USPTO Examiner HAIDER WASIUL - Art Unit 2812

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18979543Semiconductor Structure and Manufacturing Method ThereofDecember 2024February 2025Allow200NoNo
18777737SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICESJuly 2024February 2025Allow700NoNo
18769958Conductive Feature FormationJuly 2024March 2025Allow800NoNo
18762560Manufacturing Method for a Power MOSFET with Gate-Source ESD Diode StructureJuly 2024October 2024Allow310NoNo
18753892PACKAGING OF A SEMICONDUCTOR DEVICE WITH A PLURALITY OF LEADSJune 2024May 2025Allow1010NoNo
18750063BIPOLAR JUNCTION TRANSISTOR WITH GATE OVER TERMINALSJune 2024January 2025Allow700NoNo
18743453SEMICONDUCTOR DEVICE WITH PROGRAMMABLE STRUCTURE AND METHOD FOR FABRICATING THE SAMEJune 2024January 2025Allow700NoNo
18735999SEMICONDUCTOR NANOPARTICLES, METHOD OF PRODUCING THE SEMICONDUCTOR NANOPARTICLES, AND LIGHT-EMITTING DEVICEJune 2024January 2025Allow810NoNo
18669514DISPLAY DEVICE WITH LIGHT EMITTING ELEMENTS ON PARALLEL ELECTRODE BRANCHES EXTENDING FROM SEPARATE PARALLEL ELECTRODESMay 2024April 2025Allow1110NoNo
18663563LATERALLY-DIFFUSED METAL-OXIDE-SEMICONDUCTOR DEVICES WITH AN AIR GAPMay 2024September 2024Allow411NoNo
18658333FALSE COLLECTORS AND GUARD RINGS FOR SEMICONDUCTOR DEVICESMay 2024November 2024Allow700NoNo
18619924OPTOELECTRONIC SEMICONDUCTOR CHIP AND METHOD FOR PRODUCTING AN OPTOELECTRONIC SEMICONDUCTOR CHIPMarch 2024January 2025Allow1010NoNo
18613435METHOD FOR MAKING NANOSTRUCTURE TRANSISTORS WITH FLUSH SOURCE/DRAIN DOPANT BLOCKING STRUCTURES INCLUDING A SUPERLATTICEMarch 2024July 2024Allow401NoNo
18603854Semiconductor Structure and Manufacturing Method ThereofMarch 2024December 2024Allow911NoNo
18600234FABRICATION METHOD FOR JFET WITH IMPLANT ISOLATIONMarch 2024February 2025Allow1111NoNo
18435530Light Emitting Device Including Multiple Photoluminescence MaterialsFebruary 2024March 2025Allow1310YesNo
18539959SYSTEM AND METHOD FOR BI-DIRECTIONAL TRENCH POWER SWITCHESDecember 2023September 2024Allow901NoNo
18526208THREE-DIMENSIONAL SEMICONDUCTOR DEVICEDecember 2023August 2024Allow901NoNo
18520998ESD STRUCTURENovember 2023November 2024Allow1211NoNo
18520908Silicon Controlled RectifierNovember 2023August 2024Allow900YesNo
18513544ELECTROSTATIC DISCHARGE (ESD) ARRAY WITH BACK END OF LINE (BEOL) CONNECTION IN A CARRIER WAFERNovember 2023August 2024Allow910NoNo
18511731IMAGE SENSOR DEVICENovember 2023September 2024Allow1010NoNo
18485477DISPLAY DEVICE AND ELECTRONIC DEVICEOctober 2023May 2024Allow700NoNo
18452965SEMICONDUCTOR MEMORY DEVICEAugust 2023April 2024Allow800NoNo
18366834BIPOLAR JUNCTION TRANSISTOR WITH GATE OVER TERMINALSAugust 2023March 2024Allow700NoNo
18360495EPITAXIAL SOURCE/DRAIN STRUCTURE AND METHODJuly 2023June 2024Allow1110NoNo
18359016Contact Plug with Impurity VariationJuly 2023March 2024Allow700NoNo
18358959SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOFJuly 2023August 2024Allow1202NoNo
18358873MEMS OPTICAL DEVICE COMPRISING A LENS AND AN ACTUATOR FOR CONTROLLING THE CURVATURE OF THE LENS, AND RELATED MANUFACTURING PROCESSJuly 2023August 2024Allow1310NoNo
18213502ELECTROSTATIC DISCHARGE (ESD) DEVICE WITH IMPROVED TURN-ON VOLTAGEJune 2023March 2024Allow910YesNo
18330276Fabric-Based Items With Electrical Component ArraysJune 2023February 2024Allow801NoNo
18201308SEMICONDUCTOR DEVICE WITH SOURCE/DRAIN PATTERN INCLUDING BUFFER LAYERMay 2023February 2024Allow901NoNo
18312181SEMICONDUCTOR DEVICE HAVING A CONTACT STRUCTUREMay 2023October 2024Allow1721NoNo
18140955TERAHERTZ CAPABLE INTEGRATED CIRCUITApril 2023April 2024Allow1111YesNo
18302063PACKAGED DIE AND RDL WITH BONDING STRUCTURES THEREBETWEENApril 2023January 2024Allow901NoNo
18301807PACKAGING OF A SEMICONDUCTOR DEVICE WITH A PLURALITY OF LEADSApril 2023March 2024Allow1110YesNo
18191829SEMICONDUCTOR NANOPARTICLES, METHOD OF PRODUCING THE SEMICONDUCTOR NANOPARTICLES, AND LIGHT-EMITTING DEVICEMarch 2023March 2024Allow1210NoNo
