Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 19012337 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | January 2025 | September 2025 | Allow | 8 | 2 | 1 | No | No |
| 18848769 | SEMICONDUCTOR DEVICE | September 2024 | September 2025 | Allow | 12 | 2 | 1 | Yes | No |
| 18656631 | SEMICONDUCTOR POWER DEVICE AND METHOD FOR MANUFACTURING THE SAME | May 2024 | November 2025 | Allow | 19 | 2 | 1 | No | No |
| 18632253 | Fabricating Method of Semiconductor Device | April 2024 | July 2025 | Allow | 16 | 2 | 0 | No | No |
| 18626472 | METHOD AND APPARATUS FOR MANUFACTURING A SEMICONDUCTOR LAYER AND SUBSTRATE PROVIDED THEREWITH | April 2024 | May 2025 | Allow | 13 | 1 | 0 | Yes | No |
| 18604713 | SEMICONDUCTOR DEVICE | March 2024 | June 2025 | Abandon | 15 | 1 | 0 | No | No |
| 18581606 | SEMICONDUCTOR DEVICE | February 2024 | October 2025 | Abandon | 20 | 2 | 0 | No | No |
| 18513942 | ROUGH BUFFER LAYER FOR GROUP III-V DEVICES ON SILICON | November 2023 | May 2025 | Allow | 18 | 1 | 1 | Yes | No |
| 18494122 | METHOD FOR MANUFACTURING GROUP III NITRIDE SEMICONDUCTOR SUBSTRATE | October 2023 | February 2026 | Allow | 28 | 2 | 2 | Yes | No |
| 18376994 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | October 2023 | January 2025 | Abandon | 15 | 1 | 1 | No | No |
| 18376024 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | October 2023 | September 2025 | Abandon | 24 | 1 | 1 | No | No |
| 18478465 | MONOLITHIC COMPONENT COMPRISING A GALLIUM NITRIDE POWER TRANSISTOR | September 2023 | July 2025 | Allow | 22 | 2 | 1 | Yes | No |
| 18471263 | INTEGRATED DESIGN FOR III-NITRIDE DEVICES | September 2023 | January 2025 | Allow | 16 | 2 | 1 | Yes | No |
| 18367508 | TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME | September 2023 | December 2025 | Allow | 27 | 4 | 0 | No | No |
| 18450161 | GROUP III NITRIDE SINGLE CRYSTAL SUBSTRATE | August 2023 | October 2025 | Abandon | 26 | 3 | 0 | Yes | No |
| 18215059 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | June 2023 | September 2024 | Allow | 15 | 1 | 1 | Yes | No |
| 18331263 | NITRIDE SEMICONDUCTOR LIGHT-EMITTING ELEMENT | June 2023 | January 2026 | Allow | 32 | 0 | 0 | No | No |
| 18265434 | METHOD OF MANUFACTURING SEMICONDUCTOR SUBSTRATE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | June 2023 | February 2026 | Allow | 32 | 0 | 1 | No | No |
| 18204993 | SEMICONDUCTOR DEVICE | June 2023 | September 2025 | Abandon | 27 | 3 | 0 | No | No |
| 18038193 | SEMICONDUCTOR SUBSTRATE, AND MANUFACTURING METHOD AND MANUFACTURING APPARATUS OF SEMICONDUCTOR SUBSTRATE | May 2023 | July 2025 | Allow | 25 | 3 | 1 | Yes | No |
| 18295879 | NITRIDE CRYSTAL, OPTICAL DEVICE, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING NITRIDE CRYSTAL | April 2023 | May 2024 | Allow | 14 | 1 | 1 | Yes | No |
| 18028221 | Thin Film Transistor and Preparation Method thereof, Display Substrate and Display Apparatus | March 2023 | February 2026 | Allow | 35 | 1 | 1 | No | No |
| 18117243 | NITRIDE SEMICONDUCTOR DEVICE | March 2023 | July 2024 | Allow | 16 | 1 | 1 | Yes | No |
| 18176463 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | February 2023 | April 2024 | Allow | 13 | 1 | 1 | Yes | No |
| 18098019 | Elevationally-Extending String of Memory Cells and Methods of Forming an Elevationally-Extending String of Memory Cells | January 2023 | November 2024 | Allow | 22 | 2 | 1 | Yes | No |
