Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18786636 | MEMORY STRUCTURES AND METHODS OF FORMING THE SAME | July 2024 | March 2025 | Allow | 8 | 1 | 0 | No | No |
| 18637915 | BUFFERED TOP THIN FILM RESISTOR, MIM CAPACITOR, AND METHOD OF FORMING THE SAME | April 2024 | March 2025 | Allow | 11 | 2 | 0 | Yes | No |
| 18632960 | UNDER-SOURCE BODY CONTACT | April 2024 | March 2025 | Allow | 12 | 2 | 0 | Yes | No |
| 18613389 | THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES | March 2024 | September 2024 | Allow | 6 | 0 | 0 | No | No |
| 18614439 | SEMICONDUCTOR RECTIFIER AND MANUFACTURING METHOD OF THE SAME | March 2024 | August 2024 | Allow | 5 | 1 | 1 | No | No |
| 18603932 | METHOD FOR PROCESSING MEMORY DEVICE | March 2024 | September 2024 | Allow | 6 | 1 | 0 | No | No |
| 18438338 | RADIO-FREQUENCY SWITCHING DEVICES HAVING IMPROVED VOLTAGE HANDLING CAPABILITY | February 2024 | September 2024 | Allow | 8 | 0 | 0 | Yes | No |
| 18509468 | THIN FILM TRANSISTOR, METHOD FOR MANUFACTURING THE SAME, AND SEMICONDUCTOR DEVICE | November 2023 | June 2024 | Allow | 7 | 0 | 0 | No | No |
| 18483413 | SEMICONDUCTOR DEVICES INCLUDING GATE SPACER | October 2023 | January 2025 | Allow | 15 | 2 | 0 | Yes | No |
| 18375455 | DISPLAY APPARATUS INCLUDING CONDUCTIVE PATTERN IN SUBSTRATE AND METHOD OF MANUFACTURING THE SAME | September 2023 | April 2024 | Allow | 7 | 0 | 0 | Yes | No |
| 18365503 | MIDDLE-OF-LINE INTERCONNECT STRUCTURE AND MANUFACTURING METHOD | August 2023 | December 2024 | Allow | 16 | 1 | 0 | No | No |
| 18329206 | SEMICONDUCTOR DEVICES | June 2023 | October 2024 | Allow | 16 | 0 | 1 | No | No |
| 18132966 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | April 2023 | March 2025 | Allow | 24 | 1 | 1 | No | No |
| 18161329 | SEMICONDUCTOR DEVICE | January 2023 | May 2025 | Allow | 28 | 0 | 0 | No | No |
| 18072201 | LOCOS FILLET FOR DRAIN REDUCED BREAKDOWN IN HIGH VOLTAGE TRANSISTORS | November 2022 | June 2025 | Allow | 31 | 0 | 0 | No | No |
| 17983788 | RFLDMOS DEVICE AND MANUFACTURING METHOD THEREOF | November 2022 | June 2025 | Allow | 31 | 0 | 0 | No | No |
| 17983434 | NMOS HALF-BRIDGE POWER DEVICE AND MANUFACTURING METHOD THEREOF | November 2022 | June 2025 | Allow | 31 | 0 | 0 | No | No |
| 17982164 | SEMICONDUCTOR DEVICE, METHOD OF FABRICATING THE SAME, AND DISPLAY DEVICE INCLUDING THE SAME | November 2022 | May 2024 | Allow | 18 | 0 | 0 | No | No |
| 17883683 | SEMICONDUCTOR DEVICE INCLUDING OXIDE SEMICONDUCTOR LAYER | August 2022 | March 2025 | Allow | 31 | 1 | 0 | No | No |
| 17873547 | SELF-ALIGNED CONTACT AND CONTACT OVER ACTIVE GATE STRUCTURES | July 2022 | September 2024 | Abandon | 26 | 1 | 0 | No | No |
| 17810814 | METHOD FOR FORMING SEMICONDUCTOR STRUCTURE FOR MEMORY DEVICE | July 2022 | March 2024 | Allow | 21 | 0 | 0 | No | No |
| 17844971 | SEMICONDUCTOR DEVICE HAVING GATE ELECTRODES WITH DOPANT OF DIFFERENT CONDUCTIVE TYPES | June 2022 | April 2025 | Allow | 34 | 2 | 0 | No | No |
| 17807841 | TRANSISTOR DIE WITH PRIMARY AND ANCILLARY TRANSISTOR ELEMENTS | June 2022 | April 2025 | Allow | 34 | 0 | 0 | No | No |
| 17841873 | METHOD OF FABRICATING SEMICONDUCTOR DEVICES INCLUDING A FIN FIELD EFFECT TRANSISTOR | June 2022 | March 2024 | Allow | 21 | 0 | 0 | No | No |
