Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18651526 | ACCESS TIME IN A MEMORY ARRAY | April 2024 | March 2026 | Allow | 23 | 1 | 0 | No | No |
| 18597860 | Sense Amplifier and Method Thereof | March 2024 | August 2025 | Allow | 17 | 1 | 0 | No | No |
| 18587279 | NONVOLATILE MEMORY | February 2024 | March 2026 | Allow | 25 | 1 | 0 | Yes | No |
| 18215681 | 3D LAYOUT AND ORGANIZATION FOR ENHANCEMENT OF MODERN MEMORY SYSTEMS | June 2023 | March 2026 | Allow | 32 | 2 | 0 | No | No |
| 18204806 | STORAGE SYSTEM AND SEMICONDUCTOR PACKAGE WITH IMPROVED POWER SUPPLY EFFICIENCY | June 2023 | September 2025 | Allow | 27 | 1 | 0 | No | No |
| 18314825 | METHOD FOR TESTING AND REPAIRING MEMORY DEVICE | May 2023 | September 2025 | Allow | 28 | 1 | 0 | No | No |
| 18030834 | MEMRISTIVE LOGIC GATE CIRCUIT | April 2023 | August 2025 | Allow | 28 | 1 | 0 | No | No |
| 17691957 | THRESHOLD VOLTAGE DISTRIBTUTION ADJUSTMENT FOR BUFFER | March 2022 | January 2023 | Allow | 10 | 1 | 0 | No | No |
| 17679656 | SELECTIVE WORDLINE SCANS BASED ON A DATA STATE METRIC | February 2022 | February 2023 | Allow | 11 | 1 | 0 | No | No |
| 17583967 | Pooled Memory System Enabled by Monolithic In-Package Optical I/O | January 2022 | February 2023 | Allow | 13 | 1 | 0 | No | No |
| 17561787 | RECOVERY OF MEMORY FROM ASYNCHRONOUS POWER LOSS | December 2021 | January 2023 | Allow | 13 | 1 | 0 | No | No |
| 17561545 | SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM | December 2021 | February 2023 | Allow | 14 | 1 | 0 | Yes | No |
| 17557389 | MEMORY ARRAY STRUCTURES FOR CAPACITIVE SENSE NAND MEMORY | December 2021 | January 2023 | Allow | 13 | 1 | 0 | No | No |
| 17540314 | SEMICONDUCTOR DEVICE | December 2021 | January 2023 | Allow | 14 | 1 | 0 | No | No |
| 17523369 | STORAGE CONTROLLER, STORAGE DEVICE, AND OPERATION METHOD OF STORAGE DEVICE | November 2021 | March 2023 | Allow | 16 | 1 | 0 | Yes | No |
| 17500066 | SEMICONDUCTOR MEMORY DEVICE | October 2021 | December 2022 | Allow | 14 | 1 | 0 | No | No |
| 17468711 | SIGNAL MODULATION APPARATUS, MEMORY STORAGE APPARATUS, AND SIGNAL MODULATION METHOD | September 2021 | February 2023 | Allow | 17 | 0 | 0 | No | No |
| 17305878 | APPARATUSES AND METHODS FOR REFRESH ADDRESS MASKING | July 2021 | January 2023 | Allow | 18 | 1 | 0 | No | No |
| 17335606 | INTEGRATED CIRCUIT INCLUDING CELL ARRAY WITH WORD LINE ASSIST CELLS | June 2021 | January 2023 | Allow | 20 | 1 | 0 | Yes | No |
| 17220320 | PAGE BUFFER AND SEMICONDUCTOR MEMORY DEVICE HAVING THE SAME | April 2021 | February 2023 | Allow | 23 | 2 | 0 | No | No |
| 16275776 | SEMICONDUCTOR MEMORY DEVICE, MEMORY SYSTEM, AND WRITE METHOD | February 2019 | September 2019 | Abandon | 7 | 0 | 0 | No | No |
| 15479196 | LIGHT INCIDENT ANGLE CONTROLLABLE ELECTRONIC DEVICE AND MANUFACTURING METHOD THEREOF | April 2017 | June 2018 | Abandon | 15 | 1 | 0 | No | No |
| 14903600 | MEMORY SYSTEM AND METHOD FOR PROCESSING DATA IN MEMORY | January 2016 | January 2017 | Abandon | 12 | 1 | 0 | No | No |
| 14696334 | ELECTRONIC DEVICE | April 2015 | February 2017 | Abandon | 22 | 2 | 0 | No | No |
| 14634708 | MEMORY DEVICE AND METHOD FOR CONTROLLING THE SAME | February 2015 | February 2017 | Abandon | 24 | 1 | 0 | No | No |
| 14192380 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE | February 2014 | September 2016 | Abandon | 30 | 1 | 0 | No | No |
| 14192428 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE | February 2014 | September 2016 | Abandon | 31 | 1 | 0 | No | No |
