USPTO Examiner BOOTH RICHARD A - Art Unit 2812

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18651840IMAGE SENSOR PACKAGEMay 2024May 2025Allow1310NoNo
18643632FIN SMOOTHING AND INTEGRATED CIRCUIT STRUCTURES RESULTING THEREFROMApril 2024November 2024Allow600NoNo
18611108MICRO LED BASED DISPLAY PANELMarch 2024February 2025Allow1100NoNo
18586735METAL OXIDE INTERLAYER STRUCTURE FOR NFET AND PFETFebruary 2024January 2025Allow1110NoNo
18432546SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICEFebruary 2024April 2025Allow1401NoNo
18426288VERTICAL BLUE LIGHT EMITTING DIODE AND METHOD FOR MANUFACTURING SAMEJanuary 2024August 2024Allow700NoNo
18406385SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMEJanuary 2024November 2024Allow1010NoNo
18402595CAPACITOR ARCHITECTURES IN SEMICONDUCTOR DEVICESJanuary 2024March 2025Allow1400NoNo
18398053SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICEDecember 2023September 2024Allow900NoNo
18396042SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOFDecember 2023January 2025Allow1310NoNo
18533574Array of Memory Cells, Methods Used in Forming an Array of Memory Cells, Methods Used in Forming an Array of Vertical Transistors, and Methods Used in Forming an Array of CapacitorsDecember 2023January 2025Allow1421YesNo
18526516METHOD FOR MANUFACTURING A GRIDDecember 2023October 2024Allow1110NoNo
18510787CAPACITANCE STRUCTURENovember 2023May 2025Allow1821NoNo
18386649FeRAM with Laminated Ferroelectric Film and Method Forming SameNovember 2023February 2025Allow1521NoNo
18484144SEMICONDUCTOR DEVICE INCLUDING FERROELECTRIC LAYER AND METAL PARTICLES EMBEDDED IN METAL-ORGANIC FRAMEWORK LAYEROctober 2023April 2024Allow700NoNo
18476852MEMORY DEVICESeptember 2023July 2024Allow1010NoNo
18371956METHOD OF FABRICATING SUPER-JUNCTION BASED VERTICAL GALLIUM NITRIDE JFET AND MOSFET POWER DEVICESSeptember 2023April 2024Allow700NoNo
18450499NON-LEAD BASED HIGH DENSITY MEMORY DEVICESAugust 2023November 2024Allow1511NoNo
18449298METHOD FOR FABRICATING A STRAINED SEMICONDUCTOR-ON-INSULATOR SUBSTRATEAugust 2023November 2024Allow1510NoNo
18233331SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMEAugust 2023June 2024Allow1010NoNo
18447495SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTUREAugust 2023February 2024Allow700NoNo
18232518SYSTEMS AND METHODS OF TESTING MEMORY DEVICESAugust 2023February 2024Allow700NoNo
18357153FERROELECTRIC MEMORY DEVICEJuly 2023November 2024Allow1611NoNo
183539543D FERROELECTRIC MEMORYJuly 2023January 2025Allow1810NoNo
18214584FERROELECTRIC RANDOM ACCESS MEMORY (FRAM) CAPACITORS AND METHODS OF CONSTRUCTIONJune 2023January 2024Allow700NoNo
18213120METHODS FOR MAKING RADIO FREQUENCY (RF) SEMICONDUCTOR DEVICES INCLUDING A GROUND PLANE LAYER HAVING A SUPERLATTICEJune 2023February 2024Allow810YesNo
18210155INTEGRATED CIRCUIT INCLUDING A CAPACITIVE ELEMENT AND CORRESPONDING MANUFACTURING METHODJune 2023March 2024Allow900NoNo
18332080MEMORY WINDOW OF MFM MOSFET FOR SMALL CELL SIZEJune 2023April 2024Allow1110NoNo
18328660SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEJune 2023December 2023Allow700NoNo
18039668SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING A SUBSTRATE FOR A SEMICONDUCTOR COMPONENT, AND USE OF INDIUM DURING PRODUCTION OF SAMEMay 2023February 2024Allow810NoNo
18324245SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAMEMay 2023May 2024Allow1110NoNo
18321487COMPACT EEPROM MEMORY CELL WITH A GATE DIELECTRIC LAYER HAVING TWO DIFFERENT THICKNESSESMay 2023March 2024Allow1010NoNo
18143549FIN SMOOTHING AND INTEGRATED CIRCUIT STRUCTURES RESULTING THEREFROMMay 2023February 2024Allow1010NoNo
18142476UNIT CELL OF DISPLAY PANEL INCLUDING INTEGRATED TFT PHOTODETECTORMay 2023April 2024Allow1110NoNo
