Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18651840 | IMAGE SENSOR PACKAGE | May 2024 | May 2025 | Allow | 13 | 1 | 0 | No | No |
| 18643632 | FIN SMOOTHING AND INTEGRATED CIRCUIT STRUCTURES RESULTING THEREFROM | April 2024 | November 2024 | Allow | 6 | 0 | 0 | No | No |
| 18619772 | DOPED POLAR LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAME | March 2024 | August 2025 | Allow | 17 | 1 | 0 | Yes | No |
| 18611108 | MICRO LED BASED DISPLAY PANEL | March 2024 | February 2025 | Allow | 11 | 0 | 0 | No | No |
| 18598184 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | March 2024 | July 2025 | Allow | 17 | 1 | 0 | No | No |
| 18586735 | METAL OXIDE INTERLAYER STRUCTURE FOR NFET AND PFET | February 2024 | January 2025 | Allow | 11 | 1 | 0 | No | No |
| 18432546 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | February 2024 | April 2025 | Allow | 14 | 0 | 1 | No | No |
| 18426288 | VERTICAL BLUE LIGHT EMITTING DIODE AND METHOD FOR MANUFACTURING SAME | January 2024 | August 2024 | Allow | 7 | 0 | 0 | No | No |
| 18418976 | Diamond Semiconductor System And Method | January 2024 | January 2026 | Abandon | 24 | 2 | 1 | No | No |
| 18406385 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | January 2024 | November 2024 | Allow | 10 | 1 | 0 | No | No |
| 18402595 | CAPACITOR ARCHITECTURES IN SEMICONDUCTOR DEVICES | January 2024 | March 2025 | Allow | 14 | 0 | 0 | No | No |
| 18398053 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | December 2023 | September 2024 | Allow | 9 | 0 | 0 | No | No |
| 18396042 | SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF | December 2023 | January 2025 | Allow | 13 | 1 | 0 | No | No |
| 18536511 | IMAGE ACQUISITION DEVICE | December 2023 | February 2026 | Allow | 27 | 0 | 0 | No | No |
| 18533574 | Array of Memory Cells, Methods Used in Forming an Array of Memory Cells, Methods Used in Forming an Array of Vertical Transistors, and Methods Used in Forming an Array of Capacitors | December 2023 | January 2025 | Allow | 14 | 2 | 1 | Yes | No |
| 18526516 | METHOD FOR MANUFACTURING A GRID | December 2023 | October 2024 | Allow | 11 | 1 | 0 | No | No |
| 18526454 | SEMICONDUCTOR DEVICE | December 2023 | November 2025 | Allow | 24 | 2 | 1 | No | No |
| 18510787 | CAPACITANCE STRUCTURE | November 2023 | May 2025 | Allow | 18 | 2 | 1 | No | No |
| 18386649 | FeRAM with Laminated Ferroelectric Film and Method Forming Same | November 2023 | February 2025 | Allow | 15 | 2 | 1 | No | No |
| 18288288 | DISPLAY DEVICE AND METHOD FOR MANUFACTURING DISPLAY DEVICE | October 2023 | February 2026 | Allow | 28 | 0 | 0 | No | No |
| 18484144 | SEMICONDUCTOR DEVICE INCLUDING FERROELECTRIC LAYER AND METAL PARTICLES EMBEDDED IN METAL-ORGANIC FRAMEWORK LAYER | October 2023 | April 2024 | Allow | 7 | 0 | 0 | No | No |
| 18476852 | MEMORY DEVICE | September 2023 | July 2024 | Allow | 10 | 1 | 0 | No | No |
| 18474080 | MICROELECTRONIC DEVICES, MEMORY DEVICES, AND 3D NAND FLASH MEMORY DEVICES | September 2023 | July 2025 | Allow | 21 | 1 | 0 | No | No |
| 18371956 | METHOD OF FABRICATING SUPER-JUNCTION BASED VERTICAL GALLIUM NITRIDE JFET AND MOSFET POWER DEVICES | September 2023 | April 2024 | Allow | 7 | 0 | 0 | No | No |
| 18468159 | DISPLAY DEVICE | September 2023 | November 2025 | Allow | 26 | 0 | 0 | No | No |
| 18549426 | ELECTRODEPOSITION OF METALS USING AN IONICALLY RESISTIVE IONICALLY PERMEABLE ELEMENT OR A SHIELD SPATIALLY TAILORED TO DIE-LEVEL PATTERNS ON A SUBSTRATE | September 2023 | March 2026 | Allow | 30 | 1 | 0 | No | No |
| 18548652 | LIGHT DETECTION ELEMENT | September 2023 | February 2026 | Allow | 30 | 1 | 0 | Yes | No |
| 18241730 | System and Method for Direct Patterning Using a Compensated Shadow Mask | September 2023 | March 2026 | Allow | 30 | 1 | 0 | No | No |
| 18450499 | NON-LEAD BASED HIGH DENSITY MEMORY DEVICES | August 2023 | November 2024 | Allow | 15 | 1 | 1 | No | No |