| 17838644 | THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES | June 2022 | December 2023 | Allow | 18 | 0 | 0 | No | No |
| 17835983 | Gallium Nitride Device with Field Plate Structure and Method of Manufacturing the Same | June 2022 | March 2025 | Allow | 33 | 1 | 1 | No | No |
| 17831892 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE WITH WORD LINES | June 2022 | September 2024 | Allow | 28 | 0 | 0 | No | No |
| 17830723 | METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH GUARD RING | June 2022 | September 2024 | Allow | 28 | 0 | 0 | No | No |
| 17830480 | SEMICONDUCTOR DEVICE WITH GUARD RING | June 2022 | September 2024 | Allow | 28 | 0 | 0 | No | No |
| 17804680 | FABRICATING AN ELECTROCONDUCTIVE CONTACT ON A TOP SURFACE OF A TUNNELING MAGNETORESISTANCE ELEMENT | May 2022 | March 2025 | Allow | 34 | 0 | 1 | Yes | No |
| 17735475 | SEMICONDUCTOR DEVICE INCLUDING METAL-2 DIMENSIONAL MATERIAL-SEMICONDUCTOR CONTACT | May 2022 | March 2024 | Allow | 22 | 1 | 0 | No | No |
| 17660729 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | April 2022 | January 2025 | Allow | 32 | 0 | 1 | No | No |
| 17658960 | PIXEL-TYPE SEMICONDUCTOR LIGHT-EMITTING DEVICE AND METHOD OF MANUFACTURING THE SAME | April 2022 | March 2024 | Allow | 23 | 1 | 0 | Yes | No |
| 17658914 | STRUCTURE HAVING DIFFERENT GATE DIELECTRIC WIDTHS IN DIFFERENT REGIONS OF SUBSTRATE | April 2022 | July 2025 | Allow | 39 | 2 | 1 | Yes | No |
| 17657242 | SELECTIVE DONOR PLATES, METHODS OF FABRICATION AND USES THEREOF FOR ASSEMBLING COMPONENTS ONTO SUBSTRATES | March 2022 | May 2025 | Abandon | 38 | 0 | 1 | No | No |
| 17706792 | METHOD OF PREPARING SEMICONDUCTOR STRUCTURE HAVING LOW DIELECTRIC CONSTANT LAYER | March 2022 | November 2024 | Allow | 32 | 1 | 0 | No | No |
| 17702831 | POWER DEVICE AND FABRICATION METHOD THEREOF | March 2022 | November 2024 | Allow | 32 | 1 | 0 | No | No |
| 17694694 | MIDDLE VOLTAGE TRANSISTOR AND FABRICATING METHOD OF THE SAME | March 2022 | March 2025 | Allow | 36 | 1 | 1 | Yes | No |
| 17687812 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE | March 2022 | February 2025 | Abandon | 36 | 0 | 1 | No | No |
| 17668548 | DISPLAY DEVICE | February 2022 | June 2024 | Allow | 29 | 1 | 0 | Yes | No |
| 17665398 | MOSFET DEVICE WITH SHIELDING REGION AND MANUFACTURING METHOD THEREOF | February 2022 | July 2024 | Allow | 29 | 1 | 0 | No | No |
| 17584580 | ASYMMETRIC SEMICONDUCTOR DEVICE INCLUDING LDD REGION AND MANUFACTURING METHOD THEREOF | January 2022 | June 2024 | Allow | 29 | 0 | 0 | No | No |
| 17583050 | TRENCH-GATE MOS TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME | January 2022 | January 2024 | Allow | 24 | 1 | 0 | No | No |
| 17582230 | METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH SIDEWALL OXIDIZED DIELECTRIC | January 2022 | February 2024 | Allow | 25 | 1 | 0 | No | No |
| 17648161 | Integrating Passive Devices in Package Structures | January 2022 | June 2024 | Allow | 29 | 1 | 0 | Yes | No |
| 17573708 | METHOD FOR FORMING A TRENCH IN A FIRST SEMICONDUCTOR LAYER OF A MULTI-LAYER SYSTEM | January 2022 | June 2024 | Allow | 29 | 0 | 0 | No | No |
| 17564688 | SEMICONDUCTOR AND METHOD OF MANUFACTURING THE SAME | December 2021 | June 2024 | Allow | 30 | 0 | 1 | No | No |
