Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 19042789 | INTERPOSER FOR HIGH-DENSITY AND HIGH-CHANNEL COUNT NEURAL INTERFACE | January 2025 | February 2026 | Allow | 12 | 1 | 1 | No | No |
| 18761779 | SEMICONDUCTOR DEVICE INCLUDING TWO-DIMENSIONAL SEMICONDUCTOR MATERIAL | July 2024 | May 2025 | Allow | 10 | 0 | 1 | No | No |
| 18762567 | Power MOSFET with Gate-Source ESD Diode Structure | July 2024 | September 2025 | Allow | 14 | 1 | 1 | No | No |
| 18749580 | Power MOSFET with Gate-Source ESD Diode Structure | June 2024 | July 2025 | Allow | 13 | 2 | 1 | No | No |
| 18749576 | Manufacturing Method for a Power MOSFET with Gate-Source ESD Diode Structure | June 2024 | January 2025 | Allow | 7 | 1 | 1 | No | No |
| 18747341 | Power MOSFET with Gate-Source ESD Diode Structure | June 2024 | December 2024 | Allow | 6 | 1 | 1 | No | No |
| 18737890 | Power MOSFET with Gate-Source ESD Diode Structure | June 2024 | July 2025 | Allow | 13 | 3 | 1 | No | No |
| 18733052 | MICROELECTRONIC ASSEMBLIES | June 2024 | May 2025 | Allow | 12 | 1 | 1 | No | No |
| 18733821 | Power MOSFET with Gate-Source ESD Diode Structure | June 2024 | January 2025 | Allow | 8 | 1 | 1 | No | No |
| 18733823 | Power MOSFET with Gate-Source ESD Diode Structure | June 2024 | June 2025 | Allow | 13 | 1 | 1 | No | No |
| 18675293 | SEMICONDUCTOR DEVICE AND DISPLAY DEVICE INCLUDING THE SAME | May 2024 | October 2025 | Allow | 17 | 1 | 1 | No | No |
| 18670709 | Power MOSFET with Gate-Source ESD Diode Structure | May 2024 | March 2025 | Allow | 10 | 1 | 0 | Yes | No |
| 18658794 | SEMICONDUCTOR DEVICE INCLUDING BARRIER LAYER BETWEEN ACTIVE REGION AND SEMICONDUCTOR LAYER AND METHOD OF FORMING THE SAME | May 2024 | June 2025 | Allow | 13 | 1 | 1 | Yes | No |
| 18645895 | CRYSTAL EFFICIENT SIC DEVICE WAFER PRODUCTION | April 2024 | April 2025 | Allow | 12 | 1 | 1 | No | No |
| 18639993 | TRANSISTOR WITH LOW LEAKAGE CURRENTS AND MANUFACTURING METHOD THEREOF | April 2024 | December 2025 | Allow | 20 | 2 | 1 | Yes | No |
| 18631243 | SEMICONDUCTOR DEVICE AND SEMICONDUCTOR CIRCUIT | April 2024 | April 2025 | Allow | 12 | 0 | 1 | Yes | No |
| 18611718 | METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE | March 2024 | February 2025 | Allow | 11 | 1 | 0 | No | No |
| 18606779 | Light-Emitting Element, Light-Emitting Device, Display Device, Electronic Appliance, And Lighting Device | March 2024 | June 2025 | Allow | 15 | 1 | 1 | No | No |
| 18600228 | LIGHT EMITTING DEVICE FOR DISPLAY AND DISPLAY APPARATUS HAVING THE SAME | March 2024 | July 2025 | Allow | 16 | 1 | 1 | No | No |
| 18594792 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | March 2024 | October 2025 | Allow | 19 | 2 | 1 | Yes | No |
| 18581466 | ACTUATOR DEVICE | February 2024 | January 2025 | Allow | 11 | 1 | 1 | No | No |
| 18419382 | ANISOTROPIC CONDUCTIVE FILM WITH CARBON-BASED CONDUCTIVE REGIONS HAVING VOID SPACE AND RELATED SEMICONDUCTOR DEVICE ASSEMBLIES AND METHODS | January 2024 | March 2025 | Allow | 14 | 1 | 1 | No | No |
| 18416776 | Power MOSFET with Gate-Source ESD Diode Structure | January 2024 | October 2024 | Allow | 9 | 1 | 1 | Yes | No |
| 18398686 | SILICON CARBIDE MOSFET DEVICE AND MANUFACTURING METHOD THEREOF | December 2023 | January 2025 | Allow | 13 | 1 | 1 | No | No |
| 18531497 | FORMING A SACRIFICIAL LINER FOR DUAL CHANNEL DEVICES | December 2023 | October 2025 | Allow | 22 | 1 | 1 | No | No |
| 18526315 | SEMICONDUCTOR DEVICE | December 2023 | March 2025 | Allow | 15 | 1 | 1 | No | No |
| 18522925 | SUPER JUNCTION SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | November 2023 | November 2025 | Abandon | 24 | 2 | 0 | No | No |
| 18505684 | SEMICONDUCTOR DEVICE | November 2023 | December 2024 | Allow | 13 | 0 | 1 | No | No |
