Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18741463 | Non-Interleaving N-Well And P-Well Pickup Region Design For Ic Devices | June 2024 | July 2025 | Allow | 13 | 1 | 0 | No | No |
| 18734635 | TRANSISTORS WITH STACKED CHANNELS AND THE METHODS OF FORMING THE SAME | June 2024 | June 2025 | Allow | 12 | 1 | 1 | No | No |
| 18676161 | LIGHT DETECTING DEVICE WITH OXIDE SEMICONDUCTOR TRANSITORS | May 2024 | January 2026 | Allow | 20 | 2 | 1 | No | No |
| 18608045 | FIN-BASED WELL STRAPS FOR IMPROVING MEMORY MACRO PERFORMANCE | March 2024 | September 2025 | Allow | 18 | 1 | 1 | Yes | No |
| 18582162 | CAPACITOR NETWORKS FOR HARMONIC CONTROL IN POWER DEVICES | February 2024 | April 2025 | Allow | 14 | 1 | 0 | No | No |
| 18413716 | Fin Field-Effect Transistor Device with Composite Liner for the Fin | January 2024 | May 2025 | Allow | 16 | 2 | 0 | Yes | No |
| 18384916 | FINGERPRINT SENSOR, METHOD FOR MANUFACTURING FINGERPRINT SENSOR, AND DISPLAY DEVICE INCLUDING FINGERPRINT SENSOR | October 2023 | September 2024 | Allow | 11 | 0 | 0 | No | No |
| 18475675 | SILICON CARBIDE SEMICONDUCTOR DEVICE | September 2023 | February 2026 | Allow | 28 | 0 | 0 | No | No |
| 18470254 | Display Panel and Thin Film Transistor Including a Control Electrode comprising Molybdenum, Nitrogen and Chlorine | September 2023 | February 2026 | Allow | 29 | 0 | 1 | No | No |
| 18369814 | DISPLAY DEVICE HAVING FRACTURE RESISTANCE | September 2023 | December 2024 | Allow | 14 | 0 | 1 | No | No |
| 18244423 | INTEGRATION OF MULTIMODAL TRANSISTORS WITH TRANSISTOR FABRICATION SEQUENCE | September 2023 | January 2026 | Allow | 28 | 0 | 0 | No | No |
| 18447857 | SEMICONDUCTOR DEVICE HAVING INTERLEAVED CLOCK GATE BLOCKS AND DECOUPLING CAPACITOR BLOCKS AND METHOD OF OPERATING SAME | August 2023 | July 2025 | Allow | 23 | 2 | 1 | Yes | No |
| 18365065 | Image Sensing Device Including Overcoating Layer Between Color Filters and Method of Manufacturing The Same | August 2023 | February 2026 | Allow | 31 | 0 | 1 | No | No |
| 18228782 | An Array Of Capacitors, An Array Of Memory Cells, Method Used In Forming An Array Of Memory Cells, Methods Used In Forming An Array Of Capacitors, And Methods Used In Forming A Plurality Of Horizontally-Spaced Conductive Lines | August 2023 | January 2026 | Allow | 30 | 0 | 1 | No | No |
| 18362561 | METHOD OF MAKING SOI DEVICE FROM BULK SILICON SUBSTRATE AND SOI DEVICE | July 2023 | December 2025 | Allow | 28 | 0 | 0 | No | No |
| 18362076 | LIGHT SENSOR FOR PACKAGE INTRUSION DETECTION | July 2023 | February 2026 | Allow | 31 | 0 | 1 | No | No |
| 18360622 | IMAGE SENSING DEVICE HAVING PHOTOELECTRIC CONVERSION ELEMENT | July 2023 | February 2026 | Allow | 31 | 1 | 0 | No | No |
| 18357995 | STRUCTURE AND METHOD OF POWER SUPPLY ROUTING IN SEMICONDUCTOR DEVICE | July 2023 | November 2024 | Allow | 16 | 0 | 1 | No | No |
| 18219722 | METHOD OF FABRICATING SEMICONDUCTOR DEVICE HAVING BIT LINE COMPRISING A PLURALITY OF PINS EXTENDING TOWARD THE SUBSTRATE | July 2023 | November 2024 | Allow | 16 | 1 | 0 | No | No |
