Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18743852 | PAGE BUFFER CIRCUIT AND MEMORY DEVICE INCLUDING THE SAME | June 2024 | February 2025 | Allow | 8 | 0 | 0 | No | No |
| 18738967 | 3D MEMORY SEMICONDUCTOR DEVICES AND STRUCTURES WITH MEMORY CELLS | June 2024 | December 2024 | Allow | 6 | 1 | 0 | No | No |
| 18645018 | NEURAL NETWORK CLASSIFIER USING ARRAY OF THREE-GATE NON-VOLATILE MEMORY CELLS | April 2024 | April 2025 | Allow | 12 | 1 | 0 | No | No |
| 18645184 | NEURAL NETWORK CLASSIFIER USING ARRAY OF THREE-GATE NON-VOLATILE MEMORY CELLS | April 2024 | December 2024 | Allow | 8 | 0 | 0 | No | No |
| 18644840 | NEURAL NETWORK CLASSIFIER USING ARRAY OF THREE-GATE NON-VOLATILE MEMORY CELLS | April 2024 | February 2025 | Allow | 10 | 1 | 0 | No | No |
| 18605401 | 3D MEMORY SEMICONDUCTOR DEVICES AND STRUCTURES WITH MEMORY CELLS | March 2024 | May 2024 | Allow | 2 | 0 | 0 | No | No |
| 18581260 | SENSING SCHEME FOR A MEMORY WITH SHARED SENSE COMPONENTS | February 2024 | May 2025 | Allow | 14 | 0 | 0 | No | No |
| 18443979 | Sub-Word Line Driver Placement For Memory Device | February 2024 | November 2024 | Allow | 9 | 0 | 0 | Yes | No |
| 18418880 | FERROELECTRIC MEMORY OPERATION BIAS AND POWER DOMAINS | January 2024 | February 2025 | Allow | 13 | 1 | 0 | No | No |
| 18407096 | 3D MEMORY SEMICONDUCTOR DEVICES AND STRUCTURES WITH MEMORY-LINE PILLARS | January 2024 | March 2024 | Allow | 2 | 0 | 0 | No | No |
| 18541218 | MEMORY DEVICE, ELECTRONIC DEVICE, AND OPERATION METHOD OF MEMORY DEVICE | December 2023 | June 2025 | Allow | 18 | 0 | 0 | No | No |
| 18527978 | NAND DATA PLACEMENT SCHEMA | December 2023 | December 2024 | Allow | 12 | 0 | 0 | No | No |
| 18518849 | MEMORY INCLUDING A PLURALITY OF PORTIONS AND USED FOR REDUCING PROGRAM DISTURBANCE AND PROGRAM METHOD THEREOF | November 2023 | February 2025 | Allow | 15 | 0 | 0 | No | No |
| 18508903 | STORAGE DEVICES HAVING ENHANCED ERROR DETECTION AND MEMORY CELL REPAIR | November 2023 | June 2025 | Allow | 19 | 0 | 0 | No | No |
| 18384304 | 3D MEMORY SEMICONDUCTOR DEVICES AND STRUCTURES WITH BIT-LINE PILLARS | October 2023 | December 2023 | Allow | 2 | 0 | 0 | No | No |
| 18489567 | SEMICONDUCTOR DEVICES FOR DETECTING DEFECTS IN ERROR CORRECTION CIRCUITS, AND METHODS OF PERFORMING TEST MODE OPERATIONS | October 2023 | June 2025 | Allow | 20 | 0 | 0 | No | No |
| 18482016 | MEMORY, MEMORY SYSTEM AND OPERATION METHOD OF MEMORY SYSTEM | October 2023 | November 2024 | Allow | 13 | 0 | 0 | No | No |
| 18376198 | APPARATUS FOR DETERMINING MEMORY CELL DATA STATES | October 2023 | June 2024 | Allow | 8 | 0 | 0 | No | No |
| 18459930 | SEMICONDUCTOR MODULE FOR PERFORMING ERROR CORRECTION OPERATION | September 2023 | April 2025 | Allow | 19 | 0 | 0 | No | No |
| 18455904 | MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME | August 2023 | August 2024 | Allow | 12 | 0 | 0 | No | No |
| 18237816 | CROSS-TEMPERATURE COMPENSATION IN A MEMORY SUB-SYSTEM | August 2023 | April 2025 | Allow | 20 | 0 | 0 | No | No |
| 18453223 | INTEGRATED CIRCUIT DEVICE | August 2023 | February 2025 | Allow | 18 | 1 | 0 | Yes | No |
