Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18779095 | SEMICONDUCTOR TRENCH CAPACITOR STRUCTURE AND MANUFACTURING METHOD THEREOF | July 2024 | January 2026 | Allow | 18 | 1 | 0 | No | No |
| 18763075 | SEMICONDUCTOR STRUCTURES HAVING DEEP TRENCH CAPACITOR AND METHODS FOR MANUFACTURING THE SAME | July 2024 | March 2025 | Allow | 8 | 1 | 0 | No | No |
| 18755379 | Ferroelectric Tunnel Junction Devices with a Sparse Seed Layer and Methods for Forming the Same | June 2024 | July 2025 | Allow | 13 | 1 | 0 | No | No |
| 18747379 | SEMICONDUCTOR DEVICE, FERROELECTRIC CAPACITOR AND LAMINATED STRUCTURE | June 2024 | May 2025 | Allow | 11 | 1 | 0 | No | No |
| 18743431 | SEMICONDUCTOR STRUCTURES HAVING DEEP TRENCH CAPACITOR AND METHODS FOR MANUFACTURING THE SAME | June 2024 | January 2025 | Allow | 7 | 0 | 0 | No | No |
| 18731945 | REDUCING PATTERN LOADING IN THE ETCH-BACK OF METAL GATE | June 2024 | November 2025 | Allow | 17 | 3 | 0 | No | No |
| 18678270 | LEAD FRAME AND MANUFACTURING METHOD THEREOF | May 2024 | April 2025 | Allow | 10 | 1 | 0 | Yes | No |
| 18674923 | METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE INCLUDING A MOS TRANSISTOR HAVING A SILICIDE LAYER | May 2024 | July 2025 | Allow | 14 | 1 | 0 | No | No |
| 18666035 | SEMICONDUCTOR MEMORY DEVICE | May 2024 | December 2024 | Allow | 7 | 0 | 0 | No | No |
| 18659523 | SEMICONDUCTOR DEVICE, SEMICONDUCTOR WAFER, MEMORY DEVICE, AND ELECTRONIC DEVICE | May 2024 | December 2024 | Allow | 7 | 0 | 0 | No | No |
| 18641815 | MEMS RESONATOR INTEGRATED CICRUIT FABRICATION | April 2024 | May 2025 | Allow | 13 | 1 | 0 | No | No |
| 18614757 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | March 2024 | November 2024 | Allow | 7 | 0 | 0 | No | No |
| 18594215 | TRENCH CAPACITOR STRUCTURE WITH HYBRID FILLING LAYER | March 2024 | January 2025 | Allow | 11 | 1 | 0 | No | No |
| 18586255 | THIN FILM TRANSISTOR AND VERTICAL NON-VOLATILE MEMORY DEVICE INCLUDING TRANSITION METAL-INDUCED POLYCRYSTALLINE METAL OXIDE CHANNEL LAYER | February 2024 | September 2024 | Allow | 7 | 0 | 0 | No | No |
| 18439785 | INTEGRATED CIRCUIT DEVICES AND METHODS OF MANUFACTURING THE SAME | February 2024 | January 2025 | Allow | 11 | 1 | 0 | Yes | No |
| 18406403 | Semiconductor Package Using A Coreless Signal Distribution Structure | January 2024 | February 2025 | Allow | 13 | 1 | 0 | No | No |
| 18405134 | MULTI-LAYER TRENCH CAPACITOR STRUCTURE | January 2024 | November 2024 | Allow | 10 | 1 | 0 | No | No |
| 18398162 | PLASMA PROCESSING SYSTEM AND EDGE RING REPLACEMENT METHOD | December 2023 | April 2025 | Allow | 16 | 2 | 0 | No | No |
| 18395617 | SEMICONDUCTOR PACKAGES AND MANUFACTURING METHODS THEREOF | December 2023 | December 2024 | Allow | 12 | 1 | 0 | No | No |
| 18395110 | MULTILAYER CAPACITOR ELECTRODE | December 2023 | October 2024 | Allow | 10 | 1 | 0 | No | No |
| 18515619 | HALL EFFECT SENSOR WITH LOW OFFSET AND HIGH LEVEL OF STABILITY | November 2023 | November 2024 | Allow | 11 | 1 | 0 | No | No |