| 18349437 | TRANSPARENT REFRACTION STRUCTURE FOR AN IMAGE SENSOR AND METHODS OF FORMING THE SAME | July 2023 | May 2025 | Allow | 23 | 2 | 1 | Yes | No |
| 18348430 | Split Stack Triple Height Cell | July 2023 | February 2025 | Allow | 19 | 1 | 1 | No | No |
| 18213758 | COMPLEMENTARY MOS FETS VERTICALLY ARRANGED AND INCLUDING MULTIPLE DIELECTRIC LAYERS SURROUNDING THE MOS FETS | June 2023 | January 2025 | Allow | 19 | 1 | 0 | No | No |
| 18204548 | METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE COMPRISING EDGE WORD LINE AND CENTRAL WORD LINE | June 2023 | September 2025 | Allow | 27 | 1 | 0 | No | No |
| 18322620 | BACKSIDES SUBTRACTIVE M1 PATTERNING WITH BACKSIDE CONTACT REPAIR FOR TIGHT N2P SPACE | May 2023 | January 2026 | Allow | 32 | 0 | 1 | No | No |
| 18322212 | WRAPAROUND GATE STRUCTURE | May 2023 | March 2026 | Allow | 34 | 1 | 0 | No | No |
| 18320523 | IMAGE SENSOR WITH DUAL TRENCH ISOLATION STRUCTURE | May 2023 | July 2025 | Allow | 25 | 2 | 1 | No | No |
| 18319716 | MANUFACTURING METHOD OF PILLAR-SHAPED SEMICONDUCTOR DEVICE | May 2023 | November 2025 | Allow | 30 | 0 | 1 | No | No |
| 18316005 | DIFFERENT DIFFUSION BREAK STRUCTURES FOR THREE-DIMENSIONAL STACKED SEMICONDUCTOR DEVICE | May 2023 | December 2025 | Allow | 31 | 1 | 0 | Yes | No |
| 18310743 | System and Method for Aligned Stitching | May 2023 | July 2024 | Allow | 15 | 0 | 0 | No | No |
| 18139981 | MONOLITHIC INTEGRATION OF DIVERSE DEVICE TYPES WITH SHARED ELECTRICAL ISOLATION | April 2023 | September 2025 | Allow | 29 | 1 | 1 | No | No |
| 18305261 | IMAGE SENSOR DEVICE WITH LIGHT BLOCKING STRUCTURE AND ADHESION LAYER EMBEDDED IN OXIDE LAYER | April 2023 | December 2025 | Allow | 32 | 4 | 1 | No | No |
| 18299878 | SEMICONDUCTOR DEVICE WITH MICROLENS LAYER AND CAMERA INCLUDING THE SAME | April 2023 | September 2024 | Allow | 17 | 1 | 0 | No | No |
| 18123729 | MAGNETORESISTIVE STACK/STRUCTURE AND METHODS THEREFOR | March 2023 | July 2024 | Allow | 16 | 1 | 1 | Yes | No |
| 18179598 | FERROELECTRIC STRUCTURE INCLUDING A FERROELECTRIC FILM HAVING A FIRST NET POLARIZATION ORIENTED TOWARD A FIRST POLARIZATION ENHANCEMENT FILM AND SEMICONDUCTOR DEVICE INCLUDING THE SAME | March 2023 | August 2024 | Allow | 17 | 1 | 1 | No | No |
| 18118037 | SEMICONDUCTOR DEVICE HAVING FIN STRUCTURES WITH UNEQUAL CHANNEL HEIGHTS AND MANUFACTURING METHOD THEREOF | March 2023 | January 2025 | Allow | 23 | 2 | 1 | No | No |
| 18178913 | SEMICONDUCTOR DEVICE WITH EQUIPOTENTIAL RING ELECTRODE | March 2023 | July 2024 | Allow | 17 | 1 | 0 | No | No |
| 18178445 | SEMICONDUCTOR DEVICE INCLUDING CONTROL ELECTRODE WITH THREE CONTROL PARTS | March 2023 | November 2025 | Allow | 33 | 1 | 0 | No | No |
| 18170794 | MICROWAVE INTEGRATED CIRCUITS INCLUDING GALLIUM-NITRIDE DEVICES ON SILICON | February 2023 | November 2025 | Allow | 33 | 1 | 0 | No | No |
