Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18786636 | MEMORY STRUCTURES AND METHODS OF FORMING THE SAME | July 2024 | March 2025 | Allow | 8 | 1 | 0 | No | No |
| 18771783 | METHODS RELATED TO RADIO-FREQUENCY SWITCHING DEVICES HAVING IMPROVED VOLTAGE HANDLING CAPABILITY | July 2024 | February 2026 | Allow | 19 | 1 | 0 | No | No |
| 18637915 | BUFFERED TOP THIN FILM RESISTOR, MIM CAPACITOR, AND METHOD OF FORMING THE SAME | April 2024 | March 2025 | Allow | 11 | 2 | 0 | Yes | No |
| 18632960 | UNDER-SOURCE BODY CONTACT | April 2024 | March 2025 | Allow | 12 | 2 | 0 | Yes | No |
| 18628325 | Integrated Circuit Device and Method of Forming the Same | April 2024 | January 2026 | Allow | 22 | 1 | 0 | No | No |
| 18613389 | THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES | March 2024 | September 2024 | Allow | 6 | 0 | 0 | No | No |
| 18614439 | SEMICONDUCTOR RECTIFIER AND MANUFACTURING METHOD OF THE SAME | March 2024 | August 2024 | Allow | 5 | 1 | 1 | No | No |
| 18603932 | METHOD FOR PROCESSING MEMORY DEVICE | March 2024 | September 2024 | Allow | 6 | 1 | 0 | No | No |
| 18438338 | RADIO-FREQUENCY SWITCHING DEVICES HAVING IMPROVED VOLTAGE HANDLING CAPABILITY | February 2024 | September 2024 | Allow | 8 | 0 | 0 | Yes | No |
| 18509468 | THIN FILM TRANSISTOR, METHOD FOR MANUFACTURING THE SAME, AND SEMICONDUCTOR DEVICE | November 2023 | June 2024 | Allow | 7 | 0 | 0 | No | No |
| 18483413 | SEMICONDUCTOR DEVICES INCLUDING GATE SPACER | October 2023 | January 2025 | Allow | 15 | 2 | 0 | Yes | No |
| 18375455 | DISPLAY APPARATUS INCLUDING CONDUCTIVE PATTERN IN SUBSTRATE AND METHOD OF MANUFACTURING THE SAME | September 2023 | April 2024 | Allow | 7 | 0 | 0 | Yes | No |
| 18448305 | SEMICONDUCTOR DEVICE WITH FIELD PLATE STRUCTURES | August 2023 | February 2026 | Allow | 30 | 0 | 1 | No | No |
| 18264561 | HIGH VOLTAGE NITRIDE SEMICONDUCTOR DEVICE | August 2023 | October 2025 | Allow | 26 | 0 | 0 | No | No |
| 18365503 | MIDDLE-OF-LINE INTERCONNECT STRUCTURE AND MANUFACTURING METHOD | August 2023 | December 2024 | Allow | 16 | 1 | 0 | No | No |
| 18230137 | ISOLATOR | August 2023 | January 2026 | Allow | 30 | 1 | 0 | No | No |
| 18360843 | MANUFACTURING METHOD OF A SEMICONDUCTOR DEVICE WITH JUNCTION FIELD EFFECT TRANSISTOR | July 2023 | October 2025 | Allow | 26 | 0 | 0 | No | No |
| 18224864 | SEMICONDUCTOR DEVICE COMPRISING ALIGNMENT KEY | July 2023 | January 2026 | Allow | 30 | 1 | 0 | Yes | No |
| 18355834 | SEMICONDUCTOR DEVICE WITH FLOATING GATE, AND METHOD FOR MANUFACTURING THE SAME | July 2023 | October 2025 | Allow | 27 | 0 | 0 | No | No |
| 18329206 | SEMICONDUCTOR DEVICES | June 2023 | October 2024 | Allow | 16 | 0 | 1 | No | No |
| 18035086 | POWER FIELD-EFFECT TRANSISTOR AND MANUFACTURING METHOD | May 2023 | December 2025 | Allow | 31 | 1 | 0 | No | No |
| 18132562 | A GRAPHENE-BASED BIOSENSOR | April 2023 | January 2026 | Allow | 33 | 1 | 0 | No | No |
| 18132966 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | April 2023 | March 2025 | Allow | 24 | 1 | 1 | No | No |
| 18247554 | DISPLAY PANEL WITH IMPROVED MOBILITY OF THE THIN FILM TRANSISTOR | March 2023 | December 2025 | Allow | 33 | 1 | 0 | No | No |
| 18193859 | SEMICONDUCTOR DEVICE SIDEWALL OF THE GATE SEMICONDUCTOR LAYER INCLUDING A PLURALITY OF SURFACES HAVING DIFFERENT SLOPES | March 2023 | March 2026 | Allow | 36 | 1 | 1 | Yes | No |
