Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18866425 | MOSFET DEVICE | November 2024 | June 2025 | Allow | 7 | 0 | 0 | No | No |
| 18419987 | ANNEALED SEED LAYER TO IMPROVE FERROELECTRIC PROPERTIES OF MEMORY LAYER | January 2024 | February 2025 | Allow | 13 | 1 | 0 | Yes | No |
| 18415503 | TRENCH SCHOTTKY BARRIER RECTIFIER AND METHOD FOR FABRICATING SAME | January 2024 | September 2024 | Allow | 8 | 1 | 0 | Yes | No |
| 18529505 | SEMICONDUCTOR DEVICE INCLUDING FERROELECTRIC MATERIAL, NEUROMORPHIC CIRCUIT INCLUDING THE SEMICONDUCTOR DEVICE, AND NEUROMORPHIC COMPUTING APPARATUS INCLUDING THE NEUROMORPHIC CIRCUIT | December 2023 | August 2024 | Allow | 9 | 0 | 0 | Yes | No |
| 18519205 | SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES | November 2023 | July 2024 | Allow | 8 | 0 | 0 | No | No |
| 18520518 | SEMICONDUCTOR SUBSTRATE | November 2023 | August 2024 | Allow | 9 | 0 | 0 | No | No |
| 18470224 | DISPLAY APPARATUS | September 2023 | November 2024 | Abandon | 14 | 1 | 0 | No | No |
| 18238534 | HIGH ELECTRON MOBILITY TRANSISTOR | August 2023 | April 2024 | Allow | 8 | 0 | 0 | No | No |
| 18237075 | IMAGING ELEMENT AND IMAGING APPARATUS | August 2023 | September 2024 | Allow | 13 | 2 | 0 | Yes | No |
| 18452823 | PHOTOELECTRIC CONVERSION ELEMENT, SOLID-STATE IMAGING DEVICE, AND ELECTRONIC DEVICE | August 2023 | August 2024 | Allow | 12 | 1 | 0 | Yes | No |
| 18446572 | IMAGE SENSOR WITH PASSIVATION LAYER FOR DARK CURRENT REDUCTION | August 2023 | July 2024 | Allow | 12 | 1 | 0 | Yes | No |
| 18361989 | TRENCH FORMATION SCHEME FOR PROGRAMMABLE METALLIZATION CELL TO PREVENT METAL REDEPOSIT | July 2023 | March 2025 | Allow | 20 | 1 | 1 | Yes | No |
| 18228093 | METHOD FOR MANUFACTURING BACK SURFACE INCIDENT TYPE SEMICONDUCTOR PHOTO DETECTION ELEMENT | July 2023 | September 2024 | Allow | 14 | 2 | 0 | No | No |
| 18327978 | SOLID-STATE IMAGE SENSOR | June 2023 | April 2025 | Allow | 22 | 2 | 0 | No | No |
| 18326015 | DISPLAY DEVICE | May 2023 | January 2025 | Allow | 19 | 2 | 0 | No | No |
| 18324638 | SEMICONDUCTOR DEVICE | May 2023 | January 2024 | Allow | 7 | 0 | 0 | No | No |
| 18198384 | IMAGE SENSOR INTENDED TO BE ILLUMINATED VIA A BACK SIDE, AND CORRESPONDING METHOD FOR ACQUIRING A LIGHT FLUX | May 2023 | December 2023 | Allow | 7 | 0 | 0 | No | No |
| 18196090 | SEMICONDUCTOR DEVICE, ELECTRONIC SYSTEM, AND ELECTROSTATIC DISCHARGE PROTECTION METHOD FOR SEMICONDUCTOR DEVICE THEREOF | May 2023 | April 2024 | Allow | 11 | 0 | 0 | No | No |
| 18139493 | DISPLAY DEVICE | April 2023 | March 2024 | Allow | 10 | 1 | 0 | No | No |
| 18130677 | METHOD FOR PREPARING DISPLAY SUBSTRATE | April 2023 | November 2023 | Allow | 7 | 0 | 0 | Yes | No |
| 18185966 | IMAGE PICKUP ELEMENT, STACKED IMAGE PICKUP ELEMENT, AND SOLID IMAGE PICKUP APPARATUS | March 2023 | May 2024 | Allow | 14 | 2 | 0 | Yes | No |
| 18103227 | REDUCING LOSS IN STACKED QUANTUM DEVICES | January 2023 | December 2023 | Allow | 10 | 0 | 0 | No | No |
| 18158452 | CAPACITOR AND METHOD FOR FORMING THE SAME | January 2023 | January 2024 | Allow | 12 | 1 | 0 | No | No |
| 18006418 | THREE-DIMENSIONAL ELECTRONIC DEVICES AND METHODS OF PRODUCING THE SAME | January 2023 | April 2025 | Allow | 26 | 1 | 1 | Yes | No |
| 18156712 | PHOTOELECTRIC CONVERSION ELEMENT AND IMAGING DEVICE | January 2023 | October 2023 | Allow | 8 | 1 | 0 | No | No |
