Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18654293 | VERTICAL DEVICE TRIGGERED SILICON CONTROL RECTIFIER | May 2024 | February 2025 | Allow | 10 | 1 | 1 | No | No |
| 18654247 | NEUTRAL pH COPPER PLATING SOLUTION FOR UNDERCUT REDUCTION | May 2024 | January 2025 | Allow | 9 | 0 | 0 | No | No |
| 18642052 | DEVICE WITH METAL FIELD PLATE EXTENSION | April 2024 | January 2025 | Allow | 9 | 1 | 1 | Yes | No |
| 18629606 | EPITAXIAL OXIDE TRANSISTOR | April 2024 | February 2025 | Allow | 10 | 0 | 0 | No | No |
| 18629555 | EPITAXIAL OXIDE TRANSISTOR | April 2024 | April 2025 | Allow | 12 | 0 | 0 | No | No |
| 18604620 | METHOD FOR MAKING A RADIO FREQUENCY SILICON-ON-INSULATOR (RFSOI) WAFER INCLUDING A SUPERLATTICE | March 2024 | January 2025 | Allow | 11 | 2 | 0 | Yes | No |
| 18443357 | HIGH ELECTRON MOBILITY TRANSISTOR WITH DOPED SEMICONDUCTOR REGION IN GATE STRUCTURE | February 2024 | March 2025 | Allow | 13 | 1 | 0 | No | No |
| 18423986 | EPITAXIAL OXIDE TRANSISTOR | January 2024 | February 2025 | Allow | 12 | 0 | 0 | No | No |
| 18419015 | SIDEWAYS VIAS IN ISOLATION AREAS TO CONTACT INTERIOR LAYERS IN STACKED DEVICES | January 2024 | November 2024 | Allow | 10 | 0 | 1 | No | No |
| 18405875 | BOND PAD CONNECTION LAYOUT | January 2024 | November 2024 | Allow | 11 | 1 | 0 | No | No |
| 18396987 | ELECTROSTATIC DISCHARGE (ESD) PROTECTION CIRCUIT WITH DISABLE FEATURE BASED ON HOT-PLUG CONDITION DETECTION | December 2023 | February 2025 | Allow | 14 | 1 | 0 | No | No |
| 18395249 | SELF-PASSIVATED NITROGEN-POLAR III-NITRIDE TRANSISTOR | December 2023 | October 2024 | Allow | 10 | 1 | 0 | No | No |
| 18541441 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | December 2023 | August 2024 | Allow | 8 | 1 | 1 | No | No |
| 18517330 | BUFFER DESIGN FOR PACKAGE INTEGRATION | November 2023 | May 2025 | Allow | 18 | 2 | 0 | No | No |
| 18514164 | SEMICONDUCTOR STRUCTURE WITH MATERIAL MODIFICATION AND LOW RESISTANCE PLUG | November 2023 | March 2025 | Allow | 16 | 0 | 1 | No | No |
| 18513618 | DEVICE ARRAY SUBSTRATE AND DISPLAY DEVICE | November 2023 | March 2025 | Allow | 16 | 0 | 1 | Yes | No |
| 18510204 | SEMICONDUCTOR DEVICE | November 2023 | August 2024 | Allow | 9 | 1 | 0 | No | No |
| 18507957 | SEMICONDUCTOR DEVICE AND FORMING METHOD THEREOF | November 2023 | April 2025 | Allow | 17 | 0 | 1 | Yes | No |
| 18505215 | DIE CLEANING SYSTEMS AND RELATED METHODS | November 2023 | October 2024 | Allow | 11 | 1 | 0 | No | No |
| 18480323 | EPITAXIAL OXIDE MATERIALS, STRUCTURES, AND DEVICES | October 2023 | July 2024 | Allow | 9 | 0 | 0 | No | No |
| 18480334 | EPITAXIAL OXIDE MATERIALS, STRUCTURES, AND DEVICES | October 2023 | September 2024 | Allow | 11 | 1 | 0 | No | No |
| 18464517 | SEMICONDUCTOR NANOPARTICLES AND METHOD OF PRODUCING SEMICONDUCTOR NANOPARTICLES | September 2023 | December 2024 | Allow | 15 | 2 | 0 | No | No |
| 18464169 | SEMICONDUCTOR DEVICE | September 2023 | July 2024 | Allow | 10 | 1 | 0 | No | No |
| 18454938 | Power Measurement In A Two-Wire Load Control Device | August 2023 | July 2024 | Allow | 11 | 1 | 0 | No | No |
| 18362261 | FIELD EFFECT TRANSISTOR WITH NEGATIVE CAPACITANCE DIELECTRIC STRUCTURES | July 2023 | March 2025 | Allow | 19 | 1 | 0 | Yes | No |