| 18449298 | METHOD FOR FABRICATING A STRAINED SEMICONDUCTOR-ON-INSULATOR SUBSTRATE | August 2023 | November 2024 | Allow | 15 | 1 | 0 | No | No |
| 18233331 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | August 2023 | June 2024 | Allow | 10 | 1 | 0 | No | No |
| 18232518 | SYSTEMS AND METHODS OF TESTING MEMORY DEVICES | August 2023 | February 2024 | Allow | 7 | 0 | 0 | No | No |
| 18447495 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE | August 2023 | February 2024 | Allow | 7 | 0 | 0 | No | No |
| 18357153 | FERROELECTRIC MEMORY DEVICE | July 2023 | November 2024 | Allow | 16 | 1 | 1 | No | No |
| 18353954 | 3D FERROELECTRIC MEMORY | July 2023 | January 2025 | Allow | 18 | 1 | 0 | No | No |
| 18352532 | HIGH DENSITY CAPACITOR AND METHODS OF FORMING THE SAME | July 2023 | February 2026 | Allow | 31 | 0 | 1 | No | No |
| 18350754 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | July 2023 | March 2026 | Allow | 32 | 0 | 0 | No | No |
| 18214584 | FERROELECTRIC RANDOM ACCESS MEMORY (FRAM) CAPACITORS AND METHODS OF CONSTRUCTION | June 2023 | January 2024 | Allow | 7 | 0 | 0 | No | No |
| 18213120 | METHODS FOR MAKING RADIO FREQUENCY (RF) SEMICONDUCTOR DEVICES INCLUDING A GROUND PLANE LAYER HAVING A SUPERLATTICE | June 2023 | February 2024 | Allow | 8 | 1 | 0 | Yes | No |
| 18337232 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | June 2023 | November 2025 | Allow | 29 | 0 | 1 | No | No |
| 18210155 | INTEGRATED CIRCUIT INCLUDING A CAPACITIVE ELEMENT AND CORRESPONDING MANUFACTURING METHOD | June 2023 | March 2024 | Allow | 9 | 0 | 0 | No | No |
| 18208687 | THREE-DIMENSIONAL MEMORY DEVICES AND METHODS FOR FORMING THE SAME | June 2023 | February 2026 | Allow | 32 | 0 | 1 | No | No |
| 18332080 | MEMORY WINDOW OF MFM MOSFET FOR SMALL CELL SIZE | June 2023 | April 2024 | Allow | 11 | 1 | 0 | No | No |
| 18328660 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | June 2023 | December 2023 | Allow | 7 | 0 | 0 | No | No |
| 18327143 | METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE | June 2023 | February 2026 | Allow | 32 | 0 | 1 | No | No |
| 18204397 | SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME | June 2023 | February 2026 | Allow | 32 | 0 | 1 | No | No |
| 18039668 | SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING A SUBSTRATE FOR A SEMICONDUCTOR COMPONENT, AND USE OF INDIUM DURING PRODUCTION OF SAME | May 2023 | February 2024 | Allow | 8 | 1 | 0 | No | No |
| 18324245 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | May 2023 | May 2024 | Allow | 11 | 1 | 0 | No | No |
| 18323999 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SEMICONDUCTOR DEVICE | May 2023 | February 2026 | Allow | 33 | 0 | 0 | No | No |
| 18321487 | COMPACT EEPROM MEMORY CELL WITH A GATE DIELECTRIC LAYER HAVING TWO DIFFERENT THICKNESSES | May 2023 | March 2024 | Allow | 10 | 1 | 0 | No | No |
| 18195689 | FERROELECTRIC TUNNEL JUNCTION STRUCTURE WITH L-SHAPED SPACERS | May 2023 | December 2025 | Allow | 31 | 1 | 1 | No | No |
| 18144885 | SEMICONDUCTOR DEVICE | May 2023 | July 2025 | Allow | 26 | 0 | 0 | No | No |
| 18143549 | FIN SMOOTHING AND INTEGRATED CIRCUIT STRUCTURES RESULTING THEREFROM | May 2023 | February 2024 | Allow | 10 | 1 | 0 | No | No |
| 18311894 | WAFER STACKING METHOD | May 2023 | January 2026 | Allow | 32 | 1 | 1 | No | No |
| 18142476 | UNIT CELL OF DISPLAY PANEL INCLUDING INTEGRATED TFT PHOTODETECTOR | May 2023 | April 2024 | Allow | 11 | 1 | 0 | No | No |
| 18307206 | BACK-END-OF-LINE CMOS INVERTER HAVING REDUCED SIZE AND REDUCED SHORT-CHANNEL EFFECTS AND METHODS OF FORMING THE SAME | April 2023 | July 2025 | Allow | 26 | 0 | 0 | No | No |
| 18137188 | TEXTURED COBALT ALUMINUM/MAGNESIUM-ALUMINUM-OXIDE PEDESTAL FOR MEMORY DEVICES | April 2023 | July 2025 | Allow | 27 | 0 | 0 | No | No |