| 18192247 | FORKSHEET TRANSISTOR WITH DUAL DEPTH LATE CELL BOUNDARY CUT | March 2023 | October 2025 | Allow | 30 | 0 | 0 | No | No |
| 18127895 | SEMICONDUCTOR DEVICE WITH IMPROVED RELIABILITY OF A CONNECTION RELATION BETWEEN A THROUGH VIA AND A LOWER WIRIING LAYER | March 2023 | September 2025 | Allow | 30 | 0 | 0 | No | No |
| 18176612 | SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME WHICH INCREASES THE CHANNEL LENGTH | March 2023 | December 2025 | Allow | 34 | 1 | 1 | No | No |
| 18175907 | MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME, AND ELECTRONIC APPARATUS INCLUDING MEMORY DEVICE | February 2023 | January 2026 | Allow | 34 | 1 | 1 | No | No |
| 18108019 | EDMOS AND FABRICATING METHOD OF THE SAME | February 2023 | August 2025 | Allow | 30 | 1 | 0 | No | No |
| 18161329 | SEMICONDUCTOR DEVICE | January 2023 | May 2025 | Allow | 28 | 0 | 0 | No | No |
| 18161119 | SEMICONDUCTOR STRUCTURE WITH INCREASED CHANNEL LENGTH AND METHOD FOR FORMING THE SAME | January 2023 | December 2025 | Allow | 35 | 1 | 1 | Yes | No |
| 18007023 | SEMICONDUCTOR DEVICE AND ELECTRONIC APPARATUS THAT ARE CAPABLE OF INCREASING THE EFFECTIVE CHANNEL WIDTH | January 2023 | October 2025 | Allow | 32 | 1 | 0 | No | No |
| 18153368 | A SEMICONDUCTOR DEVICE AND A METHOD OF FABRICATING THE SAMEWITH INCREASED EFFECTIVE WIDTH OF THE CHANNEL WITHOUT INCREASING THE WIDTH OF THE GATE ACTIVE REGION | January 2023 | December 2025 | Allow | 35 | 1 | 1 | Yes | No |
| 18092239 | MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE INCLUDING FORMING A RECESS FILLING PATTERN | December 2022 | August 2025 | Allow | 31 | 0 | 0 | No | No |
| 18072201 | LOCOS FILLET FOR DRAIN REDUCED BREAKDOWN IN HIGH VOLTAGE TRANSISTORS | November 2022 | June 2025 | Allow | 31 | 0 | 0 | No | No |
| 18059186 | IC STRUCTURE WITH GATE ELECTRODE FULLY WITHIN V-SHAPED CAVITY | November 2022 | February 2026 | Allow | 38 | 2 | 0 | Yes | No |
| 17925303 | A METHOD OF MANUFACTURING A SEMICONDUCTOR STRUCTURE, WHICH CAN BE APPLIED TO FULL-COLOR LED | November 2022 | August 2025 | Allow | 33 | 1 | 0 | No | No |
| 17984736 | TRANSISTOR WITH METAL FIELD PLATE CONTACT | November 2022 | March 2026 | Allow | 40 | 2 | 0 | No | No |
| 17983788 | RFLDMOS DEVICE AND MANUFACTURING METHOD THEREOF | November 2022 | June 2025 | Allow | 31 | 0 | 0 | No | No |
| 17983434 | NMOS HALF-BRIDGE POWER DEVICE AND MANUFACTURING METHOD THEREOF | November 2022 | June 2025 | Allow | 31 | 0 | 0 | No | No |
| 17982164 | SEMICONDUCTOR DEVICE, METHOD OF FABRICATING THE SAME, AND DISPLAY DEVICE INCLUDING THE SAME | November 2022 | May 2024 | Allow | 18 | 0 | 0 | No | No |
| 17977978 | ARRAY SUBSTRATE AND DISPLAY DEVICE INCLUDING THEREOF | October 2022 | August 2025 | Allow | 33 | 1 | 0 | No | No |
| 18046531 | METAL OXIDE SEMICONDUCTOR DEVICES AND INTEGRATION METHODS | October 2022 | November 2025 | Allow | 38 | 1 | 1 | No | No |
| 17936434 | VERTICAL-TRANSPORT FIELD-EFFECT TRANSISTOR WITH BACKSIDE SOURCE/DRAIN CONNECTIONS | September 2022 | November 2025 | Allow | 37 | 1 | 0 | Yes | No |
| 17933304 | FIELD EFFECT TRANSISTOR WITH ADJUSTABLE EFFECTIVE GATE LENGTH | September 2022 | July 2025 | Allow | 34 | 2 | 1 | No | No |