| 18514060 | SEMICONDUCTOR DEVICE WITH ELECTRODE HAVING STEP-SHAPED SIDEWALL AND METHOD FOR PREPARING THE SAME | November 2023 | February 2026 | Allow | 27 | 0 | 0 | No | No |
| 18513042 | ELECTRONIC DEVICES AND METHODS OF MANUFACTURING THE SAME | November 2023 | September 2024 | Allow | 10 | 1 | 0 | No | No |
| 18513431 | MOLDED DIRECT BONDED AND INTERCONNECTED STACK | November 2023 | October 2024 | Allow | 11 | 1 | 0 | No | No |
| 18512096 | TRENCH PATTERN FOR TRENCH CAPACITOR YIELD IMPROVEMENT | November 2023 | September 2024 | Allow | 10 | 1 | 0 | No | No |
| 18504140 | DISPLAY DEVICE | November 2023 | September 2024 | Allow | 11 | 1 | 0 | No | No |
| 18382837 | ORGANIC LIGHT EMITTING DIODE AND ORGANIC LIGHT EMITTING DEVICE INCLUDING THE SAME | October 2023 | January 2026 | Allow | 27 | 0 | 0 | No | No |
| 18482710 | THIN FILM TRANSISTOR ARRAY SUBSTRATE AND ORGANIC LIGHT-EMITTING DISPLAY DEVICE INCLUDING THE SAME | October 2023 | August 2024 | Allow | 11 | 1 | 0 | No | No |
| 18285836 | ACCUMULATION GATE FOR QUANTUM DEVICE | October 2023 | January 2026 | Allow | 27 | 0 | 0 | No | No |
| 18479630 | SEMICONDUCTOR DEVICES WITH DISSIMLAR MATERIALS AND METHODS | October 2023 | August 2024 | Allow | 11 | 1 | 0 | No | No |
| 18375193 | LEAD FRAME AND MANUFACTURING METHOD THEREOF | September 2023 | March 2024 | Allow | 6 | 2 | 0 | No | No |
| 18372716 | SEMICONDUCTOR DEVICE | September 2023 | September 2024 | Allow | 12 | 2 | 0 | No | No |
| 18463290 | METHOD FOR MANUFACTURING LIGHT EMITTING DEVICES | September 2023 | May 2024 | Allow | 8 | 0 | 0 | No | No |
| 18242076 | SEMICONDUCTOR DEVICE WITH ELECTRODE HAVING STEP-SHAPED SIDEWALL AND METHOD FOR PREPARING THE SAME | September 2023 | December 2025 | Allow | 28 | 0 | 0 | No | No |
| 18452517 | DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME | August 2023 | April 2024 | Allow | 8 | 0 | 0 | No | No |
| 18234609 | SEMICONDUCTOR PACKAGE | August 2023 | March 2026 | Allow | 31 | 0 | 1 | No | No |
| 18449769 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | August 2023 | March 2026 | Allow | 31 | 1 | 0 | No | No |
| 18233899 | MIM CAPACITOR AND FABRICATING METHOD OF THE SAME | August 2023 | December 2025 | Allow | 28 | 1 | 0 | No | No |
| 18231754 | HIGH DENSITY METAL INSULATOR METAL CAPACITOR | August 2023 | September 2024 | Allow | 13 | 2 | 0 | No | No |
| 18363456 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE | August 2023 | August 2024 | Allow | 12 | 1 | 0 | No | No |
| 18360941 | HIGH CAPACITANCE MIM DEVICE WITH SELF ALIGNED SPACER | July 2023 | July 2024 | Allow | 12 | 1 | 0 | No | No |
| 18361331 | FERROELECTRIC CHANNEL FIELD EFFECT TRANSISTOR | July 2023 | August 2024 | Allow | 13 | 2 | 0 | No | No |
| 18226861 | Metal-Insulator-Metal Capacitor Within Metallization Structure | July 2023 | January 2025 | Allow | 18 | 1 | 0 | No | No |
| 18358511 | METHODS AND SYSTEMS OF FORMING METAL INTERCONNECT LAYERS USING ENGINEERED TEMPLATES | July 2023 | August 2024 | Allow | 13 | 1 | 0 | No | No |
