Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18734635 | TRANSISTORS WITH STACKED CHANNELS AND THE METHODS OF FORMING THE SAME | June 2024 | June 2025 | Allow | 12 | 1 | 1 | No | No |
| 18582162 | CAPACITOR NETWORKS FOR HARMONIC CONTROL IN POWER DEVICES | February 2024 | April 2025 | Allow | 14 | 1 | 0 | No | No |
| 18413716 | Fin Field-Effect Transistor Device with Composite Liner for the Fin | January 2024 | May 2025 | Allow | 16 | 2 | 0 | Yes | No |
| 18384916 | FINGERPRINT SENSOR, METHOD FOR MANUFACTURING FINGERPRINT SENSOR, AND DISPLAY DEVICE INCLUDING FINGERPRINT SENSOR | October 2023 | September 2024 | Allow | 11 | 0 | 0 | No | No |
| 18369814 | DISPLAY DEVICE HAVING FRACTURE RESISTANCE | September 2023 | December 2024 | Allow | 14 | 0 | 1 | No | No |
| 18357995 | STRUCTURE AND METHOD OF POWER SUPPLY ROUTING IN SEMICONDUCTOR DEVICE | July 2023 | November 2024 | Allow | 16 | 0 | 1 | No | No |
| 18349437 | TRANSPARENT REFRACTION STRUCTURE FOR AN IMAGE SENSOR AND METHODS OF FORMING THE SAME | July 2023 | May 2025 | Allow | 23 | 2 | 1 | Yes | No |
| 18219722 | METHOD OF FABRICATING SEMICONDUCTOR DEVICE HAVING BIT LINE COMPRISING A PLURALITY OF PINS EXTENDING TOWARD THE SUBSTRATE | July 2023 | November 2024 | Allow | 16 | 1 | 0 | No | No |
| 18348430 | Split Stack Triple Height Cell | July 2023 | February 2025 | Allow | 19 | 1 | 1 | No | No |
| 18213758 | COMPLEMENTARY MOS FETS VERTICALLY ARRANGED AND INCLUDING MULTIPLE DIELECTRIC LAYERS SURROUNDING THE MOS FETS | June 2023 | January 2025 | Allow | 19 | 1 | 0 | No | No |
| 18320523 | IMAGE SENSOR WITH DUAL TRENCH ISOLATION STRUCTURE | May 2023 | July 2025 | Allow | 25 | 2 | 1 | No | No |
| 18310743 | System and Method for Aligned Stitching | May 2023 | July 2024 | Allow | 15 | 0 | 0 | No | No |
| 18299878 | SEMICONDUCTOR DEVICE WITH MICROLENS LAYER AND CAMERA INCLUDING THE SAME | April 2023 | September 2024 | Allow | 17 | 1 | 0 | No | No |
| 18123729 | MAGNETORESISTIVE STACK/STRUCTURE AND METHODS THEREFOR | March 2023 | July 2024 | Allow | 16 | 1 | 1 | Yes | No |
| 18179598 | FERROELECTRIC STRUCTURE INCLUDING A FERROELECTRIC FILM HAVING A FIRST NET POLARIZATION ORIENTED TOWARD A FIRST POLARIZATION ENHANCEMENT FILM AND SEMICONDUCTOR DEVICE INCLUDING THE SAME | March 2023 | August 2024 | Allow | 17 | 1 | 1 | No | No |
| 18118037 | SEMICONDUCTOR DEVICE HAVING FIN STRUCTURES WITH UNEQUAL CHANNEL HEIGHTS AND MANUFACTURING METHOD THEREOF | March 2023 | January 2025 | Allow | 23 | 2 | 1 | No | No |
| 18178913 | SEMICONDUCTOR DEVICE WITH EQUIPOTENTIAL RING ELECTRODE | March 2023 | July 2024 | Allow | 17 | 1 | 0 | No | No |
| 18096391 | IMAGE SENSING DEVICE INCLUDING GRID STRUCTURES HAVING DIFFERENT HEIGHTS | January 2023 | October 2024 | Allow | 21 | 1 | 1 | No | No |
| 18083619 | MODULE PACKAGE WITH HIGH ILLUMINATION EFFICIENCY | December 2022 | June 2024 | Allow | 18 | 1 | 0 | No | No |
