USPTO Examiner ERDEM FAZLI - Art Unit 2812

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
19175411LATERALLY DIFFUSED METAL OXIDE SEMICONDUCTOR DEVICE AND PREPARATION METHOD THEREOFApril 2025December 2025Allow820YesNo
19033509CONDUCTIVE CHANNEL STRUCTURE FOR SiC DEVICES, FULLY INTEGRATED SiC DEVICE AND FULLY INTEGRATED MANUFACTURING PROCESS THEREOFJanuary 2025June 2025Allow510YesNo
18950687PI-TYPE TRENCH GATE SILICON CARBIDE MOSFET DEVICE AND FABRICATION METHOD THEREOFNovember 2024September 2025Allow1011NoNo
18897009LATERAL HIGH VOLTAGE SEMICONDUCTOR DEVICE AND METHOD FOR FORMING A LATERAL HIGH VOLTAGE SEMICONDUCTOR DEVICESeptember 2024October 2025Allow1310NoNo
18785583SILICON CARBIDE SPLIT-GATE MOSFETS INTEGRATING HIGH-SPEED FREEWHEELING DIODES AND PREPARATION METHODS THEREOFJuly 2024February 2025Allow720NoNo
18625798SEMICONDUCTOR DEVICE WITH DOPED REGION BETWEEN GATE AND DRAINApril 2024September 2025Allow1720NoNo
18596271VERTICAL FIELD EFFECT TRANSISTOR DEVICE AND METHOD OF FABRICATIONMarch 2024February 2026Allow2310NoNo
18587327REGROWTH UNIFORMITY IN GAN VERTICAL DEVICESFebruary 2024September 2025Allow1920YesNo
18412650DESIGNS FOR SILICON CARBIDE MOSFETsJanuary 2024July 2025Abandon1820NoNo
18514976HIGH VOLTAGE SEMICONDUCTOR DEVICE COMPRISING A COMBINED JUNCTION TERMINAL PROTECTION STRUCTURE WITH A FERROELECTRIC MATERIALNovember 2023September 2024Allow1010NoNo
18513576TRENCH MOSFET DEVICE AND MANUFACTURING METHOD THEREFORNovember 2023October 2024Abandon1120NoNo
18380747TWO-DIMENSIONAL SEMICONDUCTOR BASED PRINTABLE OPTOELECTRONIC INKS, FABRICATING METHODS AND APPLICATIONS OF SAMEOctober 2023October 2024Allow1210NoNo
18486207DISPLAY DEVICEOctober 2023September 2024Allow1110NoNo
18475978SIDEWALL PROTECTION FOR PCRAM DEVICESeptember 2023October 2024Allow1310NoNo
18474300SEMICONDUCTOR DEVICESeptember 2023September 2024Allow1110NoNo
18459273METHOD FOR MANUFACTURING A SIC ELECTRONIC DEVICE WITH REDUCED HANDLING STEPS, AND SIC ELECTRONIC DEVICEAugust 2023February 2025Allow1820NoNo
18275614SUPER JUNCTION MOSFET DEVICEAugust 2023October 2024Allow1420YesNo
18364397MICROELECTRONIC DEVICES WITH MIRRORED BLOCKS OF MULTI-SET STAIRCASED STADIUMS, AND RELATED SYSTEMS AND METHODSAugust 2023March 2026Allow3110NoNo
18360617FINFET STRUCTURE WITH CONTROLLED AIR GAPSJuly 2023November 2025Allow2810NoNo
18358991Integrated Devices in Semiconductor Packages and Methods of Forming SameJuly 2023November 2024Allow1620NoNo
18273556DISPLAY APPARATUS, AND DISPLAY PANEL AND MANUFACTURING METHOD THEREFORJuly 2023February 2026Allow3110NoNo
18224330FLIP CHIP TYPE LIGHT EMITTING DEVICEJuly 2023May 2025Allow2210NoNo
18333562SEMICONDUCTOR DEVICEJune 2023February 2024Allow800NoNo
18332119Heterostructure of an Electronic Circuit Having a Semiconductor DeviceJune 2023June 2024Allow1210YesNo
18039610SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOFMay 2023December 2023Allow700NoNo
18321080VERTICAL MEMORY DEVICES AND METHODS OF MANUFACTURING THE SAMEMay 2023June 2025Allow2500NoNo
18320309TRENCH-GATE FIELD EFFECT TRANSISTORMay 2023October 2025Allow2900NoNo
18317764INTEGRATED CIRCUIT DEVICE AND MANUFACTURING METHOD THEREOFMay 2023March 2026Allow3411YesNo
18316273HIGH VOLTAGE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAMEMay 2023October 2025Allow2910NoNo
18315943SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEMay 2023March 2026Abandon3401NoNo
18143991SEMICONDUCTOR COMPONENT HAVING DEFECT BARRIER REGIONMay 2023November 2025Allow3110NoNo
