Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18887821 | ELECTRICAL CONTACT CAVITY STRUCTURE AND METHODS OF FORMING THE SAME | September 2024 | February 2025 | Allow | 5 | 1 | 0 | Yes | No |
| 18758898 | SEMICONDUCTOR DEVICE STRUCTURE WITH NANOSTRUCTURE | June 2024 | June 2025 | Allow | 11 | 1 | 0 | No | No |
| 18754468 | Gate Structures For Semiconductor Devices | June 2024 | August 2025 | Allow | 13 | 1 | 0 | Yes | No |
| 18752906 | SEMICONDUCTOR DEVICES INCLUDING TWO-DIMENSIONAL MATERIAL AND METHODS OF FABRICATION THEREOF | June 2024 | October 2025 | Allow | 16 | 2 | 0 | No | No |
| 18752321 | Circuit Structure with Gate Configuration | June 2024 | July 2025 | Allow | 12 | 1 | 0 | Yes | No |
| 18752112 | Self-Aligned Metal Gate for Multigate Device | June 2024 | May 2025 | Allow | 11 | 1 | 0 | No | No |
| 18746288 | SEMICONDUCTOR DEVICES WITH BACKSIDE POWER RAIL AND BACKSIDE SELF-ALIGNED VIA | June 2024 | May 2025 | Allow | 11 | 1 | 0 | No | No |
| 18745029 | SEMICONDUCTOR DEVICE STRUCTURE WITH BACKSIDE CONTACT | June 2024 | May 2025 | Allow | 11 | 1 | 0 | No | No |
| 18742126 | MULTI-LAYER CHANNEL STRUCTURES AND METHODS OF FABRICATING THE SAME IN FIELD-EFFECT TRANSISTORS | June 2024 | August 2025 | Allow | 14 | 2 | 0 | No | No |
| 18741987 | Semiconductor Devices Including Backside Vias and Methods of Forming the Same | June 2024 | January 2025 | Allow | 7 | 0 | 0 | No | No |
| 18741356 | SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF | June 2024 | August 2025 | Allow | 14 | 2 | 0 | No | No |
| 18740024 | INTEGRATED CIRCUIT AND METHOD FOR FORMING THE SAME | June 2024 | July 2025 | Allow | 13 | 1 | 0 | No | No |
| 18738390 | Semiconductor Structure with Staggered Selective Growth | June 2024 | May 2025 | Allow | 12 | 1 | 0 | No | No |
| 18679459 | NANOWIRE TRANSISTOR AND METHOD FOR FABRICATING THE SAME | May 2024 | January 2025 | Allow | 8 | 1 | 0 | No | No |
| 18673960 | SEMICONDUCTOR DEVICE FABRICATION METHODS AND STRUCTURES THEREOF | May 2024 | April 2025 | Allow | 11 | 1 | 0 | No | No |
| 18672218 | GAP-INSULATED SEMICONDUCTOR DEVICE | May 2024 | April 2025 | Allow | 11 | 1 | 0 | No | No |
| 18669199 | EFFECTIVE WORK FUNCTION TUNING VIA SILICIDE INDUCED INTERFACE DIPOLE MODULATION FOR METAL GATES | May 2024 | April 2025 | Allow | 11 | 1 | 0 | No | No |
| 18669052 | AIR GAP IN INNER SPACERS AND METHODS OF FABRICATING THE SAME IN FIELD-EFFECT TRANSISTORS | May 2024 | January 2025 | Allow | 8 | 0 | 0 | No | No |
| 18665572 | TRANSISTOR, INTEGRATED CIRCUIT, AND MANUFACTURING METHOD OF TRANSISTOR | May 2024 | December 2024 | Allow | 7 | 0 | 0 | No | No |
| 18655973 | Source/Drain Contacts and Methods of Forming Same | May 2024 | March 2025 | Allow | 10 | 1 | 0 | No | No |
| 18656033 | High Selectivity Etching With Germanium-Containing Gases | May 2024 | September 2025 | Allow | 17 | 2 | 0 | Yes | No |
| 18650067 | DISPLAY DEVICE | April 2024 | August 2025 | Allow | 15 | 2 | 0 | No | No |
| 18633002 | SEMICONDUCTOR DEVICES | April 2024 | March 2025 | Allow | 11 | 1 | 0 | No | No |
| 18629002 | CAPACITANCE REDUCTION FOR BACK-SIDE POWER RAIL DEVICE | April 2024 | February 2026 | Allow | 22 | 3 | 0 | No | No |
| 18625282 | SEMICONDUCTOR DEVICE HAVING NANOSHEET TRANSISTOR AND METHODS OF FABRICATION THEREOF | April 2024 | April 2025 | Allow | 12 | 1 | 0 | Yes | No |
| 18623390 | ISOLATION STRUCTURES IN MULTI-GATE SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME | April 2024 | February 2025 | Allow | 11 | 1 | 0 | No | No |
| 18623885 | MULTI-GATE DEVICE STRUCTURE | April 2024 | October 2025 | Allow | 18 | 3 | 0 | No | No |
| 18613296 | SEMICONDUCTOR DEVICE STRUCTURE AND METHODS OF FORMING THE SAME | March 2024 | March 2025 | Allow | 11 | 1 | 0 | No | No |
