USPTO Examiner SAYADIAN HRAYR - Art Unit 2814

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
17138917SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHODDecember 2020September 2024Allow4411NoNo
17129667THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES AND METHODS OF FABRICATING THE SAMEDecember 2020October 2022Allow2200NoNo
17112894LOW STRESS INTEGRATED DEVICE PACKAGEDecember 2020March 2023Allow2711NoNo
17108752SEMICONDUCTOR DEVICE INCLUDING BURIED CONDUCTIVE FINGERS AND METHOD OF MAKING THE SAMEDecember 2020January 2024Allow3701YesNo
17106181WAVEGUIDE DUAL-DEPLETION REGION (DDR) PHOTODIODESNovember 2020October 2023Abandon3401NoNo
17102957MICROELECTRONICS PACKAGE WITH VERTICALLY STACKED MEMS DEVICE AND CONTROLLER DEVICENovember 2020June 2024Allow4341YesYes
17087915INTEGRATED CIRCUITS INCLUDING STANDARD CELL STRUCTURES AND LAYOUT METHODSNovember 2020January 2024Abandon3921NoNo
17084872NANOBIO SENSING DEVICEOctober 2020January 2023Allow2701NoNo
17072480SUBSTRATE PROCESSING METHOD AND DEVICE MANUFACTURED BY THE SAMEOctober 2020October 2021Allow1200NoNo
17068396SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICEOctober 2020September 2021Allow1200NoNo
17019553SEMICONDUCTOR DEVICE HAVING BURIED GATE STRUCTURE AND METHOD FOR FABRICATING THE SAMESeptember 2020October 2020Allow100YesNo
17018276STRAIN GAUGE WITH MECHANICALLY DECOUPLED TEMPERATURE SENSORSeptember 2020March 2021Allow610NoNo
17017721SEMICONDUCTOR MEMORY DEVICESeptember 2020July 2023Allow3411NoNo
17017551Cell ArchitectureSeptember 2020September 2022Allow2400NoNo
17011667METHODS OF SELECTIVE DEPOSITIONSeptember 2020October 2024Allow4912NoNo
16984999MEMS SENSORAugust 2020January 2023Allow3001NoNo
16944173PACKAGE STRUCTUREJuly 2020July 2022Allow2321YesNo
16943591Via Rail StructureJuly 2020December 2023Abandon4021YesNo
16934792SOLID-STATE IMAGING DEVICE, MANUFACTURING METHOD THEREOF, AND ELECTRONIC DEVICEJuly 2020September 2020Allow200NoNo
16931164NON-VOLATILE SEMICONDUCTOR MEMORY DEVICEJuly 2020April 2024Allow4541YesNo
16961059GRAPHENE BASED CONTACT LAYERS FOR ELECTRONIC DEVICESJuly 2020July 2022Abandon2420YesNo
16924010IMAGE PICK-UP APPARATUSJuly 2020September 2021Allow1510YesNo
16920428SEMICONDUCTOR DEVICE WITH INTEGRATED CAPACITOR AND MANUFACTURING METHOD THEREOFJuly 2020June 2021Allow1101NoNo
16900640SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD OF THE SAMEJune 2020November 2021Allow1710NoNo
16900034Light-Emitting Device and Method for Manufacturing Light-Emitting DeviceJune 2020January 2022Allow1900YesNo
16888416ELECTRONIC DEVICEMay 2020July 2022Allow2601YesNo
16883780DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAMEMay 2020September 2020Allow400NoNo
16880230SEMICONDUCTOR MEMORY DEVICEMay 2020October 2022Allow2901NoNo
16874045PROCESS AND STRUCTURE OF OVERLAY OFFSET MEASUREMENTMay 2020November 2022Allow3011NoNo
16859437THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES AND METHODS OF FABRICATING THE SAMEApril 2020September 2020Allow500YesNo
16859917DISPLAY DEVICEApril 2020January 2021Allow810NoNo
16858178SOLID-STATE IMAGING DEVICE, MANUFACTURING METHOD THEREOF, AND ELECTRONIC DEVICEApril 2020July 2022Allow2721YesNo
16758553SOLID-STATE IMAGING DEVICE AND ELECTRONIC APPARATUSApril 2020October 2022Allow3001NoNo
16842954PLANAR INTEGRATED CIRCUIT PACKAGE INTERCONNECTSApril 2020November 2021Allow1910NoNo
16842909MANUFACTURING METHOD OF IMAGE SENSING DEVICEApril 2020January 2022Allow2220NoNo
