Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18865498 | METHOD FOR TRANSFERRING A LAYER FROM A SOURCE SUBSTRATE TO A DESTINATION SUBSTRATE | November 2024 | May 2025 | Allow | 6 | 1 | 0 | No | No |
| 18766944 | DISPLAY DEVICE | July 2024 | April 2025 | Allow | 9 | 1 | 0 | No | No |
| 18767291 | SEMICONDUCTOR DEVICES WITH MODIFIED SOURCE/DRAIN FEATURE AND METHODS THEREOF | July 2024 | August 2025 | Allow | 14 | 2 | 0 | Yes | No |
| 18761585 | PHOTORESIST LAYER SURFACE TREATMENT, CAP LAYER, AND METHOD OF FORMING PHOTORESIST PATTERN | July 2024 | July 2025 | Allow | 12 | 1 | 1 | No | No |
| 18755342 | MULTI-GATE DEVICE AND RELATED METHODS | June 2024 | March 2025 | Allow | 8 | 0 | 1 | No | No |
| 18749899 | SEMICONDUCTOR STRUCTURE WITH AIR GAP IN PATTERN-DENSE REGION AND METHOD OF MANUFACTURING THE SAME | June 2024 | January 2025 | Allow | 7 | 1 | 0 | No | No |
| 18739140 | SILVER PATTERNING AND INTERCONNECT PROCESSES | June 2024 | December 2024 | Allow | 6 | 0 | 0 | No | No |
| 18737600 | IMAGE SENSOR DEVICE AND METHODS OF FORMING THE SAME | June 2024 | March 2025 | Allow | 10 | 1 | 0 | No | No |
| 18733564 | GATE STRUCTURES AND SPACERS IN SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF | June 2024 | July 2025 | Allow | 13 | 1 | 1 | No | No |
| 18676465 | SEMICONDUCTOR STRUCTURES OF ANTI-FUSE DEVICES AND CORE DEVICES WITH DIFFERENT DIELECTRIC LAYERS | May 2024 | April 2025 | Allow | 11 | 2 | 0 | No | No |
| 18662267 | CUPROUS OXIDE DEVICES AND FORMATION METHODS | May 2024 | April 2025 | Allow | 11 | 1 | 0 | No | No |
| 18656610 | BACKSIDE ILLUMINATED IMAGE SENSOR AND MANUFACTURING METHOD THEREOF | May 2024 | March 2025 | Allow | 10 | 1 | 0 | No | No |
| 18645678 | SEMICONDUCTOR COMPONENT ARRANGEMENT, METHOD FOR FABRICATION THEREOF AND HEAT DISSIPATION DEVICE | April 2024 | September 2025 | Allow | 17 | 1 | 0 | No | No |
| 18645181 | REVERSED TONE PATTERNING METHOD FOR DIPOLE INCORPORATION FOR MULTIPLE THRESHOLD VOLTAGES | April 2024 | November 2024 | Allow | 7 | 0 | 0 | No | No |
| 18631560 | SWITCHING ELEMENT | April 2024 | March 2025 | Allow | 11 | 1 | 0 | No | No |
| 18586925 | SURFACE MODIFICATION LAYER FOR CONDUCTIVE FEATURE FORMATION | February 2024 | March 2025 | Allow | 12 | 1 | 0 | No | No |
| 18585660 | DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME | February 2024 | January 2025 | Allow | 11 | 1 | 0 | No | No |
| 18438047 | METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE | February 2024 | January 2025 | Allow | 11 | 1 | 0 | No | No |
| 18431112 | SEMICONDUCTOR DEVICES | February 2024 | March 2025 | Allow | 13 | 4 | 1 | No | No |
| 18426794 | SAG NANOWIRE GROWTH WITH A PLANARIZATION PROCESS | January 2024 | December 2024 | Allow | 11 | 1 | 0 | No | No |
| 18424800 | LIGHT-EMITTING DEVICE AND DISPLAY DEVICE USING THE SAME | January 2024 | February 2025 | Allow | 13 | 1 | 1 | No | No |
| 18417984 | SINGLE CRYSTAL SEMICONDUCTOR STRUCTURE AND METHOD OF FABRICATING THE SAME | January 2024 | February 2025 | Allow | 13 | 1 | 1 | Yes | No |
| 18407025 | SEMICONDUCTOR DEVICE WITH A POROUS PORTION, WAFER COMPOSITE AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE | January 2024 | May 2025 | Allow | 16 | 2 | 1 | Yes | No |
