Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18869882 | SOLAR CELL AND PREPARATION METHOD THEREFOR | November 2024 | January 2026 | Allow | 14 | 0 | 1 | No | No |
| 18263240 | WAFER ASSEMBLY AND METHOD FOR PRODUCING A PLURALITY OF SEMICONDUCTOR CHIPS | July 2023 | February 2026 | Allow | 31 | 1 | 0 | No | No |
| 18225748 | SEMICONDUCTOR DEVICE WITH PROFILED WORK-FUNCTION METAL GATE ELECTRODE AND METHOD OF MAKING | July 2023 | August 2024 | Allow | 13 | 1 | 0 | No | No |
| 18347956 | METAL MASK, METHOD OF MANUFACTURING THE SAME, AND METHOD OF MANUFACTURING DISPLAY PANEL USING THE METAL MASK | July 2023 | January 2025 | Allow | 18 | 2 | 0 | No | No |
| 18327624 | ORGANIC LIGHT EMITTING DISPLAY DEVICE | June 2023 | August 2024 | Allow | 15 | 1 | 0 | No | No |
| 18202336 | METHODS AND SYSTEMS FOR FORMING A LAYER COMPRISING A GROUP 13 ELEMENT ON A SUBSTRATE | May 2023 | February 2026 | Allow | 32 | 1 | 0 | No | No |
| 18314926 | SEMICONDUCTOR DEVICE WITH CAP ELEMENT | May 2023 | March 2026 | Allow | 34 | 1 | 0 | No | No |
| 18305786 | SEMICONDUCTOR DEVICE | April 2023 | February 2026 | Allow | 34 | 1 | 0 | No | No |
| 18305772 | METHOD FOR MANUFACTURING ORGANIC EL DEVICE | April 2023 | February 2026 | Allow | 34 | 1 | 0 | No | No |
| 18027432 | III-NITRIDE DEVICES WITH THROUGH-VIA STRUCTURES | March 2023 | October 2025 | Allow | 31 | 1 | 0 | No | No |
| 18185079 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | March 2023 | December 2025 | Allow | 34 | 1 | 0 | No | No |
| 18104272 | METHODS FOR FABRICATING SEMICONDUCTOR DEVICES WITH BACKSIDE POWER DELIVERY NETWORK USING LASER LIFTOFF LAYER | January 2023 | November 2025 | Allow | 34 | 1 | 0 | No | No |
| 18009770 | NITROGEN-CONTAINING COMPOUND, ELECTRONIC COMPONENT COMPRISING SAME, AND ELECTRONIC APPARATUS | December 2022 | October 2023 | Allow | 10 | 1 | 0 | No | No |
| 18073880 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | December 2022 | March 2026 | Abandon | 39 | 1 | 0 | No | No |
| 17925913 | SEMICONDUCTOR APPARATUS HAVING STAGGERED STRUCTURE AND METHOD OF MANUFACTURING THE SAME, AND ELECTRONIC DEVICE | November 2022 | December 2025 | Allow | 37 | 2 | 0 | No | No |
| 17985957 | CIRCUIT SUBSTRATE | November 2022 | December 2025 | Allow | 37 | 1 | 0 | No | No |
| 17975332 | 3D ISOLATION OF A SEGMENTATED 3D NANOSHEET CHANNEL REGION | October 2022 | September 2025 | Allow | 34 | 1 | 0 | No | No |
| 17921213 | DISPLAY PANEL AND DISPLAY DEVICE THEREOF | October 2022 | October 2025 | Allow | 36 | 1 | 0 | No | No |
| 17970455 | DISPLAY DEVICE | October 2022 | September 2025 | Allow | 35 | 1 | 0 | No | No |
| 17916050 | METHOD FOR FORMING NANOSTRUCTURE AND FIELD EFFECT TRANSISTOR DEVICE ON A SUBSTRATE | September 2022 | August 2025 | Allow | 35 | 1 | 0 | No | No |
| 17914349 | METHOD FOR MANUFACTURING SEMICONDUCTOR LIGHT EMITTING DEVICE | September 2022 | December 2025 | Allow | 39 | 2 | 0 | No | No |
| 17949907 | METHODS OF TRANSFERRING A DIE FROM A CARRIER TO A RECEIVE SUBSTRATE, AND RELATED SYSTEMS AND MATERIALS | September 2022 | October 2025 | Allow | 37 | 2 | 0 | Yes | No |
| 17899636 | SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF | August 2022 | September 2025 | Abandon | 37 | 1 | 0 | No | No |