| 18162818 | SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME WITH MULTIPLE GATE CONDUCTIVE LAYERS HAVING DIFFERENT CHARACTERISTICS | February 2023 | March 2026 | Allow | 37 | 2 | 1 | No | No |
| 18096391 | IMAGE SENSING DEVICE INCLUDING GRID STRUCTURES HAVING DIFFERENT HEIGHTS | January 2023 | October 2024 | Allow | 21 | 1 | 1 | No | No |
| 18095041 | SEMICONDUCTOR DEVICE INCLUDING ACTIVE REGION AND SEMICONDUCTOR LAYER ON SIDE SURFACE OF ACTIVE REGION | January 2023 | January 2026 | Allow | 37 | 1 | 1 | Yes | No |
| 18083619 | MODULE PACKAGE WITH HIGH ILLUMINATION EFFICIENCY | December 2022 | June 2024 | Allow | 18 | 1 | 0 | No | No |
| 18064705 | Attachment of Stress Sensitive Integrated Circuit Dies | December 2022 | March 2025 | Abandon | 27 | 2 | 1 | No | No |
| 18059701 | Semiconductor Device Having Conductive Field Plate Overlapping an Edge of an Active Region | November 2022 | June 2024 | Allow | 19 | 0 | 1 | No | No |
| 18070303 | Integrated Circuit Structure with Hybrid Cell Design | November 2022 | July 2024 | Allow | 20 | 0 | 1 | No | No |
| 18057688 | Isolation Structures | November 2022 | April 2024 | Allow | 17 | 0 | 1 | No | No |
| 17985861 | INTEGRATED STRUCTURE WITH TRAP RICH REGIONS AND LOW RESISTIVITY REGIONS | November 2022 | December 2025 | Allow | 37 | 2 | 0 | No | No |
| 17984261 | PHOTOSENSITIVE SEMICONDUCTOR DEVICE INCLUDING HETEROJUNCTION PHOTODIODE | November 2022 | June 2024 | Allow | 19 | 1 | 0 | No | No |
| 17984243 | PHOTOSENSITIVE SEMICONDUCTOR DEVICE INCLUDING HETEROJUNCTION PHOTODIODE | November 2022 | June 2024 | Allow | 19 | 1 | 0 | No | No |
| 18048186 | SEMICONDUCTOR CELL BLOCKS HAVING NON-INTEGER MULTIPLE OF CELL HEIGHTS | October 2022 | April 2024 | Allow | 18 | 1 | 0 | No | No |
| 18046149 | DISPLAY APPARATUS INCLUDING A HIGH-DENSITY INORGANIC LAYER | October 2022 | April 2024 | Allow | 18 | 1 | 0 | No | No |
| 17962262 | IMAGING ELEMENT HAVING P-TYPE AND N-TYPE SOLID PHASE DIFFUSION LAYERS FORMED IN A SIDE WALL OF AN INTERPIXEL LIGHT SHIELDING WALL | October 2022 | September 2024 | Allow | 23 | 2 | 1 | Yes | No |
| 17958035 | IMAGE SENSOR HAVING NANOPOSTS | September 2022 | September 2025 | Allow | 35 | 1 | 0 | No | No |
| 17956769 | METHOD TO ENABLE 30 MICRONS PITCH EMIB OR BELOW | September 2022 | October 2024 | Allow | 25 | 2 | 1 | No | No |
| 17955630 | DRAM STRUCTURE AND METHOD FOR FORMING SAME | September 2022 | September 2025 | Allow | 35 | 2 | 0 | No | No |
| 17934703 | SEMICONDUCTOR STRUCTURE INCLUDING BIT LINE COMPOSE OF A METAL LAYER AND A METAL SILICIDE LAYER AND MANUFACTURING METHOD THEREOF | September 2022 | July 2025 | Allow | 33 | 1 | 1 | No | No |
| 17950325 | Same Focal Plane Pixel Design for RGB-IR Image Sensors | September 2022 | October 2025 | Allow | 37 | 1 | 1 | No | No |
| 17934489 | Semiconductor Memory Device and Method For Manufacturing the Same Including a Plurality of Mutually Perpendicular Trenches Having the Same Depth | September 2022 | April 2025 | Allow | 31 | 0 | 1 | No | No |
