USPTO Examiner RADKE JAY W - Art Unit 2827

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18675997LOW POWER MANAGEMENT FOR SLEEP MODE OPERATION OF A MEMORY DEVICEMay 2024May 2025Allow1110YesNo
18663114METHOD FOR MANAGING A MEMORY APPARATUSMay 2024January 2025Allow810NoNo
18632583PHASE-CHANGE MEMORY CELL AND METHOD FOR FABRICATING THE SAMEApril 2024February 2025Allow1110NoNo
18545144SEMICONDUCTOR MEMORY DEVICE AND STORAGE SYSTEM INCLUDING SEMICONDUCTOR MEMORY DEVICEDecember 2023July 2024Allow700YesNo
18539798MULTI-SAMPLED, CHARGE-SHARING THERMOMETER IN MEMORY DEVICEDecember 2023July 2024Allow700YesNo
18532826METHOD FOR MAPPING AN INPUT VECTOR TO AN OUTPUT VECTOR BY MEANS OF A MATRIX CIRCUITDecember 2023June 2025Allow1900YesNo
18533111RANDOM SWAP INJECTIONDecember 2023January 2025Allow1320NoNo
18529619NONVOLATILE MEMORY PACKAGE, STORAGE DEVICE INCLUDING THE SAME, AND METHOD OF OPERATING THEREOFDecember 2023June 2025Allow1800NoNo
18525088Voltage Ramp Memory CalibrationNovember 2023June 2025Allow1800NoNo
18521851REFRESH CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAMENovember 2023June 2025Allow1800NoNo
18520612Memory systemNovember 2023June 2024Allow700YesNo
18518578MEMORY DEVICE, MEMORY CELL READ CIRCUIT, AND CONTROL METHOD FOR MISMATCH COMPENSATIONNovember 2023October 2024Allow1110NoNo
18518126THRESHOLD COMPENSATED DETECTOR FOR MEMORY SENSENovember 2023June 2025Allow1900NoNo
18507872PROBABILISTIC DATA INTEGRITY SCANS USING RISK FACTOR ESTIMATIONNovember 2023May 2025Allow1800NoNo
18387476LATCH TYPE SENSE AMPLIFIER FOR NON-VOLATILE MEMORYNovember 2023May 2025Allow1800NoNo
18485630SEMICONDUCTOR STORAGE DEVICEOctober 2023May 2024Allow700YesNo
18477013METHOD FOR INFORMATION STORAGE BASED ON HYBRID MATERIALSeptember 2023December 2024Allow1500NoNo
18467271NONVOLATILE MEMORY AND WRITING METHODSeptember 2023August 2024Allow1110YesNo
18463975BANK TO BANK DATA TRANSFERSeptember 2023April 2025Allow1920YesNo
18456430MEMORY DEVICEAugust 2023April 2025Allow2010NoNo
18449725MEMORY DEVICE AND AN OPERATION METHOD THEREOFAugust 2023June 2025Allow2210YesNo
18448902MEMORY DEVICE AND ZQ CALIBRATION METHODAugust 2023June 2025Allow2210NoNo
18230859MONITORING CIRCUIT, REFRESH METHOD AND MEMORYAugust 2023May 2025Allow2210NoNo
18356786VERA DETECTION METHOD TO CATCH ERASE FAILJuly 2023March 2025Allow1910NoNo
18355642SEMICONDUCTOR APPARATUS AND SYSTEMJuly 2023November 2024Allow1600NoNo
18218122METHOD FOR MANAGING A MEMORY APPARATUSJuly 2023February 2024Allow700NoNo
18216499REGISTER, FLOP, AND LATCH DESIGNS INLCUDING FERROELECTRIC AND LINEAR DIELECTRICSJune 2023February 2025Allow2010YesNo
18331493CAPACITOR, METHOD OF CONTROLLING THE SAME, AND TRANSISTOR INCLUDING THE SAMEJune 2023December 2023Allow600YesNo
18330353MEMORY DEVICE AND METHOD FOR REDUCING ACTIVE POWER CONSUMPTION THEREOF USING ADDRESS CONTROLJune 2023April 2025Allow2300NoNo
18204020NEUROMORPHIC DEVICEMay 2023November 2024Allow1800NoNo
18312037MEMORY DEVICE AND ERASING METHOD THEREOFMay 2023March 2025Allow2210NoNo
18303016ANALOG PEAK POWER MANAGEMENT FOR MULTI-DIE OPERATIONSApril 2023April 2025Allow2420NoNo
18190511SEMICONDUCTOR MEMORY DEVICEMarch 2023May 2025Allow2620NoNo
18188978SYNAPTIC ARRAY FOR FIELD-TRAINING-CAPABLE IN-MEMORY COMPUTING USING NON-VOLATILE MEMORY TECHNOLOGIESMarch 2023February 2025Allow2310YesNo
18188804MEMORY WITH ONE-TIME PROGRAMMABLE (OTP) CELLSMarch 2023October 2024Allow1800NoNo