| 18405159 | SEMICONDUCTOR DEVICE HAVING IMPROVED ELECTROSTATIC DISCHARGE PROTECTION | January 2024 | October 2024 | Allow | 10 | 0 | 1 | No | No |
| 18397293 | NANOSHEET TRANSISTOR | December 2023 | April 2025 | Allow | 15 | 1 | 0 | No | No |
| 18543745 | DISPLAY DEVICE | December 2023 | March 2026 | Allow | 26 | 0 | 0 | No | No |
| 18569607 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | December 2023 | March 2026 | Allow | 27 | 0 | 0 | No | No |
| 18534537 | DISPLAY DEVICE INCLUDING A FLEXIBLE SUBSTRATE | December 2023 | October 2024 | Allow | 10 | 1 | 0 | No | No |
| 18513624 | SEMICONDUCTOR DEVICE AND FABRICATION METHOD | November 2023 | December 2024 | Allow | 12 | 1 | 1 | No | No |
| 18505563 | Memory Arrays Comprising Strings Of Memory Cells And Methods Used In Forming A Memory Array Comprising Strings Of Memory Cells | November 2023 | July 2025 | Allow | 20 | 2 | 1 | No | No |
| 18504307 | SEMICONDUCTOR DEVICE | November 2023 | February 2026 | Allow | 27 | 0 | 0 | No | No |
| 18386346 | Integrated Assemblies and Methods of Forming Integrated Assemblies | November 2023 | September 2024 | Allow | 10 | 1 | 1 | No | No |
| 18383158 | SEMICONDUCTOR STRUCTURE WITH AIR GAP IN PATTERN-DENSE REGION AND METHOD OF MANUFACTURING THE SAME | October 2023 | September 2024 | Allow | 11 | 1 | 1 | No | No |
| 18480378 | FORMATION OF SINGLE CRYSTAL SEMICONDUCTORS USING PLANAR VAPOR LIQUID SOLID EPITAXY | October 2023 | December 2024 | Allow | 14 | 1 | 1 | No | No |
| 18471730 | SEMICONDUCTOR DEVICE | September 2023 | December 2025 | Allow | 27 | 0 | 0 | No | No |
| 18369321 | HARDMASK STRUCTURE AND METHOD OF FORMING SEMICONDUCTOR STRUCTURE | September 2023 | March 2026 | Allow | 30 | 1 | 0 | No | No |
| 18452581 | CHANNEL STRUCTURES INCLUDING DOPED 2D MATERIALS FOR SEMICONDUCTOR DEVICES | August 2023 | November 2024 | Allow | 15 | 1 | 1 | Yes | No |
| 18547151 | Method For Fabricating Semiconductor Structures | August 2023 | November 2025 | Allow | 27 | 0 | 0 | No | No |
| 18234678 | SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE | August 2023 | June 2025 | Allow | 22 | 1 | 0 | No | No |
| 18232881 | METHOD FOR MANUFACTURING METAL OXYNITRIDE FILM | August 2023 | January 2025 | Allow | 17 | 1 | 1 | No | No |
| 18447927 | SEMICONDUCTOR DEVICE HAVING A THERMAL CONTACT AND METHOD OF MAKING | August 2023 | July 2024 | Allow | 11 | 0 | 1 | No | No |
| 18446681 | Seam-Filling of Metal Gates with Si-Containing Layers | August 2023 | August 2024 | Allow | 12 | 1 | 0 | No | No |
| 18446151 | MULTIGATE DEVICE WITH AIR GAP SPACER AND BACKSIDE RAIL CONTACT AND METHOD OF FABRICATING THEREOF | August 2023 | January 2025 | Allow | 17 | 2 | 0 | No | No |
| 18231486 | NANOSTRUCTURED CHANNEL REGIONS FOR SEMICONDUCTOR DEVICES | August 2023 | September 2024 | Allow | 14 | 1 | 1 | Yes | No |
| 18366392 | MULTI-GATE DEVICE AND RELATED METHODS | August 2023 | March 2025 | Allow | 19 | 3 | 0 | No | No |
| 18365995 | NANO TRANSISTORS WITH SOURCE/DRAIN HAVING SIDE CONTACTS TO 2-D MATERIAL | August 2023 | August 2024 | Allow | 12 | 1 | 0 | No | No |
