Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18979543 | Semiconductor Structure and Manufacturing Method Thereof | December 2024 | February 2025 | Allow | 2 | 0 | 0 | No | No |
| 18777737 | SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES | July 2024 | February 2025 | Allow | 7 | 0 | 0 | No | No |
| 18769958 | Conductive Feature Formation | July 2024 | March 2025 | Allow | 8 | 0 | 0 | No | No |
| 18762560 | Manufacturing Method for a Power MOSFET with Gate-Source ESD Diode Structure | July 2024 | October 2024 | Allow | 3 | 1 | 0 | No | No |
| 18753892 | PACKAGING OF A SEMICONDUCTOR DEVICE WITH A PLURALITY OF LEADS | June 2024 | May 2025 | Allow | 10 | 1 | 0 | No | No |
| 18750063 | BIPOLAR JUNCTION TRANSISTOR WITH GATE OVER TERMINALS | June 2024 | January 2025 | Allow | 7 | 0 | 0 | No | No |
| 18743453 | SEMICONDUCTOR DEVICE WITH PROGRAMMABLE STRUCTURE AND METHOD FOR FABRICATING THE SAME | June 2024 | January 2025 | Allow | 7 | 0 | 0 | No | No |
| 18735999 | SEMICONDUCTOR NANOPARTICLES, METHOD OF PRODUCING THE SEMICONDUCTOR NANOPARTICLES, AND LIGHT-EMITTING DEVICE | June 2024 | January 2025 | Allow | 8 | 1 | 0 | No | No |
| 18669514 | DISPLAY DEVICE WITH LIGHT EMITTING ELEMENTS ON PARALLEL ELECTRODE BRANCHES EXTENDING FROM SEPARATE PARALLEL ELECTRODES | May 2024 | April 2025 | Allow | 11 | 1 | 0 | No | No |
| 18663563 | LATERALLY-DIFFUSED METAL-OXIDE-SEMICONDUCTOR DEVICES WITH AN AIR GAP | May 2024 | September 2024 | Allow | 4 | 1 | 1 | No | No |
| 18658333 | FALSE COLLECTORS AND GUARD RINGS FOR SEMICONDUCTOR DEVICES | May 2024 | November 2024 | Allow | 7 | 0 | 0 | No | No |
| 18619924 | OPTOELECTRONIC SEMICONDUCTOR CHIP AND METHOD FOR PRODUCTING AN OPTOELECTRONIC SEMICONDUCTOR CHIP | March 2024 | January 2025 | Allow | 10 | 1 | 0 | No | No |
| 18613435 | METHOD FOR MAKING NANOSTRUCTURE TRANSISTORS WITH FLUSH SOURCE/DRAIN DOPANT BLOCKING STRUCTURES INCLUDING A SUPERLATTICE | March 2024 | July 2024 | Allow | 4 | 0 | 1 | No | No |
| 18603854 | Semiconductor Structure and Manufacturing Method Thereof | March 2024 | December 2024 | Allow | 9 | 1 | 1 | No | No |
| 18600234 | FABRICATION METHOD FOR JFET WITH IMPLANT ISOLATION | March 2024 | February 2025 | Allow | 11 | 1 | 1 | No | No |
| 18435530 | Light Emitting Device Including Multiple Photoluminescence Materials | February 2024 | March 2025 | Allow | 13 | 1 | 0 | Yes | No |
| 18539959 | SYSTEM AND METHOD FOR BI-DIRECTIONAL TRENCH POWER SWITCHES | December 2023 | September 2024 | Allow | 9 | 0 | 1 | No | No |
| 18526208 | THREE-DIMENSIONAL SEMICONDUCTOR DEVICE | December 2023 | August 2024 | Allow | 9 | 0 | 1 | No | No |
| 18520998 | ESD STRUCTURE | November 2023 | November 2024 | Allow | 12 | 1 | 1 | No | No |
| 18520908 | Silicon Controlled Rectifier | November 2023 | August 2024 | Allow | 9 | 0 | 0 | Yes | No |
| 18513544 | ELECTROSTATIC DISCHARGE (ESD) ARRAY WITH BACK END OF LINE (BEOL) CONNECTION IN A CARRIER WAFER | November 2023 | August 2024 | Allow | 9 | 1 | 0 | No | No |