| 17951518 | SEMICONDUCTOR STRUCTURE, METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE, AND MEMORY | September 2022 | November 2025 | Allow | 38 | 1 | 1 | No | No |
| 17946636 | PHOTOELECTRIC CONVERTER AND SOLID-STATE IMAGING DEVICE | September 2022 | March 2024 | Allow | 18 | 1 | 0 | No | No |
| 17932778 | PHOTOELECTRIC CONVERSION DEVICE HAVING A SEMICONDUCTOR REGION ARRANGED IN A SUBSTRATE AND HAVING A PLURALITY OF REGIONS ALONG A SURFACE OF THE SUBSTRATE | September 2022 | October 2025 | Allow | 37 | 1 | 1 | No | No |
| 17939303 | SEMICONDUCTOR ELEMENT, ELECTRONIC SYSTEM INCLUDING THE SEMICONDUCTOR ELEMENT, AND METHOD OF FABRICATING THE SEMICONDUCTOR ELEMENT | September 2022 | October 2025 | Allow | 37 | 3 | 1 | No | No |
| 17897844 | SEMICONDUCTOR DEVICE | August 2022 | January 2025 | Abandon | 29 | 2 | 0 | No | No |
| 17883985 | METHOD AND APPARATUS FOR REDUCING LIGHT LEAKAGE AT MEMORY NODES IN CMOS IMAGE SENSORS | August 2022 | May 2024 | Allow | 21 | 1 | 1 | No | No |
| 17818635 | Low-Refractivity Grid Structure and Method Forming Same | August 2022 | March 2025 | Allow | 31 | 4 | 0 | Yes | No |
| 17881635 | METHOD AND SYSTEM FOR MONITORING AND CONTROLLING SEMICONDUCTOR PROCESS | August 2022 | April 2025 | Allow | 33 | 0 | 0 | No | No |
| 17881969 | DEVICES AND METHODS FOR DRAM LEAKAGE REDUCTION | August 2022 | April 2025 | Allow | 32 | 0 | 1 | No | No |
| 17881981 | Semiconductor Package with Dual Sides of Metal Routing | August 2022 | June 2024 | Allow | 22 | 1 | 1 | No | No |
| 17879971 | Semiconductor structure and method of manufacturing the same including buried word lines of different widths | August 2022 | April 2025 | Allow | 32 | 0 | 0 | No | No |
| 17874463 | Fin-Based Well Straps For Improving Memory Macro Performance | July 2022 | November 2023 | Allow | 16 | 0 | 1 | No | No |
| 17814917 | Structure and Method for an MRAM Device with a Multi-Layer Top Electrode | July 2022 | January 2025 | Allow | 30 | 4 | 1 | Yes | No |
| 17873699 | INTEGRATED CIRCUIT WITH DUMMY BOUNDARY CELLS | July 2022 | November 2023 | Allow | 16 | 0 | 0 | No | No |
| 17871603 | Non-Interleaving N-Well And P-Well Pickup Region Design For Ic Devices | July 2022 | February 2024 | Allow | 19 | 1 | 0 | Yes | No |
| 17813817 | RF SWITCH DEVICE HAVING A TRAP LAYER AND METHOD OF MANUFACTURING SAME | July 2022 | November 2025 | Abandon | 40 | 2 | 1 | No | No |
| 17869177 | Interconnect Line for Semiconductor Device | July 2022 | February 2025 | Allow | 31 | 3 | 1 | Yes | No |
| 17869206 | Semiconductor device including air gap structure above word line | July 2022 | March 2025 | Allow | 32 | 0 | 0 | No | No |
| 17869521 | Contact with a Silicide Region | July 2022 | February 2025 | Allow | 31 | 3 | 1 | No | No |
| 17860367 | SEMICONDUCTOR DEVICE WITH A BOOSTER LAYER AND METHOD FOR FABRICATING THE SAME | July 2022 | May 2024 | Allow | 22 | 1 | 1 | No | No |
| 17860132 | BIOMETRIC IDENTIFICATION DEVICE | July 2022 | October 2025 | Allow | 39 | 2 | 0 | No | No |