| 18095728 | ELECTRONIC CIRCUIT | January 2023 | October 2023 | Allow | 9 | 0 | 0 | No | No |
| 18079702 | DISPLAY STACK WITH INTEGRATED PHOTODETECTORS | December 2022 | January 2024 | Allow | 13 | 1 | 0 | No | No |
| 18061233 | IMAGING DEVICE | December 2022 | August 2024 | Allow | 21 | 1 | 0 | No | No |
| 18059338 | INTEGRATED CIRCUIT DEVICES WITH NON-COLLAPSED FINS AND METHODS OF TREATING THE FINS TO PREVENT FIN COLLAPSE | November 2022 | April 2025 | Abandon | 28 | 4 | 0 | Yes | No |
| 17979183 | METHOD FOR CO-MANUFACTURING A FERROELECTRIC MEMORY AND AN OxRAM RESISTIVE MEMORY AND DEVICE CO-INTEGRATING A FERROELECTRIC MEMORY AND AN OxRAM RESISTIVE MEMORY | November 2022 | April 2025 | Allow | 29 | 0 | 0 | Yes | No |
| 17964108 | IMAGING DEVICE, STACKED IMAGING DEVICE, AND SOLID-STATE IMAGING APPARATUS | October 2022 | January 2024 | Allow | 15 | 1 | 0 | Yes | No |
| 17947172 | SEMICONDUCTOR STRUCTURE | September 2022 | July 2024 | Allow | 22 | 5 | 0 | Yes | No |
| 17940464 | SOLID-STATE IMAGING DEVICE, MANUFACTURING METHOD THEREOF, AND ELECTRONIC APPARATUS | September 2022 | October 2023 | Allow | 13 | 0 | 0 | No | No |
| 17885479 | SEMICONDUCTOR DEVICE AND A METHOD FOR FABRICATING THE SAME | August 2022 | November 2023 | Allow | 15 | 1 | 0 | No | No |
| 17882012 | ANNEALED SEED LAYER TO IMPROVE FERROELECTRIC PROPERTIES OF MEMORY LAYER | August 2022 | October 2023 | Allow | 15 | 1 | 0 | Yes | No |
| 17877214 | METHOD FOR MANUFACTURING BACK SURFACE INCIDENT TYPE SEMICONDUCTOR PHOTO DETECTION ELEMENT | July 2022 | April 2023 | Allow | 9 | 1 | 0 | Yes | No |
| 17873921 | METHOD OF TESTING WAFER | July 2022 | February 2024 | Allow | 19 | 1 | 0 | Yes | No |
| 17841668 | SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF | June 2022 | June 2025 | Allow | 36 | 1 | 0 | No | No |
| 17805966 | MEMORY AND MEMORY FORMING METHOD | June 2022 | June 2025 | Allow | 36 | 1 | 0 | No | No |
| 17833100 | Singulation and Bonding Methods and Structures Formed Thereby | June 2022 | July 2024 | Allow | 25 | 1 | 1 | Yes | No |
| 17832609 | EPITAXIAL FEATURES IN SEMICONDUCTOR DEVICES AND MANUFACTURING METHOD OF THE SAME | June 2022 | April 2025 | Allow | 35 | 1 | 1 | No | No |
| 17805201 | MICROELECTRONIC DEVICES, RELATED ELECTRONIC SYSTEMS, AND METHODS OF FORMING MICROELECTRONIC DEVICES | June 2022 | April 2025 | Allow | 35 | 0 | 0 | Yes | No |
| 17828264 | MEMORY DEVICE WITH AIR GAPS FOR REDUCING CAPACITIVE COUPLING | May 2022 | May 2023 | Allow | 11 | 1 | 0 | Yes | No |
| 17829065 | METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE AND SILICON CARBIDE SEMICONDUCTOR DEVICE | May 2022 | September 2024 | Allow | 27 | 0 | 0 | No | No |
| 17826708 | CMOS IMAGE SENSORS | May 2022 | January 2024 | Allow | 20 | 1 | 0 | Yes | No |
| 17748601 | TRENCH FORMATION SCHEME FOR PROGRAMMABLE METALLIZATION CELL TO PREVENT METAL REDEPOSIT | May 2022 | May 2023 | Allow | 12 | 1 | 1 | No | No |
| 17663066 | PROCESSING METHOD OF WAFER | May 2022 | February 2025 | Allow | 33 | 2 | 0 | Yes | No |
| 17737851 | Forming Low-Resistance Capping Layer Over Metal Gate Electrode | May 2022 | May 2025 | Allow | 36 | 0 | 1 | Yes | No |
| 17660939 | MEMORY CELL FORMATION IN THREE DIMENSIONAL MEMORY ARRAYS USING ATOMIC LAYER DEPOSITION | April 2022 | May 2025 | Allow | 37 | 2 | 1 | Yes | No |