| 18064705 | Attachment of Stress Sensitive Integrated Circuit Dies | December 2022 | March 2025 | Abandon | 27 | 2 | 1 | No | No |
| 18059701 | Semiconductor Device Having Conductive Field Plate Overlapping an Edge of an Active Region | November 2022 | June 2024 | Allow | 19 | 0 | 1 | No | No |
| 18070303 | Integrated Circuit Structure with Hybrid Cell Design | November 2022 | July 2024 | Allow | 20 | 0 | 1 | No | No |
| 18057688 | Isolation Structures | November 2022 | April 2024 | Allow | 17 | 0 | 1 | No | No |
| 17984261 | PHOTOSENSITIVE SEMICONDUCTOR DEVICE INCLUDING HETEROJUNCTION PHOTODIODE | November 2022 | June 2024 | Allow | 19 | 1 | 0 | No | No |
| 17984243 | PHOTOSENSITIVE SEMICONDUCTOR DEVICE INCLUDING HETEROJUNCTION PHOTODIODE | November 2022 | June 2024 | Allow | 19 | 1 | 0 | No | No |
| 18048186 | SEMICONDUCTOR CELL BLOCKS HAVING NON-INTEGER MULTIPLE OF CELL HEIGHTS | October 2022 | April 2024 | Allow | 18 | 1 | 0 | No | No |
| 18046149 | DISPLAY APPARATUS INCLUDING A HIGH-DENSITY INORGANIC LAYER | October 2022 | April 2024 | Allow | 18 | 1 | 0 | No | No |
| 17962262 | IMAGING ELEMENT HAVING P-TYPE AND N-TYPE SOLID PHASE DIFFUSION LAYERS FORMED IN A SIDE WALL OF AN INTERPIXEL LIGHT SHIELDING WALL | October 2022 | September 2024 | Allow | 23 | 2 | 1 | Yes | No |
| 17956769 | METHOD TO ENABLE 30 MICRONS PITCH EMIB OR BELOW | September 2022 | October 2024 | Allow | 25 | 2 | 1 | No | No |
| 17934703 | SEMICONDUCTOR STRUCTURE INCLUDING BIT LINE COMPOSE OF A METAL LAYER AND A METAL SILICIDE LAYER AND MANUFACTURING METHOD | September 2022 | July 2025 | Allow | 33 | 1 | 1 | No | No |
| 17934489 | Semiconductor Memory Device and Method For Manufacturing the Same Including a Plurality of Mutually Perpendicular Trenches Having the Same Depth | September 2022 | April 2025 | Allow | 31 | 0 | 1 | No | No |
| 17946636 | PHOTOELECTRIC CONVERTER AND SOLID-STATE IMAGING DEVICE | September 2022 | March 2024 | Allow | 18 | 1 | 0 | No | No |
| 17897844 | SEMICONDUCTOR DEVICE | August 2022 | January 2025 | Abandon | 29 | 2 | 0 | No | No |
| 17818635 | Low-Refractivity Grid Structure and Method Forming Same | August 2022 | March 2025 | Allow | 31 | 4 | 0 | Yes | No |
| 17883985 | METHOD AND APPARATUS FOR REDUCING LIGHT LEAKAGE AT MEMORY NODES IN CMOS IMAGE SENSORS | August 2022 | May 2024 | Allow | 21 | 1 | 1 | No | No |
| 17881981 | Semiconductor Package with Dual Sides of Metal Routing | August 2022 | June 2024 | Allow | 22 | 1 | 1 | No | No |
| 17881969 | DEVICES AND METHODS FOR DRAM LEAKAGE REDUCTION | August 2022 | April 2025 | Allow | 32 | 0 | 1 | No | No |
| 17881635 | METHOD AND SYSTEM FOR MONITORING AND CONTROLLING SEMICONDUCTOR PROCESS | August 2022 | April 2025 | Allow | 33 | 0 | 0 | No | No |
| 17879971 | Semiconductor structure and method of manufacturing the same including buried word lines of different widths | August 2022 | April 2025 | Allow | 32 | 0 | 0 | No | No |
