Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18412747 | 3D VIRTUAL GROUND MEMORY AND MANUFACTURING METHODS FOR SAME | January 2024 | August 2025 | Allow | 19 | 1 | 0 | No | No |
| 18367056 | SEMICONDUCTOR DEVICE WITH CONTACTS HAVING DIFFERENT DIMENSIONS AND METHOD FOR FABRICATING THE SAME | September 2023 | March 2026 | Abandon | 30 | 4 | 0 | No | No |
| 18126814 | DISPLAY DEVICE WITH ION TRAPPING ELECTRODES | March 2023 | December 2025 | Allow | 33 | 0 | 0 | No | No |
| 18076382 | SEMICONDUCTOR DEVICE PACKAGE WITH CONDUCTIVE PILLARS AND REINFORCING AND ENCAPSULATING LAYERS | December 2022 | December 2024 | Allow | 24 | 1 | 1 | No | No |
| 18049828 | METHOD FOR MANUFACTURING A DISTRIBUTED BRAGG REFLECTOR FOR 1550 NM VERTICAL-CAVITY SURFACE-EMITTING LASER | October 2022 | November 2025 | Allow | 37 | 1 | 1 | No | No |
| 17760078 | PART INCLUDING SILICON CARBIDE LAYER AND MANUFACTURING METHOD THEREOF | August 2022 | August 2025 | Allow | 37 | 1 | 0 | No | No |
| 17845119 | METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE INCLUDING PERFORMING THERMAL TREATMENT ON SUBSTRATE AND SEMICONDUCTOR DEVICE | June 2022 | February 2024 | Allow | 20 | 2 | 0 | No | No |
| 17717143 | LIGHT EMITTING MODULE AND DISPLAY DEVICE | April 2022 | June 2025 | Abandon | 39 | 1 | 0 | No | No |
| 17682466 | THREE-DIMENSIONAL MEMORY DEVICE WITH MULTILEVEL DRAIN-SELECT ELECTRODES AND METHODS FOR FORMING THE SAME | February 2022 | August 2025 | Allow | 42 | 1 | 1 | No | No |
| 17597926 | STORAGE UNIT AND METHOD OF MANUFACUTRING THE SAME AND THREE-DIMENSIONAL MEMORY | January 2022 | July 2024 | Allow | 29 | 2 | 0 | No | No |
| 17649165 | METHOD FOR FUSING AND FILLING SEMICONDUCTOR STRUCTURE, AND SEMICONDUCTOR STRUCTURE | January 2022 | April 2025 | Abandon | 39 | 1 | 1 | No | No |
| 17574271 | METHOD FOR MANUFACTURING POWER SEMICONDUCTOR DEVICE | January 2022 | October 2025 | Abandon | 45 | 4 | 0 | No | No |
| 17554888 | Display Device Having a Separation Structure to Disconnect a Light Emitting Layer | December 2021 | October 2024 | Allow | 33 | 4 | 0 | Yes | No |
| 17548728 | CONDUCTIVE CONTACT STRUCTURES FOR ELECTROSTATIC DISCHARGE PROTECTION IN INTEGRATED CIRCUITS | December 2021 | July 2025 | Abandon | 43 | 2 | 1 | No | No |
| 17546971 | Light Emitting Display Device with a Reduced Coupling Capacitance between the Conductive Wiring Lines | December 2021 | March 2023 | Allow | 15 | 0 | 0 | No | No |
| 17541603 | LATERAL BIPOLAR JUNCTION TRANSISTORS CONTAINING A TWO-DIMENSIONAL MATERIAL | December 2021 | February 2026 | Abandon | 50 | 6 | 1 | Yes | No |
| 17518919 | IMAGE SENSOR INCLUDING A REGION SEPARATION PATTERN | November 2021 | March 2026 | Allow | 52 | 6 | 1 | Yes | No |
| 17607813 | DISPLAY SUBSTRATES AND MANUFACTURING METHODS THEREOF, AND DISPLAY DEVICES | October 2021 | September 2025 | Allow | 46 | 2 | 0 | No | No |
| 17504391 | ELECTRIC FIELD MANAGEMENT IN SEMICONDUCTOR DEVICES | October 2021 | August 2024 | Allow | 34 | 1 | 1 | No | No |
| 17500313 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | October 2021 | January 2024 | Abandon | 27 | 0 | 1 | No | No |
| 17474929 | SEMICONDUCTOR MANUFACTURING METHOD AND SEMICONDUCTOR MANUFACTURING APPARATUS | September 2021 | June 2024 | Abandon | 33 | 2 | 1 | No | No |
| 17470826 | 3D MEMORY DEVICE WITH MODULATED DOPED CHANNEL | September 2021 | March 2024 | Allow | 30 | 2 | 1 | No | No |
