USPTO Examiner HUR JUNG H - Art Unit 2824

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
17257532Memory and Its Addressing Method Including Redundant Decoding And Normal DecodingDecember 2020April 2022Allow1510NoNo
17254592MAGNETIC MEMORY DEVICE WITH WRITE CURRENT FLOWING SIMULTANEOUSLY THROUGH NON-ADJACENT LINES IN MEMORY CELL ARRAYDecember 2020May 2022Allow1710YesNo
17123518NON-VOLATILE MEMORY DEVICE INCLUDING A ROW DECODER WITH A PULL-UP STAGE CONTROLLED BY A CURRENT MIRRORDecember 2020December 2021Allow1200NoNo
17120405MEMORY DEVICE INCLUDING VARIABLE REFERENCE RESISTOR AND METHOD OF CALIBRATING THE VARIABLE REFERENCE RESISTORDecember 2020June 2022Allow1810NoNo
17113595MIDPOINT SENSING REFERENCE GENERATION FOR STT-MRAMDecember 2020January 2023Allow2530YesNo
17108737ENERGY RECOVERY IN FILAMENTARY RESISTIVE MEMORIESDecember 2020May 2023Allow3040NoNo
17102266APPARATUSES AND METHODS FOR TRACKING WORD LINE ACCESSESNovember 2020June 2022Allow1920NoNo
17099030CONCURRENT MULTI-BIT ACCESS IN CROSS-POINT ARRAYNovember 2020June 2022Allow1910YesNo
17086908INTEGRATED ASSEMBLIES COMPRISING VERTICALLY-STACKED DECKSNovember 2020March 2022Allow1720NoNo
17083951SYSTEMS AND METHODS FOR MAINTAINING REFRESH OPERATIONS OF MEMORY BANKS USING A SHARED ADDRESS PATHOctober 2020July 2023Allow3220YesNo
17082557MAGNETIC MEMORY DEVICES INCLUDING MAGNETIC STRUCTURE WITH MAGNETIC DOMAINSOctober 2020December 2021Allow1410NoNo
17081116POWER SUPPLY GENERATOR ASSISTOctober 2020January 2022Allow1510NoNo
17082000MEMORY UNIT WITH MULTI-BIT INPUT LOCAL COMPUTING CELL FOR MULTI-BIT CONVOLUTIONAL NEURAL NETWORK BASED COMPUTING-IN-MEMORY APPLICATIONS, MEMORY ARRAY STRUCTURE WITH MULTI-BIT INPUT LOCAL COMPUTING CELL FOR MULTI-BIT CONVOLUTIONAL NEURAL NETWORK BASED COMPUTING-IN-MEMORY APPLICATIONS AND COMPUTING METHOD THEREOFOctober 2020September 2022Allow2310NoNo
17050457STORAGE STRUCTURE AND ERASE METHOD THEREOF INCLUDING ERASING MEMORY BLOCKS IN PIPELINE MANNEROctober 2020December 2022Abandon2520NoNo
17064880NONVOLATILE MEMORY SENSING CIRCUIT INCLUDING VARIABLE CURRENT SOURCEOctober 2020December 2021Allow1410NoNo
17061636SIGNAL AMPLIFICATION IN MRAM DURING READING, INCLUDING A PAIR OF COMPLEMENTARY TRANSISTORS CONNECTED TO AN ARRAY LINEOctober 2020February 2022Allow1700YesNo
17034405PHYSICALLY UNCLONABLE FUNCTION ARCHITECTURE INCLUDING MEMORY CELLS WITH PARALLEL-CONNECTED ACCESS TRANSISTORS AND COMMON WRITE WORDLINESSeptember 2020July 2021Allow900NoNo
17035118MEMORY DEVICE INCLUDING A WORD LINE WITH PORTIONS WITH DIFFERENT SIZES IN DIFFERENT METAL LAYERSSeptember 2020March 2022Allow1820NoNo
17033684EXECUTION METHOD OF FIRMWARE CODE, MEMORY STORAGE DEVICE AND MEMORY CONTROL CIRCUIT UNITSeptember 2020December 2022Abandon2740YesNo
17032537NON-VOLATILE MEMORY WITH VIRTUAL GROUND VOLTAGE PROVIDED TO UNSELECTED COLUMN LINES DURING MEMORY WRITE OPERATIONSeptember 2020November 2021Allow1410NoNo
17032516NON-VOLATLE MEMORY WITH VIRTUAL GROUND VOLTAGE PROVIDED TO UNSELECTED COLUMN LINES DURING MEMORY READ OPERATIONSeptember 2020March 2022Allow1711NoNo
17031542MAGNETIC MEMORY READ CIRCUIT AND CALIBRATION METHOD THEREFORSeptember 2020August 2021Allow1100NoNo