16832398METHOD OF FABRICATION OF A PHOTONIC CHIP COMPRISING AN SACM-APD PHOTODIODE OPTICALLY COUPLED TO AN INTEGRATED WAVEGUIDEMarch 2020October 2021Allow1801NoNo
16830662Integrated Memory with Redistribution of Capacitor Connections, and Methods of Forming Integrated MemoryMarch 2020July 2022Allow2701NoNo
16649949MICROELECTRONIC ASSEMBLIESMarch 2020May 2023Allow3701YesNo
16825593COMPOSITE STRUCTURESMarch 2020August 2023Allow4130NoNo
16822329Multi-Layer Die AttachmentMarch 2020March 2022Allow2411YesNo
16819686MULTIFUNCTIONAL METAMATERIAL-BASED OPTICAL DEVICEMarch 2020October 2021Allow1901NoNo
16819902LEADFRAMES WITH FOLDED CONDUCTOR PORTION AND DEVICES THEREFROMMarch 2020October 2022Allow3111NoNo
16820549Precision CapacitorMarch 2020September 2022Allow3021NoNo
16808467PATTERN GENERATION DEVICE, PATTERN GENERATION METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICEMarch 2020February 2022Allow2410YesNo
16794022SEMICONDUCTOR MEMORY DEVICEFebruary 2020March 2023Allow3601NoNo
16792114HETEROGENEOUS INTEGRATED CIRCUIT FOR SHORT WAVELENGTHSFebruary 2020March 2022Allow2511YesNo
16790386WIDE CHANNEL GATE STRUCTUREFebruary 2020March 2022Allow2511YesNo
16787371PHASE CHANGE MEMORY WITH A CARBON BUFFER LAYERFebruary 2020April 2022Abandon2620YesNo
16785704PHOSPHOR AND LIGHT SOURCE DEVICEFebruary 2020August 2024Abandon5411YesNo
16773100HIGH-FREQUENCY MODULEJanuary 2020March 2023Allow3811NoNo
16746046METHOD AND STRUCTURE TO REDUCE CELL WIDTH IN SEMICONDUCTOR DEVICEJanuary 2020January 2023Allow3621YesNo
16745331SEMICONDUCTOR DEVICE PACKAGE AND THE METHOD OF MANUFACTURING THE SAMEJanuary 2020April 2023Allow3931YesNo
16743367PASSIVE MAGNETIC DEVICESJanuary 2020July 2020Allow600NoNo
16740482SEMICONDUCTOR STRUCTURE AND METHOD FOR FABRICATING THE SAMEJanuary 2020April 2022Allow2711NoNo
16738981SELECTIVE NITRIDED GATE-OXIDE FOR RTS NOISE AND WHITE-PIXEL REDUCTIONJanuary 2020March 2023Allow3811YesNo
16734456SEMICONDUCTOR DEVICES INCLUDING THROUGH VIAS AND METHODS OF FABRICATING THE SAMEJanuary 2020November 2021Allow2301NoNo
16733651DISPLAY SUBSTRATE AND DISPLAY APPARATUS INCLUDING THE SAMEJanuary 2020April 2021Allow1520YesNo
16732202DUAL POWER STRUCTURE WITH EFFICIENT LAYOUTDecember 2019July 2024Allow5421NoNo
16726622LED LIGHTING APPARATUS HAVING ADDITIONAL FUNCTIONDecember 2019January 2024Allow4911NoNo
16722865Space Optimization Between SRAM Cells and Standard CellsDecember 2019January 2023Allow3721YesNo
16721940LAYOUT OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING SEMICONDUCTOR DEVICEDecember 2019June 2021Allow1801NoNo
16721380VERTICAL 2-TRANSISTOR MEMORY CELLDecember 2019January 2024Allow4821NoNo
16719418DISPLAY PANEL AND DISPLAY APPARATUS INCLUDING THE SAMEDecember 2019January 2024Allow4911NoNo
16624205IMAGING ELEMENT, STACKED IMAGING ELEMENT, AND SOLID-STATE IMAGING APPARATUSDecember 2019January 2023Allow3721YesNo
16702576SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMEDecember 2019May 2023Abandon4151YesNo
16698766MEMS DEVICENovember 2019April 2022Abandon2920YesNo
16695511LIGHT EMITTING APPARATUS AND METHOD FOR PRODUCING THE SAMENovember 2019October 2021Allow2210YesNo
16679508Fabrication of Large Height Top Metal Electrode for Sub-60nm Magnetoresistive Random Access Memory (MRAM) DevicesNovember 2019March 2021Allow1700NoNo
16679427VERTICAL TRANSPORT FET DEVICES HAVING A SACRIFICIAL DOPED LAYERNovember 2019June 2020Allow701NoNo