| 18133693 | SEMICONDUCTOR DEVICE INCLUDING NONVOLATILE MEMORY DEVICE AND LOGIC DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE INCLUDING NONVOLATILE MEMORY DEVICE AND LOGIC DEVICE | April 2023 | March 2024 | Allow | 11 | 1 | 0 | No | No |
| 18299119 | SUSCEPTOR TRANSFER FOR PROCESS CHAMBER | April 2023 | November 2025 | Allow | 31 | 1 | 0 | Yes | No |
| 18031421 | SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE | April 2023 | December 2025 | Allow | 32 | 1 | 0 | No | No |
| 18297659 | MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE AND FLASH MEMORY | April 2023 | October 2023 | Allow | 7 | 0 | 0 | No | No |
| 18030549 | METHOD FOR MANUFACTURING WAFER HAVING FUNCTIONAL FILM | April 2023 | October 2025 | Allow | 31 | 1 | 0 | No | No |
| 18030334 | FERROELECTRIC DEVICE AND SEMICONDUCTOR DEVICE | April 2023 | July 2025 | Allow | 27 | 0 | 0 | No | No |
| 18295743 | CONCEPT FOR SILICON CARBIDE POWER DEVICES | April 2023 | March 2024 | Allow | 11 | 1 | 0 | No | No |
| 18295331 | SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREFOR | April 2023 | February 2026 | Allow | 35 | 1 | 1 | No | No |
| 18183469 | SEMICONDUCTOR DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME | March 2023 | November 2025 | Allow | 32 | 0 | 0 | No | No |
| 18183571 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | March 2023 | September 2025 | Allow | 30 | 1 | 0 | Yes | No |
| 18183534 | METHOD OF MANUFACTURING STRUCTURE AND METHOD OF MANUFACTURING CAPACITOR | March 2023 | November 2025 | Allow | 32 | 2 | 1 | No | No |
| 18181922 | B-SITE DOPED PEROVSKITE LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAME | March 2023 | August 2023 | Allow | 6 | 1 | 0 | No | No |
| 18181426 | MANGANESE-DOPED PEROVSKITE LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAME | March 2023 | September 2023 | Allow | 7 | 1 | 0 | No | No |
| 18181525 | B-SITE DOPED PEROVSKITE LAYERS AND SEMICONDUCTOR DEVICE INCORPORATING SAME | March 2023 | August 2023 | Allow | 5 | 0 | 0 | No | No |
| 18117478 | SPLIT-GATE NON-VOLATILE MEMORY DEVICE AND FABRICATION METHOD THEREOF | March 2023 | December 2025 | Abandon | 33 | 1 | 0 | No | No |
| 18178527 | METHOD OF MANUFACTURING MEMORY DEVICE AND PATTERNING METHOD | March 2023 | February 2024 | Allow | 11 | 0 | 0 | No | No |
| 18116736 | WAFER DICING USING FEMTOSECOND-BASED LASER AND PLASMA ETCH | March 2023 | June 2024 | Allow | 16 | 2 | 0 | No | No |
| 18176238 | NOR-TYPE MEMORY DEVICE, METHOD OF MANUFACTURING NOR-TYPE MEMORY DEVICE, AND ELECTRONIC APPARATUS INCLUDING MEMORY DEVICE | February 2023 | February 2026 | Allow | 36 | 1 | 1 | No | No |
| 18023618 | SEMICONDUCTOR DEVICE, CAPACITOR, AND MANUFACTURING METHOD THEREOF | February 2023 | September 2025 | Allow | 31 | 1 | 0 | No | No |
| 18175137 | Metal Oxide Interlayer Structure for NFET and PFET | February 2023 | October 2023 | Allow | 8 | 0 | 0 | No | No |
| 18175445 | SEMICONDUCTOR MEMORY DEVICE | February 2023 | November 2025 | Allow | 33 | 0 | 0 | No | No |
| 18022304 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | February 2023 | October 2025 | Allow | 32 | 1 | 0 | Yes | No |
| 18111427 | THREE-DIMENSIONAL INTEGRATED CIRCUIT | February 2023 | November 2025 | Allow | 33 | 1 | 0 | No | No |
| 18168956 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | February 2023 | June 2025 | Allow | 28 | 0 | 0 | No | No |
| 18168068 | CAPACITOR AND ELECTRONIC DEVICE INCLUDING THE SAME | February 2023 | September 2025 | Allow | 31 | 1 | 0 | Yes | No |
| 18168513 | SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE | February 2023 | November 2025 | Allow | 33 | 0 | 1 | No | No |
| 18108519 | NONVOLATILE STORAGE ELEMENT AND ANALOG CIRCUIT PROVIDED WITH SAME | February 2023 | February 2024 | Allow | 13 | 1 | 0 | No | No |
| 18167011 | Diamond Semiconductor System And Method | February 2023 | October 2023 | Allow | 8 | 0 | 0 | No | No |