| 18511731 | IMAGE SENSOR DEVICE | November 2023 | September 2024 | Allow | 10 | 1 | 0 | No | No |
| 18485477 | DISPLAY DEVICE AND ELECTRONIC DEVICE | October 2023 | May 2024 | Allow | 7 | 0 | 0 | No | No |
| 18452965 | SEMICONDUCTOR MEMORY DEVICE | August 2023 | April 2024 | Allow | 8 | 0 | 0 | No | No |
| 18366834 | BIPOLAR JUNCTION TRANSISTOR WITH GATE OVER TERMINALS | August 2023 | March 2024 | Allow | 7 | 0 | 0 | No | No |
| 18360495 | EPITAXIAL SOURCE/DRAIN STRUCTURE AND METHOD | July 2023 | June 2024 | Allow | 11 | 1 | 0 | No | No |
| 18359016 | Contact Plug with Impurity Variation | July 2023 | March 2024 | Allow | 7 | 0 | 0 | No | No |
| 18358959 | SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOF | July 2023 | August 2024 | Allow | 12 | 0 | 2 | No | No |
| 18358873 | MEMS OPTICAL DEVICE COMPRISING A LENS AND AN ACTUATOR FOR CONTROLLING THE CURVATURE OF THE LENS, AND RELATED MANUFACTURING PROCESS | July 2023 | August 2024 | Allow | 13 | 1 | 0 | No | No |
| 18213502 | ELECTROSTATIC DISCHARGE (ESD) DEVICE WITH IMPROVED TURN-ON VOLTAGE | June 2023 | March 2024 | Allow | 9 | 1 | 0 | Yes | No |
| 18330276 | Fabric-Based Items With Electrical Component Arrays | June 2023 | February 2024 | Allow | 8 | 0 | 1 | No | No |
| 18201308 | SEMICONDUCTOR DEVICE WITH SOURCE/DRAIN PATTERN INCLUDING BUFFER LAYER | May 2023 | February 2024 | Allow | 9 | 0 | 1 | No | No |
| 18312181 | SEMICONDUCTOR DEVICE HAVING A CONTACT STRUCTURE | May 2023 | October 2024 | Allow | 17 | 2 | 1 | No | No |
| 18140955 | TERAHERTZ CAPABLE INTEGRATED CIRCUIT | April 2023 | April 2024 | Allow | 11 | 1 | 1 | Yes | No |
| 18302063 | PACKAGED DIE AND RDL WITH BONDING STRUCTURES THEREBETWEEN | April 2023 | January 2024 | Allow | 9 | 0 | 1 | No | No |
| 18301807 | PACKAGING OF A SEMICONDUCTOR DEVICE WITH A PLURALITY OF LEADS | April 2023 | March 2024 | Allow | 11 | 1 | 0 | Yes | No |
| 18191829 | SEMICONDUCTOR NANOPARTICLES, METHOD OF PRODUCING THE SEMICONDUCTOR NANOPARTICLES, AND LIGHT-EMITTING DEVICE | March 2023 | March 2024 | Allow | 12 | 1 | 0 | No | No |
| 18186062 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE BY FORMING A STACKED MEMORY STRUCTURE WITH INSULATING PATTERNS | March 2023 | March 2024 | Allow | 12 | 1 | 1 | Yes | No |
| 18180992 | OPTOELECTRONIC SEMICONDUCTOR CHIP AND METHOD FOR PRODUCTING AN OPTOELECTRONIC SEMICONDUCTOR CHIP | March 2023 | February 2024 | Allow | 11 | 1 | 0 | Yes | No |
| 18147935 | Semiconductor device | December 2022 | July 2024 | Allow | 18 | 0 | 1 | Yes | No |
| 18089236 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | December 2022 | April 2025 | Allow | 28 | 0 | 0 | No | No |
| 18002642 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | December 2022 | April 2025 | Allow | 28 | 0 | 0 | No | No |
| 17994053 | IGBT CHIP INTEGRATING TEMPERATURE SENSOR | November 2022 | April 2025 | Allow | 39 | 0 | 0 | No | No |
| 18058453 | High-Voltage Bidirectional Field Effect Transistor | November 2022 | June 2025 | Allow | 31 | 1 | 0 | Yes | No |