| 17556344 | METHOD AND APPARATUS FOR SUPPLYING POWER TO VLSI SILICON CHIPS | December 2021 | November 2024 | Allow | 35 | 1 | 1 | Yes | No |
| 17546443 | USING A SAME MASK FOR DIRECT PRINT AND SELF-ALIGNED DOUBLE PATTERNING OF NANOSHEETS | December 2021 | June 2024 | Allow | 30 | 1 | 0 | Yes | No |
| 17643404 | METHOD OF FABRICATING SEMICONDUCTOR STRUCTURE | December 2021 | October 2023 | Allow | 22 | 0 | 0 | No | No |
| 17522543 | Tiered-Profile Contact for Semiconductor | November 2021 | September 2024 | Allow | 34 | 2 | 0 | No | No |
| 17518270 | SEMICONDUCTOR STRUCTURE WITH AN AIR GAP AND METHOD OF FORMING THE SAME | November 2021 | October 2024 | Allow | 35 | 1 | 1 | No | No |
| 17508832 | SEMICONDUCTOR DEVICE INCLUDING A BURIED CHANNEL ARRAY TRANSISTOR STRUCTURE | October 2021 | April 2024 | Allow | 30 | 3 | 0 | No | No |
| 17505340 | SEMICONDUCTOR INTEGRATED CIRCUIT COMPONENT | October 2021 | February 2025 | Allow | 40 | 2 | 1 | Yes | No |
| 17448916 | SILICON CARBIDE FIELD-EFFECT TRANSISTORS | September 2021 | September 2023 | Allow | 24 | 0 | 0 | No | No |
| 17476558 | METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE WITH REDUCED VARIATION OF THE IMPURITY CONCENTRATION NEAR THE SURFACE OF THE SEMICONDUCTOR FILM | September 2021 | October 2023 | Allow | 25 | 0 | 0 | No | No |
| 17400965 | Integrated Circuit Device and Method of Forming the Same | August 2021 | December 2023 | Allow | 28 | 0 | 0 | No | No |
| 17379265 | Semiconductor Devices and Methods of Manufacture | July 2021 | May 2024 | Allow | 34 | 1 | 0 | No | No |
| 17353325 | METHODS RELATED TO RADIO-FREQUENCY SWITCHING DEVICES HAVING IMPROVED VOLTAGE HANDLING CAPABILITY | June 2021 | October 2023 | Allow | 27 | 1 | 0 | No | No |
| 17353394 | RADIO-FREQUENCY SWITCHING DEVICES HAVING IMPROVED VOLTAGE HANDLING CAPABILITY | June 2021 | March 2024 | Allow | 32 | 2 | 0 | No | No |
| 17342813 | METHOD OF MANUFACTURING AN OPTICAL SEMICONDUCTOR DEVICE | June 2021 | February 2025 | Allow | 45 | 6 | 0 | Yes | Yes |
| 17313646 | METHODS OF FORMING A SEMICONDUCTOR DEVICE COMPRISING A CHANNEL MATERIAL | May 2021 | December 2022 | Allow | 20 | 0 | 0 | Yes | No |
| 17313034 | THIN FILM TRANSISTOR, METHOD FOR MANUFACTURING THE SAME, AND SEMICONDUCTOR DEVICE | May 2021 | June 2023 | Allow | 26 | 0 | 0 | No | No |
| 17238108 | DISPLAY PANEL AND DISPLAY APPARATUS INCLUDING THE SAME | April 2021 | June 2023 | Allow | 25 | 1 | 0 | No | No |
| 17235491 | TRANSISTOR CELL WITH SELF-ALIGNED GATE CONTACT | April 2021 | March 2025 | Allow | 46 | 2 | 1 | No | No |
| 17228640 | Barrier Film Laminate Comprising Submicron Getter Particles and Electronic Device Comprising Such a Laminate | April 2021 | April 2024 | Abandon | 36 | 1 | 0 | No | No |
| 17216444 | Contact Metallization Process | March 2021 | August 2024 | Allow | 41 | 2 | 1 | Yes | No |
| 17276248 | SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | March 2021 | October 2024 | Allow | 43 | 3 | 1 | No | No |
| 17145414 | HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) | January 2021 | September 2023 | Allow | 33 | 3 | 0 | Yes | No |
| 17142220 | DISPLAY APPARATUS INCLUDING CONDUCTIVE PATTERN IN SUBSTRATE AND METHOD OF MANUFACTURING THE SAME | January 2021 | June 2023 | Allow | 30 | 0 | 0 | No | No |