18186062SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE BY FORMING A STACKED MEMORY STRUCTURE WITH INSULATING PATTERNSMarch 2023March 2024Allow1211YesNo
18180992OPTOELECTRONIC SEMICONDUCTOR CHIP AND METHOD FOR PRODUCTING AN OPTOELECTRONIC SEMICONDUCTOR CHIPMarch 2023February 2024Allow1110YesNo
18147935Semiconductor deviceDecember 2022July 2024Allow1801YesNo
18089236SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEDecember 2022April 2025Allow2800NoNo
18002642SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAMEDecember 2022April 2025Allow2800NoNo
17994053IGBT CHIP INTEGRATING TEMPERATURE SENSORNovember 2022April 2025Allow3900NoNo
18058453High-Voltage Bidirectional Field Effect TransistorNovember 2022June 2025Allow3110YesNo
17990763FIELD EFFECT TRANSISTOR AND FABRICATION METHOD THEREOFNovember 2022February 2025Allow2701NoNo
17990433DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAMENovember 2022July 2025Allow3101NoNo
18054986MEMORY DEVICENovember 2022April 2025Allow2900NoNo
17980988SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAMENovember 2022June 2025Allow3201NoNo
17918809SEMICONDUCTOR DEVICEOctober 2022December 2024Allow2610NoNo
17954582SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SAMESeptember 2022April 2025Allow3010NoNo
17913981Power Semiconductor Device Comprising a Thyristor and a Bipolar Junction TransistorSeptember 2022August 2024Allow2310NoNo
17948796SEMICONDUCTOR DEVICESSeptember 2022January 2025Allow2801NoNo
17948929CHIP PARTSSeptember 2022October 2024Allow2500YesNo
17943160MAGNETIC MEMORY DEVICESeptember 2022July 2025Allow3410NoNo
17905352MAGNETORESISTIVE SENSOR ELEMENT FOR SENSING A TWO-DIMENSIONAL MAGNETIC FIELD WITH LOW HIGH-FIELD ERRORAugust 2022March 2025Allow3000NoNo
17891384SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEAugust 2022February 2025Allow3000YesNo
17890254SEMICONDUCTOR DEVICEAugust 2022August 2024Allow2400NoNo
17886689STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE WITH ISOLATION STRUCTUREAugust 2022January 2025Allow2900NoNo
17885026METHOD OF MAKING A CONTACT STRUCTUREAugust 2022January 2024Allow1821NoNo
17815866�-LED, �-LED DEVICE, DISPLAY AND METHOD FOR THE SAMEJuly 2022June 2025Allow3510NoNo
17814245MRAM DEVICE STRUCTUREJuly 2022May 2025Allow3421YesNo
17793521ARRAY BASE PLATE AND DETECTING METHOD THEREOF, AND LIGHT EMITTING APPARATUSJuly 2022February 2025Allow3100NoNo
17849824TRANSIENT VOLTAGE SUPPRESSION DEVICEJune 2022March 2024Allow2011NoNo
17849725FINS DISPOSED ON STACKS OF NANOSTRUCTURES WHERE THE NANOSTRUCTURES ARE WRAPPED AROUND BY A GATEJune 2022May 2025Allow3501YesNo
17808364OPERATING VOLTAGE-TRIGGERED SEMICONDUCTOR CONTROLLED RECTIFIERJune 2022April 2024Allow2200NoNo
17807869MIS CAPACITOR AND METHOD OF MAKING A MIS CAPACITORJune 2022March 2025Allow3300NoNo
17840472Devices with Displays Having Transparent Openings and Transition RegionsJune 2022November 2024Allow2901YesNo
17831717SEMICONDUCTOR DEVICES WITH IMPROVED LAYOUT TO INCREASE ELECTROSTATIC DISCHARGE PERFORMANCEJune 2022March 2025Allow3410NoNo
17827955SEMICONDUCTOR DEVICE AND POWER AMPLIFIERMay 2022December 2024Allow3001NoNo
17826754Conductive Feature FormationMay 2022May 2024Allow2400NoNo
17804530MICROELECTRONIC DEVICES INCLUDING STACK STRUCTURES HAVING DOPED INTERFACIAL REGIONS, AND RELATED SYSTEMS AND METHODSMay 2022May 2025Allow3601NoNo
17748924BARRIER STRUCTURE FOR PREVENTING ETCHING TO CONTROL CIRCUITRYMay 2022June 2025Allow3601NoNo
17746655CONTAMINATION DETECTION METHODMay 2022November 2024Allow3001YesNo
17662263SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICESMay 2022May 2024Allow2400NoNo
17775042LIGHT-EMITTING DEVICE WITH POLARIZATION MODULATED LAST QUANTUM BARRIERMay 2022August 2024Allow2700NoNo
17662101SNAPBACK ELECTROSTATIC DISCHARGE PROTECTION DEVICE WITH TUNABLE PARAMETERSMay 2022March 2024Allow2200YesNo
17732513SEMICONDUCTOR DEVICES FOR HIGH FREQUENCY APPLICATIONSApril 2022May 2025Allow3601NoNo
17731510FALSE COLLECTORS AND GUARD RINGS FOR SEMICONDUCTOR DEVICESApril 2022May 2024Allow2500YesNo
17730516METAL OXIDE FILM, SEMICONDUCTOR DEVICE, AND DISPLAY DEVICEApril 2022May 2024Allow2501YesNo