| 17729260 | HYBRID IMAGE SENSORS HAVING OPTICAL AND SHORT-WAVE INFRARED PIXELS INTEGRATED THEREIN | April 2022 | October 2023 | Allow | 18 | 1 | 1 | Yes | No |
| 17723535 | GATE STRUCTURES AND SEMICONDUCTOR DEVICES INCLUDING THE SAME | April 2022 | March 2025 | Allow | 35 | 1 | 0 | Yes | No |
| 17658708 | Gate Resistance Reduction Through Low-Resistivity Conductive Layer | April 2022 | October 2023 | Allow | 18 | 1 | 0 | No | No |
| 17658636 | DISPLAY SUBSTRATE AND DISPLAY DEVICE | April 2022 | October 2023 | Allow | 19 | 1 | 0 | Yes | No |
| 17705416 | HIGH ELECTRON MOBILITY TRANSISTOR | March 2022 | June 2023 | Allow | 15 | 2 | 0 | No | No |
| 17698523 | SEMICONDUCTOR DEVICE WITH PROGRAMMABLE ELEMENT AND METHOD FOR FABRICATING THE SAME | March 2022 | January 2025 | Allow | 34 | 1 | 0 | No | No |
| 17689890 | Display Device and Method for Manufacturing the Same | March 2022 | June 2024 | Allow | 28 | 4 | 0 | Yes | No |
| 17684955 | EPITAXIALLY INTEGRATED PROTECTION DIODES FOR MONOCHROMATIC PHOTOSENSITIVE DIODES | March 2022 | November 2024 | Allow | 32 | 0 | 0 | No | No |
| 17638660 | Semiconductor Chip and Method for Producing a Semiconductor Chip | February 2022 | December 2024 | Allow | 33 | 1 | 0 | No | No |
| 17677335 | Quality Detection Method and Apparatus | February 2022 | April 2025 | Allow | 38 | 2 | 1 | Yes | No |
| 17673636 | TRANSISTOR WITH INTEGRATED PASSIVE COMPONENTS | February 2022 | July 2024 | Allow | 29 | 0 | 0 | Yes | No |
| 17671311 | PHOTOELECTRIC CONVERSION ELEMENT AND SOLID-STATE IMAGING DEVICE | February 2022 | June 2024 | Allow | 28 | 1 | 0 | No | No |
| 17669869 | DISPLAY DEVICE HAVING DECREASED PROBAILLITY OF SHORT CIRCUITS | February 2022 | May 2025 | Allow | 39 | 1 | 0 | No | No |
| 17668263 | CONDUCTIVE BRIDGING RANDOM ACCESS MEMORY FORMED USING SELECTIVE BARRIER METAL REMOVAL | February 2022 | February 2023 | Allow | 12 | 1 | 0 | No | No |
| 17633035 | METHOD OF PRINTING LASER MARK AND METHOD OF PRODUCING LASER-MARKED SILICON WAFER | February 2022 | June 2024 | Allow | 29 | 3 | 0 | Yes | No |
| 17591091 | LIGHT EMITTING DEVICE AND DISPLAY APPARATUS INCLUDING THE SAME | February 2022 | December 2024 | Allow | 34 | 1 | 0 | Yes | No |
| 17582800 | Optically Transparent Surface Gate for a Qubit Memory Cell | January 2022 | February 2025 | Allow | 37 | 2 | 0 | No | No |
| 17583098 | Simultaneous Dual-Band Image Sensors | January 2022 | May 2023 | Allow | 15 | 0 | 1 | No | No |
| 17577805 | INTERCONNECT STRUCTURE | January 2022 | February 2024 | Allow | 24 | 2 | 0 | No | No |
| 17571029 | INTERCONNECT STRUCTURE | January 2022 | January 2024 | Allow | 25 | 2 | 0 | Yes | No |
| 17562802 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | December 2021 | August 2023 | Allow | 20 | 1 | 0 | Yes | No |
| 17554552 | FORMATION METHOD OF CHIP PACKAGE WITH FAN-OUT FEATURE | December 2021 | November 2023 | Allow | 23 | 2 | 1 | Yes | No |
| 17643177 | METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE | December 2021 | February 2023 | Allow | 14 | 1 | 0 | No | No |
| 17643080 | BALLISTIC EXCITON TRANSISTOR | December 2021 | October 2024 | Allow | 34 | 0 | 1 | Yes | No |
| 17617114 | DOPED MIXED CATION PEROVSKITE MATERIALS AND DEVICES EXPLOITING SAME | December 2021 | February 2025 | Abandon | 38 | 1 | 0 | Yes | No |
