USPTO Examiner NGUYEN TUAN T - Art Unit 2824

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
17138252Driver Circuit Equipped With Power Gating CircuitDecember 2020July 2022Allow1901NoNo
17133956SENSE AMPLIFIER SLEEP STATE FOR LEAKAGE SAVINGS WITHOUT BIAS MISMATCHDecember 2020July 2022Allow1801NoNo
17247633SCAN OPTIMIZATION USING DATA SELECTION ACROSS WORDLINE OF A MEMORY ARRAYDecember 2020June 2022Allow1801NoNo
17122864ERROR RECOVERY OPERATIONS WITHIN A MEMORY SUB-SYSTEMDecember 2020January 2022Allow1300NoNo
17107235METHODS FOR DETECTING AND MITIGATING MEMORY MEDIA DEGRADATION AND MEMORY DEVICES EMPLOYING THE SAMENovember 2020March 2022Allow1610NoNo
16953485MEMORY SYSTEM INCLUDING A FLASH MEMORY DEVICE AND A MEMORY CONTROLLERNovember 2020January 2022Allow1410NoNo
16953196MEMORY CONTROLLER FOR STROBE-BASED MEMORY SYSTEMSNovember 2020May 2022Allow1810NoNo
17084244MEMORY DEVICES HAVING SOURCE LINES DIRECTLY COUPLED TO BODY REGIONS AND METHODSOctober 2020February 2022Allow1600NoNo
17084366SEMICONDUCTOR MEMORY APPARATUS FOR PREVENTING DISTURBANCEOctober 2020May 2022Allow1910NoNo
17084399SEMICONDUCTOR MEMORY APPARATUS FOR PREVENTING DISTURBANCEOctober 2020May 2022Allow1910NoNo
17074643SEMICONDUCTOR MEMORY DEVICEOctober 2020February 2022Allow1500NoNo
17049282COMMAND/ADDRESS CHANNEL ERROR DETECTIONOctober 2020February 2022Allow1600NoNo
17071924HARDWARE ACCELERATOR WITH ANALOG-CONTENT ADDRESSABLE MEMORY (A-CAM) FOR DECISION TREE COMPUTATIONOctober 2020May 2022Allow1901NoNo
17037795METHOD FOR SELECTING BAD COLUMNS IN DATA STORAGE MEDIUMSeptember 2020January 2022Allow1600NoNo
17035755WRITE PROTECTION CIRCUIT FOR MEMORY AND DISPLAY APPARATUSSeptember 2020April 2022Allow1910NoNo
17024410PRECISION TUNING OF A PAGE OR WORD OF NON-VOLATILE MEMORY CELLS AND ASSOCIATED HIGH VOLTAGE CIRCUITS FOR AN ANALOG NEURAL MEMORY ARRAY IN AN ARTIFICIAL NEURAL NETWORKSeptember 2020July 2022Allow2201NoNo
17022274MEMORY SYSTEM THAT USES NAND FLASH MEMORY AS A MEMORY CHIPSeptember 2020December 2021Allow1500NoNo
17022639SEMICONDUCTOR MEMORY DEVICESeptember 2020June 2021Allow900NoNo
17022848DIE-BASED HIGH AND LOW PRIORITY ERROR QUEUESSeptember 2020April 2022Allow1910NoNo
17020508VARIABLE CLOCK DIVIDERSeptember 2020June 2022Allow2110NoNo
17012135NONVOLATILE MEMORY DEVICE AND METHOD OF CONTROLLING INITIALIZATION OF THE SAMESeptember 2020March 2021Allow610YesNo
17011496ELECTRONIC DEVICE FOR CONTROLLING COMMAND INPUTSeptember 2020February 2022Allow1800NoNo
17010400ERROR DETECTIONSeptember 2020March 2022Allow1810NoNo
17009091SEMICONDUCTOR MEMORY DEVICE, CONTROLLER, MEMORY SYSTEM AND METHOD OF OPERATING THE SAMESeptember 2020February 2022Allow1701NoNo
17006627SEMICONDUCTOR STORAGE DEVICE INCLUDING IDENTIFYING PATTERNS AT POSITIONS CORRESPONDING TO MEMORY BLOCKSAugust 2020July 2022Allow2311NoNo
16941107INDUCTIVE ENERGY HARVESTING AND SIGNAL DEVELOPMENT FOR A MEMORY DEVICEJuly 2020September 2022Allow2511NoNo
16939542METHOD FOR LUT-FREE MEMORY REPAIRJuly 2020February 2022Allow1901NoNo
16936871MEMORY SYSTEM INCLUDING A MEMORY CONTROLLERJuly 2020November 2021Allow1610NoNo
16929685MEMORY CELL ARRANGEMENT AND METHODS THEREOFJuly 2020January 2022Allow1811NoNo