| 17136548 | VERTICAL FIN FIELD EFFECT TRANSISTOR DEVICES WITH REDUCED TOP SOURCE/DRAIN VARIABILITY AND LOWER RESISTANCE | December 2020 | March 2024 | Allow | 38 | 2 | 0 | No | No |
| 17134830 | MIDDLE-OF-LINE INTERCONNECT STRUCTURE AND MANUFACTURING METHOD | December 2020 | December 2024 | Allow | 47 | 3 | 1 | Yes | No |
| 17132293 | MULTI-GATE SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING THE SAME | December 2020 | August 2024 | Allow | 43 | 3 | 1 | No | No |
| 17120784 | SEMICONDUCTOR DEVICES | December 2020 | April 2024 | Allow | 40 | 2 | 1 | Yes | No |
| 17113305 | TRENCH MOSFET AND METHOD FOR MANUFACTURING THE SAME | December 2020 | August 2024 | Allow | 45 | 2 | 1 | Yes | No |
| 17112343 | SEMICONDUCTOR DEVICE WITH U-SHAPED CHANNEL AND ELECTRONIC APPARATUS INCLUDING THE SAME | December 2020 | September 2023 | Allow | 33 | 1 | 1 | No | No |
| 17103584 | METHOD OF MANUFACTURING DIE SEAL RING | November 2020 | March 2023 | Allow | 28 | 1 | 0 | No | No |
| 17086255 | LATERAL DOUBLE-DIFFUSED TRANSISTOR AND MANUFACTURING METHOD THEREOF | October 2020 | June 2024 | Allow | 44 | 3 | 1 | No | No |
| 17063084 | HIGH VOLTAGE FIELD EFFECT TRANSISTOR WITH VERTICAL CURRENT PATHS AND METHOD OF MAKING THE SAME | October 2020 | August 2023 | Allow | 34 | 2 | 1 | No | No |
| 17060193 | SEMICONDUCTOR DEVICES INCLUDING GATE SPACER | October 2020 | June 2023 | Allow | 32 | 2 | 1 | Yes | No |
| 17019767 | SEMICONDUCTOR DEVICES | September 2020 | January 2023 | Allow | 28 | 0 | 1 | No | No |
| 17014266 | TRENCH-GATE MOS TRANSISTOR AND METHOD FOR MANUFACTURING | September 2020 | October 2021 | Allow | 13 | 1 | 0 | No | No |
| 17001925 | SEMICONDUCTOR DEVICE INCLUDING METAL-2 DIMENSIONAL MATERIAL-SEMICONDUCTOR CONTACT | August 2020 | January 2022 | Allow | 17 | 1 | 0 | No | No |
| 16996206 | SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME | August 2020 | June 2023 | Allow | 34 | 2 | 1 | No | No |
| 16947692 | INTEGRATED CIRCUIT DEVICES INCLUDING VERTICAL FIELD-EFFECT TRANSISTORS | August 2020 | March 2023 | Allow | 32 | 1 | 1 | Yes | No |
| 16988374 | METHOD FOR DEPOSITING SILICON-FREE CARBON-CONTAINING FILM AS GAP-FILL LAYER BY PULSE PLASMA-ASSISTED DEPOSITION | August 2020 | November 2023 | Allow | 39 | 3 | 1 | Yes | No |
| 16986274 | METHOD FOR DEPOSITING SILICON-FREE CARBON-CONTAINING FILM AS GAP-FILL LAYER BY PULSE PLASMA-ASSISTED DEPOSITION | August 2020 | January 2023 | Allow | 29 | 1 | 1 | No | No |
| 16983143 | SEMICONDUCTOR DEVICE INCLUDING AN OXIDE SEMICONDUCTOR | August 2020 | April 2022 | Allow | 20 | 1 | 0 | No | No |
| 16945384 | SEMICONDUCTOR PACKAGE DEVICE WITH INTEGRATED ANTENNA AND MANUFACTURING METHOD THEREOF | July 2020 | November 2021 | Allow | 16 | 1 | 0 | No | No |
| 16937700 | THIN FILM TRANSISTOR, METHOD FOR PREPARING THE SAME, ARRAY SUBSTRATE, DISPLAY PANEL AND APPARATUS | July 2020 | September 2021 | Allow | 14 | 1 | 0 | No | No |
| 16914503 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | June 2020 | January 2023 | Allow | 31 | 4 | 0 | No | No |
| 16915595 | Method of Forming Contacts In a Semiconductor Device | June 2020 | April 2021 | Allow | 9 | 1 | 0 | Yes | No |
| 16910022 | Method Of Forming Split Gate Memory Cells With Thinned Side Edge Tunnel Oxide | June 2020 | April 2022 | Allow | 22 | 0 | 1 | No | No |
| 16909619 | Memory and Method for Forming the Same | June 2020 | November 2022 | Allow | 29 | 1 | 1 | No | No |