| 18365680 | IMAGE SENSOR DEVICE AND METHODS OF FORMING THE SAME | August 2023 | March 2024 | Allow | 8 | 0 | 0 | Yes | No |
| 18365402 | METHOD FOR FORMING A SEMICONDUCTOR-ON-INSULATOR (SOI) SUBSTRATE | August 2023 | August 2024 | Allow | 12 | 1 | 0 | Yes | No |
| 18365405 | Local Gate Height Tuning by CMP and Dummy Gate Design | August 2023 | October 2024 | Allow | 15 | 2 | 1 | No | No |
| 18363692 | SEMICONDUCTOR PACKAGES AND METHODS OF FORMING THE SAME | August 2023 | September 2024 | Allow | 13 | 1 | 1 | No | No |
| 18362240 | STRAIN RELIEF TRENCHES FOR EPITAXIAL GROWTH | July 2023 | December 2025 | Allow | 29 | 4 | 1 | Yes | No |
| 18361262 | PROCESS AND STRUCTURE FOR SOURCE/DRAIN CONTACTS | July 2023 | January 2025 | Allow | 18 | 1 | 1 | No | No |
| 18358530 | PASSIVATION SCHEME DESIGN FOR WAFER SINGULATION | July 2023 | November 2024 | Allow | 15 | 1 | 1 | No | No |
| 18358689 | SEMICONDUCTOR CHIP | July 2023 | May 2024 | Allow | 9 | 1 | 0 | No | No |
| 18225994 | CRYSTALLINE TRANSITION METAL DICHALCOGENIDE FILMS AND METHODS OF MAKING SAME | July 2023 | August 2024 | Abandon | 13 | 1 | 0 | No | No |
| 18220963 | SEMICONDUCTOR STRUCTURE WITH AIR GAP IN PATTERN-DENSE REGION AND METHOD OF MANUFACTURING THE SAME | July 2023 | October 2025 | Allow | 27 | 1 | 0 | No | No |
| 18221358 | HYBRID BONDING CONTACT STRUCTURE OF THREE-DIMENSIONAL MEMORY DEVICE | July 2023 | June 2024 | Allow | 12 | 1 | 1 | No | No |
| 18219986 | GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING OXIDE SUB-FINS | July 2023 | September 2024 | Allow | 14 | 1 | 1 | No | No |
| 18347778 | DISPLAY DEVICE | July 2023 | April 2024 | Allow | 9 | 1 | 0 | No | No |
| 18345266 | MEMORY DEVICE | June 2023 | January 2026 | Allow | 31 | 1 | 0 | No | No |
| 18211502 | SELECTIVE LINER DEPOSITION FOR VIA RESISTANCE REDUCTION | June 2023 | March 2026 | Allow | 33 | 1 | 0 | No | No |
| 18327785 | SILVER PATTERNING AND INTERCONNECT PROCESSES | June 2023 | February 2024 | Allow | 9 | 0 | 1 | No | No |
| 18204259 | PHOTORESIST LAYER SURFACE TREATMENT, CAP LAYER, AND METHOD OF FORMING PHOTORESIST PATTERN | May 2023 | March 2024 | Allow | 10 | 1 | 0 | No | No |
| 18324314 | HIGH-FREQUENCY MODULE AND COMMUNICATION DEVICE | May 2023 | December 2025 | Allow | 30 | 1 | 0 | No | No |
| 18144648 | ELECTROLUMINESCENCE DISPLAY | May 2023 | February 2026 | Allow | 33 | 1 | 1 | No | No |
| 18311220 | SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SAME | May 2023 | March 2026 | Allow | 34 | 0 | 1 | No | No |
| 18141552 | BACKSIDE CONTACTS FOR SOURCE/DRAIN REGIONS | May 2023 | February 2026 | Allow | 34 | 1 | 1 | No | No |
| 18303557 | SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF | April 2023 | March 2025 | Allow | 23 | 3 | 1 | Yes | No |
| 18032276 | DISPLAY DEVICE INCLUDING SELF-ALIGNED LEDS AND METHOD FOR MANUFACTURING DISPLAY DEVICE | April 2023 | January 2026 | Allow | 33 | 1 | 0 | No | No |
| 18132868 | METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE | April 2023 | November 2023 | Allow | 7 | 0 | 0 | Yes | No |
| 18131486 | SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND METHOD OF RECYCLING SUBSTRATE | April 2023 | July 2024 | Allow | 15 | 2 | 0 | No | No |