| 17462309 | SEMICONDUCTOR DEVICE WITH CONTACTS HAVING DIFFERENT DIMENSIONS AND METHOD FOR FABRICATING THE SAME | August 2021 | March 2025 | Abandon | 43 | 3 | 1 | No | No |
| 17407566 | Semiconductor Device with Varying Gate Dimensions and Methods of Forming the Same | August 2021 | May 2024 | Allow | 33 | 1 | 1 | No | No |
| 17400510 | NITRIDE SEMICONDUCTOR, WAFER, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING THE NITRIDE SEMICONDUCTOR | August 2021 | October 2025 | Abandon | 50 | 3 | 1 | Yes | No |
| 17384837 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | July 2021 | June 2024 | Allow | 34 | 2 | 0 | No | No |
| 17443138 | METHOD OF MAKING AN INDIVIDUALIZATION ZONE OF AN INTEGRATED CIRCUIT | July 2021 | May 2024 | Allow | 34 | 1 | 1 | Yes | No |
| 17380422 | Semiconductor Devices with Air Gaps and the Method Thereof | July 2021 | February 2025 | Allow | 43 | 2 | 1 | Yes | No |
| 17370012 | IMAGING DEVICE | July 2021 | August 2025 | Allow | 49 | 3 | 1 | Yes | No |
| 17370982 | INTERMEDIATE CONNECTION MEMBER, METHOD FOR MANUFACTURING INTERMEDIATE CONNECTION MEMBER, ELECTRONIC MODULE, METHOD FOR MANUFACTURING ELECTRONIC MODULE, AND ELECTRONIC EQUIPMENT | July 2021 | September 2024 | Allow | 39 | 1 | 1 | No | No |
| 17360447 | IMAGE SENSOR | June 2021 | July 2024 | Allow | 37 | 2 | 1 | Yes | No |
| 17358165 | SEMICONDUCTOR MEMORY STRUCTURE AND METHOD FOR FORMING THE SAME | June 2021 | February 2025 | Allow | 43 | 3 | 1 | No | No |
| 17418117 | SEMICONDUCTOR STRUCTURE FOR DIGITAL AND RADIOFREQUENCY APPLICATIONS, AND METHOD FOR MANUFACTURING SUCH A STRUCTURE | June 2021 | June 2025 | Allow | 48 | 2 | 0 | No | No |
| 17416948 | SUBSTRATE OF THE SEMI-CONDUCTOR-ON-INSULATOR TYPE FOR RADIOFREQUENCY APPLICATIONS | June 2021 | March 2024 | Abandon | 33 | 2 | 0 | No | No |
| 17413486 | DISPLAY DEVICE | June 2021 | July 2024 | Abandon | 37 | 4 | 0 | Yes | No |
| 17332571 | OVERLAY ALIGNMENT MARK, METHOD FOR MEASURING OVERLAY ERROR, AND METHOD FOR OVERLAY ALIGNMENT | May 2021 | May 2025 | Abandon | 48 | 3 | 1 | No | No |
| 17297423 | MANUFACTURING A CORROSION TOLERANT MICRO-ELECTROMECHANICAL FLUID EJECTION DEVICE | May 2021 | January 2024 | Abandon | 32 | 1 | 0 | No | No |
| 17322599 | IMAGE SENSOR STRUCTURE INCLUDING NANOWIRE STRUCTURE AND MANUFACTURING METHOD THEREOF | May 2021 | October 2024 | Allow | 41 | 4 | 1 | No | No |
| 17241321 | THREE-DIMENSIONAL MEMORY DEVICE WITH A CONDUCTIVE DRAIN-SELECT-LEVEL SPACER AND METHODS FOR FORMING THE SAME | April 2021 | April 2024 | Allow | 36 | 2 | 1 | No | No |
| 17288121 | DISPLAY PANEL, METHOD FOR MANUFACTURING THE SAME AND DISPLAY DEVICE | April 2021 | August 2024 | Allow | 40 | 2 | 0 | No | No |
| 17237178 | GROUP III NITRIDE DEVICE AND METHOD OF FABRICATING A GROUP III NITRIDE-BASED DEVICE | April 2021 | May 2024 | Allow | 37 | 2 | 1 | No | No |
| 17230114 | 3D VIRTUAL GROUND MEMORY AND MANUFACTURING METHODS FOR SAME | April 2021 | November 2023 | Allow | 31 | 1 | 1 | Yes | No |
| 17225553 | LIGHT EMITTING AREA INCLUDING DIFFRACTIVE PATTERN AND DISPLAY DEVICE HAVING THE SAME | April 2021 | November 2024 | Allow | 44 | 3 | 1 | No | No |
| 17283625 | EPITAXIAL GROWTH USING CARBON BUFFER ON SUBSTRATE | April 2021 | February 2025 | Allow | 46 | 4 | 0 | Yes | No |
| 17224284 | METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE | April 2021 | June 2025 | Abandon | 50 | 5 | 0 | No | No |
