Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18768561 | METHOD FOR FORMING SEMICONDUCTOR STRUCTURE | July 2024 | May 2025 | Allow | 10 | 0 | 0 | No | No |
| 18510736 | MEMORY DEVICE WITH VERTICALLY STACKED SEMICONDUCTOR STRUCTURES | November 2023 | April 2025 | Allow | 17 | 1 | 0 | Yes | No |
| 18373291 | HIGH ELECTRON MOBILITY TRANSISTOR AND METHOD FOR FORMING THE SAME USING THE METAL GATE LAYER AND SPACER AS AN ETCH MASK | September 2023 | April 2025 | Allow | 19 | 3 | 1 | No | No |
| 18365435 | Asymmetric Source/Drain for Backside Source Contact | August 2023 | March 2025 | Allow | 19 | 2 | 0 | Yes | No |
| 17797218 | Reverse Conducting Power Semiconductor Device and Method for Manufacturing the Same | August 2022 | June 2025 | Allow | 34 | 1 | 0 | No | No |
| 17764430 | METHOD FOR MANUFACTURING SEMICONDUCTOR ELEMENT COMPRISING A MASK, TRANSVERAL EPITAXIAL GROWTH, AND PEELING | March 2022 | April 2025 | Abandon | 36 | 2 | 0 | No | No |
| 17677152 | LIGHT EMITTING SEMICONDUCTOR CHIP AND METHOD FOR MANUFACTURING A PLURALITY OF LIGHT EMITTING SEMICONDUCTOR CHIPS | February 2022 | January 2025 | Abandon | 35 | 0 | 1 | No | No |
| 17671604 | IMPACT-RESISTANT MICROMECHANICAL ARMS | February 2022 | June 2025 | Allow | 40 | 2 | 1 | No | No |
| 17578569 | Ni(Al)O P-TYPE SEMICONDUCTOR VIA SELECTIVE OXIDATION OF NiAl AND METHODS OF FORMING THE SAME | January 2022 | February 2024 | Allow | 25 | 1 | 0 | Yes | No |
| 17571149 | RESISTIVE RANDOM ACCESS MEMORY AND METHOD FOR MANUFACTURING THE SAME | January 2022 | February 2025 | Allow | 37 | 2 | 1 | Yes | No |
| 17647086 | FORMING PASSIVATION STACK HAVING ETCH STOP LAYER | January 2022 | July 2024 | Allow | 30 | 3 | 0 | Yes | No |
| 17556224 | DISPLAY PANEL AND MANUFACTURING METHOD THEREOF, DISPLAY APPARATUS AND SPLICING DISPLAY APPARATUS | December 2021 | June 2025 | Allow | 42 | 2 | 0 | No | No |
| 17553772 | MEMORY DEVICES HAVING VERTICAL TRANSISTORS AND METHODS FOR FORMING THE SAME | December 2021 | April 2025 | Allow | 40 | 3 | 0 | Yes | No |
| 17549523 | Organic Light Emitting Display Device that Detects Moisture by Emitting Light Responsive to Ultraviolet Light Irradiation | December 2021 | February 2025 | Allow | 38 | 2 | 0 | Yes | No |
| 17526321 | PREPARATION METHOD FOR SEMICONDUCTOR STRUCTURE INVOLVING THE REPLACEMENT OF DIELECTRIC LAYER WITH GATE | November 2021 | April 2025 | Allow | 41 | 3 | 0 | No | No |
| 17515782 | TWO TRANSISTOR CELLS FOR VERTICAL THREE-DIMENSIONAL MEMORY | November 2021 | June 2025 | Allow | 44 | 3 | 1 | Yes | No |
| 17516310 | STRETCHABLE DISPLAY DEVICE WITH CONNECTION LINES IN DIFFERENT DIRECTIONS BETWEEN PIXELS | November 2021 | May 2025 | Allow | 43 | 3 | 0 | Yes | No |
| 17513948 | HIGH VOLTAGE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | October 2021 | August 2024 | Allow | 34 | 3 | 0 | Yes | No |
| 17502708 | CONTAMINATED INTERFACE MITIGATION IN A SEMICONDUCTOR DEVICE | October 2021 | February 2025 | Allow | 40 | 2 | 1 | Yes | No |
| 17503077 | PAD STRUCTURES FOR SEMICONDUCTOR DEVICES | October 2021 | July 2025 | Allow | 45 | 4 | 1 | Yes | No |
| 17502044 | DISPLAY DEVICE HAVING SURFACE CONTROL LAYER IN TRANSMISSION AREA | October 2021 | May 2025 | Allow | 43 | 3 | 0 | No | No |