| 17543004 | LIGHT SENSOR PIXEL AND METHOD OF MANUFACTURING THE SAME | December 2021 | November 2024 | Allow | 36 | 1 | 1 | No | No |
| 17457686 | METHOD TO RELEASE NANO SHEET AFTER NANO SHEET FIN RECESS | December 2021 | June 2025 | Allow | 43 | 0 | 1 | Yes | No |
| 17456091 | SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE MANUFACTURING METHOD | November 2021 | November 2024 | Allow | 36 | 1 | 1 | No | No |
| 17520854 | SEMICONDUCTOR CHIP INCLUDING CHIP PAD, REDISTRIBUTION WIRING TEST PAD, AND REDISTRIBUTION WIRING CONNECTION PAD | November 2021 | March 2023 | Allow | 16 | 1 | 1 | No | No |
| 17516920 | INTEGRATED CIRCUIT INCLUDING A CAPACITIVE STRUCTURE OF THE METAL-INSULATOR-METAL TYPE AND CORRESPONDING MANUFACTURING METHOD | November 2021 | February 2024 | Allow | 28 | 3 | 1 | No | No |
| 17452541 | SEMICONDUCTOR MEMORY AND FORMING METHOD THEREOF | October 2021 | April 2025 | Abandon | 41 | 2 | 1 | No | No |
| 17451456 | SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SAME | October 2021 | December 2024 | Allow | 38 | 1 | 1 | Yes | No |
| 17498839 | SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES | October 2021 | July 2023 | Allow | 21 | 1 | 0 | Yes | No |
| 17496360 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | October 2021 | October 2022 | Allow | 12 | 0 | 0 | Yes | No |
| 17601638 | IMAGING ELEMENT, STACKED IMAGING ELEMENT AND SOLID-STATE IMAGING DEVICE, AND METHOD OF MANUFACTURING IMAGING ELEMENT | October 2021 | July 2024 | Allow | 33 | 0 | 1 | No | No |
| 17483765 | FIELD EFFECT TRANSISTOR WITH SOURCE/DRAIN CONTACT ISOLATION STRUCTURE AND METHOD | September 2021 | February 2025 | Allow | 41 | 1 | 0 | No | No |
| 17476985 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | September 2021 | October 2023 | Allow | 25 | 0 | 1 | Yes | No |
| 17436818 | SEMICONDUCTOR TEMPLATE AND FABRICATION METHOD | September 2021 | September 2024 | Allow | 37 | 1 | 1 | No | No |
| 17466297 | SOLID-STATE IMAGE SENSOR | September 2021 | May 2024 | Allow | 32 | 3 | 1 | Yes | No |
| 17435293 | COLOR AND INFRARED IMAGE SENSOR | August 2021 | August 2022 | Allow | 11 | 0 | 0 | Yes | No |
| 17434867 | LIGHT EMITTING ELEMENT AND DISPLAY DEVICE USING SAME | August 2021 | April 2024 | Allow | 31 | 0 | 0 | Yes | No |
| 17461034 | SEMICONDUCTOR DEVICE | August 2021 | February 2023 | Allow | 18 | 1 | 1 | Yes | No |
| 17458564 | SEMICONDUCTOR SUBSTRATE AND METHOD OF MANUFACTURING THE SAME | August 2021 | October 2023 | Allow | 26 | 0 | 1 | No | No |
| 17445856 | GATE-TO-GATE ISOLATION FOR STACKED TRANSISTOR ARCHITECTURE VIA SELECTIVE DIELECTRIC DEPOSITION STRUCTURE | August 2021 | March 2025 | Allow | 43 | 1 | 1 | Yes | No |
| 17433458 | SEMICONDUCTOR DEVICE | August 2021 | July 2024 | Allow | 35 | 1 | 0 | No | No |
| 17408938 | SEMICONDUCTOR MEMORY DEVICE | August 2021 | February 2025 | Allow | 42 | 2 | 0 | Yes | No |
| 17409741 | SEMICONDUCTOR STORAGE DEVICE | August 2021 | October 2024 | Allow | 38 | 1 | 0 | Yes | No |
| 17409300 | Memory Arrays Comprising Strings Of Memory Cells And Methods Used In Forming A Memory Array Comprising Strings Of Memory Cells | August 2021 | October 2024 | Allow | 38 | 1 | 1 | Yes | No |
| 17406951 | DETECTION SUBSTRATE AND RAY DETECTOR | August 2021 | November 2023 | Allow | 27 | 1 | 1 | No | No |
| 17402756 | PIXEL ARRAY AND AN IMAGE SENSOR INCLUDING THE SAME | August 2021 | January 2025 | Allow | 41 | 2 | 0 | Yes | No |