| 17990763 | FIELD EFFECT TRANSISTOR AND FABRICATION METHOD THEREOF | November 2022 | February 2025 | Allow | 27 | 0 | 1 | No | No |
| 17990433 | DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME | November 2022 | July 2025 | Allow | 31 | 0 | 1 | No | No |
| 18054986 | MEMORY DEVICE | November 2022 | April 2025 | Allow | 29 | 0 | 0 | No | No |
| 17980988 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | November 2022 | June 2025 | Allow | 32 | 0 | 1 | No | No |
| 17918809 | SEMICONDUCTOR DEVICE | October 2022 | December 2024 | Allow | 26 | 1 | 0 | No | No |
| 17954582 | SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SAME | September 2022 | April 2025 | Allow | 30 | 1 | 0 | No | No |
| 17913981 | Power Semiconductor Device Comprising a Thyristor and a Bipolar Junction Transistor | September 2022 | August 2024 | Allow | 23 | 1 | 0 | No | No |
| 17948796 | SEMICONDUCTOR DEVICES | September 2022 | January 2025 | Allow | 28 | 0 | 1 | No | No |
| 17948929 | CHIP PARTS | September 2022 | October 2024 | Allow | 25 | 0 | 0 | Yes | No |
| 17943160 | MAGNETIC MEMORY DEVICE | September 2022 | July 2025 | Allow | 34 | 1 | 0 | No | No |
| 17905352 | MAGNETORESISTIVE SENSOR ELEMENT FOR SENSING A TWO-DIMENSIONAL MAGNETIC FIELD WITH LOW HIGH-FIELD ERROR | August 2022 | March 2025 | Allow | 30 | 0 | 0 | No | No |
| 17891384 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | August 2022 | February 2025 | Allow | 30 | 0 | 0 | Yes | No |
| 17890254 | SEMICONDUCTOR DEVICE | August 2022 | August 2024 | Allow | 24 | 0 | 0 | No | No |
| 17886689 | STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE WITH ISOLATION STRUCTURE | August 2022 | January 2025 | Allow | 29 | 0 | 0 | No | No |
| 17885026 | METHOD OF MAKING A CONTACT STRUCTURE | August 2022 | January 2024 | Allow | 18 | 2 | 1 | No | No |
| 17815866 | �-LED, �-LED DEVICE, DISPLAY AND METHOD FOR THE SAME | July 2022 | June 2025 | Allow | 35 | 1 | 0 | No | No |
| 17814245 | MRAM DEVICE STRUCTURE | July 2022 | May 2025 | Allow | 34 | 2 | 1 | Yes | No |
| 17793521 | ARRAY BASE PLATE AND DETECTING METHOD THEREOF, AND LIGHT EMITTING APPARATUS | July 2022 | February 2025 | Allow | 31 | 0 | 0 | No | No |
| 17849824 | TRANSIENT VOLTAGE SUPPRESSION DEVICE | June 2022 | March 2024 | Allow | 20 | 1 | 1 | No | No |
| 17849725 | FINS DISPOSED ON STACKS OF NANOSTRUCTURES WHERE THE NANOSTRUCTURES ARE WRAPPED AROUND BY A GATE | June 2022 | May 2025 | Allow | 35 | 0 | 1 | Yes | No |
| 17808364 | OPERATING VOLTAGE-TRIGGERED SEMICONDUCTOR CONTROLLED RECTIFIER | June 2022 | April 2024 | Allow | 22 | 0 | 0 | No | No |
| 17807869 | MIS CAPACITOR AND METHOD OF MAKING A MIS CAPACITOR | June 2022 | March 2025 | Allow | 33 | 0 | 0 | No | No |
| 17840472 | Devices with Displays Having Transparent Openings and Transition Regions | June 2022 | November 2024 | Allow | 29 | 0 | 1 | Yes | No |
| 17831717 | SEMICONDUCTOR DEVICES WITH IMPROVED LAYOUT TO INCREASE ELECTROSTATIC DISCHARGE PERFORMANCE | June 2022 | March 2025 | Allow | 34 | 1 | 0 | No | No |