18133693SEMICONDUCTOR DEVICE INCLUDING NONVOLATILE MEMORY DEVICE AND LOGIC DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE INCLUDING NONVOLATILE MEMORY DEVICE AND LOGIC DEVICEApril 2023March 2024Allow1110NoNo
18297659MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE AND FLASH MEMORYApril 2023October 2023Allow700NoNo
18295743CONCEPT FOR SILICON CARBIDE POWER DEVICESApril 2023March 2024Allow1110NoNo
18181922B-SITE DOPED PEROVSKITE LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAMEMarch 2023August 2023Allow610NoNo
18181426MANGANESE-DOPED PEROVSKITE LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAMEMarch 2023September 2023Allow710NoNo
18181525B-SITE DOPED PEROVSKITE LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAMEMarch 2023August 2023Allow500NoNo
18178527METHOD OF MANUFACTURING MEMORY DEVICE AND PATTERNING METHODMarch 2023February 2024Allow1100NoNo
18116736WAFER DICING USING FEMTOSECOND-BASED LASER AND PLASMA ETCHMarch 2023June 2024Allow1620NoNo
18175137Metal Oxide Interlayer Structure for NFET and PFETFebruary 2023October 2023Allow800NoNo
18168956SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAMEFebruary 2023June 2025Allow2800NoNo
18108519NONVOLATILE STORAGE ELEMENT AND ANALOG CIRCUIT PROVIDED WITH SAMEFebruary 2023February 2024Allow1310NoNo
18167011Diamond Semiconductor System And MethodFebruary 2023October 2023Allow800NoNo
18107917SOLAR CELL HAVING AN EMITTER REGION WITH WIDE BANDGAP SEMICONDUCTOR MATERIALFebruary 2023February 2024Allow1210NoNo
18101120Transistors and Memory ArraysJanuary 2023January 2025Allow2430YesNo
18016681Light Emitting Device and Light Emitting ApparatusJanuary 2023May 2025Allow2800NoNo
18152868METHOD FOR MAKING ACTIVE AREA AIR GAPJanuary 2023May 2025Allow2800NoNo
18094377Memory Cells and Integrated Assemblies having Charge-Trapping-Material with Trap-Enhancing-AdditiveJanuary 2023February 2024Allow1310NoNo
18004660METHOD FOR CONSTRUCTING MAGNETIC TUNNELING JUNCTION DEVICES AND USE OF DEVICE FOR SPIN-DEPENDENT TRANSPORT CHARACTERIZATIONJanuary 2023May 2025Allow2800YesNo
18150770SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICEJanuary 2023October 2023Allow900NoNo
18093428THERMAL CONTROL FOR FORMATION AND PROCESSING OF ALUMINUM NITRIDEJanuary 2023November 2023Allow1010NoNo
18088370METHOD OF FABRICATING SEMICONDUCTOR DEVICEDecember 2022May 2025Allow2800NoNo
18085985METHOD OF FABRICATING SUPER-JUNCTION BASED VERTICAL GALLIUM NITRIDE JFET AND MOSFET POWER DEVICESDecember 2022June 2023Allow600NoNo
18085756SEMICONDUCTOR DEVICE HAVING A MAIN TRANSISTOR, A SENSE TRANSISTOR, AND A BYPASS DIODE STRUCTUREDecember 2022September 2023Allow910NoNo
18068438DOPED POLAR LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAMEDecember 2022November 2023Allow1110YesNo
18067633DOPED POLAR LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAMEDecember 2022November 2023Allow1110NoNo
18067653DOPED POLAR LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAMEDecember 2022September 2023Allow910NoNo
18063909METHOD OF FORMING TRANSITION METAL DICHALCOGENIDE THIN FILMDecember 2022August 2023Allow910NoNo
18063938SEMICONDUCTOR DEVICE INCLUDING FERROELECTRIC LAYERDecember 2022June 2025Allow3001NoNo
18076888Array Of Memory CellsDecember 2022September 2023Allow900NoNo
17990206Vertical FinFet Formation Using Directional DepositionNovember 2022April 2025Allow2901NoNo
18054269MEMORY DEVICENovember 2022April 2025Allow2900NoNo
17998159CAPACITOR AND INDUCTOR EMBEDDED STRUCTURE AND MANUFACTURING METHOD THEREFOR, AND SUBSTRATENovember 2022April 2025Allow2900NoNo
17981499SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMENovember 2022June 2023Allow700NoNo