17724363LED STRUCTURE AND PREPARATION METHOD THEREOFApril 2022September 2024Allow2900NoNo
17722465Metal-Oxide-Semiconductor Capacitor and Circuit Board Including the Same Embedded ThereinApril 2022April 2024Allow2421YesNo
17714630METHOD OF FORMING SEMICONDUCTOR DEVICEApril 2022October 2024Allow3110NoNo
17711914SEMICONDUCTOR DEVICEApril 2022September 2024Allow2900NoNo
17710320FALSE COLLECTORS AND GUARD RINGS FOR SEMICONDUCTOR DEVICESMarch 2022October 2023Allow1801NoNo
17701795DISPLAY APPARATUSMarch 2022October 2024Allow3100NoNo
17701097SEMICONDUCTOR DEVICE AND A DATA STORAGE SYSTEM INCLUDING THE SAMEMarch 2022February 2025Allow3500NoNo
17701195TUNNELING FIELD EFFECT TRANSISTOR AND SEMICONDUCTOR DEVICE INCLUDING THE SAMEMarch 2022February 2024Allow2300NoNo
17693867SEMICONDUCTOR PACKAGE INCLUDING REDISTRIBUTION SUBSTRATE AND METHOD OF MANUFACTURING THE SAMEMarch 2022November 2024Allow3210YesNo
17693439TEST KEY AND SEMICONDUCTOR DIE INCLUDING THE SAMEMarch 2022November 2024Allow3201NoNo
17654293SEMICONDUCTOR STORAGE DEVICE AND MANUFACTURING METHOD THEREOFMarch 2022February 2025Allow3611NoNo
17690788STACKED SEMICONDUCTOR DEVICES IN SEALANTS AND INTERCONNECTED WITH PILLAR ELECTRODESMarch 2022October 2024Allow3111YesNo
17687380ESD PROTECTION CIRCUIT WITH ISOLATED SCR FOR NEGATIVE VOLTAGE OPERATIONMarch 2022April 2024Allow2511YesNo
17684736MEMORY DEVICEMarch 2022October 2024Allow3200NoNo
17685257SEMICONDUCTOR DEVICE WITH INTERGRATED RESISTOR AT ELEMENT REGION BOUNDARYMarch 2022September 2024Allow3111NoNo
17680099DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAMEFebruary 2022April 2025Allow3810NoNo
17678407SEMICONDUCTOR DEVICE WITH PROGRAMMABLE STRUCTURE AND METHOD FOR FABRICATING THE SAMEFebruary 2022September 2024Allow3111NoNo
17677094ELECTROSTATIC PROTECTION ELEMENTFebruary 2022September 2024Allow3120NoNo
17677239INTEGRATED CIRCUIT DEVICES WITH ANGLED TRANSISTORS FORMED BASED ON ANGLED WAFERSFebruary 2022June 2025Allow4000NoNo
17676388IMAGE SENSOR AND MANUFACTURING METHOD THEREOF, AND DISPLAY DEVICEFebruary 2022July 2024Allow2800YesNo
17651561PACKED TERMINAL TRANSISTORSFebruary 2022June 2024Allow2800NoNo

Appeals Overview

No appeal data available for this record. This may indicate that no appeals have been filed or decided for applications in this dataset.

Examiner HAIDER, WASIUL - Prosecution Strategy Guide

Executive Summary

Examiner HAIDER, WASIUL works in Art Unit 2812 and has examined 133 patent applications in our dataset. With an allowance rate of 100.0%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 28 months.

Allowance Patterns

Examiner HAIDER, WASIUL's allowance rate of 100.0% places them in the 98% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by HAIDER, WASIUL receive 0.57 office actions before reaching final disposition. This places the examiner in the 4% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by HAIDER, WASIUL is 28 months. This places the examiner in the 52% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +0.0% benefit to allowance rate for applications examined by HAIDER, WASIUL. This interview benefit is in the 11% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 33.3% of applications are subsequently allowed. This success rate is in the 66% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 62.5% of cases where such amendments are filed. This entry rate is in the 84% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Petition Practice

When applicants file petitions regarding this examiner's actions, 33.3% are granted (fully or in part). This grant rate is in the 27% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 22% percentile). This examiner rarely makes examiner's amendments compared to other examiners. You should expect to make all necessary claim amendments yourself through formal amendment practice.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 3.0% of allowed cases (in the 71% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.