17028522TEST MODES FOR A SEMICONDUCTOR MEMORY DEVICE WITH STACKED MEMORY CHIPS USING A CHIP IDENTIFICATIONSeptember 2020June 2021Allow810YesNo
17027007MEMORY TEST APPARATUS AND TESTING METHOD THEREOF INCLUDING BUILT-IN SELF TEST (BIST)September 2020January 2022Allow1510NoNo
17021620MEMORY DEVICE AND METHOD OF OPERATING THE MEMORY DEVICE INCLUDING PROGRAM VERIFY OPERATION WITH PROGRAM VOLTAGE ADJUSTMENTSeptember 2020November 2022Allow2630YesNo
17018786RAMP-BASED BIASING IN A MEMORY DEVICESeptember 2020August 2021Allow1100YesNo
17014480RESISTIVE MEMORY DEVICE WITH BOUNDARY AND EDGE TRANSISTORS COUPLED TO EDGE BIT LINESSeptember 2020February 2022Allow1821NoNo
17010455MAGNETIC MEMORY WITH CIRCUIT TO SUPPLY SHIFT PULSE TO MOVE A DOMAIN WALL IN A MAGNETIC BODYSeptember 2020September 2021Allow1210NoNo
17009329DEVICES ADJUSTING A LEVEL OF AN ACTIVE VOLTAGE SUPPLIED IN A REFRESH OPERATIONSeptember 2020February 2022Allow1720NoNo
17004446VERIFICATION OF AN EXCESSIVELY HIGH THRESHOLD VOLTAGE IN A MEMORY DEVICEAugust 2020February 2022Allow1820NoNo
17003541SEMICONDUCTOR MEMORY DEVICE WITH A SWITCHING MEMORY CELL IN A MEMORY STRING AND OPERATING METHOD THEREOFAugust 2020January 2022Allow1720NoNo
16997652METHOD FOR DRIVING AN ELECTRONIC DEVICE INCLUDING A SEMICONDUCTOR MEMORY IN A TEST MODEAugust 2020July 2021Allow1120NoNo
16770411STORAGE CIRCUIT PROVIDED WITH VARIABLE RESISTANCE ELEMENTS, REFERENCE VOLTAGE CIRCUIT AND SENSE AMPLIFIERAugust 2020July 2022Allow2520YesNo
16983486TECHNIQUES FOR PROGRAMMING MULTI-LEVEL SELF-SELECTING MEMORY CELLAugust 2020January 2022Allow1811YesNo
16943874SEMICONDUCTOR DEVICE WITH A POWER-DOWN MODE AND A POWER GATING CIRCUIT AND SEMICONDUCTOR SYSTEM INCLUDING THE SAMEJuly 2020June 2021Allow1000NoNo
16939919APPARATUSES AND METHODS FOR COMPARING DATA PATTERNS IN MEMORYJuly 2020March 2022Allow2021YesNo
16935598THREE-DIMENSIONAL NAND FLASH MEMORY DEVICE HAVING IMPROVED DATA RELIABILITY BY VARYING PROGRAM INTERVALS, AND METHOD OF OPERATING THE SAMEJuly 2020September 2021Allow1411YesNo
16922786MEMRISTIVE DEVICE AND METHOD BASED ON ION MIGRATION OVER ONE OR MORE NANOWIRESJuly 2020April 2021Allow910YesNo
16912717METHODS TO TOLERATE PROGRAMMING AND RETENTION ERRORS OF CROSSBAR MEMORY ARRAYSJune 2020October 2022Allow2800YesNo
16911313SRAM LOW-POWER WRITE DRIVERJune 2020November 2022Abandon2910NoNo
16905694TIME DIVISION MULTIPLEXING (TDM) BASED OPTICAL TERNARY CONTENT ADDRESSABLE MEMORY (TCAM)June 2020July 2021Allow1301NoNo
16900015MULTI-PASS PROGRAMMING PROCESS FOR MEMORY DEVICE WHICH OMITS VERIFY TEST IN FIRST PROGRAM PASSJune 2020April 2021Allow1000NoNo
16900470Locally Timed Sensing of Memory DeviceJune 2020December 2022Allow3010YesNo
16878481DYNAMIC RANDOM ACCESS MEMORY ARRAY, SEMICONDUCTOR LAYOUT STRUCTURE AND FABRICATION METHOD THEREOFMay 2020September 2020Allow400NoNo
16877752MEMORY SYSTEM STORAGE DEVICE INCLUDING PATH CIRCUIT IN PARALLEL WITH AUXILIARY POWER DEVICEMay 2020November 2021Allow1811NoNo
16870506NON-VOLATILE RESISTIVE MEMORY DEVICE INCLUDING A PLURALITY OF WRITE MODESMay 2020January 2023Allow3211YesNo
16861435APPARATUS FOR DISCHARGING CONTROL GATES AFTER PERFORMING AN ACCESS OPERATION ON A MEMORY CELLApril 2020March 2021Allow1110NoNo
16861090APPARATUSES AND METHODS FOR POST-PACKAGE REPAIR PROTECTIONApril 2020January 2022Allow2020NoNo