| 18472704 | SEMICONDUCTOR DEVICE | September 2023 | October 2025 | Allow | 24 | 1 | 2 | No | No |
| 18370586 | HIGH ASPECT RATIO SOURCE OR DRAIN STRUCTURES WITH ABRUPT DOPANT PROFILE | September 2023 | January 2025 | Allow | 16 | 1 | 1 | No | No |
| 18464141 | 4H-SIC ELECTRONIC DEVICE WITH IMPROVED SHORT-CIRCUIT PERFORMANCES, AND MANUFACTURING METHOD THEREOF | September 2023 | March 2025 | Allow | 18 | 1 | 1 | No | No |
| 18460481 | DEVICE PACKAGES INCLUDING REDISTRIBUTION LAYERS WITH CARBON-BASED CONDUCTIVE ELEMENTS, AND METHODS OF FABRICATION | September 2023 | December 2024 | Allow | 16 | 1 | 1 | No | No |
| 18239720 | SEMICONDUCTOR MEMORY DEVICE | August 2023 | December 2024 | Allow | 15 | 1 | 1 | No | No |
| 18447871 | Semiconductor Device Having Backside Interconnect Structure on Through Substrate Via | August 2023 | February 2025 | Allow | 18 | 1 | 1 | Yes | No |
| 18232159 | Channel Structures For Semiconductor Devices | August 2023 | March 2025 | Allow | 19 | 2 | 0 | Yes | No |
| 18366352 | Interconnect Features With Sharp Corners and Method Forming Same | August 2023 | December 2024 | Allow | 16 | 1 | 1 | No | No |
| 18365420 | SEMICONDUCTOR DEVICE AND METHOD | August 2023 | September 2025 | Allow | 25 | 2 | 1 | Yes | No |
| 18360212 | IMAGE SENSOR | July 2023 | January 2025 | Allow | 17 | 1 | 1 | No | No |
| 18354323 | Semiconductor Structure with Backside Via Contact and a Protection Liner Layer | July 2023 | November 2024 | Allow | 16 | 1 | 1 | No | No |
| 18216984 | MID-PROCESSING REMOVAL OF SEMICONDUCTOR FINS DURING FABRICATION OF INTEGRATED CIRCUIT STRUCTURES | June 2023 | November 2024 | Allow | 17 | 1 | 1 | No | No |
| 18341498 | Low Warpage High Density Trench Capacitor | June 2023 | November 2024 | Allow | 17 | 2 | 1 | No | No |
| 18338509 | SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD OF THE SAME | June 2023 | December 2024 | Allow | 18 | 1 | 1 | No | No |
| 18333979 | SUPER JUNCTION POWER DEVICE | June 2023 | October 2024 | Allow | 16 | 1 | 1 | No | No |
| 18206831 | Gate Capping Structures In Semiconductor Devices | June 2023 | May 2025 | Allow | 24 | 0 | 1 | Yes | No |
| 18197600 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | May 2023 | October 2024 | Allow | 17 | 0 | 1 | No | No |
| 18310538 | DISPLAY DEVICE AND DISPLAY APPARATUS | May 2023 | December 2025 | Allow | 31 | 1 | 0 | No | No |
| 18309013 | HETEROSTRUCTURE OXIDE SEMICONDUCTOR VERTICAL GATE-ALL-AROUND (VGAA) TRANSISTOR AND METHODS FOR MAKING THE SAME | April 2023 | October 2024 | Allow | 18 | 0 | 1 | No | No |
| 18307279 | SEMICONDUCTOR DEVICES AND METHOD OF FABRICATING THE SAME | April 2023 | May 2024 | Allow | 13 | 0 | 1 | No | No |
| 18300180 | SEMICONDUCTOR DEVICE | April 2023 | November 2025 | Allow | 31 | 0 | 1 | No | No |
| 18295246 | FIELD EFFECT TRANSISTOR AND METHOD | April 2023 | October 2024 | Allow | 18 | 1 | 1 | Yes | No |
| 18295248 | FIELD EFFECT TRANSISTOR AND METHOD | April 2023 | November 2024 | Allow | 19 | 1 | 1 | No | No |
| 18124842 | WIDE BAND GAP SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD | March 2023 | February 2026 | Allow | 35 | 1 | 1 | No | No |
| 18187171 | BACKSIDE ILLUMINATED IMAGE SENSOR AND MANUFACTURING METHOD THEREOF | March 2023 | February 2026 | Allow | 35 | 1 | 1 | Yes | No |
| 18122245 | DISPLAY DEVICE | March 2023 | October 2025 | Allow | 31 | 1 | 0 | Yes | No |
| 18172830 | SiC SEMICONDUCTOR DEVICE | February 2023 | September 2024 | Allow | 19 | 1 | 0 | No | No |
| 18170938 | SILICON CARBIDE SEMICONDUCTOR DEVICE | February 2023 | August 2024 | Allow | 18 | 1 | 1 | No | No |
| 18165300 | Organic Light Emitting Diode Display Device and Manufacturing Method Thereof | February 2023 | November 2025 | Allow | 33 | 1 | 0 | No | No |
| 18157975 | METHOD, CONTROL SYSTEM, AND SYSTEM FOR MACHINING A SEMICONDUCTOR WAFER, AND SEMICONDUCTOR WAFER | January 2023 | March 2025 | Allow | 25 | 2 | 0 | No | No |