16925295MEMORY DEVICE, SENSING AMPLIFIER, AND METHOD FOR SENSING MEMORY CELLJuly 2020March 2022Allow2011NoNo
16923934MEMORY CELLS, MEMORY CELL ARRAYS, METHODS OF USING AND METHODS OF MAKINGJuly 2020January 2021Allow610NoNo
16922282Method of Maintaining the State of Semiconductor Memory Having Electrically Floating Body TransistorJuly 2020January 2021Allow610NoNo
16921255SEMICONDUCTOR MEMORY DEVICE, MEMORY CONTROLLER, AND ERROR NOTIFICATION METHODJuly 2020July 2022Allow2411NoNo
16919922MEMORY DEVICE TESTING, AND ASSOCIATED METHODS, DEVICES, AND SYSTEMSJuly 2020May 2022Allow2210NoNo
16916367LOOP-DEPENDENT SWITCHING BETWEEN PROGRAM-VERIFY TECHNIQUESJune 2020October 2021Allow1510NoNo
16916463MEMORY MODULE WITH REDUCED ECC OVERHEAD AND MEMORY SYSTEMJune 2020September 2021Allow1401NoNo
16902752DEVICES, MEMORY DEVICES, AND METHODS OF FORMING DEVICESJune 2020February 2022Allow2011NoNo
16896644NONVOLATILE SEMICONDUCTOR MEMORY DEVICEJune 2020March 2021Allow910NoNo
168888713D NAND FLASH AND OPERATION METHOD THEREOFJune 2020June 2021Allow1310NoNo
16886685ON-CHIP-COPY FOR INTEGRATED MEMORY ASSEMBLYMay 2020July 2021Allow1401NoNo
16883410MEMORY DEVICE AND METHOD OF OPERATING THE SAMEMay 2020September 2021Allow1510NoNo
16878882Memory Cells and Arrays of Memory CellsMay 2020November 2020Allow610NoNo
16875358MEMORY SYSTEM, MEMORY CONTROLLER, AND METHOD OF OPERATING MEMORY SYSTEMMay 2020September 2021Allow1610NoNo
16872990WRITE CYCLE EXECUTION BASED ON DATA COMPARISONMay 2020April 2021Allow1120YesNo
16869495COMPUTE AN OPTIMIZED READ VOLTAGEMay 2020January 2021Allow900NoNo
16867631MEMORY CHIP HAVING ON-DIE MIRRORING FUNCTION AND METHOD FOR TESTING THE SAMEMay 2020March 2022Allow2211NoNo
16862238Write Assist Scheme with BitlineApril 2020August 2022Allow2810NoNo
16846049METHODS FOR DETECTING AND MITIGATING MEMORY MEDIA DEGRADATION AND MEMORY DEVICES EMPLOYING THE SAMEApril 2020August 2020Allow410NoNo
16842891VOLTAGE CONTROLLER AND MEMORY DEVICE INCLUDING SAMEApril 2020August 2021Allow1610NoNo
16843628TIMING SIGNAL DELAY COMPENSATION IN A MEMORY DEVICEApril 2020August 2021Allow1601NoNo
16838423ACCESS SIGNAL ADJUSTMENT CIRCUITS AND METHODS FOR MEMORY CELLS IN A CROSS-POINT ARRAYApril 2020January 2021Allow1010NoNo
16834232RESISTIVE RANDOM ACCESS MEMORY DEVICEMarch 2020April 2021Allow1320NoNo
16822119METHOD AND APPARATUS FOR ELIMINATING EEPROM BIT-DISTURBMarch 2020July 2021Allow1611YesNo
16818111Semiconductor Device Having Electrically Floating Body Transistor, Semiconductor Device Having Both Volatile and Non-Volatile Functionality and Method of OperatingMarch 2020December 2020Allow1020NoNo
16811738APPARATUS FOR SUPPLYING POWER SUPPLY VOLTAGE TO SEMICONDUCTOR CHIP INCLUDING VOLATILE MEMORY CELLMarch 2020October 2021Allow1920NoNo
16807405NONVOLATILE MEMORY DEVICE AND METHOD OF CONTROLLING INITIALIZATION OF THE SAMEMarch 2020January 2021Allow1110NoNo
16807845MEMORY SYSTEMMarch 2020January 2021Allow1000NoNo
16804397COMPACT SEMICONDUCTOR MEMORY DEVICE HAVING REDUCED NUMBER OF CONTACTS, METHODS OF OPERATING AND METHODS OF MAKINGFebruary 2020February 2021Allow1110NoNo
16804698DEVICE FOR SWITCHING BETWEEN DIFFERENT READING MODES OF A NON-VOLATILE MEMORY AND METHOD FOR READING A NON-VOLATILE MEMORYFebruary 2020August 2020Allow510NoNo
