Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18632506 | STRUCTURES FOR A LATERALLY-DIFFUSED METAL-OXIDE-SEMICONDUCTOR TRANSISTOR | April 2024 | August 2024 | Allow | 5 | 0 | 1 | No | No |
| 18628275 | Laser Edge Shaping for Semiconductor Wafers | April 2024 | November 2024 | Allow | 7 | 1 | 0 | No | No |
| 18615255 | SILICIDE-LAYER-COUPLED DOPED PORTION OF ACTIVE REGION AND METHOD OF FABRICATING SAME | March 2024 | July 2025 | Allow | 16 | 1 | 0 | Yes | No |
| 18615615 | MULTI-CHANNEL TRANSISTOR | March 2024 | September 2024 | Allow | 6 | 0 | 1 | No | No |
| 18608957 | SEMICONDUCTOR STRUCTURE | March 2024 | February 2025 | Allow | 11 | 1 | 0 | No | No |
| 18592553 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | March 2024 | November 2024 | Allow | 9 | 1 | 0 | No | No |
| 18395785 | DISPLAY DEVICE | December 2023 | April 2025 | Allow | 15 | 2 | 0 | No | No |
| 18545337 | Backside Gate Contact, Backside Gate Etch Stop Layer, and Methods of Forming Same | December 2023 | June 2024 | Allow | 6 | 0 | 1 | No | No |
| 18517458 | Contacts for Semiconductor Devices and Methods of Forming the Same | November 2023 | October 2024 | Allow | 10 | 1 | 0 | No | No |
| 18389057 | DISPLAY APPARATUS INCLUDING TRANSMISSIVE LIGHT SOURCE | November 2023 | October 2024 | Allow | 11 | 1 | 0 | No | No |
| 18502109 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | November 2023 | April 2025 | Allow | 18 | 4 | 0 | Yes | No |
| 18385390 | SUPER JUNCTION TRENCH MOSFET AND METHOD FOR PREPARING SAME | October 2023 | October 2025 | Allow | 24 | 0 | 1 | No | No |
| 18493686 | PACKAGED HIGH VOLTAGE MOSFET DEVICE WITH CONNECTION CLIP AND MANUFACTURING PROCESS THEREOF | October 2023 | November 2025 | Allow | 25 | 4 | 0 | Yes | No |
| 18490866 | SEMICONDUCTOR DOPED REGION WITH BIASED ISOLATED MEMBERS | October 2023 | September 2024 | Allow | 11 | 1 | 0 | Yes | No |
| 18487505 | TRANSISTOR DEVICE HAVING A FIELD PLATE | October 2023 | May 2024 | Allow | 7 | 0 | 0 | No | No |
| 18467482 | METHODS FOR FORMING SEMICONDUCTOR STRUCTURES | September 2023 | July 2024 | Allow | 10 | 1 | 0 | No | No |
| 18466434 | HIGH ELECTRON MOBILITY TRANSISTOR AND HIGH ELECTRON MOBILITY TRANSISTOR FORMING METHOD | September 2023 | December 2025 | Allow | 27 | 2 | 1 | No | No |
| 18447783 | LDMOS WITH ENHANCED SAFE OPERATING AREA AND METHOD OF MANUFACTURE | August 2023 | October 2024 | Allow | 14 | 1 | 0 | No | No |
| 18366711 | SEMICONDUCTOR STRUCTURES FOR GALVANIC ISOLATION | August 2023 | November 2025 | Allow | 27 | 1 | 1 | Yes | No |
| 18446183 | Semiconductor Device with Air Gaps and Method of Fabrication Thereof | August 2023 | July 2025 | Allow | 23 | 1 | 0 | No | No |
| 18446113 | Semiconductor Structures And Methods Of Forming The Same | August 2023 | April 2024 | Allow | 9 | 0 | 0 | No | No |
| 18360508 | Structure and Method for Semiconductor Devices | July 2023 | May 2025 | Allow | 22 | 1 | 0 | Yes | No |
| 18355549 | THICKER CORNER OF A GATE DIELECTRIC STRUCTURE AROUND A RECESSED GATE ELECTRODE FOR AN MV DEVICE | July 2023 | August 2024 | Allow | 13 | 1 | 0 | No | No |
