Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18741063 | FIN FIELD-EFFECT TRANSISTOR DEVICE AND METHOD | June 2024 | April 2025 | Allow | 10 | 1 | 0 | No | No |
| 18732725 | RRAM BOTTOM ELECTRODE | June 2024 | March 2025 | Allow | 9 | 1 | 0 | No | No |
| 18669565 | SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THE SAME | May 2024 | March 2025 | Allow | 10 | 1 | 0 | No | No |
| 18644330 | MULTI-LAYER DIELECTRIC REFILL FOR PROFILE CONTROL IN SEMICONDUCTOR DEVICES | April 2024 | April 2025 | Allow | 11 | 1 | 0 | No | No |
| 18631641 | BURIED GRID WITH SHIELD IN WIDE BAND GAP MATERIAL | April 2024 | February 2025 | Allow | 10 | 1 | 0 | No | No |
| 18627931 | A STRUCTURE AND METHODS OF FORMING THE STRUCTURE | April 2024 | February 2025 | Allow | 10 | 1 | 0 | No | No |
| 18623766 | LATERAL FIN STATIC INDUCTION TRANSISTOR | April 2024 | February 2025 | Allow | 11 | 1 | 0 | No | No |
| 18619261 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | March 2024 | October 2024 | Allow | 7 | 0 | 0 | No | No |
| 18614985 | FIN ISOLATION STRUCTURE FOR FINFET AND METHOD OF FORMING THE SAME | March 2024 | October 2025 | Allow | 18 | 1 | 0 | Yes | No |
| 18608949 | Semiconductor structure | March 2024 | February 2025 | Allow | 11 | 2 | 0 | No | No |
| 18589774 | METHOD TO INDUCE STRAIN IN FINFET CHANNELS FROM AN ADJACENT REGION | February 2024 | October 2024 | Allow | 8 | 1 | 0 | No | No |
| 18440071 | Semiconductor Device and Methods of Forming Same | February 2024 | June 2025 | Allow | 16 | 2 | 0 | No | No |
| 18412605 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | January 2024 | August 2024 | Allow | 7 | 0 | 0 | No | No |
| 18395662 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD | December 2023 | July 2024 | Allow | 7 | 0 | 0 | No | No |
| 18537236 | SPLIT SOURCE DRAIN TRANSISTOR | December 2023 | March 2025 | Allow | 15 | 1 | 0 | No | No |
| 18533072 | Nanosheet FET with Controlled Overlay Mark | December 2023 | March 2026 | Allow | 27 | 0 | 0 | No | No |
| 18532975 | SCALABLE MPS DEVICE BASED ON SIC | December 2023 | October 2024 | Allow | 10 | 1 | 0 | No | No |
| 18526062 | Semiconductor Structure Cutting Process and Structures Formed Thereby | December 2023 | June 2024 | Allow | 7 | 0 | 0 | No | No |
| 18520346 | REDUCING PARASITIC CAPACITANCE IN SEMICONDUCTOR DEVICES | November 2023 | December 2025 | Allow | 25 | 1 | 0 | No | No |
| 18383191 | SIC TRENCH MOSFET WITH AN EMBEDDED JUNCTION BARRIER SCHOTTKY DIODE | October 2023 | February 2026 | Allow | 28 | 0 | 0 | No | No |
| 18492689 | MICROELECTRONIC DEVICES INCLUDING PILLARS WITH PARTIALLY-CIRCULAR UPPER PORTIONS AND CIRCULAR LOWER PORTIONS, AND RELATED METHODS | October 2023 | January 2025 | Allow | 15 | 2 | 0 | Yes | No |
| 18487177 | SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | October 2023 | May 2024 | Allow | 7 | 0 | 0 | No | No |
| 18372226 | DIODE | September 2023 | August 2024 | Allow | 11 | 1 | 0 | No | No |
| 18468284 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | September 2023 | June 2024 | Allow | 9 | 0 | 0 | No | No |
| 18244892 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | September 2023 | September 2024 | Allow | 12 | 1 | 0 | No | No |
| 18242717 | STANDALONE HIGH VOLTAGE GALVANIC ISOLATION CAPACITORS | September 2023 | October 2024 | Allow | 13 | 1 | 0 | No | No |
| 17761222 | DISPLAY PANEL AND METHOD FOR FABRICATING SAME | August 2023 | February 2026 | Allow | 47 | 1 | 0 | No | No |
| 18449830 | SEMICONDUCTOR DEVICE | August 2023 | January 2026 | Allow | 30 | 1 | 0 | No | No |
| 18449443 | FIN FIELD-EFFECT TRANSISTOR DEVICE AND METHODS OF FORMING | August 2023 | March 2026 | Allow | 31 | 1 | 0 | No | No |
| 18363966 | A NOVEL LAYOUT TO REDUCE NOISE IN SEMICONDUCTOR DEVICES | August 2023 | July 2025 | Allow | 24 | 1 | 0 | No | No |
