USPTO Examiner HARRISON MONICA D - Art Unit 2815

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18741063FIN FIELD-EFFECT TRANSISTOR DEVICE AND METHODJune 2024April 2025Allow1010NoNo
18732725RRAM BOTTOM ELECTRODEJune 2024March 2025Allow910NoNo
18669565SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THE SAMEMay 2024March 2025Allow1010NoNo
18644330MULTI-LAYER DIELECTRIC REFILL FOR PROFILE CONTROL IN SEMICONDUCTOR DEVICESApril 2024April 2025Allow1110NoNo
18631641BURIED GRID WITH SHIELD IN WIDE BAND GAP MATERIALApril 2024February 2025Allow1010NoNo
18627931A STRUCTURE AND METHODS OF FORMING THE STRUCTUREApril 2024February 2025Allow1010NoNo
18623766LATERAL FIN STATIC INDUCTION TRANSISTORApril 2024February 2025Allow1110NoNo
18619261SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICEMarch 2024October 2024Allow700NoNo
18614985FIN ISOLATION STRUCTURE FOR FINFET AND METHOD OF FORMING THE SAMEMarch 2024October 2025Allow1810YesNo
18608949Semiconductor structureMarch 2024February 2025Allow1120NoNo
18589774METHOD TO INDUCE STRAIN IN FINFET CHANNELS FROM AN ADJACENT REGIONFebruary 2024October 2024Allow810NoNo
18440071Semiconductor Device and Methods of Forming SameFebruary 2024June 2025Allow1620NoNo
18412605SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOFJanuary 2024August 2024Allow700NoNo
18395662SEMICONDUCTOR DEVICE AND MANUFACTURING METHODDecember 2023July 2024Allow700NoNo
18537236SPLIT SOURCE DRAIN TRANSISTORDecember 2023March 2025Allow1510NoNo
18533072Nanosheet FET with Controlled Overlay MarkDecember 2023March 2026Allow2700NoNo
18532975SCALABLE MPS DEVICE BASED ON SICDecember 2023October 2024Allow1010NoNo
18526062Semiconductor Structure Cutting Process and Structures Formed TherebyDecember 2023June 2024Allow700NoNo
18520346REDUCING PARASITIC CAPACITANCE IN SEMICONDUCTOR DEVICESNovember 2023December 2025Allow2510NoNo
18383191SIC TRENCH MOSFET WITH AN EMBEDDED JUNCTION BARRIER SCHOTTKY DIODEOctober 2023February 2026Allow2800NoNo
18492689MICROELECTRONIC DEVICES INCLUDING PILLARS WITH PARTIALLY-CIRCULAR UPPER PORTIONS AND CIRCULAR LOWER PORTIONS, AND RELATED METHODSOctober 2023January 2025Allow1520YesNo
18487177SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAMEOctober 2023May 2024Allow700NoNo
18372226DIODESeptember 2023August 2024Allow1110NoNo
18468284SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMESeptember 2023June 2024Allow900NoNo
18244892SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMESeptember 2023September 2024Allow1210NoNo
18242717STANDALONE HIGH VOLTAGE GALVANIC ISOLATION CAPACITORSSeptember 2023October 2024Allow1310NoNo
17761222DISPLAY PANEL AND METHOD FOR FABRICATING SAMEAugust 2023February 2026Allow4710NoNo
18449830SEMICONDUCTOR DEVICEAugust 2023January 2026Allow3010NoNo
18449443FIN FIELD-EFFECT TRANSISTOR DEVICE AND METHODS OF FORMINGAugust 2023March 2026Allow3110NoNo
18363966A NOVEL LAYOUT TO REDUCE NOISE IN SEMICONDUCTOR DEVICESAugust 2023July 2025Allow2410NoNo
18360588SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAMEJuly 2023January 2026Allow3010NoNo
18350819SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOFJuly 2023February 2024Allow800NoNo
18343590SEMICONDUCTOR DEVICE AND EQUIPMENTJune 2023October 2025Allow2800NoNo
18334275SILICON CARBIDE DIODE WITH REDUCED VOLTAGE DROP, AND MANUFACTURING METHOD THEREOFJune 2023May 2024Allow1110NoNo
18332972ELECTRONIC DEVICE AND METHOD OF MANUFACTURING THE SAMEJune 2023May 2024Allow1110NoNo
18208404DISPLAY APPARATUSJune 2023May 2024Allow1110NoNo
18328488SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHODJune 2023January 2026Allow3210NoNo
18315000FIN ISOLATION STRUCTURE FOR FINFET AND METHOD OF FORMING THE SAMEMay 2023November 2023Allow600NoNo
18314277METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE THEREOFMay 2023November 2025Allow3110NoNo
18143191SEMICONDUCTOR DEVICES WITH A COMPOSITIONALLY GRADED LAYER, AND METHODS OF MAKING AND USE THEREOFMay 2023August 2025Allow2700NoNo
18308897SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THEREOFApril 2023February 2024Allow1010NoNo
18308909Redistribution Structures for Semiconductor Packages and Methods of Forming the SameApril 2023November 2023Allow600NoNo
18137329NEGATIVE CHARGE EXTRACTION STRUCTURE FOR EDGE TERMINATIONApril 2023October 2025Allow3010NoNo
18303617Buried Grid Double Junction Barrier Schottky Diode and Method of MakingApril 2023February 2026Allow3410NoNo
18133156SEMICONDUCTOR DEVICEApril 2023February 2024Allow1010NoNo
18131014SCHOTTKY DIODEApril 2023June 2025Allow2710NoNo
18129122SEMICONDUCTOR DEVICEMarch 2023July 2025Allow2700NoNo
18127661METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICEMarch 2023December 2025Allow3310NoNo
18029222DISPLAY PANEL AND DISPLAY DEVICEMarch 2023March 2026Allow3510NoNo
18127679METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICEMarch 2023December 2025Allow3310NoNo
18190208DISPLAY DEVICE AND METHOD FOR MANUFACTURING THE SAMEMarch 2023October 2023Allow700NoNo
18245757FERROELECTRIC DEVICE AND SEMICONDUCTOR DEVICEMarch 2023October 2025Allow3110NoNo