| 18155890 | STRUCTURE FOR GALVANIC ISOLATION USING DIELECTRIC-FILLED TRENCH IN SUBSTRATE BELOW ELECTRODE | January 2023 | November 2025 | Allow | 34 | 1 | 0 | No | No |
| 18097073 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES AND SEMICONDUCTOR DEVICES | January 2023 | August 2024 | Allow | 19 | 1 | 1 | No | No |
| 18152708 | LIGHT EMITTING DEVICE | January 2023 | July 2024 | Allow | 18 | 1 | 1 | No | No |
| 18088550 | SEMICONDUCTOR DEVICES | December 2022 | October 2024 | Allow | 21 | 1 | 1 | No | No |
| 18078383 | Semiconductor Package | December 2022 | March 2025 | Abandon | 27 | 1 | 1 | No | No |
| 18077168 | SEMICONDUCTOR DEVICE | December 2022 | May 2024 | Allow | 17 | 1 | 1 | No | No |
| 18076774 | SEMICONDUCTOR DEVICE INCLUDING CURRENT SPREAD REGION | December 2022 | August 2024 | Allow | 20 | 1 | 1 | Yes | No |
| 18075247 | DISPLAY DEVICE HAVING LIGHT EMITTING STACKED STRUCTURE | December 2022 | December 2024 | Allow | 24 | 1 | 1 | No | No |
| 18072285 | SILICON CARBIDE SEMICONDUCTOR DEVICE | November 2022 | March 2026 | Allow | 39 | 1 | 1 | Yes | No |
| 17987135 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | November 2022 | November 2024 | Allow | 24 | 0 | 1 | No | No |
| 18055565 | SEMICONDUCTOR DEVICE INCLUDING TWO-DIMENSIONAL SEMICONDUCTOR MATERIAL | November 2022 | March 2024 | Allow | 16 | 0 | 1 | No | No |
| 17924846 | HYBRID MICRODISPLAY | November 2022 | December 2025 | Allow | 37 | 1 | 1 | Yes | No |
| 17981504 | SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF | November 2022 | January 2026 | Allow | 38 | 1 | 1 | No | No |
| 17978175 | SILICON CARBIDE SEMICONDUCTOR DEVICE | October 2022 | March 2026 | Allow | 40 | 1 | 1 | Yes | No |
| 17976438 | IMAGE PICKUP DEVICE AND ELECTRONIC APPARATUS | October 2022 | July 2024 | Allow | 21 | 1 | 1 | No | No |
| 17970928 | INVERSION CHANNEL DEVICES ON MULTIPLE CRYSTAL ORIENTATIONS | October 2022 | March 2024 | Allow | 17 | 1 | 1 | No | No |
| 17937593 | MICROELECTRONIC ASSEMBLIES | October 2022 | February 2024 | Allow | 17 | 1 | 1 | Yes | No |
| 17955625 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | September 2022 | January 2026 | Allow | 40 | 1 | 1 | Yes | No |
| 17954606 | FinFET with discontinuous channel regions | September 2022 | June 2025 | Allow | 32 | 1 | 1 | No | No |
| 17948670 | SYSTEMS AND METHODS FOR PILLAR EXTENSION IN TERMINATION AREAS OF WIDE BAND GAP SUPER-JUNCTION POWER DEVICES | September 2022 | December 2025 | Allow | 39 | 1 | 1 | Yes | No |
| 17945530 | SILICON CARBIDE POWER DEVICE WITH INTEGRATED RESISTANCE AND CORRESPONDING MANUFACTURING PROCESS | September 2022 | November 2025 | Allow | 38 | 1 | 1 | No | No |
| 17908715 | IMAGING ELEMENT AND SEMICONDUCTOR CHIP | September 2022 | December 2025 | Allow | 40 | 1 | 1 | No | No |
| 17897378 | BACKSIDE POWER RAIL TO DEEP VIAS | August 2022 | January 2026 | Allow | 40 | 1 | 1 | Yes | No |
| 17883585 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES AND SEMICONDUCTOR DEVICE | August 2022 | July 2024 | Allow | 24 | 1 | 1 | No | No |
| 17817789 | NITRIDE SEMICONDUCTOR AND SEMICONDUCTOR DEVICE | August 2022 | July 2025 | Allow | 35 | 1 | 1 | No | No |
| 17881519 | Graphics Processing Unit and High Bandwidth Memory Integration Using Integrated Interface and Silicon Interposer | August 2022 | August 2024 | Allow | 24 | 1 | 0 | No | No |
| 17878714 | AUTOMATED WATER HEATER FLUSHING AND MONITORING SYSTEM | August 2022 | July 2024 | Allow | 23 | 1 | 0 | No | No |
| 17815999 | Source/Drain Isolation Structures For Leakage Prevention | July 2022 | May 2024 | Allow | 22 | 1 | 1 | Yes | No |
| 17875277 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES AND SEMICONDUCTOR DEVICES | July 2022 | June 2024 | Allow | 23 | 1 | 1 | Yes | No |