16857053LOW RESISTANCE MONOSILICIDE ELECTRODE FOR PHASE CHANGE MEMORY AND METHODS OF MAKING THE SAMEApril 2020June 2021Allow1401NoNo
16852239SYSTEM AND METHOD FOR COUNTING FAIL BIT AND READING OUT THE SAMEApril 2020April 2022Allow2441YesNo
16847629MEMORY AND CALIBRATION AND OPERATION METHODS THEREOF FOR READING DATA IN MEMORY CELLSApril 2020August 2021Allow1611YesNo
16831116MEMORY ARRAY WITH MULTIPLEXED SELECT LINES AND TWO TRANSISTOR MEMORY CELLSMarch 2020November 2021Allow1920NoNo
16827109MEMORY DEVICE AND BIT LINE PRECHARGING METHOD DURING PROGRAM VERIFY OPERATION IN THE MEMORY DEVICEMarch 2020November 2022Allow3240YesNo
16826558NONVOLATILE MEMORY DEVICE WITH A MONITORING CELL IN A CELL STRINGMarch 2020August 2021Allow1611YesNo
16824618ACCELERATED IN-MEMORY CACHE WITH MEMORY ARRAY SECTIONS HAVING DIFFERENT CONFIGURATIONSMarch 2020May 2021Allow1411YesNo
16647155MEMORY CIRCUIT DEVICE INCLUDING A SELECTION CIRCUIT UNIT SHARED BY A WRITE CIRCUIT UNIT AND A READ CIRCUT UNITMarch 2020July 2021Allow1610YesNo
16808955NON VOLATILE FLASH MEMORY WITH IMPROVED VERIFICATION RECOVERY AND COLUMN SEEDINGMarch 2020December 2022Allow3351YesNo
16808227BIPOLAR ALL-MEMRISTOR CIRCUIT FOR IN-MEMORY COMPUTINGMarch 2020March 2023Allow3621NoNo
16805839METHOD FOR ENHANCING TUNNEL MAGNETORESISTANCE IN MEMORY DEVICEMarch 2020January 2021Allow1000NoNo
16805574Data Storage With Improved Read Performance By Avoiding Line DischargeFebruary 2020May 2022Abandon2730NoNo
16639235THYRISTORSFebruary 2020May 2021Abandon1510NoNo
16786725REFRESH RATE CONTROL FOR A MEMORY DEVICEFebruary 2020April 2021Allow1410NoNo
16776383VARIABLE RESISTANCE MEMORY WITH LATTICE ARRAY USING ENCLOSING TRANSISTORSJanuary 2020February 2021Allow1301NoNo
16745823RESISTIVE MEMORY DEVICES AND METHODS OF OPERATING RESISTIVE MEMORY DEVICES INCLUDING ADJUSTMENT OF CURRENT PATH RESISTANCE OF A SELECTED MEMORY CELL IN A RESISTIVE MEMORY DEVICEJanuary 2020February 2021Allow1310NoNo
16738945NONVOLATILE MEMORY APPARATUS FOR MITIGATING READ DISTURBANCE AND SYSTEM USING THE SAMEJanuary 2020July 2021Allow1811NoNo
16625479JTAG BASED ARCHITECTURE ALLOWING MULTI-CORE OPERATIONDecember 2019February 2024Abandon5060YesNo
16717460MEMORY SUB-SYSTEM TEMPERATURE REGULATIONDecember 2019February 2021Allow1410YesNo
16691173CROSS POINT RESISTIVE MEMORY DEVICE WITH COMPENSATION FOR LEAKAGE CURRENT IN READ OPERATIONNovember 2019March 2021Allow1610NoNo
16615243WIRING LINE LAYOUT IN A SEMICONDUCTOR MEMORY DEVICENovember 2019March 2021Allow1620NoNo
16687000MEMORY SYSTEM, MEMORY CONTROLLER AND MEMORY DEVICE FOR CONFIGURING SUPER BLOCKSNovember 2019April 2021Allow1710YesNo
16687297MEMORY DEVICE STRUCTURE INCLUDING TILTED SIDEWALL AND METHOD FOR FABRICATING THE SAMENovember 2019October 2021Allow2330NoNo
16684989Efuse Programming Unit, Efuse Circuit and Programming Process ThereofNovember 2019June 2021Abandon1920NoNo
16683173OPERATION METHODS OF FERROELECTRIC MEMORYNovember 2019June 2021Allow1921YesNo
16662900MEMORY DEVICE INCLUDING GROUPED PAGE BUFFERS AND READ OPERATION METHOD THEREOFOctober 2019June 2021Allow2020NoNo
16655575METHODS TO TOLERATE PROGRAMMING AND RETENTION ERRORS OF CROSSBAR MEMORY ARRAYSOctober 2019September 2022Allow3500YesNo