| 18358529 | FINFET DEVICE AND METHOD OF FORMING SAME | July 2023 | September 2024 | Allow | 14 | 2 | 0 | No | No |
| 18356239 | SEMICONDUCTOR DEVICE | July 2023 | October 2025 | Allow | 27 | 1 | 0 | No | No |
| 18224462 | DISPLAY DEVICE | July 2023 | January 2026 | Allow | 30 | 0 | 0 | No | No |
| 18354573 | Ferroelectric Tunnel Junction Devices with a Sparse Seed Layer and Methods for Forming the Same | July 2023 | May 2024 | Allow | 10 | 1 | 0 | No | No |
| 18350397 | CAPACITOR AND ELECTRONIC DEVICE INCLUDING THE SAME | July 2023 | September 2025 | Allow | 26 | 0 | 0 | No | No |
| 18219247 | SEMICONDUCTOR STRUCTURES HAVING DEEP TRENCH CAPACITOR AND METHODS FOR MANUFACTURING THE SAME | July 2023 | September 2024 | Allow | 15 | 1 | 1 | No | No |
| 18346403 | OFFSET PADS OVER TSV | July 2023 | October 2024 | Allow | 16 | 1 | 0 | No | No |
| 18342752 | SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOF | June 2023 | June 2024 | Allow | 11 | 1 | 0 | No | No |
| 18342861 | MULTI-LATERAL RECESSED MIM STRUCTURE | June 2023 | January 2026 | Allow | 31 | 1 | 0 | No | No |
| 18335167 | CAPPING LAYER OVER FET FERAM TO INCREASE CHARGE MOBILITY | June 2023 | June 2024 | Allow | 12 | 1 | 0 | No | No |
| 18209499 | DISPLAY PANEL | June 2023 | April 2024 | Allow | 10 | 1 | 0 | No | No |
| 18206655 | SEMICONDUCTOR DEVICE, SEMICONDUCTOR WAFER, MEMORY DEVICE, AND ELECTRONIC DEVICE | June 2023 | January 2024 | Allow | 7 | 0 | 0 | No | No |
| 18206520 | MEMS RESONATOR SYSTEM | June 2023 | January 2024 | Allow | 8 | 0 | 0 | No | No |
| 18206097 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | June 2023 | May 2024 | Allow | 12 | 1 | 0 | No | No |
| 18329729 | SEMICONDUCTOR DEVICE STRUCTURE WITH ELECTRODE LAYER AND METHOD FOR FORMING THE SAME | June 2023 | February 2026 | Allow | 32 | 0 | 1 | No | No |
| 18327869 | SEMICONDUCTOR TRENCH CAPACITOR STRUCTURE AND MANUFACTURING METHOD THEREOF | June 2023 | June 2024 | Allow | 12 | 1 | 0 | No | No |
| 18203816 | SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING SAME | May 2023 | January 2026 | Allow | 32 | 1 | 0 | No | No |
| 18326115 | Gate Spacer Structure and Method of Forming Same | May 2023 | April 2024 | Allow | 10 | 1 | 0 | No | No |
| 18326218 | FERROELECTRIC STRUCTURE LINING CONDUCTIVE INTERCONNECT STRUCTURE | May 2023 | January 2026 | Allow | 32 | 1 | 0 | No | No |
| 18314572 | SEMICONDUCTOR DEVICE | May 2023 | December 2023 | Allow | 7 | 0 | 0 | No | No |
| 18310022 | ELECTRONIC DEVICE INCLUDING FERROELECTRIC LAYER | May 2023 | May 2024 | Allow | 12 | 1 | 0 | No | No |
| 18300388 | SEMICONDUCTOR DEVICE INCLUDING CAPACITOR AND METHOD FOR FABRICATING THE SAME | April 2023 | November 2025 | Allow | 31 | 1 | 0 | No | No |
| 18297868 | SEMICONDUCTOR DEVICE STRUCTURE | April 2023 | March 2024 | Allow | 11 | 1 | 0 | No | No |
| 18298095 | Reducing Pattern Loading in the Etch-Back of Metal Gate | April 2023 | February 2024 | Allow | 11 | 1 | 0 | No | No |
| 18297677 | SEMICONDUCTOR DEVICE AND IMAGING DEVICE | April 2023 | September 2025 | Allow | 29 | 0 | 0 | No | No |