| 18233562 | MEMORY ARCHITECTURE SUPPORTING BOTH CONVENTIONAL MEMORY ACCESS MODE AND DIGITAL IN-MEMORY COMPUTATION PROCESSING MODE | August 2023 | March 2025 | Allow | 19 | 0 | 0 | No | No |
| 18447997 | FERROELECTRIC FIELD-EFFECT TRANSISTOR (FeFET) MEMORY | August 2023 | May 2025 | Allow | 21 | 2 | 0 | No | No |
| 18446513 | METHOD AND DEVICE FOR OBTAINING ROW HAMMER REFRESH ADDRESS, AND STORAGE MEDIUM | August 2023 | April 2025 | Allow | 20 | 0 | 0 | No | No |
| 18366191 | MEMORY DEVICE WITH CONTENT ADDRESSABLE MEMORY UNITS | August 2023 | June 2024 | Allow | 11 | 0 | 0 | No | No |
| 18231235 | 3D MEMORY SEMICONDUCTOR DEVICES AND STRUCTURES WITH BIT-LINE PILLARS | August 2023 | October 2023 | Allow | 2 | 0 | 0 | No | No |
| 18264414 | DYNAMIC RANDOM ACCESS MEMORY REFRESH CIRCUIT AND REFRESH METHOD, AND PROOF-OF-WORK CHIP | August 2023 | June 2025 | Allow | 23 | 1 | 0 | No | No |
| 18362525 | MAGNETIC MEMORY DEVICE | July 2023 | February 2024 | Allow | 7 | 0 | 0 | No | No |
| 18358463 | TEMPERATURE DEPENDENT REFRESH READ RATE | July 2023 | March 2025 | Allow | 20 | 0 | 0 | No | No |
| 18357412 | NON-VOLATILE MEMORY WITH ERASE DEPTH DETECTION AND ADAPTIVE ADJUSTMENT TO PROGRAMMING | July 2023 | May 2025 | Allow | 21 | 0 | 0 | No | No |
| 18219418 | FERROELECTRIC MEMORY LOCAL SENSE AMPLIFICATION | July 2023 | April 2025 | Allow | 21 | 0 | 0 | No | No |
| 18219401 | FERROELECTRIC MEMORY REFERENCE GENERATION | July 2023 | March 2025 | Allow | 20 | 0 | 0 | No | No |
| 18340906 | Identifying unusable memory blocks based on zeros-ones imbalance in memory readouts | June 2023 | March 2025 | Allow | 21 | 0 | 0 | No | No |
| 18336428 | MEMORY DEVICE | June 2023 | August 2024 | Allow | 14 | 0 | 0 | No | No |
| 18209051 | SYSTEM AND METHOD FOR TESTING MEMORY DEVICE | June 2023 | December 2024 | Allow | 18 | 0 | 0 | No | No |
| 18331923 | REFRESH CIRCUIT AND MEMORY | June 2023 | February 2025 | Allow | 20 | 0 | 0 | No | No |
| 18322894 | SEMICONDUCTOR MEMORY DEVICES HAVING ADJUSTABLE I/O SIGNAL LINE LOADING THAT SUPPORTS REDUCED POWER CONSUMPTION DURING READ AND WRITE OPERATIONS | May 2023 | February 2025 | Allow | 20 | 0 | 0 | No | No |
| 18321576 | PAGE BUFFER, MEMORY DEVICE INCLUDING PAGE BUFFER AND MEMORY SYSTEM | May 2023 | February 2025 | Allow | 21 | 0 | 0 | No | No |
| 18320667 | TEST CIRCUIT AND RECEIVING CIRCUIT HAVING TEST FUNCTION | May 2023 | January 2025 | Allow | 20 | 0 | 0 | No | No |
| 18317382 | SEMICONDUCTOR DEVICE | May 2023 | May 2025 | Allow | 24 | 0 | 1 | No | No |
| 18313041 | MEMORY DEVICE AND MANUFACTURING METHOD | May 2023 | August 2024 | Allow | 16 | 1 | 0 | No | No |
| 18251699 | SPINTRONIC DEVICE, MEMORY CELL, MEMORY ARRAY AND READ AND WRITE CIRCUIT | May 2023 | April 2025 | Allow | 24 | 1 | 0 | No | No |
| 18310738 | APPARATUSES AND METHODS FOR SETTING A DUTY CYCLE ADJUSTER FOR IMPROVING CLOCK DUTY CYCLE | May 2023 | February 2024 | Allow | 10 | 0 | 0 | No | No |
| 18310302 | APPARATUSES AND METHODS FOR SETTING A DUTY CYCLE ADJUSTER FOR IMPROVING CLOCK DUTY CYCLE | May 2023 | June 2024 | Allow | 14 | 1 | 0 | No | No |
