Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18789866 | SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME | July 2024 | March 2026 | Allow | 19 | 1 | 0 | No | No |
| 18763964 | SELF-TIMING READ TERMINATION | July 2024 | December 2025 | Allow | 18 | 0 | 0 | No | No |
| 18761619 | MEMORY DEVICE WITH REDUNDANCY FOR PAGE-BASED REPAIR | July 2024 | January 2025 | Allow | 7 | 0 | 0 | No | No |
| 18761321 | MEMORY DEVICE AND READ VOLTAGE SETTING METHOD THEREOF | July 2024 | March 2026 | Allow | 20 | 1 | 0 | No | No |
| 18752638 | Scannable Memory Subsystem | June 2024 | March 2026 | Allow | 21 | 1 | 0 | No | No |
| 18749098 | METHOD AND SYSTEM FOR REPLACEMENT OF MEMORY CELLS | June 2024 | April 2025 | Allow | 9 | 1 | 0 | No | No |
| 18742749 | TECHNIQUES FOR DETECTING A STATE OF A BUS | June 2024 | April 2025 | Allow | 10 | 1 | 0 | No | No |
| 18736779 | BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION | June 2024 | June 2025 | Allow | 13 | 1 | 0 | No | No |
| 18671964 | MEMORY DEVICE | May 2024 | March 2026 | Allow | 21 | 1 | 0 | No | No |
| 18670883 | MEMORY SYSTEMS AND DEVICES HAVING ENHANCED COLUMN REPAIR CAPABILITY AND METHODS OF OPERATING SAME | May 2024 | February 2026 | Allow | 21 | 1 | 0 | Yes | No |
| 18667358 | APPARATUSES AND METHODS FOR FORCING MEMORY CELL FAILURES IN A MEMORY DEVICE | May 2024 | November 2025 | Allow | 18 | 1 | 0 | No | No |
| 18653688 | STORAGE DEVICE AND METHOD OF OPERATING STORAGE DEVICE | May 2024 | January 2026 | Allow | 21 | 1 | 0 | Yes | No |
| 18651357 | SEQUENTIAL ACCESS TO LINKED MEMORY DICE FOR BUS TRAINING | April 2024 | January 2026 | Allow | 20 | 1 | 0 | Yes | No |
| 18650942 | SEMICONDUCTOR MEMORY DEVICE AND CONTROL METHOD OF THE SAME | April 2024 | January 2026 | Allow | 21 | 1 | 0 | No | No |
| 18635569 | AREA SAVING HIGH COVERAGE FAST DIAGNOSIS MEMORY SCAN DESIGN | April 2024 | January 2026 | Allow | 21 | 1 | 0 | No | No |
| 18635219 | DUMMY MEMORY HOLE DEFECT DETECTION | April 2024 | December 2025 | Allow | 20 | 1 | 0 | Yes | No |
| 18634096 | Usage-Based Disturbance Counter Repair | April 2024 | March 2026 | Allow | 23 | 1 | 0 | Yes | No |
| 18611351 | VOTING-BASED STATE SELECTION FOR A VOLATILE MEMORY | March 2024 | January 2026 | Allow | 22 | 1 | 0 | No | No |
| 18608220 | DYNAMIC ERROR MONITOR AND REPAIR | March 2024 | July 2025 | Allow | 16 | 2 | 0 | No | No |
| 18581694 | AREA-EFFICIENT, WIDTH-ADJUSTABLE SIGNALING INTERFACE | February 2024 | January 2025 | Allow | 11 | 1 | 0 | No | No |
| 18420688 | STACKED DRAM DEVICE AND METHOD OF MANUFACTURE | January 2024 | August 2024 | Allow | 7 | 0 | 0 | No | No |
| 18415722 | PRE-CHARACTERIZING WEAK BITS FOR INCREASED LOW DENSITY PARITY CHECK (LDPC) SPEED | January 2024 | January 2026 | Allow | 24 | 1 | 0 | Yes | No |
| 18411822 | METHOD, DEVICE, AND CIRCUIT FOR HIGH-SPEED MEMORIES | January 2024 | November 2024 | Allow | 10 | 1 | 0 | No | No |
| 18411397 | Data Storage Device and Method for Read Disturb Mitigation During Low-Power Modes | January 2024 | September 2025 | Allow | 20 | 1 | 0 | No | No |
| 18406424 | BIT COUNTING CIRCUITS AND MEMORY DEVICES INCLUDING THE SAME | January 2024 | January 2026 | Allow | 25 | 1 | 0 | Yes | No |