| 17895952 | IN-CHAMBER METROLOGY OF SUBSTRATES FOR PROCESS CHARACTERIZATION AND IMPROVEMENT | August 2022 | December 2025 | Allow | 40 | 2 | 0 | Yes | No |
| 17802517 | METHOD FOR PRODUCING INK COMPOSITION | August 2022 | March 2024 | Allow | 19 | 2 | 0 | Yes | No |
| 17817661 | SUBSTRATE PROCESSING SYSTEM AND SUBSTRATE PROCESSING METHOD | August 2022 | February 2025 | Allow | 30 | 2 | 1 | No | No |
| 17854884 | FIELD PLATE AND ISOLATION STRUCTURE FOR HIGH VOLTAGE DEVICE | June 2022 | June 2025 | Allow | 36 | 1 | 0 | No | No |
| 17853150 | Impurity Removal in Doped ALD Tantalum Nitride | June 2022 | January 2025 | Allow | 30 | 0 | 0 | No | No |
| 17851785 | ELECTRON BARRIER FILM, QUANTUM DOT LIGHT-EMITTING DIODE AND PREPARATION METHOD THEREOF | June 2022 | June 2025 | Allow | 35 | 1 | 0 | No | No |
| 17789682 | NITRIDE SEMICONDUCTOR DEVICE | June 2022 | March 2025 | Allow | 32 | 1 | 0 | No | No |
| 17787097 | METHOD FOR PRODUCING EPITAXIAL SILICON WAFER | June 2022 | February 2025 | Allow | 32 | 1 | 0 | No | No |
| 17826298 | METHODS FOR DOPING SEMICONDUCTORS IN TRANSISTORS | May 2022 | April 2025 | Allow | 34 | 1 | 0 | No | No |
| 17824835 | LIGHT-EMTTING DIODE DISPLAY DEVICES WITH UV-CURED LAYER | May 2022 | May 2025 | Abandon | 36 | 1 | 0 | No | No |
| 17734687 | Semiconductor Structure and Methods of Forming Same | May 2022 | July 2024 | Allow | 26 | 1 | 0 | No | No |
| 17734683 | Interconnect Structure without Barrier Layer on Bottom Surface of Via | May 2022 | January 2025 | Allow | 33 | 2 | 1 | Yes | No |
| 17729695 | OLED DISPLAY PANEL AND OLED DISPLAY DEVICE | April 2022 | November 2024 | Allow | 30 | 0 | 0 | No | No |
| 17726673 | METHOD OF FABRICATING SEMICONDUCTOR DEVICE | April 2022 | January 2025 | Allow | 32 | 1 | 0 | No | No |
| 17725430 | METHOD FOR ETCHING GAPS OF UNEQUAL WIDTH | April 2022 | September 2024 | Allow | 29 | 0 | 0 | No | No |
| 17769407 | Method for Producing a Lighting Device | April 2022 | November 2024 | Allow | 31 | 1 | 0 | No | No |
| 17710939 | LIGHT-EMTTING DIODE LIGHT EXTRACTION LAYER HAVING GRADED INDEX OF REFRACTION | March 2022 | December 2023 | Allow | 21 | 0 | 0 | No | No |
| 17763869 | NITROGEN-CONTAINING COMPOUND, ELECTRONIC COMPONENT AND ELECTRONIC DEVICE INCLUDING SAME | March 2022 | January 2023 | Allow | 9 | 0 | 0 | No | No |
| 17762844 | THERMALLY CONDUCTIVE SILICONE COMPOSITION, PRODUCTION METHOD THEREOF, AND SEMICONDUCTOR DEVICE | March 2022 | July 2024 | Allow | 28 | 0 | 0 | No | No |
| 17687166 | METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND METHOD FOR PROCESSING FILM | March 2022 | April 2025 | Allow | 37 | 2 | 0 | Yes | No |
| 17651883 | RESIST PATTERNED REDISTRIBUTION WIRING ON COPPER POLYIMIDE VIA LAYER | February 2022 | September 2025 | Allow | 43 | 2 | 0 | Yes | No |
| 17667488 | METHOD OF BACK END OF LINE VIA TO METAL LINE MARGIN IMPROVEMENT | February 2022 | October 2024 | Allow | 33 | 3 | 0 | No | No |
| 17665166 | WAFER AND METHOD OF MANUFACTURING WAFER | February 2022 | October 2023 | Allow | 21 | 0 | 0 | No | No |
| 17582551 | METHOD OF MANUFACTURING MEMORY DEVICE HAVING MEMORY CELL WITH REDUCED PROTRUSION | January 2022 | October 2024 | Allow | 32 | 1 | 0 | No | No |
| 17555790 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | December 2021 | November 2024 | Allow | 35 | 3 | 0 | No | No |
