Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18749271 | SEMICONDUCTOR STORAGE DEVICE | June 2024 | May 2025 | Allow | 11 | 1 | 0 | No | No |
| 18715300 | SEMICONDUCTOR DEVICE, DISPLAY APPARATUS, DATA PROCESSING SYSTEM, AND CONTROL SYSTEM OF THE SEMICONDUCTOR DEVICE | May 2024 | November 2025 | Allow | 17 | 0 | 0 | No | No |
| 18672933 | MEMORY SYSTEMS, OPERATING METHODS AND READABLE STORAGE MEDIUMS | May 2024 | November 2025 | Allow | 18 | 0 | 0 | No | No |
| 18651032 | APPARATUS WITH POST-MANUFACTURING DATA UPDATE MECHANISM AND METHODS FOR OPERATING THE SAME | April 2024 | January 2025 | Allow | 9 | 0 | 0 | No | No |
| 18649739 | BUFFERED DYNAMIC RANDOM ACCESS MEMORY DEVICE | April 2024 | April 2025 | Allow | 11 | 1 | 0 | No | No |
| 18642253 | ALGORITHM QUALIFIER COMMANDS | April 2024 | April 2025 | Allow | 11 | 1 | 0 | No | No |
| 18635739 | Proactive Usage-Based Disturbance Mitigation based on Resource Availability | April 2024 | November 2025 | Allow | 19 | 1 | 0 | No | No |
| 18631003 | ANALOG NEUROMORPHIC CIRCUITS FOR DOT-PRODUCT OPERATION IMPLEMENTING RESISTIVE MEMORIES | April 2024 | August 2025 | Allow | 16 | 1 | 0 | No | No |
| 18622866 | PREDICTION OF DATA RETENTION DEGRADATION OF A NON-VOLATILE MEMORY DEVICE BASED ON A MACHINE LEARNING ALGORITHM | March 2024 | October 2025 | Allow | 18 | 0 | 0 | No | No |
| 18604858 | MULTI-PROGRAM OF MEMORY CELLS WITHOUT INTERVENING ERASE OPERATIONS | March 2024 | December 2025 | Allow | 21 | 1 | 0 | Yes | No |
| 18601367 | MEMORY CIRCUIT AND METHOD OF OPERATING SAME | March 2024 | June 2025 | Allow | 15 | 1 | 0 | No | No |
| 18592833 | INTEGRATED CIRCUIT DEVICE INCLUDING AN SRAM PORTION HAVING END POWER SELECT CIRCUITS | March 2024 | April 2025 | Allow | 14 | 1 | 0 | No | No |
| 18593635 | ADAPTIVE WRITE OPERATIONS FOR A MEMORY DEVICE | March 2024 | March 2025 | Allow | 13 | 1 | 0 | No | No |
| 18586350 | PROGRAM SPEED COMPENSATION FOR NON-VOLATILE MEMORY CELLS | February 2024 | December 2025 | Allow | 22 | 1 | 0 | No | No |
| 18583527 | APPARATUS WITH REFRESH MANAGEMENT MECHANISM | February 2024 | July 2025 | Allow | 17 | 2 | 0 | No | No |
| 18437516 | NON-VOLATILE PROCESSOR CIRCUIT | February 2024 | December 2025 | Allow | 22 | 1 | 0 | No | No |
| 18429139 | DETERMINING REFERENCE VOLTAGE OFFSETS FOR READ OPERATIONS IN A MEMORY SYSTEM | January 2024 | July 2025 | Allow | 18 | 0 | 0 | No | No |
| 18426708 | MAGNETIC DOMAIN WALL MOTION ELEMENT AND MAGNETIC ARRAY | January 2024 | August 2025 | Allow | 18 | 0 | 0 | No | No |
| 18422770 | MEMORY DEVICE AND OPERATION METHOD THEREOF | January 2024 | August 2025 | Allow | 18 | 0 | 0 | No | No |
| 18414524 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE | January 2024 | January 2025 | Allow | 12 | 1 | 0 | No | No |
| 18413085 | ANTIFUSE-TYPE ONE TIME PROGRAMMING MEMORY WITH FORKSHEET TRANSISTORS | January 2024 | July 2025 | Allow | 18 | 0 | 0 | No | No |
| 18412505 | GENERATION OF PHYSICALLY UNCLONABLE FUNCTION USING ONE-TIME-PROGRAMMABLE MEMORY DEVICES WITH BACK-END-OF-LINE TRANSISTORS | January 2024 | October 2025 | Allow | 22 | 1 | 0 | Yes | No |