| 17874463 | Fin-Based Well Straps For Improving Memory Macro Performance | July 2022 | November 2023 | Allow | 16 | 0 | 1 | No | No |
| 17873699 | INTEGRATED CIRCUIT WITH DUMMY BOUNDARY CELLS | July 2022 | November 2023 | Allow | 16 | 0 | 0 | No | No |
| 17814917 | Structure and Method for an MRAM Device with a Multi-Layer Top Electrode | July 2022 | January 2025 | Allow | 30 | 4 | 1 | Yes | No |
| 17871603 | Non-Interleaving N-Well And P-Well Pickup Region Design For Ic Devices | July 2022 | February 2024 | Allow | 19 | 1 | 0 | Yes | No |
| 17869206 | Semiconductor device including air gap structure above word line | July 2022 | March 2025 | Allow | 32 | 0 | 0 | No | No |
| 17869177 | Interconnect Line for Semiconductor Device | July 2022 | February 2025 | Allow | 31 | 3 | 1 | Yes | No |
| 17869521 | Contact with a Silicide Region | July 2022 | February 2025 | Allow | 31 | 3 | 1 | No | No |
| 17860367 | SEMICONDUCTOR DEVICE WITH A BOOSTER LAYER AND METHOD FOR FABRICATING THE SAME | July 2022 | May 2024 | Allow | 22 | 1 | 1 | No | No |
| 17858084 | DYNAMIC RANDOM ACCESS MEMORY HAVING WORD LINE BURIED IN CHOP STRUCTURE WITH DIFFERENT WIDTHS | July 2022 | July 2024 | Allow | 25 | 2 | 0 | No | No |
| 17850310 | METHOD OF MANUFACTURING A HETEROSTRUCTURE OR A STACKED SEMICONDUCTOR STRUCTURE HAVING A SILICON-GERMANIUM INTERFACE | June 2022 | February 2024 | Allow | 20 | 1 | 0 | No | No |
| 17846021 | INTEGRATED CIRCUIT COMPONENT WITH CONDUCTIVE TERMINALS OF DIFFERENT DIMENSIONS AND PACKAGE STRUCTURE HAVING THE SAME | June 2022 | May 2024 | Allow | 22 | 1 | 1 | No | No |
| 17808178 | DECOUPLING CAPACITOR INSIDE GATE CUT TRENCH | June 2022 | April 2025 | Allow | 34 | 2 | 1 | Yes | No |
| 17843793 | DISPLAY DEVICE WITH MULTI-RESOLUTION | June 2022 | April 2025 | Allow | 34 | 1 | 1 | No | No |
| 17785314 | Optical Receiving Circuit | June 2022 | November 2024 | Allow | 29 | 0 | 0 | No | No |
| 17840170 | DISPLAY DEVICE HAVING LIGHT EMITTING ELEMENTS ON ORGANIC LAYER WITH SCATTERER | June 2022 | June 2025 | Allow | 36 | 1 | 1 | Yes | No |
| 17838294 | SEMICONDUCTOR STRUCTURES INCLUDING GLASS CORE LAYER AND METHODS OF FORMING THE SAME | June 2022 | May 2025 | Allow | 35 | 1 | 1 | No | No |
| 17836183 | DISPLAY DEVICE INCLUDING LIGHT BLOCKING LAYER | June 2022 | May 2025 | Allow | 36 | 1 | 1 | Yes | No |
| 17835073 | METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH DEPOSITION CYCLES OF CHEMICAL VAPOR DEPOSITION PROCESS TO FORM COMPOSITE CONTACT STRUCTURE | June 2022 | April 2025 | Allow | 35 | 3 | 0 | No | No |
| 17830356 | IMAGE SENSOR HAVING LENS LAYER OVER OPTICAL SENSING AREA AND MANUFACTURING METHOD THEREOF | June 2022 | January 2025 | Allow | 31 | 3 | 1 | Yes | No |
| 17750460 | MAGNETIC TUNNEL JUNCTION DEVICE WITH RESIDUE-PROTECTION SIDEWALL SPACER AND THE METHOD FOR FORMING A MAGNETIC TUNNEL JUNCTION DEVICE WITH RESIDUE-PROTECTION SIDEWALL SPACER | May 2022 | October 2023 | Allow | 17 | 0 | 0 | No | No |