| 17456402 | APPLYING INERT ION BEAM ETCHING FOR IMPROVING A PROFILE AND REPAIRING SIDEWALL DAMAGE FOR PHASE CHANGE MEMORY DEVICES | November 2021 | April 2025 | Allow | 41 | 1 | 0 | Yes | No |
| 17456052 | METHOD FOR OPTIMIZING THE ELECTRIC CONDUCTION THROUGH A METAL/OXIDE/METAL INTERFACE | November 2021 | August 2024 | Allow | 32 | 1 | 0 | No | No |
| 17595589 | ACTIVE REGION ARRAY FORMATION METHOD | November 2021 | August 2024 | Allow | 33 | 1 | 0 | No | No |
| 17455717 | SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF | November 2021 | June 2024 | Allow | 30 | 1 | 0 | No | No |
| 17521021 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | November 2021 | August 2024 | Allow | 33 | 1 | 0 | No | No |
| 17453851 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | November 2021 | February 2024 | Allow | 27 | 1 | 0 | No | No |
| 17517247 | INTERCONNECT STRUCTURES AND METHODS FOR FORMING SAME | November 2021 | January 2026 | Allow | 50 | 4 | 0 | Yes | No |
| 17451645 | METHOD FOR MANUFACTURING MEMORY AND MEMORY | October 2021 | May 2024 | Allow | 31 | 1 | 0 | No | No |
| 17503599 | Methods Of Forming Metal Nitride Films | October 2021 | March 2024 | Allow | 29 | 0 | 0 | No | No |
| 17604320 | SIC EDGE RING | October 2021 | June 2024 | Allow | 32 | 1 | 0 | No | No |
| 17599851 | CdSeTe PHOTOVOLTAIC DEVICES WITH INTERDIGITATED BACK CONTACT ARCHITECTURE | September 2021 | July 2024 | Allow | 33 | 1 | 0 | No | No |
| 17599413 | SEMICONDUCTOR STRUCTURE AND FORMING METHOD THEREOF | September 2021 | November 2022 | Allow | 13 | 2 | 0 | No | No |
| 17476993 | INK CONTAINING LIGHT-EMITTING ELEMENTS AND METHOD OF FABRICATING DISPLAY DEVICE USING THE SAME | September 2021 | July 2024 | Allow | 34 | 2 | 0 | No | No |
| 17438786 | RESIST UNDERLAYER FILM-FORMING COMPOSITION | September 2021 | April 2024 | Allow | 31 | 0 | 0 | No | No |
| 17446235 | GUARD RING AND MANUFACTURING METHOD THEREOF | August 2021 | June 2024 | Allow | 34 | 2 | 0 | Yes | No |
| 17371375 | METHOD OF MANUFACTURING EXTREME ULTRAVIOLET (EUV) PHOTOMASK AND METHOD AND APPARATUS FOR CORRECTING EUV PHOTOMASK | July 2021 | November 2024 | Allow | 41 | 1 | 1 | Yes | No |
| 17360135 | Hybrid Source Drain Regions Formed Based on Same Fin and Methods Forming Same | June 2021 | June 2024 | Allow | 36 | 2 | 0 | No | No |
| 17355663 | WAFER AND METHOD OF MANUFACTRURING WAFER | June 2021 | November 2021 | Allow | 5 | 0 | 1 | Yes | No |
| 17355050 | PHASE CHANGE MEMORY STRUCTURE AND MANUFACTURING METHOD FOR THE SAME | June 2021 | September 2023 | Allow | 27 | 0 | 0 | No | No |
| 17352195 | Contacts for Semiconductor Devices and Methods of Forming the Same | June 2021 | November 2023 | Allow | 29 | 2 | 0 | No | No |
| 17345258 | HIGH DENSITY PICK AND SEQUENTIAL PLACE TRANSFER PROCESS AND TOOL | June 2021 | March 2024 | Allow | 33 | 2 | 0 | Yes | No |
| 17338379 | METHOD FOR SILICIDATION OF SEMICONDUCTOR DEVICE, AND CORRESPONDING SEMICONDUCTOR DEVICE | June 2021 | August 2023 | Allow | 27 | 1 | 0 | No | No |
| 17324492 | INTEGRATED CIRCUIT DEVICE | May 2021 | October 2023 | Allow | 29 | 2 | 0 | Yes | No |
| 17321536 | THROUGH SUBSTRATE VIA STRUCTURE AND MANUFACTURING METHOD THEREOF, REDISTRIBUTION LAYER STRUCTURE AND MANUFACTURING METHOD THEREOF | May 2021 | May 2024 | Allow | 36 | 2 | 0 | No | No |