| 18410190 | EFUSE CELLS WITH BACKSIDE POWER RAILS | January 2024 | October 2025 | Allow | 22 | 1 | 0 | No | No |
| 18407533 | THREE-DIMENSIONAL FLASH MEMORY AND OPERATION METHOD THEREFOR | January 2024 | March 2025 | Allow | 14 | 1 | 0 | No | No |
| 18406097 | NON-VOLATILE PHASE-CHANGE MEMORY DEVICE INCLUDING A DISTRIBUTED ROW DECODER WITH N-CHANNEL MOSFET TRANSISTORS AND RELATED ROW DECODING METHOD | January 2024 | August 2025 | Allow | 20 | 1 | 0 | No | No |
| 18403730 | MEMORY DEVICE, INTEGRATED CIRCUIT AND MANUFACTURING METHOD OF THE SAME | January 2024 | July 2025 | Allow | 18 | 0 | 0 | No | No |
| 18396118 | FUSE MEMORY CIRCUIT | December 2023 | June 2025 | Allow | 18 | 0 | 0 | No | No |
| 18541598 | FRACTAL ANALOG RANDOM ACCESS MEMORY | December 2023 | May 2025 | Allow | 17 | 2 | 0 | Yes | No |
| 18539622 | ONE-TIME PROGRAMMABLE MEMORY CIRCUIT, ONE-TIME PROGRAMMABLE MEMORY AND OPERATION METHOD THEREOF | December 2023 | November 2025 | Allow | 23 | 1 | 0 | No | No |
| 18539657 | PHASE CHANGE MEMORY, ELECTRONIC DEVICE, AND PREPARATION METHOD FOR PHASE CHANGE MEMORY | December 2023 | December 2025 | Allow | 24 | 1 | 0 | No | No |
| 18529831 | Data Writing Method and Storage Device | December 2023 | July 2025 | Allow | 19 | 3 | 0 | No | No |
| 18530200 | MEMORY AND MEMORY SYSTEM | December 2023 | November 2025 | Allow | 23 | 1 | 0 | No | No |
| 18530031 | DYNAMIC NAND SENSING FOR A MEMORY READ OPERATION | December 2023 | November 2025 | Allow | 23 | 1 | 0 | No | No |
| 18523069 | MEMORY DEVICE HAVING TIERS OF 2-TRANSISTOR MEMORY CELLS AND CHARGE STORAGE STRUCTURE HAVING MULTIPLE PORTIONS | November 2023 | July 2025 | Allow | 19 | 0 | 0 | No | No |
| 18520175 | COMMAND CLOCK STRUCTURE | November 2023 | October 2025 | Allow | 23 | 1 | 0 | No | No |
| 18506202 | Sense Amplifier Circuitry and Threshold Voltage Compensation | November 2023 | September 2025 | Allow | 22 | 1 | 0 | No | No |
| 18505855 | MEDIA MANAGEMENT SCANNING WITH UNIFIED CRITERIA TO ALLEVIATE FAST AND LATENT READ DISTURB | November 2023 | October 2025 | Allow | 23 | 1 | 0 | No | No |
| 18505143 | NON-VOLATILE MEMORY AND REFERENCE CURRENT GENERATOR THEREOF | November 2023 | September 2025 | Allow | 22 | 1 | 0 | No | No |
| 18505064 | SEMICONDUCTOR DEVICE AND PROGRAMMABLE MACRO CIRCUIT | November 2023 | September 2025 | Allow | 23 | 1 | 0 | No | No |
| 18502661 | SENSE AMPLIFIER AND NONVOLATILE MEMORY DEVICE | November 2023 | February 2026 | Abandon | 27 | 1 | 0 | No | No |
| 18499219 | MEMORY CONTROLLER, MEMORY SYSTEM INCLUDING THE SAME, AND OPERATING METHOD THEREOF | November 2023 | October 2025 | Allow | 24 | 1 | 0 | No | No |
| 18485324 | MEMORY CIRCUIT, DYNAMIC RANDOM ACCESS MEMORY AND OPERATION METHOD THEREOF | October 2023 | September 2025 | Allow | 23 | 1 | 0 | No | No |
| 18377279 | WORD LINE STRUCTURES FOR THREE-DIMENSIONAL MEMORY ARRAYS | October 2023 | March 2025 | Allow | 17 | 1 | 0 | No | No |
| 18480027 | SEMICONDUCTOR DEVICE PROVIDING A TEST MODE RELATED TO DETECTING A DEFECT IN A METAL LINE | October 2023 | September 2025 | Allow | 24 | 1 | 0 | No | No |