| 14153560 | GLOBAL BITLINE WRITE ASSIST FOR SRAM ARCHITECTURES | January 2014 | December 2015 | Abandon | 23 | 1 | 0 | No | No |
| 14138160 | COMBINATION STORAGE AND PROCESSING DEVICE | December 2013 | August 2018 | Abandon | 56 | 2 | 0 | Yes | No |
| 14100479 | SEMICONDUCTOR APPARATUS AND CHIP ID GENERATION METHOD THEREOF | December 2013 | October 2015 | Abandon | 22 | 2 | 0 | No | No |
| 14014244 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE | August 2013 | January 2015 | Abandon | 17 | 1 | 0 | No | No |
| 13917662 | CONTENT ADDRESSABLE MEMORY CELLS AND TERNARY CONTENT ADDRESSABLE MEMORY CELLS | June 2013 | December 2014 | Abandon | 18 | 1 | 0 | No | No |
| 13839219 | SEMICONDUCTOR MEMORY STORAGE APPARATUS HAVING CHARGE STORAGE LAYER AND CONTROL GATE | March 2013 | August 2015 | Abandon | 29 | 1 | 0 | No | No |
| 13834477 | OTPROM ARRAY WITH LEAKAGE CURRENT CANCELATION FOR ENHANCED EFUSE SENSING | March 2013 | October 2015 | Abandon | 31 | 2 | 0 | No | No |
| 13796808 | ERASING METHOD OF RESISTIVE RANDOM ACCESS MEMORY | March 2013 | December 2014 | Abandon | 21 | 2 | 0 | No | No |
| 13779038 | NONVOLATILE MEMORY DEVICE AND OPERATING METHOD THEREOF | February 2013 | October 2014 | Abandon | 19 | 1 | 0 | Yes | No |
| 13747777 | NONVOLATILE MEMORY APPARATUS AND METHOD OF OPERATING THE SAME | January 2013 | September 2015 | Abandon | 32 | 2 | 0 | No | No |
| 13720358 | FLASH MEMORY DEVICE AND OPERATING METHOD THEREOF | December 2012 | December 2014 | Abandon | 24 | 2 | 0 | Yes | No |
| 13614486 | SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SAME | September 2012 | January 2015 | Abandon | 28 | 1 | 0 | No | No |
| 13308736 | SEMICONDUCTOR MEMORY DEVICE | December 2011 | February 2013 | Abandon | 15 | 1 | 0 | No | No |
| 13269416 | Method and Apparatus for Memory Fault Tolerance | October 2011 | April 2012 | Abandon | 6 | 0 | 0 | No | No |
| 13052978 | SEMICONDUCTOR MEMORY DEVICE IN WHICH RESISTANCE STATE OF MEMORY CELL IS CONTROLLABLE | March 2011 | May 2013 | Abandon | 26 | 1 | 0 | No | No |
| 12929696 | Semiconductor storage device | February 2011 | September 2013 | Abandon | 31 | 2 | 0 | No | No |
| 12774618 | MEMORY DEVICE WORD LINE DRIVERS AND METHODS | May 2010 | September 2011 | Abandon | 16 | 0 | 0 | No | No |
| 12453855 | Magnetic head assembly and magnetic recording apparatus | May 2009 | April 2011 | Abandon | 23 | 0 | 0 | No | No |
| 12207104 | SYSTEM TO ADJUST A REFERENCE CURRENT | September 2008 | April 2010 | Allow | 20 | 0 | 0 | No | No |
| 12134686 | MAGNETIC MEMORY ARRAYS | June 2008 | March 2009 | Abandon | 10 | 1 | 0 | No | No |
| 12028652 | COMPLEMENTARY OUTPUT FLIP FLOP | February 2008 | January 2009 | Abandon | 11 | 0 | 0 | No | No |
| 11923505 | Flash EEPROM System | October 2007 | September 2008 | Abandon | 10 | 0 | 0 | No | No |
| 11745925 | MEMORY | May 2007 | March 2009 | Abandon | 22 | 1 | 0 | No | No |
| 11626042 | MAGNETORESISTIVE ELEMENT AND MAGNETIC MEMORY | January 2007 | June 2009 | Abandon | 29 | 2 | 0 | No | No |
| 11615936 | Stacked capacitor memory | December 2006 | August 2007 | Abandon | 7 | 0 | 0 | No | No |
| 11565439 | MEMORY REDUNDANCY PROGRAMMING | November 2006 | September 2007 | Abandon | 9 | 0 | 0 | No | No |
| 11338684 | Semiconductor integrated circuit and method of testing the same | January 2006 | June 2009 | Abandon | 41 | 2 | 1 | No | No |
| 11325224 | Memory architectures including non-volatile memory devices | January 2006 | May 2009 | Abandon | 40 | 4 | 0 | Yes | No |
| 11100914 | Magnetic memory and recording method thereof | April 2005 | January 2009 | Abandon | 45 | 7 | 0 | Yes | No |