| 17599580 | DISPLAY PANEL AND DISPLAY DEVICE THAT INCLUDE AN ANNULAR REPAIR CIRCUIT | September 2021 | November 2024 | Allow | 38 | 1 | 0 | No | No |
| 17599587 | MASK AND METHOD FOR MANUFACTURING SAME, DISPLAY PANEL, AND DISPLAY DEVICE | September 2021 | May 2025 | Allow | 44 | 2 | 0 | No | No |
| 17599268 | TERMINAL DEVICE AND DISPLAY SCREEN THEREOF, AND PREPARATION METHOD FOR DISPLAY SCREEN | September 2021 | May 2025 | Allow | 44 | 3 | 0 | No | No |
| 17436058 | SEMICONDUCTOR DEVICE THAT COMPRISES AN HEMT AND AN HHMT WITH A BACKSIDE CONTACT ELECTRODE AND THE MANUFACTURING METHOD THEREOF | September 2021 | April 2025 | Allow | 43 | 2 | 0 | No | No |
| 17458672 | A Nano-FET Transistor with Alternating Nanostructures and Method of Forming Thereof | August 2021 | October 2024 | Allow | 38 | 3 | 0 | Yes | No |
| 17410410 | ELECTRONIC DEVICE COMPRISNG A MICRO-LENS AND PHOTODIODE ARRAY WITH AMORPHIC N-TYPE AND P-TYPE LAYERS | August 2021 | January 2025 | Allow | 41 | 3 | 0 | Yes | No |
| 17433231 | Epitaxial Wafer of Red Light-Emitting Diode, and Preparation Method Therefor | August 2021 | May 2024 | Abandon | 33 | 1 | 0 | No | No |
| 17405517 | IMAGE SENSOR COMPRISING A GRID PATTERN AND A CONDUCTIVE PATTERN | August 2021 | March 2024 | Allow | 31 | 1 | 0 | Yes | No |
| 17400712 | Method for Forming a Semiconductor Structure Having a Porous Semiconductor Layer in RF Devices | August 2021 | April 2025 | Allow | 44 | 7 | 1 | No | No |
| 17426736 | IMAGING DEVICE AND IMAGING SYSTEM | July 2021 | May 2024 | Abandon | 34 | 1 | 0 | No | No |
| 17386575 | DYNAMIC RANDOM ACCESS MEMORY DEVICE WITH ACTIVE REGIONS OF DIFFERENT PROFILE ROUGHNESS AND METHOD FOR FORMING THE SAME | July 2021 | March 2025 | Allow | 43 | 3 | 1 | No | No |
| 17382001 | Interconnect Structure Including Graphite and Method Forming Same | July 2021 | February 2025 | Allow | 43 | 4 | 1 | No | No |
| 17419348 | DISPLAY PANEL AND DISPLAY DEVICE WITH NANOCRYSTALLINE PARTICLES THAT IMPROVE THE LIGHT INTENSITIES OF THE LIGHT-EMITTING AREAS | June 2021 | March 2025 | Allow | 45 | 3 | 0 | No | No |
| 17419305 | Display Substrate with Stepped Wire Configuration, Dummy Rectangle Units and Display Apparatus, and Manufacturing Method Thereof | June 2021 | March 2025 | Allow | 45 | 2 | 0 | No | No |
| 17418744 | TWO STEP PHOSPHOR DEPOSITION TO MAKE A MATRIX ARRAY | June 2021 | May 2025 | Allow | 47 | 4 | 0 | Yes | No |
| 17353051 | OHMIC ELECTRODE FOR TWO-DIMENSIONAL CARRIER GAS (2DCG) SEMICONDUCTOR DEVICE | June 2021 | June 2024 | Allow | 36 | 2 | 0 | Yes | No |
| 17344478 | Semiconductor Device with Backside Power Rail and Method for Forming the Same | June 2021 | July 2024 | Allow | 38 | 2 | 1 | Yes | No |
| 17333045 | HIGH ELECTRON MOBILITY TRANSISTOR AND METHOD FOR FORMING THE SAME | May 2021 | August 2024 | Allow | 39 | 3 | 0 | Yes | No |
| 17308678 | Asymmetric Source/Drain for Backside Source Contact | May 2021 | November 2024 | Allow | 43 | 3 | 1 | Yes | No |
| 17237249 | METHOD FOR FORMING SEMICONDUCTOR STRUCTURE WITH FINS USING A MULTILAYER MASK STRUCTURE FOR ETCHING TO FORM NANOSTRUCTURES | April 2021 | May 2024 | Allow | 36 | 3 | 0 | Yes | No |
| 17231895 | Methods Used In Forming A Memory Array Comprising Strings Of Memory Cells Including Forming A Pair Of Elevationally-Extending Walls That Are Laterally-Spaced Relative One Another And That Are Individually Horizontally-Longitudinally-Elongated | April 2021 | September 2024 | Allow | 41 | 4 | 1 | Yes | No |