18182956STATIC RANDOM ACCESS MEMORY WITH WRITE ASSIST ADJUSTMENTMarch 2023December 2024Allow2130YesNo
18116823MEMORY DEVICE OF REDUCING THE NUMBER OF CALIBRATION RESISTORS AND CONTROL METHOD THEREOFMarch 2023January 2025Allow2210NoNo
18175514REDUCING PRECHARGE CURRENT SURGE IN DIGITAL COMPUTE IN MEMORYFebruary 2023April 2025Allow2510NoNo
18173499SEMICONDUCTOR DEVICE AND MEMORY SYSTEMFebruary 2023December 2023Allow901NoNo
18171121MEMORY DEVICE REFRESH OPERATIONSFebruary 2023March 2025Allow2500NoNo
18171106SYSTEMS AND METHODS FOR WRITING AND READING DATA STORED IN A POLYMERFebruary 2023October 2023Allow810NoNo
18170925MULTI-RAIL SENSE CIRCUIT WITH PRE-CHARGE TRANSISTORS AND MEMORY CIRCUIT INCORPORATING THE SENSE CIRCUITFebruary 2023March 2025Allow2520NoNo
18169635SELECTIVE PER DIE DRAM PPR FOR MEMORY DEVICEFebruary 2023February 2025Allow2410NoNo
18104201DOUBLE SINGLE LEVEL CELL PROGRAM IN A MEMORY DEVICEJanuary 2023April 2025Allow2610YesNo
18161274SEMICONDUCTOR STORAGE DEVICEJanuary 2023July 2023Allow500YesNo
18160620NONVOLATILE MEMORY DEVICE AND STORAGE DEVICE INCLUDING THE NONVOLATILE MEMORY DEVICEJanuary 2023January 2024Allow1120YesNo
18100806ACTIVATE COMMANDS FOR MEMORY PREPARATIONJanuary 2023February 2025Allow2410NoNo
180985482T-1R ARCHITECTURE FOR RESISTIVE RAMJanuary 2023October 2023Allow910NoNo
18091002Histogram Creation Process for Memory DevicesDecember 2022September 2023Allow800YesNo
18089512METHOD FOR READING MEMORY, A MEMORY, A MEMORY SYSTEM, AND ELECTRONIC DEVICEDecember 2022January 2025Allow2410NoNo
18084570MEMORY DEVICE, SENSE AMPLIFIER AND METHOD FOR MISMATCH COMPENSATIONDecember 2022September 2023Allow910NoNo
18082480HIGHLY ENERGY-EFFICIENT CAM BASED ON SINGLE FEFET AND OPERATING METHOD THEREOFDecember 2022October 2024Allow2210NoNo
18081004THRESHOLD VOLTAGE OFFSET BIN SELECTION BASED ON DIE FAMILY IN MEMORY DEVICESDecember 2022May 2023Allow500NoNo
18079843PERFORMING A PROGRAM OPERATION BASED ON A HIGH VOLTAGE PULSE TO SECURELY ERASE DATADecember 2022October 2023Allow1010YesNo
18075799MANAGING REFERENCE CURRENTS IN SEMICONDUCTOR DEVICESDecember 2022October 2024Allow2210YesNo
17993586SUPERCONDUCTING DISTRIBUTED BIDIRECTIONAL CURRENT DRIVER SYSTEMNovember 2022December 2024Allow2410NoNo
17993118PHASE CHANGE MEMORY DEVICE WITH IMPROVED RETENTION CHARACTERISTICS AND RELATED METHODNovember 2022December 2024Allow2410NoNo
17984916MEMORY PLANE ACCESS MANAGMENTNovember 2022July 2023Allow810NoNo
17976179READ AND WRITE ENHANCEMENTS FOR ARRAYS OF SUPERCONDUCTING MAGNETIC MEMORY CELLSOctober 2022May 2024Allow1810NoNo
17975565METHOD FOR MANAGING A MEMORY APPARATUSOctober 2022April 2023Allow600NoNo
17957788UNMATCHED CLOCK FOR COMMAND-ADDRESS AND DATASeptember 2022May 2025Abandon3120NoNo
17947954INPUT/OUTPUT CIRCUIT, OPERATION METHOD OF THE INPUT/OUTPUT CIRCUIT AND DATA PROCESSING SYSTEM INCLUDING THE INPUT/OUTPUT CIRCUITSeptember 2022April 2023Allow700NoNo
17902744SEMICONDUCTOR MEMORY DEVICESeptember 2022March 2025Allow3020NoNo
17901801MEMORY TEST CIRCUIT, MEMORY ARRAY, AND TESTING METHOD OF MEMORY ARRAYSeptember 2022August 2024Allow2310NoNo
17899417MANAGING PERFORMANCE AND SERVICE LIFE PREDICTION FOR A MEMORY SUBSYSTEM USING ENVIRONMENTAL FACTORSAugust 2022April 2024Allow2010NoNo
17898576SEMICONDUCTOR MEMORY DEVICEAugust 2022August 2024Allow2310NoNo
17897441MANAGING DEFECTIVE BLOCKS DURING MULTI-PLANE PROGRAMMING OPERATIONS IN MEMORY DEVICESAugust 2022January 2025Allow2810YesNo