| 18405156 | NON-VOLATILE MEMORY WITH ENHANCED EARLY PROGRAM TERMINATION MODE FOR NEIGHBOR PLANE DISTURB | January 2024 | November 2025 | Allow | 22 | 0 | 0 | No | No |
| 18403700 | Method for Scanning a Memory Array | January 2024 | January 2026 | Allow | 25 | 1 | 0 | No | No |
| 18392487 | INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST | December 2023 | October 2024 | Allow | 10 | 1 | 0 | Yes | No |
| 18393544 | MEMORY DEVICE | December 2023 | November 2025 | Allow | 22 | 1 | 0 | No | No |
| 18544612 | DATA SERIALIZER, LATCH DATA DEVICE USING THE SAME AND CONTROLLING METHOD THEREOF | December 2023 | September 2025 | Allow | 21 | 1 | 0 | No | No |
| 18543687 | MEMORY DEVICE INCLUDING REPAIR CIRCUIT AND OPERATING METHOD THEREOF | December 2023 | September 2025 | Allow | 20 | 0 | 0 | No | No |
| 18534495 | TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIPLE SIGNALS IN A MEMORY CHIP | December 2023 | February 2026 | Allow | 27 | 1 | 0 | No | No |
| 18556858 | Logical Memory Repair with a Shared Physical Memory | October 2023 | October 2025 | Allow | 23 | 0 | 0 | No | No |
| 18486789 | CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO | October 2023 | May 2025 | Allow | 19 | 1 | 0 | No | No |
| 18485631 | SEMICONDUCTOR DEVICE HAVING MEMORY CELL ARRAY DIVIDED INTO PLURAL MEMORY MATS | October 2023 | May 2025 | Allow | 19 | 1 | 0 | No | No |
| 18482464 | STORAGE DEVICE FOR SUPPORTING DYNAMIC ALLOCATION OF MEMORY AND METHOD OF OPERATING THE SAME | October 2023 | March 2026 | Allow | 29 | 2 | 0 | Yes | No |
| 18369014 | ERROR CONDITION MONITORING IN MEMORY SYSTEMS | September 2023 | November 2025 | Allow | 26 | 1 | 0 | Yes | No |
| 18467996 | SYSTEMS AND METHODS FOR MONITORING AND MANAGING MEMORY DEVICES | September 2023 | June 2025 | Allow | 21 | 1 | 0 | No | No |
| 18463905 | SENSE AMPLIFIER AND OUTPUT LATCH CIRCUIT FOR TESTING | September 2023 | November 2025 | Allow | 26 | 2 | 0 | No | No |
| 18243441 | Row Repair Circuitry | September 2023 | August 2025 | Allow | 23 | 1 | 0 | No | No |
| 18241621 | VOLTAGE GENERATION CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME | September 2023 | May 2025 | Allow | 20 | 0 | 0 | No | No |
| 18458201 | MEMORY DEVICE AND READING METHOD THEREOF | August 2023 | July 2025 | Allow | 23 | 1 | 0 | Yes | No |
| 18238232 | MEMORY DEVICE AND MEMORY SYSTEM | August 2023 | January 2025 | Allow | 17 | 1 | 0 | No | No |
| 18455031 | METHOD FOR OPTIMIZING FLASH MEMORY CHIP AND RELATED APPARATUS | August 2023 | April 2025 | Allow | 19 | 0 | 0 | Yes | No |
| 18453903 | SEMICONDUCTOR DEVICE RELATED TO A PARALLEL TEST | August 2023 | April 2025 | Allow | 20 | 1 | 0 | Yes | No |
| 18453400 | SYSTEM AND METHOD FOR PARALLEL MEMORY TEST | August 2023 | July 2024 | Allow | 11 | 1 | 0 | No | No |
| 18236177 | FLASH MEMORY FOR PERFORMING MARGIN READ TEST OPERATION AND MARGIN READ TEST SYSTEM INCLUDING THE SAME | August 2023 | August 2025 | Allow | 24 | 1 | 0 | Yes | No |
| 18277382 | RECONFIGURABLE MBIST METHOD BASED ON ADAPTIVE MARCH ALGORITHM | August 2023 | January 2025 | Allow | 17 | 1 | 0 | No | No |
| 18450241 | Non-Volatile Memory Device and Method of Operating the Same | August 2023 | April 2024 | Allow | 8 | 1 | 0 | No | No |