| 18351149 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | July 2023 | August 2024 | Allow | 13 | 1 | 0 | Yes | No |
| 18348334 | MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE | July 2023 | February 2024 | Allow | 7 | 0 | 0 | No | No |
| 18217719 | METHOD FOR PREPARING SEMICONDUCTOR DEVICE WITH CONTACT STRUCTURE | July 2023 | January 2024 | Allow | 7 | 0 | 0 | No | No |
| 18345678 | POWER SEMICONDUCTOR DEVICE HAVING AN ELECTRODE WITH AN EMBEDDED MATERIAL | June 2023 | July 2025 | Allow | 24 | 1 | 1 | Yes | No |
| 18338815 | LIGHT-EMITTING DEVICE, MANUFACTURING METHOD THEREOF AND DISPLAY MODULE USING THE SAME | June 2023 | January 2025 | Allow | 19 | 1 | 0 | No | No |
| 18325861 | MEMORY DEVICE, METHOD, LAYOUT, AND SYSTEM | May 2023 | August 2025 | Allow | 27 | 0 | 0 | No | No |
| 18139862 | BRIDGE INTERCONNECTION WITH LAYERED INTERCONNECT STRUCTURES | April 2023 | June 2024 | Allow | 14 | 1 | 0 | No | No |
| 18138528 | SEMICONDUCTOR DEVICE INCLUDING BACK SIDE POWER SUPPLY CIRCUIT | April 2023 | March 2024 | Allow | 11 | 0 | 0 | No | No |
| 18137257 | FIN FIELD-EFFECT TRANSISTOR AND METHOD OF FORMING THE SAME | April 2023 | October 2023 | Allow | 6 | 0 | 0 | No | No |
| 18298230 | SEMICONDUCTOR DEVICES HAVING BURIED GATES | April 2023 | June 2024 | Allow | 14 | 1 | 1 | Yes | No |
| 18129961 | Gate Stack Treatment For Ferroelectric Transistors | April 2023 | November 2023 | Allow | 8 | 0 | 0 | No | No |
| 18130201 | P-TYPE DIPOLE FOR P-FET | April 2023 | March 2024 | Allow | 12 | 1 | 0 | Yes | No |
| 18125958 | METHOD OF MANUFACTURING SEMICONDUCTOR PACKAGE | March 2023 | June 2025 | Allow | 27 | 0 | 0 | No | No |
| 18184559 | SUBSTRATE HAVING A DIE POSITION MARK AND A SEMICONDUCTOR DIE STACK STRUCTURE INCLUDING SEMICONDUCTOR DIES STACKED ON THE SUBSTRATE | March 2023 | December 2025 | Allow | 33 | 1 | 0 | No | No |
| 18043726 | TRANSISTOR AND METHOD FOR FABRICATING THE SAME | March 2023 | November 2025 | Allow | 32 | 1 | 0 | No | No |
| 18042667 | LIGHT-EMITTING SUBSTRATE AND MANUFACTURING METHOD THEREOF, AND LIGHT-EMITTING APPARATUS | February 2023 | September 2025 | Allow | 31 | 1 | 0 | No | No |
| 18167776 | CRYSTALLINE SEMICONDUCTOR LAYER FORMED IN BEOL PROCESSES | February 2023 | March 2024 | Allow | 13 | 1 | 0 | Yes | No |
| 18102831 | TRANSISTOR DEVICE HAVING A CELL FIELD AND METHOD OF FABRICATING A GATE OF THE TRANSISTOR DEVICE | January 2023 | October 2024 | Allow | 20 | 2 | 0 | No | No |
| 18101712 | SEMICONDUCTOR DEVICE AND METHOD OF CONTROLLING SAME | January 2023 | April 2024 | Allow | 15 | 0 | 1 | No | No |
| 18155887 | SILICIDE-SANDWICHED SOURCE/DRAIN REGION AND METHOD OF FABRICATING SAME | January 2023 | October 2023 | Allow | 9 | 0 | 0 | No | No |
| 18155394 | INTEGRATION OF A SCHOTTKY DIODE WITH A MOSFET | January 2023 | January 2024 | Allow | 12 | 1 | 0 | No | No |
| 18152087 | METHODS FOR IMPROVEMENT OF PHOTORESIST PATTERNING PROFILE | January 2023 | May 2024 | Allow | 16 | 1 | 1 | No | No |
| 18151438 | SEMICONDUCTOR STRUCTURE AND METHOD FOR FABRICATING SAME | January 2023 | October 2025 | Allow | 33 | 0 | 1 | No | No |
| 18150202 | MANUFACTURING METHOD OF SPLIT GATE TRENCH DEVICE | January 2023 | July 2025 | Allow | 30 | 0 | 1 | No | No |