| 17220072 | METHOD FOR MANUFACTURING A SEMICONDUCTOR MEMORY DEVICE | April 2021 | October 2024 | Abandon | 42 | 4 | 0 | No | No |
| 17217348 | POWER DEVICE ASSEMBLIES AND COOLING DEVICES FOR COOLING HEAT- GENERATING DEVICES | March 2021 | April 2024 | Allow | 36 | 2 | 0 | Yes | No |
| 17211739 | PIXEL OF A LIGHT SENSOR AND METHOD FOR MANUFACTURING SAME | March 2021 | November 2024 | Allow | 43 | 3 | 1 | Yes | No |
| 17205213 | METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE WITH MEMORY DEVICE | March 2021 | February 2024 | Allow | 34 | 3 | 1 | No | No |
| 17193053 | Light Emitting Diode Devices With Patterned TCO Layer Including Different Thicknesses | March 2021 | May 2024 | Allow | 38 | 4 | 1 | No | No |
| 17273459 | OPTOELECTRONIC SEMICONDUCTOR DEVICE HAVING A SUPPORT ELEMENT AND AN ELECTRIC CONTACT ELEMENT, AN OPTOELECTRONIC COMPONENT AND A METHOD OF PRODUCING THE OPTOELECTRONIC SEMICONDUCTOR DEVICE | March 2021 | May 2024 | Abandon | 38 | 1 | 0 | No | No |
| 17273721 | SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF | March 2021 | March 2025 | Abandon | 48 | 2 | 0 | No | No |
| 17272825 | LIGHT-EMITTING DEVICE AND DISPLAY DEVICE INCLUDING BANK STRUCTURES COMPRISED OF COLOR FILTER MATERIAL | March 2021 | March 2025 | Allow | 49 | 3 | 0 | Yes | No |
| 17270969 | ARRAY SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME, DISPLAY PANEL AND DISPLAY DEVICE | February 2021 | June 2024 | Allow | 40 | 1 | 0 | No | No |
| 17249247 | CONTACT PADS OF THREE-DIMENSIONAL MEMORY DEVICE AND FABRICATION METHOD THEREOF | February 2021 | June 2024 | Allow | 40 | 2 | 0 | Yes | No |
| 17165593 | SEMICONDUCTOR DEVICE INCLUDING BONDING STRUCTURES AND CHIP GUARDS | February 2021 | July 2024 | Allow | 41 | 4 | 0 | Yes | No |
| 17162515 | LIGHT EMITTING DIODE STRUCTURE WITH INDIVIDUAL FUCTIONABLE LED UNITS AND METHOD FOR MANUFACTURING THE SAME | January 2021 | December 2024 | Allow | 46 | 4 | 0 | Yes | No |
| 17158888 | MICROELECTRONIC DEVICES WITH VERTICALLY RECESSED CHANNEL STRUCTURES AND DISCRETE, SPACED INTER-SLIT STRUCTURES, AND RELATED METHODS AND SYSTEMS | January 2021 | March 2025 | Allow | 49 | 4 | 1 | No | Yes |
| 17158259 | Integrated Assemblies and Methods of Forming Integrated Assemblies | January 2021 | April 2025 | Allow | 51 | 7 | 1 | Yes | No |
| 17153100 | LED UNIT, LED DISPLAY, AND MANUFACTURING METHOD INVOLVING ASSEMBLY FLUID AND GUIDING PLATE ASSEMBLY | January 2021 | August 2024 | Abandon | 43 | 2 | 0 | Yes | No |
| 17250415 | IMAGING ELEMENT AND ELECTRONIC APPARATUS INCLUDING A STEPPED STRUCTURE | January 2021 | May 2024 | Allow | 40 | 1 | 0 | No | No |
| 17250349 | LIGHT-RECEIVING ELEMENT AND DISTANCE-MEASURING MODULE | January 2021 | April 2024 | Abandon | 39 | 1 | 0 | No | No |
| 17258621 | LIGHT-EMITTING DEVICE COMPRISING BANKS AND ELECTRODES THEREON, AND DISPLAY DEVICE COMPRISING SAME | January 2021 | August 2024 | Allow | 43 | 2 | 0 | Yes | No |
| 17117337 | LATERAL GATE MATERIAL ARRANGEMENTS FOR QUANTUM DOT DEVICES | December 2020 | October 2024 | Allow | 46 | 2 | 0 | Yes | No |