16596368MEMORY AND OPERATION METHOD THEREOF INCLUDING ACCESSING REDUNDANCY WORLD LINES BY MEMORY CONTROLLEROctober 2019May 2024Allow5550YesNo
16603710SEMICONDUCTOR NEURAL NETWORK DEVICE INCLUDING A SYNAPSE CIRCUIT COMPRISING MEMORY CELLS AND AN ACTIVATION FUNCTION CIRCUITOctober 2019September 2022Allow3510NoNo
16578770SEMICONDUCTOR MEMORY DEVICE INCLUDING PROGRAM OPERATION STATUS FLAG CELLSSeptember 2019February 2021Allow1710NoNo
16567906SEMICONDUCTOR MEMORY APPARATUS WITH A WRITE VOLTAGE LEVEL DETECTIONSeptember 2019May 2021Allow2020YesNo
16551530GROUPING BITS OF A CODE WORD FOR MEMORY DEVICE OPERATIONSAugust 2019February 2021Allow1720NoNo
16521235NONVOLATILE MEMORY APPARATUS AND VERIFICATION WRITE METHOD THEREOF FOR REDUCING PROGRAM TIMEJuly 2019March 2021Abandon2010NoNo
16517212ENCODER FOR MEMORY SYSTEM AND METHOD THEREOFJuly 2019December 2020Allow1710YesNo
16516900DATA STORAGE MANAGEMENT IN A DEVICE INCLUDING REMOVABLE AND EMBEDDED STORAGE AREASJuly 2019October 2020Allow1510NoNo
16516094POWERGATE BIASING TECHNIQUES FOR MEMORY APPLICATIONSJuly 2019August 2023Allow4990YesNo
16503169Nonvolatile Memory Device And Method Of Operation With A Word Line Setup Time Based On Two Sequential Read VoltagesJuly 2019March 2020Allow810YesNo
16502978NEURAL NETWORK MEMORY WITH AN ARRAY OF VARIABLE RESISTANCE MEMORY CELLSJuly 2019November 2022Allow4010NoNo
16418016METHODS FOR MITIGATING POWER LOSS EVENTS DURING OPERATION OF MEMORY DEVICES AND MEMORY DEVICES EMPLOYING THE SAMEMay 2019May 2022Allow3640YesNo
16412661METHODS FOR PROGRAMMING MEMORY INCLUDING AN OVERDRIVE VOLTAGE FOR GATING AN ACCESS LINE VOLTAGEMay 2019February 2021Allow2120NoNo
16412627VOLTAGE GENERATION SYSTEMS FOR PROGRAMMING MEMORYMay 2019October 2020Allow1710YesNo
16410231FDSOI SENSE AMPLIFIER CONFIGURATION IN A MEMORY DEVICEMay 2019March 2021Allow2211NoNo
16408873MEMORY ACCESS INTERFACE DEVICE INCLUDING PHASE AND DUTY CYCLE ADJUSTING CIRCUITS FOR MEMORY ACCESS SIGNALSMay 2019June 2020Allow1300NoNo
16401429SINGLE-GATE MULTIPLE-TIME PROGRAMMING NON-VOLATILE MEMORY AND OPERATION METHOD THEREOFMay 2019November 2020Abandon1910NoNo
16400280LOCATION DEPENDENT IMPEDANCE MITIGATION IN NON-VOLATILE MEMORYMay 2019November 2020Allow1810YesNo
16400048MAGNETORESISTIVE MEMORY DEVICE WITH DIFFERENT WRITE PULSE PATTERNSMay 2019October 2020Allow1730NoNo
16393050SKEWED SENSE AMPLIFIER FOR SINGLE-ENDED SENSINGApril 2019November 2020Allow1911YesNo
16299413ACCESS ASSIST WITH WORDLINE ADJUSTMENT WITH TRACKING CELLMarch 2019June 2020Allow1510NoNo
16299684MEMORY DEVICE HAVING IMPROVED DATA RELIABILITY BY VARYING PROGRAM INTERVALS, AND METHOD OF OPERATING THE SAMEMarch 2019March 2021Allow2421YesNo
16298507SEMICONDUCTOR MEMORY DEVICEMarch 2019October 2020Abandon1910NoNo
16292338ADJUSTING READ VOLTAGE LEVEL IN REWRITABLE NONVOLATILE MEMORY MODULEMarch 2019January 2021Allow2220YesNo
16261379CLOCKED COMMANDS TIMING ADJUSTMENTS METHOD IN SYNCHRONOUS SEMICONDUCTOR INTEGRATED CIRCUITSJanuary 2019August 2020Allow1820NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner HUR, JUNG H.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
9
Examiner Affirmed
7
(77.8%)
Examiner Reversed
2
(22.2%)
Reversal Percentile
36.1%
Lower than average

