indicating that filing appeals is less effective here than in most other areas.

Strategic Recommendations

Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.

Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.

Art Unit 1737 - Prosecution Statistics Summary

Executive Summary

Art Unit 1737 is part of Group 1730 in Technology Center 1700. This art unit has examined 5,769 patent applications in our dataset, with an overall allowance rate of 81.2%. Applications typically reach final disposition in approximately 26 months.

Comparative Analysis

Art Unit 1737's allowance rate of 81.2% places it in the 64% percentile among all USPTO art units. This art unit has an above-average allowance rate compared to other art units.

Prosecution Patterns

Applications in Art Unit 1737 receive an average of 1.80 office actions before reaching final disposition (in the 48% percentile). The median prosecution time is 26 months (in the 67% percentile).

Strategic Considerations

When prosecuting applications in this art unit, consider the following:

  • The art unit's allowance rate suggests a more favorable examination environment compared to the USPTO average.
  • With fewer office actions than average, plan for relatively streamlined prosecution.
  • The median prosecution time is shorter than average and should be factored into your continuation and client communication strategies.
  • Review individual examiner statistics within this art unit to identify examiners with particularly favorable or challenging prosecution patterns.

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.