| 18092777 | MEMORY DEVICES AND METHODS FOR FORMING THE SAME | January 2023 | January 2026 | Allow | 37 | 1 | 1 | No | No |
| 18091091 | DISPLAY DEVICE | December 2022 | October 2023 | Allow | 9 | 1 | 0 | No | No |
| 18069367 | HIGH ELECTRON MOBILITY TRANSISTOR AND HIGH ELECTRON MOBILITY TRANSISTOR FORMING METHOD | December 2022 | August 2023 | Allow | 8 | 1 | 1 | Yes | No |
| 18081373 | SEMICONDUCTOR DEVICE | December 2022 | January 2024 | Allow | 13 | 2 | 0 | No | No |
| 18079957 | SHIELDED GATE MOSFET DEVICE AND MANUFACTURING METHOD THEREOF | December 2022 | October 2025 | Allow | 34 | 0 | 1 | Yes | No |
| 18059615 | SEMICONDUCTOR DEVICE AND CIRCUIT DEVICE | November 2022 | November 2025 | Allow | 35 | 1 | 0 | No | No |
| 18059022 | SEMICONDUCTOR DEVICE AND METHODS FOR FORMING THE SAME | November 2022 | January 2026 | Allow | 38 | 1 | 1 | No | No |
| 18058791 | LAYER STRUCTURES INCLUDING DIELECTRIC LAYER, METHODS OF MANUFACTURING DIELECTRIC LAYER, ELECTRONIC DEVICE INCLUDING DIELECTRIC LAYER, AND ELECTRONIC APPARATUS INCLUDING ELECTRONIC DEVICE | November 2022 | November 2025 | Allow | 36 | 1 | 0 | Yes | No |
| 18057531 | SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME | November 2022 | March 2026 | Allow | 40 | 2 | 0 | No | No |
| 17925806 | SEMICONDUCTOR DEVICE AND PREPARATION METHOD THEREOF | November 2022 | May 2023 | Allow | 6 | 0 | 0 | No | No |
| 17985315 | TRANSISTOR DEVICE HAVING A FIELD PLATE IN AN ELONGATE ACTIVE TRENCH | November 2022 | July 2023 | Allow | 8 | 0 | 0 | No | No |
| 17975559 | HIGH ELECTRON MOBILITY TRANSISTOR DEVICE AND MANUFACTURING METHOD THEREOF | October 2022 | July 2025 | Allow | 33 | 2 | 0 | No | No |
| 17970601 | SEMICONDUCTOR DEVICE | October 2022 | July 2023 | Allow | 9 | 0 | 0 | No | No |
| 17967904 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | October 2022 | December 2023 | Allow | 14 | 1 | 0 | No | No |
| 17938893 | Semiconductor Device and Method of Forming Charge Balanced Power MOSFET Combining Field Plate and Super-Junction | October 2022 | December 2025 | Allow | 38 | 3 | 0 | No | No |
| 17938378 | FLEXIBLE TRANSISTORS WITH NEAR-JUNCTION HEAT DISSIPATION | October 2022 | January 2024 | Allow | 16 | 1 | 0 | No | No |
| 17934913 | SEMICONDUCTOR BACKSIDE TRANSISTOR INTEGRATION WITH BACKSIDE POWER DELIVERY NETWORK | September 2022 | March 2025 | Allow | 30 | 0 | 0 | No | No |
| 17947689 | TRANSISTOR DEVICE AND METHOD FOR PRODUCING A TRANSISTOR DEVICE | September 2022 | October 2025 | Allow | 37 | 2 | 1 | No | No |
| 17947164 | SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | September 2022 | March 2025 | Allow | 30 | 0 | 0 | No | No |
| 17942562 | SEMICONDUCTOR DEVICE | September 2022 | March 2025 | Allow | 30 | 0 | 0 | No | No |
| 17903204 | SHIELD GATE TRENCH MOSFET DEVICE AND METHOD FOR MANUFACTURING THE SAME | September 2022 | November 2025 | Allow | 38 | 1 | 1 | Yes | No |
| 17899704 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | August 2022 | May 2025 | Allow | 33 | 0 | 1 | No | No |
| 17898816 | STORAGE DEVICE, STORAGE SYSTEM, AND OPERATION METHOD OF STORAGE DEVICE | August 2022 | June 2025 | Allow | 33 | 0 | 1 | No | No |