18135717SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMEApril 2023February 2026Allow3420NoNo
18301146MOSFET DEVICE WITH UNDULATING CHANNELApril 2023June 2024Allow1410YesNo
18031365SEMICONDUCTOR DEVICE AND POWER CONVERSION DEVICEApril 2023July 2025Allow2700NoNo
18298765SEMICONDUCTOR DEVICE AND POWER CONVERSION APPARATUSApril 2023January 2026Allow3310YesNo
18247344SILICON CARBIDE SEMICONDUCTOR DEVICEMarch 2023November 2025Allow3110NoNo
18128234LATERAL DIFFUSION METAL OXIDE SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMEMarch 2023January 2025Allow2130NoNo
18246407SILICON CARBIDE SEMICONDUCTOR DEVICEMarch 2023December 2025Allow3210YesNo
18245939SELECTIVE DEPOSITION OF METAL OXIDES USING SILANES AS AN INHIBITORMarch 2023November 2025Allow3210NoNo
18183375SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAMEMarch 2023November 2025Allow3210NoNo
18182766SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAMEMarch 2023March 2026Allow3620NoNo
18120995SEMICONDUCTOR DEVICEMarch 2023March 2024Allow1220NoNo
18119364POWER DEVICE AND METHOD FOR MANUFACTURING THE SAMEMarch 2023February 2026Allow3511NoNo
18177245SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, INVERTER CIRCUIT, DRIVE DEVICE, VEHICLE, AND ELEVATORMarch 2023February 2026Allow3611NoNo
18175836IMAGE SENSOR STRUCTUREFebruary 2023May 2024Allow1410YesNo
18175823DISPLAY PANEL AND METHOD OF FABRICATING THE SAMEFebruary 2023November 2025Allow3210NoNo
18176095SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICEFebruary 2023February 2026Allow3611NoNo
18114632SiC SUBSTRATE AND SiC EPITAXIAL WAFERFebruary 2023June 2024Allow1620NoNo
18172590SEMICONDUCTOR DEVICEFebruary 2023July 2025Allow2900NoNo
18172608SEMICONDUCTOR STRUCTURE, SEMICONDUCTOR ASSEMBLY AND METHOD FOR MANUFACTURING THE SAMEFebruary 2023November 2025Allow3310NoNo
18111079SEMICONDUCTOR DEVICE HAVING DEEP TRENCH STRUCTURE AND METHOD OF MANUFACTURING THEREOFFebruary 2023September 2024Allow1910NoNo
18170525SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOFFebruary 2023February 2026Allow3611NoNo
18167415SEMICONDUCTOR PACKAGEFebruary 2023March 2025Allow2510YesNo
18164585SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOFFebruary 2023February 2026Allow3611NoNo
18103463STRETCHABLE ELECTRONIC DEVICEJanuary 2023May 2024Allow1510YesNo
18096679RUGGED LDMOS WITH REDUCED NSD IN SOURCEJanuary 2023October 2025Allow3331YesYes
18096570DISPLAY DEVICEJanuary 2023January 2026Allow3620NoNo
18091807METHOD OF MANUFACTURING SEMICONDUCTOR DEVICEDecember 2022June 2024Allow1810NoNo
18080427Semiconductor Device Having a Field Termination Structure and a Charge Balance Structure, and Method of Producing the Semiconductor DeviceDecember 2022January 2026Allow3720NoNo
18056962FIN FIELD EFFECT TRANSISTOR WITH FIELD PLATINGNovember 2022April 2024Allow1720NoNo
17920033GaN-BASED SEMICONDUCTOR DEVICE WITH REDUCED LEAKAGE CURRENT AND METHOD FOR MANUFACTURING THE SAMEOctober 2022May 2025Allow3010NoNo
17957790VDMOS DEVICE AND METHOD FOR FABRICATING THE SAMESeptember 2022November 2025Allow3811NoNo
17944844SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICESeptember 2022January 2024Allow1600NoNo
17944394LIGHT EMITTING DEVICE, METHOD OF MANUFACTURING SAME AND DISPLAY DEVICE INCLUDING SAMESeptember 2022October 2023Allow1310YesNo
17823678LAYOUTS OF DATA PADS ON A SEMICONDUCTOR DIEAugust 2022January 2026Allow4011NoNo
17823638LAYOUTS OF DATA PADS ON A SEMICONDUCTOR DIEAugust 2022January 2026Allow4011NoNo
17892660SEMICONDUCTOR DEVICEAugust 2022May 2025Allow3210NoNo