| 18284822 | MEMORY DEVICE AND METHOD FOR PROTECTING A MEMORY DEVICE FROM THE EFFECT OF ROW HAMMERING | September 2023 | August 2025 | Allow | 23 | 1 | 0 | No | No |
| 18373769 | METHODS FOR PERFORMING MULTIPLE MEMORY OPERATIONS IN RESPONSE TO A SINGLE COMMAND AND MEMORY DEVICES AND SYSTEMS EMPLOYING THE SAME | September 2023 | July 2025 | Allow | 22 | 3 | 0 | No | No |
| 18475335 | SEMICONDUCTOR MEMORY DEVICE | September 2023 | October 2024 | Allow | 13 | 1 | 0 | No | No |
| 18474643 | DYNAMIC, RANDOM-ACCESS MEMORY WITH HIDDEN MEMORY SCRUBBING | September 2023 | August 2025 | Allow | 23 | 1 | 0 | No | No |
| 18470314 | HIERARCHICAL MEMORY ARCHITECTURE INCLUDING ON-CHIP MULTI-BANK NON-VOLATILE MEMORY WITH LOW LEAKAGE AND LOW LATENCY | September 2023 | March 2025 | Allow | 18 | 1 | 0 | No | No |
| 18469971 | MEMORY DEVICE USING SEMICONDUCTOR ELEMENT | September 2023 | May 2025 | Allow | 20 | 0 | 0 | No | No |
| 18469742 | SYSTEMS AND METHODS FOR FLEXIBLE BANK ADDRESSING IN DIGITAL COMPUTING-IN-MEMORY (DCIM) | September 2023 | August 2025 | Allow | 23 | 1 | 0 | No | No |
| 18368988 | AUTOMATIC VENT FOR SSD COOLING ENHANCEMENT | September 2023 | January 2025 | Allow | 16 | 1 | 0 | No | No |
| 18466561 | METHOD OF MEASURING REFRACTIVE INDEX OF SEMICONDUCTOR MEMORY DEVICE AND METHOD OF CLASSIFYING PRODUCT GROUP USING THE SAME | September 2023 | September 2025 | Allow | 24 | 1 | 0 | No | No |
| 18242521 | NONVOLATILE SEMICONDUCTOR MEMORY | September 2023 | November 2024 | Allow | 14 | 1 | 0 | No | No |
| 18459429 | FLASH MEMORY WITH HIGH INTEGRATION | September 2023 | July 2025 | Allow | 23 | 1 | 0 | No | No |
| 18460493 | MEMORY DEVICE | September 2023 | April 2025 | Allow | 20 | 0 | 0 | No | No |
| 18457351 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF A SEMICONDUCTOR DEVICE | August 2023 | July 2025 | Allow | 23 | 1 | 0 | No | No |
| 18456397 | MAGNETIC DEVICE AND MAGNETIC STORAGE DEVICE | August 2023 | July 2025 | Allow | 23 | 1 | 0 | No | No |
| 18451069 | CONTROL CIRCUIT AND MEMORY | August 2023 | January 2025 | Allow | 17 | 0 | 0 | No | No |
| 18233852 | ENHANCED IO INTERFACE FOR PLC PROGRAM AND PROGRAM-SUSPEND-RESUME OPERATIONS | August 2023 | August 2025 | Allow | 24 | 1 | 0 | No | No |
| 18448944 | CIRCUIT FOR RECEIVING DATA AND MEMORY | August 2023 | August 2025 | Allow | 24 | 1 | 0 | No | No |
| 18448067 | MEMORY SENSE AMPLIFIER WITH PRECHARGE | August 2023 | December 2024 | Allow | 16 | 1 | 0 | No | No |
| 18232609 | VPASS AUTO LAYER COMPENSATION IN A MEMORY DEVICE | August 2023 | July 2025 | Allow | 23 | 1 | 0 | No | No |
| 18366687 | DYNAMIC MEMORY AND CONTROL METHOD FOR POWER DOWN SCHEME | August 2023 | June 2025 | Allow | 22 | 1 | 0 | No | No |
| 18230336 | PLANE AND BLOCK LOCATION DEPENDENT VOLTAGE BIASES IN NAND MEMORY | August 2023 | August 2025 | Allow | 25 | 1 | 0 | No | No |
| 18364524 | MEMORY SYSTEM | August 2023 | January 2025 | Allow | 17 | 1 | 0 | No | No |
| 18360119 | CURRENT SOURCE FOR READ OF PROGRAMMABLE RESISTANCE MEMORY CELLS | July 2023 | August 2025 | Allow | 25 | 1 | 0 | Yes | No |
| 18359169 | MEMORY CIRCUIT AND METHOD OF OPERATING SAME | July 2023 | March 2025 | Allow | 20 | 0 | 0 | No | No |
