USPTO Examiner HAIDER WASIUL - Art Unit 2812

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18979543Semiconductor Structure and Manufacturing Method ThereofDecember 2024February 2025Allow200NoNo
18777737SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICESJuly 2024February 2025Allow700NoNo
18769958Conductive Feature FormationJuly 2024March 2025Allow800NoNo
18762560Manufacturing Method for a Power MOSFET with Gate-Source ESD Diode StructureJuly 2024October 2024Allow310NoNo
18753892PACKAGING OF A SEMICONDUCTOR DEVICE WITH A PLURALITY OF LEADSJune 2024May 2025Allow1010NoNo
18750063BIPOLAR JUNCTION TRANSISTOR WITH GATE OVER TERMINALSJune 2024January 2025Allow700NoNo
18743453SEMICONDUCTOR DEVICE WITH PROGRAMMABLE STRUCTURE AND METHOD FOR FABRICATING THE SAMEJune 2024January 2025Allow700NoNo
18735999SEMICONDUCTOR NANOPARTICLES, METHOD OF PRODUCING THE SEMICONDUCTOR NANOPARTICLES, AND LIGHT-EMITTING DEVICEJune 2024January 2025Allow810NoNo
18669514DISPLAY DEVICE WITH LIGHT EMITTING ELEMENTS ON PARALLEL ELECTRODE BRANCHES EXTENDING FROM SEPARATE PARALLEL ELECTRODESMay 2024April 2025Allow1110NoNo
18669507DISPLAY DEVICEMay 2024December 2025Allow1921YesNo
18663563LATERALLY-DIFFUSED METAL-OXIDE-SEMICONDUCTOR DEVICES WITH AN AIR GAPMay 2024September 2024Allow411NoNo
18658333FALSE COLLECTORS AND GUARD RINGS FOR SEMICONDUCTOR DEVICESMay 2024November 2024Allow700NoNo
18619924OPTOELECTRONIC SEMICONDUCTOR CHIP AND METHOD FOR PRODUCTING AN OPTOELECTRONIC SEMICONDUCTOR CHIPMarch 2024January 2025Allow1010NoNo
18613435METHOD FOR MAKING NANOSTRUCTURE TRANSISTORS WITH FLUSH SOURCE/DRAIN DOPANT BLOCKING STRUCTURES INCLUDING A SUPERLATTICEMarch 2024July 2024Allow401NoNo
18603854Semiconductor Structure and Manufacturing Method ThereofMarch 2024December 2024Allow911NoNo
18600234FABRICATION METHOD FOR JFET WITH IMPLANT ISOLATIONMarch 2024February 2025Allow1111NoNo
18435530Light Emitting Device Including Multiple Photoluminescence MaterialsFebruary 2024March 2025Allow1310YesNo
18545842DISPLAY APPARATUSDecember 2023February 2026Allow2600NoNo
18541147SEMICONDUCTOR PACKAGES HAVING CAPACITORSDecember 2023March 2026Allow2700NoNo
18539959SYSTEM AND METHOD FOR BI-DIRECTIONAL TRENCH POWER SWITCHESDecember 2023September 2024Allow901NoNo
18526208THREE-DIMENSIONAL SEMICONDUCTOR DEVICEDecember 2023August 2024Allow901NoNo
18520998ESD STRUCTURENovember 2023November 2024Allow1211NoNo
18520908Silicon Controlled RectifierNovember 2023August 2024Allow900YesNo
18513544ELECTROSTATIC DISCHARGE (ESD) ARRAY WITH BACK END OF LINE (BEOL) CONNECTION IN A CARRIER WAFERNovember 2023August 2024Allow910NoNo
18511731IMAGE SENSOR DEVICENovember 2023September 2024Allow1010NoNo
18508912EDRAM AND METHOD FOR MAKING SAMENovember 2023January 2026Allow2700NoNo
18503756An Array Of Capacitors, An Array Of Memory Cells, Method Used In Forming An Array Of Memory Cells, And Method Used In Forming An Array Of CapacitorsNovember 2023March 2026Allow2800NoNo
18485477DISPLAY DEVICE AND ELECTRONIC DEVICEOctober 2023May 2024Allow700NoNo
18470117CMOS INTEGRATION FOR DOPED PLACEHOLDER AS DIRECT BACKSIDE CONTACTSeptember 2023January 2026Allow2800NoNo
18469865DISPLAY DEVICE AND METHOD FOR MANUFACTURING THE SAMESeptember 2023March 2026Allow3001NoNo
18463340SEMICONDUCTOR DEVICESeptember 2023December 2025Allow2700NoNo
18241500Diamond Wafer Based Electronic Vehicle Power ElectronicsSeptember 2023November 2025Allow2710NoNo
18452965SEMICONDUCTOR MEMORY DEVICEAugust 2023April 2024Allow800NoNo
18235193HIGH POWER TVS WITH ENHANCED REPETITIVE SURGE PERFORMANCEAugust 2023January 2026Allow2911NoNo
18366834BIPOLAR JUNCTION TRANSISTOR WITH GATE OVER TERMINALSAugust 2023March 2024Allow700NoNo
18366002SILICON CARBIDE SEMICONDUCTOR DEVICE, INVERTER CIRCUIT USING THE SAME, AND METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICEAugust 2023January 2026Allow2901NoNo
18360495EPITAXIAL SOURCE/DRAIN STRUCTURE AND METHODJuly 2023June 2024Allow1110NoNo
18358959SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOFJuly 2023August 2024Allow1202NoNo
18359016Contact Plug with Impurity VariationJuly 2023March 2024Allow700NoNo
18358606SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEJuly 2023January 2026Allow3000NoNo
18358873MEMS OPTICAL DEVICE COMPRISING A LENS AND AN ACTUATOR FOR CONTROLLING THE CURVATURE OF THE LENS, AND RELATED MANUFACTURING PROCESSJuly 2023August 2024Allow1310NoNo
18357580ELECTROSTATIC DISCHARGE PREVENTIONJuly 2023October 2025Allow2701NoNo
18356164IGBT CELLS WITH FLOATING MESAJuly 2023January 2026Allow3001YesNo
18347560SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICEJuly 2023December 2025Allow3010NoNo
18341147FRONT SIDE OHMIC CONTACT FORMATION FOR SIC DEVICEJune 2023January 2026Allow3101NoNo
18340485SEMICONDUCTOR DEVICE WITH ANODE TRENCHJune 2023January 2026Allow3110NoNo
18213502ELECTROSTATIC DISCHARGE (ESD) DEVICE WITH IMPROVED TURN-ON VOLTAGEJune 2023March 2024Allow910YesNo
18330276Fabric-Based Items With Electrical Component ArraysJune 2023February 2024Allow801NoNo
18329550CASCODE ARRANGEMENT AND SEMICONDUCTOR MODULEJune 2023October 2025Allow2800NoNo