| 18149267 | Source and Drain Structure with Reduced Contact Resistance and Enhanced Mobility | January 2023 | April 2025 | Allow | 27 | 3 | 0 | Yes | No |
| 18146528 | SEMICONDUCTOR DEVICE | December 2022 | March 2026 | Abandon | 38 | 2 | 0 | Yes | No |
| 18072712 | DISPLAY DEVICE | December 2022 | November 2024 | Allow | 23 | 2 | 0 | No | No |
| 17976689 | ITERATIVE METHOD OF MULTILAYER STACK DEVELOPMENT FOR DEVICE APPLICATIONS | October 2022 | March 2024 | Allow | 17 | 3 | 1 | Yes | No |
| 17959896 | NITRIDE SEMICONDUCTOR COMPONENT AND PROCESS FOR ITS PRODUCTION | October 2022 | September 2025 | Abandon | 36 | 4 | 1 | Yes | No |
| 17959921 | NITRIDE SEMICONDUCTOR COMPONENT AND PROCESS FOR ITS PRODUCTION | October 2022 | April 2025 | Allow | 30 | 4 | 1 | Yes | No |
| 17959875 | NITRIDE SEMICONDUCTOR COMPONENT AND PROCESS FOR ITS PRODUCTION | October 2022 | March 2025 | Allow | 29 | 4 | 1 | Yes | No |
| 17959910 | NITRIDE SEMICONDUCTOR COMPONENT AND PROCESS FOR ITS PRODUCTION | October 2022 | January 2025 | Allow | 27 | 3 | 0 | Yes | No |
| 17941148 | LIGHT-EMITTING DEVICE AND MANUFACTURING METHOD THEREOF | September 2022 | January 2024 | Allow | 16 | 2 | 0 | No | No |
| 17902209 | WIDE-GAP SEMICONDUCTOR SUBSTRATE, APPARATUS FOR MANUFACTURING WIDE-GAP SEMICONDUCTOR SUBSTRATE, AND METHOD FOR MANUFACTURING WIDE-GAP SEMICONDUCTOR SUBSTRATE | September 2022 | March 2026 | Abandon | 42 | 2 | 1 | No | No |
| 17870475 | SEMICONDUCTOR LIGHT EMITTING DEVICES AND METHOD OF MANUFACTURING THE SAME | July 2022 | August 2023 | Allow | 12 | 1 | 0 | No | No |
| 17868980 | SOURCE LEAKAGE CURRENT SUPPRESSION BY SOURCE SURROUNDING GATE STRUCTURE | July 2022 | December 2024 | Allow | 29 | 3 | 1 | Yes | No |
| 17867877 | ROUGH BUFFER LAYER FOR GROUP III-V DEVICES ON SILICON | July 2022 | September 2023 | Allow | 14 | 1 | 1 | Yes | No |
| 17836004 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | June 2022 | March 2024 | Abandon | 22 | 2 | 0 | No | No |
| 17767510 | PACKAGE STRUCTURE AND ELECTRONIC APPARATUS | April 2022 | December 2025 | Abandon | 44 | 2 | 1 | No | No |
| 17658515 | EPITAXIAL OXIDE HIGH ELECTRON MOBILITY TRANSISTOR | April 2022 | December 2022 | Allow | 8 | 1 | 1 | Yes | No |
| 17658510 | EPITAXIAL OXIDE HIGH ELECTRON MOBILITY TRANSISTOR | April 2022 | June 2024 | Abandon | 26 | 4 | 0 | Yes | Yes |
| 17656746 | CHEMICAL MECHANICAL POLISHING (CMP) SLURRY, SEMICONDUCTOR STRUCTURE, AND MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE | March 2022 | April 2025 | Abandon | 37 | 1 | 1 | No | No |
| 17704465 | METHOD OF FABRICATING SEMICONDUCTOR DEVICE | March 2022 | March 2026 | Allow | 47 | 3 | 1 | Yes | No |
| 17696988 | TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME | March 2022 | December 2023 | Abandon | 21 | 1 | 1 | No | No |
| 17686106 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE HAVING ACTIVE AREA IN STRIP | March 2022 | December 2024 | Allow | 33 | 1 | 1 | No | No |
| 17679418 | STACKED ACCESS DEVICE AND RESISTIVE MEMORY | February 2022 | February 2025 | Allow | 36 | 4 | 1 | Yes | No |
| 17674974 | SEMICONDUCTOR PACKAGE | February 2022 | September 2025 | Allow | 43 | 2 | 1 | Yes | No |
| 17576273 | EPITAXIAL STRUCTURE, LIGHT EMITTING DEVICE, AND METHOD FOR EPITAXIAL STRUCTURE MANUFACTURE | January 2022 | November 2024 | Abandon | 34 | 0 | 1 | No | No |
