USPTO Examiner CORNELY JOHN PATRICK - Art Unit 2812

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18736793SEMICONDUCTOR DEVICE WITH ACTIVE PATTERN INCLUDING A TRANSITION PATTERN AND METHOD FOR FABRICATING THE SAMEJune 2024October 2025Allow1700NoNo
18441658METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE WITH SUBMOUNT INCLUDING GROOVE ON SURFACE OF SUBMOUNT HAVING HEAT DISSIPATION PORTIONFebruary 2024January 2025Allow1110NoNo
18348959SEMICONDUCTOR DEVICE WITH SOURCE AND DRAIN PADS LOCATED ON THE SAME SIDE OF A BLOCK WORD LINE AND CONNECTED TO A U-SHAPED CHANNEL LAYER LOCATED THEREINJuly 2023February 2026Allow3100NoNo
18214138IMAGING DEVICEJune 2023December 2025Allow2900NoNo
18121730Illumination apparatus comprising passive optical nanostructuresMarch 2023May 2025Allow2630NoNo
18117729METHOD AND APPARATUS FOR FILLING A GAPMarch 2023October 2025Allow3100NoNo
18041087PROCESSING TASK START METHOD AND DEVICE IN SEMICONDUCTOR PROCESSING APPARATUSFebruary 2023June 2025Allow2800NoNo
18077299ELECTROSTATIC DISCHARGE PROTECTION DEVICES WITH MULTIPLE-DEPTH TRENCH ISOLATIONDecember 2022August 2025Allow3310NoNo
17801721SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICEAugust 2022November 2025Abandon3910NoNo
17889350MANUFACTURING METHOD AND INSPECTION METHOD OF SEMICONDUCTOR DEVICE INCLUDING OBTAINING AN IMAGE OF THE DEVICE AND DETERMINING DEFECTS OF A METAL ELECTRODEAugust 2022October 2025Allow3810NoNo
17760302DISPLAY PANEL, DISPLAY DEVICE, AND MANUFACTURING METHOD OF DISPLAY PANEL INCLUDING ANODE LAYER COMPRISING ANODE AND CONNECTION PORTION WITH UNDERCUT STRUCTUREAugust 2022October 2025Allow3810NoNo
17807195SEMICONDUCTOR MEMORY DEVICE WITH WIRING LAYER HAVING DEFINED FIRST, SECOND AND PASSING WIRING GROUPSJune 2022August 2025Allow3810NoNo
17741659SUPERCONDUCTING DEVICE COMPRISING SOCKET INCLUDING MOVABLE PIN CONNECTED TO VIA HOLE FORMED IN BOARDMay 2022November 2025Abandon4220NoNo
17775392ARRAY PANEL, AND DISPLAY DEVICE HAVING TOUCH SIGNAL LINE, COMMON ELECTRODE AND PIXEL ELECTRODE SEQUENTLIALLY STACKED AND OVERLAPPING SUB-PIXEL OPENING AREA.May 2022March 2025Allow3510NoNo
17662467METHOD OF MANUFACTURING A SEMICONDUCTOR STRUCTURE COMPRISING FORMING AN INSULATING MATERIAL LAYER WITH GAPS THEREIN IN ISOLATION REGION AND MANUFACTURED SEMICONDUCTOR STRUCTUREMay 2022September 2025Allow4011NoNo
17732259TRANSISTOR WITH INCREASED CHANNEL WIDTH AND MANUFACTURING METHOD THEREOFApril 2022November 2025Abandon4221NoNo
17727487Memory Arrays Comprising Strings Of Memory Cells And Methods Used In Forming A Memory Array Comprising Strings Of Memory CellsApril 2022February 2025Allow3401NoNo
17699430SEMICONDUCTOR DEVICE AND METHODMarch 2022June 2025Allow3911NoNo
17699587THIN-FILM TRANSISTOR SUBSTRATE WITH IMPURITY CONCENTRATION PROFILE IN LAYERING DIRECTION HAVING PEAK OUTSIDE SEMICONDUCTOR LAYERMarch 2022July 2025Allow4011NoNo
17696395LIGHT EMITTING DISPLAY DEVICEMarch 2022March 2026Allow4830YesNo
17687854THIN FILM TRANSISTOR AND MANUFACTURING METHOD FOR THE SAMEMarch 2022April 2025Abandon3711NoNo
17681912Display Device WITH LED DISPOSED ON SUBSTRATE INCLUDING TRANSLUSENT BODY AND CONDUCTIVE WIRE LAYERFebruary 2022June 2025Abandon3920NoNo
17680331Light Sensing Panel and Light Sensing Display PanelFebruary 2022November 2025Abandon4530NoNo
17584391ELECTRONIC DEVICE WITH IMPROVED STRUCTURAL RELIABILITY INCLUDING ELECTRONIC COMPONENT AND DRIVING STRUCTURE COUPLED VIA CONDUCTOR LAYERJanuary 2022November 2024Abandon3440NoNo
17295062METAL GATE STRUCTURE AND MANUFACTURING METHOD THEREOFJanuary 2022April 2025Abandon4620NoNo
17574652Method for Manufacturing Contact Hole, Semiconductor Structure and Electronic EquipmentJanuary 2022August 2024Allow3100NoNo
17564740FULL-COLOR LED DISPLAY USING ULTRA-THIN LED ELEMENT AND METHOD FOR MANUFACTURING THEREOFDecember 2021November 2024Allow3411NoNo
17645513INFRARED DEVICE COMPRISING MESA PORTION INCLUDING THREE LATERAL SURFACES FORMING SPECIFICED ANGLES WITH SUBSTRATE FACEDecember 2021December 2024Allow3621YesNo
17551182LED MODULE AND DISPLAY DEVICE HAVING LED MODULEDecember 2021November 2024Abandon3510NoNo
17528544STRETCHABLE DISPLAY DEVICENovember 2021August 2025Allow4520NoNo
17515954INTEGRATED CIRCUIT DEVICE HAVING PARALLEL CONDUCTIVE LINES WITH BULGING END PORTION(S) AND METHOD OF MANUFACTURING THE SAMENovember 2021February 2024Allow2721YesNo