| 18359822 | NON-VOLATILE MEMORY WITH EARLY RAMP FOR IMPROVED PERFORMANCE | July 2023 | August 2025 | Allow | 25 | 1 | 0 | Yes | No |
| 18225375 | SINGLE-LEVEL CELL PUMP SKIP PROGRAM OPERATION PRELIMINARY PERIOD TIMING OPTIMIZATION FOR NON-VOLATILE MEMORY | July 2023 | July 2025 | Allow | 23 | 1 | 0 | No | No |
| 18356585 | BIPOLAR SELECTOR WITH INDEPENDENTLY TUNABLE THRESHOLD VOLTAGES | July 2023 | April 2025 | Allow | 21 | 1 | 0 | No | No |
| 18355366 | DUAL REFERENCE ZQ CALIBRATION CIRCUITS AND METHODS | July 2023 | July 2025 | Allow | 23 | 1 | 0 | No | No |
| 18355357 | ONE-TIME PROGRAMMABLE MEMORY DEVICES AND METHODS | July 2023 | June 2025 | Allow | 23 | 1 | 0 | No | No |
| 18223970 | PHOTONIC SPIN REGISTER, INFORMATION WRITING METHOD, AND INFORMATION READ-OUT METHOD | July 2023 | March 2025 | Allow | 20 | 0 | 0 | No | No |
| 18221598 | SEMICONDUCTOR CHIP CAPABLE OF CALIBRATING BIAS VOLTAGE SUPPLIED TO WRITE CLOCK BUFFER REGARDLESS OF PROCESS VARIATION AND TEMPERATURE VARIATION, AND DEVICES INCLUDING THE SAME | July 2023 | April 2025 | Allow | 21 | 0 | 0 | No | No |
| 18350372 | MAGNETO RESISTIVE MEMORY FOR MONOLITHIC DATA PROCESSING | July 2023 | June 2025 | Allow | 23 | 1 | 0 | Yes | No |
| 18219213 | MAGNETIC RANDOM ACCESS MEMORY CELL AND MEMORY | July 2023 | July 2025 | Allow | 24 | 1 | 0 | No | No |
| 18216435 | Storage Device and Preparation Method, Read-Write Method, Storage Chip and Electronic Device | June 2023 | May 2025 | Allow | 23 | 1 | 0 | No | No |
| 18342186 | Read Gate Training and Tracking | June 2023 | June 2025 | Allow | 24 | 1 | 0 | Yes | No |
| 18341836 | DEVICES AND SYSTEMS FOR FLYING BITLINE WITH JUMPER CELL | June 2023 | May 2025 | Allow | 23 | 1 | 0 | No | No |
| 18341128 | MEMORY DEVICES AND METHODS THEREOF FOR MANAGING ROW HAMMER EVENTS THEREIN | June 2023 | March 2025 | Allow | 20 | 1 | 0 | Yes | No |
| 18339280 | DIGITAL VERIFY FAILBIT COUNT (VFC) CIRCUIT | June 2023 | May 2025 | Allow | 23 | 1 | 0 | No | No |
| 18213176 | METHOD FOR WRITING TO MAGNETIC RANDOM ACCESS MEMORY | June 2023 | January 2025 | Allow | 19 | 2 | 0 | No | No |
| 18209069 | FLASH MEMORY FOR REDUCING RELIABILITY DEGRADATION OF OS DATA DUE TO SMT PROCESS | June 2023 | May 2025 | Allow | 23 | 1 | 0 | Yes | No |
| 18208306 | METHODS AND SYSTEMS TO INCREASE EFFICIENCY OF SRAM WRITE ASSIST SCHEME | June 2023 | August 2025 | Allow | 26 | 1 | 0 | No | No |
| 18327062 | POWER SUPPLY SWITCHING CIRCUIT AND MEMORY | June 2023 | May 2025 | Allow | 23 | 1 | 0 | No | No |
| 18204202 | SIGNALING MEMORY ZONE RANKING INFORMATION | May 2023 | March 2025 | Allow | 22 | 1 | 0 | No | No |
| 18326587 | SEMICONDUCTOR MEMORY DEVICE | May 2023 | November 2024 | Allow | 17 | 1 | 0 | No | No |
| 18202149 | TECHNIQUES FOR FLEXIBLE SELF-REFRESH OF MEMORY ARRAYS | May 2023 | June 2025 | Allow | 24 | 1 | 0 | No | No |
| 18198892 | Temperature Sensor for Dual Inline Memory Modules (DIMM) | May 2023 | August 2025 | Allow | 27 | 1 | 0 | No | No |
| 18195540 | COMPUTING SYSTEM AND METHOD OF OPERATION THEREOF | May 2023 | May 2025 | Allow | 24 | 1 | 0 | Yes | No |