18327081SEMICONDUCTOR MEMORY STRUCTURE WITH CONTACT PASSING THROUGH OPENING IN CONTROL GATEJune 2023February 2026Allow3211NoNo
18038845SEMICONDUCTOR DEVICE WITH A SIDE SURFACE HAVING DIFFERENT PARTIAL REGIONSMay 2023September 2025Allow2800NoNo
18201308SEMICONDUCTOR DEVICE WITH SOURCE/DRAIN PATTERN INCLUDING BUFFER LAYERMay 2023February 2024Allow901NoNo
18038643BIDIRECTIONAL THYRISTOR DEVICE WITH ASYMMETRIC CHARACTERISTICSMay 2023August 2025Allow2700NoNo
18312181SEMICONDUCTOR DEVICE HAVING A CONTACT STRUCTUREMay 2023October 2024Allow1721NoNo
18311935IC STRUCTURE FOR CONNECTED CAPACITANCES AND METHOD OF FORMING SAMEMay 2023July 2025Allow2600NoNo
18140955TERAHERTZ CAPABLE INTEGRATED CIRCUITApril 2023April 2024Allow1111YesNo
18309320TRANSISTOR FEEDBACK CAPACITANCE REDUCTIONApril 2023October 2025Allow3000NoNo
18306544LOW CAPACITANCE POLY-BOUNDED SILICON CONTROLLED RECTIFIERSApril 2023October 2025Allow3000NoNo
18302063PACKAGED DIE AND RDL WITH BONDING STRUCTURES THEREBETWEENApril 2023January 2024Allow901NoNo
18301807PACKAGING OF A SEMICONDUCTOR DEVICE WITH A PLURALITY OF LEADSApril 2023March 2024Allow1110YesNo
18135099Vertical Trench Device Configurations for Radiation-Environment ApplicationsApril 2023September 2025Allow2901NoNo
18191829SEMICONDUCTOR NANOPARTICLES, METHOD OF PRODUCING THE SEMICONDUCTOR NANOPARTICLES, AND LIGHT-EMITTING DEVICEMarch 2023March 2024Allow1210NoNo
18126006SILICON CONTROLLED RECTIFIERSMarch 2023October 2025Allow3110NoNo
18186062SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE BY FORMING A STACKED MEMORY STRUCTURE WITH INSULATING PATTERNSMarch 2023March 2024Allow1211YesNo
18180992OPTOELECTRONIC SEMICONDUCTOR CHIP AND METHOD FOR PRODUCTING AN OPTOELECTRONIC SEMICONDUCTOR CHIPMarch 2023February 2024Allow1110YesNo
18177021SEMICONDUCTOR DEVICE AND POWER CONVERSION APPARATUSMarch 2023November 2025Allow3210YesNo
18158689SEMICONDUCTOR DEVICE HAVING SENSING ELEMENTJanuary 2023July 2025Allow3001NoNo
18099358SEMICONDUCTOR DEVICE WITH TRENCH ISOLATION STRUCTURES IN A TRANSITION REGION AND METHOD OF MANUFACTURINGJanuary 2023October 2025Allow3311NoNo
18098517TRANSIENT VOLTAGE SUPPRESSION DEVICEJanuary 2023July 2025Allow3001NoNo
18154875SEMICONDUCTOR STRUCTURE HAVING DEEP TRENCH CAPACITOR AND METHOD OF MANUFACTURING THEREOFJanuary 2023December 2025Allow3511NoNo
18152593IGBT WITH SHARED EMITTER CONTACTJanuary 2023February 2026Allow3701NoNo
18094023RADIO FREQUENCY SWITCHJanuary 2023December 2025Allow3510NoNo
18149219SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOFJanuary 2023July 2025Allow3110NoNo
18147935Semiconductor deviceDecember 2022July 2024Allow1801YesNo
18147065VERTICAL SEMICONDUCTOR SWITCHING ELEMENTS WITH SENSE CELL REGIONDecember 2022July 2025Allow3010YesNo
18089236SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEDecember 2022April 2025Allow2800NoNo
18088890INTEGRATED CIRCUIT DEVICEDecember 2022September 2025Allow3201NoNo
18088488ELECTROSTATIC PROTECTION DEVICE INCLUDING SCR AND MANUFACTURING METHOD THEREOFDecember 2022July 2025Allow3101YesNo
18002642SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAMEDecember 2022April 2025Allow2800NoNo
18062700LATERAL POWER SEMICONDUCTOR DEVICEDecember 2022December 2025Allow3701YesNo
17994031DISPLAY PANEL AND METHOD FOR FABRICATING SAMENovember 2022August 2025Allow3201NoNo
17994053IGBT CHIP INTEGRATING TEMPERATURE SENSORNovember 2022April 2025Allow3900NoNo
18058453High-Voltage Bidirectional Field Effect TransistorNovember 2022June 2025Allow3110YesNo
18058010Thermally Stable Spin Orbit Torque Layer for an MRAM DeviceNovember 2022November 2025Allow3620NoNo
17992098PACKAGE FOR A LATERAL POWER TRANSISTORNovember 2022July 2025Allow3210NoNo
17990763FIELD EFFECT TRANSISTOR AND FABRICATION METHOD THEREOFNovember 2022February 2025Allow2701NoNo
17990797FABRICATION OF HIGH MOBILITY THIN FILM TRANSISTORS ON THIN AND FLEXIBLE CERAMIC SUBSTRATENovember 2022September 2025Allow4500NoNo
17990433DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAMENovember 2022July 2025Allow3101NoNo
17925828SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICENovember 2022October 2025Allow3511YesNo
18054986MEMORY DEVICENovember 2022April 2025Allow2900NoNo
17980988SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAMENovember 2022June 2025Allow3201NoNo
17974148SWITCHABLE MAGNETIC DEVICE OR DOT FOR DATA STORAGEOctober 2022November 2025Allow3710NoNo
17971651MAGNETORESISTIVE RANDOM ACCESS MEMORY AND METHOD FOR FABRICATING THE SAMEOctober 2022July 2025Allow3311NoNo
17968899SEMICONDUCTOR DEVICEOctober 2022November 2025Allow3700NoNo
17967428DIRECT BACKSIDE SELF-ALIGNED CONTACTOctober 2022August 2025Allow3411NoNo
17918837SEMICONDUCTOR APPARATUS AND METHOD FOR FABRICATING SAMEOctober 2022September 2025Allow3511NoNo
17918809SEMICONDUCTOR DEVICEOctober 2022December 2024Allow2610NoNo
17963389SEMICONDUCTOR DEVICE WITH A CLAMPING DIODEOctober 2022July 2025Allow3410NoNo
17958283ULTRA-THIN SEMI-METALS FOR LOW TEMPERATURE CONDUCTIONSeptember 2022March 2026Allow4110YesNo
17954582SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SAMESeptember 2022April 2025Allow3010NoNo