| 18606944 | DECOUPLING CAPACITORS WITH BACK SIDE POWER RAILS | March 2024 | February 2025 | Allow | 11 | 1 | 0 | No | No |
| 18603424 | IMAGE-CAPTURE ELEMENT AND IMAGE CAPTURE DEVICE | March 2024 | January 2025 | Allow | 10 | 1 | 0 | No | No |
| 18598781 | SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF | March 2024 | September 2024 | Allow | 7 | 0 | 0 | No | No |
| 18598934 | NANOSHEET FIELD-EFFECT TRANSISTOR DEVICE AND METHOD OF FORMING | March 2024 | March 2025 | Allow | 12 | 2 | 0 | No | No |
| 18598689 | SUPER-STEEP SWITCHING DEVICE AND INVERTER DEVICE USING THE SAME | March 2024 | November 2024 | Allow | 8 | 1 | 0 | Yes | No |
| 18597440 | SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME | March 2024 | November 2024 | Allow | 9 | 1 | 0 | No | No |
| 18590985 | MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | February 2024 | November 2024 | Allow | 9 | 1 | 0 | No | No |
| 18590820 | SEMICONDUCTOR DEVICES WITH BACKSIDE POWER RAIL AND METHODS OF FABRICATION THEREOF | February 2024 | April 2025 | Allow | 13 | 2 | 0 | No | No |
| 18584862 | GATE ALL AROUND TRANSISTOR WITH DUAL INNER SPACERS | February 2024 | January 2025 | Allow | 11 | 1 | 0 | No | No |
| 18581096 | SEMICONDUCTOR DEVICES | February 2024 | January 2025 | Allow | 11 | 1 | 0 | No | No |
| 18440526 | GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING EMBEDDED GESNB SOURCE OR DRAIN STRUCTURES | February 2024 | December 2024 | Allow | 10 | 1 | 0 | No | No |
| 18437625 | METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND A SEMICONDUCTOR DEVICE | February 2024 | December 2024 | Allow | 10 | 1 | 0 | No | No |
| 18435140 | Transistor Gate Structure and Method of Forming | February 2024 | May 2025 | Allow | 15 | 2 | 0 | No | No |
| 18430771 | METAL OXIDE AND TRANSISTOR INCLUDING METAL OXIDE | February 2024 | December 2024 | Allow | 10 | 1 | 0 | No | No |
| 18426859 | PROCESS WINDOW CONTROL FOR GATE FORMATION IN SEMICONDUCTOR DEVICES | January 2024 | September 2024 | Allow | 8 | 1 | 0 | No | No |
| 18421398 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE | January 2024 | December 2024 | Allow | 11 | 1 | 0 | No | No |
| 18420209 | Methods of Forming Spacers for Semiconductor Devices Including Backside Power Rails | January 2024 | December 2024 | Allow | 11 | 1 | 0 | No | No |
| 18420327 | SEMICONDUCTOR STRUCTURE | January 2024 | December 2024 | Allow | 11 | 1 | 0 | No | No |
| 18418678 | Gate Structures in Transistors and Method of Forming Same | January 2024 | December 2024 | Allow | 11 | 1 | 0 | No | No |
| 18412173 | FLUORINE INCORPORATION METHOD FOR NANOSHEET | January 2024 | June 2025 | Allow | 17 | 1 | 0 | No | No |
| 18411031 | MEMORY CELL AND SEMICONDUCTOR MEMORY DEVICE WITH THE SAME | January 2024 | January 2025 | Allow | 12 | 1 | 0 | No | No |
| 18404874 | SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THE SAME | January 2024 | December 2024 | Allow | 11 | 1 | 0 | No | No |
| 18397700 | SEMICONDUCTOR DEVICE | December 2023 | March 2025 | Allow | 15 | 2 | 0 | Yes | No |
| 18538575 | INTEGRATED CIRCUIT DEVICE | December 2023 | November 2024 | Allow | 11 | 0 | 0 | No | No |
| 18531047 | Selective Epitaxy Process for the Formation of CFET Local Interconnection | December 2023 | June 2024 | Allow | 6 | 1 | 0 | No | No |
| 18526839 | Multi-Gate Device And Related Methods | December 2023 | June 2025 | Allow | 18 | 1 | 0 | No | No |
| 18524600 | Nanosheet Sizing for Power Delivery | November 2023 | June 2025 | Allow | 19 | 1 | 0 | Yes | No |
| 18524529 | Dummy Cell Designs for Nanosheet Devices | November 2023 | July 2025 | Allow | 19 | 1 | 0 | Yes | No |
| 18523023 | ACTIVE ZONES WITH OFFSET IN SEMICONDUCTOR CELL | November 2023 | September 2024 | Allow | 10 | 1 | 0 | No | No |