| 18297260 | COMPOSITION FOR SEMICONDUCTOR PROCESSING AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE USING THE SAME | April 2023 | October 2025 | Allow | 31 | 0 | 0 | No | No |
| 18297282 | TRENCH CAPACITOR STRUCTURE AND METHODS OF MANUFACTURING | April 2023 | February 2026 | Allow | 35 | 1 | 1 | Yes | No |
| 18131439 | REVERSE BLOCKING INSULATED-GATE BIPOLAR TRANSISTOR | April 2023 | February 2026 | Allow | 34 | 1 | 0 | No | No |
| 18192681 | SEMICONDUCTOR DEVICE, FERROELECTRIC CAPACITOR AND LAMINATED STRUCTURE | March 2023 | March 2024 | Allow | 11 | 1 | 0 | No | No |
| 18189053 | METAMATERIAL OXIDE CAPACITOR | March 2023 | July 2023 | Allow | 4 | 0 | 0 | No | No |
| 18119896 | SEMICONDUCTOR DEVICE | March 2023 | September 2025 | Allow | 30 | 0 | 0 | No | No |
| 18176656 | SEMICONDUCTOR MEMORY DEVICE | March 2023 | February 2024 | Allow | 11 | 2 | 0 | No | No |
| 18173874 | HALL EFFECT SENSOR WITH LOW OFFSET AND HIGH LEVEL OF STABILITY | February 2023 | August 2023 | Allow | 6 | 1 | 0 | No | No |
| 18170514 | METHOD FOR MANUFACTURING CAPACITOR ARRAY, CAPACITOR ARRAY, AND SEMICONDUCTOR DEVICE | February 2023 | September 2025 | Allow | 31 | 1 | 1 | No | No |
| 18041081 | MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AND ELECTRONIC APPARATUS | February 2023 | February 2026 | Allow | 36 | 1 | 0 | No | No |
| 18165384 | SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREFOR | February 2023 | October 2025 | Allow | 32 | 1 | 0 | No | No |
| 18165316 | CAPACITOR ARRAY AND METHOD FOR FORMING THE SAME | February 2023 | July 2023 | Allow | 5 | 0 | 0 | No | No |
| 18163252 | SEMICONDUCTOR PACKAGES | February 2023 | May 2024 | Allow | 16 | 1 | 0 | No | No |
| 18102661 | Integrated Assemblies and Methods Forming Integrated Assemblies | January 2023 | November 2025 | Allow | 34 | 2 | 1 | No | No |
| 18098960 | SEMICONDUCTOR DEVICE | January 2023 | January 2026 | Allow | 36 | 1 | 0 | No | No |
| 18154218 | DIELECTRIC THIN-FILM STRUCTURE AND ELECTRONIC DEVICE INCLUDING THE SAME | January 2023 | November 2023 | Allow | 10 | 1 | 0 | No | No |
| 18151825 | THIN FILM TRANSISTOR ARRAY SUBSTRATE AND ORGANIC LIGHT-EMITTING DISPLAY DEVICE INCLUDING THE SAME | January 2023 | July 2023 | Allow | 6 | 0 | 0 | No | No |
| 18093948 | INTEGRATED CIRCUIT DEVICES AND METHODS OF MANUFACTURING THE SAME | January 2023 | October 2023 | Allow | 10 | 0 | 0 | No | No |
| 18092162 | MULTISTACK METAL-INSULATOR-METAL (MIM) STRUCTURE USING SPACER FORMATION PROCESS FOR HETEROGENEOUS INTEGRATION WITH DISCRETE CAPACITORS | December 2022 | December 2025 | Allow | 36 | 1 | 0 | Yes | No |
| 18148327 | MOLDED DIRECT BONDED AND INTERCONNECTED STACK | December 2022 | October 2023 | Allow | 9 | 1 | 0 | No | No |
| 18147289 | SEMICONDUCTOR DEVICE INCLUDING DIELECTRIC LAYER AND METHOD OF FORMING THE SAME | December 2022 | October 2025 | Allow | 33 | 1 | 0 | Yes | No |
| 18012553 | THIN FILM CAPACITOR, ITS MANUFACTURING METHOD, AND ELECTRONIC CIRCUIT SUBSTRATE HAVING THE THIN FILM CAPACITOR | December 2022 | May 2025 | Allow | 28 | 0 | 0 | No | No |