| 17745106 | FORMATION OF SEMICONDUCTOR ARRANGEMENT COMPRISING SEMICONDUCTOR COLUMN | May 2022 | April 2024 | Allow | 23 | 1 | 1 | No | No |
| 17663267 | METHOD OF FORMING SOURCE/DRAIN REGIONS WITH EXPANDED WIDTHS | May 2022 | March 2024 | Allow | 22 | 1 | 1 | No | No |
| 17732800 | ENHANCEMENT MODE HIGH-ELECTRON-MOBILITY TRANSISTOR HAVING N-I-P SEMICONDUCTOR JUNCTION STRUCTURE AND APPLICATIONS THEREOF | April 2022 | March 2025 | Abandon | 34 | 1 | 0 | No | No |
| 17731053 | Method of Forming a Barrier Layer in an Interconnect Structure of Semiconductor Device | April 2022 | November 2024 | Allow | 31 | 3 | 1 | No | No |
| 17718309 | PACKAGE STRUCTURE WITH THROUGH VIA EXTENDING THROUGH REDISTRIBUTION LAYER AND METHOD OF MANUFACTURING THE SAME | April 2022 | April 2024 | Allow | 24 | 1 | 1 | No | No |
| 17707036 | METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT DEVICE INCLUDING A FIN-TYPE ACTIVE REGION | March 2022 | April 2024 | Allow | 24 | 1 | 1 | Yes | No |
| 17696956 | ELECTROLUMINESCENT DISPLAY DEVICE INCLUDING A RED PIXEL, A GREEN PIXEL, AND A BLUE PIXEL | March 2022 | March 2025 | Allow | 36 | 1 | 0 | Yes | No |
| 17695826 | Lid Allowing for a Thermal Interface Material with Fluidity in a Lidded Flip Chip Package | March 2022 | January 2025 | Allow | 35 | 0 | 1 | No | No |
| 17693941 | PILLAR-SHAPED SEMICONDUCTOR DEVICE HAVING CONNECTION MATERIAL LAYER FOR ANCHORING WIRING CONDUCTOR LAYER AND METHOD FOR PRODUCING THE SAME | March 2022 | May 2024 | Allow | 26 | 2 | 1 | No | No |
| 17690333 | METAL-INSULATOR-METAL (MIM) CAPACITOR WITH ADDITIONAL ELECTRODE EMBEDDED IN INSULATING FILM | March 2022 | February 2025 | Allow | 36 | 1 | 1 | No | No |
| 17676335 | Metal Gate Using Monolayers | February 2022 | February 2024 | Allow | 24 | 1 | 0 | Yes | No |
| 17669859 | SEMICONDUCTOR DEVICE INCLUDING WORK FUNCTION ADJUSTING METAL GATE STRUCTURE | February 2022 | December 2023 | Allow | 22 | 0 | 1 | No | No |
| 17665601 | PRECESSIONAL SPIN CURRENT STRUCTURE WITH NON-MAGNETIC INSERTION LAYER FOR MRAM | February 2022 | April 2024 | Allow | 26 | 2 | 0 | Yes | No |
| 17583800 | Display Device Including Partitioning Wall Comprising Transparent Conductive Oxide and Method for Manufacturing the Same | January 2022 | August 2024 | Allow | 31 | 0 | 1 | No | No |
| 17581464 | GEIGER-MODE FOCAL PLANE ARRAY HAVING INCREASED TOLERANCE TO OPTICAL OVERSTRESS | January 2022 | June 2024 | Allow | 28 | 2 | 0 | No | No |
| 17569279 | CAPACITOR DEVICE WITH MULTI-LAYER DIELECTRIC STRUCTURE | January 2022 | November 2024 | Allow | 34 | 2 | 1 | No | No |
| 17562252 | DISPLAY APPARATUS AND MULTI-SCREEN DISPLAY APPARATUS INCLUDING THE SAME | December 2021 | September 2024 | Allow | 32 | 1 | 0 | No | No |
| 17561663 | METHOD OF FORMING SEMICONDUCTOR MEMORY DEVICE HAVING SADDLE PORTION | December 2021 | November 2023 | Allow | 22 | 1 | 0 | No | No |
| 17622028 | DOHERTY AMPLIFIER | December 2021 | May 2024 | Allow | 28 | 0 | 0 | No | No |