| 18522980 | SEMICONDUCTOR DEVICE AND METHOD | November 2023 | December 2024 | Allow | 12 | 1 | 0 | No | No |
| 18521065 | High-Voltage Tolerant Device and Detection Circuit | November 2023 | March 2026 | Allow | 27 | 0 | 0 | Yes | No |
| 18513028 | GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DEPOPULATED CHANNEL STRUCTURES USING SELECTIVE BOTTOM-UP APPROACH | November 2023 | September 2024 | Allow | 10 | 1 | 0 | No | No |
| 18512527 | SEMICONDUCTOR DEVICE | November 2023 | June 2024 | Allow | 7 | 0 | 0 | No | No |
| 18511064 | WORK FUNCTION DESIGN TO INCREASE DENSITY OF NANOSHEET DEVICES | November 2023 | July 2024 | Allow | 8 | 1 | 0 | No | No |
| 18388419 | Gate Structures For Semiconductor Devices | November 2023 | September 2024 | Allow | 11 | 1 | 0 | No | No |
| 18387914 | METHODS FOR DEPOSITING A MOLYBDENUM NITRIDE FILM ON A SURFACE OF A SUBSTRATE BY A CYCLICAL DEPOSITION PROCESS AND RELATED SEMICONDUCTOR DEVICE STRUCTURES INCLUDING A MOLYBDENUM NITRIDE FILM | November 2023 | September 2024 | Allow | 10 | 1 | 0 | No | No |
| 18387116 | DISPLAY DEVICE | November 2023 | June 2024 | Allow | 7 | 0 | 0 | Yes | No |
| 18499481 | BACKSIDE POWER RAIL STRUCTURE AND METHODS OF FORMING SAME | November 2023 | August 2024 | Allow | 10 | 1 | 0 | No | No |
| 18495292 | SEMICONDUCTOR DEVICE | October 2023 | July 2024 | Allow | 9 | 1 | 0 | Yes | No |
| 18492194 | DISPLAY PANEL AND DISPLAY DEVICE | October 2023 | August 2024 | Allow | 10 | 1 | 0 | No | No |
| 18480484 | SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | October 2023 | August 2024 | Allow | 10 | 1 | 0 | No | No |
| 18375140 | SUBSTRATE, SEMICONDUCTOR DEVICE PACKAGE AND METHOD OF MANUFACTURING THE SAME | September 2023 | August 2024 | Allow | 10 | 1 | 0 | No | No |
| 18478410 | SEMICONDUCTOR DEVICE | September 2023 | May 2024 | Allow | 8 | 1 | 0 | No | No |
| 18472985 | INTEGRATED CIRCUIT | September 2023 | May 2025 | Allow | 20 | 1 | 0 | No | No |
| 18469756 | SRAM Middle Strap with Feedthrough Via | September 2023 | February 2026 | Allow | 29 | 0 | 0 | No | No |
| 18469856 | MEMORY DEVICES WITH A BACKSIDE READ BIT LINE | September 2023 | February 2026 | Allow | 29 | 0 | 0 | No | No |
| 18368078 | ELECTRONIC DEVICE | September 2023 | January 2025 | Allow | 16 | 2 | 0 | No | No |
| 18368428 | GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING ADJACENT STRUCTURES FOR SUB-FIN ELECTRICAL CONTACT | September 2023 | December 2024 | Allow | 15 | 2 | 0 | No | No |
| 18367700 | SEMICONDUCTOR DEVICE | September 2023 | June 2025 | Allow | 21 | 3 | 0 | No | No |
| 18243850 | Metal Oxide Film And Semiconductor Device | September 2023 | May 2024 | Allow | 8 | 0 | 0 | No | No |
| 18548644 | METHOD OF CONTROLLING BOW IN A SEMICONDUCTOR STRUCTURE, SEMICONDUCTOR STRUCTURE, AND SEMICONDUCTOR DEVICE | September 2023 | March 2026 | Allow | 30 | 1 | 0 | No | No |
| 18457826 | SPACE CONFINED EPI FOR STACKED FET | August 2023 | March 2026 | Allow | 30 | 1 | 0 | Yes | No |
| 18239722 | SEMICONDUCTOR DEVICE PACKAGES AND METHODS OF MANUFACTURING THE SAME | August 2023 | July 2024 | Allow | 11 | 1 | 0 | No | No |
| 18237915 | RESISTIVE SWITCHING DEVICE AND FABRICATION METHOD THEREOF | August 2023 | November 2025 | Allow | 27 | 0 | 0 | No | No |
| 18448634 | SRAM Macro Design Architecture | August 2023 | April 2025 | Allow | 21 | 0 | 0 | No | No |
| 18447153 | SEMICONDUCTOR DEVICE AND METHOD | August 2023 | July 2024 | Allow | 11 | 1 | 0 | No | No |
| 18446626 | Packaged Semiconductor Devices Including Backside Power Rails and Methods of Forming the Same | August 2023 | July 2024 | Allow | 12 | 1 | 0 | No | No |