| 17571334 | NORMALLY-OFF TRANSISTOR WITH REDUCED ON-STATE RESISTANCE AND MANUFACTURING METHOD | January 2022 | June 2025 | Allow | 42 | 4 | 1 | Yes | No |
| 17569678 | SEMICONDUCTOR STRUCTURE AND MANUFACTURE METHOD THEREOF | January 2022 | February 2025 | Abandon | 38 | 4 | 1 | No | No |
| 17563416 | INTEGRATED CIRCUIT DEVICE | December 2021 | March 2025 | Allow | 39 | 4 | 1 | Yes | No |
| 17560321 | SEMICONDUCTOR DEVICE | December 2021 | December 2023 | Allow | 23 | 1 | 0 | No | No |
| 17547600 | SEMICONDUCTOR DEVICE | December 2021 | April 2024 | Abandon | 28 | 5 | 1 | No | No |
| 17547595 | SEMICONDUCTOR DEVICE | December 2021 | December 2023 | Abandon | 25 | 2 | 0 | No | No |
| 17547603 | SEMICONDUCTOR DEVICE | December 2021 | December 2022 | Abandon | 12 | 2 | 0 | No | No |
| 17546018 | MANUFACTURING METHOD OF DISPLAY DEVICE | December 2021 | August 2025 | Abandon | 44 | 4 | 0 | Yes | No |
| 17535793 | SUBSTRATE PROCESSING METHOD, RECORDING MEDIUM, AND SUBSTRATE PROCESSING APPARATUS | November 2021 | March 2025 | Allow | 39 | 2 | 1 | No | No |
| 17595656 | SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF | November 2021 | May 2025 | Abandon | 41 | 2 | 1 | No | No |
| 17455678 | ELEMENT CHIP MANUFACTURING METHOD AND PLASMA PROCESSING METHOD | November 2021 | April 2025 | Abandon | 41 | 2 | 1 | No | No |
| 17528471 | Semiconductor Device and Manufacturing Method Thereof | November 2021 | January 2024 | Abandon | 26 | 2 | 0 | No | No |
| 17612201 | INCORPORATING SEMICONDUCTORS ON A POLYCRYSTALLINE DIAMOND SUBSTRATE | November 2021 | August 2024 | Allow | 33 | 1 | 1 | Yes | No |
| 17527366 | SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING THE SAME | November 2021 | June 2025 | Allow | 43 | 2 | 1 | Yes | No |
| 17524766 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME | November 2021 | December 2023 | Abandon | 25 | 2 | 1 | No | No |
| 17453837 | METHOD FOR PROCESSING SEMICONDUCTOR STRUCTURE | November 2021 | October 2024 | Abandon | 36 | 1 | 0 | No | No |
| 17512232 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | October 2021 | December 2024 | Abandon | 37 | 4 | 1 | No | No |
| 17511555 | BONDING METHOD FOR ELECTRONIC ELEMENT | October 2021 | April 2025 | Allow | 42 | 2 | 1 | No | No |
| 17594537 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | October 2021 | January 2025 | Abandon | 38 | 2 | 0 | Yes | No |
| 17451179 | CONTACT STRUCTURE FORMING METHOD, CONTACT STRUCTURE, AND SEMICONDUCTOR DEVICE | October 2021 | March 2025 | Abandon | 41 | 2 | 1 | No | No |
| 17496271 | LIGHT-EMITTING DEVICE AND MANUFACTURING METHOD THEREOF | October 2021 | May 2022 | Allow | 8 | 2 | 1 | No | No |
| 17478208 | SYSTEMS, DEVICES, AND METHODS FOR DEPOSITING A LAYER COMPRISING A GERMANIUM CHALCOGENIDE | September 2021 | December 2024 | Abandon | 39 | 2 | 1 | Yes | No |
| 17477058 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, METHOD OF PROCESSING SUBSTRATE, SUBSTRATE PROCESSING APPARATUS, AND RECORDING MEDIUM | September 2021 | March 2026 | Allow | 54 | 3 | 1 | Yes | No |
| 17459881 | IMPRINT METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | August 2021 | January 2026 | Abandon | 53 | 4 | 1 | Yes | No |
| 17402722 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | August 2021 | June 2023 | Allow | 22 | 1 | 0 | Yes | No |