17896345Digit Line Voltage Boosting Systems and MethodsAugust 2022June 2024Allow2110YesNo
17896907SEMICONDUCTOR MEMORY DEVICEAugust 2022July 2024Allow2210NoNo
17895565SYSTEM AND METHOD FOR READING AND WRITING MEMORY MANAGEMENT DATA THROUGH A NON-VOLATILE CELL BASED REGISTERAugust 2022March 2023Allow700NoNo
17895956SEMICONDUCTOR DEVICE AND MEMORY SYSTEMAugust 2022February 2024Allow1800NoNo
17822032SYSTEMS AND METHODS FOR TESTING REDUNDANT FUSE LATCHES IN A MEMORY DEVICEAugust 2022July 2024Allow2210NoNo
17895053CONFIGURABLE DATA PROTECTION CIRCUITRY FOR MEMORY DEVICESAugust 2022March 2024Allow1900YesNo
178915443D NAND MEMORY WITH FAST CORRECTIVE READAugust 2022July 2024Allow2310NoNo
17820792VOLTAGE BIN CALIBRATION BASED ON A TEMPORARY VOLTAGE SHIFT OFFSETAugust 2022June 2023Allow1010NoNo
17883538VOLTAGE BIN SELECTION FOR BLOCKS OF A MEMORY DEVICE AFTER POWER UP OF THE MEMORY DEVICEAugust 2022January 2023Allow600YesNo
17880849METHOD AND APPARATUS WITH MEMORY ARRAY PROGRAMMINGAugust 2022February 2024Allow1800YesNo
17879975METHOD OF PROGRAMMING A SELECT TRANSISTOR OF A SEMICONDUCTOR MEMORY DEVICEAugust 2022April 2024Allow2010NoNo
17878933NON-VOLATILE MEMORY DEVICE FOR MITIGATING CYCLING TRAPPED EFFECT AND CONTROL METHOD THEREOFAugust 2022May 2024Allow2110NoNo
17877592MEMORY ROW-HAMMER MITIGATIONJuly 2022June 2024Allow2220NoNo
17877810SMART SAMPLING FOR BLOCK FAMILY SCANJuly 2022March 2023Allow700NoNo
17872923RANGE SEGMENTING FOR ANALOG CAM WITH IMPROVED PRECISIONJuly 2022June 2023Allow1110NoNo
17868703MULTI-STAGE ERASE OPERATION FOR A MEMORY DEVICEJuly 2022December 2022Allow500NoNo
17859926VALID TRANSLATION UNIT COUNT-BASED MEMORY MANAGEMENTJuly 2022June 2023Allow1110YesNo
17857674ANALOG PEAK POWER MANAGEMENT FOR MULTI-DIE OPERATIONSJuly 2022January 2023Allow700YesNo
17857235METHOD AND DEVICE FOR TESTING MEMORYJuly 2022April 2025Allow3330NoNo
17852597MEMORY-CONTROL CIRCUIT AND METHOD FOR CONTROLLING ERASING OPERATION OF FLASH MEMORYJune 2022August 2024Allow2510NoNo
17852649ANALOG PEAK POWER MANAGEMENT FOR MULTI-DIE OPERATIONSJune 2022April 2025Allow3410NoNo
17849100ADJUSTING REFRESH RATE DURING SELF-REFRESH STATEJune 2022August 2024Allow2510NoNo
17848409KEY STORAGE DEVICE AND KEY GENERATION METHODJune 2022February 2024Allow1900YesNo
17846304HYBRID TYPE CONTENT ADDRESSABLE MEMORY FOR IMPLEMENTING IN-MEMORY-SEARCH AND OPERATION METHOD THEREOFJune 2022July 2024Allow2410NoNo
17846751MEMORY ACCESSING WITH AUTO-PRECHARGEJune 2022April 2024Allow2220NoNo
17843500SEMICONDUCTOR DEVICEJune 2022April 2023Allow1010NoNo
17842835PROGRAM CONTROL CIRCUIT FOR ANTIFUSE-TYPE ONE TIME PROGRAMMING MEMORY CELL ARRAYJune 2022November 2023Allow1700YesNo
17842268SEMICONDUCTOR DEVICESJune 2022December 2023Allow1800YesNo
17835324HIGH SPEED TOGGLE MODE TRANSMITTER WITH CAPACITIVE BOOSTINGJune 2022January 2024Allow1910NoNo
17835502Method and System for Improving Word Line Data Retention for Memory BlocksJune 2022March 2023Allow910YesNo
17804910INTEGRATED CIRCUIT STRUCTURE AND MEMORY STRUCTUREJune 2022January 2024Allow2010NoNo
17828903DETECTING AND MITIGATING MEMORY ATTACKSMay 2022August 2024Allow2710YesNo
17828921CHIP SELECT, COMMAND, AND ADDRESS ENCODINGMay 2022April 2024Allow2210YesNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner RADKE, JAY W.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
7
Examiner Affirmed
6
(85.7%)
Examiner Reversed
1
(14.3%)
Reversal Percentile
24.9%
Lower than average