| 17939617 | VERTICAL TRANSISTOR STRUCTURES WITH OFFSET SPACERS | September 2022 | January 2026 | Abandon | 40 | 0 | 1 | No | No |
| 17823985 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | September 2022 | August 2025 | Allow | 35 | 1 | 1 | Yes | No |
| 17900639 | Performance Optimization By Sizing Gates And Source/Drain Contacts Differently For Different Transistors | August 2022 | January 2026 | Allow | 40 | 2 | 1 | No | No |
| 17883683 | SEMICONDUCTOR DEVICE INCLUDING OXIDE SEMICONDUCTOR LAYER | August 2022 | March 2025 | Allow | 31 | 1 | 0 | No | No |
| 17873547 | SELF-ALIGNED CONTACT AND CONTACT OVER ACTIVE GATE STRUCTURES | July 2022 | September 2024 | Abandon | 26 | 1 | 0 | No | No |
| 17814683 | Semiconductor Device | July 2022 | August 2025 | Allow | 37 | 1 | 1 | Yes | No |
| 17812744 | VTFET WITH REDUCED PARASITIC CAPACITANCE | July 2022 | November 2025 | Allow | 41 | 2 | 1 | Yes | No |
| 17862710 | SEMICONDUCTOR STRUCTURE THAT INCLUDES SELF-ALIGNED CONTACT PLUGS AND METHODS FOR MANUFACTURING THE SAME | July 2022 | September 2025 | Allow | 38 | 1 | 1 | No | No |
| 17810652 | SELF-ALIGNED BOTTOM SPACER | July 2022 | November 2025 | Allow | 40 | 0 | 1 | No | No |
| 17810814 | METHOD FOR FORMING SEMICONDUCTOR STRUCTURE FOR MEMORY DEVICE | July 2022 | March 2024 | Allow | 21 | 0 | 0 | No | No |
| 17810634 | SEMICONDUCTOR STRUCTURE INCLUDING A PLURALITY OF SEMICONDCUTOR PILLARS AND BIT LINE ISOLATION TRENCHES AND METHOD FOR FORMING SAME | July 2022 | July 2025 | Allow | 36 | 1 | 1 | No | No |
| 17856745 | FLEXIBLE ELECTROLUMINESCENT DEVICES | July 2022 | September 2025 | Allow | 38 | 1 | 0 | No | No |
| 17854477 | 3D NAND MEMORY DEVICE WITH ISOLATION TRENCHES AND FABRICATION METHOD THEREOF | June 2022 | December 2025 | Allow | 41 | 2 | 1 | No | No |
| 17854474 | GAP FILLING METHOD IN SEMICONDUCTOR MANUFACTURING PROCESS | June 2022 | August 2025 | Allow | 38 | 1 | 0 | No | No |
| 17844971 | SEMICONDUCTOR DEVICE HAVING GATE ELECTRODES WITH DOPANT OF DIFFERENT CONDUCTIVE TYPES | June 2022 | April 2025 | Allow | 34 | 2 | 0 | No | No |
| 17807841 | TRANSISTOR DIE WITH PRIMARY AND ANCILLARY TRANSISTOR ELEMENTS | June 2022 | April 2025 | Allow | 34 | 0 | 0 | No | No |
| 17841873 | METHOD OF FABRICATING SEMICONDUCTOR DEVICES INCLUDING A FIN FIELD EFFECT TRANSISTOR | June 2022 | March 2024 | Allow | 21 | 0 | 0 | No | No |
| 17838644 | THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES | June 2022 | December 2023 | Allow | 18 | 0 | 0 | No | No |
| 17835983 | Gallium Nitride Device with Field Plate Structure and Method of Manufacturing the Same | June 2022 | March 2025 | Allow | 33 | 1 | 1 | No | No |
| 17831892 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE WITH WORD LINES | June 2022 | September 2024 | Allow | 28 | 0 | 0 | No | No |
| 17830480 | SEMICONDUCTOR DEVICE WITH GUARD RING | June 2022 | September 2024 | Allow | 28 | 0 | 0 | No | No |
| 17830723 | METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH GUARD RING | June 2022 | September 2024 | Allow | 28 | 0 | 0 | No | No |
| 17804680 | FABRICATING AN ELECTROCONDUCTIVE CONTACT ON A TOP SURFACE OF A TUNNELING MAGNETORESISTANCE ELEMENT | May 2022 | March 2025 | Allow | 34 | 0 | 1 | Yes | No |
| 17825229 | Apparatus For Single Chamber Deposition And Etch | May 2022 | December 2025 | Allow | 42 | 2 | 0 | No | No |