| 17398493 | THREE-DIMENSIONAL IMAGE SENSOR BASED ON STRUCTURED LIGHT | August 2021 | July 2022 | Allow | 11 | 0 | 0 | Yes | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner PARK, SAMUEL.
With a 40.0% reversal rate, the PTAB reverses the examiner's rejections in a meaningful percentage of cases. This reversal rate is above the USPTO average, indicating that appeals have better success here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 40.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner PARK, SAMUEL works in Art Unit 2818 and has examined 495 patent applications in our dataset. With an allowance rate of 85.1%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 27 months.
Examiner PARK, SAMUEL's allowance rate of 85.1% places them in the 56% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by PARK, SAMUEL receive 1.81 office actions before reaching final disposition. This places the examiner in the 55% percentile for office actions issued. This examiner issues a slightly above-average number of office actions.
The median time to disposition (half-life) for applications examined by PARK, SAMUEL is 27 months. This places the examiner in the 57% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a +27.1% benefit to allowance rate for applications examined by PARK, SAMUEL. This interview benefit is in the 78% percentile among all examiners. Recommendation: Interviews are highly effective with this examiner and should be strongly considered as a prosecution strategy. Per MPEP § 713.10, interviews are available at any time before the Notice of Allowance is mailed or jurisdiction transfers to the PTAB.
When applicants file an RCE with this examiner, 31.9% of applications are subsequently allowed. This success rate is in the 59% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 23.7% of cases where such amendments are filed. This entry rate is in the 23% percentile among all examiners. Strategic Recommendation: This examiner rarely enters after-final amendments compared to other examiners. You should generally plan to file an RCE or appeal rather than relying on after-final amendment entry. Per MPEP § 714.12, primary examiners have discretion in entering after-final amendments, and this examiner exercises that discretion conservatively.
When applicants request a pre-appeal conference (PAC) with this examiner, 0.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 12% percentile among all examiners. Note: Pre-appeal conferences show limited success with this examiner compared to others. While still worth considering, be prepared to proceed with a full appeal brief if the PAC does not result in favorable action.
This examiner withdraws rejections or reopens prosecution in 58.3% of appeals filed. This is in the 27% percentile among all examiners. Of these withdrawals, 14.3% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.
When applicants file petitions regarding this examiner's actions, 20.0% are granted (fully or in part). This grant rate is in the 11% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 0.2% of allowed cases (in the 50% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).
Quayle Actions: This examiner issues Ex Parte Quayle actions in 1.4% of allowed cases (in the 61% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.