| 17557991 | MEMORY DEVICE HAVING WORD LINES WITH IMPROVED RESISTANCE | December 2021 | November 2023 | Allow | 23 | 1 | 0 | No | No |
| 17620484 | METHOD FOR PRODUCING NITRIDE MESAS EACH INTENDED TO FORM AN ELECTRONIC OR OPTOELECTRONIC DEVICE | December 2021 | December 2024 | Allow | 36 | 2 | 0 | No | No |
| 17547093 | METAL-INSULATOR-METAL (MIM) CAPACITOR STRUCTURE FOR LAYER COUNT REDUCTION AND LOWER CAPACITANCE VARIATION | December 2021 | February 2024 | Allow | 26 | 1 | 0 | No | No |
| 17540691 | Electroluminescence Display Device Including a Dummy Light Emitting Layer and a Plurality of Trenches Surrounding the Display Area | December 2021 | April 2024 | Allow | 28 | 0 | 0 | No | No |
| 17534706 | IMAGE SENSOR WITH REDUCED CROSSTALK BETWEEN PIXELS | November 2021 | April 2025 | Allow | 40 | 1 | 1 | Yes | No |
| 17531999 | METAL GATES WITH LAYERS FOR TRANSISTOR THRESHOLD VOLTAGE TUNING AND METHODS OF FORMING THE SAME | November 2021 | July 2024 | Allow | 32 | 1 | 1 | Yes | No |
| 17519524 | ELECTRONIC APPARATUS INCLUDING ANTENNAS AND DIRECTORS | November 2021 | July 2024 | Allow | 32 | 2 | 1 | Yes | No |
| 17511287 | DISPLAY DEVICE INCLUDING A SEALING STRUCTURE | October 2021 | February 2025 | Allow | 40 | 2 | 1 | No | No |
| 17504807 | SOLID-STATE IMAGE SENSOR, AND ELECTRONIC DEVICE WITH SEPARATED ELECTRODE | October 2021 | September 2024 | Abandon | 35 | 2 | 1 | No | No |
| 17493715 | INTEGRATED CIRCUIT DEVICE WITH CRENELLATED METAL TRACE LAYOUT | October 2021 | February 2024 | Allow | 28 | 2 | 0 | No | No |
| 17470178 | GEIGER-MODE FOCAL PLANE ARRAY WITH MONOLITHICALLY INTEGRATED RESISTORS | September 2021 | September 2023 | Allow | 24 | 1 | 0 | No | No |
| 17470274 | METAL-INSULATOR-METAL CAPACITOR WITH TOP CONTACT | September 2021 | December 2023 | Allow | 28 | 2 | 0 | No | No |
| 17467421 | DISPLAY DEVICE HAVING FRACTURE RESISTANCE | September 2021 | June 2023 | Allow | 21 | 0 | 1 | No | No |
| 17461593 | METHOD OF MANUFACTURING SEMCONDUCTOR DEVICE INCLUDING FERROELECTRIC LAYER HAVING NANO CRYSTALS | August 2021 | July 2024 | Allow | 34 | 4 | 1 | No | No |
| 17461736 | METHOD OF FABRICATING SEMICONDUCTOR DEVICE COMPRISING FERROELECTRIC LAYER | August 2021 | October 2024 | Allow | 38 | 4 | 1 | Yes | No |
| 17460984 | Recessed Access Devices And Methods Of Forming A Recessed Access Devices | August 2021 | May 2023 | Allow | 21 | 0 | 1 | No | No |
| 17409948 | FINGERPRINT SENSOR, METHOD FOR MANUFACTURING FINGERPRINT SENSOR, AND DISPLAY DEVICE INCLUDING FINGERPRINT SENSOR | August 2021 | August 2023 | Allow | 24 | 0 | 1 | No | No |
| 17406643 | SEMICONDUCTOR DEVICE HAVING INTERLEAVED CLOCK GATE BLOCKS AND DECOUPLING CAPACITOR BLOCKS AND METHOD OF OPERATING SAME | August 2021 | May 2025 | Allow | 44 | 4 | 1 | Yes | No |
| 17401382 | STACKED GRID DESIGN FOR IMPROVED OPTICAL PERFORMANCE AND ISOLATION | August 2021 | April 2023 | Allow | 20 | 0 | 1 | No | No |