| 18360588 | SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME | July 2023 | January 2026 | Allow | 30 | 1 | 0 | No | No |
| 18350819 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | July 2023 | February 2024 | Allow | 8 | 0 | 0 | No | No |
| 18343590 | SEMICONDUCTOR DEVICE AND EQUIPMENT | June 2023 | October 2025 | Allow | 28 | 0 | 0 | No | No |
| 18334275 | SILICON CARBIDE DIODE WITH REDUCED VOLTAGE DROP, AND MANUFACTURING METHOD THEREOF | June 2023 | May 2024 | Allow | 11 | 1 | 0 | No | No |
| 18332972 | ELECTRONIC DEVICE AND METHOD OF MANUFACTURING THE SAME | June 2023 | May 2024 | Allow | 11 | 1 | 0 | No | No |
| 18208404 | DISPLAY APPARATUS | June 2023 | May 2024 | Allow | 11 | 1 | 0 | No | No |
| 18328488 | SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD | June 2023 | January 2026 | Allow | 32 | 1 | 0 | No | No |
| 18315000 | FIN ISOLATION STRUCTURE FOR FINFET AND METHOD OF FORMING THE SAME | May 2023 | November 2023 | Allow | 6 | 0 | 0 | No | No |
| 18314277 | METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE THEREOF | May 2023 | November 2025 | Allow | 31 | 1 | 0 | No | No |
| 18143191 | SEMICONDUCTOR DEVICES WITH A COMPOSITIONALLY GRADED LAYER, AND METHODS OF MAKING AND USE THEREOF | May 2023 | August 2025 | Allow | 27 | 0 | 0 | No | No |
| 18308897 | SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THEREOF | April 2023 | February 2024 | Allow | 10 | 1 | 0 | No | No |
| 18308909 | Redistribution Structures for Semiconductor Packages and Methods of Forming the Same | April 2023 | November 2023 | Allow | 6 | 0 | 0 | No | No |
| 18137329 | NEGATIVE CHARGE EXTRACTION STRUCTURE FOR EDGE TERMINATION | April 2023 | October 2025 | Allow | 30 | 1 | 0 | No | No |
| 18303617 | Buried Grid Double Junction Barrier Schottky Diode and Method of Making | April 2023 | February 2026 | Allow | 34 | 1 | 0 | No | No |
| 18133156 | SEMICONDUCTOR DEVICE | April 2023 | February 2024 | Allow | 10 | 1 | 0 | No | No |
| 18131014 | SCHOTTKY DIODE | April 2023 | June 2025 | Allow | 27 | 1 | 0 | No | No |
| 18129122 | SEMICONDUCTOR DEVICE | March 2023 | July 2025 | Allow | 27 | 0 | 0 | No | No |
| 18127661 | METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | March 2023 | December 2025 | Allow | 33 | 1 | 0 | No | No |
| 18029222 | DISPLAY PANEL AND DISPLAY DEVICE | March 2023 | March 2026 | Allow | 35 | 1 | 0 | No | No |
| 18127679 | METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | March 2023 | December 2025 | Allow | 33 | 1 | 0 | No | No |
| 18190208 | DISPLAY DEVICE AND METHOD FOR MANUFACTURING THE SAME | March 2023 | October 2023 | Allow | 7 | 0 | 0 | No | No |
| 18245757 | FERROELECTRIC DEVICE AND SEMICONDUCTOR DEVICE | March 2023 | October 2025 | Allow | 31 | 1 | 0 | No | No |
| 18182621 | BURIED GRID WITH SHIELD IN WIDE BAND GAP MATERIAL | March 2023 | January 2024 | Allow | 10 | 1 | 0 | No | No |
| 18180445 | SEMICONDUCTOR PRODUCT AND METHOD FOR PRODUCING A SEMICONDUCTOR PRODUCT | March 2023 | January 2026 | Allow | 34 | 1 | 0 | No | No |
| 18170153 | SEMICONDUCTOR DEVICE | February 2023 | June 2025 | Allow | 28 | 0 | 0 | No | No |
| 18041380 | SEMICONDUCTOR APPARATUS, IMAGING DEVICE, AND ELECTRONIC APPARATUS | February 2023 | September 2025 | Allow | 31 | 0 | 0 | No | No |
| 18166896 | MULTI-LAYER DIELECTRIC REFILL FOR PROFILE CONTROL IN SEMICONDUCTOR DEVICES | February 2023 | January 2024 | Allow | 12 | 1 | 0 | No | No |
| 18105955 | METHOD FOR FORMING A SEMICONDUCTOR DEVICE | February 2023 | September 2023 | Allow | 7 | 0 | 0 | No | No |
| 18017649 | METAL OXIDE THIN FILM TRANSISTOR, ARRAY SUBSTRATE AND DISPLAY DEVICE | January 2023 | September 2025 | Allow | 32 | 1 | 0 | No | No |
| 18157910 | METHOD AND APPARATUS FOR FORMING RUTHENIUM SILICIDE FILM ON SURFACE OF SUBSTRATE | January 2023 | May 2025 | Allow | 28 | 0 | 0 | No | No |