| 17237821 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | April 2021 | August 2023 | Allow | 27 | 1 | 0 | No | No |
| 17236700 | ACCESS LINE GRAIN MODULATION IN A MEMORY DEVICE | April 2021 | May 2024 | Allow | 37 | 3 | 0 | Yes | No |
| 17231284 | GATE CONTACT ISOLATION IN A SEMICONDUCTOR | April 2021 | September 2023 | Allow | 30 | 2 | 0 | No | No |
| 17249965 | SEMICONDUCTOR STRUCTURE INSPECTION USING A HIGH ATOMIC NUMBER MATERIAL | March 2021 | January 2024 | Allow | 34 | 2 | 0 | Yes | No |
| 17201488 | METHOD FOR MANUFACTURING SEMICONDUCTOR MEMBER AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | March 2021 | January 2023 | Allow | 22 | 0 | 0 | No | No |
| 17200227 | METHOD OF MANUFACTURING LIGHT EMITTING DEVICE | March 2021 | March 2023 | Allow | 24 | 1 | 0 | Yes | No |
| 17182948 | TRANSISTOR PRODUCTION METHOD | February 2021 | March 2024 | Allow | 37 | 3 | 0 | No | No |
| 17178495 | SEMICONDUCTOR DEVICE | February 2021 | November 2022 | Allow | 21 | 0 | 0 | No | No |
| 17175640 | Power Distribution | February 2021 | September 2024 | Allow | 43 | 2 | 1 | Yes | No |
| 17130247 | Flow Sensor, Method for Manufacturing Flow Sensor and Flow Sensor Module | December 2020 | February 2023 | Allow | 26 | 1 | 0 | No | No |
| 17131706 | THIN FILM TRANSISTORS HAVING BORON NITRIDE INTEGRATED WITH 2D CHANNEL MATERIALS | December 2020 | April 2025 | Abandon | 52 | 2 | 1 | No | No |
| 17124850 | DISPLAY APPARATUS | December 2020 | March 2023 | Allow | 26 | 1 | 0 | No | No |
| 17122209 | Devices with Strained Isolation Features | December 2020 | July 2023 | Allow | 31 | 1 | 1 | No | No |
| 17120276 | PACKAGE STRUCTURE AND METHOD OF FABRICATING THE SAME | December 2020 | September 2022 | Allow | 21 | 0 | 0 | No | No |
| 16973914 | ORGANIC LIGHT-EMITTING DEVICE AND DISPLAY DEVICE | December 2020 | August 2022 | Allow | 20 | 1 | 0 | No | No |
| 16952455 | CIRCUIT SUBSTRATE | November 2020 | August 2022 | Allow | 21 | 1 | 0 | No | No |
| 17095742 | PACKAGE SUBSTRATE AND METHOD OF FABRICATING THE SAME | November 2020 | July 2023 | Allow | 32 | 2 | 0 | No | No |
| 17095744 | PACKAGE SUBSTRATE AND METHOD OF FABRICATING THE SAME AND CHIP PACKAGE STRUCTURE | November 2020 | September 2023 | Allow | 34 | 2 | 0 | No | No |
| 17085124 | ORGANIC ELECTROLUMINESCENCE DEVICE AND POLYCYCLIC COMPOUND FOR ORGANIC ELECTROLUMINESCENCE DEVICE | October 2020 | September 2022 | Allow | 22 | 0 | 0 | No | No |
| 17082535 | METHOD FOR FORMING PLANARIZATION LAYER AND PATTERN FORMING METHOD USING THE SAME | October 2020 | January 2023 | Allow | 26 | 1 | 0 | No | No |
| 17081498 | Area-Selective Atomic Layer Deposition Of Passivation Layers | October 2020 | December 2022 | Allow | 25 | 1 | 0 | No | No |
| 17079835 | SEMICONDUCTOR DEVICE WITH CAP ELEMENT | October 2020 | February 2023 | Allow | 28 | 2 | 0 | No | No |
| 17071310 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | October 2020 | January 2023 | Allow | 27 | 2 | 0 | No | No |
| 17066604 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | October 2020 | August 2022 | Allow | 23 | 1 | 0 | No | No |
| 17030350 | FABRICATION OF GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING MOLYBDENUM NITRIDE METAL GATES AND GATE DIELECTRICS WITH A DIPOLE LAYER | September 2020 | March 2024 | Allow | 42 | 1 | 0 | No | No |