| 17896885 | BACKSIDE AND FRONTSIDE CONTACTS FOR SEMICONDUCTOR DEVICE | August 2022 | November 2025 | Allow | 39 | 1 | 1 | Yes | No |
| 17894226 | SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE | August 2022 | May 2025 | Allow | 33 | 2 | 0 | No | No |
| 17894080 | III-N DEVICES WITH IMPROVED RELIABILITY | August 2022 | June 2025 | Allow | 34 | 0 | 1 | No | No |
| 17819971 | Split-Gate Trench MOSFET | August 2022 | July 2023 | Allow | 11 | 1 | 0 | No | No |
| 17887703 | UNIFORM IMPLANT REGIONS IN A SEMICONDUCTOR RIDGE OF A FINFET | August 2022 | June 2024 | Allow | 22 | 1 | 1 | No | No |
| 17885159 | LDMOS WITH ENHANCED SAFE OPERATING AREA AND METHOD OF MANUFACTURE | August 2022 | April 2023 | Allow | 9 | 0 | 0 | Yes | No |
| 17874471 | THICKER CORNER OF A GATE DIELECTRIC STRUCTURE AROUND A RECESSED GATE ELECTRODE FOR AN MV DEVICE | July 2022 | June 2023 | Allow | 11 | 1 | 0 | No | No |
| 17874565 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | July 2022 | November 2023 | Allow | 16 | 1 | 1 | Yes | No |
| 17874772 | Fin Field-Effect Transistor and Method of Forming The Same | July 2022 | January 2023 | Allow | 6 | 0 | 0 | No | No |
| 17874742 | METHOD FOR ANNEALING BONDING WAFERS | July 2022 | November 2025 | Allow | 39 | 2 | 0 | No | No |
| 17814325 | Contacts for Semiconductor Devices and Methods of Forming the Same | July 2022 | August 2023 | Allow | 13 | 1 | 0 | Yes | No |
| 17870746 | METHOD FOR MANUFACTURING HIGH ELECTRON MOBILITY TRANSISTOR DEVICE | July 2022 | January 2026 | Abandon | 42 | 3 | 0 | Yes | No |
| 17813860 | METHOD FOR MANUFACTURING A SOI OR SIGEOI TYPE SEMICONDUCTOR-ON-INSULATOR SUBSTRATE BY BESOI AND STRUCTURE FOR MANUFACTURING SUCH A SUBSTRATE | July 2022 | May 2025 | Allow | 34 | 1 | 1 | No | No |
| 17869337 | Semiconductor Device with Air Gaps and Method of Fabrication Thereof | July 2022 | July 2023 | Allow | 12 | 0 | 0 | No | No |
| 17792447 | Superjunction Transistor Device | July 2022 | July 2025 | Allow | 36 | 2 | 0 | No | No |
| 17863069 | GALLIUM NITRIDE-BASED DEVICES AND METHODS OF TESTING THEREOF | July 2022 | June 2025 | Allow | 36 | 0 | 1 | Yes | No |
| 17860082 | STACKED FIELD EFFECT TRANSISTOR CONTACTS | July 2022 | November 2025 | Allow | 40 | 1 | 1 | Yes | No |
| 17852393 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | June 2022 | August 2023 | Allow | 14 | 0 | 0 | No | No |
| 17851046 | ELECTRONIC APPARATUS | June 2022 | July 2023 | Allow | 13 | 0 | 0 | No | No |
| 17851047 | ELECTROMAGNETIC WAVE ADJUSTMENT APPARATUS | June 2022 | February 2024 | Allow | 20 | 0 | 0 | No | No |
| 17848984 | FIELD EFFECT TRANSISTOR WITH STACKED UNIT SUBCELL STRUCTURE | June 2022 | May 2025 | Allow | 34 | 1 | 0 | Yes | No |
| 17840524 | GREYSCALE LITHOGRAPHY TECHNIQUES FOR MANUFACTURING FIELD PLATES | June 2022 | May 2025 | Allow | 35 | 1 | 1 | Yes | No |
| 17834013 | FIELD EFFECT TRANSISTOR WITH MULTIPLE STEPPED FIELD PLATE | June 2022 | December 2024 | Allow | 30 | 0 | 0 | Yes | No |
| 17804159 | WAFER PROCESSING METHOD | May 2022 | March 2025 | Allow | 34 | 1 | 0 | Yes | No |