What This Means

With a 14.3% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.

Strategic Value of Filing an Appeal

Total Appeal Filings
20
Allowed After Appeal Filing
4
(20.0%)
Not Allowed After Appeal Filing
16
(80.0%)
Filing Benefit Percentile
22.4%
Lower than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 20.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the bottom 25% across the USPTO, indicating that filing appeals is less effective here than in most other areas.

Strategic Recommendations

Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.

Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.

Examiner RADKE, JAY W - Prosecution Strategy Guide

Executive Summary

Examiner RADKE, JAY W works in Art Unit 2827 and has examined 1,048 patent applications in our dataset. With an allowance rate of 88.5%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 20 months.

Allowance Patterns

Examiner RADKE, JAY W's allowance rate of 88.5% places them in the 66% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by RADKE, JAY W receive 1.35 office actions before reaching final disposition. This places the examiner in the 27% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by RADKE, JAY W is 20 months. This places the examiner in the 89% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +5.1% benefit to allowance rate for applications examined by RADKE, JAY W. This interview benefit is in the 30% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 24.0% of applications are subsequently allowed. This success rate is in the 25% percentile among all examiners. Strategic Insight: RCEs show lower effectiveness with this examiner compared to others. Consider whether a continuation application might be more strategic, especially if you need to add new matter or significantly broaden claims.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 53.8% of cases where such amendments are filed. This entry rate is in the 75% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 28.6% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 29% percentile among all examiners. Note: Pre-appeal conferences show below-average success with this examiner. Consider whether your arguments are strong enough to warrant a PAC request.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 56.2% of appeals filed. This is in the 23% percentile among all examiners. Of these withdrawals, 44.4% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner rarely withdraws rejections during the appeal process compared to other examiners. If you file an appeal, be prepared to fully prosecute it to a PTAB decision. Per MPEP § 1207, the examiner will prepare an Examiner's Answer maintaining the rejections.

Petition Practice

When applicants file petitions regarding this examiner's actions, 59.1% are granted (fully or in part). This grant rate is in the 75% percentile among all examiners. Strategic Note: Petitions are frequently granted regarding this examiner's actions compared to other examiners. Per MPEP § 1002.02(c), various examiner actions are petitionable to the Technology Center Director, including prematureness of final rejection, refusal to enter amendments, and requirement for information. If you believe an examiner action is improper, consider filing a petition.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 4.3% of allowed cases (in the 87% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 4.5% of allowed cases (in the 77% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.