| 17029023 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | September 2020 | August 2022 | Allow | 22 | 1 | 0 | No | No |
| 16980197 | METHOD OF FORMING A THROUGH-SUBSTRATE VIA AND A SEMICONDUCTOR DEVICE COMPRISING A THROUGH-SUBSTRATE VIA | September 2020 | July 2023 | Allow | 34 | 3 | 0 | No | No |
| 17002990 | ORGANIC SEMICONDUCTING POLYMERS | August 2020 | July 2022 | Allow | 22 | 0 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner SNOW, COLLEEN ERIN.
With a 38.5% reversal rate, the PTAB reverses the examiner's rejections in a meaningful percentage of cases. This reversal rate is above the USPTO average, indicating that appeals have better success here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 26.3% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner SNOW, COLLEEN ERIN works in Art Unit 2899 and has examined 408 patent applications in our dataset. With an allowance rate of 88.0%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 24 months.
Examiner SNOW, COLLEEN ERIN's allowance rate of 88.0% places them in the 68% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by SNOW, COLLEEN ERIN receive 1.79 office actions before reaching final disposition. This places the examiner in the 40% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by SNOW, COLLEEN ERIN is 24 months. This places the examiner in the 84% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +8.8% benefit to allowance rate for applications examined by SNOW, COLLEEN ERIN. This interview benefit is in the 40% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 25.8% of applications are subsequently allowed. This success rate is in the 41% percentile among all examiners. Strategic Insight: RCEs show below-average effectiveness with this examiner. Carefully evaluate whether an RCE or continuation is the better strategy.
This examiner enters after-final amendments leading to allowance in 58.4% of cases where such amendments are filed. This entry rate is in the 84% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.
When applicants request a pre-appeal conference (PAC) with this examiner, 40.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 37% percentile among all examiners. Note: Pre-appeal conferences show below-average success with this examiner. Consider whether your arguments are strong enough to warrant a PAC request.
This examiner withdraws rejections or reopens prosecution in 40.9% of appeals filed. This is in the 8% percentile among all examiners. Of these withdrawals, 22.2% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner rarely withdraws rejections during the appeal process compared to other examiners. If you file an appeal, be prepared to fully prosecute it to a PTAB decision. Per MPEP § 1207, the examiner will prepare an Examiner's Answer maintaining the rejections.
When applicants file petitions regarding this examiner's actions, 37.0% are granted (fully or in part). This grant rate is in the 25% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 0.2% of allowed cases (in the 54% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).
Quayle Actions: This examiner issues Ex Parte Quayle actions in 3.9% of allowed cases (in the 77% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.