| 18311191 | EMBEDDED MRAM FABRICATION PROCESS FOR ION BEAM ETCHING WITH PROTECTION BY TOP ELECTRODE SPACER | May 2023 | November 2024 | Allow | 18 | 1 | 0 | No | No |
| 18306040 | ELECTRONIC DEVICE AND METHOD OF OPERATING THE SAME | April 2023 | March 2025 | Allow | 22 | 1 | 0 | No | No |
| 18305466 | ACCURATE PROGRAMMING OF ANALOG MEMORY DEVICES OF IN-MEMORY PROCESSING DEVICES HAVING A CROSSBAR ARRAY STRUCTURE | April 2023 | January 2025 | Allow | 21 | 0 | 0 | No | No |
| 18295285 | SEMICONDUCTOR MEMORY DEVICE FOR PERFORMING REMAINING BANK REFRESH OPERATION AND REFRESH METHOD THEREOF | April 2023 | January 2025 | Allow | 22 | 1 | 0 | Yes | No |
| 18129087 | Test circuit and method for reading data from a memory device during memory dump | March 2023 | September 2024 | Allow | 18 | 0 | 0 | No | No |
| 18247114 | NON-VOLATILE MEMORY | March 2023 | January 2025 | Allow | 22 | 1 | 0 | No | No |
| 18191668 | METHOD OF OPERATING MEMORY CELL | March 2023 | February 2025 | Allow | 23 | 1 | 0 | No | No |
| 18186278 | SMALL-AREA HIGH-EFFICIENCY READ-ONLY MEMORY (ROM) ARRAY AND METHOD FOR OPERATING THE SAME | March 2023 | January 2025 | Allow | 22 | 1 | 0 | No | No |
| 18184682 | MAGNETIC MEMORY DEVICE | March 2023 | October 2024 | Allow | 19 | 0 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner LE, THONG QUOC.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 28.6% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner LE, THONG QUOC works in Art Unit 2827 and has examined 1,836 patent applications in our dataset. With an allowance rate of 96.7%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 18 months.
Examiner LE, THONG QUOC's allowance rate of 96.7% places them in the 87% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by LE, THONG QUOC receive 1.20 office actions before reaching final disposition. This places the examiner in the 14% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by LE, THONG QUOC is 18 months. This places the examiner in the 96% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +3.4% benefit to allowance rate for applications examined by LE, THONG QUOC. This interview benefit is in the 26% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 41.8% of applications are subsequently allowed. This success rate is in the 93% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 79.4% of cases where such amendments are filed. This entry rate is in the 96% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.
When applicants request a pre-appeal conference (PAC) with this examiner, 200.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 96% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 93% percentile among all examiners. Of these withdrawals, 57.1% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 29.0% are granted (fully or in part). This grant rate is in the 16% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 3.7% of allowed cases (in the 82% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.6% of allowed cases (in the 56% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.