17969180SEMICONDUCTOR DEVICE HAVING FULLY OXIDIZED GATE OXIDE LAYER AND METHOD FOR MAKING THE SAMEOctober 2022January 2024Allow1510NoNo
18045417METHODS OF FORMING MICROELECTRONIC DEVICESOctober 2022May 2023Allow700NoNo
17961635SEMICONDUCTOR DEVICE INCLUDING CONTACT PLUGOctober 2022March 2025Allow2900NoNo
17947665JUNCTION BARRIER SCHOTTKY DIODE DEVICE AND METHOD FOR FABRICATING THE SAMESeptember 2022August 2023Allow1010NoNo
17898574SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMEAugust 2022October 2023Allow1300NoNo
17822905GRAPHENE TRANSISTORAugust 2022June 2025Abandon3411NoNo
17894242FLOATING GATE MEMRISTOR DEVICE AND NEUROMORPHIC DEVICE HAVING THE SAMEAugust 2022April 2023Allow800NoNo
17893594GALLIUM NITRIDE-BASED COMPOUND SEMICONDUCTOR DEVICEAugust 2022February 2025Allow3000NoNo
17891918SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMEAugust 2022April 2025Allow3201NoNo
17888511MANUFACTURING METHOD OF SEMICONDUCTOR MEMORY DEVICEAugust 2022June 2023Allow1010NoNo
17819601DOPED POLAR LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAMEAugust 2022April 2023Allow800NoNo
17818649FeRAM with Laminated Ferroelectric Film and Method Forming SameAugust 2022August 2023Allow1210NoNo
17881707THREE-DIMENSIONAL SEMICONDUCTOR DEVICESAugust 2022October 2023Allow1400NoNo
17875253SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICEJuly 2022November 2023Allow1510NoNo
17872534STACK CAPACITOR, A FLASH MEMORY DEVICE AND A MANUFACTURING METHOD THEREOFJuly 2022April 2023Allow910NoNo
17872838NONVOLATILE MEMORY DEVICE INCLUDING FERROELECTRIC LAYER HAVING NEGATIVE CAPACITANCEJuly 2022July 2023Allow1110NoNo
17869824FERROELECTRIC MEMORY DEVICE AND METHOD OF FORMING THE SAMEJuly 2022December 2023Allow1600NoNo
17814175Gate Structure and Method of Forming the SameJuly 2022January 2024Allow1801NoNo
17867678METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE AND CAPABLE OF CONTROLLING THICKNESSES OF OXIDE LAYERSJuly 2022March 2023Allow800NoNo
17863367FLASH AND FABRICATING METHOD OF THE SAMEJuly 2022April 2023Allow910NoNo
17861236SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTUREJuly 2022February 2025Allow3101NoNo
17859274SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOFJuly 2022November 2024Allow2810NoNo
178547013D FERROELECTRIC MEMORYJune 2022May 2023Allow1000NoNo
17809727SEMICONDUCTOR DEVICESJune 2022April 2024Allow2100NoNo
17853290CAPACITOR INCLUDING PEROVSKITE MATERIAL, SEMICONDUCTOR DEVICE INCLUDING THE CAPACITOR, AND METHOD OF MANUFACTURING THE CAPACITORJune 2022April 2023Allow1010NoNo
17851836CAPACITOR INCLUDING PEROVSKITE MATERIAL, SEMICONDUCTOR DEVICE INCLUDING THE CAPACITOR, AND METHOD OF MANUFACTURING THE CAPACITORJune 2022April 2023Allow1010NoNo
17851284PRESSURE SENSORS ON FLEXIBLE SUBSTRATES FOR STRESS DECOUPLINGJune 2022April 2025Allow3401YesNo
17850087METHOD OF MANUFACTURING METAL-INSULATOR-METAL (MIM) CAPACITORS WITH NOBLE METAL ELECTRODE LINERSJune 2022April 2025Allow3311NoNo
17789301DISPLAY PANEL, DISPLAY DEVICE AND TERMINAL DEVICEJune 2022October 2024Allow2800NoNo
17845113SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOFJune 2022June 2024Allow2401NoNo
17843236FERROELECTRIC RANDOM ACCESS MEMORY DEVICE WITH SEED LAYERJune 2022April 2024Allow2210NoNo
17840250Integrated Assemblies and Methods of Forming Integrated AssembliesJune 2022February 2023Allow800NoNo
17838285CAPACITOR STRUCTURES FOR MEMORY AND METHOD OF MANUFACTURING THE SAMEJune 2022February 2023Allow800NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner BOOTH, RICHARD A.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
13
Examiner Affirmed
11
(84.6%)
Examiner Reversed
2
(15.4%)
Reversal Percentile
25.7%
Lower than average