18182621BURIED GRID WITH SHIELD IN WIDE BAND GAP MATERIALMarch 2023January 2024Allow1010NoNo
18180445SEMICONDUCTOR PRODUCT AND METHOD FOR PRODUCING A SEMICONDUCTOR PRODUCTMarch 2023January 2026Allow3410NoNo
18170153SEMICONDUCTOR DEVICEFebruary 2023June 2025Allow2800NoNo
18041380SEMICONDUCTOR APPARATUS, IMAGING DEVICE, AND ELECTRONIC APPARATUSFebruary 2023September 2025Allow3100NoNo
18166896MULTI-LAYER DIELECTRIC REFILL FOR PROFILE CONTROL IN SEMICONDUCTOR DEVICESFebruary 2023January 2024Allow1210NoNo
18105955METHOD FOR FORMING A SEMICONDUCTOR DEVICEFebruary 2023September 2023Allow700NoNo
18017649METAL OXIDE THIN FILM TRANSISTOR, ARRAY SUBSTRATE AND DISPLAY DEVICEJanuary 2023September 2025Allow3210NoNo
18157910METHOD AND APPARATUS FOR FORMING RUTHENIUM SILICIDE FILM ON SURFACE OF SUBSTRATEJanuary 2023May 2025Allow2800NoNo
18157298METHOD TO INDUCE STRAIN IN FINFET CHANNELS FROM AN ADJACENT REGIONJanuary 2023August 2023Allow700NoNo
18016899SEMICONDUCTOR MATERIAL, LIGHT-EMITTING DEVICE, DISPLAY PANEL AND DISPLAY DEVICEJanuary 2023December 2025Allow3410NoNo
18153335SEMICONDUCTOR STRUCTURES AND MANUFACTURING METHOD THEREOFJanuary 2023July 2025Allow3000NoNo
18151775SEMICONDUCTOR DEVICE INCLUDING METAL-2 DIMENSIONAL MATERIAL-SEMICONDUCTOR JUNCTIONJanuary 2023February 2026Allow3720NoNo
18150942SPLIT SOURCE DRAIN TRANSISTORJanuary 2023September 2023Allow810YesNo
18091728NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE AND METHOD OF MANUFACTURING THE SAMEDecember 2022March 2024Allow1410NoNo
18088501Vertical Diode Configurations for Radiation-Environment ApplicationsDecember 2022October 2025Allow3310NoNo
18067858SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEDecember 2022June 2025Allow3010NoNo
18067702MULTI-FUNCTIONAL FIELD EFFECT TRANSISTOR WITH INTRINSIC SELF-HEALING PROPERTIESDecember 2022October 2023Allow1010NoNo
18008657WIDE GAP SEMICONDUCTOR DEVICEDecember 2022April 2025Allow2800NoNo
18074756OXIDE SEMICONDUCTOR THIN-FILM TRANSISTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEDecember 2022August 2025Allow3210NoNo
18061031Semiconductor Device and Methods of Forming SameDecember 2022November 2023Allow1110NoNo
17988764MEMORY DEVICE, MEMORY CIRCUIT AND MANUFACTURING METHOD OF MEMORY CIRCUITNovember 2022April 2025Allow2900NoNo
17924166Semiconductor DeviceNovember 2022November 2025Allow3610NoNo
18051034SEMICONDUCTOR DEVICESOctober 2022September 2023Allow1110NoNo
17975973DISPLAY PANEL AND DISPLAY APPARATUS INCLUDING THE SAMEOctober 2022January 2026Allow3910NoNo
17975402THIN FILM TRANSISTOR, THIN FILM TRANSISTOR SUBSTRATE AND DISPLAY APPARATUSOctober 2022August 2025Allow3400NoNo
17973250SEMICONDUCTOR DEVICEOctober 2022November 2025Allow3720NoNo
17969491SEMICONDUCTOR DEVICE INCLUDING CONTACT PLUGOctober 2022October 2025Allow3600NoNo
17996516SEMICONDUCTOR DEVICEOctober 2022November 2025Allow3700NoNo
17965665ARRAY OF QUANTUM DOTS WITH SPIN QUBITSOctober 2022March 2025Allow3000NoNo
179643323D STACKED INTEGRATED CIRCUITS HAVING FUNCTIONAL BLOCKS CONFIGURED TO PROVIDE REDUNDANCY SITESOctober 2022December 2024Allow2640NoNo
17955926LOW CAPACITANCE ESD PROTECTION DEVICESSeptember 2022October 2025Allow3700NoNo
17951512CRYSTAL, SEMICONDUCTOR ELEMENT AND SEMICONDUCTOR DEVICESeptember 2022October 2024Allow2520YesNo
17950952Integration of FinFETs and Schottky Diodes on a SubstrateSeptember 2022November 2025Allow4610NoNo
17950870METHODS FOR FORMING HIGH PERFORMANCE 3D NANO SHEET DEVICESSeptember 2022February 2026Abandon4110NoNo
17910372SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICESeptember 2022March 2025Allow3000NoNo
17939054SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICESeptember 2022April 2025Allow3200NoNo
17822594SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAMEAugust 2022July 2023Allow1100NoNo
17894597GATE-LAST TRI-GATE FEFETAugust 2022March 2025Allow3100NoNo
17890795SURFACE TREATMENT METHOD FOR GALLIUM OXIDE-BASED SEMICONDUCTOR SUBSTRATE AND SEMICONDUCTOR DEVICEAugust 2022April 2025Allow3210NoNo
17889597SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICEAugust 2022December 2023Allow1610NoNo
17888472MULTIPLE, ALTERNATING EPITAXIAL SILICONAugust 2022August 2025Allow3600NoNo
17886805VIA ALTERNATE NET SPACINGAugust 2022November 2025Allow3910NoNo
17799080CHIP TRAY FOR SELF-ASSEMBLY, AND METHOD FOR SUPPLYING SEMICONDUCTOR LIGHT EMITTING ELEMENTSAugust 2022December 2025Allow4010NoNo
17818405Semiconductor Structure Cutting Process and Structures Formed TherebyAugust 2022September 2023Allow1310NoNo
17882148SEMICONDUCTOR ELEMENT AND SEMICONDUCTOR DEVICEAugust 2022June 2025Allow3410NoNo
17878016SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOFJuly 2022October 2023Allow1410NoNo
17816327METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICEJuly 2022October 2023Allow1500NoNo
17876006SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMEJuly 2022May 2023Allow900NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner HARRISON, MONICA D.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
1
Examiner Affirmed
0
(0.0%)
Examiner Reversed
1
(100.0%)
Reversal Percentile
94.7%
Higher than average