| 18448346 | SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING SEMICONDUCTOR MEMORY DEVICE | August 2023 | April 2025 | Allow | 20 | 1 | 0 | Yes | No |
| 18366213 | ABORTED OPERATION DETECTION FOR NONVOLATILE MEMORY WITH NON-UNIFORM ERASE | August 2023 | January 2026 | Allow | 29 | 1 | 0 | Yes | No |
| 18364303 | MEMORY DEVICE, MEMORY SYSTEM HAVING THE SAME AND OPERATING METHOD THEREOF | August 2023 | October 2025 | Allow | 26 | 1 | 0 | Yes | No |
| 18228118 | AT-SPEED TRANSITION FAULT TESTING FOR A MULTI-PORT AND MULTI-CLOCK MEMORY | July 2023 | June 2025 | Allow | 23 | 0 | 0 | No | No |
| 18361839 | NON-VOLATILE MEMORY WITH MULTIPLE DATA RESOLUTIONS | July 2023 | September 2025 | Allow | 26 | 2 | 0 | Yes | No |
| 18361843 | NON-VOLATILE MEMORY WITH NEIGHBOR PLANE PROGRAM DISTURB AVOIDANCE | July 2023 | June 2025 | Allow | 23 | 1 | 0 | Yes | No |
| 18359975 | METHOD FOR LUT-FREE MEMORY REPAIR | July 2023 | October 2025 | Allow | 27 | 1 | 0 | No | No |
| 18360520 | EVOLVING BAD BLOCK DETECTION IN NON-VOLATILE MEMORY | July 2023 | July 2025 | Allow | 24 | 2 | 0 | Yes | No |
| 18359816 | NON-VOLATILE MEMORY WITH SLOW VOLTAGE RAMP COMPENSATION | July 2023 | June 2025 | Allow | 22 | 1 | 0 | Yes | No |
| 18225654 | Interface circuit, memory controller and method for calibrating signal processing devices in an interface circuit | July 2023 | January 2025 | Allow | 18 | 1 | 0 | No | No |
| 18357274 | NON-VOLATILE MEMORY WITH SMART CONTROL OF OVERDRIVE VOLTAGE | July 2023 | July 2025 | Allow | 23 | 1 | 0 | Yes | No |
| 18356222 | MEMORY DEVICE FOR PERFORMING READ OPERATION AND OPERATING METHOD THEREOF | July 2023 | July 2025 | Allow | 24 | 1 | 0 | No | No |
| 18273059 | READ-ONLY MEMORY DIAGNOSIS AND REPAIR | July 2023 | August 2025 | Allow | 25 | 0 | 0 | No | No |
| 18354631 | CONTROL CIRCUIT, MEMORY SYSTEM AND CONTROL METHOD | July 2023 | May 2025 | Allow | 22 | 1 | 0 | No | No |
| 18222563 | MEMORY SYSTEM, OPERATING METHOD OF THE SAME, AND CONTROLLER OF MEMORY DEVICE | July 2023 | July 2025 | Allow | 24 | 1 | 0 | Yes | No |
| 18261631 | SEMICONDUCTOR STORAGE DEVICE | July 2023 | July 2025 | Allow | 24 | 1 | 0 | No | No |
| 18351625 | FUSE BASED REPLAY PROTECTION WITH DYNAMIC FUSE USAGE AND COUNTERMEASURES FOR FUSE VOLTAGE CUT ATTACKS | July 2023 | June 2024 | Allow | 11 | 1 | 0 | No | No |
| 18346367 | NON-VOLATILE MEMORY WITH LAYOUT ADAPTIVE PROBLEMATIC WORD LINE DETECTION | July 2023 | March 2025 | Allow | 21 | 1 | 0 | Yes | No |
| 18343377 | HOST-TO-DEVICE INTERFACE CIRCUITRY TESTING | June 2023 | January 2026 | Allow | 31 | 3 | 0 | No | No |
| 18341192 | MEMORY DEVICE INCLUDING TEST PAD CONNECTION CIRCUIT | June 2023 | April 2025 | Allow | 21 | 1 | 0 | Yes | No |
| 18328186 | METHODS FOR CONTROLLING BIT LINE VOLTAGES IN MEMORY DEVICES | June 2023 | February 2026 | Allow | 33 | 2 | 0 | No | No |
| 18325109 | STORAGE DEVICE AND OPERATING METHOD THEREOF | May 2023 | June 2025 | Allow | 24 | 1 | 0 | No | No |
| 18323950 | SEMICONDUCTOR DEVICE AND OPERATING METHOD FOR CONTROLLING DRIVING DIRECTION OF WORD LINE | May 2023 | July 2025 | Allow | 26 | 1 | 0 | No | No |