| 18306531 | MEMORY DEVICES INCLUDING PROCESSING-IN-MEMORY ARCHITECTURE CONFIGURED TO PROVIDE ACCUMULATION DISPATCHING AND HYBRID PARTITIONING | April 2023 | February 2025 | Allow | 22 | 0 | 0 | No | No |
| 18306762 | Sub-Word Line Driver Placement For Memory Device | April 2023 | November 2023 | Allow | 6 | 0 | 0 | No | No |
| 18133867 | NON-VOLATILE ANALOG RESISTIVE MEMORY CELLS IMPLEMENTING FERROELECTRIC SELECT TRANSISTORS | April 2023 | December 2023 | Allow | 8 | 0 | 0 | No | No |
| 18295148 | EFUSE STRUCTURE AND METHOD | April 2023 | November 2023 | Allow | 7 | 0 | 0 | No | No |
| 18193645 | TEST METHOD FOR TESTING DECISION FEEDBACK EQUALIZATION OF MEMORY DEVICE | March 2023 | October 2024 | Allow | 18 | 0 | 0 | No | No |
| 18191039 | MEMORY DEVICE AND DEFENSE METHOD THEREOF | March 2023 | October 2024 | Allow | 19 | 0 | 0 | No | No |
| 18124334 | NEURAL NETWORK CLASSIFIER USING ARRAY OF THREE-GATE NON-VOLATILE MEMORY CELLS | March 2023 | March 2024 | Allow | 12 | 0 | 1 | No | No |
| 18245784 | DRIVING METHOD OF SEMICONDUCTOR DEVICE | March 2023 | June 2025 | Allow | 27 | 1 | 0 | No | No |
| 18121846 | CONCURRENT SLOW-FAST MEMORY CELL PROGRAMMING | March 2023 | September 2024 | Allow | 18 | 0 | 0 | No | No |
| 18119997 | PARALLELIZED DEFECT DETECTION ACROSS MULTIPLE SUB-BLOCKS IN A MEMORY DEVICE | March 2023 | September 2024 | Allow | 19 | 0 | 0 | No | No |
| 18180944 | MEMORY SYSTEM | March 2023 | October 2023 | Allow | 8 | 0 | 0 | No | No |
| 18176507 | SEMICONDUCTOR MEMORY DEVICE | March 2023 | September 2024 | Allow | 19 | 0 | 0 | No | No |
| 18175511 | REDUCING PRECHARGE POWER CONSUMPTION IN A MEMORY ARRAY | February 2023 | January 2025 | Allow | 23 | 1 | 0 | No | No |
| 18170548 | MEMORY DEVICE FOR PERFORMING READ OPERATION AND PROGRAM VERIFICATION OPERATION | February 2023 | December 2024 | Allow | 21 | 0 | 1 | No | No |
| 18111035 | LOCAL REFERENCE VOLTAGE GENERATOR FOR NON-VOLATILE MEMORY | February 2023 | January 2024 | Allow | 11 | 0 | 0 | No | No |
| 18166476 | SENSE AMPLIFIER, METHOD FOR DRIVING SENSE AMPLIFIER, AND MEMORY | February 2023 | September 2024 | Allow | 19 | 0 | 0 | No | No |
| 18163323 | ADDRESS SIGNAL TRANSMISSION CIRCUIT, ADDRESS SIGNAL TRANSMISSION METHOD AND STORAGE SYSTEM | February 2023 | October 2024 | Allow | 21 | 1 | 0 | No | No |
| 18103500 | OXIDE SEMICONDUCTOR-BASED FRAM | January 2023 | June 2023 | Allow | 4 | 0 | 0 | No | No |
| 18103383 | NEURAL MEMORY ARRAY STORING SYNAPSIS WEIGHTS IN DIFFERENTIAL CELL PAIRS | January 2023 | October 2023 | Allow | 8 | 0 | 0 | No | No |
| 18158316 | APPARATUSES, SYSTEMS, AND METHODS FOR RESETTING ROW HAMMER DETECTOR CIRCUIT BASED ON SELF-REFRESH COMMAND | January 2023 | September 2023 | Allow | 8 | 0 | 0 | No | No |
| 18156654 | SEMICONDUCTOR MEMORY DEVICE | January 2023 | September 2023 | Allow | 8 | 1 | 0 | No | No |
| 18155676 | MEMORY CHIP TEST METHOD AND APPARATUS, MEDIUM, AND DEVICE | January 2023 | September 2024 | Allow | 20 | 0 | 0 | No | No |
| 18097226 | SEMICONDUCTOR DEVICE | January 2023 | August 2024 | Allow | 19 | 0 | 0 | No | No |