| 17827955 | SEMICONDUCTOR DEVICE AND POWER AMPLIFIER | May 2022 | December 2024 | Allow | 30 | 0 | 1 | No | No |
| 17826754 | Conductive Feature Formation | May 2022 | May 2024 | Allow | 24 | 0 | 0 | No | No |
| 17804530 | MICROELECTRONIC DEVICES INCLUDING STACK STRUCTURES HAVING DOPED INTERFACIAL REGIONS, AND RELATED SYSTEMS AND METHODS | May 2022 | May 2025 | Allow | 36 | 0 | 1 | No | No |
| 17748924 | BARRIER STRUCTURE FOR PREVENTING ETCHING TO CONTROL CIRCUITRY | May 2022 | June 2025 | Allow | 36 | 0 | 1 | No | No |
| 17746655 | CONTAMINATION DETECTION METHOD | May 2022 | November 2024 | Allow | 30 | 0 | 1 | Yes | No |
| 17662263 | SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES | May 2022 | May 2024 | Allow | 24 | 0 | 0 | No | No |
| 17775042 | LIGHT-EMITTING DEVICE WITH POLARIZATION MODULATED LAST QUANTUM BARRIER | May 2022 | August 2024 | Allow | 27 | 0 | 0 | No | No |
| 17662101 | SNAPBACK ELECTROSTATIC DISCHARGE PROTECTION DEVICE WITH TUNABLE PARAMETERS | May 2022 | March 2024 | Allow | 22 | 0 | 0 | Yes | No |
| 17732513 | SEMICONDUCTOR DEVICES FOR HIGH FREQUENCY APPLICATIONS | April 2022 | May 2025 | Allow | 36 | 0 | 1 | No | No |
| 17731510 | FALSE COLLECTORS AND GUARD RINGS FOR SEMICONDUCTOR DEVICES | April 2022 | May 2024 | Allow | 25 | 0 | 0 | Yes | No |
| 17730516 | METAL OXIDE FILM, SEMICONDUCTOR DEVICE, AND DISPLAY DEVICE | April 2022 | May 2024 | Allow | 25 | 0 | 1 | Yes | No |
| 17724363 | LED STRUCTURE AND PREPARATION METHOD THEREOF | April 2022 | September 2024 | Allow | 29 | 0 | 0 | No | No |
| 17722465 | Metal-Oxide-Semiconductor Capacitor and Circuit Board Including the Same Embedded Therein | April 2022 | April 2024 | Allow | 24 | 2 | 1 | Yes | No |
| 17714630 | METHOD OF FORMING SEMICONDUCTOR DEVICE | April 2022 | October 2024 | Allow | 31 | 1 | 0 | No | No |
| 17711914 | SEMICONDUCTOR DEVICE | April 2022 | September 2024 | Allow | 29 | 0 | 0 | No | No |
| 17710320 | FALSE COLLECTORS AND GUARD RINGS FOR SEMICONDUCTOR DEVICES | March 2022 | October 2023 | Allow | 18 | 0 | 1 | No | No |
| 17701795 | DISPLAY APPARATUS | March 2022 | October 2024 | Allow | 31 | 0 | 0 | No | No |
| 17701097 | SEMICONDUCTOR DEVICE AND A DATA STORAGE SYSTEM INCLUDING THE SAME | March 2022 | February 2025 | Allow | 35 | 0 | 0 | No | No |
| 17701195 | TUNNELING FIELD EFFECT TRANSISTOR AND SEMICONDUCTOR DEVICE INCLUDING THE SAME | March 2022 | February 2024 | Allow | 23 | 0 | 0 | No | No |
| 17693867 | SEMICONDUCTOR PACKAGE INCLUDING REDISTRIBUTION SUBSTRATE AND METHOD OF MANUFACTURING THE SAME | March 2022 | November 2024 | Allow | 32 | 1 | 0 | Yes | No |
| 17693439 | TEST KEY AND SEMICONDUCTOR DIE INCLUDING THE SAME | March 2022 | November 2024 | Allow | 32 | 0 | 1 | No | No |
| 17654293 | SEMICONDUCTOR STORAGE DEVICE AND MANUFACTURING METHOD THEREOF | March 2022 | February 2025 | Allow | 36 | 1 | 1 | No | No |
