USPTO Examiner BOOTH RICHARD A - Art Unit 2812

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18651840IMAGE SENSOR PACKAGEMay 2024May 2025Allow1310NoNo
18643632FIN SMOOTHING AND INTEGRATED CIRCUIT STRUCTURES RESULTING THEREFROMApril 2024November 2024Allow600NoNo
18619772DOPED POLAR LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAMEMarch 2024August 2025Allow1710YesNo
18611108MICRO LED BASED DISPLAY PANELMarch 2024February 2025Allow1100NoNo
18598184SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICEMarch 2024July 2025Allow1710NoNo
18586735METAL OXIDE INTERLAYER STRUCTURE FOR NFET AND PFETFebruary 2024January 2025Allow1110NoNo
18432546SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICEFebruary 2024April 2025Allow1401NoNo
18426288VERTICAL BLUE LIGHT EMITTING DIODE AND METHOD FOR MANUFACTURING SAMEJanuary 2024August 2024Allow700NoNo
18418976Diamond Semiconductor System And MethodJanuary 2024January 2026Abandon2421NoNo
18406385SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMEJanuary 2024November 2024Allow1010NoNo
18402595CAPACITOR ARCHITECTURES IN SEMICONDUCTOR DEVICESJanuary 2024March 2025Allow1400NoNo
18398053SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICEDecember 2023September 2024Allow900NoNo
18396042SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOFDecember 2023January 2025Allow1310NoNo
18536511IMAGE ACQUISITION DEVICEDecember 2023February 2026Allow2700NoNo
18533574Array of Memory Cells, Methods Used in Forming an Array of Memory Cells, Methods Used in Forming an Array of Vertical Transistors, and Methods Used in Forming an Array of CapacitorsDecember 2023January 2025Allow1421YesNo
18526516METHOD FOR MANUFACTURING A GRIDDecember 2023October 2024Allow1110NoNo
18526454SEMICONDUCTOR DEVICEDecember 2023November 2025Allow2421NoNo
18510787CAPACITANCE STRUCTURENovember 2023May 2025Allow1821NoNo
18386649FeRAM with Laminated Ferroelectric Film and Method Forming SameNovember 2023February 2025Allow1521NoNo
18288288DISPLAY DEVICE AND METHOD FOR MANUFACTURING DISPLAY DEVICEOctober 2023February 2026Allow2800NoNo
18484144SEMICONDUCTOR DEVICE INCLUDING FERROELECTRIC LAYER AND METAL PARTICLES EMBEDDED IN METAL-ORGANIC FRAMEWORK LAYEROctober 2023April 2024Allow700NoNo
18476852MEMORY DEVICESeptember 2023July 2024Allow1010NoNo
18474080MICROELECTRONIC DEVICES, MEMORY DEVICES, AND 3D NAND FLASH MEMORY DEVICESSeptember 2023July 2025Allow2110NoNo
18371956METHOD OF FABRICATING SUPER-JUNCTION BASED VERTICAL GALLIUM NITRIDE JFET AND MOSFET POWER DEVICESSeptember 2023April 2024Allow700NoNo
18468159DISPLAY DEVICESeptember 2023November 2025Allow2600NoNo
18549426ELECTRODEPOSITION OF METALS USING AN IONICALLY RESISTIVE IONICALLY PERMEABLE ELEMENT OR A SHIELD SPATIALLY TAILORED TO DIE-LEVEL PATTERNS ON A SUBSTRATESeptember 2023March 2026Allow3010NoNo
18548652LIGHT DETECTION ELEMENTSeptember 2023February 2026Allow3010YesNo
18241730System and Method for Direct Patterning Using a Compensated Shadow MaskSeptember 2023March 2026Allow3010NoNo
18450499NON-LEAD BASED HIGH DENSITY MEMORY DEVICESAugust 2023November 2024Allow1511NoNo
18449298METHOD FOR FABRICATING A STRAINED SEMICONDUCTOR-ON-INSULATOR SUBSTRATEAugust 2023November 2024Allow1510NoNo
18233331SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMEAugust 2023June 2024Allow1010NoNo
18232518SYSTEMS AND METHODS OF TESTING MEMORY DEVICESAugust 2023February 2024Allow700NoNo
18447495SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTUREAugust 2023February 2024Allow700NoNo
18357153FERROELECTRIC MEMORY DEVICEJuly 2023November 2024Allow1611NoNo
183539543D FERROELECTRIC MEMORYJuly 2023January 2025Allow1810NoNo
18352532HIGH DENSITY CAPACITOR AND METHODS OF FORMING THE SAMEJuly 2023February 2026Allow3101NoNo
18350754SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMEJuly 2023March 2026Allow3200NoNo
18214584FERROELECTRIC RANDOM ACCESS MEMORY (FRAM) CAPACITORS AND METHODS OF CONSTRUCTIONJune 2023January 2024Allow700NoNo
18213120METHODS FOR MAKING RADIO FREQUENCY (RF) SEMICONDUCTOR DEVICES INCLUDING A GROUND PLANE LAYER HAVING A SUPERLATTICEJune 2023February 2024Allow810YesNo
18337232SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICEJune 2023November 2025Allow2901NoNo
18210155INTEGRATED CIRCUIT INCLUDING A CAPACITIVE ELEMENT AND CORRESPONDING MANUFACTURING METHODJune 2023March 2024Allow900NoNo
18208687THREE-DIMENSIONAL MEMORY DEVICES AND METHODS FOR FORMING THE SAMEJune 2023February 2026Allow3201NoNo
18332080MEMORY WINDOW OF MFM MOSFET FOR SMALL CELL SIZEJune 2023April 2024Allow1110NoNo
18328660SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEJune 2023December 2023Allow700NoNo
18327143METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTUREJune 2023February 2026Allow3201NoNo
18204397SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAMEJune 2023February 2026Allow3201NoNo
18039668SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING A SUBSTRATE FOR A SEMICONDUCTOR COMPONENT, AND USE OF INDIUM DURING PRODUCTION OF SAMEMay 2023February 2024Allow810NoNo
18324245SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAMEMay 2023May 2024Allow1110NoNo
18323999SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SEMICONDUCTOR DEVICEMay 2023February 2026Allow3300NoNo
18321487COMPACT EEPROM MEMORY CELL WITH A GATE DIELECTRIC LAYER HAVING TWO DIFFERENT THICKNESSESMay 2023March 2024Allow1010NoNo
18195689FERROELECTRIC TUNNEL JUNCTION STRUCTURE WITH L-SHAPED SPACERSMay 2023December 2025Allow3111NoNo