| 16949924 | PIXEL ARRAY INCLUDING OCTAGON PIXEL SENSORS | November 2020 | February 2024 | Allow | 39 | 4 | 0 | Yes | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner SEDOROOK, DAVID PAUL.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 0.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the bottom 25% across the USPTO, indicating that filing appeals is less effective here than in most other areas.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner SEDOROOK, DAVID PAUL works in Art Unit 2812 and has examined 61 patent applications in our dataset. With an allowance rate of 85.2%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 40 months.
Examiner SEDOROOK, DAVID PAUL's allowance rate of 85.2% places them in the 56% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by SEDOROOK, DAVID PAUL receive 2.59 office actions before reaching final disposition. This places the examiner in the 87% percentile for office actions issued. This examiner issues more office actions than most examiners, which may indicate thorough examination or difficulty in reaching agreement with applicants.
The median time to disposition (half-life) for applications examined by SEDOROOK, DAVID PAUL is 40 months. This places the examiner in the 8% percentile for prosecution speed. Applications take longer to reach final disposition with this examiner compared to most others.
Conducting an examiner interview provides a +25.5% benefit to allowance rate for applications examined by SEDOROOK, DAVID PAUL. This interview benefit is in the 76% percentile among all examiners. Recommendation: Interviews are highly effective with this examiner and should be strongly considered as a prosecution strategy. Per MPEP § 713.10, interviews are available at any time before the Notice of Allowance is mailed or jurisdiction transfers to the PTAB.
When applicants file an RCE with this examiner, 36.9% of applications are subsequently allowed. This success rate is in the 80% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 30.2% of cases where such amendments are filed. This entry rate is in the 35% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.
When applicants request a pre-appeal conference (PAC) with this examiner, 200.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 95% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 91% percentile among all examiners. Of these withdrawals, 100.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 100.0% are granted (fully or in part). This grant rate is in the 96% percentile among all examiners. Strategic Note: Petitions are frequently granted regarding this examiner's actions compared to other examiners. Per MPEP § 1002.02(c), various examiner actions are petitionable to the Technology Center Director, including prematureness of final rejection, refusal to enter amendments, and requirement for information. If you believe an examiner action is improper, consider filing a petition.
Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 22% percentile). This examiner rarely makes examiner's amendments compared to other examiners. You should expect to make all necessary claim amendments yourself through formal amendment practice.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.0% of allowed cases (in the 28% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.