| 17858084 | DYNAMIC RANDOM ACCESS MEMORY HAVING WORD LINE BURIED IN CHOP STRUCTURE WITH DIFFERENT WIDTHS | July 2022 | July 2024 | Allow | 25 | 2 | 0 | No | No |
| 17851673 | PROTECTION RING, METHOD FOR FORMING PROTECTION RING, AND SEMICONDUCTOR STRUCTURE | June 2022 | July 2025 | Allow | 36 | 1 | 1 | No | No |
| 17850310 | METHOD OF MANUFACTURING A HETEROSTRUCTURE OR A STACKED SEMICONDUCTOR STRUCTURE HAVING A SILICON-GERMANIUM INTERFACE | June 2022 | February 2024 | Allow | 20 | 1 | 0 | No | No |
| 17789236 | DISPLAY PANEL HAVING FAN-OUT LINE LAYER LOCATED IN DIFFERENT LAYER FROM DRIVING CIRCUIT LAYER AT DISPLAY AREA, AND DISPLAY DEVICE | June 2022 | September 2025 | Allow | 39 | 2 | 0 | No | No |
| 17846021 | INTEGRATED CIRCUIT COMPONENT WITH CONDUCTIVE TERMINALS OF DIFFERENT DIMENSIONS AND PACKAGE STRUCTURE HAVING THE SAME | June 2022 | May 2024 | Allow | 22 | 1 | 1 | No | No |
| 17808178 | DECOUPLING CAPACITOR INSIDE GATE CUT TRENCH | June 2022 | April 2025 | Allow | 34 | 2 | 1 | Yes | No |
| 17843793 | DISPLAY DEVICE WITH MULTI-RESOLUTION | June 2022 | April 2025 | Allow | 34 | 1 | 1 | No | No |
| 17842017 | SPIN-ORBIT-TORQUE BASED MAGNETIC SENSOR AND A MAGNETIC FIELD MEASUREMENT METHOD USING A MAGNETIC SENSOR | June 2022 | October 2025 | Allow | 40 | 2 | 1 | No | No |
| 17785314 | Optical Receiving Circuit | June 2022 | November 2024 | Allow | 29 | 0 | 0 | No | No |
| 17785377 | METHOD FOR MANUFACTURING A PHOTOVOLTAIC MODULE WITH PARTIAL CROSSLINKING AND LAMINATION | June 2022 | July 2025 | Abandon | 37 | 1 | 0 | No | No |
| 17840170 | DISPLAY DEVICE HAVING LIGHT EMITTING ELEMENTS ON ORGANIC LAYER WITH SCATTERER | June 2022 | June 2025 | Allow | 36 | 1 | 1 | Yes | No |
| 17838294 | SEMICONDUCTOR STRUCTURES INCLUDING GLASS CORE LAYER AND METHODS OF FORMING THE SAME | June 2022 | May 2025 | Allow | 35 | 1 | 1 | No | No |
| 17836183 | DISPLAY DEVICE INCLUDING LIGHT BLOCKING LAYER | June 2022 | May 2025 | Allow | 36 | 1 | 1 | Yes | No |
| 17835073 | METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH DEPOSITION CYCLES OF CHEMICAL VAPOR DEPOSITION PROCESS TO FORM COMPOSITE CONTACT STRUCTURE | June 2022 | April 2025 | Allow | 35 | 3 | 0 | No | No |
| 17830356 | IMAGE SENSOR HAVING LENS LAYER OVER OPTICAL SENSING AREA AND MANUFACTURING METHOD THEREOF | June 2022 | January 2025 | Allow | 31 | 3 | 1 | Yes | No |
| 17831141 | Lid with Self Sealing Plug Allowing for a Thermal Interface Material with Fluidity in a Lidded Flip Chip Package | June 2022 | October 2025 | Abandon | 41 | 1 | 1 | No | No |
| 17750460 | MAGNETIC TUNNEL JUNCTION DEVICE WITH RESIDUE-PROTECTION SIDEWALL SPACER AND THE METHOD FOR FORMING A MAGNETIC TUNNEL JUNCTION DEVICE WITH RESIDUE-PROTECTION SIDEWALL SPACER | May 2022 | October 2023 | Allow | 17 | 0 | 0 | No | No |
| 17745106 | FORMATION OF SEMICONDUCTOR ARRANGEMENT COMPRISING SEMICONDUCTOR COLUMN | May 2022 | April 2024 | Allow | 23 | 1 | 1 | No | No |
| 17663267 | METHOD OF FORMING SOURCE/DRAIN REGIONS WITH EXPANDED WIDTHS | May 2022 | March 2024 | Allow | 22 | 1 | 1 | No | No |