| 17399043 | SEMICONDUCTOR MEMORY DEVICE | August 2021 | July 2023 | Allow | 23 | 0 | 1 | No | No |
| 17428142 | IGBT POWER DEVICE | August 2021 | May 2023 | Allow | 21 | 0 | 0 | No | No |
| 17378387 | FIN FIELD-EFFECT TRANSISTOR DEVICE WITH COMPOSITE LINER FOR THE FIN | July 2021 | September 2023 | Allow | 26 | 2 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner GARCES, NELSON Y.
With a 11.1% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 21.7% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner GARCES, NELSON Y works in Art Unit 2814 and has examined 608 patent applications in our dataset. With an allowance rate of 82.7%, this examiner has a below-average tendency to allow applications. Applications typically reach final disposition in approximately 25 months.
Examiner GARCES, NELSON Y's allowance rate of 82.7% places them in the 49% percentile among all USPTO examiners. This examiner has a below-average tendency to allow applications.
On average, applications examined by GARCES, NELSON Y receive 2.21 office actions before reaching final disposition. This places the examiner in the 75% percentile for office actions issued. This examiner issues a slightly above-average number of office actions.
The median time to disposition (half-life) for applications examined by GARCES, NELSON Y is 25 months. This places the examiner in the 67% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a +3.9% benefit to allowance rate for applications examined by GARCES, NELSON Y. This interview benefit is in the 25% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 21.2% of applications are subsequently allowed. This success rate is in the 16% percentile among all examiners. Strategic Insight: RCEs show lower effectiveness with this examiner compared to others. Consider whether a continuation application might be more strategic, especially if you need to add new matter or significantly broaden claims.
This examiner enters after-final amendments leading to allowance in 28.6% of cases where such amendments are filed. This entry rate is in the 32% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.
When applicants request a pre-appeal conference (PAC) with this examiner, 66.7% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 53% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 59.1% of appeals filed. This is in the 28% percentile among all examiners. Of these withdrawals, 53.8% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.
When applicants file petitions regarding this examiner's actions, 13.3% are granted (fully or in part). This grant rate is in the 7% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 0.3% of allowed cases (in the 55% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).
Quayle Actions: This examiner issues Ex Parte Quayle actions in 3.6% of allowed cases (in the 74% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.