| 17287827 | METHOD FOR MANUFACTURING NITRIDE SEMICONDUCTOR SUBSTRATE, NITRIDE SEMICONDUCTOR SUBSTRATE, AND LAMINATE STRUCTURE | August 2021 | June 2025 | Allow | 50 | 2 | 1 | Yes | No |
| 17396154 | HEMT TRANSISTOR OF THE NORMALLY OFF TYPE INCLUDING A TRENCH CONTAINING A GATE REGION AND FORMING AT LEAST ONE STEP, AND CORRESPONDING MANUFACTURING METHOD | August 2021 | August 2023 | Allow | 25 | 2 | 1 | No | No |
| 17393601 | METHOD FOR FABRICATING SEMICONDUCTOR DEVICE AND APPARATUS FOR PROCESSING SUBSTRATE USING PLASMA | August 2021 | May 2025 | Allow | 45 | 4 | 1 | Yes | No |
| 17425007 | DISPLAY SUBSTRATE AND MANUFACTURE METHOD THEREOF, DISPLAY DEVICE | July 2021 | July 2025 | Allow | 48 | 2 | 1 | No | No |
| 17357014 | SEMICONDUCTOR STRUCTURE HAVING A GROUP III-V SEMICONDUCTOR LAYER COMPRISING A HEXAGONAL MESH CRYSTALLINE STRUCTURE | June 2021 | May 2025 | Abandon | 46 | 4 | 1 | Yes | No |
| 17357146 | MEMS-Sensor | June 2021 | February 2026 | Abandon | 56 | 8 | 2 | Yes | No |
| 17356185 | HIGH PERFORMANCE LONG-LIFETIME CHARGE-SEPARATION PHOTODETECTORS | June 2021 | January 2025 | Abandon | 43 | 4 | 1 | Yes | No |
| 17353386 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | June 2021 | March 2023 | Allow | 21 | 1 | 1 | No | No |
| 17416337 | METHOD FOR MANUFACTURING A SPINTRONIC DEVICE COMPRISING A THICK ACTIVE MAGNETIC LAYER | June 2021 | August 2025 | Allow | 50 | 2 | 1 | No | No |
| 17349974 | TRANSISTOR AND DISPLAY DEVICE | June 2021 | February 2024 | Abandon | 32 | 2 | 0 | No | No |
| 17350163 | OPTOELECTRONIC DEVICE HAVING A BORON NITRIDE ALLOY ELECTRON BLOCKING LAYER AND METHOD OF PRODUCTION | June 2021 | March 2024 | Allow | 33 | 4 | 1 | No | No |
| 17336149 | FERROELECTRIC OR ANTI-FERROELECTRIC TRENCH CAPACITOR WITH SPACERS FOR SIDEWALL STRAIN ENGINEERING | June 2021 | March 2024 | Allow | 33 | 3 | 1 | No | No |
| 17241827 | METHOD FOR PRODUCING SEMICONDUCTOR DEVICE | April 2021 | August 2025 | Abandon | 52 | 6 | 1 | Yes | No |
| 17238330 | EPITAXIAL STRUCTURE HAVING SUPER-LATTICE LAMINATES | April 2021 | December 2023 | Allow | 32 | 2 | 1 | Yes | No |
| 17236115 | SEMICONDUCTOR DEVICE | April 2021 | November 2023 | Allow | 31 | 2 | 0 | No | No |
| 17234731 | Semiconductor Device and Fabricating Method Thereof | April 2021 | February 2024 | Allow | 34 | 3 | 1 | Yes | No |
| 17228002 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR | April 2021 | August 2024 | Abandon | 40 | 4 | 1 | No | No |
| 17223278 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | April 2021 | July 2021 | Allow | 3 | 1 | 0 | No | No |
| 17210712 | SEMICONDUCTOR DEVICE | March 2021 | September 2023 | Abandon | 29 | 2 | 0 | No | No |
| 17276801 | METHOD FOR MANUFACTURING AN ELECTRONIC DEVICE | March 2021 | October 2023 | Allow | 31 | 4 | 1 | Yes | No |
| 17172636 | TIME OF FLIGHT (TOF) SENSOR WITH TRANSMIT OPTIC PROVIDING FOR REDUCED PARALLAX EFFECT | February 2021 | April 2023 | Allow | 26 | 2 | 0 | No | No |
| 17156967 | STRUCTURE OF SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | January 2021 | January 2026 | Allow | 60 | 6 | 2 | Yes | No |
| 17156241 | Elevationally-Extending String of Memory Cells and Methods of Forming an Elevationally-Extending String of Memory Cells | January 2021 | November 2022 | Allow | 22 | 1 | 1 | No | No |
| 17144388 | ORGANIC LIGHT-EMITTING DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME | January 2021 | January 2026 | Allow | 60 | 7 | 0 | Yes | No |