| 18314743 | METHOD AND SYSTEM FOR REPLACEMENT OF MEMORY CELLS | May 2023 | March 2024 | Allow | 10 | 1 | 0 | No | No |
| 18314147 | MEMORY DEVICE INCLUDING ERROR CORRECTION DEVICE | May 2023 | July 2025 | Allow | 27 | 1 | 0 | No | No |
| 18301327 | BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION | April 2023 | March 2024 | Allow | 11 | 1 | 0 | No | No |
| 18134776 | MEMORY DEVICES, OPERATING METHODS OF THE MEMORY DEVICES, AND TEST SYSTEMS INCLUDING THE MEMORY DEVICES | April 2023 | June 2025 | Allow | 26 | 1 | 0 | Yes | No |
| 18298335 | VOLTAGE PREDICTION METHOD, MEMORY STORAGE DEVICE AND MEMORY CONTROL CIRCUIT UNIT | April 2023 | March 2025 | Allow | 23 | 1 | 0 | No | No |
| 18125098 | SEMICONDUCTOR MEMORY DEVICE MANAGING FLEXIBLE REFRESH SKIP AREA | March 2023 | September 2023 | Allow | 6 | 1 | 0 | No | No |
| 18179130 | SEMICONDUCTOR-ELEMENT-INCLUDING MEMORY DEVICE | March 2023 | November 2024 | Allow | 20 | 0 | 0 | No | No |
| 18115132 | SEMICONDUCTOR MEMORY DEVICES AND METHODS OF OPERATING SEMICONDUCTOR MEMORY DEVICES | February 2023 | July 2024 | Allow | 17 | 2 | 0 | No | No |
| 18173096 | MEMORY DEVICE AND IN-MEMORY SEARCH METHOD THEREOF | February 2023 | May 2025 | Allow | 27 | 1 | 0 | Yes | No |
| 18108085 | NON-VOLATILE MEMORY DEVICE AND METHOD OF OPERATING THE SAME | February 2023 | January 2024 | Allow | 11 | 1 | 0 | No | No |
| 18165635 | SEMICONDUCTOR MEMORY DEVICES WITH BACKSIDE HEATER STRUCTURE | February 2023 | June 2025 | Allow | 28 | 1 | 0 | No | No |
| 18164349 | SEMICONDUCTOR MEMORY DEVICES, MEMORY SYSTEMS INCLUDING THE SAME AND METHODS OF OPERATING MEMORY SYSTEMS | February 2023 | January 2024 | Allow | 11 | 2 | 0 | Yes | No |
| 18157558 | REFRESH CONTROL CIRCUIT, MEMORY, AND REFRESH CONTROL METHOD | January 2023 | March 2025 | Allow | 25 | 1 | 0 | No | No |
| 18005875 | THREE-DIMENSIONAL FLASH MEMORY USING FERROELECTRIC LAYER ON BASIS OF BACK GATE STRUCTURE | January 2023 | September 2025 | Allow | 31 | 1 | 1 | Yes | No |
| 18155692 | PROGRAMMABLE MEMORY AND METHOD FOR DRIVING PROGRAMMABLE MEMORY | January 2023 | February 2025 | Allow | 25 | 1 | 0 | No | No |
| 18097459 | AREA-EFFICIENT, WIDTH-ADJUSTABLE SIGNALING INTERFACE | January 2023 | November 2023 | Allow | 10 | 1 | 0 | No | No |
| 18154256 | ADDRESS SELECTION CIRCUIT AND CONTROL METHOD THEREOF, AND MEMORY | January 2023 | October 2024 | Allow | 21 | 1 | 0 | No | No |
| 18094554 | OPTIMIZING MEMORY ACCESS OPERATION PARAMETERS | January 2023 | July 2023 | Allow | 7 | 1 | 0 | No | No |
| 18093258 | BUFFER CIRCUIT WITH DATA BIT INVERSION | January 2023 | April 2024 | Allow | 15 | 2 | 0 | Yes | No |
| 18148380 | SENSE AMPLIFIER ARCHITECTURE FOR A NON-VOLATILE MEMORY STORING CODED INFORMATION | December 2022 | November 2024 | Allow | 23 | 1 | 0 | Yes | No |
| 18090658 | NON-VOLATILE MEMORY DEVICE OPTIMIZED FOR A SURFACE MOUNT TECHNOLOGY (SMT) PROCESS AND AN OPERATING METHOD THEREOF | December 2022 | November 2024 | Allow | 22 | 1 | 0 | Yes | No |
| 18090423 | CONFIGURATION METHOD AND READING METHOD OF 3D MEMORY DEVICE, 3D MEMORY DEVICE, AND MEMORY SYSTEM | December 2022 | June 2025 | Allow | 29 | 2 | 0 | Yes | No |