| 17745639 | METHOD OF FORMING A SEMICONDUCTOR DEVICE WITH MEMORY CELLS, HIGH VOLTAGE DEVICES AND LOGIC DEVICES ON A SUBSTRATE USING A DUMMY AREA | May 2022 | September 2024 | Allow | 29 | 0 | 0 | No | No |
| 17744238 | THREE DIMENSIONAL DEVICE FORMATION USING EARLY REMOVAL OF SACRIFICIAL HETEROSTRUCTURE LAYER | May 2022 | October 2024 | Allow | 29 | 0 | 0 | No | No |
| 17735800 | Oblique Deposition and Etch Processes | May 2022 | January 2025 | Allow | 32 | 0 | 1 | No | No |
| 17734634 | CONTROLLING POSITIVE FEEDBACK IN FILAMENTARY RRAM STRUCTURES | May 2022 | August 2023 | Allow | 15 | 1 | 0 | No | No |
| 17708316 | VERTICAL SEMICONDUCTOR DEVICES | March 2022 | December 2022 | Allow | 9 | 0 | 0 | No | No |
| 17706715 | METHODS FOR MEASURING A MAGNETIC CORE LAYER PROFILE IN AN INTEGRATED CIRCUIT | March 2022 | April 2025 | Allow | 36 | 1 | 1 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner NICELY, JOSEPH C.
With a 0.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 24.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner NICELY, JOSEPH C works in Art Unit 2813 and has examined 964 patent applications in our dataset. With an allowance rate of 81.3%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 22 months.
Examiner NICELY, JOSEPH C's allowance rate of 81.3% places them in the 52% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by NICELY, JOSEPH C receive 1.46 office actions before reaching final disposition. This places the examiner in the 24% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by NICELY, JOSEPH C is 22 months. This places the examiner in the 89% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +18.2% benefit to allowance rate for applications examined by NICELY, JOSEPH C. This interview benefit is in the 60% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.
When applicants file an RCE with this examiner, 22.2% of applications are subsequently allowed. This success rate is in the 28% percentile among all examiners. Strategic Insight: RCEs show below-average effectiveness with this examiner. Carefully evaluate whether an RCE or continuation is the better strategy.
This examiner enters after-final amendments leading to allowance in 45.6% of cases where such amendments are filed. This entry rate is in the 69% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 30.8% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 32% percentile among all examiners. Note: Pre-appeal conferences show below-average success with this examiner. Consider whether your arguments are strong enough to warrant a PAC request.
This examiner withdraws rejections or reopens prosecution in 66.7% of appeals filed. This is in the 50% percentile among all examiners. Of these withdrawals, 58.3% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.
When applicants file petitions regarding this examiner's actions, 47.5% are granted (fully or in part). This grant rate is in the 42% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 4.1% of allowed cases (in the 83% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.8% of allowed cases (in the 58% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.