| 18358435 | LIGHT EMITTING MODULE | July 2023 | January 2025 | Allow | 17 | 2 | 0 | Yes | No |
| 18353246 | DOUBLE-SIDED STACKED DTC STRUCTURE | July 2023 | March 2025 | Allow | 20 | 2 | 1 | No | No |
| 18351010 | SENSOR PACKAGES | July 2023 | September 2024 | Allow | 14 | 1 | 1 | No | No |
| 18340650 | MONOLITHIC SEMICONDUCTOR DEVICE ASSEMBLIES | June 2023 | August 2024 | Allow | 14 | 1 | 1 | Yes | No |
| 18323332 | ORGANIC LIGHT EMITTING DISPLAY DEVICE | May 2023 | February 2025 | Allow | 21 | 1 | 0 | No | No |
| 18319557 | SEMICONDUCTOR WAFER AND SEMICONDUCTOR CHIP | May 2023 | March 2024 | Allow | 10 | 0 | 0 | No | No |
| 18143608 | LOGIC CIRCUIT CAPABLE OF PREVENTING LATCH-UP | May 2023 | June 2024 | Allow | 13 | 1 | 0 | No | No |
| 18135203 | SEMICONDUCTOR DEVICE WITH STRAIN RELAXED LAYER | April 2023 | May 2024 | Allow | 13 | 1 | 0 | No | No |
| 18135206 | SEMICONDUCTOR DEVICE WITH STRAIN RELAXED LAYER | April 2023 | February 2024 | Allow | 10 | 0 | 0 | No | No |
| 18175650 | DISPLAY DEVICE | February 2023 | May 2024 | Allow | 14 | 0 | 1 | No | No |
| 18175234 | Display Apparatus | February 2023 | February 2025 | Allow | 24 | 2 | 1 | Yes | No |
| 18174052 | TRANSISTOR WITH MULTI-LEVEL SELF-ALIGNED GATE AND SOURCE/DRAIN TERMINALS AND METHODS | February 2023 | July 2024 | Allow | 16 | 2 | 1 | No | No |
| 18171954 | SEMICONDUCTOR DEVICE | February 2023 | June 2024 | Allow | 16 | 1 | 0 | No | No |
| 18111861 | LED CHIP AND MANUFACTURING METHOD OF THE SAME | February 2023 | January 2025 | Allow | 23 | 2 | 1 | No | No |
| 18110095 | THYRISTOR, TRIAC AND TRANSIENT-VOLTAGE-SUPPRESSION DIODE MANUFACTURING | February 2023 | October 2024 | Allow | 20 | 1 | 0 | No | No |
| 18169023 | Route Scoring For Assessing Or Predicting Driving Performance | February 2023 | August 2023 | Allow | 7 | 0 | 0 | No | No |
| 18167365 | EPITAXIAL OXIDE MATERIALS, STRUCTURES, AND DEVICES | February 2023 | August 2024 | Allow | 18 | 1 | 1 | No | No |
| 18167349 | EPITAXIAL OXIDE MATERIALS, STRUCTURES, AND DEVICES | February 2023 | December 2024 | Allow | 22 | 2 | 1 | Yes | No |
| 18020675 | Alignment Device and Alignment Method | February 2023 | June 2025 | Allow | 28 | 0 | 0 | No | No |
| 18019824 | METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE, SILICON CARBIDE SEMICONDUCTOR DEVICE, AND POWER CONVERSION APPARATUS | February 2023 | June 2025 | Allow | 28 | 0 | 0 | No | No |
| 18161662 | Directional Deposition for Semiconductor Fabrication | January 2023 | November 2023 | Allow | 10 | 0 | 1 | No | No |
| 18017986 | WAFER ASSEMBLY HAVING ALIGNMENT MARKS, METHOD FOR FORMING SAME, AND WAFER ALIGNMENT METHOD | January 2023 | May 2025 | Allow | 28 | 0 | 0 | No | No |
| 18096351 | VERTICAL EDGE BLOCKING (VEB) TECHNIQUE FOR INCREASING PATTERNING PROCESS MARGIN | January 2023 | November 2024 | Allow | 22 | 2 | 1 | Yes | No |
| 18005058 | SEMICONDUCTOR DEVICE, SEMICONDUCTOR MODULE, AND WIRELESS COMMUNICATION APPARATUS | January 2023 | May 2025 | Allow | 28 | 0 | 0 | No | No |
| 18077778 | METHOD FOR MANUFACTURING PACKAGE STRUCTURE | December 2022 | February 2024 | Allow | 14 | 0 | 0 | No | No |