| 18446864 | SEMICONDUCTOR STRUCTURE WITH WRAPAROUND BACKSIDE AMORPHOUS LAYER | August 2023 | July 2024 | Allow | 11 | 1 | 0 | No | No |
| 18229465 | SEMICONDUCTOR DEVICE STRUCTURE AND METHODS OF FORMING THE SAME | August 2023 | August 2024 | Allow | 13 | 1 | 0 | No | No |
| 18363171 | READ-ONLY MEMORY CIRCUIT | August 2023 | September 2024 | Allow | 13 | 0 | 0 | No | No |
| 18228376 | SEMICONDUCTOR DEVICE | July 2023 | February 2026 | Allow | 31 | 1 | 0 | Yes | No |
| 18361665 | Semiconductor Structures and Methods Thereof | July 2023 | September 2024 | Allow | 14 | 1 | 0 | No | No |
| 18227744 | GATE STRUCTURES FOR SEMICONDUCTOR DEVICES | July 2023 | October 2024 | Allow | 15 | 2 | 0 | Yes | No |
| 18359690 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | July 2023 | July 2024 | Allow | 11 | 1 | 0 | No | No |
| 18359280 | Semiconductor Device With Fish Bone Structure And Methods Of Forming The Same | July 2023 | September 2024 | Allow | 14 | 1 | 0 | No | No |
| 18358537 | Transistor Gate Structures and Methods of Forming the Same | July 2023 | July 2024 | Allow | 11 | 1 | 0 | No | No |
| 18357357 | Semiconductor Devices | July 2023 | July 2024 | Allow | 12 | 1 | 0 | No | No |
| 18357491 | Nanosheet Field-Effect Transistor Device and Method of Forming | July 2023 | June 2024 | Allow | 11 | 1 | 0 | No | No |
| 18224487 | SEMICONDUCTOR DEVICE AND A METHOD FOR FABRICATING THE SAME | July 2023 | July 2024 | Allow | 12 | 1 | 0 | No | No |
| 18355960 | Integrated Hybrid Standard Cell Structure with Gate-All-Around Device | July 2023 | July 2024 | Allow | 12 | 1 | 0 | No | No |
| 18224489 | SEMICONDUCTOR DEVICE | July 2023 | February 2026 | Allow | 31 | 1 | 0 | No | No |
| 18354681 | SEMICONDUCTING METAL OXIDE TRANSISTORS HAVING A PATTERNED GATE AND METHODS FOR FORMING THE SAME | July 2023 | June 2024 | Allow | 11 | 1 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner KIM, TONG-HO.
With a 0.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 40.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner KIM, TONG-HO works in Art Unit 2811 and has examined 888 patent applications in our dataset. With an allowance rate of 94.4%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 17 months.
Examiner KIM, TONG-HO's allowance rate of 94.4% places them in the 83% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by KIM, TONG-HO receive 1.27 office actions before reaching final disposition. This places the examiner in the 17% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by KIM, TONG-HO is 17 months. This places the examiner in the 97% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a -0.5% benefit to allowance rate for applications examined by KIM, TONG-HO. This interview benefit is in the 11% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 34.1% of applications are subsequently allowed. This success rate is in the 75% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 55.9% of cases where such amendments are filed. This entry rate is in the 82% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.
When applicants request a pre-appeal conference (PAC) with this examiner, 66.7% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 55% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 83.3% of appeals filed. This is in the 76% percentile among all examiners. Of these withdrawals, 40.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 53.3% are granted (fully or in part). This grant rate is in the 54% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.
Examiner's Amendments: This examiner makes examiner's amendments in 0.2% of allowed cases (in the 53% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.5% of allowed cases (in the 55% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.