| 18157298 | METHOD TO INDUCE STRAIN IN FINFET CHANNELS FROM AN ADJACENT REGION | January 2023 | August 2023 | Allow | 7 | 0 | 0 | No | No |
| 18016899 | SEMICONDUCTOR MATERIAL, LIGHT-EMITTING DEVICE, DISPLAY PANEL AND DISPLAY DEVICE | January 2023 | December 2025 | Allow | 34 | 1 | 0 | No | No |
| 18153335 | SEMICONDUCTOR STRUCTURES AND MANUFACTURING METHOD THEREOF | January 2023 | July 2025 | Allow | 30 | 0 | 0 | No | No |
| 18151775 | SEMICONDUCTOR DEVICE INCLUDING METAL-2 DIMENSIONAL MATERIAL-SEMICONDUCTOR JUNCTION | January 2023 | February 2026 | Allow | 37 | 2 | 0 | No | No |
| 18150942 | SPLIT SOURCE DRAIN TRANSISTOR | January 2023 | September 2023 | Allow | 8 | 1 | 0 | Yes | No |
| 18091728 | NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE AND METHOD OF MANUFACTURING THE SAME | December 2022 | March 2024 | Allow | 14 | 1 | 0 | No | No |
| 18088501 | Vertical Diode Configurations for Radiation-Environment Applications | December 2022 | October 2025 | Allow | 33 | 1 | 0 | No | No |
| 18067858 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | December 2022 | June 2025 | Allow | 30 | 1 | 0 | No | No |
| 18067702 | MULTI-FUNCTIONAL FIELD EFFECT TRANSISTOR WITH INTRINSIC SELF-HEALING PROPERTIES | December 2022 | October 2023 | Allow | 10 | 1 | 0 | No | No |
| 18008657 | WIDE GAP SEMICONDUCTOR DEVICE | December 2022 | April 2025 | Allow | 28 | 0 | 0 | No | No |
| 18074756 | OXIDE SEMICONDUCTOR THIN-FILM TRANSISTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | December 2022 | August 2025 | Allow | 32 | 1 | 0 | No | No |
| 18061031 | Semiconductor Device and Methods of Forming Same | December 2022 | November 2023 | Allow | 11 | 1 | 0 | No | No |
| 17988764 | MEMORY DEVICE, MEMORY CIRCUIT AND MANUFACTURING METHOD OF MEMORY CIRCUIT | November 2022 | April 2025 | Allow | 29 | 0 | 0 | No | No |
| 17924166 | Semiconductor Device | November 2022 | November 2025 | Allow | 36 | 1 | 0 | No | No |
| 18051034 | SEMICONDUCTOR DEVICES | October 2022 | September 2023 | Allow | 11 | 1 | 0 | No | No |
| 17975973 | DISPLAY PANEL AND DISPLAY APPARATUS INCLUDING THE SAME | October 2022 | January 2026 | Allow | 39 | 1 | 0 | No | No |
| 17975402 | THIN FILM TRANSISTOR, THIN FILM TRANSISTOR SUBSTRATE AND DISPLAY APPARATUS | October 2022 | August 2025 | Allow | 34 | 0 | 0 | No | No |
| 17973250 | SEMICONDUCTOR DEVICE | October 2022 | November 2025 | Allow | 37 | 2 | 0 | No | No |
| 17969491 | SEMICONDUCTOR DEVICE INCLUDING CONTACT PLUG | October 2022 | October 2025 | Allow | 36 | 0 | 0 | No | No |
| 17996516 | SEMICONDUCTOR DEVICE | October 2022 | November 2025 | Allow | 37 | 0 | 0 | No | No |
| 17965665 | ARRAY OF QUANTUM DOTS WITH SPIN QUBITS | October 2022 | March 2025 | Allow | 30 | 0 | 0 | No | No |
| 17964332 | 3D STACKED INTEGRATED CIRCUITS HAVING FUNCTIONAL BLOCKS CONFIGURED TO PROVIDE REDUNDANCY SITES | October 2022 | December 2024 | Allow | 26 | 4 | 0 | No | No |
| 17955926 | LOW CAPACITANCE ESD PROTECTION DEVICES | September 2022 | October 2025 | Allow | 37 | 0 | 0 | No | No |
| 17951512 | CRYSTAL, SEMICONDUCTOR ELEMENT AND SEMICONDUCTOR DEVICE | September 2022 | October 2024 | Allow | 25 | 2 | 0 | Yes | No |
| 17950952 | Integration of FinFETs and Schottky Diodes on a Substrate | September 2022 | November 2025 | Allow | 46 | 1 | 0 | No | No |
| 17950870 | METHODS FOR FORMING HIGH PERFORMANCE 3D NANO SHEET DEVICES | September 2022 | February 2026 | Abandon | 41 | 1 | 0 | No | No |
| 17910372 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | September 2022 | March 2025 | Allow | 30 | 0 | 0 | No | No |
| 17939054 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | September 2022 | April 2025 | Allow | 32 | 0 | 0 | No | No |
| 17822594 | SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | August 2022 | July 2023 | Allow | 11 | 0 | 0 | No | No |