18144885SEMICONDUCTOR DEVICEMay 2023July 2025Allow2600NoNo
18143549FIN SMOOTHING AND INTEGRATED CIRCUIT STRUCTURES RESULTING THEREFROMMay 2023February 2024Allow1010NoNo
18311894WAFER STACKING METHODMay 2023January 2026Allow3211NoNo
18142476UNIT CELL OF DISPLAY PANEL INCLUDING INTEGRATED TFT PHOTODETECTORMay 2023April 2024Allow1110NoNo
18307206BACK-END-OF-LINE CMOS INVERTER HAVING REDUCED SIZE AND REDUCED SHORT-CHANNEL EFFECTS AND METHODS OF FORMING THE SAMEApril 2023July 2025Allow2600NoNo
18137188TEXTURED COBALT ALUMINUM/MAGNESIUM-ALUMINUM-OXIDE PEDESTAL FOR MEMORY DEVICESApril 2023July 2025Allow2700NoNo
18133693SEMICONDUCTOR DEVICE INCLUDING NONVOLATILE MEMORY DEVICE AND LOGIC DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE INCLUDING NONVOLATILE MEMORY DEVICE AND LOGIC DEVICEApril 2023March 2024Allow1110NoNo
18299119SUSCEPTOR TRANSFER FOR PROCESS CHAMBERApril 2023November 2025Allow3110YesNo
18031421SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICEApril 2023December 2025Allow3210NoNo
18297659MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE AND FLASH MEMORYApril 2023October 2023Allow700NoNo
18030549METHOD FOR MANUFACTURING WAFER HAVING FUNCTIONAL FILMApril 2023October 2025Allow3110NoNo
18030334FERROELECTRIC DEVICE AND SEMICONDUCTOR DEVICEApril 2023July 2025Allow2700NoNo
18295743CONCEPT FOR SILICON CARBIDE POWER DEVICESApril 2023March 2024Allow1110NoNo
18295331SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREFORApril 2023February 2026Allow3511NoNo
18183469SEMICONDUCTOR DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAMEMarch 2023November 2025Allow3200NoNo
18183571METHOD OF MANUFACTURING SEMICONDUCTOR DEVICEMarch 2023September 2025Allow3010YesNo
18183534METHOD OF MANUFACTURING STRUCTURE AND METHOD OF MANUFACTURING CAPACITORMarch 2023November 2025Allow3221NoNo
18181922B-SITE DOPED PEROVSKITE LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAMEMarch 2023August 2023Allow610NoNo
18181426MANGANESE-DOPED PEROVSKITE LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAMEMarch 2023September 2023Allow710NoNo
18181525B-SITE DOPED PEROVSKITE LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAMEMarch 2023August 2023Allow500NoNo
18117478SPLIT-GATE NON-VOLATILE MEMORY DEVICE AND FABRICATION METHOD THEREOFMarch 2023December 2025Abandon3310NoNo
18178527METHOD OF MANUFACTURING MEMORY DEVICE AND PATTERNING METHODMarch 2023February 2024Allow1100NoNo
18116736WAFER DICING USING FEMTOSECOND-BASED LASER AND PLASMA ETCHMarch 2023June 2024Allow1620NoNo
18176238NOR-TYPE MEMORY DEVICE, METHOD OF MANUFACTURING NOR-TYPE MEMORY DEVICE, AND ELECTRONIC APPARATUS INCLUDING MEMORY DEVICEFebruary 2023February 2026Allow3611NoNo
18023618SEMICONDUCTOR DEVICE, CAPACITOR, AND MANUFACTURING METHOD THEREOFFebruary 2023September 2025Allow3110NoNo
18175137Metal Oxide Interlayer Structure for NFET and PFETFebruary 2023October 2023Allow800NoNo
18175445SEMICONDUCTOR MEMORY DEVICEFebruary 2023November 2025Allow3300NoNo
18022304SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOFFebruary 2023October 2025Allow3210YesNo
18111427THREE-DIMENSIONAL INTEGRATED CIRCUITFebruary 2023November 2025Allow3310NoNo
18168956SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAMEFebruary 2023June 2025Allow2800NoNo
18168068CAPACITOR AND ELECTRONIC DEVICE INCLUDING THE SAMEFebruary 2023September 2025Allow3110YesNo
18168513SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTUREFebruary 2023November 2025Allow3301NoNo
18108519NONVOLATILE STORAGE ELEMENT AND ANALOG CIRCUIT PROVIDED WITH SAMEFebruary 2023February 2024Allow1310NoNo
18167011Diamond Semiconductor System And MethodFebruary 2023October 2023Allow800NoNo
18107917SOLAR CELL HAVING AN EMITTER REGION WITH WIDE BANDGAP SEMICONDUCTOR MATERIALFebruary 2023February 2024Allow1210NoNo
18164600SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAMEFebruary 2023July 2025Allow3011NoNo
18164399SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAMEFebruary 2023November 2025Allow3310NoNo
18101120Transistors and Memory ArraysJanuary 2023January 2025Allow2430YesNo
18099302SEMICONDUCTOR DEVICE INCLUDING GATE STRUCTUREJanuary 2023January 2026Allow3601YesNo
18016681Light Emitting Device and Light Emitting ApparatusJanuary 2023May 2025Allow2800NoNo
18152868METHOD FOR MAKING ACTIVE AREA AIR GAPJanuary 2023May 2025Allow2800NoNo
18152779METHOD FOR FABRICATING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTUREJanuary 2023September 2025Allow3201NoNo
18152151FERROELECTRIC MEMORY DEVICE AND SEMICONDUCTOR DIEJanuary 2023January 2026Allow3611NoNo
18152751MEMORY DEVICE AND METHOD OF FORMING THE SAMEJanuary 2023July 2025Allow3001NoNo
18094377Memory Cells and Integrated Assemblies having Charge-Trapping-Material with Trap-Enhancing-AdditiveJanuary 2023February 2024Allow1310NoNo
18004660METHOD FOR CONSTRUCTING MAGNETIC TUNNELING JUNCTION DEVICES AND USE OF DEVICE FOR SPIN-DEPENDENT TRANSPORT CHARACTERIZATIONJanuary 2023May 2025Allow2800YesNo
18093428THERMAL CONTROL FOR FORMATION AND PROCESSING OF ALUMINUM NITRIDEJanuary 2023November 2023Allow1010NoNo
18150245SEMICONDUCTOR STRUCTUREJanuary 2023July 2025Allow3100NoNo
18150770SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICEJanuary 2023October 2023Allow900NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner BOOTH, RICHARD A.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
13
Examiner Affirmed
11
(84.6%)
Examiner Reversed
2
(15.4%)
Reversal Percentile
27.2%
Lower than average