What This Means

With a 100.0% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.

Strategic Value of Filing an Appeal

Total Appeal Filings
5
Allowed After Appeal Filing
1
(20.0%)
Not Allowed After Appeal Filing
4
(80.0%)
Filing Benefit Percentile
25.4%
Lower than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 20.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.

Strategic Recommendations

Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.

Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.

Examiner HARRISON, MONICA D - Prosecution Strategy Guide

Executive Summary

Examiner HARRISON, MONICA D works in Art Unit 2815 and has examined 373 patent applications in our dataset. With an allowance rate of 97.3%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 18 months.

Allowance Patterns

Examiner HARRISON, MONICA D's allowance rate of 97.3% places them in the 88% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by HARRISON, MONICA D receive 1.13 office actions before reaching final disposition. This places the examiner in the 13% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by HARRISON, MONICA D is 18 months. This places the examiner in the 96% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a -2.2% benefit to allowance rate for applications examined by HARRISON, MONICA D. This interview benefit is in the 8% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 27.1% of applications are subsequently allowed. This success rate is in the 46% percentile among all examiners. Strategic Insight: RCEs show below-average effectiveness with this examiner. Carefully evaluate whether an RCE or continuation is the better strategy.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 42.3% of cases where such amendments are filed. This entry rate is in the 65% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 0.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 13% percentile among all examiners. Note: Pre-appeal conferences show limited success with this examiner compared to others. While still worth considering, be prepared to proceed with a full appeal brief if the PAC does not result in favorable action.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 80.0% of appeals filed. This is in the 72% percentile among all examiners. Of these withdrawals, 50.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.

Petition Practice

When applicants file petitions regarding this examiner's actions, 21.8% are granted (fully or in part). This grant rate is in the 11% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 0.3% of allowed cases (in the 55% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).

Quayle Actions: This examiner issues Ex Parte Quayle actions in 1.1% of allowed cases (in the 62% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

    Relevant MPEP Sections for Prosecution Strategy

    • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
    • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
    • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
    • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
    • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
    • MPEP § 1214.07: Reopening prosecution after appeal

    Important Disclaimer

    Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

    No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

    Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

    Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.