| 17894597 | GATE-LAST TRI-GATE FEFET | August 2022 | March 2025 | Allow | 31 | 0 | 0 | No | No |
| 17890795 | SURFACE TREATMENT METHOD FOR GALLIUM OXIDE-BASED SEMICONDUCTOR SUBSTRATE AND SEMICONDUCTOR DEVICE | August 2022 | April 2025 | Allow | 32 | 1 | 0 | No | No |
| 17889597 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | August 2022 | December 2023 | Allow | 16 | 1 | 0 | No | No |
| 17888472 | MULTIPLE, ALTERNATING EPITAXIAL SILICON | August 2022 | August 2025 | Allow | 36 | 0 | 0 | No | No |
| 17886805 | VIA ALTERNATE NET SPACING | August 2022 | November 2025 | Allow | 39 | 1 | 0 | No | No |
| 17799080 | CHIP TRAY FOR SELF-ASSEMBLY, AND METHOD FOR SUPPLYING SEMICONDUCTOR LIGHT EMITTING ELEMENTS | August 2022 | December 2025 | Allow | 40 | 1 | 0 | No | No |
| 17818405 | Semiconductor Structure Cutting Process and Structures Formed Thereby | August 2022 | September 2023 | Allow | 13 | 1 | 0 | No | No |
| 17882148 | SEMICONDUCTOR ELEMENT AND SEMICONDUCTOR DEVICE | August 2022 | June 2025 | Allow | 34 | 1 | 0 | No | No |
| 17878016 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | July 2022 | October 2023 | Allow | 14 | 1 | 0 | No | No |
| 17816327 | METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE | July 2022 | October 2023 | Allow | 15 | 0 | 0 | No | No |
| 17876006 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | July 2022 | May 2023 | Allow | 9 | 0 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner HARRISON, MONICA D.
With a 100.0% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 20.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner HARRISON, MONICA D works in Art Unit 2815 and has examined 373 patent applications in our dataset. With an allowance rate of 97.3%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 18 months.
Examiner HARRISON, MONICA D's allowance rate of 97.3% places them in the 88% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by HARRISON, MONICA D receive 1.13 office actions before reaching final disposition. This places the examiner in the 13% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by HARRISON, MONICA D is 18 months. This places the examiner in the 96% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a -2.2% benefit to allowance rate for applications examined by HARRISON, MONICA D. This interview benefit is in the 8% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 27.1% of applications are subsequently allowed. This success rate is in the 46% percentile among all examiners. Strategic Insight: RCEs show below-average effectiveness with this examiner. Carefully evaluate whether an RCE or continuation is the better strategy.
This examiner enters after-final amendments leading to allowance in 42.3% of cases where such amendments are filed. This entry rate is in the 65% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 0.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 13% percentile among all examiners. Note: Pre-appeal conferences show limited success with this examiner compared to others. While still worth considering, be prepared to proceed with a full appeal brief if the PAC does not result in favorable action.
This examiner withdraws rejections or reopens prosecution in 80.0% of appeals filed. This is in the 72% percentile among all examiners. Of these withdrawals, 50.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.
When applicants file petitions regarding this examiner's actions, 21.8% are granted (fully or in part). This grant rate is in the 11% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 0.3% of allowed cases (in the 55% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).
Quayle Actions: This examiner issues Ex Parte Quayle actions in 1.1% of allowed cases (in the 62% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.