| 18061225 | METHOD FOR MANUFACTURING LIGHT-EMITTING ELEMENT | December 2022 | January 2025 | Allow | 26 | 0 | 0 | No | No |
| 17992300 | SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR MEMORY DEVICE | November 2022 | October 2023 | Allow | 11 | 1 | 0 | No | No |
| 17991423 | Methods of Forming Semiconductor Packages | November 2022 | February 2024 | Allow | 15 | 0 | 0 | No | No |
| 17981178 | GaN VERTICAL-CHANNEL JUNCTION FIELD-EFFECT TRANSISTORS WITH REGROWN p-GaN BY METAL ORGANIC CHEMICAL VAPOR DEPOSITION (MOCVD) | November 2022 | September 2024 | Allow | 22 | 2 | 0 | Yes | No |
| 17977971 | DOUBLE-CHANNEL HEMT DEVICE AND MANUFACTURING METHOD THEREOF | October 2022 | July 2024 | Allow | 21 | 2 | 1 | Yes | No |
| 17977013 | EPITAXIAL WAFER AND SEMICONDUCTOR MEMORY DEVICE USING THE SAME | October 2022 | May 2025 | Allow | 31 | 2 | 1 | Yes | No |
| 17975908 | IMAGE SENSOR | October 2022 | August 2024 | Abandon | 21 | 2 | 0 | No | No |
| 18049368 | GROUP III-V SEMICONDUCTOR STRUCTURES HAVING CRYSTALLINE REGROWTH LAYERS AND METHODS FOR FORMING SUCH STRUCTURES | October 2022 | June 2023 | Allow | 7 | 0 | 0 | No | No |
| 17967754 | MONOLITHIC GROWTH OF EPITAXIAL SILICON DEVICES VIA CO-DOPING | October 2022 | February 2025 | Allow | 28 | 1 | 1 | Yes | No |
| 17953518 | METHOD AND SYSTEM FOR FORMING MATERIAL WITHIN A GAP | September 2022 | April 2025 | Allow | 30 | 1 | 0 | No | No |
| 17895139 | Power Measurement In A Two-Wire Load Control Device | August 2022 | May 2023 | Allow | 9 | 0 | 0 | No | No |
| 17802156 | Organic Light Emitting Device, Display Substrate and Display Apparatus | August 2022 | April 2025 | Allow | 32 | 0 | 0 | Yes | No |
| 17875400 | SEMICONDUCTOR DEVICES PERFORMING THRESHOLD SWITCHING | July 2022 | April 2025 | Allow | 32 | 0 | 1 | Yes | No |
| 17873087 | ORGANIC LIGHT-EMITTING DISPLAY APPARATUS | July 2022 | February 2024 | Allow | 19 | 2 | 0 | No | No |
| 17813150 | WAFER DIVIDING METHOD | July 2022 | February 2025 | Allow | 31 | 0 | 0 | No | No |
| 17867501 | Integrated Assemblies Having Vertically-Spaced Channel Material Segments, and Methods of Forming Integrated Assemblies | July 2022 | August 2024 | Allow | 25 | 2 | 1 | Yes | No |
| 17811196 | LAMINATED DEVICE WAFER FORMING METHOD | July 2022 | June 2025 | Allow | 35 | 0 | 0 | No | No |
| 17809914 | Etch Stop Layer in Integrated Circuits | June 2022 | November 2023 | Allow | 17 | 1 | 0 | No | No |
| 17849867 | SILICON-CONTROLLED RECTIFIERS IN A SILICON-ON-INSULATOR TECHNOLOGY | June 2022 | December 2023 | Allow | 18 | 1 | 1 | Yes | No |
| 17845193 | METHOD AND STRUCTURE OF MIDDLE LAYER REMOVAL | June 2022 | October 2023 | Allow | 16 | 1 | 0 | No | No |
| 17845789 | SEMICONDUCTOR DEVICE COMPRISING A LATERAL SUPER JUNCTION FIELD EFFECT TRANSISTOR | June 2022 | August 2023 | Allow | 14 | 0 | 0 | No | No |
| 17805042 | SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SAME | June 2022 | April 2025 | Allow | 34 | 1 | 0 | Yes | No |
| 17827619 | METHOD OF MANUFACTURING A FIELD EFFECT TRANSDUCER | May 2022 | March 2024 | Allow | 21 | 1 | 1 | No | No |
| 17751653 | METHOD FOR MANUFACTURING COMPOSITE LAYER CIRCUIT STRUCTURE OF ELECTRONIC DEVICE | May 2022 | April 2025 | Allow | 35 | 1 | 1 | No | No |