16679638METHOD FOR DIAGNOSING CANCER AND KIT THEREFORNovember 2019July 2022Allow3200NoNo
16667156VIA CLEANING TO REDUCE RESISTANCEOctober 2019October 2022Allow3621YesNo
16664651Devices, Structures, Materials and Methods for Vertical Light Emitting Transistors and Light Emitting DisplaysOctober 2019July 2021Allow2101NoNo
16658461MEMS Transducer for Interacting with a Volume Flow of a Fluid, and Method of Producing SameOctober 2019September 2022Allow3511NoNo
16605155MEMS DEVICE AND PROCESSOctober 2019March 2022Allow2910NoNo
16592425OHMIC CONTACTS FOR SEMICONDUCTOR STRUCTURESOctober 2019January 2021Allow1510NoNo
16499737IMAGE SENSOR, FOCUS ADJUSTMENT DEVICE, AND IMAGING DEVICESeptember 2019March 2022Allow2901NoNo
16583670CURRENT SENSING DEVICE AND ORGANIC LIGHT EMITTING DISPLAY DEVICE INCLUDING THE SAMESeptember 2019October 2022Allow3721YesNo
16577475ORGANIC LIGHT EMITTING DIODE DISPLAYSeptember 2019June 2020Allow900NoNo
16491328SEMICONDUCTOR DEVICESeptember 2019July 2021Abandon2220YesNo
16557181Method and Apparatus for improved Circuit Structure Thermal Reliability on Printed Circuit Board MaterialsAugust 2019July 2022Allow3510NoNo
16536769TRANSISTOR WITH CONTACTED DEEP WELL REGIONAugust 2019January 2021Allow1700NoNo
16509367SEMICONDUCTOR INTEGRATED DEVICE WITH ELECTRICAL CONTACTS BETWEEN STACKED DIES AND CORRESPONDING MANUFACTURING PROCESSJuly 2019October 2020Allow1510NoNo
16453719MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICEJune 2019June 2020Allow1200NoNo
16438573VERTICAL FET DEVICES WITH MULTIPLE CHANNEL LENGTHSJune 2019November 2020Allow1700YesNo
16426579METHOD TO CO-INTEGRATE SiGe AND Si CHANNELS FOR FINFET DEVICESMay 2019January 2023Allow4421YesNo
16411194MAGNETORESISTIVE STACK/STRUCTURE AND METHODS THEREFORMay 2019June 2020Allow1300NoNo
16347724SURFACE ACOUSTIC WAVE RESONATOR STRUCTUREMay 2019February 2023Abandon4530YesNo
16403596SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMEMay 2019May 2022Allow3630NoNo
16403316VERTICAL MEMORY DEVICEMay 2019November 2021Allow3011YesNo
16402471UNIFORM WORK FUNCTION METAL RECESS FOR VERTICAL TRANSISTOR COMPLEMENTARY METAL OXIDE SEMICONDUCTOR TECHNOLOGYMay 2019May 2021Allow2511YesNo
16402633DEVICE OVER PHOTODETECTOR PIXEL SENSORMay 2019March 2021Allow2201NoNo
16402292SEMICONDUCTOR DEVICES INCLUDING A STRESS PATTERNMay 2019August 2021Allow2701YesNo
16402357ARCHITECTURE OF THREE-DIMENSIONAL MEMORY DEVICE AND METHODS REGARDING THE SAMEMay 2019September 2021Allow2811NoNo
16403405MULTI PIXEL MICRO LENS PIXEL ARRAY AND CAMERA SYSTEM FOR SOLVING COLOR MIX AND OPERATING METHOD THEREOFMay 2019October 2020Allow1801NoNo
16402126MRAM DEVICE FORMATION WITH IN-SITU ENCAPSULATIONMay 2019July 2020Allow1500YesNo
16391815SEMICONDUCTOR DEVICEApril 2019October 2020Allow1811NoNo
16386826BACK-SIDE ILLUMINATED IMAGE SENSORApril 2019September 2020Allow1700NoNo
16383082SEMICONDUCTOR DEVICE HAVING BURIED GATE STRUCTURE AND METHOD FOR FABRICATING THE SAMEApril 2019June 2020Allow1400NoNo
16381485ELECTRODE STRUCTURE FOR FIELD EFFECT TRANSISTORApril 2019September 2021Allow2911NoNo
16380953METHOD OF FABRICATING SEMICONDUCTOR DEVICEApril 2019December 2020Allow2020YesNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner SAYADIAN, HRAYR.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
11
Examiner Affirmed
5
(45.5%)
Examiner Reversed
6
(54.5%)
Reversal Percentile
81.0%
Higher than average