| 17690788 | STACKED SEMICONDUCTOR DEVICES IN SEALANTS AND INTERCONNECTED WITH PILLAR ELECTRODES | March 2022 | October 2024 | Allow | 31 | 1 | 1 | Yes | No |
| 17687380 | ESD PROTECTION CIRCUIT WITH ISOLATED SCR FOR NEGATIVE VOLTAGE OPERATION | March 2022 | April 2024 | Allow | 25 | 1 | 1 | Yes | No |
| 17684736 | MEMORY DEVICE | March 2022 | October 2024 | Allow | 32 | 0 | 0 | No | No |
| 17685257 | SEMICONDUCTOR DEVICE WITH INTERGRATED RESISTOR AT ELEMENT REGION BOUNDARY | March 2022 | September 2024 | Allow | 31 | 1 | 1 | No | No |
| 17680099 | DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME | February 2022 | April 2025 | Allow | 38 | 1 | 0 | No | No |
| 17678407 | SEMICONDUCTOR DEVICE WITH PROGRAMMABLE STRUCTURE AND METHOD FOR FABRICATING THE SAME | February 2022 | September 2024 | Allow | 31 | 1 | 1 | No | No |
| 17677094 | ELECTROSTATIC PROTECTION ELEMENT | February 2022 | September 2024 | Allow | 31 | 2 | 0 | No | No |
| 17677239 | INTEGRATED CIRCUIT DEVICES WITH ANGLED TRANSISTORS FORMED BASED ON ANGLED WAFERS | February 2022 | June 2025 | Allow | 40 | 0 | 0 | No | No |
| 17676388 | IMAGE SENSOR AND MANUFACTURING METHOD THEREOF, AND DISPLAY DEVICE | February 2022 | July 2024 | Allow | 28 | 0 | 0 | Yes | No |
| 17651561 | PACKED TERMINAL TRANSISTORS | February 2022 | June 2024 | Allow | 28 | 0 | 0 | No | No |
No appeal data available for this record. This may indicate that no appeals have been filed or decided for applications in this dataset.
Examiner HAIDER, WASIUL works in Art Unit 2812 and has examined 133 patent applications in our dataset. With an allowance rate of 100.0%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 28 months.
Examiner HAIDER, WASIUL's allowance rate of 100.0% places them in the 98% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by HAIDER, WASIUL receive 0.57 office actions before reaching final disposition. This places the examiner in the 4% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by HAIDER, WASIUL is 28 months. This places the examiner in the 52% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a +0.0% benefit to allowance rate for applications examined by HAIDER, WASIUL. This interview benefit is in the 11% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 33.3% of applications are subsequently allowed. This success rate is in the 66% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 62.5% of cases where such amendments are filed. This entry rate is in the 84% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.
When applicants file petitions regarding this examiner's actions, 33.3% are granted (fully or in part). This grant rate is in the 27% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 22% percentile). This examiner rarely makes examiner's amendments compared to other examiners. You should expect to make all necessary claim amendments yourself through formal amendment practice.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 3.0% of allowed cases (in the 71% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.