| 17735475 | SEMICONDUCTOR DEVICE INCLUDING METAL-2 DIMENSIONAL MATERIAL-SEMICONDUCTOR CONTACT | May 2022 | March 2024 | Allow | 22 | 1 | 0 | No | No |
| 17660729 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | April 2022 | January 2025 | Allow | 32 | 0 | 1 | No | No |
| 17658960 | PIXEL-TYPE SEMICONDUCTOR LIGHT-EMITTING DEVICE AND METHOD OF MANUFACTURING THE SAME | April 2022 | March 2024 | Allow | 23 | 1 | 0 | Yes | No |
| 17658914 | STRUCTURE HAVING DIFFERENT GATE DIELECTRIC WIDTHS IN DIFFERENT REGIONS OF SUBSTRATE | April 2022 | July 2025 | Allow | 39 | 2 | 1 | Yes | No |
| 17657242 | SELECTIVE DONOR PLATES, METHODS OF FABRICATION AND USES THEREOF FOR ASSEMBLING COMPONENTS ONTO SUBSTRATES | March 2022 | May 2025 | Abandon | 38 | 0 | 1 | No | No |
| 17706792 | METHOD OF PREPARING SEMICONDUCTOR STRUCTURE HAVING LOW DIELECTRIC CONSTANT LAYER | March 2022 | November 2024 | Allow | 32 | 1 | 0 | No | No |
| 17702831 | POWER DEVICE AND FABRICATION METHOD THEREOF | March 2022 | November 2024 | Allow | 32 | 1 | 0 | No | No |
| 17694694 | MIDDLE VOLTAGE TRANSISTOR AND FABRICATING METHOD OF THE SAME | March 2022 | March 2025 | Allow | 36 | 1 | 1 | Yes | No |
| 17687812 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE | March 2022 | February 2025 | Abandon | 36 | 0 | 1 | No | No |
| 17653481 | HIGH PERFORMANCE DEVICE WITH DOUBLE SIDE CONTACTS | March 2022 | September 2025 | Abandon | 43 | 2 | 1 | No | No |
| 17668548 | DISPLAY DEVICE | February 2022 | June 2024 | Allow | 29 | 1 | 0 | Yes | No |
| 17665398 | MOSFET DEVICE WITH SHIELDING REGION AND MANUFACTURING METHOD THEREOF | February 2022 | July 2024 | Allow | 29 | 1 | 0 | No | No |
| 17584580 | ASYMMETRIC SEMICONDUCTOR DEVICE INCLUDING LDD REGION AND MANUFACTURING METHOD THEREOF | January 2022 | June 2024 | Allow | 29 | 0 | 0 | No | No |
| 17583050 | TRENCH-GATE MOS TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME | January 2022 | January 2024 | Allow | 24 | 1 | 0 | No | No |
| 17582230 | METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH SIDEWALL OXIDIZED DIELECTRIC | January 2022 | February 2024 | Allow | 25 | 1 | 0 | No | No |
| 17648161 | Integrating Passive Devices in Package Structures | January 2022 | June 2024 | Allow | 29 | 1 | 0 | Yes | No |
| 17573708 | METHOD FOR FORMING A TRENCH IN A FIRST SEMICONDUCTOR LAYER OF A MULTI-LAYER SYSTEM | January 2022 | June 2024 | Allow | 29 | 0 | 0 | No | No |
| 17564688 | SEMICONDUCTOR AND METHOD OF MANUFACTURING THE SAME | December 2021 | June 2024 | Allow | 30 | 0 | 1 | No | No |
| 17556344 | METHOD AND APPARATUS FOR SUPPLYING POWER TO VLSI SILICON CHIPS | December 2021 | November 2024 | Allow | 35 | 1 | 1 | Yes | No |
| 17546443 | USING A SAME MASK FOR DIRECT PRINT AND SELF-ALIGNED DOUBLE PATTERNING OF NANOSHEETS | December 2021 | June 2024 | Allow | 30 | 1 | 0 | Yes | No |
| 17643404 | METHOD OF FABRICATING SEMICONDUCTOR STRUCTURE | December 2021 | October 2023 | Allow | 22 | 0 | 0 | No | No |
| 17522543 | Tiered-Profile Contact for Semiconductor | November 2021 | September 2024 | Allow | 34 | 2 | 0 | No | No |
| 17518270 | SEMICONDUCTOR STRUCTURE WITH AN AIR GAP AND METHOD OF FORMING THE SAME | November 2021 | October 2024 | Allow | 35 | 1 | 1 | No | No |
| 17508832 | SEMICONDUCTOR DEVICE INCLUDING A BURIED CHANNEL ARRAY TRANSISTOR STRUCTURE | October 2021 | April 2024 | Allow | 30 | 3 | 0 | No | No |