| 18095880 | MANAGING MEMORY LEAKAGES OF A SYSTEM FOR EVALUATING MANUFACTURED ITEMS | January 2023 | September 2024 | Allow | 20 | 0 | 0 | No | No |
| 18151515 | SEMICONDUCTOR STRUCTURE AND CHIP | January 2023 | August 2024 | Allow | 19 | 0 | 0 | No | No |
| 18094288 | MEMORY INCLUDING A PLURALITY OF PORTIONS AND USED FOR REDUCING PROGRAM DISTURBANCE AND PROGRAM METHOD THEREOF | January 2023 | September 2023 | Allow | 8 | 0 | 0 | No | No |
| 18149729 | MEMORY DEVICE HAVING INTERFACE CHARGE TRAPS | January 2023 | April 2025 | Allow | 27 | 1 | 1 | No | No |
| 18090409 | MEMORY DEVICE, METHOD FOR OPERATING MEMORY DEVICE, MEMORY SYSTEM | December 2022 | October 2024 | Allow | 22 | 1 | 0 | No | No |
| 18147537 | A MEMORY DEVICE, PROGRAMMING METHOD AND MEMORY SYSTEM | December 2022 | August 2024 | Allow | 20 | 0 | 0 | No | No |
| 18069685 | MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME | December 2022 | May 2023 | Allow | 5 | 0 | 0 | No | No |
| 18068337 | STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES | December 2022 | April 2023 | Allow | 4 | 0 | 0 | No | No |
| 18076225 | QUICK RELIABILITY SCAN FOR MEMORY DEVICE | December 2022 | October 2023 | Allow | 10 | 1 | 0 | No | No |
| 18075027 | NAND DATA PLACEMENT SCHEMA | December 2022 | August 2023 | Allow | 9 | 1 | 0 | No | No |
| 18074101 | DEVICES, METHODS, AND SYSTEMS FOR A MULTILEVEL MEMORY CELL | December 2022 | December 2024 | Allow | 25 | 1 | 0 | No | No |
| 18061270 | MANGANESE OR SCANDIUM DOPED MULTI-ELEMENT NON-LINEAR POLAR MATERIAL GAIN MEMORY BIT-CELL | December 2022 | June 2023 | Allow | 7 | 1 | 0 | No | No |
| 18072014 | NON-VOLATILE MEMORY AND VOLTAGE DETECTING CIRCUIT THEREOF | November 2022 | July 2024 | Allow | 20 | 0 | 0 | No | No |
| 18071054 | APPARATUS, MEMORY DEVICE, AND METHOD FOR STORING MULTIPLE PARAMETER CODES FOR OPERATION PARAMETERS | November 2022 | February 2023 | Allow | 3 | 0 | 0 | No | No |
| 17988760 | MEMORY DEVICE | November 2022 | July 2024 | Allow | 20 | 0 | 0 | No | No |
| 17988090 | ERASING MEMORY | November 2022 | September 2024 | Allow | 22 | 0 | 0 | No | No |
| 18053305 | CHARGE LEAKAGE DETECTION FOR MEMORY SYSTEM RELIABILITY | November 2022 | April 2023 | Allow | 5 | 0 | 0 | No | No |
| 17980546 | SIGNAL DEVELOPMENT CACHING IN A MEMORY DEVICE | November 2022 | March 2025 | Allow | 28 | 1 | 1 | No | No |
| 17977099 | SEMICONDUCTOR DEVICE, ELECTRONIC COMPONENT, AND ELECTRONIC DEVICE | October 2022 | August 2023 | Allow | 9 | 0 | 1 | No | No |
| 17974940 | METHODS OF OPERATING A NEAR MEMORY PROCESSING-DUAL IN-LINE MEMORY MODULE (NMP-DIMM) FOR PERFORMING A READ OPERATION AND AN ADAPTIVE LATENCY MODULE AND A SYSTEM THEREOF | October 2022 | December 2024 | Allow | 26 | 2 | 0 | Yes | No |
| 18048738 | SENSING SCHEME FOR A MEMORY WITH SHARED SENSE COMPONENTS | October 2022 | October 2023 | Allow | 12 | 1 | 0 | No | No |
| 18045520 | PARTITIONED MEMORY ARCHITECTURE WITH SINGLE RESISTOR MEMORY ELEMENTS FOR IN-MEMORY SERIAL PROCESSING | October 2022 | October 2024 | Allow | 24 | 1 | 0 | No | No |