| 18125859 | SEMICONDUCTOR STRUCTURE HAVING FIN STRUCTURES | March 2023 | February 2024 | Allow | 11 | 2 | 0 | No | No |
| 18246398 | PIXEL STRUCTURE AND METHOD FOR MANUFACTURING A PIXEL STRUCTURE | March 2023 | January 2026 | Abandon | 34 | 1 | 0 | No | No |
| 18188399 | MULTI-PATTERN SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING SAME | March 2023 | October 2025 | Allow | 31 | 1 | 0 | Yes | No |
| 18122783 | CMOS STRUCTURE, AND FABRICATION METHODS OF FINFET CMOS, FD CMOS AND GAA CMOS | March 2023 | March 2026 | Allow | 36 | 1 | 1 | No | No |
| 17598893 | SEMICONDUCTOR DEVICE HAVING IMPROVED P-TYPE DOPED NITRIDE-BASED SEMICONDUCTOR LAYER AND METHOD FOR MANUFACTURING THE SAME | March 2023 | October 2025 | Allow | 49 | 1 | 0 | No | No |
| 18026494 | LIGHT EMITTING PANEL AND MANUFACTURING METHOD THEREOF, AND LIGHT EMITTING APPARATUS | March 2023 | September 2025 | Allow | 30 | 1 | 0 | No | No |
| 18179408 | CIRCUIT BOARD, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | March 2023 | January 2026 | Allow | 34 | 1 | 1 | No | No |
| 18178948 | Surface Modification Layer for Conductive Feature Formation | March 2023 | November 2023 | Allow | 8 | 1 | 0 | No | No |
| 18024296 | SEMICONDUCTOR DEVICE INCLUDING A SILICON SEMICONDUCTOR LAYER AND A NITRIDE SEMICONDUCTOR LAYER | March 2023 | September 2025 | Allow | 31 | 1 | 0 | No | No |
| 18113686 | SELF-ALIGNED SUBSTRATE ISOLATION (SASI) OF GATE-ALL-AROUND NANOSHEET FIELD EFFECT TRANSISTORS | February 2023 | March 2026 | Allow | 37 | 1 | 1 | Yes | No |
| 18113385 | Ultrafast Laser Annealing of Thin Films | February 2023 | December 2023 | Abandon | 10 | 1 | 0 | No | No |
| 18112853 | CARRIER STRUCTURE AND METHODS OF FORMING THE SAME | February 2023 | December 2025 | Allow | 34 | 1 | 1 | No | No |
| 18112916 | LIGHT-EMITTING DEVICE AND METHOD OF MANUFACTURING THE SAME | February 2023 | February 2024 | Allow | 11 | 1 | 0 | No | No |
| 18171508 | EPITAXIAL FORMATION WITH TREATMENT AND SEMICONDUCTOR DEVICES RESULTING THEREFROM | February 2023 | December 2025 | Allow | 34 | 1 | 1 | No | No |
| 18170411 | SILICON LAYER-BASED SILICIDE CONTACTS | February 2023 | November 2025 | Allow | 33 | 1 | 1 | Yes | No |
| 18104836 | METHOD FOR MANUFACTURING FOR FORMING SOURCE/DRAIN CONTACT FEATURES AND DEVICES MANUFACTURED THEREOF | February 2023 | November 2025 | Allow | 34 | 1 | 1 | No | No |
| 18163785 | SEMICONDUCTOR STRUCTURE INCLUDING GATE SPACER LAYER AND DIELECTRIC LAYER HAVING PORTION LOWER THAN TOP SURFACE OF GATE SPACER LAYER | February 2023 | December 2025 | Allow | 34 | 1 | 1 | No | No |
| 18158750 | DISPLAY DEVICE INCLUDING A FLEXIBLE SUBSTRATE | January 2023 | August 2023 | Allow | 7 | 1 | 0 | No | No |
| 18098633 | N/P-INDEPENDENTLY STRAINED POST-REPLACEMENT METAL GATE (RMG) GATE CUT FOR PERFORMANCE ENHANCED FINFET | January 2023 | January 2026 | Allow | 36 | 2 | 1 | Yes | No |
| 18016411 | CHIP HEAT SINK AND NUCLEIC ACID EXTRACTION DEVICE | January 2023 | May 2025 | Allow | 28 | 0 | 0 | No | No |
| 18005608 | PACKAGE SUBSTRATE MANUFACTURING METHOD | January 2023 | September 2025 | Allow | 32 | 1 | 0 | No | No |