| 17505340 | SEMICONDUCTOR INTEGRATED CIRCUIT COMPONENT | October 2021 | February 2025 | Allow | 40 | 2 | 1 | Yes | No |
| 17448916 | SILICON CARBIDE FIELD-EFFECT TRANSISTORS | September 2021 | September 2023 | Allow | 24 | 0 | 0 | No | No |
| 17476558 | METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE WITH REDUCED VARIATION OF THE IMPURITY CONCENTRATION NEAR THE SURFACE OF THE SEMICONDUCTOR FILM | September 2021 | October 2023 | Allow | 25 | 0 | 0 | No | No |
| 17400965 | Integrated Circuit Device and Method of Forming the Same | August 2021 | December 2023 | Allow | 28 | 0 | 0 | No | No |
| 17379265 | Semiconductor Devices and Methods of Manufacture | July 2021 | May 2024 | Allow | 34 | 1 | 0 | No | No |
| 17353394 | RADIO-FREQUENCY SWITCHING DEVICES HAVING IMPROVED VOLTAGE HANDLING CAPABILITY | June 2021 | March 2024 | Allow | 32 | 2 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner MALEK, MALIHEH.
With a 37.5% reversal rate, the PTAB reverses the examiner's rejections in a meaningful percentage of cases. This reversal rate is above the USPTO average, indicating that appeals have better success here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 27.6% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner MALEK, MALIHEH works in Art Unit 2813 and has examined 635 patent applications in our dataset. With an allowance rate of 78.6%, this examiner has a below-average tendency to allow applications. Applications typically reach final disposition in approximately 29 months.
Examiner MALEK, MALIHEH's allowance rate of 78.6% places them in the 47% percentile among all USPTO examiners. This examiner has a below-average tendency to allow applications.
On average, applications examined by MALEK, MALIHEH receive 2.03 office actions before reaching final disposition. This places the examiner in the 53% percentile for office actions issued. This examiner issues a slightly above-average number of office actions.
The median time to disposition (half-life) for applications examined by MALEK, MALIHEH is 29 months. This places the examiner in the 65% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a +3.4% benefit to allowance rate for applications examined by MALEK, MALIHEH. This interview benefit is in the 25% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 30.2% of applications are subsequently allowed. This success rate is in the 59% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 29.4% of cases where such amendments are filed. This entry rate is in the 42% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.
When applicants request a pre-appeal conference (PAC) with this examiner, 138.5% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 88% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 74.2% of appeals filed. This is in the 63% percentile among all examiners. Of these withdrawals, 52.2% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.
When applicants file petitions regarding this examiner's actions, 47.5% are granted (fully or in part). This grant rate is in the 42% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 5.0% of allowed cases (in the 86% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 4.4% of allowed cases (in the 79% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.