| 18085530 | MICRO ELEMENT STRUCTURE AND DISPLAY DEVICE | December 2022 | July 2025 | Allow | 31 | 1 | 0 | No | No |
| 18083731 | DISPLAY DEVICE | December 2022 | August 2025 | Allow | 32 | 1 | 0 | No | No |
| 18084431 | ELECTROMAGNETIC SHIELDING STRUCTURE | December 2022 | January 2026 | Allow | 37 | 1 | 0 | Yes | No |
| 18067352 | METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | December 2022 | July 2025 | Allow | 31 | 1 | 1 | No | No |
| 18079901 | SEMICONDUCTOR DEVICE | December 2022 | August 2023 | Allow | 8 | 1 | 0 | No | No |
| 18078100 | SEMICONDUCTOR MEMORY DEVICE | December 2022 | November 2023 | Allow | 11 | 1 | 0 | No | No |
| 18076780 | TRENCH PATTERN FOR TRENCH CAPACITOR YIELD IMPROVEMENT | December 2022 | August 2023 | Allow | 9 | 1 | 0 | No | No |
| 18062152 | SEMICONDUCTOR DEVICES WITH DISSIMLAR MATERIALS AND METHODS | December 2022 | July 2023 | Allow | 8 | 1 | 0 | No | No |
| 17993943 | SEMICONDUCTOR DEVICE | November 2022 | September 2025 | Allow | 33 | 0 | 1 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner DIAZ, JOSE R.
With a 10.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 17.5% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the bottom 25% across the USPTO, indicating that filing appeals is less effective here than in most other areas.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner DIAZ, JOSE R works in Art Unit 2815 and has examined 1,198 patent applications in our dataset. With an allowance rate of 83.1%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 25 months.
Examiner DIAZ, JOSE R's allowance rate of 83.1% places them in the 57% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by DIAZ, JOSE R receive 1.79 office actions before reaching final disposition. This places the examiner in the 40% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by DIAZ, JOSE R is 25 months. This places the examiner in the 80% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +7.3% benefit to allowance rate for applications examined by DIAZ, JOSE R. This interview benefit is in the 36% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 29.8% of applications are subsequently allowed. This success rate is in the 57% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 33.7% of cases where such amendments are filed. This entry rate is in the 50% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 114.3% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 80% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 73.7% of appeals filed. This is in the 62% percentile among all examiners. Of these withdrawals, 71.4% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.
When applicants file petitions regarding this examiner's actions, 49.4% are granted (fully or in part). This grant rate is in the 45% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 6.5% of allowed cases (in the 89% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 4.2% of allowed cases (in the 78% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.