| 18107917 | SOLAR CELL HAVING AN EMITTER REGION WITH WIDE BANDGAP SEMICONDUCTOR MATERIAL | February 2023 | February 2024 | Allow | 12 | 1 | 0 | No | No |
| 18164600 | SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | February 2023 | July 2025 | Allow | 30 | 1 | 1 | No | No |
| 18164399 | SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME | February 2023 | November 2025 | Allow | 33 | 1 | 0 | No | No |
| 18101120 | Transistors and Memory Arrays | January 2023 | January 2025 | Allow | 24 | 3 | 0 | Yes | No |
| 18099302 | SEMICONDUCTOR DEVICE INCLUDING GATE STRUCTURE | January 2023 | January 2026 | Allow | 36 | 0 | 1 | Yes | No |
| 18016681 | Light Emitting Device and Light Emitting Apparatus | January 2023 | May 2025 | Allow | 28 | 0 | 0 | No | No |
| 18152868 | METHOD FOR MAKING ACTIVE AREA AIR GAP | January 2023 | May 2025 | Allow | 28 | 0 | 0 | No | No |
| 18152779 | METHOD FOR FABRICATING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE | January 2023 | September 2025 | Allow | 32 | 0 | 1 | No | No |
| 18152151 | FERROELECTRIC MEMORY DEVICE AND SEMICONDUCTOR DIE | January 2023 | January 2026 | Allow | 36 | 1 | 1 | No | No |
| 18152751 | MEMORY DEVICE AND METHOD OF FORMING THE SAME | January 2023 | July 2025 | Allow | 30 | 0 | 1 | No | No |
| 18094377 | Memory Cells and Integrated Assemblies having Charge-Trapping-Material with Trap-Enhancing-Additive | January 2023 | February 2024 | Allow | 13 | 1 | 0 | No | No |
| 18004660 | METHOD FOR CONSTRUCTING MAGNETIC TUNNELING JUNCTION DEVICES AND USE OF DEVICE FOR SPIN-DEPENDENT TRANSPORT CHARACTERIZATION | January 2023 | May 2025 | Allow | 28 | 0 | 0 | Yes | No |
| 18093428 | THERMAL CONTROL FOR FORMATION AND PROCESSING OF ALUMINUM NITRIDE | January 2023 | November 2023 | Allow | 10 | 1 | 0 | No | No |
| 18150245 | SEMICONDUCTOR STRUCTURE | January 2023 | July 2025 | Allow | 31 | 0 | 0 | No | No |
| 18150770 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | January 2023 | October 2023 | Allow | 9 | 0 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner BOOTH, RICHARD A.
With a 15.4% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 38.9% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner BOOTH, RICHARD A works in Art Unit 2812 and has examined 2,032 patent applications in our dataset. With an allowance rate of 88.1%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 20 months.
Examiner BOOTH, RICHARD A's allowance rate of 88.1% places them in the 68% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by BOOTH, RICHARD A receive 1.11 office actions before reaching final disposition. This places the examiner in the 12% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by BOOTH, RICHARD A is 20 months. This places the examiner in the 93% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +2.4% benefit to allowance rate for applications examined by BOOTH, RICHARD A. This interview benefit is in the 23% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 31.5% of applications are subsequently allowed. This success rate is in the 64% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 41.2% of cases where such amendments are filed. This entry rate is in the 63% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 113.3% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 80% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 82.2% of appeals filed. This is in the 75% percentile among all examiners. Of these withdrawals, 56.7% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 35.6% are granted (fully or in part). This grant rate is in the 23% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 8.8% of allowed cases (in the 92% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.6% of allowed cases (in the 56% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.