16794104INTEGRATED CIRCUIT WITH ASYMMETRIC ARRANGEMENTS OF MEMORY ARRAYSFebruary 2020November 2021Allow2111NoNo
16792636TESTING ONE-TIME PROGRAMMABLE (OTP) MEMORY WITH DATA INPUT CAPTURE THROUGH SENSE AMPLIFIER CIRCUITFebruary 2020August 2021Allow1821NoNo
16790750MEMORY STORAGE DEVICE HAVING AUTOMATIC ERROR REPAIR MECHANISM AND METHOD THEREOFFebruary 2020February 2021Allow1210NoNo
16782157MEMORY STRUCTURE FOR ARTIFICIAL INTELLIGENCE (AI) APPLICATIONSFebruary 2020November 2021Allow2111NoNo
16775808Method of Maintaining the State of Semiconductor Memory Having Electrically Floating Body TransistorJanuary 2020March 2020Allow200NoNo
16774932APPARATUS WITH LATCH BALANCING MECHANISM AND METHODS FOR OPERATING THE SAMEJanuary 2020November 2021Allow2211NoNo
16752981MEMORY DEVICES WITH CONTROLLED WORDLINE RAMP RATES, AND ASSOCIATED SYSTEMS AND METHODSJanuary 2020January 2021Allow1130NoNo
16740275POWER REGULATION FOR MEMORY SYSTEMSJanuary 2020April 2022Allow2721YesNo
16737182APPARATUSES FOR INDEPENDENT TUNING OF ON-DIE TERMINATION IMPEDANCES AND OUTPUT DRIVER IMPEDANCES, AND RELATED METHODS, SEMICONDUCTOR DEVICES, AND SYSTEMSJanuary 2020February 2021Allow1310NoNo
16737472DEVICES, MEMORY DEVICES, AND ELECTRONIC SYSTEMSJanuary 2020February 2020Allow110NoNo
16732018MULTI-LEVEL STORAGE IN FERROELECTRIC MEMORYDecember 2019January 2021Allow1310NoNo
16726048MEMORY CONTROLLER FOR STROBE-BASED MEMORY SYSTEMSDecember 2019August 2020Allow710NoNo
16722521MEMORY SYSTEMS HAVING A PLURALITY OF MEMORY DEVICES AND METHODS OF TRAINING THE MEMORY SYSTEMSDecember 2019April 2021Allow1610NoNo
16722132POWER-ON-RESET FOR MEMORYDecember 2019February 2021Allow1410YesNo
16707025Memory Cells, Memory Cell Arrays, Methods of Using and Methods of MakingDecember 2019January 2020Allow200NoNo
16698125DYNAMIC DIGITAL PERCEPTRONNovember 2019February 2021Allow1510NoNo
16617199MAGNETORESISTIVE DYNAMIC RANDOM ACCESS MEMORY CELLNovember 2019April 2021Abandon1710NoNo
16697063MEMORY APPARATUS AND REFRESH METHOD THEREOFNovember 2019October 2020Allow1110NoNo
16693677BITCELL SUPPORTING BIT-WRITE-MASK FUNCTIONNovember 2019July 2021Allow2001NoNo
16694209CONTROLLER AND METHOD OF OPERATING THE SAMENovember 2019January 2020Allow200NoNo
16691127MEMORY DEVICE HAVING LOW WRITE ERROR RATENovember 2019September 2021Allow2211NoNo
16687189MEMORY CONTROLLER AND FLASH MEMORY SYSTEM HAVING THE SAMENovember 2019January 2021Allow1410NoNo
16684633SPIN CURRENT ASSISTED MAGNETORESISTANCE EFFECT DEVICENovember 2019December 2019Allow100NoNo
16485289MEMORY DEVICE THAT ENABLES DIRECT BLOCK COPYING BETWEEN CELL CONFIGURATIONS IN DIFFERENT OPERATION MODESOctober 2019January 2021Allow1710YesNo
16653435SEMICONDUCTOR DEVICE HAVING ELECTRICALLY FLOATING BODY TRANSISTOR, SEMICONDUCTOR DEVICE HAVING BOTH VOLATILE AND NON-VOLATILE FUNCTIONALITY AND METHOD OF OPERATINGOctober 2019November 2019Allow200NoNo
16593791SEMICONDUCTOR DEVICE AND METHOD OF OPERATING SEMICONDUCTOR DEVICEOctober 2019May 2021Allow2001NoNo
16591974MEMORY SYSTEM INCLUDING A MEMORY CONTROLLEROctober 2019June 2022Allow3211NoNo
16591414METHODS FOR DETECTING AND MITIGATING MEMORY MEDIA DEGRADATION AND MEMORY DEVICES EMPLOYING THE SAMEOctober 2019January 2020Allow300NoNo