What This Means

With a 15.4% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.

Strategic Value of Filing an Appeal

Total Appeal Filings
90
Allowed After Appeal Filing
35
(38.9%)
Not Allowed After Appeal Filing
55
(61.1%)
Filing Benefit Percentile
64.1%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 38.9% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.

Strategic Recommendations

Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner BOOTH, RICHARD A - Prosecution Strategy Guide

Executive Summary

Examiner BOOTH, RICHARD A works in Art Unit 2812 and has examined 2,032 patent applications in our dataset. With an allowance rate of 88.1%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 20 months.

Allowance Patterns

Examiner BOOTH, RICHARD A's allowance rate of 88.1% places them in the 68% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by BOOTH, RICHARD A receive 1.11 office actions before reaching final disposition. This places the examiner in the 12% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by BOOTH, RICHARD A is 20 months. This places the examiner in the 93% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +2.4% benefit to allowance rate for applications examined by BOOTH, RICHARD A. This interview benefit is in the 23% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 31.5% of applications are subsequently allowed. This success rate is in the 64% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 41.2% of cases where such amendments are filed. This entry rate is in the 63% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 113.3% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 80% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 82.2% of appeals filed. This is in the 75% percentile among all examiners. Of these withdrawals, 56.7% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.

Petition Practice

When applicants file petitions regarding this examiner's actions, 35.6% are granted (fully or in part). This grant rate is in the 23% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 8.8% of allowed cases (in the 92% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.6% of allowed cases (in the 56% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Request pre-appeal conferences: PACs are highly effective with this examiner. Before filing a full appeal brief, request a PAC to potentially resolve issues without full PTAB review.
  • Appeal filing as negotiation tool: This examiner frequently reconsiders rejections during the appeal process. Filing a Notice of Appeal may prompt favorable reconsideration during the mandatory appeal conference.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.