What This Means

With a 22.2% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.

Strategic Value of Filing an Appeal

Total Appeal Filings
27
Allowed After Appeal Filing
6
(22.2%)
Not Allowed After Appeal Filing
21
(77.8%)
Filing Benefit Percentile
30.8%
Lower than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 22.2% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.

Strategic Recommendations

Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.

Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.

Examiner HUR, JUNG H - Prosecution Strategy Guide

Executive Summary

Examiner HUR, JUNG H works in Art Unit 2824 and has examined 989 patent applications in our dataset. With an allowance rate of 85.8%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 24 months.

Allowance Patterns

Examiner HUR, JUNG H's allowance rate of 85.8% places them in the 64% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by HUR, JUNG H receive 1.58 office actions before reaching final disposition. This places the examiner in the 27% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by HUR, JUNG H is 24 months. This places the examiner in the 82% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +4.7% benefit to allowance rate for applications examined by HUR, JUNG H. This interview benefit is in the 30% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 32.2% of applications are subsequently allowed. This success rate is in the 69% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 49.5% of cases where such amendments are filed. This entry rate is in the 75% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 15.4% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 26% percentile among all examiners. Note: Pre-appeal conferences show below-average success with this examiner. Consider whether your arguments are strong enough to warrant a PAC request.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 59.1% of appeals filed. This is in the 34% percentile among all examiners. Of these withdrawals, 61.5% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.

Petition Practice

When applicants file petitions regarding this examiner's actions, 58.6% are granted (fully or in part). This grant rate is in the 60% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 13.1% of allowed cases (in the 96% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.2% of allowed cases (in the 55% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.