17606525DISPLAY SUBSTRATE AND DISPLAY PANEL WITH LIGHT EMITTING DEVICE ELECTRODE HAVING AN INCLINED SURFACEOctober 2021December 2025Allow5040NoNo
17506432LIGHT EMITTING ELEMENT AND DISPLAY DEVICE INCLUDING A PLURALITY OF LIGHT EMITTING LAYERSOctober 2021December 2025Allow4960YesNo
17449796INTEGRATION PROCESS FOR FABRICATING EMBEDDED MEMORYOctober 2021August 2025Allow4611NoNo
17486775DISPLAY WITH OVERLAPPING SIGNAL LINES ON DIFFERENT LAYERS AND SHIELDING LAYER THEREBETWEENSeptember 2021September 2024Allow3610NoNo
17485304COLOR CONVERSION SUBSTRATE WITH ANTI-COLOR-INTERFERENCE PATTERN, MANUFACTURING METHOD THEREOF AND DISPLAY PANELSeptember 2021March 2026Abandon5340YesNo
17598232DISPLAY ASSEMBLY AND DISPLAY DEVICE EACH INCLUDING FLEXIBLE CIRCUIT BOARD WITH REINFORCEMENT PLATE HAVING WAVE SHAPED EDGESeptember 2021September 2024Allow3610NoNo
17483675ORGANIC LIGHT-EMITTING DIODE INCLUDING CHARGE GENERATION LAYER HAVING METAL INTERLAYER WITH SPECIFIED WORK FUNCTION AND DISPLAY APPARATUS INCLUDING THE SAMESeptember 2021September 2025Allow4830NoNo
17482830GLASS PATCH INTEGRATION INTO AN ELECTRONIC DEVICE PACKAGESeptember 2021March 2026Abandon5321NoNo
17476772MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE INCLUDING COMPLEMENTARY FIRST AND SECOND MASK PATTERNSSeptember 2021September 2024Allow3610NoNo
17438395DISPLAY APPARATUS HAVING FLEXIBLE PANEL AND SHIELDED MULTIPLEXER IN NON-DISPLAY SUB-REGION AND METHOD FOR MANUFACTURING THE SAMESeptember 2021May 2025Allow4430NoNo
17472577METAL INTERCONNECT STRUCTURE HAVING SERPENT METAL LINESeptember 2021March 2025Allow4260YesNo
17432908Controlled Wetting in the Manufacture of Electronic ComponentsAugust 2021January 2025Allow4130YesNo
17408025GALLIUM NITRIDE (GAN) LAYER TRANSFER AND REGROWTH FOR INTEGRATED CIRCUIT TECHNOLOGYAugust 2021November 2025Abandon5121NoNo
17405606SEMICONDUCTOR DEVICE WITH ACTIVE PATTERN INCLUDING A TRANSITION PATTERN AND METHOD FOR FABRICATING THE SAMEAugust 2021March 2024Allow3121YesNo
17427107Display Panel Having Touch Electrode Leads Arranged between Substrate and Dam Structure and Preparation Method therefor, and Display ApparatusJuly 2021July 2024Allow3620NoNo
17375352PELLICLE FOR EUV LITHOGRAPHY AND METHOD OF MANUFACTURING THE SAMEJuly 2021September 2024Abandon3811NoNo
17368567SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICEJuly 2021January 2025Allow4321YesNo
17353262VAPOR DEPOSITION OF FILMS COMPRISING MOLYBDENUMJune 2021February 2025Allow4430YesNo
17353719ELECTRONIC DEVICE INCLUDING A PROTECTION LAYERJune 2021June 2024Allow3621NoNo
17352003SEMICONDUCTOR MEMORY DEVICE HAVING FIRST NET-SHAPED SOURCE PATTERN, SECOND SOURCE PATTERN AND PAD PATTERN THEREBETWEENJune 2021September 2025Allow5121NoNo
17352009DISPLAY PANEL INCLUDING SIGNAL PADS WITH VARYING DIMENSIONSJune 2021January 2026Allow5551YesNo
17350760MEMORY DEVICE INCLUDING MEMORY BLOCKS DIFFERENT FROM EACH OTHERJune 2021August 2025Allow5020YesNo
17349896FILLER CELLS FOR INTEGRATED CIRCUIT DESIGNJune 2021May 2024Allow3511YesNo
17346344SEMICONDUCTOR MEMORY DEVICE HAVING STACK OF POLYCRYSTALLINE SEMICONDUCTOR LAYERS WITH DIVERSE AVERAGE CRYSTAL GRAIN SIZESJune 2021March 2024Allow3321YesNo
17324964AI SYSTEM ON CHIP (SOC) FOR ROBOTICS VISION APPLICATIONSMay 2021October 2024Allow4120NoNo
17280912DISPLAY PANEL WITH TRANSISTOR DISPOSED IN REGION CORRESPONDING TO DATA LINEMarch 2021April 2025Allow4940NoNo
17204380HIGHLY INTEGRATED MEMORY AND PERIPHERAL CIRCUITS DEVICES HAVING DISH-SHAPED DUMMY MOLD STRUCTURES THEREINMarch 2021December 2024Abandon4520YesNo
17276060ELECTROLUMINESCENT DEVICES HAVING SENSITIZER AND FLUORESCENT EMITTERMarch 2021June 2025Allow5140YesNo
17274519SOLID-STATE IMAGING DEVICE AND ELECTRONIC APPARATUSMarch 2021June 2024Allow3930NoNo
17169230SEMICONDUCTOR DEVICE INCLUDING AN EXPOSED SOLDERABLE ELEMENTFebruary 2021July 2024Allow4130NoNo
17262723OLED DISPLAY PANEL WITH LIGHT EMITTING LAYER BROKEN AT UNDERCUT STRUCTURE, AND PREPARATION METHOD THEREOFJanuary 2021June 2025Abandon5240NoNo
17127382SHIELD STRUCTURES IN MICROELECTRONIC ASSEMBLIES HAVING DIRECT BONDINGDecember 2020March 2026Abandon6050YesNo
17124352MICROELECTRONIC STRUCTURES INCLUDING GLASS CORESDecember 2020February 2025Allow5021YesNo
17033655SELECTIVE USE OF DIFFERENT ADVANCED INTERFACE BUS WITH ELECTRONIC CHIPSSeptember 2020March 2025Allow5431YesNo
16979677Optoelectronic Semiconductor Device and Method for Producing an Optoelectronic Semiconductor DeviceSeptember 2020January 2025Abandon5240YesNo