| 18045529 | CALIBRATION METHODS AND STRUCTURES FOR PARTITIONED MEMORY ARCHITECTURE WITH SINGLE RESISTOR OR DUAL RESISTOR MEMORY ELEMENTS | October 2022 | July 2024 | Allow | 22 | 0 | 0 | No | No |
| 17957532 | MEMORY DEVICE AND OPERATION METHOD THEREOF | September 2022 | May 2024 | Allow | 20 | 0 | 0 | No | No |
| 17937120 | REFRESH CIRCUIT, MEMORY, AND REFRESH METHOD | September 2022 | June 2024 | Allow | 21 | 0 | 0 | No | No |
| 17955978 | MEMORY DEVICE | September 2022 | June 2024 | Allow | 21 | 0 | 0 | No | No |
| 17955439 | DATA CORRECTION OF REDUNDANT DATA STORAGE | September 2022 | June 2024 | Allow | 21 | 0 | 0 | No | No |
| 17948225 | 3D MEMORY SEMICONDUCTOR DEVICES AND STRUCTURES WITH BIT-LINE PILLARS | September 2022 | July 2023 | Allow | 10 | 1 | 1 | No | No |
| 17930625 | SEMICONDUCTOR MEMORY DEVICE | September 2022 | April 2024 | Allow | 19 | 0 | 0 | No | No |
| 17939756 | Detection of an Incorrectly Located Read Voltage | September 2022 | February 2024 | Allow | 17 | 2 | 0 | No | No |
| 17903371 | Bipolar Read Retry | September 2022 | March 2023 | Allow | 7 | 0 | 0 | No | No |
| 17900352 | CONTROLLER AND SEMICONDUCTOR SYSTEM INCLUDING A CONTROLLER | August 2022 | April 2023 | Allow | 7 | 0 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner YANG, HAN.
With a 0.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 60.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner YANG, HAN works in Art Unit 2824 and has examined 1,092 patent applications in our dataset. With an allowance rate of 96.7%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 16 months.
Examiner YANG, HAN's allowance rate of 96.7% places them in the 90% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by YANG, HAN receive 0.77 office actions before reaching final disposition. This places the examiner in the 7% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by YANG, HAN is 16 months. This places the examiner in the 98% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +1.5% benefit to allowance rate for applications examined by YANG, HAN. This interview benefit is in the 17% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 43.2% of applications are subsequently allowed. This success rate is in the 94% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 51.9% of cases where such amendments are filed. This entry rate is in the 73% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 133.3% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 85% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 83.3% of appeals filed. This is in the 74% percentile among all examiners. Of these withdrawals, 40.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.
When applicants file petitions regarding this examiner's actions, 48.7% are granted (fully or in part). This grant rate is in the 58% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.
Examiner's Amendments: This examiner makes examiner's amendments in 2.6% of allowed cases (in the 80% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.2% of allowed cases (in the 45% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.