What This Means

With a 15.4% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.

Strategic Value of Filing an Appeal

Total Appeal Filings
84
Allowed After Appeal Filing
32
(38.1%)
Not Allowed After Appeal Filing
52
(61.9%)
Filing Benefit Percentile
60.3%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 38.1% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.

Strategic Recommendations

Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner BOOTH, RICHARD A - Prosecution Strategy Guide

Executive Summary

Examiner BOOTH, RICHARD A works in Art Unit 2812 and has examined 2,063 patent applications in our dataset. With an allowance rate of 88.8%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 20 months.

Allowance Patterns

Examiner BOOTH, RICHARD A's allowance rate of 88.8% places them in the 67% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by BOOTH, RICHARD A receive 1.08 office actions before reaching final disposition. This places the examiner in the 15% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by BOOTH, RICHARD A is 20 months. This places the examiner in the 89% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +2.2% benefit to allowance rate for applications examined by BOOTH, RICHARD A. This interview benefit is in the 19% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 31.7% of applications are subsequently allowed. This success rate is in the 58% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 42.2% of cases where such amendments are filed. This entry rate is in the 57% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 107.1% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 77% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 80.9% of appeals filed. This is in the 71% percentile among all examiners. Of these withdrawals, 54.5% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.

Petition Practice

When applicants file petitions regarding this examiner's actions, 36.1% are granted (fully or in part). This grant rate is in the 31% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 6.9% of allowed cases (in the 93% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.5% of allowed cases (in the 50% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Request pre-appeal conferences: PACs are highly effective with this examiner. Before filing a full appeal brief, request a PAC to potentially resolve issues without full PTAB review.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.