Appeals Overview

No appeal data available for this record. This may indicate that no appeals have been filed or decided for applications in this dataset.

Examiner CORNELY, JOHN PATRICK - Prosecution Strategy Guide

Executive Summary

Examiner CORNELY, JOHN PATRICK works in Art Unit 2812 and has examined 41 patent applications in our dataset. With an allowance rate of 75.6%, this examiner has a below-average tendency to allow applications. Applications typically reach final disposition in approximately 44 months.

Allowance Patterns

Examiner CORNELY, JOHN PATRICK's allowance rate of 75.6% places them in the 41% percentile among all USPTO examiners. This examiner has a below-average tendency to allow applications.

Office Action Patterns

On average, applications examined by CORNELY, JOHN PATRICK receive 2.61 office actions before reaching final disposition. This places the examiner in the 76% percentile for office actions issued. This examiner issues more office actions than most examiners, which may indicate thorough examination or difficulty in reaching agreement with applicants.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by CORNELY, JOHN PATRICK is 44 months. This places the examiner in the 15% percentile for prosecution speed. Applications take longer to reach final disposition with this examiner compared to most others.

Interview Effectiveness

Conducting an examiner interview provides a +6.2% benefit to allowance rate for applications examined by CORNELY, JOHN PATRICK. This interview benefit is in the 33% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 30.3% of applications are subsequently allowed. This success rate is in the 60% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 26.1% of cases where such amendments are filed. This entry rate is in the 36% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.

Petition Practice

When applicants file petitions regarding this examiner's actions, 0.0% are granted (fully or in part). This grant rate is in the 4% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 23% percentile). This examiner rarely makes examiner's amendments compared to other examiners. You should expect to make all necessary claim amendments yourself through formal amendment practice.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.0% of allowed cases (in the 30% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Expect multiple rounds of prosecution: This examiner issues more office actions than average. Address potential issues proactively in your initial response and consider requesting an interview early in prosecution.
  • Plan for extended prosecution: Applications take longer than average with this examiner. Factor this into your continuation strategy and client communications.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.