16579964NONVOLATILE SEMICONDUCTOR MEMORY DEVICESeptember 2019March 2020Allow510NoNo
16497057SEMICONDUCTOR STORAGE ELEMENT, SEMICONDUCTOR STORAGE DEVICE, SEMICONDUCTOR SYSTEM, AND CONTROL METHODSeptember 2019April 2021Allow1810NoNo
16574069Method of Maintaining the State of Semiconductor Memory Having Electrically Floating Body TransistorSeptember 2019October 2019Allow100NoNo
16573302Compact Semiconductor Memory Device Having Reduced Number of Contacts, Methods of Operating and Methods of MakingSeptember 2019November 2019Allow200NoNo
16572278WRITE CYCLE EXECUTION BASED ON DATA COMPARISONSeptember 2019January 2020Allow400NoNo
16559389SEMICONDUCTOR MEMORY DEVICE IN WHICH MEMORY CELLS ARE THREE-DIMENSIONALLY ARRANGESeptember 2019January 2021Allow1701NoNo
16556381MEMORY DEVICE INCLUDING NOISE-SUPPRESSING MECHANISMAugust 2019March 2021Allow1820NoNo
16553358METADATA GROUPING FOR UN-MAP TECHNIQUESAugust 2019November 2020Allow1410NoNo
16548605METHOD AND APPARATUS FOR PRECHARGE AND REFRESH CONTROLAugust 2019September 2019Allow100NoNo
16536078ACCESS SCHEMES FOR SECTION-BASED DATA PROTECTION IN A MEMORY DEVICEAugust 2019January 2020Allow500NoNo
16523373SEMICONDUCTOR INTEGRATED CIRCUIT AND SEMICONDUCTOR DEVICEJuly 2019September 2019Allow100NoNo
16519515MEMORY CELLS, MEMORY CELL ARRAYS, METHODS OF USING AND METHODS OF MAKINGJuly 2019September 2019Allow200NoNo
16520213TAILORING CURRENT MAGNITUDE AND DURATION DURING A PROGRAMMING PULSE FOR A MEMORY DEVICEJuly 2019May 2020Allow1020NoNo

Appeals Overview

No appeal data available for this record. This may indicate that no appeals have been filed or decided for applications in this dataset.

Examiner NGUYEN, TUAN T - Prosecution Strategy Guide

Executive Summary

Examiner NGUYEN, TUAN T works in Art Unit 2824 and has examined 1,316 patent applications in our dataset. With an allowance rate of 99.1%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 15 months.

Allowance Patterns

Examiner NGUYEN, TUAN T's allowance rate of 99.1% places them in the 92% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by NGUYEN, TUAN T receive 0.22 office actions before reaching final disposition. This places the examiner in the 1% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by NGUYEN, TUAN T is 15 months. This places the examiner in the 99% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +0.9% benefit to allowance rate for applications examined by NGUYEN, TUAN T. This interview benefit is in the 20% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 40.2% of applications are subsequently allowed. This success rate is in the 91% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 87.5% of cases where such amendments are filed. This entry rate is in the 98% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Petition Practice

When applicants file petitions regarding this examiner's actions, 65.0% are granted (fully or in part). This grant rate is in the 68% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 18.8% of allowed cases (in the 98% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.9% of allowed cases (in the 62% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.
  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.