What This Means

With a 54.5% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.

Strategic Value of Filing an Appeal

Total Appeal Filings
48
Allowed After Appeal Filing
20
(41.7%)
Not Allowed After Appeal Filing
28
(58.3%)
Filing Benefit Percentile
69.1%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 41.7% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.

Strategic Recommendations

Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner SAYADIAN, HRAYR - Prosecution Strategy Guide

Executive Summary

Examiner SAYADIAN, HRAYR works in Art Unit 2814 and has examined 717 patent applications in our dataset. With an allowance rate of 69.5%, this examiner has a below-average tendency to allow applications. Applications typically reach final disposition in approximately 34 months.

Allowance Patterns

Examiner SAYADIAN, HRAYR's allowance rate of 69.5% places them in the 33% percentile among all USPTO examiners. This examiner has a below-average tendency to allow applications.

Office Action Patterns

On average, applications examined by SAYADIAN, HRAYR receive 1.92 office actions before reaching final disposition. This places the examiner in the 43% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by SAYADIAN, HRAYR is 34 months. This places the examiner in the 44% percentile for prosecution speed. Prosecution timelines are slightly slower than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a -2.9% benefit to allowance rate for applications examined by SAYADIAN, HRAYR. This interview benefit is in the 8% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 23.8% of applications are subsequently allowed. This success rate is in the 36% percentile among all examiners. Strategic Insight: RCEs show below-average effectiveness with this examiner. Carefully evaluate whether an RCE or continuation is the better strategy.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 13.3% of cases where such amendments are filed. This entry rate is in the 15% percentile among all examiners. Strategic Recommendation: This examiner rarely enters after-final amendments compared to other examiners. You should generally plan to file an RCE or appeal rather than relying on after-final amendment entry. Per MPEP § 714.12, primary examiners have discretion in entering after-final amendments, and this examiner exercises that discretion conservatively.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 70.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 59% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 73.2% of appeals filed. This is in the 62% percentile among all examiners. Of these withdrawals, 46.7% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.

Petition Practice

When applicants file petitions regarding this examiner's actions, 30.9% are granted (fully or in part). This grant rate is in the 17% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 3.9% of allowed cases (in the 83% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 10.0% of allowed cases (in the 90% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Plan for RCE after final rejection: This examiner rarely enters after-final amendments. Budget for an RCE in your prosecution strategy if you receive a final rejection.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.