17887573SPLIT-GATE POWER MOS DEVICE AND MANUFACTURING METHOD THEREOFAugust 2022February 2026Allow4221NoNo
17887156SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEAugust 2022May 2025Allow3310NoNo
17886321Semiconductor Structure and Method of Forming the SameAugust 2022September 2025Allow3720YesNo
17884242SEMICONDUCTOR DEVICE WITH DOPED REGION BETWEEN GATE AND DRAINAugust 2022January 2024Allow1720NoNo
17883660MULTIPLE DEEP TRENCH ISOLATION (MDTI) STRUCTURE FOR CMOS IMAGE SENSORAugust 2022January 2024Allow1700NoNo
17880113SEMICONDUCTOR DEVICE AND MODULEAugust 2022September 2025Allow3820YesNo
17870865METHOD FOR FABRICATING HYBRID BONDED STRUCTUREJuly 2022February 2024Allow1900NoNo
17871231SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAMEJuly 2022January 2025Allow3000NoNo
17869567METHOD OF MANUFACTURING OHMIC CONTACTS ON A SILICON CARBIDE (SIC) SUBSTRATE, METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICEJuly 2022July 2025Allow3611YesNo
17865400SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICEJuly 2022July 2025Allow3620NoNo
17758907METAL-OXIDE FILM SEMICONDUCTOR FIELD-EFFECT TRANSISTOR DEVICE AND METHOD FOR MANUFACTURING SAMEJuly 2022April 2025Allow3310NoNo
17864132SEMICONDUCTOR DEVICEJuly 2022April 2025Allow3310YesNo
17863799SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PACKAGEJuly 2022February 2026Allow4330YesNo
17811618DIODES WITH SCHOTTKY CONTACT INCLUDING LOCALIZED SURFACE REGIONSJuly 2022April 2025Allow3310YesNo
17857219SEMICONDUCTOR STRUCTURE, MANUFACTURING METHOD THEREFOR AND MEMORYJuly 2022June 2025Allow3610NoNo
17856885DEVICE, METHOD AND SYSTEM TO PROVIDE AN INTERCONNECT BETWEEN CHANNEL STRUCTURESJuly 2022February 2026Allow4421NoNo
17855387SILICON CARBIDE SEMICONDUCTOR DEVICEJune 2022December 2024Allow3000NoNo
17853886LIGHTING DEVICEJune 2022May 2024Allow2310NoNo
17847650GATE TRENCH POWER SEMICONDUCTOR DEVICES HAVING IMPROVED BREAKDOWN PERFORMANCE AND METHODS OF FORMING SUCH DEVICESJune 2022February 2026Allow4440NoYes
17845120GATE TRENCH POWER SEMICONDUCTOR DEVICES HAVING TRENCH SHIELDING PATTERNS FORMED DURING THE WELL IMPLANT AND RELATED METHODSJune 2022March 2026Allow4420NoYes
17751198Semiconductor Device and MethodMay 2022June 2024Allow2510NoNo
17745601SEMICONDUCTOR PACKAGE INCLUDING ELECTROMAGNETIC SHIELD STRUCTUREMay 2022April 2025Allow3510YesNo
17732709SEMICONDUCTOR PACKAGEApril 2022April 2025Allow3610YesNo
17725845IMAGE SENSING DEVICE INCLUDING THROUGH SILICON VIA (TSV) STRUCTUREApril 2022April 2025Allow3610NoNo
17724413Insulated Gate Bipolar Transistor, Power Module, and Living ApplianceApril 2022January 2025Allow3310YesNo
17721640SEMICONDUCTOR DEVICE AND DISPLAY DEVICEApril 2022November 2025Allow4330YesNo
17719323UNIT PIXEL FOR LED DISPLAY AND LED DISPLAY APPARATUS HAVING THE SAMEApril 2022May 2025Allow3820NoNo
17713201DISPLAY DEVICEApril 2022April 2025Allow3610NoNo
17708698LATERALLY DIFFUSED METAL-OXIDE SEMICONDUCTOR WITH GATE CONTACTMarch 2022February 2025Allow3520YesNo
17765387ARRAY SUBSTRATE AND DISPLAY DEVICEMarch 2022March 2025Allow3510NoNo
17707943DISPLAY DEVICEMarch 2022November 2025Allow4330NoNo
17703536DISPLAY DEVICEMarch 2022April 2025Allow3710NoNo
17760655OLED-WAVEGUIDE ASSEMBLY AND PRODUCTION METHOD THEREFORMarch 2022March 2025Allow3610NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner ERDEM, FAZLI.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
1
Examiner Affirmed
1
(100.0%)
Examiner Reversed
0
(0.0%)
Reversal Percentile
10.7%
Lower than average