| 17210861 | SEMICONDUCTOR DEVICES, NONVOLATILE MEMORY DEVICES INCLUDING THE SAME, ELECTRONIC SYSTEMS INCLUDING THE SAME, AND METHODS FOR FABRICATING THE SAME | March 2021 | February 2024 | Allow | 34 | 1 | 1 | Yes | No |
| 17206527 | STRUCTURE AND METHOD FOR MRAM DEVICES | March 2021 | January 2024 | Allow | 34 | 2 | 1 | No | No |
| 17276117 | ORGANIC LIGHT EMITTING DISPLAY DEVICE | March 2021 | September 2025 | Allow | 54 | 3 | 0 | No | No |
| 17188423 | SEMICONDUCTOR STORAGE DEVICE WITH INSULATING LAYERS FOR ETCHING STOP | March 2021 | September 2023 | Allow | 31 | 1 | 1 | No | No |
| 17250664 | SEMICONDUCTOR DEVICE | February 2021 | May 2024 | Abandon | 39 | 3 | 1 | No | No |
| 17264318 | OPTOELECTRONIC SEMICONDUCTOR CHIP AND OPTOELECTRONIC SEMICONDUCTOR COMPONENT | January 2021 | May 2024 | Abandon | 39 | 1 | 0 | No | No |
| 17263886 | DISPLAY PANEL AND MANUFACTURING METHOD THEREOF | January 2021 | November 2024 | Abandon | 45 | 2 | 0 | No | No |
| 17152288 | IMAGE SENSOR | January 2021 | February 2025 | Allow | 49 | 4 | 0 | No | No |
| 17254358 | FLEXIBLE DISPLAY | December 2020 | July 2025 | Abandon | 55 | 4 | 1 | No | No |
No appeal data available for this record. This may indicate that no appeals have been filed or decided for applications in this dataset.
Examiner HRNJIC, ADIN works in Art Unit 2817 and has examined 42 patent applications in our dataset. With an allowance rate of 64.3%, this examiner allows applications at a lower rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 39 months.
Examiner HRNJIC, ADIN's allowance rate of 64.3% places them in the 25% percentile among all USPTO examiners. This examiner is less likely to allow applications than most examiners at the USPTO.
On average, applications examined by HRNJIC, ADIN receive 2.43 office actions before reaching final disposition. This places the examiner in the 70% percentile for office actions issued. This examiner issues a slightly above-average number of office actions.
The median time to disposition (half-life) for applications examined by HRNJIC, ADIN is 39 months. This places the examiner in the 27% percentile for prosecution speed. Prosecution timelines are slightly slower than average with this examiner.
Conducting an examiner interview provides a +15.0% benefit to allowance rate for applications examined by HRNJIC, ADIN. This interview benefit is in the 54% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.
When applicants file an RCE with this examiner, 20.8% of applications are subsequently allowed. This success rate is in the 23% percentile among all examiners. Strategic Insight: RCEs show lower effectiveness with this examiner compared to others. Consider whether a continuation application might be more strategic, especially if you need to add new matter or significantly broaden claims.
This examiner enters after-final amendments leading to allowance in 39.1% of cases where such amendments are filed. This entry rate is in the 60% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 24% percentile). This examiner rarely makes examiner's amendments compared to other examiners. You should expect to make all necessary claim amendments yourself through formal amendment practice.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 7.4% of allowed cases (in the 85% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.