| 17141273 | NITRIDE CRYSTAL, OPTICAL DEVICE, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING NITRIDE CRYSTAL | January 2021 | February 2023 | Allow | 25 | 1 | 1 | No | No |
| 17134090 | ALGORITHM FOR OPTIMAL ICD CONFIGURATION USING A COUPLED WELLBORE-RESERVOIR MODEL | December 2020 | November 2023 | Allow | 34 | 2 | 0 | Yes | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner KIM, JAY C.
With a 26.1% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 27.4% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner KIM, JAY C works in Art Unit 2815 and has examined 863 patent applications in our dataset. With an allowance rate of 46.8%, this examiner allows applications at a lower rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 38 months.
Examiner KIM, JAY C's allowance rate of 46.8% places them in the 10% percentile among all USPTO examiners. This examiner is less likely to allow applications than most examiners at the USPTO.
On average, applications examined by KIM, JAY C receive 3.62 office actions before reaching final disposition. This places the examiner in the 95% percentile for office actions issued. This examiner issues more office actions than most examiners, which may indicate thorough examination or difficulty in reaching agreement with applicants.
The median time to disposition (half-life) for applications examined by KIM, JAY C is 38 months. This places the examiner in the 30% percentile for prosecution speed. Prosecution timelines are slightly slower than average with this examiner.
Conducting an examiner interview provides a +18.3% benefit to allowance rate for applications examined by KIM, JAY C. This interview benefit is in the 61% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.
When applicants file an RCE with this examiner, 10.8% of applications are subsequently allowed. This success rate is in the 5% percentile among all examiners. Strategic Insight: RCEs show lower effectiveness with this examiner compared to others. Consider whether a continuation application might be more strategic, especially if you need to add new matter or significantly broaden claims.
This examiner enters after-final amendments leading to allowance in 15.6% of cases where such amendments are filed. This entry rate is in the 17% percentile among all examiners. Strategic Recommendation: This examiner rarely enters after-final amendments compared to other examiners. You should generally plan to file an RCE or appeal rather than relying on after-final amendment entry. Per MPEP § 714.12, primary examiners have discretion in entering after-final amendments, and this examiner exercises that discretion conservatively.
When applicants request a pre-appeal conference (PAC) with this examiner, 85.7% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 66% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 63.5% of appeals filed. This is in the 42% percentile among all examiners. Of these withdrawals, 37.5% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.
When applicants file petitions regarding this examiner's actions, 49.3% are granted (fully or in part). This grant rate is in the 45% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 5.2% of allowed cases (in the 86% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 26.2% of allowed cases (in the 95% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.