| 11050428 | INTEGRATED SEMICONDUCTOR MEMORY WITH TEMPERATURE-DEPENDENT VOLTAGE GENERATION | February 2005 | January 2007 | Allow | 24 | 0 | 0 | No | No |
| 10948498 | Input/output line sense amplifiers and/or input/output line drivers in semiconductor memory devices and methods of operating such devices | September 2004 | March 2009 | Abandon | 60 | 4 | 0 | No | Yes |
| 10707665 | [NONVOLATILE MEMORY STRUCTURE] | December 2003 | December 2005 | Allow | 24 | 1 | 1 | No | No |
| 09954184 | MEMORY CARD DEVICE INCLUDING A CLOCK GENERATOR | September 2001 | March 2002 | Allow | 6 | 0 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner ZARABIAN, AMIR.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 0.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the bottom 25% across the USPTO, indicating that filing appeals is less effective here than in most other areas.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner ZARABIAN, AMIR works in Art Unit 2827 and has examined 50 patent applications in our dataset. With an allowance rate of 28.0%, this examiner allows applications at a lower rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 21 months.
Examiner ZARABIAN, AMIR's allowance rate of 28.0% places them in the 4% percentile among all USPTO examiners. This examiner is less likely to allow applications than most examiners at the USPTO.
On average, applications examined by ZARABIAN, AMIR receive 1.22 office actions before reaching final disposition. This places the examiner in the 15% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by ZARABIAN, AMIR is 21 months. This places the examiner in the 91% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +11.3% benefit to allowance rate for applications examined by ZARABIAN, AMIR. This interview benefit is in the 46% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 0.0% of applications are subsequently allowed. This success rate is in the 0% percentile among all examiners. Strategic Insight: RCEs show lower effectiveness with this examiner compared to others. Consider whether a continuation application might be more strategic, especially if you need to add new matter or significantly broaden claims.
This examiner enters after-final amendments leading to allowance in 25.0% of cases where such amendments are filed. This entry rate is in the 34% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.
When applicants request a pre-appeal conference (PAC) with this examiner, 200.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 96% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 93% percentile among all examiners. Of these withdrawals, 100.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 87.5% are granted (fully or in part). This grant rate is in the 87% percentile among all examiners. Strategic Note: Petitions are frequently granted regarding this examiner's actions compared to other examiners. Per MPEP § 1002.02(c), various examiner actions are petitionable to the Technology Center Director, including prematureness of final rejection, refusal to enter amendments, and requirement for information. If you believe an examiner action is improper, consider filing a petition.
Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 24% percentile). This examiner rarely makes examiner's amendments compared to other examiners. You should expect to make all necessary claim amendments yourself through formal amendment practice.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 14.3% of allowed cases (in the 91% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.