| 17776143 | GROUP III NITRIDE SEMICONDUCTOR DEVICE WITH GATE RECESS AND RELATED METHOD FOR MANUFACTURING | May 2022 | September 2025 | Abandon | 41 | 3 | 0 | No | No |
| 17732800 | ENHANCEMENT MODE HIGH-ELECTRON-MOBILITY TRANSISTOR HAVING N-I-P SEMICONDUCTOR JUNCTION STRUCTURE AND APPLICATIONS THEREOF | April 2022 | March 2025 | Abandon | 34 | 1 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner GARCES, NELSON Y.
With a 9.1% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 19.2% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the bottom 25% across the USPTO, indicating that filing appeals is less effective here than in most other areas.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner GARCES, NELSON Y works in Art Unit 2814 and has examined 539 patent applications in our dataset. With an allowance rate of 80.5%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 25 months.
Examiner GARCES, NELSON Y's allowance rate of 80.5% places them in the 51% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by GARCES, NELSON Y receive 2.37 office actions before reaching final disposition. This places the examiner in the 68% percentile for office actions issued. This examiner issues a slightly above-average number of office actions.
The median time to disposition (half-life) for applications examined by GARCES, NELSON Y is 25 months. This places the examiner in the 79% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +2.1% benefit to allowance rate for applications examined by GARCES, NELSON Y. This interview benefit is in the 22% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 19.9% of applications are subsequently allowed. This success rate is in the 21% percentile among all examiners. Strategic Insight: RCEs show lower effectiveness with this examiner compared to others. Consider whether a continuation application might be more strategic, especially if you need to add new matter or significantly broaden claims.
This examiner enters after-final amendments leading to allowance in 28.2% of cases where such amendments are filed. This entry rate is in the 40% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.
When applicants request a pre-appeal conference (PAC) with this examiner, 63.2% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 51% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 54.2% of appeals filed. This is in the 25% percentile among all examiners. Of these withdrawals, 53.8% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.
When applicants file petitions regarding this examiner's actions, 13.3% are granted (fully or in part). This grant rate is in the 8% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 0.4% of allowed cases (in the 57% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).
Quayle Actions: This examiner issues Ex Parte Quayle actions in 3.7% of allowed cases (in the 76% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.