| 17664569 | EPITAXIAL OXIDE DEVICE WITH IMPACT IONIZATION | May 2022 | May 2024 | Allow | 24 | 1 | 0 | No | No |
| 17664577 | METHOD AND EPITAXIAL OXIDE DEVICE WITH IMPACT IONIZATION | May 2022 | April 2024 | Allow | 23 | 0 | 0 | No | No |
| 17741530 | CARRIER SUBSTRATE AND ELEMENT TRANSFER METHOD USING THE SAME | May 2022 | November 2024 | Allow | 30 | 0 | 0 | No | No |
| 17736186 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | May 2022 | May 2025 | Allow | 36 | 1 | 1 | No | No |
| 17730801 | METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | April 2022 | May 2024 | Allow | 25 | 2 | 1 | No | No |
| 17729546 | Semiconductor Device and Method | April 2022 | January 2025 | Allow | 33 | 1 | 0 | No | No |
| 17729469 | Process Temperature Measurement Device Fabrication Techniques and Methods of Calibration and Data Interpolation of the Same | April 2022 | April 2023 | Allow | 11 | 0 | 0 | No | No |
| 17726618 | Silicon Carbide Devices, Semiconductor Devices and Methods for Forming Silicon Carbide Devices and Semiconductor Devices | April 2022 | May 2024 | Abandon | 25 | 2 | 1 | No | No |
| 17725326 | ETCH STOP LAYER FOR INJECTING CARRIERS INTO DRIFT LAYER FOR A VERTICAL POWER DEVICE | April 2022 | November 2023 | Allow | 18 | 1 | 1 | No | No |
| 17725037 | ANTI-PARALLEL DIODE FORMED USING DAMAGED CRYSTAL STRUCTURE IN A VERICAL POWER DEVICE | April 2022 | June 2023 | Allow | 14 | 0 | 1 | No | No |
| 17719622 | METHOD OF FORMING A WIRING AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING THE SAME | April 2022 | September 2024 | Allow | 29 | 0 | 0 | No | No |
| 17754773 | SEMICONDUCTOR LIGHT-EMITTING ELEMENT AND METHOD OF PRODUCING THE SAME | April 2022 | July 2024 | Allow | 27 | 0 | 1 | No | No |
| 17715886 | MEMORY DEVICE AND FORMING METHOD THEREOF | April 2022 | March 2024 | Allow | 24 | 2 | 1 | Yes | No |
| 17657374 | LIGHT-EMITTING DIODE | March 2022 | August 2023 | Allow | 17 | 1 | 0 | No | No |
| 17710531 | Interconnect Structures and Methods of Forming the Same | March 2022 | February 2025 | Allow | 35 | 1 | 1 | No | No |
| 17705404 | SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME | March 2022 | March 2023 | Allow | 12 | 0 | 0 | No | No |
| 17762714 | RECESSED STRUCTURE CAPABLE OF BEING CONVENIENTLY MONITORED ONLINE AND PREPARATION METHOD THEREOF | March 2022 | November 2024 | Allow | 31 | 0 | 0 | No | No |
| 17654804 | MULTI-GATE DEVICE AND RELATED METHODS | March 2022 | August 2024 | Allow | 29 | 3 | 0 | Yes | No |
| 17693035 | Methods of Forming Structures Containing Leaker-Devices and Memory Configurations Incorporating Leaker-Devices | March 2022 | March 2023 | Allow | 12 | 0 | 0 | No | No |
| 17653828 | EPITAXIAL OXIDE MATERIALS, STRUCTURES, AND DEVICES | March 2022 | October 2022 | Allow | 8 | 1 | 1 | No | No |
| 17685400 | SEMICONDUCTOR DEVICE WITH STRAIN RELAXED LAYER | March 2022 | March 2023 | Allow | 12 | 0 | 0 | No | No |
| 17683288 | SEMICONDUCTOR DEVICE WITH STRAIN RELAXED LAYER | February 2022 | May 2024 | Allow | 27 | 4 | 0 | Yes | No |
| 17652019 | EPITAXIAL OXIDE MATERIALS, STRUCTURES, AND DEVICES | February 2022 | March 2024 | Allow | 25 | 0 | 0 | No | No |