| 18016177 | COMPOUND SEMICONDUCTOR SUBSTRATE AND METHOD FOR MANUFACTURING COMPOUND SEMICONDUCTOR SUBSTRATE | January 2023 | August 2025 | Allow | 32 | 1 | 0 | No | No |
| 18096791 | PIN DIODE INCLUDING A CONDUCTIVE LAYER, AND FABRICATION PROCESS | January 2023 | December 2023 | Abandon | 11 | 1 | 1 | No | No |
| 18093861 | DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME | January 2023 | November 2023 | Allow | 11 | 1 | 1 | No | No |
| 18150861 | Volume-less Fluorine Incorporation Method | January 2023 | November 2025 | Allow | 34 | 1 | 1 | No | No |
| 18090872 | THREE-DIMENSIONAL NAND MEMORY DEVICE AND METHOD OF FORMING THE SAME | December 2022 | January 2026 | Allow | 37 | 2 | 1 | No | No |
| 18148056 | OPTICAL SENSOR DEVICE | December 2022 | August 2025 | Allow | 31 | 1 | 0 | No | No |
| 18146886 | SYSTEM, ELECTRONIC DEVICE AND PACKAGE WITH VERTICAL TO HORIZONTAL SUBSTRATE INTEGRATED WAVEGUIDE TRANSITION AND HORIZONTAL GROUNDED COPLANAR WAVEGUIDE TRANSITION | December 2022 | August 2025 | Allow | 32 | 0 | 0 | No | No |
| 18068992 | COMPLEMENTARY FIELD EFFECT TRANSISTOR (CFET) WITH BALANCED N AND P DRIVE CURRENT | December 2022 | August 2025 | Allow | 32 | 1 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner PATEL, REEMA.
With a 33.3% reversal rate, the PTAB reverses the examiner's rejections in a meaningful percentage of cases. This reversal rate is above the USPTO average, indicating that appeals have better success here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 27.3% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner PATEL, REEMA works in Art Unit 2812 and has examined 1,167 patent applications in our dataset. With an allowance rate of 88.0%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 21 months.
Examiner PATEL, REEMA's allowance rate of 88.0% places them in the 68% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by PATEL, REEMA receive 1.42 office actions before reaching final disposition. This places the examiner in the 23% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by PATEL, REEMA is 21 months. This places the examiner in the 91% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +6.0% benefit to allowance rate for applications examined by PATEL, REEMA. This interview benefit is in the 33% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 35.2% of applications are subsequently allowed. This success rate is in the 79% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 49.2% of cases where such amendments are filed. This entry rate is in the 74% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 66.7% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 55% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 70.0% of appeals filed. This is in the 56% percentile among all examiners. Of these withdrawals, 42.9% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.
When applicants file petitions regarding this examiner's actions, 45.6% are granted (fully or in part). This grant rate is in the 39% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 3.2% of allowed cases (in the 80% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 2.3% of allowed cases (in the 70% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.