What This Means

With a 0.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.

Strategic Value of Filing an Appeal

Total Appeal Filings
20
Allowed After Appeal Filing
8
(40.0%)
Not Allowed After Appeal Filing
12
(60.0%)
Filing Benefit Percentile
66.2%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 40.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.

Strategic Recommendations

Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner ERDEM, FAZLI - Prosecution Strategy Guide

Executive Summary

Examiner ERDEM, FAZLI works in Art Unit 2812 and has examined 366 patent applications in our dataset. With an allowance rate of 99.2%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 32 months.

Allowance Patterns

Examiner ERDEM, FAZLI's allowance rate of 99.2% places them in the 93% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by ERDEM, FAZLI receive 2.41 office actions before reaching final disposition. This places the examiner in the 69% percentile for office actions issued. This examiner issues a slightly above-average number of office actions.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by ERDEM, FAZLI is 32 months. This places the examiner in the 52% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a -0.9% benefit to allowance rate for applications examined by ERDEM, FAZLI. This interview benefit is in the 10% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 33.2% of applications are subsequently allowed. This success rate is in the 71% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 55.9% of cases where such amendments are filed. This entry rate is in the 82% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 183.3% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 92% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 95.2% of appeals filed. This is in the 85% percentile among all examiners. Of these withdrawals, 65.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.

Petition Practice

When applicants file petitions regarding this examiner's actions, 32.0% are granted (fully or in part). This grant rate is in the 19% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 8.7% of allowed cases (in the 92% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.6% of allowed cases (in the 56% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.
  • Request pre-appeal conferences: PACs are highly effective with this examiner. Before filing a full appeal brief, request a PAC to potentially resolve issues without full PTAB review.
  • Appeal filing as negotiation tool: This examiner frequently reconsiders rejections during the appeal process. Filing a Notice of Appeal may prompt favorable reconsideration during the mandatory appeal conference.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.