Appeals Overview

No appeal data available for this record. This may indicate that no appeals have been filed or decided for applications in this dataset.

Examiner HAIDER, WASIUL - Prosecution Strategy Guide

Executive Summary

Examiner HAIDER, WASIUL works in Art Unit 2812 and has examined 44 patent applications in our dataset. With an allowance rate of 100.0%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 29 months.

Allowance Patterns

Examiner HAIDER, WASIUL's allowance rate of 100.0% places them in the 96% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by HAIDER, WASIUL receive 0.82 office actions before reaching final disposition. This places the examiner in the 5% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by HAIDER, WASIUL is 29 months. This places the examiner in the 65% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +0.0% benefit to allowance rate for applications examined by HAIDER, WASIUL. This interview benefit is in the 15% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 25.0% of applications are subsequently allowed. This success rate is in the 38% percentile among all examiners. Strategic Insight: RCEs show below-average effectiveness with this examiner. Carefully evaluate whether an RCE or continuation is the better strategy.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 66.7% of cases where such amendments are filed. This entry rate is in the 90% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Petition Practice

When applicants file petitions regarding this examiner's actions, 0.0% are granted (fully or in part). This grant rate is in the 4% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 24% percentile). This examiner rarely makes examiner's amendments compared to other examiners. You should expect to make all necessary claim amendments yourself through formal amendment practice.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 4.5% of allowed cases (in the 79% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.