| 17677390 | SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME | February 2022 | September 2024 | Allow | 31 | 0 | 1 | No | No |
| 17665703 | Integrated Circuit Interconnect Structures with Air Gaps | February 2022 | April 2024 | Allow | 26 | 2 | 0 | Yes | No |
| 17665925 | SEMICONDUCTOR DEVICE STRUCTURE WITH METAL GATE STACK | February 2022 | December 2022 | Allow | 10 | 0 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner AHMAD, KHAJA.
With a 27.8% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 25.8% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner AHMAD, KHAJA works in Art Unit 2813 and has examined 1,120 patent applications in our dataset. With an allowance rate of 83.4%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 22 months.
Examiner AHMAD, KHAJA's allowance rate of 83.4% places them in the 51% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by AHMAD, KHAJA receive 1.67 office actions before reaching final disposition. This places the examiner in the 46% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by AHMAD, KHAJA is 22 months. This places the examiner in the 81% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +21.0% benefit to allowance rate for applications examined by AHMAD, KHAJA. This interview benefit is in the 69% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.
When applicants file an RCE with this examiner, 33.6% of applications are subsequently allowed. This success rate is in the 67% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 22.5% of cases where such amendments are filed. This entry rate is in the 21% percentile among all examiners. Strategic Recommendation: This examiner rarely enters after-final amendments compared to other examiners. You should generally plan to file an RCE or appeal rather than relying on after-final amendment entry. Per MPEP § 714.12, primary examiners have discretion in entering after-final amendments, and this examiner exercises that discretion conservatively.
When applicants request a pre-appeal conference (PAC) with this examiner, 62.5% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 49% percentile among all examiners. Note: Pre-appeal conferences show below-average success with this examiner. Consider whether your arguments are strong enough to warrant a PAC request.
This examiner withdraws rejections or reopens prosecution in 51.4% of appeals filed. This is in the 17% percentile among all examiners. Of these withdrawals, 36.8% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner rarely withdraws rejections during the appeal process compared to other examiners. If you file an appeal, be prepared to fully prosecute it to a PTAB decision. Per MPEP § 1207, the examiner will prepare an Examiner's Answer maintaining the rejections.
When applicants file petitions regarding this examiner's actions, 43.8% are granted (fully or in part). This grant rate is in the 47% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 0.4% of allowed cases (in the 56% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.9% of allowed cases (in the 55% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.