| 18084452 | MEMORY DEVICES WITH MULTIPLE PSEUDO-CHANNELS | December 2022 | February 2026 | Allow | 38 | 2 | 0 | Yes | No |
| 18076029 | MEMORY DEVICE AND METHOD OF OPERATING THE SAME | December 2022 | March 2025 | Allow | 27 | 1 | 0 | No | No |
| 18061312 | PROXIMITY HEATER TO LOWER RRAM FORMING VOLTAGE | December 2022 | April 2025 | Allow | 28 | 1 | 0 | No | No |
| 18072723 | METHOD FOR ERASING FLASH MEMORY | December 2022 | December 2024 | Allow | 25 | 1 | 0 | No | No |
| 17983331 | MEMORY CELL | November 2022 | May 2025 | Allow | 30 | 1 | 0 | No | No |
| 17982512 | MEMORY REPAIR USING OPTIMIZED REDUNDANCY UTILIZATION | November 2022 | June 2023 | Allow | 7 | 1 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner BASHAR, MOHAMMED A.
With a 14.3% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 8.3% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the bottom 25% across the USPTO, indicating that filing appeals is less effective here than in most other areas.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner BASHAR, MOHAMMED A works in Art Unit 2824 and has examined 538 patent applications in our dataset. With an allowance rate of 94.2%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 19 months.
Examiner BASHAR, MOHAMMED A's allowance rate of 94.2% places them in the 82% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by BASHAR, MOHAMMED A receive 1.25 office actions before reaching final disposition. This places the examiner in the 16% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by BASHAR, MOHAMMED A is 19 months. This places the examiner in the 95% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +3.4% benefit to allowance rate for applications examined by BASHAR, MOHAMMED A. This interview benefit is in the 26% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 41.1% of applications are subsequently allowed. This success rate is in the 92% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 30.9% of cases where such amendments are filed. This entry rate is in the 45% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.
When applicants request a pre-appeal conference (PAC) with this examiner, 0.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 13% percentile among all examiners. Note: Pre-appeal conferences show limited success with this examiner compared to others. While still worth considering, be prepared to proceed with a full appeal brief if the PAC does not result in favorable action.
This examiner withdraws rejections or reopens prosecution in 61.1% of appeals filed. This is in the 38% percentile among all examiners. Of these withdrawals, 36.4% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.
When applicants file petitions regarding this examiner's actions, 21.4% are granted (fully or in part). This grant rate is in the 11% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 24% percentile). This examiner rarely makes examiner's amendments compared to other examiners. You should expect to make all necessary claim amendments yourself through formal amendment practice.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.0% of allowed cases (in the 31% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.