| 16897955 | FLOATING-GATE DEVICES IN HIGH VOLTAGE APPLICATIONS | June 2020 | December 2022 | Allow | 30 | 3 | 0 | Yes | No |
| 16890374 | DOPED ABSORPTION PHOTODIODE | June 2020 | March 2021 | Allow | 10 | 1 | 1 | No | No |
| 16889127 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | June 2020 | October 2021 | Allow | 16 | 1 | 0 | No | No |
| 16877855 | Method of Implanting an Implant Species into a Substrate at Different Depths | May 2020 | December 2022 | Allow | 31 | 3 | 0 | No | No |
| 16760786 | SEMICONDUCTOR DEVICE, SEMICONDUCTOR CHIP AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | April 2020 | November 2022 | Allow | 30 | 1 | 1 | No | No |
| 16858857 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | April 2020 | June 2022 | Allow | 26 | 4 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner MALEK, MALIHEH.
With a 50.0% reversal rate, the PTAB reverses the examiner's rejections in a meaningful percentage of cases. This reversal rate is above the USPTO average, indicating that appeals have better success here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 31.2% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner MALEK, MALIHEH works in Art Unit 2813 and has examined 621 patent applications in our dataset. With an allowance rate of 82.4%, this examiner has a below-average tendency to allow applications. Applications typically reach final disposition in approximately 28 months.
Examiner MALEK, MALIHEH's allowance rate of 82.4% places them in the 48% percentile among all USPTO examiners. This examiner has a below-average tendency to allow applications.
On average, applications examined by MALEK, MALIHEH receive 1.79 office actions before reaching final disposition. This places the examiner in the 54% percentile for office actions issued. This examiner issues a slightly above-average number of office actions.
The median time to disposition (half-life) for applications examined by MALEK, MALIHEH is 28 months. This places the examiner in the 52% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a +4.1% benefit to allowance rate for applications examined by MALEK, MALIHEH. This interview benefit is in the 26% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 33.3% of applications are subsequently allowed. This success rate is in the 65% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 32.1% of cases where such amendments are filed. This entry rate is in the 39% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.
When applicants request a pre-appeal conference (PAC) with this examiner, 125.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 83% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 68.4% of appeals filed. This is in the 49% percentile among all examiners. Of these withdrawals, 46.2% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.
When applicants file petitions regarding this examiner's actions, 45.9% are granted (fully or in part). This grant rate is in the 52% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.
Examiner's Amendments: This examiner makes examiner's amendments in 4.0% of allowed cases (in the 87% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 4.3% of allowed cases (in the 77% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.