| 17875138 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | July 2022 | May 2024 | Allow | 21 | 0 | 1 | No | No |
| 17814607 | Fin Field-Effect Transistor Device and Method of Forming | July 2022 | June 2024 | Allow | 23 | 1 | 1 | No | No |
| 17871928 | SEMICONDUCTOR DEVICES AND METHODS OF FABRICATION THEREOF | July 2022 | July 2025 | Allow | 36 | 1 | 0 | No | No |
| 17871464 | CHANNEL MOBILITY IMPROVEMENT | July 2022 | July 2024 | Allow | 23 | 1 | 0 | No | No |
| 17870775 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | July 2022 | August 2025 | Allow | 37 | 1 | 1 | No | No |
| 17864761 | INVERSION CHANNEL DEVICES ON MULTIPLE CRYSTAL ORIENTATIONS | July 2022 | June 2023 | Abandon | 11 | 1 | 1 | Yes | No |
| 17812694 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | July 2022 | April 2025 | Allow | 33 | 1 | 0 | Yes | No |
| 17861432 | SEMICONDUCTOR DEVICE | July 2022 | November 2023 | Allow | 16 | 0 | 1 | No | No |
| 17860731 | DISPLAY DEVICE | July 2022 | September 2025 | Allow | 38 | 1 | 1 | Yes | No |
| 17859790 | SEMICONDUCTOR DEVICE | July 2022 | July 2025 | Allow | 37 | 1 | 1 | No | No |
| 17758339 | METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR DEVICE, AND MANUFACTURING METHOD THEREFOR | July 2022 | August 2025 | Abandon | 38 | 1 | 0 | No | No |
| 17809976 | VARIABLE SIZE FIN STRUCTURES | June 2022 | May 2024 | Allow | 22 | 1 | 0 | Yes | No |
| 17846616 | MULTI-COLOR PHOSPHOR CONVERTED LED PACKAGE WITH SINGLE CAVITY | June 2022 | April 2024 | Allow | 22 | 1 | 1 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner NGUYEN, CUONG B.
With a 33.3% reversal rate, the PTAB reverses the examiner's rejections in a meaningful percentage of cases. This reversal rate is above the USPTO average, indicating that appeals have better success here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 47.6% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner NGUYEN, CUONG B works in Art Unit 2818 and has examined 904 patent applications in our dataset. With an allowance rate of 86.9%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 23 months.
Examiner NGUYEN, CUONG B's allowance rate of 86.9% places them in the 65% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by NGUYEN, CUONG B receive 1.65 office actions before reaching final disposition. This places the examiner in the 33% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by NGUYEN, CUONG B is 23 months. This places the examiner in the 86% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +19.0% benefit to allowance rate for applications examined by NGUYEN, CUONG B. This interview benefit is in the 62% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.
When applicants file an RCE with this examiner, 32.3% of applications are subsequently allowed. This success rate is in the 68% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 30.3% of cases where such amendments are filed. This entry rate is in the 44% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.
When applicants request a pre-appeal conference (PAC) with this examiner, 76.9% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 61% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 65.4% of appeals filed. This is in the 46% percentile among all examiners. Of these withdrawals, 35.3% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.
When applicants file petitions regarding this examiner's actions, 34.9% are granted (fully or in part). This grant rate is in the 22% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 0.6% of allowed cases (in the 61% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).
Quayle Actions: This examiner issues Ex Parte Quayle actions in 15.0% of allowed cases (in the 92% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.